JP4160403B2 - Use of fluorinated ketones as wet cleaners for gas phase reactors. - Google Patents
Use of fluorinated ketones as wet cleaners for gas phase reactors. Download PDFInfo
- Publication number
- JP4160403B2 JP4160403B2 JP2002583701A JP2002583701A JP4160403B2 JP 4160403 B2 JP4160403 B2 JP 4160403B2 JP 2002583701 A JP2002583701 A JP 2002583701A JP 2002583701 A JP2002583701 A JP 2002583701A JP 4160403 B2 JP4160403 B2 JP 4160403B2
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- JP
- Japan
- Prior art keywords
- reactor
- fluorinated
- cleaning agent
- hexafluoropropylene
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 150000002576 ketones Chemical class 0.000 title claims description 35
- 239000012459 cleaning agent Substances 0.000 claims description 23
- 239000007788 liquid Substances 0.000 claims description 21
- 239000007789 gas Substances 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 17
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 9
- 125000004432 carbon atom Chemical group C* 0.000 claims description 8
- 238000004140 cleaning Methods 0.000 claims description 8
- 239000000203 mixture Substances 0.000 claims description 8
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 6
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 claims description 4
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- 239000010702 perfluoropolyether Substances 0.000 claims description 2
- OHMHBGPWCHTMQE-UHFFFAOYSA-N 2,2-dichloro-1,1,1-trifluoroethane Chemical compound FC(F)(F)C(Cl)Cl OHMHBGPWCHTMQE-UHFFFAOYSA-N 0.000 claims 1
- WTPUKBUYGDXTOF-UHFFFAOYSA-N F[C](Cl)Br Chemical class F[C](Cl)Br WTPUKBUYGDXTOF-UHFFFAOYSA-N 0.000 claims 1
- ZJCFOZHHYJVNNP-UHFFFAOYSA-N F[C]Br Chemical class F[C]Br ZJCFOZHHYJVNNP-UHFFFAOYSA-N 0.000 claims 1
- 150000001491 aromatic compounds Chemical class 0.000 claims 1
- KYKAJFCTULSVSH-UHFFFAOYSA-N chloro(fluoro)methane Chemical class F[C]Cl KYKAJFCTULSVSH-UHFFFAOYSA-N 0.000 claims 1
- 239000012071 phase Substances 0.000 description 16
- NROKBHXJSPEDAR-UHFFFAOYSA-M potassium fluoride Chemical compound [F-].[K+] NROKBHXJSPEDAR-UHFFFAOYSA-M 0.000 description 16
- HCDGVLDPFQMKDK-UHFFFAOYSA-N hexafluoropropylene Chemical group FC(F)=C(F)C(F)(F)F HCDGVLDPFQMKDK-UHFFFAOYSA-N 0.000 description 14
- 150000001875 compounds Chemical class 0.000 description 13
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 12
- IYRWEQXVUNLMAY-UHFFFAOYSA-N carbonyl fluoride Chemical compound FC(F)=O IYRWEQXVUNLMAY-UHFFFAOYSA-N 0.000 description 12
- 239000003599 detergent Substances 0.000 description 12
- 229910052731 fluorine Inorganic materials 0.000 description 11
- 239000011737 fluorine Substances 0.000 description 11
- -1 perfluorocarbons Chemical class 0.000 description 11
- 238000010792 warming Methods 0.000 description 10
- 238000009835 boiling Methods 0.000 description 9
- 229920002313 fluoropolymer Polymers 0.000 description 9
- 239000004811 fluoropolymer Substances 0.000 description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 9
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 8
- 239000012298 atmosphere Substances 0.000 description 8
- 239000000460 chlorine Substances 0.000 description 8
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 8
- 238000004817 gas chromatography Methods 0.000 description 8
- 229930195733 hydrocarbon Natural products 0.000 description 8
- 150000002430 hydrocarbons Chemical class 0.000 description 8
- 229920000642 polymer Polymers 0.000 description 8
- 235000003270 potassium fluoride Nutrition 0.000 description 8
- 239000011698 potassium fluoride Substances 0.000 description 8
- 238000005530 etching Methods 0.000 description 7
- 239000002904 solvent Substances 0.000 description 7
- PBVZTJDHQVIHFR-UHFFFAOYSA-N 1,1,2,3,3,3-hexafluoroprop-1-ene Chemical compound FC(F)=C(F)C(F)(F)F.FC(F)=C(F)C(F)(F)F PBVZTJDHQVIHFR-UHFFFAOYSA-N 0.000 description 6
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- JGZVUTYDEVUNMK-UHFFFAOYSA-N 5-carboxy-2',7'-dichlorofluorescein Chemical compound C12=CC(Cl)=C(O)C=C2OC2=CC(O)=C(Cl)C=C2C21OC(=O)C1=CC(C(=O)O)=CC=C21 JGZVUTYDEVUNMK-UHFFFAOYSA-N 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 238000007654 immersion Methods 0.000 description 5
- 238000005240 physical vapour deposition Methods 0.000 description 5
- 238000003756 stirring Methods 0.000 description 5
- 239000013638 trimer Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- GRVMOMUDALILLH-UHFFFAOYSA-N 1,1,1,2,4,5,5,5-octafluoro-2,4-bis(trifluoromethyl)pentan-3-one Chemical compound FC(F)(F)C(F)(C(F)(F)F)C(=O)C(F)(C(F)(F)F)C(F)(F)F GRVMOMUDALILLH-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 229910052801 chlorine Inorganic materials 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 3
- 150000002222 fluorine compounds Chemical class 0.000 description 3
- 125000001153 fluoro group Chemical group F* 0.000 description 3
- 125000005842 heteroatom Chemical group 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- MWUXSHHQAYIFBG-UHFFFAOYSA-N nitrogen oxide Inorganic materials O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- BRWSHOSLZPMKII-UHFFFAOYSA-N 2,3,3,3-tetrafluoro-2-(trifluoromethyl)propanoyl fluoride Chemical compound FC(=O)C(F)(C(F)(F)F)C(F)(F)F BRWSHOSLZPMKII-UHFFFAOYSA-N 0.000 description 2
- RXGUIWHIADMCFC-UHFFFAOYSA-N 2-Methylpropyl 2-methylpropionate Chemical compound CC(C)COC(=O)C(C)C RXGUIWHIADMCFC-UHFFFAOYSA-N 0.000 description 2
- HHBBIOLEJRWIGU-UHFFFAOYSA-N 4-ethoxy-1,1,1,2,2,3,3,4,5,6,6,6-dodecafluoro-5-(trifluoromethyl)hexane Chemical compound CCOC(F)(C(F)(C(F)(F)F)C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)F HHBBIOLEJRWIGU-UHFFFAOYSA-N 0.000 description 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 2
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 2
- 229910052794 bromium Inorganic materials 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 235000011089 carbon dioxide Nutrition 0.000 description 2
- ABDBNWQRPYOPDF-UHFFFAOYSA-N carbonofluoridic acid Chemical class OC(F)=O ABDBNWQRPYOPDF-UHFFFAOYSA-N 0.000 description 2
- 150000001733 carboxylic acid esters Chemical class 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 239000000539 dimer Substances 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 238000004821 distillation Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000003682 fluorination reaction Methods 0.000 description 2
- 238000004508 fractional distillation Methods 0.000 description 2
- 238000005194 fractionation Methods 0.000 description 2
- 125000005843 halogen group Chemical group 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052740 iodine Inorganic materials 0.000 description 2
- 239000011630 iodine Substances 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000004810 partition chromatography Methods 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 239000012286 potassium permanganate Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 150000003254 radicals Chemical class 0.000 description 2
- 239000011541 reaction mixture Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- VBJIFLOSOQGDRZ-UHFFFAOYSA-N (2-chloro-2,2-difluoroacetyl) 2-chloro-2,2-difluoroacetate Chemical compound FC(F)(Cl)C(=O)OC(=O)C(F)(F)Cl VBJIFLOSOQGDRZ-UHFFFAOYSA-N 0.000 description 1
- GETTZEONDQJALK-UHFFFAOYSA-N (trifluoromethyl)benzene Chemical compound FC(F)(F)C1=CC=CC=C1 GETTZEONDQJALK-UHFFFAOYSA-N 0.000 description 1
- KSOCRXJMFBYSFA-UHFFFAOYSA-N 1,1,1,2,2,3,3,4,4,5,6,6,6-tridecafluoro-5-(1,1,1,2,3,3,4,4,5,5,6,6,6-tridecafluorohexan-2-yloxy)hexane Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(C(F)(F)F)OC(F)(C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F KSOCRXJMFBYSFA-UHFFFAOYSA-N 0.000 description 1
- MEMJZBFXKCSMSF-UHFFFAOYSA-N 1,1,1,2,2,3,3,4,4-nonafluoro-4-methoxybutane Chemical compound COC(F)(F)C(F)(F)C(F)(F)C(F)(F)F.COC(F)(F)C(F)(F)C(F)(F)C(F)(F)F MEMJZBFXKCSMSF-UHFFFAOYSA-N 0.000 description 1
- SIVXJSMXRSOFRR-UHFFFAOYSA-N 1,1,1,2,4,4,5,5,6,6,6-undecafluoro-2-(trifluoromethyl)hexan-3-one Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(=O)C(F)(C(F)(F)F)C(F)(F)F SIVXJSMXRSOFRR-UHFFFAOYSA-N 0.000 description 1
