JP4500101B2 - Ｘ線ｃｔ装置 - Google Patents

Ｘ線ｃｔ装置 Download PDF

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Publication number
JP4500101B2
JP4500101B2 JP2004140769A JP2004140769A JP4500101B2 JP 4500101 B2 JP4500101 B2 JP 4500101B2 JP 2004140769 A JP2004140769 A JP 2004140769A JP 2004140769 A JP2004140769 A JP 2004140769A JP 4500101 B2 JP4500101 B2 JP 4500101B2
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Japan
Prior art keywords
ray
afterglow
correction
imaging
time constant
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Expired - Fee Related
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JP2004140769A
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Japanese (ja)
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JP2005319152A (ja
JP2005319152A5 (enExample
Inventor
康隆 昆野
健一 岡島
靖 宮崎
裕 鱒沢
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Hitachi Healthcare Manufacturing Ltd
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Hitachi Medical Corp
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Priority to JP2004140769A priority Critical patent/JP4500101B2/ja
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Publication of JP2005319152A5 publication Critical patent/JP2005319152A5/ja
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Publication of JP4500101B2 publication Critical patent/JP4500101B2/ja
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JP2004140769A 2004-05-11 2004-05-11 Ｘ線ｃｔ装置 Expired - Fee Related JP4500101B2 (ja)

Priority Applications (1)

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JP2004140769A JP4500101B2 (ja) 2004-05-11 2004-05-11 Ｘ線ｃｔ装置

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Application Number Priority Date Filing Date Title
JP2004140769A JP4500101B2 (ja) 2004-05-11 2004-05-11 Ｘ線ｃｔ装置

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JP2005319152A JP2005319152A (ja) 2005-11-17
JP2005319152A5 JP2005319152A5 (enExample) 2007-02-01
JP4500101B2 true JP4500101B2 (ja) 2010-07-14

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JP2004140769A Expired - Fee Related JP4500101B2 (ja) 2004-05-11 2004-05-11 Ｘ線ｃｔ装置

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JP (1) JP4500101B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8309910B2 (en) * 2010-12-15 2012-11-13 General Electric Company Phantom for spectral CT image system calibration
US9508142B2 (en) 2012-08-22 2016-11-29 Hitachi Medical Corporation X-ray CT apparatus and X-ray CT image-generating method
KR101347254B1 (ko) * 2012-09-10 2014-01-07 연세대학교 원주산학협력단 방사선 검출기의 불균일성 보정 방법
CN103405241B (zh) * 2013-07-21 2015-07-08 西北工业大学 一种射线成像的探测器余辉校正方法
JP7242255B2 (ja) * 2018-11-05 2023-03-20 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置および検出器ユニット

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5331682A (en) * 1991-11-25 1994-07-19 General Electric Company Radiation detector offset and afterglow compensation technique
JPH08243101A (ja) * 1995-03-14 1996-09-24 Ge Yokogawa Medical Syst Ltd Ｘ線検出器の特性改善方法及びｘ線ｃｔ装置
JP2002306467A (ja) * 2001-04-17 2002-10-22 Hitachi Medical Corp Ｘ線ｃｔ装置

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JP2005319152A (ja) 2005-11-17

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