JP4464096B2 - 成形式渦電流アレイプローブ - Google Patents

成形式渦電流アレイプローブ Download PDF

Info

Publication number
JP4464096B2
JP4464096B2 JP2003330963A JP2003330963A JP4464096B2 JP 4464096 B2 JP4464096 B2 JP 4464096B2 JP 2003330963 A JP2003330963 A JP 2003330963A JP 2003330963 A JP2003330963 A JP 2003330963A JP 4464096 B2 JP4464096 B2 JP 4464096B2
Authority
JP
Japan
Prior art keywords
eddy current
probe
current array
insert
probe body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003330963A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004117359A5 (enExample
JP2004117359A (ja
Inventor
ウィリアム・スチュアート・マックナイト
シュリドハル・チャンパクナス・ナス
サンディー・エリザベス・グレシャム
リチャード・ロイド・トラントウ
ダグラス・エドワード・イングラム
ジョン・ウィリアム・アーテル
トマス・ジェームズ・バツィンゲル
カーチス・ウェイン・ローズ
フランシス・ハワード・リトル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2004117359A publication Critical patent/JP2004117359A/ja
Publication of JP2004117359A5 publication Critical patent/JP2004117359A5/ja
Application granted granted Critical
Publication of JP4464096B2 publication Critical patent/JP4464096B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP2003330963A 2002-09-24 2003-09-24 成形式渦電流アレイプローブ Expired - Fee Related JP4464096B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/253,848 US6812697B2 (en) 2002-09-24 2002-09-24 Molded eddy current array probe

Publications (3)

Publication Number Publication Date
JP2004117359A JP2004117359A (ja) 2004-04-15
JP2004117359A5 JP2004117359A5 (enExample) 2006-11-09
JP4464096B2 true JP4464096B2 (ja) 2010-05-19

Family

ID=31977810

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003330963A Expired - Fee Related JP4464096B2 (ja) 2002-09-24 2003-09-24 成形式渦電流アレイプローブ

Country Status (4)

Country Link
US (1) US6812697B2 (enExample)
EP (1) EP1403635B1 (enExample)
JP (1) JP4464096B2 (enExample)
DE (1) DE60327914D1 (enExample)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8180585B2 (en) * 1999-08-26 2012-05-15 Tk Holdings, Inc. Magnetic crash sensor
US20070188168A1 (en) * 1999-08-26 2007-08-16 Stanley James G Magnetic sensor
US7514917B2 (en) * 2003-09-19 2009-04-07 Automotive Systems Laboratory, Inc. Magnetic crash sensor
US7209844B2 (en) * 2003-09-19 2007-04-24 Automotive Systems Laboratory, Inc. Magnetic crash sensor
US20080109177A1 (en) * 2003-09-19 2008-05-08 Cech Leonard S Magnetic crash sensor
JP2007510134A (ja) * 2003-09-19 2007-04-19 オートモーティブ システムズ ラボラトリー インコーポレーテッド 磁気衝突検知方法
US7839143B2 (en) * 2003-09-19 2010-11-23 Tk Holdings Inc. Eddy current magnetic crash sensor
US7463987B2 (en) * 2003-09-19 2008-12-09 Takata Holdings, Inc. Magnetic sensing system and method
US7772839B2 (en) * 2003-09-19 2010-08-10 Tk Holdings, Inc. Eddy current magnetic crash sensor
US7839142B2 (en) * 2003-09-19 2010-11-23 Tk Holdings, Inc. Magnetic crash sensor
CN101035699A (zh) * 2003-12-21 2007-09-12 汽车系统实验室公司 磁传感器
US7026811B2 (en) * 2004-03-19 2006-04-11 General Electric Company Methods and apparatus for eddy current inspection of metallic posts
US7015690B2 (en) * 2004-05-27 2006-03-21 General Electric Company Omnidirectional eddy current probe and inspection system
US6952094B1 (en) * 2004-12-22 2005-10-04 General Electric Company Nondestructive inspection method and system therefor
JP2009507210A (ja) * 2005-07-29 2009-02-19 オートモーティブ システムズ ラボラトリー インコーポレーテッド 磁気衝突センサー
EP1952135A4 (en) 2005-11-03 2011-12-14 Coastal Res Corp CONVIVIAL FOUCAULT CURRENT NETWORK
JP4736753B2 (ja) * 2005-11-30 2011-07-27 株式会社日立製作所 渦電流探傷プローブと被検査体のリフトオフ量評価方法及びその評価装置並びに渦電流探傷方法及び渦電流探傷装置
US7402999B2 (en) * 2005-11-30 2008-07-22 General Electric Company Pulsed eddy current pipeline inspection system and method
FR2901611B1 (fr) * 2006-05-24 2009-01-16 Airbus France Sas Dispositif de controle non destructif d'une piece par analyse de distribution du champ magnetique de fuite
FR2901609B1 (fr) 2006-05-24 2009-01-16 Airbus France Sas Dispositif de controle non destructif d'une piece par analyse de dissipation de rayonnement
FR2916852B1 (fr) * 2007-05-30 2009-09-11 Snecma Sa Reperage de points d'interet sur une zone de la surface d'une piece et application a l'optimisation de la trajectoire et de l'angulation des sondes a courants de foucault
JP2009002787A (ja) * 2007-06-21 2009-01-08 Hitachi-Ge Nuclear Energy Ltd 渦電流探傷プローブ
KR100881265B1 (ko) 2007-07-27 2009-02-05 한국전력공사 보빈형 와전류 탐촉자
US7888932B2 (en) * 2007-11-05 2011-02-15 General Electric Company Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same
US7952348B2 (en) * 2007-11-05 2011-05-31 General Electric Company Flexible eddy current array probe and methods of assembling the same
US8704512B2 (en) 2008-03-27 2014-04-22 Honda Motor Co., Ltd. Nondestructive testing system for steel workpiece
US7956607B2 (en) * 2008-09-09 2011-06-07 General Electric Company Digital ferromagnetic part inspection
US8269489B2 (en) * 2008-11-25 2012-09-18 General Electric Company System and method for eddy current inspection of parts with complex geometries
US8395378B2 (en) 2010-04-29 2013-03-12 General Electric Company Nondestructive robotic inspection method and system therefor
CN101923070B (zh) * 2010-06-23 2012-04-18 北京理工大学 一种齿轮损伤检测方法与装置
ES2402722B1 (es) * 2011-10-31 2014-07-18 Tecnatom, S.A. Sonda array integrada para inspección de defectos en componentes mediante corrientes inducidas y método para operación de dicha sonda array.
US9110036B2 (en) 2012-08-02 2015-08-18 Olympus Ndt, Inc. Assembly with a universal manipulator for inspecting dovetail of different sizes
US9689262B2 (en) 2013-06-05 2017-06-27 General Electric Company Thermographic inspection system for composite wind turbine blade
US9646599B2 (en) * 2013-10-24 2017-05-09 Spirit Aerosystems, Inc. Remoldable contour sensor holder
FR3058522B1 (fr) * 2016-11-10 2021-01-29 Commissariat Energie Atomique Tete de controle pour capteurs a courants de foucault
CA2956749A1 (en) * 2017-01-27 2018-07-27 Global Inspections-Ndt, Inc. Form-fitting eddy current array sensor and method of use thereof
TWI627411B (zh) * 2017-12-15 2018-06-21 致茂電子股份有限公司 電流探針結構
US10895554B2 (en) * 2018-08-14 2021-01-19 Southwest Research Institute Flexible eddy current test probe using a shape-memory alloy for surface conformance
CN114280139B (zh) * 2021-12-15 2025-04-18 爱德森（厦门）电子有限公司 一种异形金属部件适形涡流检测方法及其检测装置
WO2023201193A1 (en) 2022-04-13 2023-10-19 Metso Outotec USA Inc. Autonomous non-destructive testing system and use thereof for inspecting gear teeth in an open gear set
US12298274B2 (en) * 2022-09-05 2025-05-13 General Electric Company Flexible sensor assembly
WO2025079216A1 (ja) * 2023-10-12 2025-04-17 三菱ジェネレーター株式会社 欠陥検出装置、及び欠陥検出装置の製造方法
US20250123242A1 (en) * 2023-10-16 2025-04-17 Rtx Corporation Eddy current probe assembly