- RPSRMEXKOXQGKM-UHFFFAOYSA-N 1,1,1,2,4,4,5,5,6,6,7,7,8,8,9,9,9-heptadecafluoro-2-(trifluoromethyl)nonan-3-one Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(=O)C(F)(C(F)(F)F)C(F)(F)F RPSRMEXKOXQGKM-UHFFFAOYSA-N 0.000 description 1
- UDVYMKMTPUSSLP-UHFFFAOYSA-N 1,1,1,2,4,4,5,5-octafluoro-5-(trifluoromethoxy)-2-(trifluoromethyl)pentan-3-one Chemical compound FC(F)(F)OC(F)(F)C(F)(F)C(=O)C(F)(C(F)(F)F)C(F)(F)F UDVYMKMTPUSSLP-UHFFFAOYSA-N 0.000 description 1
- FLXHMXSWIMMEFD-UHFFFAOYSA-N 1,1,1,3,3,4,4,5,5,6,6,7,7,8,8,8-hexadecafluorooctan-2-one Chemical compound FC(F)(F)C(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F FLXHMXSWIMMEFD-UHFFFAOYSA-N 0.000 description 1
- ABQIAHFCJGVSDJ-UHFFFAOYSA-N 1,1,1,3,4,4,4-heptafluoro-3-(trifluoromethyl)butan-2-one Chemical compound FC(F)(F)C(=O)C(F)(C(F)(F)F)C(F)(F)F ABQIAHFCJGVSDJ-UHFFFAOYSA-N 0.000 description 1
- YBTCBNQUROAZJL-UHFFFAOYSA-N 1,1,1-trifluoropentan-3-one Chemical compound CCC(=O)CC(F)(F)F YBTCBNQUROAZJL-UHFFFAOYSA-N 0.000 description 1
- ZSXRVTIIXWUZDE-UHFFFAOYSA-N 1,1,2,2,3,3,4,4,5,5,6,6,7,7,7-pentadecafluoroheptyl 2,2,2-trifluoroacetate Chemical compound FC(F)(F)C(=O)OC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F ZSXRVTIIXWUZDE-UHFFFAOYSA-N 0.000 description 1
- WDHGLDKBPYJCLF-UHFFFAOYSA-N 1-chloro-1,1,3,4,4,4-hexafluoro-3-(trifluoromethyl)butan-2-one Chemical compound FC(F)(F)C(F)(C(F)(F)F)C(=O)C(F)(F)Cl WDHGLDKBPYJCLF-UHFFFAOYSA-N 0.000 description 1
- DFUYAWQUODQGFF-UHFFFAOYSA-N 1-ethoxy-1,1,2,2,3,3,4,4,4-nonafluorobutane Chemical compound CCOC(F)(F)C(F)(F)C(F)(F)C(F)(F)F DFUYAWQUODQGFF-UHFFFAOYSA-N 0.000 description 1
- WIHCZQVQWBCKOA-UHFFFAOYSA-N 2,2,3,3,4,4,5,5-octafluorocyclopentan-1-one Chemical compound FC1(F)C(=O)C(F)(F)C(F)(F)C1(F)F WIHCZQVQWBCKOA-UHFFFAOYSA-N 0.000 description 1
- PQMAKJUXOOVROI-UHFFFAOYSA-N 2,2,3,3,5,5,6,6-octafluoro-4-(trifluoromethyl)morpholine Chemical compound FC(F)(F)N1C(F)(F)C(F)(F)OC(F)(F)C1(F)F PQMAKJUXOOVROI-UHFFFAOYSA-N 0.000 description 1
- ZAKJNULOUJTZMO-UHFFFAOYSA-N 2,2,3,3-tetrafluoro-3-(trifluoromethoxy)propanoyl fluoride Chemical compound FC(=O)C(F)(F)C(F)(F)OC(F)(F)F ZAKJNULOUJTZMO-UHFFFAOYSA-N 0.000 description 1
- LKEYHSAKBVEOJQ-UHFFFAOYSA-N 6,6,6-trifluorohexan-3-one Chemical compound CCC(=O)CCC(F)(F)F LKEYHSAKBVEOJQ-UHFFFAOYSA-N 0.000 description 1
- WHQHUSWWAFAPSR-UHFFFAOYSA-N CC(C)CC(C)(C)C(OF)=O Chemical compound CC(C)CC(C)(C)C(OF)=O WHQHUSWWAFAPSR-UHFFFAOYSA-N 0.000 description 1
- XPDWGBQVDMORPB-UHFFFAOYSA-N Fluoroform Chemical compound FC(F)F XPDWGBQVDMORPB-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- CSNNHWWHGAXBCP-UHFFFAOYSA-L Magnesium sulfate Chemical compound [Mg+2].[O-][S+2]([O-])([O-])[O-] CSNNHWWHGAXBCP-UHFFFAOYSA-L 0.000 description 1
- 238000005481 NMR spectroscopy Methods 0.000 description 1
- 241000700159 Rattus Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- ZCZSIDMEHXZRLG-UHFFFAOYSA-N acetic acid heptyl ester Natural products CCCCCCCOC(C)=O ZCZSIDMEHXZRLG-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
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- 230000002378 acidificating effect Effects 0.000 description 1
- 230000007059 acute toxicity Effects 0.000 description 1
- 231100000403 acute toxicity Toxicity 0.000 description 1
- 150000001266 acyl halides Chemical class 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
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- 238000004458 analytical method Methods 0.000 description 1
- MTHSVFCYNBDYFN-UHFFFAOYSA-N anhydrous diethylene glycol Natural products OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 1
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- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000007810 chemical reaction solvent Substances 0.000 description 1
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- 238000006731 degradation reaction Methods 0.000 description 1
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- LTVOKYUPTHZZQH-UHFFFAOYSA-N difluoromethane Chemical compound F[C]F LTVOKYUPTHZZQH-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- JPXGPRBLTIYFQG-UHFFFAOYSA-N heptan-4-yl acetate Chemical compound CCCC(CCC)OC(C)=O JPXGPRBLTIYFQG-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
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- BCCOBQSFUDVTJQ-UHFFFAOYSA-N octafluorocyclobutane Chemical compound FC1(F)C(F)(F)C(F)(F)C1(F)F BCCOBQSFUDVTJQ-UHFFFAOYSA-N 0.000 description 1
- 235000019407 octafluorocyclobutane Nutrition 0.000 description 1
- SJFUDWKNZGXSLV-UHFFFAOYSA-N octan-2-yl acetate Chemical compound CCCCCCC(C)OC(C)=O SJFUDWKNZGXSLV-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
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- XNLICIUVMPYHGG-UHFFFAOYSA-N pentan-2-one Chemical compound CCCC(C)=O XNLICIUVMPYHGG-UHFFFAOYSA-N 0.000 description 1
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N pentanoic acid group Chemical group C(CCCC)(=O)O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 1
- FYJQJMIEZVMYSD-UHFFFAOYSA-N perfluoro-2-butyltetrahydrofuran Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)C1(F)OC(F)(F)C(F)(F)C1(F)F FYJQJMIEZVMYSD-UHFFFAOYSA-N 0.000 description 1
- 125000005010 perfluoroalkyl group Chemical group 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
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- 239000000741 silica gel Substances 0.000 description 1
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- 229910052710 silicon Inorganic materials 0.000 description 1
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- 125000004434 sulfur atom Chemical group 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-N sulfuric acid Substances OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- KFUSEUYYWQURPO-OWOJBTEDSA-N trans-1,2-dichloroethene Chemical group Cl\C=C\Cl KFUSEUYYWQURPO-OWOJBTEDSA-N 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D11/00—Special methods for preparing compositions containing mixtures of detergents
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
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Description
本発明はフッ素化ケトンを気相反応器及び気相反応器部品用の湿式洗浄剤として使用する方法に関する。 The present invention relates to a method of using a fluorinated ketone as a wet detergent for a gas phase reactor and gas phase reactor components.
地球温暖化ガスの放出は世界的な注目を浴びている。国連地球温暖化会議において制定された京都議定書の目標は二酸化炭素、メタン、窒素酸化物、ペルフルオロカーボン(PFC)、ヒドロフルオロカーボン、(HFC)及びSF6の排出基準を1990年以前の水準に引き下げることであった。更に、米国の半導体製造業者の大部分は、PFC排出削減に関する選択肢を評価することを誓約する環境保護局との覚書に署名している。 The release of global warming gas has received worldwide attention. The goal of the Kyoto Protocol established at the United Nations Global Warming Conference is to reduce emissions standards for carbon dioxide, methane, nitrogen oxides, perfluorocarbons (PFC), hydrofluorocarbons, (HFC) and SF 6 to pre-1990 levels. Met. In addition, the majority of US semiconductor manufacturers have signed a memorandum of understanding with the Environmental Protection Agency that pledges to evaluate options for reducing PFC emissions.
化学気相成長チャンバー、物理気相成長チャンバー及びエッチングチャンバーは種々の電子デバイスや部品の製造に関連して半導体業界で広く使用されている。これらの装置では反応性ガスや蒸気が種々の誘電材料及び金属材料の堆積、パターン形成または除去の目的で使用されるが、時間の経過とともに、望ましくない堆積物、典型的には炭素、フッ素、水素及び酸素を含有するフルオロポリマー、が装置の壁や部品上に蓄積することが避けられない。これらの堆積物は装置内で製造される製品の潜在的汚染の原因となりうるので定期的に除去しなくてはならない。C2F6及びC3F8などのペルフルオロカーボンガスやNF3のような全フッ素化窒素化合物が当該装置のその場プラズマ洗浄にこれまで使用されてきた。しかしながら、これらのガス状物質は極度に安定で地球温暖化の原因となり、ガススクラバーでトラップまたは処理することが難しい。 Chemical vapor deposition chambers, physical vapor deposition chambers and etching chambers are widely used in the semiconductor industry in connection with the manufacture of various electronic devices and components. In these devices, reactive gases and vapors are used for the purpose of deposition, patterning or removal of various dielectric and metallic materials, but over time, undesirable deposits, typically carbon, fluorine, It is inevitable that fluoropolymers containing hydrogen and oxygen accumulate on the walls and parts of the device. These deposits must be removed periodically as they can cause potential contamination of the products produced in the equipment. Perfluorinated nitrogen compounds such as C 2 F 6 and C 3 F 8 perfluorocarbon gas and NF 3, such have been used heretofore in situ plasma cleaning of the device. However, these gaseous substances are extremely stable and cause global warming and are difficult to trap or treat with a gas scrubber.
