JP4081350B2 - メモリのためのアドレス構成を生成する方法 - Google Patents
メモリのためのアドレス構成を生成する方法 Download PDFInfo
- Publication number
- JP4081350B2 JP4081350B2 JP2002323686A JP2002323686A JP4081350B2 JP 4081350 B2 JP4081350 B2 JP 4081350B2 JP 2002323686 A JP2002323686 A JP 2002323686A JP 2002323686 A JP2002323686 A JP 2002323686A JP 4081350 B2 JP4081350 B2 JP 4081350B2
- Authority
- JP
- Japan
- Prior art keywords
- address
- lines
- memory
- sequence
- column
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/10—Decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Static Random-Access Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/990,924 US6466512B1 (en) | 2001-11-13 | 2001-11-13 | Method of generating address configurations for solid state memory |
| US09/990,924 | 2001-11-13 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003187589A JP2003187589A (ja) | 2003-07-04 |
| JP2003187589A5 JP2003187589A5 (enExample) | 2005-08-04 |
| JP4081350B2 true JP4081350B2 (ja) | 2008-04-23 |
Family
ID=25536657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002323686A Expired - Fee Related JP4081350B2 (ja) | 2001-11-13 | 2002-11-07 | メモリのためのアドレス構成を生成する方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6466512B1 (enExample) |
| EP (1) | EP1310960A3 (enExample) |
| JP (1) | JP4081350B2 (enExample) |
| KR (1) | KR20030040101A (enExample) |
| CN (1) | CN100380518C (enExample) |
| TW (1) | TW580711B (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6535455B1 (en) * | 2001-10-13 | 2003-03-18 | Hewlett-Packard Company | Fault-tolerant neighborhood-disjoint address logic for solid state memory |
| US7003713B2 (en) * | 2002-05-16 | 2006-02-21 | Broadcom Corporation | Variable Hamming error correction for a one-time-programmable-ROM |
| US7191380B2 (en) * | 2003-09-10 | 2007-03-13 | Hewlett-Packard Development Company, L.P. | Defect-tolerant and fault-tolerant circuit interconnections |
| US7350132B2 (en) * | 2003-09-10 | 2008-03-25 | Hewlett-Packard Development Company, L.P. | Nanoscale interconnection interface |
| US7307345B2 (en) * | 2005-11-01 | 2007-12-11 | Hewlett-Packard Development Company, L.P. | Crossbar-array designs and wire addressing methods that tolerate misalignment of electrical components at wire overlap points |
| US7495942B2 (en) * | 2004-08-13 | 2009-02-24 | University Of Florida Research Foundation, Inc. | Nanoscale content-addressable memory |
| US7489583B2 (en) * | 2005-09-06 | 2009-02-10 | Hewlett-Packard Development Company, L.P. | Constant-weight-code-based addressing of nanoscale and mixed microscale/nanoscale arrays |
| US7319416B2 (en) * | 2006-01-30 | 2008-01-15 | Hewlett-Packard Development Company, L.P. | Tunneling-resistor-junction-based microscale/nanoscale demultiplexer arrays |
| US7763978B2 (en) * | 2007-03-28 | 2010-07-27 | Hewlett-Packard Development Company, L.P. | Three-dimensional crossbar array systems and methods for writing information to and reading information stored in three-dimensional crossbar array junctions |
| US7630246B2 (en) * | 2007-06-18 | 2009-12-08 | Micron Technology, Inc. | Programming rate identification and control in a solid state memory |
| KR100892673B1 (ko) | 2007-09-05 | 2009-04-15 | 주식회사 하이닉스반도체 | 어드레스 치환 회로 및 이를 포함하는 반도체 메모리 장치 |
| KR100956946B1 (ko) * | 2008-04-16 | 2010-05-11 | 매그나칩 반도체 유한회사 | 비휘발성 메모리 장치의 쓰기방법 |
| KR100971654B1 (ko) * | 2008-06-25 | 2010-07-22 | (주)아이엘전자 | 플럭스 유입 방지 택트 스위치 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4064558A (en) * | 1976-10-22 | 1977-12-20 | General Electric Company | Method and apparatus for randomizing memory site usage |
| US4092665A (en) * | 1976-12-29 | 1978-05-30 | Xerox Corporation | Method and means for extracting variable length data from fixed length bytes |
| US4556960A (en) * | 1982-12-13 | 1985-12-03 | Sperry Corporation | Address sequencer for overwrite avoidance |
| US4782340A (en) * | 1986-08-22 | 1988-11-01 | Energy Conversion Devices, Inc. | Electronic arrays having thin film line drivers |
| US5550782A (en) * | 1991-09-03 | 1996-08-27 | Altera Corporation | Programmable logic array integrated circuits |
| JPH0696598A (ja) * | 1992-07-10 | 1994-04-08 | Texas Instr Japan Ltd | 半導体メモリ装置及び欠陥メモリセル救済回路 |
| US5721498A (en) * | 1995-12-11 | 1998-02-24 | Hewlett Packard Company | Block segmentation of configuration lines for fault tolerant programmable logic device |
| US6172933B1 (en) * | 1998-09-04 | 2001-01-09 | Intel Corporation | Redundant form address decoder for memory system |
| KR100326268B1 (ko) * | 1998-10-28 | 2002-05-09 | 박종섭 | 디코딩시의동작마진확보를위한디코딩장치및그방법 |
| JP2000285694A (ja) * | 1999-03-30 | 2000-10-13 | Mitsubishi Electric Corp | 半導体記憶装置および半導体記憶装置を搭載する半導体集積回路装置 |
| US6088287A (en) * | 1999-08-23 | 2000-07-11 | Advanced Micro Devices, Inc. | Flash memory architecture employing three layer metal interconnect for word line decoding |
| US6459648B1 (en) * | 2001-10-13 | 2002-10-01 | Josh N. Hogan | Fault-tolerant address logic for solid state memory |
-
2001
- 2001-11-13 US US09/990,924 patent/US6466512B1/en not_active Expired - Lifetime
-
2002
- 2002-10-29 TW TW091132102A patent/TW580711B/zh not_active IP Right Cessation
- 2002-11-07 JP JP2002323686A patent/JP4081350B2/ja not_active Expired - Fee Related
- 2002-11-12 KR KR1020020069929A patent/KR20030040101A/ko not_active Ceased
- 2002-11-13 CN CNB021495300A patent/CN100380518C/zh not_active Expired - Lifetime
- 2002-11-13 EP EP02257803A patent/EP1310960A3/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| KR20030040101A (ko) | 2003-05-22 |
| EP1310960A2 (en) | 2003-05-14 |
| TW200300261A (en) | 2003-05-16 |
| CN1419240A (zh) | 2003-05-21 |
| JP2003187589A (ja) | 2003-07-04 |
| EP1310960A3 (en) | 2005-01-12 |
| CN100380518C (zh) | 2008-04-09 |
| US6466512B1 (en) | 2002-10-15 |
| TW580711B (en) | 2004-03-21 |
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