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136240A (en) * 1991-05-06 1992-08-04 General Electric Company Automatically self-adjusting eddy current probe for bolt hole inspection
US5315234A (en) 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
US5371461A (en) * 1992-06-26 1994-12-06 General Electric Company Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements
US5442286A (en) * 1993-09-22 1995-08-15 General Electric Company Eddy current array inspection device
US5841277A (en) * 1996-07-30 1998-11-24 General Electric Company Hand-holdable probe having a flexible eddy current sensor
US5903147A (en) * 1997-03-18 1999-05-11 General Electric Company Eddy current array inspection device for shaped holes
US5895871A (en) * 1997-07-25 1999-04-20 General Electric Company Finger controlled inspection apparatus
US6114849A (en) * 1998-04-17 2000-09-05 United Western Technologies Corp. Flexible eddy current test probe
US6198280B1 (en) * 1998-04-27 2001-03-06 Siemens Westinghouse Power Corporation Eddy current flexible field probe deployed through a loading platform
US6339326B1 (en) 2000-03-15 2002-01-15 General Electric Company Eddy current inspection probe
US6545467B1 (en) 2000-10-27 2003-04-08 General Electric Company Contoured surface eddy current inspection system
US6469503B2 (en) * 2001-03-26 2002-10-22 General Electric Company Eddy current inspection probe and method of use

Also Published As

Publication number Publication date
US6812697B2 (en) 2004-11-02
JP2004117359A (ja) 2004-04-15
EP1403635A1 (en) 2004-03-31
DE60327914D1 (de) 2009-07-23
EP1403635B1 (en) 2009-06-10
US20040056656A1 (en) 2004-03-25

Similar Documents

Publication Publication Date Title
JP4464096B2 (ja) 成形式渦電流アレイプローブ
US5315234A (en) Eddy current device for inspecting a component having a flexible support with a plural sensor array
US5442286A (en) Eddy current array inspection device
EP3615949B1 (en) Probe card for a testing apparatus of electronic devices
US6288537B1 (en) Eddy current probe with foil sensor mounted on flexible probe tip and method of use
US5903147A (en) Eddy current array inspection device for shaped holes
KR101898475B1 (ko) 육각형 모듈들을 사용하여 구성된 프로브-카드 인터포저
US10677756B2 (en) Integrated sensor cartridge system and method of use
US5696653A (en) Tooling for holding a head gimbal assembly
US5479099A (en) Magnetic inspection head suited for contoured or irregular surfaces
US6469503B2 (en) Eddy current inspection probe and method of use
US9110036B2 (en) Assembly with a universal manipulator for inspecting dovetail of different sizes
JP4919050B2 (ja) フローティング機構
CN212277150U (zh) 样品台及电子显微镜
CN117129919A (zh) 一种磁悬浮轴承的磁通量密度测量方法和装置
CN114646784A (zh) 可精确定位的测试座
JP2006038676A (ja) 渦流探傷装置のマルチコイル式プローブ及びその製造方法
US20090199652A1 (en) Tensile specimen measuring apparatus and method
JP2006300791A (ja) 渦電流探傷用マルチコイルプローブ
CN114993535B (zh) Rf屏蔽波纹管接触指力量化测试装置及测试方法
EP1281956A1 (en) Compliant laminar eddy current sensitivity standard
JP2009244280A (ja) 渦電流探傷用マルチコイルプローブ
JPH0850016A (ja) 湾曲ガラスの曲率測定装置
CN204462196U (zh) 定位部件、固定台座、以及具有该部件和台座的检查治具
KR100922589B1 (ko) 스크라이브 라인 측정용 서포터

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060921

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060921

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20081202

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090630

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20090925

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20090925

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20090925

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20091001

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091228

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100126

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100218

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130226

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130226

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140226

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees