JP4479959B2 - Diagnostic system and diagnostic method - Google Patents

Description

  The present invention relates to a diagnosis system and a diagnosis method for diagnosing a component unit constituting a computer system.

  Conventionally, a diagnosis of a computer system is performed by connecting a diagnosis-dedicated processor to the main unit of the computer system and mounting diagnostic software on the diagnosis-dedicated processor, and when the OS installed in the main unit detects a processing abnormality, Collecting log information written in (DASD), sending diagnosis commands to the diagnosis target device, obtaining the operation results, and performing diagnosis.

  In the above-described diagnosis method, in order to read log information from a file (DASD), log information read-only software is operated and loaded into a diagnostic-dedicated processor. For this reason, in order to collect log information on the diagnostic processor, it is necessary to turn on the power of the main unit and operate the log information read-only software that operates on the main unit, and the power control must be operated. In other words, there was a problem of inducing a cause such as a system down due to an operation error caused by a manual operation. In addition, the diagnostic processor is not necessarily designed to be directly connected to various peripheral devices. Generally, the diagnostic dedicated processor obtains diagnostic information of the peripheral device via the main unit. Therefore, there is a problem that it is difficult to diagnose a device having a deep hierarchy from the diagnostic dedicated processor.

  In order to solve these problems, the present invention stores log information on an IC tag affixed to each unit component constituting the diagnosis target device with a self-diagnosis function, and based on a diagnostic command read from the IC tag. Diagnosis is performed, the diagnosis result is written in the IC tag, and the log information and diagnosis result of the unit part are read and diagnosed via the IC tag attached to the unit part using an IC tag reader / writer.

  The invention of the present application collects log information and sends diagnostic commands at an independent path regardless of the power supply ON / OFF, etc. of the device to be diagnosed, and at the same level regardless of the hierarchy of the component units constituting the device. Thus, the diagnosis results can be easily collected.

  The present invention is based on a diagnostic command that stores log information in an IC tag that is attached to each unit component that constitutes a diagnostic target device with a self-diagnostic function and that is read from the IC tag, and diagnoses the result. The log information and diagnosis results of the unit part are read and diagnosed via the IC tag attached to the unit part using an IC tag reader / writer.

FIG. 1 shows a system configuration diagram of the present invention.
In FIG. 1, a diagnosis target device 1 is a device incorporating a computer system to be diagnosed, and includes a plurality of unit parts 2, an IC tag interface means 6, an IC tag reader / writer 9, a timer 10, an IC tag 11, and an IC. It consists of a tag 12 and the like.

  The unit component 2 is a unit component that constitutes the diagnosis target apparatus 1 and is replaced when a failure occurs. Here, the unit component 2 includes a self-diagnosis unit 3, a processing unit 4, an abnormality detection unit 5, and the like. Is.

  The self-diagnosis means 3 performs self-diagnosis on the unit component 2 and collects information (log information) of the diagnosis result, or based on a diagnosis command (instructed diagnosis command in the information read from the IC tag 11). The unit part 2 is self-diagnosed and information on the diagnosis result (diagnosis result information) is collected.

The processing means 4 performs various controls according to the program.
The abnormality detection means 5 detects an abnormality of the processing means 4.

  The IC tag interface means 6 exchanges information between the unit component 2 and the IC tag reader / writer 9, and is provided for each unit component 2 or for each of the plurality of unit components 2. The self-diagnosis control means 7, the failure information writing means 8, and the like.

  When there is a self-diagnosis command in the information read from the IC tags 11 and 12 by the IC tag reader / writer 9, the self-diagnosis control unit 7 passes the self-diagnosis command to the self-diagnosis unit 3 of the corresponding unit part 2. The self-diagnosis of the unit component 2 is executed, the diagnosis result is received, and written in the IC tags 11 and 12.

  The failure information writing means 8 collects failure information of the unit component 2 and writes it to the IC tags 11 and 12.

  The IC tag reader / writer 9 writes information (diagnosis result information, failure information, log information, etc.) to the IC tags 11, 12, and reads information (self-diagnosis commands, etc.) from the IC tags 11, 12. Thus, each unit component 2 or a plurality of unit components 2 is provided.

  The timer 10 measures, and here, when the self-diagnosis control means 6 notifies the self-diagnosis command to the self-diagnosis means 3 of the unit part 2, the timer 10 measures the predetermined time. Is a timer for determining that the unit component 2 is faulty or measuring time when there is no response.

  The IC tags 11 and 12 are attached to one or a plurality of unit parts 2 for each one or a plurality of unit parts 2 and can read and write information wirelessly. The IC tag 11 is used for writing failure information of the unit component 2 (see FIG. 7), and the IC tag 12 is used for writing and storing past failure history (see FIG. 9).

  The diagnostic PC 21 is a diagnostic personal computer (notebook personal computer), and here, includes a diagnostic control means 22, a timer 26, an IC tag reader / writer 27, an input device 28, a display device 29, and the like. .

  The diagnosis control means 22 is for diagnosing the diagnosis target apparatus 1 and is composed of a failure history priority diagnosis means 23, a failure information analysis means 24, a unit diagnosis execution means 25, and the like.

  The failure history priority diagnosis means 23 issues a diagnosis command from the highest priority in the failure history, diagnoses the unit part 2 of the diagnosis target device 1, and collects the diagnosis results. .

  The failure information analysis means 24 analyzes failure information and determines a failure location (such as which unit part 2 constituting the diagnosis target device is a failure location).

  The unit diagnosis execution means 25 is for diagnosing the presence or absence of a failure and the location of the failure by causing the unit component 2 constituting the diagnosis target apparatus 1 to execute a diagnosis command.

  The timer 26 is a timer for causing the diagnosis target device 1 (and the corresponding unit component 2 constituting the diagnosis target device 1) to execute a diagnosis command, and determining that a failure occurs when the time is over.

  The IC tag reader / writer 27 is for wirelessly writing information to the IC tags 11 and 12, reading information, and the like.

  The input device 28 inputs instructions and data, and is a mouse, a keyboard, or the like.

The display device 29 displays a screen, data, and the like, and is a display.
Next, the operation of the configuration of FIG. 1 will be described in detail according to the order of the flowchart of FIG.

  FIG. 2 is a flowchart for explaining the operation of the present invention (part 1). Here, the diagnosis target device 1 and the diagnosis PC 21 correspond to the diagnosis target device 1 and the diagnosis PC 21 of FIG.

First, the operation on the diagnosis target apparatus 1 side will be described in detail.
In FIG. 2, in S <b> 1, it is determined whether the abnormality detection unit 5 detects a processing abnormality. In the case of YES, the failure information is written by the failure information writing means 8 in S2 (the failure information is written in the IC tag 11 described on the right side). Then, the process proceeds to S3. On the other hand, if NO in S1, the process proceeds to S3.

  In S3, the IC tag is periodically read. The information of the IC tag 11 is read by the IC tag reader / writer 9 every time (periodically) set in the timer 10 of FIG.

  In S4, it is determined whether there is a diagnosis command. This determines whether there is a diagnostic command (diagnostic command) in the information periodically read from the IC tag 11 in S3. In the case of YES, the process proceeds to S5 and subsequent steps. If NO, return to S1 and repeat.

  In S5, unit diagnosis by the self-diagnosis means 3 is performed. This is because the diagnosis command (diagnostic command) is found in the information read from the IC tag 11 in YES of S4, and the self-diagnosis is executed by passing the diagnostic command to the self-diagnostic means 3 of the corresponding unit part 2. .

  In S6, the diagnosis result is written to the IC tag. This writes the result of the self-diagnosis in S5 to the self-diagnosis result storage area of the IC tag 11.

  As described above, the diagnosis target device 1 collects failure information when an abnormality is detected and writes the failure information in the failure information area of the IC tag 11, and the diagnostic PC 21 is an independent path and wirelessly stopped. Can be read out, and when there is a diagnostic command in the information read from the IC tag 11, the relevant unit component 2 is diagnosed by the diagnostic command, and the diagnosis result is displayed as the IC tag 11. The diagnostic PC 21 can be read out even when the diagnostic target apparatus 1 is stopped by the wireless and independent route of the diagnostic PC 21.

Next, the operation on the diagnostic PC 21 side will be described in detail.
In FIG. 2, S 11 activates the diagnosis control means 22. This starts up the diagnostic PC 21 shown in FIG. 1 and activates a business program as the diagnostic control means 22 to put it in an operating state.

  In step S12, the IC tag 11 is read. In this case, the IC tag reader / writer 27 in FIG. 1 reads information from the IC tag 11 attached to each component unit 2 constituting the diagnosis target device 1 wirelessly.

  In S13, it is determined whether there is failure information. This determines whether or not there is failure information in the information read wirelessly from the IC tag 11 attached to each component unit 2 in S12. If YES, the process proceeds to S14. In the case of NO, it is determined that there is no failure information, and the process ends.

  In S14, since it is determined that there is failure information in the information read from the IC tag 11 attached to the component unit 2 in YES of S13, the failure information analysis means 24 performs diagnosis. This analyzes the failure of the unit part 2 based on the failure information. If the failure location can be identified, the diagnosis result / failure location is presented in S15, the CE is notified, and the process ends. On the other hand, if the failure location cannot be specified, the process proceeds to S16 and subsequent steps.

  In S16, since failure information could not be identified by analyzing failure information in S14, a diagnosis command by the unit diagnosis execution means 25 is written to the IC tag 11. This is because the failure location of the unit component 2 could not be specified only by analyzing the failure information, and a diagnostic command is written in the IC tag 11 attached to the corresponding unit component 2 in order to specify it. Then, in S3 to S6 of FIG. 2 described above, the diagnosis command written in the IC tag 11 is read and executed by the diagnosis target apparatus 1, and the diagnosis result is written in the IC tag 11.

S17 sets a timer.
In S18, the IC tag 11 is periodically read.

  S19 determines whether there is a diagnosis result. This is done by periodically reading information from the IC tag 11 and determining whether there is diagnostic result information. In the case of YES, diagnosis by the failure information analysis means 24 is executed in S20. For this, the diagnostic result information obtained by executing the diagnostic command read from the IC tag 11 is analyzed, the failure part of the unit part 2 is identified, and the process proceeds to S22. On the other hand, in the case of NO in S19, it is determined in S21 whether timeout has occurred, and in the case of YES, a failure (failure indicating that the result cannot be received even if a diagnosis command is transmitted) is presented as a diagnosis result in S22. If so, return to S18 and repeat.

  S22 displays a diagnosis result. For example, the following information is displayed as the above diagnosis result.

-Display of fault location-Unable to identify fault location-Display diagnostic information-Display timeout:
Here, the “display of the failure location” displays the failure location when the failure location of the unit component 2 can be identified by analyzing the failure information in S14. “Failure location cannot be specified” is a case where failure information cannot be specified by analyzing failure information. In that case, the diagnosis command issued and the diagnosis result diagnosed by the diagnosis command are "Display information". “Display of timeout” is displayed when a diagnostic result is not received even if a diagnostic command is issued or a timeout occurs. This information is presented to the CE for notification.

  As described above, on the diagnostic PC 21 side, information is read from the IC tag 11 attached to each unit component 2 constituting the diagnosis target apparatus 1, and when there is failure information, if the failure location can be identified, the failure location can be identified. It is possible to present and inform the CE. Furthermore, when the failure location cannot be specified, a diagnostic command is written to the IC tag 11 attached to the unit part 2, and the diagnostic target device 1 performs self-diagnosis and writes the diagnostic result to the IC tag 11. Can be read and analyzed on the diagnostic PC 21 side, the failure location can be determined, and the failure information, diagnosis command, diagnosis result, and analysis result can be presented to the CE for notification. This will be described in detail below.

  3 and 4 are flowcharts for explaining the operation of the present invention. 3 and 4 show detailed flowcharts when information is written to the IC tag 11.

  3A shows the operation on the unit part 2 side constituting the diagnosis target apparatus of FIG. 1, and FIG. 3B shows the operation on the diagnosis PC 21 side.

  In FIG. 3A, in step S31, a job is executed. This is because the processing means 4 constituting the unit component 2 of the diagnosis target apparatus 1 in FIG. 1 executes the job.

  In S32, it is determined whether an abnormality has been detected. This is to determine whether the abnormality detection means 5 in the unit component 2 of FIG. 1 detects an abnormality (abnormality detection by a sensor, abnormality detection by software) during execution of the job of S31. If YES, the process proceeds to S33. In the case of NO, S31 and subsequent steps are repeated.

  In S33, since abnormality is detected in YES of S32, the abnormality information is written in the IC tag 11. This is because the detected abnormality information (failure information) is written in the IC tag 11 affixed to the unit part 2 in FIG. 1 (or one IC tag 11 (central management IC tag 11 is attached to a plurality of unit parts 2). When it is provided, it is written in the IC tag 11).

  In step S34, it is determined whether a retry is possible. If yes, return to S31 and repeat. If NO, the process ends.

  As described above, when the abnormality is detected on the unit component 2 side, the abnormality information of the unit component 2 in which the abnormality is detected can be written and stored in the IC tag 11.

  In FIG. 3B, S41 reads the IC tag information. The IC tag reader / writer 27 constituting the diagnostic PC 21 in FIG. 1 reads the abnormality information (failure information) of the unit part 2 from the IC tag 11 attached to each unit part 2 of the diagnosis target apparatus 1.

  In S42, it is determined whether or not the collection of abnormality information of all unit parts has been completed. If YES, the process proceeds to S43. In the case of NO, reading of abnormality information of the next unit part 2 is repeated in S41.

  In S43, the failure unit part 2 is specified. This specifies a faulty unit part based on the abnormality information for each unit part 2 read from the IC tag 11 in S41 (for example, the unit part 2 having the abnormality information is specified as a faulty unit part). At this time, failure analysis is executed for the abnormality information, and an analysis result is generated.

  S44 is displayed. This also displays the failure unit part 2 specified in S43 and the failure analysis result. A CE (maintenance personnel) who sees this can determine which unit part 2 constituting the diagnosis target apparatus 1 is faulty and look at the fault analysis result to determine the state of the fault.

  As described above, the job is executed on the unit component 2 side constituting the diagnosis target apparatus 1, and when an abnormality is detected during the execution of the job, the abnormality information (and the status information of the unit component 2) is sent to the IC tag 11. Write to and store. On the other hand, the maintenance staff operates the diagnostic PC 21 in FIG. 1 and automatically collects abnormality information for each unit part 2 from the IC tag 11 attached to the unit part 2 of the diagnosis target apparatus 1 and uses the analysis program to detect the failed unit. The component 2 and the failure analysis result are also displayed on the display, and when the display is seen, the failure of any unit component occurs immediately, and the failure analysis result of what type of failure is observed. It becomes possible to quickly arrange 2 (or, in addition, a faulty component to be configured). At this time, the maintenance personnel automatically read and analyze the abnormality information for each unit part 2 from the IC tag 11 completely and independently without operating the operation panel of the diagnosis target apparatus 1 to be maintained, and the failed unit part. 2 and the failure analysis result can be displayed in association with each other to deal with the failure. In particular, even if the operation of the unit component 2 is stopped on a wireless and independent route on the diagnostic PC 21 side, the abnormality information of the unit component 2 is read from the IC tag 11 affixed to each unit component 2, and the failure location Can be specified.

  FIG. 4 shows an IC tag writing flowchart of the present invention. This is a detailed flowchart when the abnormality information of the unit component 2 is wirelessly written to the IC tag 11 in S33 of FIG. 3 described above.

  In FIG. 4A, S51 determines whether there is a free area in the IC tag 11. In the case of YES, since it has been found that there is a free area in the IC tag 11, the abnormality information of the unit component 2 is written in the free area of the IC tag 11 in S52. On the other hand, in the case of NO, since it has been found that there is no empty area in the IC tag 11, the abnormality information is written (overwritten) in the oldest record in S53.

  As described above, when the failure information writing means 8 in FIG. 1 writes the abnormality information of the unit part 2 to the IC tag 11, if there is an empty record in the IC tag 11, the abnormality information is written in the empty record. When there is no record, the oldest time (the time information in the abnormality information of the IC tag 11 in FIG. 7 or the oldest time out of the time when the abnormality information was actually written to the IC tag 11 not shown) By overwriting the record, it becomes possible to always leave a predetermined number of abnormal information of the latest unit part 2.

  In FIG. 4B, S61 determines whether there is a record of the same abnormality information. This is because when the failure information writing means 8 in FIG. 1 writes the abnormality information of the unit component 2 to the IC tag 11, there is the same record from the IC tag 11 (record with the same abnormality information for each unit component 2). Determine. In the case of YES, since it is found that the same abnormality information has already been written in the IC tag 11, the number of times of the record is incremented by 1 in S62 (for example, the number of times of the abnormality information column is incremented by 1 and the number of occurrences has occurred. Remember that). On the other hand, in the case of NO, the process proceeds to S51 of FIG. 4A described above, and is written in the empty area (or the oldest record).

  As described above, when the abnormality information is written in the IC tag 11, if the abnormality information of the same unit part 2 has already been written in the IC tag 11, the number of occurrences is incremented by 1 and the number of occurrences is stored. It is possible to eliminate the situation where the abnormality information of the IC tag 3 is overwritten with the abnormality information of the unit (see FIG. 7).

  In FIG. 4C, S71 determines whether the IC tag 11 has a free area. In the case of YES, since it has been found that there is a free area in the IC tag 11, the abnormality information is written in the free area in S52 of FIG. On the other hand, in the case of NO, since it has been found that there is no free space in the IC tag 11, it is written to another memory (for example, abnormal information of a predetermined number of records from the old time is written to another memory (for example, a hard disk device for saving). The current abnormality information is written into the IC tag 11 while being saved.

  In S72, the area of the IC tag 11 is made usable. This sets the area (record) of the IC tag 11 written and saved in another memory (the spare IC tag 11 or the hard disk device) in S71 to be usable (for example, empty). Here, when there are a plurality of IC tags 11, the spare IC tags 11 may be associated with each IC tag 11 and evacuated, or may be evacuated. These IC tags 11 may be provided, and when each IC tag 11 becomes full, it may be evacuated to the shared spare IC tag 11.

  FIG. 5 shows a flowchart (part 2) for explaining the operation of the present invention. In FIG. 5, the timer 10 is set on the diagnosis target apparatus 1 side, and the diagnosis result by the self-diagnosis means 3 is written to the IC tag 11 for the set time, or the timer 26 is set on the diagnosis PC 21 side. The procedure when the diagnosis command is written to the IC tag 11 and instructed, and it is determined that the time is over when the diagnosis result is not written to the IC tag 11 even after the set time has elapsed is shown. Here, S81 to S84 in FIG. 5 are the same as S1 to S4 in FIG. 2, and S91 to S102 (except S96) in FIG. 5 are the same as S11 to S22 in FIG.

In FIG. 5, since the failure information could not be identified by analyzing the failure information in S <b> 94, S <b> 96 writes the diagnosis command and timer value from the unit diagnosis execution means 25 to the IC tag 11. This is because the failure location of the unit component 2 could not be specified only by analyzing the failure information. In order to specify this, the diagnosis command and the timer 10 of the unit component 2 are used.
The timer value to be set is written in the IC tag 11 attached to the corresponding unit part 2. Then, in S85 to S89 of FIG. 5 described above, the diagnosis command and timer value written in the IC tag 11 are read and executed by the diagnosis target apparatus 1, and the diagnosis result is written in the IC tag 11.

  As described above, on the diagnostic PC 21 side, information is read from the IC tag 11 attached to each unit component 2 constituting the diagnosis target apparatus 1, and when there is failure information, if the failure location can be identified, the failure location can be identified. It is possible to present and notify the CE (S91 to S95). Further, when the fault location cannot be specified, the diagnostic command and the timer value are written in the IC tag 11 attached to the unit part 2 and the diagnosis target device 1 performs self-diagnosis so that the diagnostic result is written in the IC tag 11. Then, it can be read out and analyzed on the diagnostic PC 21 side, the failure location is determined, and the failure information, the diagnostic command, the diagnosis result, and the analysis result can be presented and notified to the CE (from S96 to S102). ).

  FIG. 6 shows a flowchart (part 3) for explaining the operation of the present invention. 6 shows that when the failure location cannot be identified even after analyzing the failure information of the unit component 3 read from the IC tag 11 of FIG. 5 (the failure location cannot be identified in S121 to S124), Based on the failure history of the unit part 3 read from the pasted IC tag (failure history) 12, the priority diagnostic units are extracted in S-1 to S-3 and the unit parts 2 are diagnosed in that order. Is. Here, S111 to S119 in FIG. 6 are the same as S81 to S89 in FIG. 5, and S121 to S132 in FIG. 6 are the same as S91 to S102 in FIG.

  In FIG. 6, S-1 reads the failure history IC tag 12. This is because the failure history information is obtained from the IC tag (failure history) 12 (or failure history area in the IC tag 11, the same applies hereinafter) attached to the unit component 2 of the diagnosis target apparatus 1, and the IC tag reader / writer shown in FIG. 27 reads the radio.

