JP4231708B2 - Regulator built-in semiconductor device - Google Patents

Regulator built-in semiconductor device Download PDF

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Publication number
JP4231708B2
JP4231708B2 JP2003047844A JP2003047844A JP4231708B2 JP 4231708 B2 JP4231708 B2 JP 4231708B2 JP 2003047844 A JP2003047844 A JP 2003047844A JP 2003047844 A JP2003047844 A JP 2003047844A JP 4231708 B2 JP4231708 B2 JP 4231708B2
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Japan
Prior art keywords
power supply
regulator
voltage
logic circuit
semiconductor device
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JP2003047844A
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JP2004259879A (en
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敏弘 塚越
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Ricoh Co Ltd
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Ricoh Co Ltd
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Description

【0001】
【発明の属する技術分野】
本発明は、レギュレータを内蔵する半導体装置に関する。
【0002】
【従来の技術】
従来から、レギュレータを内蔵する半導体装置が知られている。
図6は、半導体装置への電源供給方式の従来例を示した例であり、ひとつの半導体装置に、少なくとも2つ以上の電源電圧(この図では、VCC1とVCC2の2種類)を供給する必要があった。
図7は、レギュレータを内蔵して単一電源を実現した半導体装置の別の例を示したものであり、内部論理回路の電源を、内臓レギュレータから供給している。図6、図7いずれの例においても、内部論理回路中央部へのIRドロップの対策は、電源供給の配線幅、配線の本数を変化させる程度の対策しかできず、根本的に問題を解決することはできなかった(例えば特許文献1〜3参照)。
【0003】
【特許文献1】
特開平8−234851号公報
【特許文献2】
特開平10−150152号公報
【特許文献3】
特許第3080015号公報
【0004】
【発明が解決しようとする課題】
高集積で大規模な半導体装置では、消費電力が増大し、その影響として、隣接論理領域への電源ノイズの発生や、(大)電流消費による内部電源電圧の降下が懸念されている。
本発明を用いる事で、分離された内部論理回路領域に対して、独立した電源供給が可能となり、隣接領域からの影響を低減させる事を目的とする。
【0005】
また、大規模な半導体集積回路では、内部論理回路電力消費と電源配線抵抗成分によって、半導体装置のチップ中央部にIRドロップと呼ばれる内部電源電圧降下が発生すると、トランジスタ性能が劣化し、論理回路の応答速度が遅くなるといった、性能劣化が発生する。内部論理回路中央部の電源電圧を、周辺部に比べて高電位に設定する事で、論理回路の性能劣化を抑える事を目的とする。
【0006】
さらに、大規模な半導体集積回路では、内部論理回路電力消費と電源配線抵抗成分によって、半導体装置のチップ中央部に、IRドロップと呼ばれる内部電源電圧降下が発生すると、トランジスタ性能が劣化し、論理回路の応答速度が遅くなるといった、性能劣化が発生する。内部論理回路中央部の電源電圧変動を観測し、フィードバック制御が可能となり、論理回路の性能劣化を抑えながら、余分な電力消費を抑える事を目的とする。
【0007】
【課題を解決するための手段】
