JP4551666B2 - 照明装置及び露光装置 - Google Patents
照明装置及び露光装置 Download PDFInfo
- Publication number
- JP4551666B2 JP4551666B2 JP2004042802A JP2004042802A JP4551666B2 JP 4551666 B2 JP4551666 B2 JP 4551666B2 JP 2004042802 A JP2004042802 A JP 2004042802A JP 2004042802 A JP2004042802 A JP 2004042802A JP 4551666 B2 JP4551666 B2 JP 4551666B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- mirror unit
- exposure apparatus
- illumination
- reticle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/52—Details
- G03B27/54—Lamp housings; Illuminating means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004042802A JP4551666B2 (ja) | 2004-02-19 | 2004-02-19 | 照明装置及び露光装置 |
| US11/062,024 US7190436B2 (en) | 2004-02-19 | 2005-02-18 | Illumination apparatus and exposure apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004042802A JP4551666B2 (ja) | 2004-02-19 | 2004-02-19 | 照明装置及び露光装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005235999A JP2005235999A (ja) | 2005-09-02 |
| JP2005235999A5 JP2005235999A5 (enExample) | 2007-04-05 |
| JP4551666B2 true JP4551666B2 (ja) | 2010-09-29 |
Family
ID=34857989
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004042802A Expired - Fee Related JP4551666B2 (ja) | 2004-02-19 | 2004-02-19 | 照明装置及び露光装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7190436B2 (enExample) |
| JP (1) | JP4551666B2 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008042462B4 (de) * | 2008-09-30 | 2010-11-04 | Carl Zeiss Smt Ag | Beleuchtungssystem für die EUV-Mikrolithographie |
| DE102013223935A1 (de) * | 2013-11-22 | 2015-05-28 | Carl Zeiss Smt Gmbh | Beleuchtungssystem für die EUV-Belichtungslithographie |
| NL2016266A (en) * | 2015-03-02 | 2016-09-30 | Asml Netherlands Bv | Radiation System. |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3371510B2 (ja) * | 1994-02-23 | 2003-01-27 | 株式会社ニコン | 照明装置及び露光装置 |
| US6038279A (en) * | 1995-10-16 | 2000-03-14 | Canon Kabushiki Kaisha | X-ray generating device, and exposure apparatus and semiconductor device production method using the X-ray generating device |
| JP3618856B2 (ja) * | 1995-10-20 | 2005-02-09 | キヤノン株式会社 | X線露光装置、及びこれを用いたデバイス生産方法 |
| JP3817848B2 (ja) * | 1997-07-18 | 2006-09-06 | 株式会社ニコン | 照明装置 |
| US6144495A (en) * | 1997-12-23 | 2000-11-07 | Canon Kabushiki Kaisha | Projection light source |
| DE10053587A1 (de) * | 2000-10-27 | 2002-05-02 | Zeiss Carl | Beleuchtungssystem mit variabler Einstellung der Ausleuchtung |
| US7109497B2 (en) * | 1998-05-05 | 2006-09-19 | Carl Zeiss Smt Ag | Illumination system particularly for microlithography |
| US6438199B1 (en) * | 1998-05-05 | 2002-08-20 | Carl-Zeiss-Stiftung | Illumination system particularly for microlithography |
| US6285743B1 (en) * | 1998-09-14 | 2001-09-04 | Nikon Corporation | Method and apparatus for soft X-ray generation |
| JP4521896B2 (ja) * | 1999-06-08 | 2010-08-11 | キヤノン株式会社 | 照明装置、投影露光装置及びデバイス製造方法 |
| JP2001307985A (ja) * | 2000-04-24 | 2001-11-02 | Takeshi Kawabata | リソグラフィ用露光装置 |
| JP2002006096A (ja) | 2000-06-23 | 2002-01-09 | Nikon Corp | 電磁波発生装置、これを用いた半導体製造装置並びに半導体デバイスの製造方法 |
| JP3605055B2 (ja) * | 2001-07-31 | 2004-12-22 | キヤノン株式会社 | 照明光学系、露光装置及びデバイス製造方法 |
| JP3634782B2 (ja) * | 2001-09-14 | 2005-03-30 | キヤノン株式会社 | 照明装置、それを用いた露光装置及びデバイス製造方法 |
| JP2004335575A (ja) * | 2003-05-01 | 2004-11-25 | Canon Inc | 露光装置 |
-
2004
- 2004-02-19 JP JP2004042802A patent/JP4551666B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-18 US US11/062,024 patent/US7190436B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20050185165A1 (en) | 2005-08-25 |
| US7190436B2 (en) | 2007-03-13 |
| JP2005235999A (ja) | 2005-09-02 |
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