  In S-2, it is determined whether there is history information. This determines whether there is failure history information from the IC tag (failure history) 12 attached to the corresponding component unit 2 in S-1. In the case of YES, the priority diagnosis unit is extracted in S-3 (for example, the unit component 2 having a large number of failures is extracted as the priority diagnosis unit), and the process proceeds to S126. If no, the process proceeds to S126.

  By the above S-1 to S-3, the failure information is read from the IC tag 11 attached to each of the many unit parts 2 constituting the diagnosis target apparatus 1, and the failure location is identified by analyzing the failure information. When the failure part cannot be identified (the failure part cannot be specified in S124), the failure history information is read from the IC tag (failure history) 12 attached to the unit component 2 and the failure information is read out based on the failure history information. The unit part 2 to be preferentially diagnosed is extracted, the diagnosis command is written in the IC tag 11 attached to the unit part 2, the diagnosis result is read and analyzed, and the fault location is efficiently and past failure history is also obtained. It is possible to specify quickly (S126 to S130).

  FIG. 7 shows an example of IC tag failure information according to the present invention. The following information shown in the figure is written in the IC tag 11 or the written information is read out.

・ Tag ID:
・ Failure information:
・ Device name: ATM
·Serial number:
·Machine number:
-Log information area
・ No:
·Date and time of occurrence:
-Source mode:
・ Error log information:
·Error code:
・ Fault detection address:
ICC log information:
・ ICC code:
・ Cash serial number:
·importance:
・ Number of occurrences:
・ Other:
Here, the tag ID is a unique ID assigned to the IC tag 11. The failure information is failure information of the unit part 2 to which the IC tag 11 is attached, and is composed of a device name, a manufacturing number, a machine number, a log information area, an importance level, the number of occurrences, and the like. The device name, production number, and machine number are information such as the device name, production number, and machine number of the unit part 2 to which the IC tag 11 is attached. The log information area is an area in which a log of failure information that has occurred in the unit component 2 is written (overwrites the oldest one when it is full and writes new failure information. It is not overwritten, and the same failure information counts up the number of occurrences). The illustrated information is stored in the log information area. The importance level sets the importance level of the failure information (set by referring to a table in which the importance level is set in advance). The number of occurrences is to count up the number of occurrences when the same failure information occurs.

  As described above, the failure information is written and stored in the IC tag 11 attached to each unit component 2 constituting the diagnosis target apparatus 1, so that the IC attached to the unit component 2 wirelessly from the external diagnostic PC 21 is stored. It is possible to read out and analyze the failure information of the unit component 2 through a path independent from the tag 11 and specify the failure location.

  FIG. 8 shows an example of an IC tag diagnosis command of the present invention. This is an example of a diagnostic command and its diagnostic result for identifying the fault location when the fault information of the unit part 2 read from the IC tag 11 is analyzed and the fault location cannot be identified. The following information is associated with each other.

・ Diagnostic command code:
・ Target unit:
·Diagnosis:
・ Other:
Here, the diagnostic command code is a diagnostic command code for self-diagnosis of the unit component 2. The target unit is the unit part 2 (or ID) to be self-diagnosed with the diagnosis command. The diagnosis result is a diagnosis result (OK, NG) when the self-diagnosis is performed with the diagnosis command.

  As described above, by issuing a diagnostic command and obtaining the diagnostic result, even if the failure location cannot be identified by failure information, the diagnostic command is issued sequentially and its operation is checked to identify the failure location individually. It becomes possible.

  FIG. 9 shows an example of IC tag failure history information of the present invention. The following information shown in the figure is written in the IC tag (failure history) 12 and read out as necessary.

・ No:
・ Exchange date:
-Replacement unit:
・ Failure phenomenon:
·Error code:
・ IOC code:
・ Number of exchanges:
・ Other:
Here, No is a sequential number for managing records. The replacement date is a date when the unit part 2 in which a failure has occurred in the diagnosis target apparatus 1 and a new (or repaired) unit part 2 are replaced. The replacement unit is the name of the replaced unit part, ID, and the like. The failure phenomenon is a failure phenomenon (error code, IOC code, etc.) that has occurred in the past. The number of exchanges is the number of exchanges in the past.

