JP4367263B2 - 拡散計測装置 - Google Patents
拡散計測装置 Download PDFInfo
- Publication number
- JP4367263B2 JP4367263B2 JP2004204024A JP2004204024A JP4367263B2 JP 4367263 B2 JP4367263 B2 JP 4367263B2 JP 2004204024 A JP2004204024 A JP 2004204024A JP 2004204024 A JP2004204024 A JP 2004204024A JP 4367263 B2 JP4367263 B2 JP 4367263B2
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- Prior art keywords
- refractive index
- region
- particle
- electrode
- optical waveguide
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004204024A JP4367263B2 (ja) | 2004-07-12 | 2004-07-12 | 拡散計測装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2004204024A JP4367263B2 (ja) | 2004-07-12 | 2004-07-12 | 拡散計測装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006029781A JP2006029781A (ja) | 2006-02-02 |
JP2006029781A5 JP2006029781A5 (ru) | 2007-02-08 |
JP4367263B2 true JP4367263B2 (ja) | 2009-11-18 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2004204024A Expired - Fee Related JP4367263B2 (ja) | 2004-07-12 | 2004-07-12 | 拡散計測装置 |
Country Status (1)
Country | Link |
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JP (1) | JP4367263B2 (ru) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008051606A (ja) * | 2006-08-23 | 2008-03-06 | Shimadzu Corp | 粒子径計測方法および計測装置 |
JP2008096191A (ja) * | 2006-10-10 | 2008-04-24 | Shimadzu Corp | 誘電泳動特性評価方法 |
JP4830909B2 (ja) * | 2007-02-28 | 2011-12-07 | 株式会社島津製作所 | 粒子測定装置 |
JP5720504B2 (ja) * | 2011-09-09 | 2015-05-20 | 株式会社島津製作所 | 粒子径測定装置 |
JP7205851B2 (ja) * | 2018-05-30 | 2023-01-17 | 国立大学法人東京工業大学 | 屈折率測定装置、屈折率測定方法およびプログラム |
CN115461607A (zh) * | 2020-04-28 | 2022-12-09 | 松下知识产权经营株式会社 | 计数方法以及计数装置 |
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2004
- 2004-07-12 JP JP2004204024A patent/JP4367263B2/ja not_active Expired - Fee Related
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Publication number | Publication date |
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JP2006029781A (ja) | 2006-02-02 |
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