装置壁及び部品はいろいろな液体薬品により洗浄できる。現在使用されている 液体洗浄剤には、水、アセトンやイソプロパノールのような各種炭化水素、並びにペルフルオロカーボン、ヒドロフルオロカーボン及びヒドロフルオロエーテルなどの各種フッ素化合物、が含まれる。水や炭化水素は前記フルオロポリマー残渣を容易には溶解しない。加えて、水は乾燥に長時間を要し、炭化水素は可燃性であり、どちらも洗浄剤の特性として好ましくない。ある種のフッ素系薬品は地球温暖化の原因となる可能性を有するという、洗浄剤として好ましくない別の特性を有する。 Equipment walls and parts can be cleaned with a variety of liquid chemicals. Currently used liquid detergents include water, various hydrocarbons such as acetone and isopropanol, and various fluorine compounds such as perfluorocarbons, hydrofluorocarbons and hydrofluoroethers. Water and hydrocarbons do not dissolve the fluoropolymer residue easily. In addition, water takes a long time to dry and hydrocarbons are flammable, both of which are undesirable as cleaning agent properties. Certain fluorinated chemicals have another property that is undesirable as a cleaning agent, which may cause global warming.
本発明は化学気相成長チャンバー、物理気相成長チャンバー及びエッチングチャンバーの壁や部品上に蓄積した堆積物をフッ素化ケトン含有の液体洗浄剤で除去する方法を提供するものである。本発明のフッ素化ケトンは半導体業界で従来使用されてきた液体ペルフルオロ薬品と同等の性能を有するが、低い地球温暖化係数を有する。 The present invention provides a method of removing deposits accumulated on the walls and parts of a chemical vapor deposition chamber, a physical vapor deposition chamber and an etching chamber with a liquid cleaning agent containing a fluorinated ketone. The fluorinated ketones of the present invention have performance equivalent to liquid perfluorochemicals conventionally used in the semiconductor industry, but have a low global warming potential.
本発明は化学気相成長チャンバー、物理気相成長チャンバー及びエッチングチャンバーの壁や部品上に蓄積した堆積物を5〜10個の炭素原子を有するフッ素化ケトン化合物を含有する液体洗浄剤で除去する方法を提供するものである。本洗浄剤はペルフルオロケトン、すなわち炭素骨格上のすべての水素原子をフッ素で置換した化合物であってもよい。あるいは、フッ素化ケトン洗浄剤は、2個以下の水素原子と、臭素、塩素及びヨウ素を含む2個以下のハロゲン原子とが前記炭素骨格に結合していてもよい。1つ以上のヘテロ原子が当該分子の炭素骨格に割り込んでもよい。本洗浄剤はフッ素化ケトンと相溶性のある補助のハロゲン化化合物を含有してもよく、好適な、補助洗浄剤はヒドロフルオロエーテルである。本洗浄剤はふき取り、噴霧、浸漬などの洗浄方法に適用できる。 The present invention removes deposits accumulated on the walls and parts of chemical vapor deposition chamber, physical vapor deposition chamber and etching chamber with a liquid detergent containing a fluorinated ketone compound having 5 to 10 carbon atoms. A method is provided. The cleaning agent may be a perfluoroketone, that is, a compound in which all hydrogen atoms on the carbon skeleton are substituted with fluorine. Alternatively, in the fluorinated ketone detergent, 2 or less hydrogen atoms and 2 or less halogen atoms including bromine, chlorine and iodine may be bonded to the carbon skeleton. One or more heteroatoms may interrupt the carbon skeleton of the molecule. The detergent may contain an auxiliary halogenated compound that is compatible with the fluorinated ketone, and a preferred auxiliary detergent is a hydrofluoroether. This cleaning agent can be applied to cleaning methods such as wiping, spraying and dipping.
本発明は、炭素原子5〜10個、好ましくは6〜8個を有するフッ素化ケトン化合物を含む液体洗浄剤を使用した化学気相成長チャンバー、物理気相成長チャンバー及びエッチングチャンバーの洗浄法を提供するものである。典型的なフッ素化ケトンは、沸点が150℃以下であって、室温で液体である。フッ素化ケトンはペルフルオロケトンであることが好ましい。 The present invention provides a cleaning method for a chemical vapor deposition chamber, a physical vapor deposition chamber and an etching chamber using a liquid cleaning agent containing a fluorinated ketone compound having 5 to 10 carbon atoms, preferably 6 to 8 carbon atoms. To do. Typical fluorinated ketones have a boiling point of 150 ° C. or lower and are liquid at room temperature. The fluorinated ketone is preferably a perfluoroketone.
本明細書で使用する際、「気相反応器」という語句は化学気相成長チャンバー、物理気相成長チャンバー及びエッチングチャンバーを含むものとする。これらの装置は反応性ガスまたは蒸気により各種の誘電材料、金属材料を堆積、パターン化または除去するのに使用される。気相反応器は半導体業界で各種電子デバイス及び部品の製造に広く用いられている。典型的な例として、CF4、C2F6及びC3F8のようなガス状ペルフルオロカーボンが各種の誘電及び金属材料のエッチングに使用される。このペルフルオロカーボンは一般的に酸素と混合され、ラジオ周波数のプラズマにより、フッ素、二フッ化炭素、三フッ化炭素などの種々のラジカルを生成する。これらのラジカルは更に反応を経て種々のフルオロポリマーを生成する。このフルオロポリマーは反応器壁及び部品上に他の種々の副生物と共に堆積する。これらの副生物には、例えば、シリコン由来の残渣、タングステン、アルミニウムなどの金属残渣が含まれる。定期的に、製造中の製品の汚染を避けるために気相反応器を洗浄しこれらのフルオロポリマーとその他の残渣を除去する必要がある。 As used herein, the phrase “vapor phase reactor” is intended to include chemical vapor deposition chambers, physical vapor deposition chambers, and etching chambers. These devices are used to deposit, pattern or remove various dielectric and metallic materials with reactive gases or vapors. Gas phase reactors are widely used in the semiconductor industry for the manufacture of various electronic devices and components. As a typical example, gaseous perfluorocarbons such as CF 4 , C 2 F 6 and C 3 F 8 are used for etching various dielectric and metallic materials. This perfluorocarbon is generally mixed with oxygen, and various radicals such as fluorine, carbon difluoride, and carbon trifluoride are generated by radio frequency plasma. These radicals undergo further reactions to produce various fluoropolymers. The fluoropolymer is deposited with various other by-products on the reactor walls and parts. These by-products include, for example, silicon-derived residues and metal residues such as tungsten and aluminum. Periodically, it is necessary to clean the gas phase reactor to remove these fluoropolymers and other residues to avoid contamination of the product being manufactured.
この堆積物を除去する従来の手法においては、種々の液体洗浄剤の使用が可能であった。現在使用されている液体洗浄剤には、水、アセトンやイソプロパノールのような各種炭化水素、並びにペルフルオロカーボン、ヒドロフルオロカーボン及びヒドロフルオロエーテルのような各種フッ素化合物が含まれる。水や炭化水素は前記フルオロポリマーを容易には溶解しない。加えて、水は乾燥に長時間を要し、炭化水素は可燃性であり、どちらも洗浄剤の特性として好ましくない。本発明は、これらの好ましくない特質を避け、少なくとも先行技術に比べより環境にやさしい代替法を提供する。反応器の壁や部品上に堆積したフルオロポリマー及びその他の残渣は5〜10個の炭素原子を有する液体フッ素化洗浄剤を使用することにより溶解することができる。本気相反応器洗浄方法はガス状ペルフルオロカーボンを使用する従来の方法を部分的または完全に置き換え使用することができる。以後、「洗浄」という語句は気相反応器の壁及び部品上に時間を経て蓄積した好ましくない堆積物を除去することを言う。 In the conventional method for removing the deposit, various liquid cleaning agents can be used. Currently used liquid detergents include water, various hydrocarbons such as acetone and isopropanol, and various fluorine compounds such as perfluorocarbons, hydrofluorocarbons and hydrofluoroethers. Water and hydrocarbons do not dissolve the fluoropolymer easily. In addition, water takes a long time to dry and hydrocarbons are flammable, both of which are undesirable as cleaning agent properties. The present invention avoids these undesirable attributes and provides an alternative that is at least more environmentally friendly than the prior art. Fluoropolymer and other residues deposited on reactor walls and parts can be dissolved by using a liquid fluorinated detergent having 5 to 10 carbon atoms. The gas phase reactor cleaning method can be used partially or completely replacing conventional methods using gaseous perfluorocarbons. Hereinafter, the phrase “cleaning” refers to removing unwanted deposits that have accumulated over time on the walls and components of the gas phase reactor.
本発明のフッ素化ケトンは、典型的には、5〜10個の炭素原子、好ましくは6〜8個の炭素原子を有する。洗浄剤としてはペルフルオロケトン、すなわち炭素骨格上のすべての水素原子がフッ素に置換されていてもよい。あるいは、このフッ素化ケトン洗浄剤は2個以下の水素原子と、炭素骨格に結合している臭素、塩素及びヨウ素を含むフッ素以外の2個以下のハロゲン原子とを有してもよい。 The fluorinated ketones of the present invention typically have 5 to 10 carbon atoms, preferably 6 to 8 carbon atoms. As the cleaning agent, perfluoroketone, that is, all hydrogen atoms on the carbon skeleton may be substituted with fluorine. Alternatively, the fluorinated ketone detergent may have 2 or less hydrogen atoms and 2 or less halogen atoms other than fluorine containing bromine, chlorine and iodine bonded to the carbon skeleton.
洗浄剤に好適なペルフルオロケトン化合物の代表例にはCF3(CF2)5C(O)CF3、CF3C(O)CF(CF3)2、CF3CF2CF2C(O)CF2CF2CF3、CF3CF2C(O)CF(CF3)2、(CF3)2CFC(O)CF(CF3)2、(CF3)2CFCF2C(O)CF(CF3)2、(CF3)2CF(CF2)2C(O)CF(CF3)2、(CF3)2CF(CF2)3C(O)CF(CF3)2、CF3(CF2)2C(O)CF(CF3)2、CF3(CF2)3C(O)CF(CF3)2、CF3(CF2)4C(O)CF(CF3)2、CF3(CF2)5C(O)CF(CF3)2、CF3CF2C(O)CF2CF2CF3、ペルフルオロシクロペンタノン及びペルフルオロシクロヘキサノンが含まれる。 Representative examples of perfluoroketone compounds suitable for cleaning agents include CF 3 (CF 2 ) 5 C (O) CF 3 , CF 3 C (O) CF (CF 3 ) 2 , and CF 3 CF 2 CF 2 C (O). CF 2 CF 2 CF 3 , CF 3 CF 2 C (O) CF (CF 3 ) 2 , (CF 3 ) 2 CFC (O) CF (CF 3 ) 2 , (CF 3 ) 2 CFCF 2 C (O) CF (CF 3 ) 2 , (CF 3 ) 2 CF (CF 2 ) 2 C (O) CF (CF 3 ) 2 , (CF 3 ) 2 CF (CF 2 ) 3 C (O) CF (CF 3 ) 2 , CF 3 (CF 2 ) 2 C (O) CF (CF 3 ) 2 , CF 3 (CF 2 ) 3 C (O) CF (CF 3 ) 2 , CF 3 (CF 2 ) 4 C (O) CF (CF 3) 2, CF 3 (CF 2) 5 C (O) CF (CF 3) 2, CF 3 CF 2 C (O) CF 2 CF 2 CF 3, perfluoro cyclopentanone and perfluorocyclobutane f Sanon is included.
1個または2個のフッ素以外の原子が炭素骨格に結合しているフッ素化ケトンの代表例にはCHF2CF2C(O)CF(CF3)2、CF3C(O)CH2C(O)CF3、(CF3)2CFC(O)CF2Cl、CF2ClCF2C(O)CF(CF3)2、CF2Cl(CF2)2C(O)CF(CF3)2、CF2Cl(CF2)3C(O)CF(CF3)2、CF2Cl(CF2)4C(O)CF(CF3)2、CF2Cl(CF2)5C(O)CF(CF3)2、及びCF2ClCF2C(O)CF2CF2CF3が含まれる。 Representative examples of fluorinated ketones in which one or two atoms other than fluorine are bonded to the carbon skeleton include CHF 2 CF 2 C (O) CF (CF 3 ) 2 , CF 3 C (O) CH 2 C (O) CF 3 , (CF 3 ) 2 CFC (O) CF 2 Cl, CF 2 ClCF 2 C (O) CF (CF 3 ) 2 , CF 2 Cl (CF 2 ) 2 C (O) CF (CF 3 ) 2 , CF 2 Cl (CF 2 ) 3 C (O) CF (CF 3 ) 2 , CF 2 Cl (CF 2 ) 4 C (O) CF (CF 3 ) 2 , CF 2 Cl (CF 2 ) 5 C (O) CF (CF 3 ) 2 and CF 2 ClCF 2 C (O) CF 2 CF 2 CF 3 are included.
フッ素化ケトンとして一個以上のヘテロ原子が炭素骨格に割り込んでいるものも含まれる。好適なヘテロ原子には、例えば、窒素、酸素及び硫黄原子が含まれ、代表的な化合物としてはCF3OCF2CF2C(O)CF(CF3)2及びCF3OCF2C(O)CF(CF3)2が含まれる。 Also included are fluorinated ketones in which one or more heteroatoms interrupt the carbon skeleton. Suitable heteroatoms include, for example, nitrogen, oxygen and sulfur atoms, and representative compounds include CF 3 OCF 2 CF 2 C (O) CF (CF 3 ) 2 and CF 3 OCF 2 C (O). CF (CF 3 ) 2 is included.
フッ素化ケトンは公知の方法で製造される。一つの方法は米国特許第5,466,877号(ムーア(Moore))に記載の通り式RfCO2CF(Rf’)2の全フッ素化カルボン酸エステルを求核性開始剤の共存下に解離する方法である。ここでRfとRf’はフッ素またはペルフルオロアルキル基である。フッ素化カルボン酸エステルの前駆体は米国特許第5,399,718号(コステロら(Costello et al))に記載の通り、フッ素に置換されていない対応する炭化水素または一部フッ素化した炭化水素のフッ素ガスによる直接フッ素化により得られる。 The fluorinated ketone is produced by a known method. One method is the coexistence of a fully fluorinated carboxylic acid ester of the formula R f CO 2 CF (R f ′ ) 2 with a nucleophilic initiator as described in US Pat. No. 5,466,877 (Moore). It is a method of dissociating downward. Here, R f and R f ′ are fluorine or a perfluoroalkyl group. Precursors of fluorinated carboxylic acid esters are described in US Pat. No. 5,399,718 (Costello et al), corresponding hydrocarbons that are not substituted with fluorine or partially fluorinated hydrocarbons. Obtained by direct fluorination with fluorine gas.
カルボニル基に対してアルファ位に分岐のある過フッ素化ケトンは、米国特許第3,185,734号(ファウセットら(Fawcett et al))の記載により合成できる。フッ化物イオンの存在下、無水の環境下でアシルハライドにヘキサフルオロプロピレンを加えて合成される。少量のヘキサフルオロプロピレン2量体及び/または3量体不純物はペルフルオロケトンの蒸留により除去することができる。もし、沸点が近すぎ、分別蒸留ができない場合は、適当な溶媒、例えばアセトン、酢酸またはそれらの混合物などの有機溶媒中で過マンガン酸のアルカリ金属塩で酸化することにより2量体及び/または3量体不純物を除去できる。この酸化反応は通常密封した反応器中で室温または昇温した状態で行われる。 Perfluorinated ketones that are branched alpha to the carbonyl group can be synthesized as described in US Pat. No. 3,185,734 (Fawcett et al). It is synthesized by adding hexafluoropropylene to acyl halide in an anhydrous environment in the presence of fluoride ions. Small amounts of hexafluoropropylene dimer and / or trimer impurities can be removed by distillation of perfluoroketone. If the boiling point is too close to allow fractional distillation, dimer and / or by oxidation with an alkali metal salt of permanganic acid in an appropriate solvent, for example an organic solvent such as acetone, acetic acid or mixtures thereof. Trimer impurities can be removed. This oxidation reaction is usually carried out in a sealed reactor at room temperature or at an elevated temperature.
直鎖の過フッ素化ケトンはペルフルオロカルボン酸のアルカリ金属塩とペルフルオロカルボニルの酸性フッ化物を米国特許第4,136,121号(マーティニら(Martini et al))に記載の通り反応させることにより得られる。この種のケトンはまた米国特許第5,998,671号(バンデルプイ(Van Der Puy))に記載の通り、ペルフルオロカルボン酸塩と過フッ素化酸無水物を非プロトン性溶媒中、昇温状態で反応させることによっても得ることができる。 Linear perfluorinated ketones can be obtained by reacting alkali metal salts of perfluorocarboxylic acids with acidic fluorides of perfluorocarbonyl as described in US Pat. No. 4,136,121 (Martini et al). It is done. This type of ketone can also be obtained as described in US Pat. No. 5,998,671 (Van Der Puy) in which a perfluorocarboxylate and a perfluorinated acid anhydride are heated in an aprotic solvent at elevated temperature. It can also be obtained by reacting.
フッ素化ケトン洗浄剤は単独でも使用でき、他のフッ素化ケトンとの組み合わせまたはフッ素化ケトンと相溶性のある1つ以上の補助の洗浄剤と組合せて使用することができる。補助洗浄剤の典型的な例としてはハロゲン化化合物であり、例えば、ヒドロフルオロカーボン、ヒドロクロロフルオロカーボン、パーフルオロカーボン、パーフルオロポリエーテル、ヒドロフルオロエーテル、ヒドロフルオロポリエーテル、ヒドロクロロフルオロエーテル、フッ素化芳香族化合物、クロロフルオロカーボン、ブロモフルオロカーボン、ブロモクロロフルオロカーボン、ヒドロブロモカーボン、ヨードフルオロカーボン及びヒドロブロモフルオロカーボンが含まれる。代表的な補助洗浄剤は、C5F11H、C6F13H、C4F9OCH3、C4F9OC2H5、C3F7CF(OC2H5)CF(CF3)2、CF3CH2CF2CH3、CF3CFHCFHCF2CF3、C6F14、C7F16、C8F18、(C4F9)3N、ペルフルオロ−2−ブチルテトラヒドロフラン、ペルフルオロ−N−メチルモルホリン、HCF2O(CF2O)n(CF2CF2O)mCF2H(ここで、nは0〜2であり、mは0〜5であり、nとmの和は少なくとも1である。)、C3F7I、ベンゾトリフルオリド、トランス−1,2−ジジクロロエチレンなどが含まれる。好ましい補助洗浄剤はC4F9OCH3、C4F9OC2H5、C3F7CF(OC2H5)CF(CF3)2などのヒドロフルオロエーテルである。 The fluorinated ketone detergent can be used alone or in combination with other fluorinated ketones or with one or more auxiliary detergents that are compatible with the fluorinated ketone. Typical examples of auxiliary cleaning agents are halogenated compounds, such as hydrofluorocarbons, hydrochlorofluorocarbons, perfluorocarbons, perfluoropolyethers, hydrofluoroethers, hydrofluoropolyethers, hydrochlorofluoroethers, fluorinated aromatics. Group compounds, chlorofluorocarbons, bromofluorocarbons, bromochlorofluorocarbons, hydrobromocarbons, iodofluorocarbons and hydrobromofluorocarbons. Typical auxiliary cleaners are C 5 F 11 H, C 6 F 13 H, C 4 F 9 OCH 3 , C 4 F 9 OC 2 H 5 , C 3 F 7 CF (OC 2 H 5 ) CF (CF 3 ) 2 , CF 3 CH 2 CF 2 CH 3 , CF 3 CFHCCFHCF 2 CF 3 , C 6 F 14 , C 7 F 16 , C 8 F 18 , (C 4 F 9 ) 3 N, perfluoro-2-butyltetrahydrofuran perfluoro -N- methylmorpholine, HCF 2 O (CF 2 O ) n (CF 2 CF 2 O) m CF 2 H ( wherein, n is 0 to 2, m is 0-5, and n The sum of m is at least 1.), C 3 F 7 I, benzotrifluoride, trans-1,2-dichloroethylene and the like. Preferred auxiliary cleaning agents are hydrofluoroether such as C 4 F 9 OCH 3, C 4 F 9 OC 2 H 5, C 3 F 7 CF (OC 2 H 5) CF (CF 3) 2.
フッ素化ケトン洗浄剤は、例えば、ふき取り、噴霧及び浸漬または沈濡により部品を沈潜すなどの使用法が適用できる。この洗浄剤は、窒素、アルゴンまたは二酸化炭素などの不活性推進ガスと組み合わせ、洗浄が必要な表面に洗浄剤を吹き付けることもできる。この洗浄剤は、室温または、例えば150℃までの昇温状態で使用できる。 The fluorinated ketone cleaning agent can be used in such a manner that, for example, the parts are submerged by wiping, spraying and dipping or soaking. This cleaning agent can be combined with an inert propellant gas such as nitrogen, argon or carbon dioxide and sprayed onto the surface requiring cleaning. This cleaning agent can be used at room temperature or at elevated temperature up to 150 ° C., for example.
本発明のペルフルオロケトンは半導体業界で使用されている従来のペルフルオロカーボンよりはるかに低い地球温暖化係数(GWP)を有する。本明細書で使用する際、「GWP」は一つの化合物自身の構造に由来する相対的な温暖化係数とする。一つの化合物のGWPは、1990年に気候変動に関する政府間パネル(IPCC)によって定義され、1998年に改訂(世界気象機関、オゾン層破壊の科学的評価(Scientific Assesment of Ozone Depletion):1998、地球オゾン層研究と監視計画(Global Ozone Research and Monitoring Project)−報告No.44、ジュネーブ、1999)されたが、特定の積算時間(ITH)にわたる一つのガス1キログラム当たりの放出による温暖化度合いとCO21キログラム当たりの放出による温暖化度合いとの比較として計算される。
短期効果(20年)と長期効果(500年またはそれ以上)の間の妥協案として、通常、採用されているIHTは100年である。有機化合物の大気中での濃度は擬似一次の速度式(すなわち、対数的減少)に従うと仮定する。同一時間間隔にわたるCO2濃度は大気中からのCO2の交換及び除去に関するより複雑なモデルが組み込まれている(ベルン(Bern)の炭素循環モデル)。 As a compromise between the short-term effect (20 years) and the long-term effect (500 years or more), the IHT typically adopted is 100 years. It is assumed that the concentration of organic compounds in the air follows a pseudo first order rate equation (ie, logarithmic reduction). CO 2 concentrations over the same time interval incorporate a more complex model for the exchange and removal of CO 2 from the atmosphere (Bern's carbon cycle model).
CF3CF2C(O)CF(CF3)2の大気中での寿命は、300ナノメーターの紫外線による光分解の研究から約5日とされている。他のペルフルオロケトンも同様の吸収を示すことから同様の大気中での寿命が想定される。測定された赤外線衝突断面積はピノックら(Pinnock et al)(J.Geophys.Res.,100,23227,1995)の方法を用いて放射力値の算定に使用された。この放射力値と5日の大気中寿命を用いて計算すると、6個の炭素原子を有するペルフルオロケトンのGWP(ITHを100年として)は1であるのに対しC2F6のそれは11,400となる。本発明のペルフルオロケトン類は概ねGWPの値として10以下をとる。大気下層での急速な劣化の事実から、全フッ素化ケトンの寿命は短く、地球温暖化への寄与は十分少ないことが期待される。 The lifetime of CF 3 CF 2 C (O) CF (CF 3 ) 2 in the atmosphere is about 5 days from the study of photodecomposition by 300 nanometer ultraviolet rays. Since other perfluoroketones exhibit similar absorption, the same lifetime in the atmosphere is assumed. The measured infrared impact cross section was used to calculate the radiation force value using the method of Pinnock et al (J. Geophys. Res., 100, 23227, 1995). Calculated using this radiation force value and the atmospheric lifetime of 5 days, the perfluoroketone having 6 carbon atoms has a GWP of 1 (ITH as 100 years), whereas that of C 2 F 6 is 11. 400. The perfluoroketones of the present invention generally have a GWP value of 10 or less. The fact of rapid degradation in the lower atmosphere, the lifetime of the perfluorinated ketone is short, the contribution to global warming is expected to be sufficiently small.
更に、フッ素化ケトン類は毒性が低い。例えば、ペルフルオロケトンCF3CF2C(O)CF(CF3)2はラットの短期吸入試験よる急性毒性が低い。4時間の暴露期間によるLC50濃度は空気中でペルフルオロケトン100,000−ppmである。この毒性は半導体業界で洗浄剤として現在使用されているペルフルオロカーボンのそれと同程度である。 Furthermore, fluorinated ketones have low toxicity. For example, perfluoroketone CF 3 CF 2 C (O) CF (CF 3 ) 2 has a low acute toxicity according to a short-term inhalation test in rats. LC 50 concentration by exposure period of 4 hours is perfluoroketone 100,000-ppm in air. This toxicity is comparable to that of perfluorocarbons currently used as cleaning agents in the semiconductor industry.
以下の実施例によりフッ素化ケトンを洗浄剤として使用する方法について更に記載する。本実施例は本発明の理解を容易にするためのものであり、本発明に制限を設けるものではない。特に断らない限り、すべての百分率及び比率は重量基準である。 The following examples further describe methods for using fluorinated ketones as detergents. This example is for facilitating understanding of the present invention, and does not limit the present invention. Unless otherwise indicated, all percentages and ratios are by weight.
評価対象有機フッ素化合物の製造と原料
CF3CF2C(O)CF(CF3)2
1,1,1,2,4,4,5,5,5−ノナフルオロ−2−トリフルオロメチル−ブタン−3−オン
撹拌機、ヒーター及び熱電対を装着した清潔な乾燥した600ミリリットルパー反応器内に5.6g(0.10モル)の無水フッ化カリウム(ウィスコンシン州ミルウォーキーのシグマ アルドリッチ ケミカル カンパニー(Sigma Aldrich Chemical Co.,Milwaukee,WI)より入手可)と250gの無水ジグリム(無水ジエチレングリコールジメチルエーテル、ウィスコンシン州ミルウォーキーのシグマ アルドリッチ ケミカル カンパニー(Sigma Aldrich Chemical Co.,Milwaukee,WI)より入手可)を添加した。この合成及び引き続くすべての合成で使用する無水フッ化カリウムは、噴霧乾燥して125℃で保管し、使用直前に粉砕した。21.0g(0.13モル)のC2F5COF(純度約95.0%、ミネソタ州セントポールの3M カンパニー(3M Company,St.Paul,MN)より入手可)を密封した反応器に添加しながら、反応器の内容物を撹拌した。次に反応器およびその内容物を加熱して温度が70℃に達したら、147.3g(0.98モル)のCF2=CFCF3(ヘキサフルオロプロピレン、シグマ アルドリッチ ケミカル カンパニー(Sigma Aldrich Chemical Co.)より入手可)と163.3g(0.98モル)のC2F5COFとの混合物を3.0時間かけて添加した。ヘキサフルオロプロピレンとC2F5COFとの混合物の添加中は、圧力を95psig(7500トール)未満に維持した。ヘキサフルオロプロピレン添加終了時の圧力は30psig(2300トール)であり、45分の保持時間を通じて変わらなかった。反応器の内容物を冷却して1段プレート蒸留し、ガスクロマトグラフィーによる測定から90.6%の1,1,1,2,4,4,5,5,5−ノナフルオロ−2−トリフルオロメチル−ブタン−3−オンおよび0.37%のC6F12(ヘキサフルオロプロピレン二量体)を含有する粗フッ素化ケトン307.1gを得た。これを水洗、蒸留し、シリカゲルと接触させた後、乾燥し、0.4%のヘキサフルオロプロピレン二量体を含有する純度99%の分別されたフッ素化ケトンを得た。
Manufacture and raw materials of the target organic fluorine compounds CF 3 CF 2 C (O) CF (CF 3 ) 2
1,1,1,2,4,4,5,5,5-nonafluoro-2-trifluoromethyl-butane-3-one A clean, dry 600 ml Parr reactor equipped with stirrer, heater and thermocouple 5.6 g (0.10 mol) of anhydrous potassium fluoride (available from Sigma Aldrich Chemical Co., Milwaukee, Wis.) And 250 g of anhydrous diglyme (anhydrous diethylene glycol dimethyl ether, Sigma Aldrich Chemical Company, Milwaukee, Wisconsin (available from Sigma Aldrich Chemical Co., Milwaukee, Wis.) Was added. The anhydrous potassium fluoride used in this synthesis and all subsequent syntheses was spray dried and stored at 125 ° C. and ground immediately before use. 21.0 g (0.13 mol) of C 2 F 5 COF (purity about 95.0%, available from 3M Company, St. Paul, Minn. (3M Company, St. Paul, MN)) in a sealed reactor While adding, the contents of the reactor were stirred. The reactor and its contents were then heated and when the temperature reached 70 ° C., 147.3 g (0.98 mol) of CF 2 ═CFCF 3 (hexafluoropropylene, Sigma Aldrich Chemical Co., Ltd.). ) And 163.3 g (0.98 mol) of C 2 F 5 COF was added over 3.0 hours. During the addition of the mixture of hexafluoropropylene and C 2 F 5 COF, the pressure was maintained below 95 psig (7500 Torr). The pressure at the end of the hexafluoropropylene addition was 30 psig (2300 Torr) and remained unchanged throughout the 45 minute hold time. The reactor contents were cooled, single plate distilled, and 90.6% 1,1,1,2,4,4,5,5,5-nonafluoro-2-trifluoro as determined by gas chromatography 307.1 g of crude fluorinated ketone containing methyl-butan-3-one and 0.37% C 6 F 12 (hexafluoropropylene dimer) was obtained. This was washed with water, distilled, contacted with silica gel, and then dried to obtain a fractionated fluorinated ketone having a purity of 99% containing 0.4% hexafluoropropylene dimer.
上記によって作成された分別されたフッ素化ケトンから次の方法でヘキサフルオロプロピレン二量体を取り除いた。すやわち、撹拌機、ヒーターおよび熱電対を装着した清潔な乾燥した600ミリリットルパー反応器内に、61gの酢酸、1.7gの過マンガン酸カリウム、および301gの上述の分別された1,1,1,2,4,4,5,5,5−ノナフルオロ−2−トリフルオロメチル−ブタン−3−オンを入れた。反応器を密封して撹拌しながら60℃に加熱し、圧力を12psig(1400トール)にした。60℃で75分間の撹拌した後、ディップチューブを使用して液体サンプルを採取し、サンプルを相分離させて下相を水で洗浄した。気液分配クロマトグラフィーを使用してサンプルの分析を行ったところ、ヘキサフルオロプロピレン二量体は検出不能であり、ヘキサフルオロプロピレン三量体は少量検出された。60分後に第2回目のサンプルを採取して同様に処理した。第2回目のサンプルの気液分配クロマトグラフィー分析の結果、二量体、三量体いずれも検出不能であった。反応を3.5時間後に停止して精製したケトンを酢酸から相分離させ、下相を水で2回洗浄した。気液分配クロマトグラフィーによって99.6%を越える純度を有し、検出可能量のヘキサフルオロプロピレン二量体または三量体を含有しないケトン261gを手取った。 The hexafluoropropylene dimer was removed from the fractionated fluorinated ketone prepared as described above by the following method. That is, 61 g acetic acid, 1.7 g potassium permanganate, and 301 g of the above fractionated 1,1 in a clean, dry 600 ml Parr reactor equipped with stirrer, heater and thermocouple. 1,2,4,4,5,5,5-nonafluoro-2-trifluoromethyl-butan-3-one. The reactor was sealed and heated to 60 ° C. with stirring to a pressure of 12 psig (1400 Torr). After stirring at 60 ° C. for 75 minutes, a liquid sample was taken using a dip tube, the sample was phase separated and the lower phase was washed with water. When the sample was analyzed using gas-liquid distribution chromatography, hexafluoropropylene dimer was not detectable, and a small amount of hexafluoropropylene trimer was detected. After 60 minutes, a second sample was collected and processed in the same manner. As a result of the gas-liquid partition chromatography analysis of the second sample, neither dimer nor trimer was detectable. The reaction was stopped after 3.5 hours and the purified ketone was phase separated from acetic acid and the lower phase was washed twice with water. 261 g of ketone having a purity of more than 99.6% by gas-liquid partition chromatography and no detectable amount of hexafluoropropylene dimer or trimer was picked.
n−C3F7C(O)CF(CF3)2
1,1,1,2,4,4,5,5,6,6,6−ウンデカフルオロ−2−トリフルオロメチルヘキサン−3−オン
撹拌機、ヒーター、および熱電対を装着した清潔な乾燥した600ミリリットルパー反応器内に、5.8g(0.10モル)の無水フッ化カリウム及び108gの無水ジグリムを添加した。232.5g(1.02モル)のn−C3F7COF(3M カンパニー(3M Company)より入手可、約95.0%純度)を密閉した反応器に添加する間、反応器の内容物を撹拌しながら、ドライアイスで冷却した。次に反応器とその内容物を加熱し、温度が72℃に達した後、141g(0.94モル)のCF2=CFCF3(ヘキサフルオロプロピレン)を85psig(5150トール)の圧力で3.25時間かけて添加した。ヘキサフルオロプロピレンを添加する間、反応器の温度を85℃までゆっくりと昇温して、圧力は90psig(5400トール)未満に保った。ヘキサフルオロプロピレン添加終了時の圧力は40psig(2800トール)で、続く4時間の保持時間の間に変化はなかった。下相を分別蒸留して、72.5℃の沸点を有し、ガスクロマトグラフィーによる測定から純度99.9%を有する1,1,1,2,4,4,5,5,6,6,6−ウンデカフルオロ−2−トリフルオロメチルヘキサン−3−オンを243.5g得た。構造をガスクロマトグラフィー質量分析計(GCMS)によって確認した。
n-C 3 F 7 C ( O) CF (CF 3) 2
1,1,1,2,4,4,5,5,6,6,6-undecafluoro-2-trifluoromethylhexane-3-one Clean dry equipped with stirrer, heater, and thermocouple 5.8 g (0.10 mole) of anhydrous potassium fluoride and 108 g of anhydrous diglyme were added into the 600 milliliter Par reactor. N-C 3 F 7 COF of 232.5g (1.02 mol) (3M Company (3M Company) from Availability In, about 95.0% purity) during the addition the reactor was sealed, the contents of the reactor The mixture was cooled with dry ice while stirring. The reactor and its contents are then heated and after the temperature reaches 72 ° C., 141 g (0.94 mol) of CF 2 ═CFCF 3 (hexafluoropropylene) is added at a pressure of 85 psig (5150 torr). Added over 25 hours. During the addition of hexafluoropropylene, the reactor temperature was slowly raised to 85 ° C. and the pressure was kept below 90 psig (5400 Torr). The pressure at the end of the hexafluoropropylene addition was 40 psig (2800 torr) and remained unchanged during the subsequent 4 hour hold time. 1,1,1,2,4,4,5,5,6,6 having a boiling point of 72.5 ° C. and a purity of 99.9% as determined by gas chromatography , 6-Undecafluoro-2-trifluoromethylhexane-3-one was obtained in an amount of 243.5 g. The structure was confirmed by gas chromatography mass spectrometer (GCMS).
CF3(CF2)5C(O)CF3
1,1,1,3,3,4,4,5,5,6,6,7,7,8,8,8−ヘキサデカフルオロオクタン−2−オン
米国特許第5,488,142号(フォールら(Fall et al))に記載の通り、直接フッ素化により1052ミリリットルの酢酸2−オクチルを全フッ素化エステルに変換した。得られた全フッ素化エステルをメタノールで処理し、ヘミケタールに変換し、反応溶媒の蒸留を行った。得られたヘミケタール1272gを徐々に1200ミリリットルの濃硫酸に添加し、得られた反応混合物を再蒸留し、沸点97℃、核磁気共鳴法により純度98.4%の1,1,1,3,3,4,4,5,5,6,6,7,7,8,8,8−ヘキサデカフルオロオクタン−2−オン1554.3gを得た。
CF 3 (CF 2 ) 5 C (O) CF 3
1,1,1,3,3,4,4,5,5,6,6,7,7,8,8,8-hexadecafluorooctane-2-one US Pat. No. 5,488,142 ( As described in Fall et al), 1052 milliliters of 2-octyl acetate was converted to a fully fluorinated ester by direct fluorination. The resulting fully fluorinated ester was treated with methanol, converted to hemiketal, and the reaction solvent was distilled. 1272 g of the obtained hemiketal was gradually added to 1200 ml of concentrated sulfuric acid, the resulting reaction mixture was redistilled, and 1,1,1,3, having a boiling point of 97 ° C. and a purity of 98.4% by nuclear magnetic resonance. 1554.3 g of 3,4,4,5,5,6,6,7,7,8,8,8-hexadecafluorooctane-2-one was obtained.
CF3OCF2CF2C(O)CF(CF3)2
1,1,2,2,4,5,5,5−オクタフルオロ−1−トリフルオロメトキシ−4−トリフルオロメチルペンタン−3−オン
清潔な乾燥した600ミリリットルパー反応器内に、11.6g(0.20モル)の無水フッ化カリウムおよび113.5gの無水ジグリムを入れた。反応器の内容物を撹拌しながら、ドライアイスで冷却し、次に独立の真空系を用いて、230g(0.96モル)のCF3OCF2CF2COF(3M Co.より入手可、純度約97%)を密封反応器に添加した。反応器を80℃および圧力80psig(4900トール)にして、154g(1.03モル)のヘキサフルオロプロピレンを3.5時間かけて徐々に添加した。1時間の反応保持時間に続いて、蒸留および分別前の相分離によって生成物を反応混合物から回収し、77℃の沸点を有し、ガスクロマトグラフィーによる測定で純度99.8%を有する1,1,2,2,4,5,5,5−オクタフルオロ−1−トリフルオロメトキシ−4−トリフルオロメチルペンタン−3−オン100gを得た。ガスクロマトグラフィーおよび質量分析によって構造を確認した。
CF 3 OCF 2 CF 2 C (O) CF (CF 3 ) 2
1,1,2,2,4,5,5,5-octafluoro-1-trifluoromethoxy-4-trifluoromethylpentan-3-one 11.6 g in a clean, dry 600 ml Parr reactor (0.20 mol) of anhydrous potassium fluoride and 113.5 g of anhydrous diglyme were added. The reactor contents are cooled with dry ice while stirring and then using an independent vacuum system, 230 g (0.96 mol) of CF 3 OCF 2 CF 2 COF (available from 3M Co., purity About 97%) was added to the sealed reactor. The reactor was brought to 80 ° C. and a pressure of 80 psig (4900 torr) and 154 g (1.03 mol) of hexafluoropropylene was added slowly over 3.5 hours. Following a reaction holding time of 1 hour, the product is recovered from the reaction mixture by phase separation before distillation and fractionation, has a boiling point of 77 ° C. and has a purity of 99.8% as determined by gas chromatography. 100 g of 1,2,2,4,5,5,5-octafluoro-1-trifluoromethoxy-4-trifluoromethylpentan-3-one was obtained. The structure was confirmed by gas chromatography and mass spectrometry.
ClCF2C(O)CF(CF3)2
1−クロロ−1,1,3,4,4,4−ヘキサフルオロ−3−トリフルオロメチル−ブタン−2−オン
清潔な乾燥した600ミリリットルパー圧力反応器内に、53.5g(0.92モル)の無水フッ化カリウム、150gの無水ジグリム、及び150gのクロロジフルオロ酢酸無水物を装填した。反応器を80℃および92psig(5500トール)に設定し、123g(0.820モル)のヘキサフルオロプロピレンを3時間かけて、120psig(7000トール)を越えないタンク圧力で装填した。80℃での0.5時間の反応に続き、反応器の内容物を冷却させて蒸留し、180.6gの粗試料を得た。粗試料の分別蒸留、酢酸/KMnO4処理、および再分別後に、ガスクロマトグラフィーによる測定で純度98.8%を有する無色透明液体(CF3)2CFC(O)CF2Clを46.1g(理論収量の26%)得た。
ClCF 2 C (O) CF (CF 3 ) 2
1-Chloro-1,1,3,4,4,4-hexafluoro-3-trifluoromethyl-butan-2-one In a clean, dry 600 ml per pressure reactor, 53.5 g (0.92 Mol) of anhydrous potassium fluoride, 150 g of anhydrous diglyme, and 150 g of chlorodifluoroacetic anhydride. The reactor was set at 80 ° C. and 92 psig (5500 torr) and 123 g (0.820 mol) of hexafluoropropylene was charged over 3 hours at a tank pressure not exceeding 120 psig (7000 torr). Following a 0.5 hour reaction at 80 ° C., the reactor contents were cooled and distilled to yield 180.6 g of a crude sample. After fractional distillation of the crude sample, acetic acid / KMnO4 treatment and re-fractionation, 46.1 g (theoretical) of a colorless transparent liquid (CF 3 ) 2 CFC (O) CF 2 Cl having a purity of 98.8% as determined by gas chromatography 26% of the yield).
(CF3)2CFC(O)CF(CF3)2
1,1,1,2,4,5,5,5,6,6,6−オクタフルオロ−2,4−ビス(トリフルオロメチル)ペンタン−3−オン
8.1g(0.14モル)の無水フッ化カリウム、216g(0.50モル)のペルフルオロ(イソ酪酸イソブチル)(米国特許第5,399,718号(コステロら(Costell et al)に記載の通り、イソ酪酸イソブチルとフッ素ガスを反応させ作成)及び200gの無水ジグリムを清潔な乾燥した600ミリリットルパー圧力反応器に装填した。反応器を0℃未満に冷却した後、得られた混合物に165g(1.10モル)のヘキサフルオロプロピレンを添加した。反応器の内容物を撹拌しながら70℃で一晩反応させ、次に反応器を冷却して反応器内の過剰な圧力を大気中に放出した。次に反応器の内容物を相分離させて362.5gの下相を得た。得られた下相を以前の類似反応から保存してあった下相と混合した。22%のフッ化ペルフルオロイソブチリルを含有する集めた下相604g及びヘキサフルオロプロピレン197g(1.31モル)に無水フッ化カリウム8g(0.1モル)及び無水ジグリム50gを添加して、得られる混合物をパー反応器内で前回と同様に反応させた。今回は、54.4%の所望物質と、わずかに5.7%のフッ化ペルフルオロイソブチリルを含有する下相847gを得た。次に得られた下相を水洗して無水硫酸マグネシウムで乾燥後、分別蒸留した。ガスクロマトグラフィー質量分析計(「gcms」)による測定で純度95.2%を有し(47%理論収量)、73℃の沸点を有する1,1,1,2,4,5,5,5,6,6,6−オクタフルオロ−2,4−ビス(トリフルオロメチル)ペンタン−3−オン359gを得た。
(CF 3 ) 2 CFC (O) CF (CF 3 ) 2
1,1,1,2,4,5,5,5,6,6,6-octafluoro-2,4-bis (trifluoromethyl) pentan-3-one 8.1 g (0.14 mol) Anhydrous potassium fluoride, 216 g (0.50 mol) perfluoro (isobutyl isobutyrate) (US Pat. No. 5,399,718 (reacting isobutyl isobutyrate with fluorine gas as described in Costell et al.) And 200 g of anhydrous diglyme were charged into a clean, dry 600 ml per pressure reactor, and after cooling the reactor to below 0 ° C., the resulting mixture was charged with 165 g (1.10 mol) of hexafluoropropylene. The reactor contents were allowed to react overnight at 70 ° C. with stirring, then the reactor was cooled to release excess pressure in the reactor to the atmosphere. The contents were phase separated to give 362.5 g of the lower phase, which was mixed with the lower phase that had been stored from the previous similar reaction, containing 22% perfluoroisobutyryl fluoride. To 604 g of the collected lower phase and 197 g (1.31 mol) of hexafluoropropylene, 8 g (0.1 mol) of anhydrous potassium fluoride and 50 g of anhydrous diglyme are added, and the resulting mixture is kept in the Parr reactor as before. This time, 847 g of a lower phase containing 54.4% of the desired material and only 5.7% perfluoroisobutyryl fluoride was obtained. The extract was dried over anhydrous magnesium sulfate and fractionally distilled, having a purity of 95.2% (47% theoretical yield) and a boiling point of 73 ° C. as measured by gas chromatography mass spectrometer (“gcms”) 1,1 , 1,2 4,5,5,5,6,6,6- octafluoro-2,4-bis (trifluoromethyl) pentanoic 3-one 359 g.
CF3(CF2)5C(O)CF(CF3)2
1,1,1,2,4,4,5,5,6,6,7,7,8,8,9,9,9−ヘプタデカフルオロ−2−トリフルオロメチル−ノナン−3−オン
2027gのトリフルオロ酢酸ペンタデカフルオロヘプチルエステル(米国特許第5,399,718号(コステロら(Costello et al)))に記載の通り、酢酸ヘプチルとフッ素ガスを反応させ、作成)、777gの3M(商標)PF−5052パフォーマンスリキッド(全フッ素化溶媒の混合物、3M カンパニー(3M Company)より入手可)、3171gの無水ジグリム及び79gの無水フッ化カリウムからなる混合物を2ガロン(7.6リットル)の撹拌機付きステンレススチール製圧力容器に投入した。この容器を加熱し、1816gのヘキサフルオロプロピレンを2時間にわたり、この間反応温度を約50℃に維持しながら、添加した。ヘキサフルオロプロピレンの添加終了後、さらに1.5時間、50℃に保持した。次いで、反応器を冷却し内容物を抜き取った。得られた液体を相分離し、下相を分別蒸留し、ガスクロマトグラフィーと質量分析から沸点25℃、純度95%の1,1,1,2,4,4,4−ヘプタフルオロ−3−トリフルオロメチル−ブタン−2−オン565gと沸点134℃、純度98.5%の1,1,1,2,4,4,5,5,6,6,7,7,8,8,9,9,9−ヘプタデカフルオロ−2−トリフルオロメチル−ノナン−3−オン1427gを得た。
CF 3 (CF 2 ) 5 C (O) CF (CF 3 ) 2
1,1,1,2,4,4,5,5,6,6,7,7,8,8,9,9,9-heptadecafluoro-2-trifluoromethyl-nonan-3-one 2027 g Of trifluoroacetic acid pentadecafluoroheptyl ester (made by reacting heptyl acetate with fluorine gas as described in US Pat. No. 5,399,718 (Costello et al)), 777 g of 3M ( TM) PF-5052 performance Liquid (a mixture of perfluorinated solvents, 3M Company (3M Company) available from), the mixture of two gallons consisting of anhydrous potassium fluoride in anhydrous diglyme and 79g of 3171g of (7.6 liters) It was put into a stainless steel pressure vessel with a stirrer. The vessel was heated and 1816 g of hexafluoropropylene was added over 2 hours while maintaining the reaction temperature at about 50 ° C. After completion of the addition of hexafluoropropylene, the temperature was further maintained at 50 ° C. for 1.5 hours. The reactor was then cooled and the contents removed. The obtained liquid was phase-separated, the lower phase was fractionally distilled, and 1,1,1,2,4,4-heptafluoro-3- having a boiling point of 25 ° C. and a purity of 95% from gas chromatography and mass spectrometry. 1,1,1,2,4,4,5,5,6,6,7,7,8,8,9 with 565 g of trifluoromethyl-butan-2-one and a boiling point of 134 ° C. and a purity of 98.5% , 9,9-heptadecafluoro-2-trifluoromethyl-nonan-3-one 1427 g were obtained.
C4F9OCH3
ペルフルオロブチルメチルエーテル
3M(商標)ノベック(NOVEC)(商標)HFE−7100スペシャルティリキッド(specialty liquid)(ミネソタ州セントポールの3M カンパニー(St.Paul,MN)より入手可)
C 4 F 9 OCH 3
Perfluorobutyl methyl ether 3M (TM) Novec (TM) HFE-7100 special liquid (available from 3M Company, St. Paul, Minn.)
C4F9OC2H5
ペルフルオロブチルエチルエーテル
3M(商標)ノベック(NOVEC)(商標)HFE−7200スペシャルティリキッド(specialty liquid)(ミネソタ州セントポールの3M カンパニー(St.Paul,MN)より入手可)
C 4 F 9 OC 2 H 5
Perfluorobutyl ethyl ether 3M (TM) Novec (TM) HFE-7200 special liquid (available from 3M Company, St. Paul, Minn.)
C3F7CF(OC2H5)CF(CF3)2
3−エトキシーペルフルオロ(2−メチルヘキサン)
3M(商標)ノベック(NOVEC)(商標)HFE−7500スペシャルティリキッド(specialty liquid)(ミネソタ州セントポールの3M カンパニー(St.Paul,MN)より入手可)
C 3 F 7 CF (OC 2 H 5) CF (CF3) 2
3-Ethoxy-perfluoro (2-methylhexane)
3M (TM) Novec (TM) HFE-7500 specialty liquid (available from 3M Company, St. Paul, MN, St. Paul, Minn.)
実施例1及び比較例C1〜C3
実施例1において、ペルフルオロケトンの1種であるCF3CF2C(O)CF(CF3)2を湿式洗浄剤として評価した。すなわち、8インチ(20cm)ウエーハ(カリフォルニア州サンタクララのアプライドマテリアル(Applied Materials,Santa Clara,CA)から入手)の処理に商業的に使用されたモデルP−5000エッチングチャンバーから取り外したシリカガス分配用板状器具上に蓄積したフルオロポリマーを除去することにより湿式洗浄剤として評価した。
Example 1 and Comparative Examples C1-C3
In Example 1, CF 3 CF 2 C (O) CF (CF 3 ) 2 , which is a kind of perfluoroketone, was evaluated as a wet cleaning agent. That is, a silica gas distribution plate removed from a model P-5000 etching chamber used commercially to process 8 inch (20 cm) wafers (obtained from Applied Materials, Santa Clara, Calif.). The wet polymer was evaluated by removing the fluoropolymer that had accumulated on the tool.
各評価においては、約500ミリリットルの湿式洗浄剤をポリマーが蓄積した前記器具に使用し、室温にて前記器具を浸漬した。30分浸漬の後、厚さ8分の1インチ(0.3cm)のポリテトラフルオロエチレン厚板に巻かれたクリーンルーム用拭き取り紙(ニュージャージー州サドルリバーのテックスワイプ(Texwipe,Saddle River,NJ)より入手可)を用い、手で静かに擦る方法(すなわち、前記器具に非常にわずかな力を垂直方向に5分間掛ける)で前記ポリマーを除去する操作を行った。30分の浸漬後、約半分の堆積ポリマーが除去できた。さらに、30分の浸漬後(合計60分)、ほとんどすべてのポリマー堆積物を擦り取ることができた。 In each evaluation, about 500 milliliters of wet cleaning agent was used for the instrument with accumulated polymer and the instrument was immersed at room temperature. Cleanroom wipes (Texwipe, Saddle River, NJ) wrapped in 1/8 inch (0.3 cm) thick polytetrafluoroethylene slab after 30 minutes immersion The polymer was removed by a method of gently rubbing by hand (that is, applying a very slight force to the device in the vertical direction for 5 minutes). About half of the deposited polymer could be removed after 30 minutes of immersion. Furthermore, after 30 minutes immersion (60 minutes total), almost all polymer deposits could be scraped off.
比較例C1〜C3においては、CF3CF2C(O)CF(CF3)2に置き換えて、C4F9OCH3、C4F9OC2H5及びC3F7CF(OC2H5)CF(CF3)2をそれぞれ使用する以外は実施例1に記載の評価方法によった。C4F9OCH3、C4F9OC2H5及びC3F7CF(OC2H5)CF(CF3)2溶剤を使用することにより、60分の浸漬後、ほとんどすべての前記ポリマー堆積物が除去できた(今回は30分浸漬後の擦り操作はなし)。 In Comparative Examples C1 to C3, replaced with CF 3 CF 2 C (O) CF (CF 3) 2, C 4 F 9 OCH 3, C 4 F 9 OC 2 H 5 and C 3 F 7 CF (OC 2 The evaluation method described in Example 1 was used except that H 5 ) CF (CF 3 ) 2 was used. By using C 4 F 9 OCH 3 , C 4 F 9 OC 2 H 5 and C 3 F 7 CF (OC 2 H 5 ) CF (CF 3 ) 2 solvent, almost all of the above after immersion for 60 minutes The polymer deposit could be removed (this time there was no rubbing operation after immersion for 30 minutes).
実施例2〜8
実施例2〜8においては、湿式洗浄剤として、次にあげるフッ素化ケトン:n−C3F7C(O)CF(CF3)2(実施例2)、CF3(CF2)5C(O)CF3(実施例3)、CF3OCF2CF2C(O)CF(CF3)2(実施例4)、ClCF2C(O)CF(CF3)2(実施例5)、(CF3)2CFC(O)CF(CF3)2(実施例6)、CF3(CF2)5C(O)CF(CF3)2(実施例7)及びCF3CF2C(O)CF(CF3)2(実施例8−実施例1で使用したと同じケトン)を室温で評価した。各ケトンについては、商業運転によりフルオロポリマーで汚染されたチャンバーガスのシャワーヘッド(汚染されたヘッドは東京エレクトロン社(東京、日本)から入手)を洗浄する能力を評価した。各洗浄試験においては、各溶媒約20ミリリットルを洗浄に使用したが、ClCF2C(O)CF(CF3)2においては揮発性が高いので40ミリリットルを使用した。各汚染したシャワーヘッドを部分的に供試フッ素化ケトン溶媒に5分間浸漬し、実施例1に記載の厚さ8分の1インチ(0.3cm)のポリテトラフルオロエチレン厚板に巻かれたクリーンルーム用拭き取り紙を用い、手で静かに擦った。各事例ともポリマーの除去が若干困難であったので、汚染した各シャワーヘッドを供試フッ素化ケトンにさらに5分間(合計10分間)浸漬した。今回は、すべての供試フッ素化ケトンについて、前記フルオロポリマーを汚染したヘッドから容易に除去することができた。
Examples 2-8
In Examples 2-8, as a wet cleaning agent, then raising the fluorinated ketone: n-C 3 F 7 C (O) CF (CF 3) 2 ( Example 2), CF 3 (CF 2 ) 5 C (O) CF 3 (Example 3), CF 3 OCF 2 CF 2 C (O) CF (CF 3 ) 2 (Example 4), ClCF 2 C (O) CF (CF 3 ) 2 (Example 5) (CF 3 ) 2 CFC (O) CF (CF 3) 2 (Example 6), CF 3 (CF 2 ) 5 C (O) CF (CF 3) 2 (Example 7) and CF 3 CF 2 C (O ) CF (CF 3 ) 2 (Example 8-Same ketone as used in Example 1) was evaluated at room temperature. Each ketone was evaluated for its ability to clean a chamber gas showerhead contaminated with fluoropolymer by commercial operation (contaminated head obtained from Tokyo Electron Limited, Tokyo, Japan). In each washing test, about 20 ml of each solvent was used for washing, but 40 ml was used because ClCF 2 C (O) CF (CF 3 ) 2 is highly volatile. Each contaminated showerhead was partially immersed in the test fluorinated ketone solvent for 5 minutes and wound on a 1/8 inch (0.3 cm) thick polytetrafluoroethylene slab as described in Example 1. A clean room wipe was used and gently rubbed by hand. In each case, removal of the polymer was somewhat difficult, so each contaminated showerhead was immersed in the test fluorinated ketone for an additional 5 minutes (10 minutes total). This time, all of the test fluorinated ketones could be easily removed from the contaminated head.
実施例9〜10
CF3CF2C(O)CF(CF3)2については、洗浄溶媒として40℃(実施例9)と自身の沸点より数度低い(実施例10)温度でさらに評価した。溶媒温度の上昇につれポリマーの除去速度が増加した。
Examples 9-10
CF 3 CF 2 C (O) CF (CF 3 ) 2 was further evaluated as a cleaning solvent at 40 ° C. (Example 9) and a temperature several degrees lower than its boiling point (Example 10). As the solvent temperature increased, the polymer removal rate increased.
前述の詳細な説明から、この発明の範囲と精神を逸脱することなく、この発明に様々な変更ができることは明らかである。それゆえ、本発明の精神から逸脱しないすべての変更及び変形は特許請求の範囲及びその等価物に包含されることを意図している。 It will be apparent from the foregoing detailed description that various modifications can be made to the present invention without departing from the scope and spirit of the invention. Therefore, all modifications and variations that do not depart from the spirit of the present invention are intended to be embraced in the claims and their equivalents.
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US3185734A (en) * | 1960-10-25 | 1965-05-25 | Du Pont | Novel polyfluoro-substituted ketones and their preparation from polyfluoro acid fluorides |
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JP2763083B2 (en) * | 1993-06-01 | 1998-06-11 | 工業技術院長 | Fluorine-based cleaning solvent composition |
US5466877A (en) * | 1994-03-15 | 1995-11-14 | Minnesota Mining And Manufacturing Company | Process for converting perfluorinated esters to perfluorinated acyl fluorides and/or ketones |
JP2869432B2 (en) * | 1996-10-04 | 1999-03-10 | 工業技術院長 | Solvent and method for cleaning article surface using the same |
JP2952414B2 (en) * | 1997-09-22 | 1999-09-27 | 工業技術院長 | Solvent and method for cleaning article surface using the same |
US5998671A (en) * | 1998-05-15 | 1999-12-07 | Alliedsignal Inc. | Fluorinated ketones and method for making same |
DE69933025T2 (en) * | 1998-05-26 | 2007-03-08 | Tokyo Electron Ltd. | CLEANING LIQUID AND CLEANING METHOD FOR SEMICONDUCTOR MACHINING COMPONENTS |
JP3141325B2 (en) * | 1999-01-14 | 2001-03-05 | 工業技術院長 | Solvent and method for cleaning article surface using the same |
JP4322346B2 (en) * | 1999-02-26 | 2009-08-26 | 東京エレクトロン株式会社 | Cleaning method for film forming apparatus |
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2001
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2002
- 2002-02-12 JP JP2002583701A patent/JP4160403B2/en not_active Expired - Fee Related
- 2002-02-12 EP EP02764134A patent/EP1381709A1/en not_active Withdrawn
- 2002-02-12 KR KR10-2003-7013839A patent/KR20030090784A/en not_active Application Discontinuation
- 2002-02-12 WO PCT/US2002/004087 patent/WO2002086191A1/en active Search and Examination
- 2002-02-12 CN CNA028087798A patent/CN1505693A/en active Pending
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WO2002086191A1 (en) | 2002-10-31 |
JP2005507954A (en) | 2005-03-24 |
US6394107B1 (en) | 2002-05-28 |
CN1505693A (en) | 2004-06-16 |
EP1381709A1 (en) | 2004-01-21 |
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