JP4307741B2 - フローサイトメータ用固体素子ｒｆ発振−検出器 - Google Patents

フローサイトメータ用固体素子ｒｆ発振−検出器 Download PDF

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Publication number
JP4307741B2
JP4307741B2 JP2000600078A JP2000600078A JP4307741B2 JP 4307741 B2 JP4307741 B2 JP 4307741B2 JP 2000600078 A JP2000600078 A JP 2000600078A JP 2000600078 A JP2000600078 A JP 2000600078A JP 4307741 B2 JP4307741 B2 JP 4307741B2
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Japan
Prior art keywords
jfet
oscillator
circuit
voltage
coupled
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Expired - Lifetime
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JP2000600078A
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English (en)
Japanese (ja)
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JP2002537556A (ja
JP2002537556A5 (enExample
Inventor
ケイ． ハッシャー，フレデリック
シュネイダー，ジェラルド
ラミルツ，ラザロ
Original Assignee
コールター インターナショナル コーポレイション
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Priority claimed from US09/374,911 external-priority patent/US6323632B1/en
Application filed by コールター インターナショナル コーポレイション filed Critical コールター インターナショナル コーポレイション
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Publication of JP2002537556A5 publication Critical patent/JP2002537556A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
    • H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
    • H03B5/1206—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification
    • H03B5/1218—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification the generator being of the balanced type
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
    • H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
    • H03B5/1228—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device the amplifier comprising one or more field effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
    • H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
    • H03B5/1237—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator
    • H03B5/124—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator the means comprising a voltage dependent capacitance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
    • H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
    • H03B5/1296—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device the feedback circuit comprising a transformer

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Power Engineering (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2000600078A 1999-02-18 2000-02-03 フローサイトメータ用固体素子ｒｆ発振−検出器 Expired - Lifetime JP4307741B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US25249899A 1999-02-18 1999-02-18
US09/252,498 1999-02-18
US09/374,911 1999-08-13
US09/374,911 US6323632B1 (en) 1999-08-13 1999-08-13 Solid state RF oscillator-detector for flow cytometer
PCT/US2000/002743 WO2000049386A2 (en) 1999-02-18 2000-02-03 Solid state rf oscillator-detector for flow cytometer

Publications (3)

Publication Number Publication Date
JP2002537556A JP2002537556A (ja) 2002-11-05
JP2002537556A5 JP2002537556A5 (enExample) 2007-02-22
JP4307741B2 true JP4307741B2 (ja) 2009-08-05

Family

ID=26942369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000600078A Expired - Lifetime JP4307741B2 (ja) 1999-02-18 2000-02-03 フローサイトメータ用固体素子ｒｆ発振−検出器

Country Status (4)

Country Link
EP (1) EP1153279B1 (enExample)
JP (1) JP4307741B2 (enExample)
DE (1) DE60007617T2 (enExample)
WO (1) WO2000049386A2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101820101B1 (ko) * 2016-06-30 2018-01-18 서강대학교산학협력단 계측 장치 및 이에 사용되는 마이크로튜브의 제조 방법
CN111019814B (zh) * 2019-12-26 2022-12-09 中国科学院苏州生物医学工程技术研究所 一种基于纳米孔的核酸测序装置、核酸测序方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2011086A (en) * 1977-10-13 1979-07-04 Skf Uk Ltd Improvements in or relating to inductive proximity detectors
US4785264A (en) * 1987-05-28 1988-11-15 Motorola, Inc. Dual FET oscillator
US5218325A (en) * 1992-03-31 1993-06-08 Motorola, Inc. Low noise oscillator
GB9215733D0 (en) * 1992-07-24 1992-09-09 British Tech Group Method of and apparatus for determining a property of a sample

Also Published As

Publication number Publication date
WO2000049386A3 (en) 2000-12-28
JP2002537556A (ja) 2002-11-05
EP1153279A2 (en) 2001-11-14
WO2000049386A2 (en) 2000-08-24
EP1153279B1 (en) 2004-01-07
DE60007617T2 (de) 2004-09-30
DE60007617D1 (de) 2004-02-12

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