JP4239513B2 - 質量分析システム、質量分析方法、質量分析装置 - Google Patents

質量分析システム、質量分析方法、質量分析装置 Download PDF

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Publication number
JP4239513B2
JP4239513B2 JP2002230757A JP2002230757A JP4239513B2 JP 4239513 B2 JP4239513 B2 JP 4239513B2 JP 2002230757 A JP2002230757 A JP 2002230757A JP 2002230757 A JP2002230757 A JP 2002230757A JP 4239513 B2 JP4239513 B2 JP 4239513B2
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mass
ions
database
analysis
ion
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Japanese (ja)
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JP2004071420A (ja
JP2004071420A5 (enExample
Inventor
集 平林
憲孝 内田
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Hitachi Ltd
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Hitachi Ltd
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/4285—Applying a resonant signal, e.g. selective resonant ejection matching the secular frequency of ions

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2002230757A 2002-08-08 2002-08-08 質量分析システム、質量分析方法、質量分析装置 Expired - Fee Related JP4239513B2 (ja)

Priority Applications (1)

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JP2002230757A JP4239513B2 (ja) 2002-08-08 2002-08-08 質量分析システム、質量分析方法、質量分析装置

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Application Number Priority Date Filing Date Title
JP2002230757A JP4239513B2 (ja) 2002-08-08 2002-08-08 質量分析システム、質量分析方法、質量分析装置

Publications (3)

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JP2004071420A JP2004071420A (ja) 2004-03-04
JP2004071420A5 JP2004071420A5 (enExample) 2005-06-23
JP4239513B2 true JP4239513B2 (ja) 2009-03-18

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JP2002230757A Expired - Fee Related JP4239513B2 (ja) 2002-08-08 2002-08-08 質量分析システム、質量分析方法、質量分析装置

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JP (1) JP4239513B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005241251A (ja) 2004-02-24 2005-09-08 Hitachi High-Technologies Corp 質量分析システム
JP4025850B2 (ja) * 2004-03-19 2007-12-26 独立行政法人産業技術総合研究所 糖鎖構造同定方法及び同解析装置
JP4491299B2 (ja) * 2004-08-11 2010-06-30 株式会社日立ハイテクノロジーズ 質量分析装置
JP4644560B2 (ja) * 2005-08-09 2011-03-02 株式会社日立ハイテクノロジーズ 質量分析システム
JP4801455B2 (ja) * 2006-01-26 2011-10-26 株式会社日立ハイテクノロジーズ 質量分析システム
JP4857000B2 (ja) * 2006-03-24 2012-01-18 株式会社日立ハイテクノロジーズ 質量分析システム
US7884318B2 (en) * 2008-01-16 2011-02-08 Metabolon, Inc. Systems, methods, and computer-readable medium for determining composition of chemical constituents in a complex mixture
JP5150370B2 (ja) * 2008-05-30 2013-02-20 株式会社日立ハイテクノロジーズ 質量分析システムおよび質量分析方法
WO2015104844A1 (ja) * 2014-01-10 2015-07-16 株式会社島津製作所 質量分析データ処理方法及び質量分析データ処理装置
CN111710588B (zh) * 2015-04-23 2023-09-26 英国质谱公司 在离子阱中分离离子

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JP2004071420A (ja) 2004-03-04

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