JP3998460B2 - 光学装置の特性を決定する方法及び検査装置 - Google Patents

光学装置の特性を決定する方法及び検査装置 Download PDF

Info

Publication number
JP3998460B2
JP3998460B2 JP2001349780A JP2001349780A JP3998460B2 JP 3998460 B2 JP3998460 B2 JP 3998460B2 JP 2001349780 A JP2001349780 A JP 2001349780A JP 2001349780 A JP2001349780 A JP 2001349780A JP 3998460 B2 JP3998460 B2 JP 3998460B2
Authority
JP
Japan
Prior art keywords
polarization
path
light
light beam
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001349780A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002243585A5 (enExample
JP2002243585A (ja
Inventor
ハロルド・ローゼンフェルド
グレッグ・ヴァン・ウィガーレン
ダグラス・バニー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP00125089A external-priority patent/EP1113250B1/en
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2002243585A publication Critical patent/JP2002243585A/ja
Publication of JP2002243585A5 publication Critical patent/JP2002243585A5/ja
Application granted granted Critical
Publication of JP3998460B2 publication Critical patent/JP3998460B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/336—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization mode dispersion [PMD]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/337—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization dependent loss [PDL]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2001349780A 2000-11-17 2001-11-15 光学装置の特性を決定する方法及び検査装置 Expired - Fee Related JP3998460B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP00125089A EP1113250B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining the polarisation mode dispersion of an optical device
US00125089.3 2001-08-28
US09/940,741 US6606158B2 (en) 2000-11-17 2001-08-28 Determination of a property of an optical device
US940741 2001-08-28

Publications (3)

Publication Number Publication Date
JP2002243585A JP2002243585A (ja) 2002-08-28
JP2002243585A5 JP2002243585A5 (enExample) 2007-08-02
JP3998460B2 true JP3998460B2 (ja) 2007-10-24

Family

ID=26071602

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001349780A Expired - Fee Related JP3998460B2 (ja) 2000-11-17 2001-11-15 光学装置の特性を決定する方法及び検査装置

Country Status (1)

Country Link
JP (1) JP3998460B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1450149B1 (de) * 2003-02-21 2007-01-03 Thorlabs, Inc. Vorrichtung und Verfahren zur Bestimmung der chromatischen Dispersion von optischen Komponenten
US7075659B2 (en) * 2004-02-05 2006-07-11 Agilent Technologies, Inc. Heterodyne optical network analysis that utilizes signal modulation
DE102006025122A1 (de) 2005-05-31 2006-12-07 Yokogawa Electric Corporation, Musashino Vorrichtung zur Messung einer optischen Charakteristik
JP4916347B2 (ja) * 2007-03-12 2012-04-11 アンリツ株式会社 光ヘテロダイン型ｏｆｄｒ装置
JP7622857B2 (ja) * 2021-09-13 2025-01-28 日本電信電話株式会社 光ファイバセンシング装置及び方法

Also Published As

Publication number Publication date
JP2002243585A (ja) 2002-08-28

Similar Documents

Publication Publication Date Title
US6606158B2 (en) Determination of a property of an optical device
EP1420238B1 (en) Determining an optical property by using superimposed delayed signals
US7042573B2 (en) Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects
Heffner Automated measurement of polarization mode dispersion using Jones matrix eigenanalysis
US6882428B2 (en) Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser
US6204924B1 (en) Method and apparatus for measuring polarization mode dispersion of optical devices
EP0553460A2 (en) Method and apparatus for measuring polarization mode dispersion in optical devices
CN101871788B (zh) 测量保偏光纤和双折射介质的分布式偏振串扰方法及装置
US7009691B2 (en) System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
US9041935B2 (en) Measuring polarization crosstalk in optical birefringent materials and devices based on reduction of line broadening caused by birefringent dispersion
US20110277552A1 (en) Measuring Distributed Polarization Crosstalk in Polarization Maintaining Fiber and Optical Birefringent Material
US7227645B2 (en) Method and apparatus for measuring polarization mode dispersion
US7426021B2 (en) Interferometric optical analyzer and method for measuring the linear response of an optical component
US7602499B2 (en) Measuring polarization mode dispersion
EP1207377A2 (en) Method and apparatus for measuring optical properties by means of the Jones matrix
Williams PMD measurement techniques and how to avoid the pitfalls
JP3998460B2 (ja) 光学装置の特性を決定する方法及び検査装置
WO1996036859A1 (en) Measurement of polarization mode dispersion
JP2006521554A (ja) 単一波長掃引の偏光依存損失測定
JP4741329B2 (ja) 波長分散測定方法、波長分散測定装置及び波長分散補正システム
US7253906B2 (en) Polarization state frequency multiplexing
Simova et al. Biased π-shifted low-coherence Interferometry for measuring polarization mode dispersion (PMD)
Du et al. Unbalanced Orthogonal Polarization Interrogated Optical Vector Analysis
CA2236521A1 (en) Method and apparatus for measuring polarization mode dispersion of optical devices
US20070182967A1 (en) Method and apparatus for precision measurement of phase shifts

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20041104

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20061117

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20061207

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20070306

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20070309

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070607

A524 Written submission of copy of amendment under section 19 (pct)

Free format text: JAPANESE INTERMEDIATE CODE: A524

Effective date: 20070607

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070711

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070807

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100817

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees