JP4548463B2 - 伝送線路基板及び電気的測定装置 - Google Patents
伝送線路基板及び電気的測定装置 Download PDFInfo
- Publication number
- JP4548463B2 JP4548463B2 JP2007234702A JP2007234702A JP4548463B2 JP 4548463 B2 JP4548463 B2 JP 4548463B2 JP 2007234702 A JP2007234702 A JP 2007234702A JP 2007234702 A JP2007234702 A JP 2007234702A JP 4548463 B2 JP4548463 B2 JP 4548463B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- transmission line
- measurement
- tomographic
- line substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
- G01N27/221—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance by investigating the dielectric properties
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
この断層部に対する試料への導入方法については、特に限定されず、例えば、上方から滴下等してもよいし、断層部を、流路の一部とするように形成された試料導入用流路を設けておいて、該流路から試料を断層部に向けて送液等してもよい。
次に、本発明では、上述した高周波伝送路が複数並設された構成のマルチ伝送線路基板を提供する。さらには、このマルチ伝送線路基板において、複数の断層部を通過するような試料導入用流路を形成してもよい。この場合、該流路内を試料が送液され、次々に断層部を通過していくようになるため、時間差を設けて試料の誘電測定を連続的に行うような用途に適している。
また、本発明では、上記した伝送線路基板を用いて、測定対象試料の電気的特性に係わる情報を取得するための装置であって、前記伝送線路基板を構成する前記導体層に対して電力を供給する電源部と、前記断層部へ直接又は流路を介して試料を導入する試料導入部と、前記断層部へ試料が導入されたことで変化し得るインピーダンスを計測する計測部と、を備えた電気的測定装置、そして、前記インピーダンスに基づいて試料の誘電率を得る解析部をさらに備える電気的測定装置を提供する。
2、3 導体層
4 絶縁層
G 断層部(断線されている)
Claims (5)
- 所定厚みの絶縁層と、
前記絶縁層を挟むように対向配置され、高周波伝送路として機能する複数対の導体層と、
前記複数対の導体層の一方側の各導体層を断線状態にするように形成され、測定対象の試料が導入され得る複数の断層部と、
各断層部を流路の一部とする試料導入用流路と、
を少なくとも備え、
前記試料導入用流路は、前記絶縁層上に並設された各導体層に形成された断層部の全てを通過するように延設されており、前記試料が全ての断層部を通過する伝送線路基板。 - 更に、前記断層部が設けられた導体層のうちの一の導体層に選択的に接続して電気信号を取得する1対のスイッチング導体を備える請求項1記載の伝送線路基板。
- 前記複数対の導体層の他方側の導体層が共通である請求項1又は2に記載の伝送線路基板。
- 請求項1乃至3のいずれか1項に記載の伝送線路基板を用いて、測定対象試料の電気的特性に係わる情報を取得するための装置であって、
前記伝送線路基板を構成する各導体層に対して電力を供給する電源部と、
各断層部へ流路を介して試料を導入する試料導入部と、
前記断層部へ試料が導入されたことで変化し得るインピーダンスを計測する計測部と、を備える電気的測定装置。 - 前記インピーダンスに基づいて試料の誘電率を得る解析部を有する請求項4記載の電気的測定装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007234702A JP4548463B2 (ja) | 2007-09-10 | 2007-09-10 | 伝送線路基板及び電気的測定装置 |
US12/283,009 US8368410B2 (en) | 2007-09-10 | 2008-09-09 | Transmission line for dielectric measurement and dielectric measuring device having the transmission line |
US13/734,011 US9250296B2 (en) | 2007-09-10 | 2013-01-04 | Transmission line for dielectric measurement and dielectric measuring device having the transmission line |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007234702A JP4548463B2 (ja) | 2007-09-10 | 2007-09-10 | 伝送線路基板及び電気的測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009068864A JP2009068864A (ja) | 2009-04-02 |
JP4548463B2 true JP4548463B2 (ja) | 2010-09-22 |
Family
ID=40605301
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007234702A Expired - Fee Related JP4548463B2 (ja) | 2007-09-10 | 2007-09-10 | 伝送線路基板及び電気的測定装置 |
Country Status (2)
Country | Link |
---|---|
US (2) | US8368410B2 (ja) |
JP (1) | JP4548463B2 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5098817B2 (ja) | 2008-05-29 | 2012-12-12 | ソニー株式会社 | 物性測定装置及び物性測定方法 |
US10139468B2 (en) * | 2014-08-29 | 2018-11-27 | The United States Of America, As Represented By The Secretary Of Agriculture | Planar transmission-line permittivity sensor and calibration method for the characterization of liquids, powders and semisolid materials |
JP7011806B2 (ja) * | 2017-10-06 | 2022-01-27 | 国立研究開発法人産業技術総合研究所 | 誘電体材料評価装置 |
CN111289583A (zh) * | 2020-02-19 | 2020-06-16 | 华北电力大学 | 一种凝胶类材料宽频介电特性的测试装置及方法 |
CN111337748B (zh) * | 2020-04-22 | 2022-02-01 | 广西科技大学 | 适用于高温高频条件下的阻抗测量方法 |
TWI805131B (zh) * | 2021-12-16 | 2023-06-11 | 國立陽明交通大學 | 一種用於量測待測物的複介電係數的裝置、以及用於複合介電質的時域多重反射訊號的量測裝置及其量測方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002286632A (ja) * | 2001-03-23 | 2002-10-03 | Japan Science & Technology Corp | 測定試料の光学的評価方法およびその装置 |
JP2003509692A (ja) * | 1999-08-02 | 2003-03-11 | シグネチャー バイオサイエンス,インコーポレイティド | 分子結合事象を検出するためのテストシステムおよびセンサ |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4734184A (en) * | 1985-08-29 | 1988-03-29 | Diamond Sensor Systems, Inc. | Self-activating hydratable solid-state electrode apparatus |
US5772153A (en) * | 1995-10-17 | 1998-06-30 | Abaunza; John T. | Aircraft icing sensors |
US6338968B1 (en) * | 1998-02-02 | 2002-01-15 | Signature Bioscience, Inc. | Method and apparatus for detecting molecular binding events |
