JP4367263B2 - 拡散計測装置 - Google Patents

拡散計測装置 Download PDF

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Publication number
JP4367263B2
JP4367263B2 JP2004204024A JP2004204024A JP4367263B2 JP 4367263 B2 JP4367263 B2 JP 4367263B2 JP 2004204024 A JP2004204024 A JP 2004204024A JP 2004204024 A JP2004204024 A JP 2004204024A JP 4367263 B2 JP4367263 B2 JP 4367263B2
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Japan
Prior art keywords
refractive index
region
particle
electrode
optical waveguide
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Japanese (ja)
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JP2006029781A (ja
JP2006029781A5 (enExample
Inventor
直司 森谷
健二 田窪
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Shimadzu Corp
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Shimadzu Corp
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JP2004204024A 2004-07-12 2004-07-12 拡散計測装置 Expired - Fee Related JP4367263B2 (ja)

Priority Applications (1)

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JP2004204024A JP4367263B2 (ja) 2004-07-12 2004-07-12 拡散計測装置

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JP2004204024A JP4367263B2 (ja) 2004-07-12 2004-07-12 拡散計測装置

Publications (3)

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JP2006029781A JP2006029781A (ja) 2006-02-02
JP2006029781A5 JP2006029781A5 (enExample) 2007-02-08
JP4367263B2 true JP4367263B2 (ja) 2009-11-18

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JP2004204024A Expired - Fee Related JP4367263B2 (ja) 2004-07-12 2004-07-12 拡散計測装置

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JP (1) JP4367263B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008051606A (ja) * 2006-08-23 2008-03-06 Shimadzu Corp 粒子径計測方法および計測装置
JP2008096191A (ja) * 2006-10-10 2008-04-24 Shimadzu Corp 誘電泳動特性評価方法
JP4830909B2 (ja) * 2007-02-28 2011-12-07 株式会社島津製作所 粒子測定装置
JP5720504B2 (ja) * 2011-09-09 2015-05-20 株式会社島津製作所 粒子径測定装置
JP7205851B2 (ja) * 2018-05-30 2023-01-17 国立大学法人東京工業大学 屈折率測定装置、屈折率測定方法およびプログラム
EP4145110A4 (en) * 2020-04-28 2023-10-04 Panasonic Intellectual Property Management Co., Ltd. COUNTING METHOD AND COMMUNICATION DEVICE

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