JP4511512B2 - 分析装置用ユーザインタフェース及び分析装置 - Google Patents

分析装置用ユーザインタフェース及び分析装置 Download PDF

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Publication number
JP4511512B2
JP4511512B2 JP2006346801A JP2006346801A JP4511512B2 JP 4511512 B2 JP4511512 B2 JP 4511512B2 JP 2006346801 A JP2006346801 A JP 2006346801A JP 2006346801 A JP2006346801 A JP 2006346801A JP 4511512 B2 JP4511512 B2 JP 4511512B2
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JP2007139792A5 (enExample
JP2007139792A (ja
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貴道 内藤
博美 尾道
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Sysmex Corp
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Sysmex Corp
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JP2006346801A 2006-12-22 2006-12-22 分析装置用ユーザインタフェース及び分析装置 Expired - Fee Related JP4511512B2 (ja)

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JP2006346801A JP4511512B2 (ja) 2006-12-22 2006-12-22 分析装置用ユーザインタフェース及び分析装置

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JP2006346801A JP4511512B2 (ja) 2006-12-22 2006-12-22 分析装置用ユーザインタフェース及び分析装置

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JP2002181872A Division JP4184721B2 (ja) 2002-06-21 2002-06-21 ユーザインターフェイスおよびそれを備えた分析装置

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JP2007139792A JP2007139792A (ja) 2007-06-07
JP2007139792A5 JP2007139792A5 (enExample) 2008-11-27
JP4511512B2 true JP4511512B2 (ja) 2010-07-28

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JP2006346801A Expired - Fee Related JP4511512B2 (ja) 2006-12-22 2006-12-22 分析装置用ユーザインタフェース及び分析装置

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010286410A (ja) * 2009-06-12 2010-12-24 Beckman Coulter Inc 制御装置
CN102483423B (zh) * 2009-09-28 2014-11-05 株式会社日立高新技术 自动分析装置、其信息显示方法以及信息显示系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03251930A (ja) * 1990-02-28 1991-11-11 Shimadzu Corp 測定装置等の制御装置
JP3261020B2 (ja) * 1995-09-04 2002-02-25 日本電子株式会社 化学分析装置のユーザインターフェース
JPH102902A (ja) * 1996-06-14 1998-01-06 Toshiba Corp 自動分析装置
JP3889877B2 (ja) * 1997-04-10 2007-03-07 株式会社日立製作所 自動分析装置およびその支援システム
JP3798539B2 (ja) * 1997-11-26 2006-07-19 日本分光株式会社 分光光度計
US6269276B1 (en) * 1998-03-31 2001-07-31 Roche Diagnostics Corporation Multi-rule quality control method and apparatus
JP3849343B2 (ja) * 1998-04-21 2006-11-22 株式会社日立製作所 自動分析装置
JP3598019B2 (ja) * 1999-06-16 2004-12-08 株式会社日立製作所 自動分析装置
JP2001218756A (ja) * 2000-02-10 2001-08-14 Hiroboo Kk 疲労度測定装置

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