  As described above, the IC tag (failure history) 12 is affixed to the unit part 2 and the past failure history information (replacement date, replacement unit, failure information, number of replacements, etc.) of the unit part 2 is accumulated and stored. Thus, when an intermittent failure occurs, the past failure history information is read and a diagnosis command for diagnosing the failure is preferentially passed to the corresponding unit part via the IC tag 11 for self-diagnosis, and the diagnosis result is displayed. It is possible to receive and analyze via the IC tag 11 and to find a faulty part quickly and efficiently (see S-1 to S-3 in FIG. 6 described above). At this time, as described in the lower part of FIG. 9, the diagnostic unit extraction priority is determined in the order of replacement count> latest date> phenomenon code coincidence, and diagnostic commands are sequentially transmitted from the high priority unit component 2 via the IC tag 11. The diagnosis result is received via the IC tag 11 and analyzed, so that the failure location can be identified efficiently and quickly.

  The present invention collects log information and sends diagnostic commands at an independent path regardless of the power ON / OFF of the device to be diagnosed, and at the same level regardless of the hierarchy of the component units constituting the device. Thus, the diagnosis results can be easily collected.

It is a system configuration diagram of the present invention. It is operation | movement explanatory flowchart (the 1) of this invention. It is an operation | movement explanatory flowchart of this invention. It is an operation | movement explanatory flowchart of this invention. It is operation | movement description flowchart (the 2) of this invention. It is operation | movement description flowchart (the 3) of this invention. It is an example of IC tag failure information of the present invention. It is an example of an IC tag diagnosis command of the present invention. It is an example of IC tag failure log | history information of this invention.

Explanation of symbols

1: Diagnosis target device 2: Unit part 3: Self-diagnosis means 4: Processing means 5: Abnormality detection means 6: IC tag interface means 7: Self-diagnosis control means 8: Failure information writing means 9: IC tag reader / writer 10: Timer 11: IC tag 12: IC tag (failure history)
21: PC for diagnosis
22: diagnosis control means 23: failure history priority diagnosis means 24: failure information analysis means 25: unit diagnosis execution means 26: timer 27: IC tag reader / writer 28: input device 29: display device

Claims (5)

In a diagnostic system for diagnosing unit parts constituting a computer system,
An IC tag provided for each unit part or a plurality of unit parts constituting the computer system, and affixed to the one unit part or the plurality of unit parts;
Wherein provided for each single unit component or each plurality of unit parts, and self-test function for the self-diagnosis of the one unit part or the plurality of unit member based on self-test program,
Wherein provided for each single unit component or each plurality of unit parts, wherein the IC tag read the diagnostic command notifies the self-diagnosis function self is diagnosed, to the IC tag receives its self-test results writing, and the optionally collect self diagnostic function diagnostic system characterized in that an IC tag reader-writer that writes to the IC tag reads the log information stored in the memory. It comprises a first means for reading log information from the IC tag, and writes the diagnosis command from the outside to the IC tag, either or both of the second means for reading out the self diagnosis result from the IC tag The diagnostic system according to claim 1, wherein: The self-diagnosis function of the timer provided, until the time over by setting the initial value or the specified value to the timer, wherein, characterized in that it comprises means for unit parts diagnostic command fails or diagnosis The diagnostic system of Claim 1 or Claim 2. For each unit part or a plurality of unit parts, the IC tag or the second IC tag that accumulates past failure history information of the one unit part or the plurality of unit parts is provided.
The diagnostic apparatus determines a priority order of unit component diagnosis based on failure history information read from the IC tag or the second IC tag, and executes diagnosis of the unit component with a diagnostic command in the priority order. The diagnostic system according to any one of claims 1 to 3. In a diagnostic method for diagnosing unit parts constituting a computer system,
An IC tag provided for each unit part or a plurality of unit parts constituting the computer system, and affixed to the one unit part or the plurality of unit parts;
Wherein provided for each single unit component or each plurality of unit parts, and self-test function for the self-diagnosis of the one unit part or the plurality of unit member based on self-test program,
Wherein provided for each single unit component or each plurality of unit parts, wherein the IC tag read the diagnostic command notifies the self-diagnosis function self is diagnosed, to the IC tag receives its self-test results writing, and the optionally collect self diagnosis function reads out the log information stored in the memory and an IC tag reader-writer that writes to the IC tag,
The IC tag reads the log information from the steps, and writes the diagnosis command from the outside to the IC tag, the diagnostic method with either or both of the step of reading the self diagnosis result from the IC tag.

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