JP4646599B2 - 超音波探傷装置 - Google Patents

超音波探傷装置 Download PDF

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Publication number
JP4646599B2
JP4646599B2 JP2004319745A JP2004319745A JP4646599B2 JP 4646599 B2 JP4646599 B2 JP 4646599B2 JP 2004319745 A JP2004319745 A JP 2004319745A JP 2004319745 A JP2004319745 A JP 2004319745A JP 4646599 B2 JP4646599 B2 JP 4646599B2
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JP
Japan
Prior art keywords
flaw detection
detection data
data
predetermined
monitor
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Expired - Fee Related
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JP2004319745A
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English (en)
Japanese (ja)
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JP2006132987A5 (enExample
JP2006132987A (ja
Inventor
理行 重久
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Olympus Corp
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Olympus Corp
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Priority to JP2004319745A priority Critical patent/JP4646599B2/ja
Publication of JP2006132987A publication Critical patent/JP2006132987A/ja
Publication of JP2006132987A5 publication Critical patent/JP2006132987A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan

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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2004319745A 2004-11-02 2004-11-02 超音波探傷装置 Expired - Fee Related JP4646599B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004319745A JP4646599B2 (ja) 2004-11-02 2004-11-02 超音波探傷装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004319745A JP4646599B2 (ja) 2004-11-02 2004-11-02 超音波探傷装置

Publications (3)

Publication Number Publication Date
JP2006132987A JP2006132987A (ja) 2006-05-25
JP2006132987A5 JP2006132987A5 (enExample) 2007-12-20
JP4646599B2 true JP4646599B2 (ja) 2011-03-09

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ID=36726663

Family Applications (1)

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JP2004319745A Expired - Fee Related JP4646599B2 (ja) 2004-11-02 2004-11-02 超音波探傷装置

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JP (1) JP4646599B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4938050B2 (ja) * 2009-05-15 2012-05-23 有限会社超音波材料診断研究所 超音波診断評価装置
CN104764806B (zh) * 2015-03-20 2018-10-09 江苏大学 一种缺陷量化参数估计方法
RU180038U1 (ru) * 2018-03-14 2018-05-31 Акционерное общество "Фирма ТВЕМА" Ультразвуковой дефектоскоп
RU2686409C1 (ru) * 2018-11-08 2019-04-25 Акционерное общество "Фирма ТВЕМА" Дефектоскоп для контроля рельсов
RU206199U1 (ru) * 2021-04-23 2021-08-30 Акционерное общество "Фирма ТВЕМА" Дефектоскоп для контроля рельсов

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3108879B2 (ja) * 1990-10-12 2000-11-13 株式会社日立メディコ 超音波診断装置
JPH0580034A (ja) * 1991-09-19 1993-03-30 Tokimec Inc 超音波探傷装置
JPH0933494A (ja) * 1995-07-24 1997-02-07 Hitachi Ltd 超音波探傷装置
JPH116820A (ja) * 1997-06-13 1999-01-12 Hitachi Constr Mach Co Ltd 超音波探査映像方法
JPH11118776A (ja) * 1997-10-13 1999-04-30 Hitachi Constr Mach Co Ltd 扇形走査式超音波検査装置
JPH11183452A (ja) * 1997-12-25 1999-07-09 Hitachi Constr Mach Co Ltd 超音波探傷器の波形表示方法
JPH11211706A (ja) * 1998-01-22 1999-08-06 Hitachi Constr Mach Co Ltd 扇形走査式超音波検査装置
JP2000266734A (ja) * 1999-03-16 2000-09-29 Hitachi Constr Mach Co Ltd 測定波形表示装置および測定波形表示方法

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Publication number Publication date
JP2006132987A (ja) 2006-05-25

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