本発明のレギュレータ内蔵型半導体装置の発明は、内部論理回路領域用の内部電源電圧と、外部入出力領域用の外部電源電圧とが異なり、単一の外部電源を降圧して内部論理回路領域へ電源供給するレギュレータを内蔵する半導体装置において、発生電圧を複数のスイッチで個別に設定できる複数の同一構造のレギュレータを有し、2つ以上に分割された内部論理回路領域に対して、異なる電圧を供給する機能を備え、内部論理回路領域を、半導体装置の中心に近い中央部と、外部入出力回路に近い周辺部に分割し、個々に独立したレギュレータから電源供給し、内部論理回路領域周辺部の電源電圧と比較して、内部論理回路中央部の電源電圧を高電位に設定すると共に、内部論理回路領域中央部へ供給後の電圧を観測する機能を備え、観測された電圧値に応じて、該領域へ電源供給するレギュレータに対して発生電圧を変動させる機能をさらに備え、電圧判定回路が、レギュレータ内部の前記スイッチを選択して前記レギュレータの出力電圧を設定することを特徴とする。
【0010】
【発明の実施の形態】
本発明は、一つの半導体装置上に、内部論理回路領域用の内部電源電圧と、外部入出力領域用の外部電源電圧との複数の電源電圧を必要とする半導体装置に関する。
このような半導体装置における内部論理回路用電源電圧は、半導体製造技術の微細化の進歩に伴い、低電圧化に進む方向にあり、製造技術の世代が変われば、供給する電源電圧を変更しなければならない。複数の半導体装置を使用してシステム装置を構成する場合、同一システム基板上に、半導体製造技術世代の異なる半導体装置を搭載する場合、複数の異なる電源電圧を準備する必要が生じ、システム基板設計の電源設計が複雑になり、部品コストも高くなってしまう。
【0011】
本発明のレギュレータ内蔵半導体装置を用いる事で、システム基板から該半導体装置へ供給する電源電圧は1系統で実現でき、システム基板設計の容易化と、部品コストの低減を同じに実現することが可能となる。
また同時に、内部論理回路領域を複数の領域に分割し、電源供給を独立させる事で、IRドロップと呼ばれる、内部論理回路中央部の電圧降下の問題を解消し、単一電源供給でありながら、かつ安定した動作を実現することを可能とする。
【0012】
図6は、半導体装置への電源供給方式の従来例を図式化したもので、ひとつの半導体装置に、少なくとも2つ以上の電源電圧を供給する必要があった。
図7は、レギュレータを内蔵して単一電源を実現した半導体装置の従来例を図式化したもので、内部論理回路の電源は、内臓レギュレータから供給している。
【0013】
図6、図7いずれの例においても、内部論理回路中央部へのIRドロップの対策は、電源供給の配線幅、本数を変化させる程度の対策しかできず、根本的に問題を解決することはできなかった。
【0014】
図1は、内蔵レギュレータの一実現例で、“IN”の部分から外部電源が入力される。Tr3のゲート電圧Vrefと、Tr4のゲート電位を同電位となる様に、デプレッショントランジスタTr6のゲート電位が調整される。またR1〜Rnで構成される直列抵抗で構成された分圧回路によって、“OUT”から出力される電圧レベルを決定できる。図1に示す例の場合、分圧抵抗で決められた“OUT”電圧は、ある一定に固定されているのが基本である。
【0015】
図2は、本発明にかかるレギュレータ内蔵型半導体装置の実施形態例であり、内部論理回路領域を複数の領域(モジュール1から4)に分割し、個々のモジュールへの電源供給用に独立したレギュレータを1個づつ配置することを特徴としている。これにより各モジュールの電源は、隣接するモジュールと分離することができ、ある任意のモジュールで電力消費が多くなり、電源電圧の変動等のノイズ要因が発生する可能性が高まった場合であっても、このノイズ発生区域には安定な電源を供給してノイズ源となるのを極力抑えると共に、隣接モジュールへは安定した電源供給を行う事が可能となり、内部論理回路の安定動作を実現する事が可能となる。
【0016】
図3は、本発明にかかるレギュレータ内蔵型半導体装置の実施形態例であり、この例では、内部論理回路領域を複数の領域(モジュール1から5)に分割されている。中央部のモジュール5への電源供給用の接続線は、周辺のモジュール1〜4に比べ、配線抵抗が多くなってしまい、モジュール5内部での電力消費が大きい場合、電源電圧が降下する可能性が高くなるため、Reg5(レギュレータ5)の出力電圧は、Reg1〜4(レギュレータ1〜4)の出力電圧に比べ、高く設定する。
これにより、中央部のモジュール5の電圧レベルが低くなる事が防げ、内部論理回路全てのモジュールの安定動作が保証される。
【0017】
図4は、本発明にかかるレギュレータ内蔵型半導体装置の実施形態例であり、この例では、内部論理回路モジュールの内、電圧レベルが変動する危険性の高いモジュールの電圧を観測する電圧判定機能回路を内蔵している。図に示す実施形態例では、モジュール5の電圧レベルを電圧判定機能回路で判定し、推奨動作に適した電圧レベルと比較して、結果が高く得られた場合には、Reg5に対して“OUT”電圧を低く変更する指示を、結果が低く得られた場合には、Reg5に対して“OUT”電圧を高く変更する指示を与える。このような指示は、フィードバック制御を用いて行うため、このような制御により、電圧変動が懸念されたモジュール5の電圧レベルは、常に、推奨動作に適した電圧レベルで安定供給される。これによって、たとえばノイズを起こさないがノイズを起こしやすい状況が続いても、安定供給された電源が供給されることによって、ノイズは発生しない。
