JP4397396B2 - レーザ光イオン化装置への直接液体注入口 - Google Patents

レーザ光イオン化装置への直接液体注入口 Download PDF

Info

Publication number
JP4397396B2
JP4397396B2 JP2006514270A JP2006514270A JP4397396B2 JP 4397396 B2 JP4397396 B2 JP 4397396B2 JP 2006514270 A JP2006514270 A JP 2006514270A JP 2006514270 A JP2006514270 A JP 2006514270A JP 4397396 B2 JP4397396 B2 JP 4397396B2
Authority
JP
Japan
Prior art keywords
photoionization
sample
area
analyte
liquid sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006514270A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006525528A5 (enExample
JP2006525528A (ja
Inventor
オーサー・ハラルド
コッジオラ・マイケル・ジェイ．
ヤング・スティーブン・イー．
クロスレイ・デイビッド・アール．
Original Assignee
ヤスミ・キャピタル，リミテッド・ライアビリティ・カンパニー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ヤスミ・キャピタル，リミテッド・ライアビリティ・カンパニー filed Critical ヤスミ・キャピタル，リミテッド・ライアビリティ・カンパニー
Publication of JP2006525528A publication Critical patent/JP2006525528A/ja
Publication of JP2006525528A5 publication Critical patent/JP2006525528A5/ja
Application granted granted Critical
Publication of JP4397396B2 publication Critical patent/JP4397396B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006514270A 2003-04-29 2004-04-29 レーザ光イオン化装置への直接液体注入口 Expired - Fee Related JP4397396B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US46716203P 2003-04-29 2003-04-29
PCT/US2004/013821 WO2004097891A2 (en) 2003-04-29 2004-04-29 Direct liquid injection inlet to a laser photoionization apparatus

Publications (3)

Publication Number Publication Date
JP2006525528A JP2006525528A (ja) 2006-11-09
JP2006525528A5 JP2006525528A5 (enExample) 2007-07-19
JP4397396B2 true JP4397396B2 (ja) 2010-01-13

Family

ID=33418440

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006514270A Expired - Fee Related JP4397396B2 (ja) 2003-04-29 2004-04-29 レーザ光イオン化装置への直接液体注入口

Country Status (3)

Country Link
US (1) US7095016B2 (enExample)
JP (1) JP4397396B2 (enExample)
WO (1) WO2004097891A2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1672674A1 (de) * 2004-12-17 2006-06-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Untersuchungsverfahren und -system zur Hochdurchsatzmassenanalyse
EP2017875A1 (en) * 2007-07-16 2009-01-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Method and apparatus for providing a sample for a subsequent analysis
EP2230702A1 (en) 2009-03-19 2010-09-22 Ecole Polytechnique Fédérale de Lausanne (EPFL) Modified surface

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4358302A (en) 1980-11-24 1982-11-09 The University Of Rochester Apparatus for separation of gas borne particles
US5285064A (en) 1987-03-06 1994-02-08 Extrel Corporation Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
US6653626B2 (en) 1994-07-11 2003-11-25 Agilent Technologies, Inc. Ion sampling for APPI mass spectrometry
US5917185A (en) * 1997-06-26 1999-06-29 Iowa State University Research Foundation, Inc. Laser vaporization/ionization interface for coupling microscale separation techniques with mass spectrometry
US6140639A (en) * 1998-05-29 2000-10-31 Vanderbilt University System and method for on-line coupling of liquid capillary separations with matrix-assisted laser desorption/ionization mass spectrometry
ATE386335T1 (de) 1999-10-29 2008-03-15 Mds Inc Through Its Mds Sciex Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie- massenspekrometrie
EP1193730A1 (en) * 2000-09-27 2002-04-03 Eidgenössische Technische Hochschule Zürich Atmospheric-pressure ionization device and method for analysis of a sample
US6858841B2 (en) * 2002-02-22 2005-02-22 Agilent Technologies, Inc. Target support and method for ion production enhancement
US6646257B1 (en) * 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source

Also Published As

Publication number Publication date
JP2006525528A (ja) 2006-11-09
WO2004097891A2 (en) 2004-11-11
US20040222373A1 (en) 2004-11-11
WO2004097891A3 (en) 2005-03-17
US7095016B2 (en) 2006-08-22

Similar Documents

Publication Publication Date Title
Borsdorf et al. Recent developments in ion mobility spectrometry
US7968842B2 (en) Apparatus and systems for processing samples for analysis via ion mobility spectrometry
US4968885A (en) Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
Wu et al. Secondary electrospray ionization ion mobility spectrometry/mass spectrometry of illicit drugs
JP5002365B2 (ja) 質量分析装置及び質量分析方法
Tunheng et al. Development of signal smoothing device for precise elemental analysis using laser ablation-ICP-mass spectrometry
JP5815533B2 (ja) イオン移動度センサーに供給するサンプルを調製する装置
Chen et al. Recent applications of ambient ionization mass spectrometry in environmental analysis
US8022360B2 (en) Gas pre-concentrator for detection apparatus
JP2007535097A (ja) レーザ光イオン化質量分析を使用して連続流動試料系から微量有機物質を検出及び確認する方法及び装置
JP2009180731A (ja) 質量分析におけるノイズを低減するための方法および装置
JPH09231938A (ja) 三次元四重極イオントラップ質量分析装置
Proctor et al. Atmospheric pressure ionization mass spectrometry
US9664657B2 (en) Pulsed admission of analyte to detection apparatus
US5359196A (en) Mass spectrometry with gas counterflow for particle beam
JP2006525528A (ja) レーザ光イオン化装置への直接液体注入口
US20200393410A1 (en) Techniques for mass analysis of aerosol particles
GB2240176A (en) Introduction of affluent into mass spectrometers and other gas-phase or particle detectors
CN108700553A (zh) 使用化学标记改善样品中组分的鉴定、量化和空间定位的方法
JPH0582080A (ja) 質量分析計
US20240118286A1 (en) Methods and systems for measuring endogenous analytes utilzing an origin-adjusted approach
RU2273842C1 (ru) Способ спектрального анализа
Pham et al. Analytical approaches for disease detection
Kotkovskii et al. A laser ion-mobility spectrometer
McLintic et al. Gas Analysis

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070427

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070427

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20071119

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20091002

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20091020

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121030

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121030

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131030

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees