JP4505665B2 - 光による微粒子の操作方法及び操作装置 - Google Patents

光による微粒子の操作方法及び操作装置 Download PDF

Info

Publication number
JP4505665B2
JP4505665B2 JP2000105968A JP2000105968A JP4505665B2 JP 4505665 B2 JP4505665 B2 JP 4505665B2 JP 2000105968 A JP2000105968 A JP 2000105968A JP 2000105968 A JP2000105968 A JP 2000105968A JP 4505665 B2 JP4505665 B2 JP 4505665B2
Authority
JP
Japan
Prior art keywords
fine particles
optical system
spherical aberration
light beam
medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2000105968A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001290083A5 (enExample
JP2001290083A (ja
Inventor
久美子 大瀧
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP2000105968A priority Critical patent/JP4505665B2/ja
Priority to US09/826,104 priority patent/US20010028508A1/en
Publication of JP2001290083A publication Critical patent/JP2001290083A/ja
Priority to US10/117,182 priority patent/US6603607B2/en
Publication of JP2001290083A5 publication Critical patent/JP2001290083A5/ja
Application granted granted Critical
Publication of JP4505665B2 publication Critical patent/JP4505665B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H3/00—Production or acceleration of neutral particle beams, e.g. molecular or atomic beams
    • H05H3/04—Acceleration by electromagnetic wave pressure

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Manipulator (AREA)
  • Microscoopes, Condenser (AREA)
  • Micromachines (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2000105968A 2000-04-07 2000-04-07 光による微粒子の操作方法及び操作装置 Expired - Lifetime JP4505665B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2000105968A JP4505665B2 (ja) 2000-04-07 2000-04-07 光による微粒子の操作方法及び操作装置
US09/826,104 US20010028508A1 (en) 2000-04-07 2001-04-05 Minute particle optical manipulation method and apparatus
US10/117,182 US6603607B2 (en) 2000-04-07 2002-04-08 Minute particle optical manipulation method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000105968A JP4505665B2 (ja) 2000-04-07 2000-04-07 光による微粒子の操作方法及び操作装置

Publications (3)

Publication Number Publication Date
JP2001290083A JP2001290083A (ja) 2001-10-19
JP2001290083A5 JP2001290083A5 (enExample) 2007-04-05
JP4505665B2 true JP4505665B2 (ja) 2010-07-21

Family

ID=18619216

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000105968A Expired - Lifetime JP4505665B2 (ja) 2000-04-07 2000-04-07 光による微粒子の操作方法及び操作装置

Country Status (2)

Country Link
US (1) US20010028508A1 (enExample)
JP (1) JP4505665B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003175497A (ja) * 2001-12-13 2003-06-24 Japan Science & Technology Corp 光ピンセット捕捉力強化光学系
JP2004247947A (ja) * 2003-02-13 2004-09-02 Olympus Corp 光学装置
ITMI20070150A1 (it) * 2007-01-31 2008-08-01 Univ Pavia Metodo e dispositivo ottico per la manipolazione di una particella
CN102768411B (zh) * 2012-05-30 2014-05-07 中国科学院光电技术研究所 一种基于子孔径分割的光路耦合对准装置及对准方法
CN102860845A (zh) * 2012-08-30 2013-01-09 中国科学技术大学 活体动物体内的细胞的捕获、操控方法及相应的装置
CN104215502B (zh) * 2014-03-17 2016-08-24 南方科技大学 细胞的弹性模量的检测系统及细胞的弹性模量的检测方法
JP6606975B2 (ja) * 2015-10-28 2019-11-20 株式会社ジェイテクト 光ピンセット装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2947971B2 (ja) * 1991-03-02 1999-09-13 聡 河田 レーザトラッピング方法及び装置
JPH0670064A (ja) * 1992-08-21 1994-03-11 Toshiba Corp 通信料金管理装置
JPH11326860A (ja) * 1998-05-18 1999-11-26 Olympus Optical Co Ltd 波面変換素子及びそれを用いたレーザ走査装置
JP2003175497A (ja) * 2001-12-13 2003-06-24 Japan Science & Technology Corp 光ピンセット捕捉力強化光学系

Also Published As

Publication number Publication date
US20010028508A1 (en) 2001-10-11
JP2001290083A (ja) 2001-10-19

Similar Documents

Publication Publication Date Title
JP6360825B2 (ja) 結像光学系、照明装置および観察装置
US8582203B2 (en) Optical arrangement for oblique plane microscopy
JP5006694B2 (ja) 照明装置
JP5286774B2 (ja) 顕微鏡装置と、これに用いられる蛍光キューブ
WO2015041320A1 (ja) 補償光学系及び光学装置
JP5655617B2 (ja) 顕微鏡
JP2013235271A (ja) レーザー顕微解剖装置及び方法
JP4505665B2 (ja) 光による微粒子の操作方法及び操作装置
JP4222877B2 (ja) 顕微鏡観察方法及びそれに用いる顕微鏡
JPWO2016056651A1 (ja) 結像光学系、照明装置および顕微鏡装置
JP2010091809A (ja) 顕微鏡装置
WO2016052743A1 (ja) 光軸方向走査型顕微鏡装置
US6603607B2 (en) Minute particle optical manipulation method and apparatus
JPWO2016056147A1 (ja) 結像光学系、照明装置および観察装置
US20240045188A1 (en) Confocal microscope with photon re-allocation
JP2000097857A5 (enExample)
US6600598B1 (en) Method and apparatus for producing diffracted-light contrast enhancement in microscopes
JP4962749B2 (ja) 光による微粒子操作装置
JP2010145950A (ja) 液浸対物レンズ及びこの液浸対物レンズを有する顕微鏡
CN113892042B (zh) 用于固体浸没弯月形透镜的设备、系统及方法
CN110554491B (zh) 用于观测活体未染色细胞的微型相位差数码显微镜
WO2007136100A1 (ja) 暗視野顕微鏡及びその調整方法
JP2003195182A (ja) 集光光学系及び微粒子操作装置
Vettenburg Extended field-of-view light-sheet microscopy
JP2002189175A (ja) 光による微粒子操作装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070215

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070215

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100330

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100412

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130514

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 4505665

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130514

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130514

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130514

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140514

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term