【0018】
図5は、内蔵レギュレータの他の1例であり、図1のレギュレータと同様に、“IN”から外部電源が入力される。Tr3のゲート電圧Vrefと、Tr4のゲート電位を同電位とする様に、デプレッショントランジスタTr6のゲート電位が調整される。R1〜Rnで構成される直列抵抗で構成された分圧回路からTr4ゲートへの接続位置を、S1、S2としたスイッチにより選択する事で、“OUT”から出力する電圧レベルを変更する事が可能である。
【0019】
図5に示すレギュレータは、図1に示すレギュレータに代えて本発明の半導体装置に内蔵することができる。なおスイッチS1、S2を構成するトランジスタは、MOSFETを用いているが、このスイッチは、他のスイッチ手段であってもよい。またMOSFETは、一般にはn−型が用いられるが、p−型であってもよい。
【0020】
【発明の効果】
2つ以上に分割された内部論理回路領域に対して、独立したレギュレータから電源の供給を可能にする事で、隣接する内部論理回路領域の電流消費による電源電圧降下やノイズの影響を低減することが可能となる。内部論理回路領域中央部への供給電圧を予め高く設定しておく事で、内部論理回路電力消費と電源配線抵抗成分による電源電圧降下が発生しても、内部論理回路領域中央部の性能劣化を抑える事が可能となる。
内部論理回路電力消費と電源配線抵抗成分による電源電圧降下状態を観測し、該当領域のレギュレータ供給電圧を制御可能にする事で、内部論理回路全領域均一な電源供給が可能となる。
このような本発明のレギュレータ内蔵半導体装置は、OA機器、AV機器、通信機器あるいはPC関連機器等に使用することができ、このような本発明のレギュレータ内蔵半導体装置を有する上記機器は、上記した効果を有する。
【図面の簡単な説明】
【図1】 本発明に係るレギュレータ内臓半導体装置に使用されるレギュレータの1例を示す図である。
【図2】 本発明に係るレギュレータ内臓半導体装置の一例を示す図であ
【図3】 本発明に係るレギュレータ内臓半導体装置の他の一例を示す図であ
【図4】 本発明に係るレギュレータ内臓半導体装置の他の一例を示す図であ
【図5】 本発明に係るレギュレータ内臓半導体装置に使用される他のレギュレータの1例を示す図である。
【図6】 従来のレギュレータ内臓の半導体装置の一例を示す図である。
【図7】 従来のレギュレータ内臓の半導体装置の他の一例を示す図である。
【符号の説明】
REG1〜REG5 レギュレータ1〜5
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a semiconductor device incorporating a regulator.
[0002]
[Prior art]
Conventionally, a semiconductor device incorporating a regulator is known.
FIG. 6 shows an example of a conventional method for supplying power to a semiconductor device, and it is necessary to supply at least two power supply voltages (in this figure, two types of VCC1 and VCC2) to one semiconductor device. was there.
FIG. 7 shows another example of a semiconductor device in which a single power supply is realized with a built-in regulator, and the power of the internal logic circuit is supplied from the built-in regulator. In both the examples of FIGS. 6 and 7, IR drop countermeasures to the central part of the internal logic circuit can only take measures to change the wiring width of the power supply and the number of wirings, and fundamentally solve the problem. (For example, see Patent Documents 1 to 3).
[0003]
[Patent Document 1]
Japanese Patent Laid-Open No. 8-234851 [Patent Document 2]
JP-A-10-150152 [Patent Document 3]
Japanese Patent No. 3080015 [0004]
[Problems to be solved by the invention]
In a highly integrated and large-scale semiconductor device, power consumption increases, and there are concerns about the occurrence of power supply noise in adjacent logic areas and the drop in internal power supply voltage due to (large) current consumption.
By using the present invention, for isolated internal logic circuit area, it is possible to separate the power supply shall be the purpose of reducing the influence from the adjacent regions.
[0005]
Also, in a large-scale semiconductor integrated circuit, when an internal power supply voltage drop called IR drop occurs in the center of a chip of a semiconductor device due to internal logic circuit power consumption and power supply wiring resistance components, transistor performance deteriorates, and logic circuit Performance degradation such as a slow response speed occurs. The power supply voltage of the internal logic circuit central, by setting a high potential as compared with the peripheral part, shall be the purpose of suppressing deterioration of the performance of the logic circuit.
[0006]
Furthermore, in a large-scale semiconductor integrated circuit, when an internal power supply voltage drop called IR drop occurs in the center of a chip of a semiconductor device due to internal logic circuit power consumption and power supply wiring resistance components, transistor performance deteriorates and logic circuit Performance degradation occurs, such as a slow response speed. Observe the power supply voltage fluctuation of the internal logic circuit central enables feedback control, while suppressing deterioration of the performance of the logic circuit, shall be the purpose of suppressing the unnecessary power consumption.
[0007]
[Means for Solving the Problems]
According to the regulator-embedded semiconductor device of the present invention, the internal power supply voltage for the internal logic circuit area is different from the external power supply voltage for the external input / output area, and the single external power supply is stepped down to the internal logic circuit area. A semiconductor device with a built-in regulator that supplies power has a plurality of regulators with the same structure that can individually set the generated voltage with a plurality of switches, and different voltages are applied to the internal logic circuit area divided into two or more. The internal logic circuit area is divided into a central part close to the center of the semiconductor device and a peripheral part close to the external input / output circuit, and power is supplied from independent regulators. Compared with the power supply voltage, the power supply voltage at the center of the internal logic circuit is set to a high potential, and the voltage after being supplied to the center of the internal logic circuit area is observed. The according to the voltage value, further comprising a function for varying the generation voltage to the power supply regulator to the region, the voltage determining circuit, sets the output voltage of the regulator to select the switch of the internal regulator It is characterized by that.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
The present invention relates to a semiconductor device that requires a plurality of power supply voltages including an internal power supply voltage for an internal logic circuit region and an external power supply voltage for an external input / output region on a single semiconductor device.
The power supply voltage for the internal logic circuit in such a semiconductor device is in the direction of lowering the voltage with the progress of miniaturization of the semiconductor manufacturing technology, and if the generation of the manufacturing technology changes, the power supply voltage to be supplied must be changed. I must. When configuring a system device using a plurality of semiconductor devices, when mounting semiconductor devices of different semiconductor manufacturing technology generations on the same system board, it is necessary to prepare a plurality of different power supply voltages, The power supply design becomes complicated and the cost of parts increases.
[0011]
By using the regulator built-in semiconductor device of the present invention, the power supply voltage supplied from the system board to the semiconductor device can be realized by one system, and the system board can be easily designed and the cost of parts can be reduced at the same time. It becomes.
At the same time, by dividing the internal logic circuit area into a plurality of areas and making the power supply independent, the problem of voltage drop at the center of the internal logic circuit, called IR drop, is solved, while being a single power supply, In addition, stable operation can be realized.
[0012]
FIG. 6 is a schematic diagram of a conventional example of a power supply method for a semiconductor device, and it is necessary to supply at least two power supply voltages to one semiconductor device.
FIG. 7 is a schematic diagram of a conventional example of a semiconductor device in which a single power source is realized by incorporating a regulator, and the power of the internal logic circuit is supplied from the built-in regulator.
[0013]
In both the examples of FIGS. 6 and 7, the IR drop countermeasure to the central part of the internal logic circuit can only be a measure of changing the wiring width and number of power supply lines, and the problem can be fundamentally solved. could not.
[0014]
FIG. 1 shows an example of realization of a built-in regulator, and an external power supply is input from the “IN” portion. The gate potential of the depletion transistor Tr6 is adjusted so that the gate voltage Vref of Tr3 and the gate potential of Tr4 become the same potential. In addition, the voltage level output from “OUT” can be determined by a voltage dividing circuit including a series resistor including R1 to Rn. In the case of the example shown in FIG. 1, the “OUT” voltage determined by the voltage dividing resistor is basically fixed at a certain level.
[0015]
FIG. 2 shows an embodiment of a regulator built-in type semiconductor device according to the present invention, in which an internal logic circuit area is divided into a plurality of areas (modules 1 to 4), and an independent regulator for supplying power to each module. It is characterized by arranging one by one. As a result, the power supply of each module can be separated from the adjacent module, and even when there is an increased possibility of noise factors such as fluctuations in power supply voltage due to increased power consumption in any given module In this noise generation area, it is possible to supply stable power as much as possible and suppress noise generation as much as possible, and it is possible to supply stable power to adjacent modules, and to realize stable operation of internal logic circuits. It becomes possible.
[0016]
FIG. 3 shows an embodiment of a regulator built-in semiconductor device according to the present invention . In this example, the internal logic circuit area is divided into a plurality of areas (modules 1 to 5). The connection line for power supply to the module 5 in the central portion has a higher wiring resistance than the peripheral modules 1 to 4, and the power supply voltage may drop when the power consumption inside the module 5 is large. Therefore, the output voltage of Reg5 (regulator 5) is set higher than the output voltages of Reg1 to 4 (regulators 1 to 4).
As a result, the voltage level of the central module 5 can be prevented from being lowered, and the stable operation of all the modules of the internal logic circuit is guaranteed.
[0017]
FIG. 4 shows an embodiment of a regulator built-in semiconductor device according to the present invention . In this example, a voltage determination function circuit for observing the voltage of a module having a high risk of voltage level fluctuation among internal logic circuit modules. Built in. In the embodiment shown in FIG. 4 , the voltage level of the module 5 is determined by the voltage determination function circuit, and when the result is high compared with the voltage level suitable for the recommended operation, An instruction to change the “OUT” voltage to be low, and if the result is low, an instruction to change the “OUT” voltage to be high is given to Reg5. Since such an instruction is performed using feedback control, the voltage level of the module 5 in which voltage fluctuation is a concern is always stably supplied at a voltage level suitable for the recommended operation. As a result, for example, even if a situation in which noise is not generated but is likely to generate noise continues, noise is not generated by the supply of stably supplied power.
[0018]
FIG. 5 shows another example of a built-in regulator, and an external power supply is input from “IN” as in the regulator of FIG. The gate potential of the depletion transistor Tr6 is adjusted so that the gate voltage Vref of Tr3 and the gate potential of Tr4 are the same. The voltage level output from “OUT” can be changed by selecting the connection position from the voltage dividing circuit composed of series resistors composed of R1 to Rn to the Tr4 gate using the switches S1 and S2. Is possible.
[0019]
The regulator shown in FIG. 5 can be incorporated in the semiconductor device of the present invention instead of the regulator shown in FIG. Although the transistors constituting the switches S1 and S2 use MOSFETs, the switches may be other switch means. The MOSFET is generally n-type, but may be p-type.
[0020]
【The invention's effect】
To reduce the influence of power supply voltage drop and noise due to current consumption in adjacent internal logic circuit area by enabling power supply from an independent regulator to the internal logic circuit area divided into two or more. that Do and is possible. By setting the supply voltage to the central part of the internal logic circuit area high in advance, even if the power supply voltage drop due to the internal logic circuit power consumption and the power supply wiring resistance component occurs, the performance of the central part of the internal logic circuit area will be degraded. It becomes possible to suppress.
By observing the power supply voltage drop state due to the internal logic circuit power consumption and the power supply wiring resistance component and making the regulator supply voltage controllable in the corresponding area, it is possible to supply power uniformly throughout the internal logic circuit.
Such a semiconductor device with a built-in regulator according to the present invention can be used for OA equipment, AV equipment, communication equipment, PC-related equipment, and the like. Has an effect.
[Brief description of the drawings]
FIG. 1 is a diagram showing an example of a regulator used in a regulator built-in semiconductor device according to the present invention.
Ru Figure showing one example of a regulator visceral semiconductor device according to the invention; FIG.
Ru Figure der showing another example of a regulator visceral semiconductor device according to the present invention; FIG.
Ru Figure der showing another example of a regulator visceral semiconductor device according to the present invention; FIG.
FIG. 5 is a diagram showing an example of another regulator used in the regulator built-in semiconductor device according to the present invention.
FIG. 6 is a diagram illustrating an example of a conventional semiconductor device with a built-in regulator.
FIG. 7 is a diagram showing another example of a conventional semiconductor device with a built-in regulator.
[Explanation of symbols]
REG1 to REG5 Regulators 1 to 5

Claims (1)

内部論理回路領域用の内部電源電圧と、外部入出力領域用の外部電源電圧とが異なり、単一の外部電源を降圧して内部論理回路領域へ電源供給するレギュレータを内蔵する半導体装置において、発生電圧を複数のスイッチで個別に設定できる複数の同一構造のレギュレータを有し、2つ以上に分割された内部論理回路領域に対して、異なる電圧を供給する機能を備え、内部論理回路領域を、半導体装置の中心に近い中央部と、外部入出力回路に近い周辺部に分割し、個々に独立したレギュレータから電源供給し、内部論理回路領域周辺部の電源電圧と比較して、内部論理回路中央部の電源電圧を高電位に設定すると共に、内部論理回路領域中央部へ供給後の電圧を観測する機能を備え、観測された電圧値に応じて、該領域へ電源供給するレギュレータに対して発生電圧を変動させる機能をさらに備え、電圧判定回路が、レギュレータ内部の前記スイッチを選択して前記レギュレータの出力電圧を設定することを特徴とするレギュレータ内蔵型半導体装置。Generated in a semiconductor device with a built-in regulator that steps down a single external power supply and supplies power to the internal logic circuit area, where the internal power supply voltage for the internal logic circuit area is different from the external power supply voltage for the external input / output area It has a plurality of regulators having the same structure that can individually set the voltage with a plurality of switches, and has a function of supplying different voltages to the internal logic circuit area divided into two or more . Divided into a central part close to the center of the semiconductor device and a peripheral part close to the external input / output circuit, power is supplied from an independent regulator, and compared to the power supply voltage in the peripheral part of the internal logic circuit area, the center of the internal logic circuit The power supply voltage of the part is set to a high potential, and the function of observing the voltage after being supplied to the central part of the internal logic circuit area is provided, and the power supply voltage is supplied to the area according to the observed voltage value. Further comprising a function for varying the generation voltage to regulator, the voltage determining circuit, the regulator built-in semiconductor device by selecting the switch internal regulator and sets the output voltage of the regulator.
JP2003047844A 2003-02-25 2003-02-25 Regulator built-in semiconductor device Expired - Fee Related JP4231708B2 (en)

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US7568115B2 (en) * 2005-09-28 2009-07-28 Intel Corporation Power delivery and power management of many-core processors
JP4929857B2 (en) * 2006-06-12 2012-05-09 株式会社日立製作所 Semiconductor device
US8099619B2 (en) * 2006-09-28 2012-01-17 Intel Corporation Voltage regulator with drive override
JP2008192083A (en) * 2007-02-07 2008-08-21 Nippon Telegr & Teleph Corp <Ntt> Low dropout regulator circuit
JP5581868B2 (en) * 2010-07-15 2014-09-03 株式会社リコー Semiconductor circuit and constant voltage circuit using the same
JP7331419B2 (en) * 2019-04-01 2023-08-23 セイコーエプソン株式会社 Integrated circuit devices, oscillators, electronic devices and moving bodies

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