US6597185B1 (en) * | 2000-09-20 | 2003-07-22 | Neocera, Inc. | Apparatus for localized measurements of complex permittivity of a material |
US6995572B2 (en) * | 2001-03-05 | 2006-02-07 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Sensor and method for detecting a superstrate |
JP4861220B2 (ja) * | 2006-08-28 | 2012-01-25 | キヤノン株式会社 | 電磁波を用いた検査装置 |
JP4928249B2 (ja) * | 2006-12-20 | 2012-05-09 | キヤノン株式会社 | 検出装置 |
-
2007
- 2007-09-10 JP JP2007234702A patent/JP4548463B2/ja not_active Expired - Fee Related
-
2008
- 2008-09-09 US US12/283,009 patent/US8368410B2/en active Active
-
2013
- 2013-01-04 US US13/734,011 patent/US9250296B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003509692A (ja) * | 1999-08-02 | 2003-03-11 | シグネチャー バイオサイエンス,インコーポレイティド | 分子結合事象を検出するためのテストシステムおよびセンサ |
JP2002286632A (ja) * | 2001-03-23 | 2002-10-03 | Japan Science & Technology Corp | 測定試料の光学的評価方法およびその装置 |
Also Published As
Publication number | Publication date |
---|---|
US20130120002A1 (en) | 2013-05-16 |
US8368410B2 (en) | 2013-02-05 |
JP2009068864A (ja) | 2009-04-02 |
US20090134885A1 (en) | 2009-05-28 |
US9250296B2 (en) | 2016-02-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4548463B2 (ja) | 伝送線路基板及び電気的測定装置 | |
JP5098817B2 (ja) | 物性測定装置及び物性測定方法 | |
Gennarelli et al. | A microwave resonant sensor for concentration measurements of liquid solutions | |
CN103975242B (zh) | 电子侧流测试装置和方法 | |
US20030072549A1 (en) | Method and apparatus for dielectric spectroscopy of biological solutions | |
Castiglione et al. | The effect of ohmic cable losses on time‐domain reflectometry measurements of electrical conductivity | |
WO2002065127A2 (en) | A system and method for characterizing the permittivity of molecular events | |
JP6305444B2 (ja) | 媒体の誘電特性を求めるためのセンサおよび方法 | |
US20090212789A1 (en) | Modified tdr method and apparatus for suspended solid concentration measurement | |
RU2566605C2 (ru) | Устройство и способ усовершенствованных измерений посредством контрольно-измерительного устройства | |
Chung et al. | High concentration suspended sediment measurements using time domain reflectometry | |
US4918375A (en) | Reflectometric moisture meter for capillary-porous materials, especially for the soil | |
US20150091592A1 (en) | Test strip resistance check | |
US6111342A (en) | Instrument for chemical measurement | |
JP4928249B2 (ja) | 検出装置 | |
CN104350373A (zh) | 压电单元、压电装置、压电判定装置及状态判定方法 | |
US8217665B2 (en) | Radio-frequency ion channel probe | |
US7179587B2 (en) | Method and apparatus for high frequency interfacing to biochemical membranes | |
Kim et al. | Radio-frequency response of single pores and artificial ion channels | |
Pioggia et al. | Characterization of a carbon nanotube polymer composite sensor for an impedimetric electronic tongue | |
KR20210061186A (ko) | 동일평면 도파관 소자를 이용한 d-(+)-포도당 용액의 농도변화에 따른 검출 및 전기적 특성 분석방법 | |
Hakiki et al. | Broadband complex dielectric permittivity: Combined impedance spectroscopy and time domain reflectometry | |
Zeng et al. | Development of distillation sensors for spirit beverages production monitoring based on impedance spectroscopy measurement and partial least-squares regression | |
Castiglione et al. | Multiplexer‐induced interference on TDR measurements of electrical conductivity | |
Kurniawati et al. | INTER-DIGITAL CAPACITOR SENSOR FOR MEASURING PERMITTIVITY OF FLUID |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090708 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090721 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090924 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100330 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100521 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100615 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100628 |
|
R151 | Written notification of patent or utility model registration |
Ref document number: 4548463 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R151 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130716 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |