JP3980850B2 - Manufacturing method of crystal unit - Google Patents

Manufacturing method of crystal unit Download PDF

Info

Publication number
JP3980850B2
JP3980850B2 JP2001251760A JP2001251760A JP3980850B2 JP 3980850 B2 JP3980850 B2 JP 3980850B2 JP 2001251760 A JP2001251760 A JP 2001251760A JP 2001251760 A JP2001251760 A JP 2001251760A JP 3980850 B2 JP3980850 B2 JP 3980850B2
Authority
JP
Japan
Prior art keywords
vibration region
crystal
cut
crystal piece
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001251760A
Other languages
Japanese (ja)
Other versions
JP2003069374A (en
Inventor
宣夫 比留間
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nihon Dempa Kogyo Co Ltd
Original Assignee
Nihon Dempa Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Dempa Kogyo Co Ltd filed Critical Nihon Dempa Kogyo Co Ltd
Priority to JP2001251760A priority Critical patent/JP3980850B2/en
Publication of JP2003069374A publication Critical patent/JP2003069374A/en
Application granted granted Critical
Publication of JP3980850B2 publication Critical patent/JP3980850B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は水晶振動子を産業上の技術分野とし、特に振動領域の厚みをエッチングによって小さくした高周波用の水晶振動子の製造方法に関する。
【0002】
【従来の技術】
(発明の背景)水晶振動子例えばATカット型は周波数及び時間の基準源及びフィルタ素子として各種の電子機器に採用される。近年では、通信周波数等の高周波化に伴い、厚みの小さい水晶片が要求される。このようなものの一つに、例えば振動領域の厚みをエッチングによって小さくした水晶片がある。
【0003】
(従来技術の一例)第3図は一従来例を説明する水晶振動子の図である。
水晶振動子はATカットとした水晶片1からなる。水晶片1は振動領域2となる厚みの小さい中央部と、これより厚みの大きい非振動領域3となる外周部とからなる。そして、両主面の振動領域2には励振電極4が非振動領域3には引出電極5が延出する。なお、外周部の非振動領域3は通常では保持領域となる。
【0004】
このようなものでは、第4図(断面図)に示したように、先ず、スパッタリング等により、平板状とした水晶片1の両主面にマスクとしての金属膜6を形成してレジスト液7を塗布する「第4図(a)」。そして、露光によって、レジスト液7の中央部を除去する「同図(b)」。次に、金属膜6の中央部をエッチングし「同図(c)」、水晶片1の主面中央部を露出してレジスト液7を除去する「同図(d)
【0005】
次に、水晶片1をHF(フッ化水素)液中に投入して両主面側からエッチングし、振動領域2となる中央部の厚みを非振動領域3となる外周部よりも小さくする「同図(e)」。最後に、金属膜6を除去して「同図(f)」、振動領域2としての両主面中央部に励振電極4を、さらに非振動領域3としての両端外周部に引出電極5を蒸着等によって延出する。なお、通常では図示しない水晶ウェハの状態で形成された後、個々に分割される。
【0006】
【発明が解決しようとする課題】
(従来技術の問題点)しかしながら、上記構成の水晶振動子では、金属膜6やレジスト液7の形成や除去を繰り返すため、製造工程を多く要して生産性の悪い問題があった。また、金属膜6やレジスト液7の除去のために、各種の化学液を使用するため、廃液の問題もあった。
【0007】
(発明の目的)本発明は、製造工程を少なくして生産性を高め、廃液の少ない製造となる水晶振動子の製造方法を提供することを目的とする。
【0008】
【課題を解決するための手段】
(着目点)本発明は、ATカットに対して双晶となるBTカットはエッチング速度が2/7程度である点に着目した。
【0009】
(解決手段)本発明は、上記の着目点に基づき、水晶片の振動領域(ATカット)に対して非振動領域を双晶化(BTカット化)してエッチングしたことを基本的な解決手段とする。
【0010】
【作用】
本発明は、非振動領域を双晶化(BTカット化)してエッチングしたので、振動領域(ATカット)のエッチング速度が相対的に大きくなり、金属膜(マスク)やレジスト液を不要とする。以下、本発明の一実施例を製造工程を踏まえて説明する。
【0011】
【実施例】
第1図は本発明の一実施例を説明する水晶振動子の図である。なお、前従来例と同一部分には同番号を付与してその説明は簡略又は省略する。
水晶振動子は、前述同様にATカットとした厚みの小さい中央部(振動領域)と、これより厚みの大きい外周部(非振動領域)を有する水晶片1からなる「前第3図」。そして、この実施例では、先ず平板状とした水晶片1の外周部にレーザPを照射する「第1図(a)」。なお、ATカットにおける結晶軸(XY'Z')のY'軸を厚みとして、ここではX軸を幅、Z'軸を長さとする。
【0012】
これにより、水晶片1の外周部を中央部に対して双晶化する「同図(b)」。すなわち、外周部のX軸方向が反転してATカットから、概ねBTカットに変化する。但し、中央部はそのままのATカットを維持する。そして、中央部をATカットとして外周部をBTカットとした双晶の水晶片1をHF液中に投入して全体的にエッチングする。
【0013】
このようなものでは、水晶片1の外周部が双晶化したBTカットなので、エッチング速度が中央部の単結晶部より2/7程度遅くなる。例えばHF液を常温25℃とすると、中央部のATカットでは0.07μm/分のエッチング速度であり、外周部では0.02μm/分となる。したがって、水晶片1の中央部が両主面側から先にエッチングされ、結局、中央部の厚みが外周部よりも小さく加工される「第1図(c)」。
【0014】
例えばATカットとした平板状の水晶片の厚みを16.7μm(100MHz)として、外周部を双晶化してエッチングし、中央部を1.7μm(≒1GHz)にすると外周部は12.4μmになる。したがって、外周部を充分な保持強度として高周波数の水晶振動子を得る。
【0015】
これらのことから、レーザPを水晶片1の外周部に照射して双晶化した後、水晶片を露出して全体的にエッチングするのみなので、製造工程を大幅に簡略して生産性を高められる。また、金属膜やレジストを不要にするので、これらを除去するための化学液を排除して廃液を少なくする。
【0016】
【他の事項】
上記実施例では、水晶片1は振動領域2となる中央部の外周全ての厚みを大きくして非振動領域3としたが、例えば第2図に示したように振動領域2の外周一部に非振動領域3を形成してもよく、これらの形状は任意である。
【0017】
【発明の効果】
本発明は、ATカットとした水晶片の振動領域に対して非振動領域を双晶化してエッチングしたので、製造工程を少なくして生産性を高め、廃液の少ない製造となる水晶振動子の製造方法を提供できる。
【図面の簡単な説明】
【図1】 本発明の一実施例を説明する各製造工程における水晶振動子(水晶片)の断面図である。
【図2】 本発明の他の実施例を説明する水晶振動子の図である。
【図3】 従来例を説明する水晶振動子の図である。
【図4】 従来例を説明する各製造工程における水晶振動子の断面図である。
【符号の説明】
1 水晶片、2 振動領域、3 非振動領域、4 励振電極、5 引出電極、6 金属膜、7 レジスト液.
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a crystal resonator in an industrial technical field, and more particularly to a method for manufacturing a high-frequency crystal resonator in which the thickness of a vibration region is reduced by etching.
[0002]
[Prior art]
(Background of the Invention) A quartz resonator, for example, an AT cut type, is adopted in various electronic devices as a frequency and time reference source and a filter element. In recent years, a crystal piece having a small thickness is required with the increase of the communication frequency and the like. One such example is a crystal piece in which the thickness of the vibration region is reduced by etching, for example.
[0003]
(Example of Prior Art) FIG. 3 is a diagram of a crystal resonator for explaining one conventional example.
The crystal resonator is composed of a crystal piece 1 having an AT cut. The crystal piece 1 is composed of a central portion with a small thickness that becomes the vibration region 2 and an outer peripheral portion that becomes the non-vibration region 3 with a larger thickness. An excitation electrode 4 extends in the vibration region 2 on both main surfaces, and an extraction electrode 5 extends in the non-vibration region 3. In addition, the non-vibration area | region 3 of an outer peripheral part becomes a holding | maintenance area | region normally.
[0004]
In such a case, as shown in FIG. 4 (cross-sectional view), first, a metal film 6 as a mask is formed on both main surfaces of the flat crystal piece 1 by sputtering or the like to form a resist solution 7. “FIG. 4 (a)”. Then, the central portion of the resist solution 7 is removed by exposure “the same figure (b)”. Next, by etching the central portion of the metal film 6 "FIG (c)", to expose the main surface central portion of the crystal piece 1 to remove the resist solution 7 "the (d) of FIG."
[0005]
Next, the crystal piece 1 is put into HF (hydrogen fluoride) solution and etched from both main surface sides, so that the thickness of the central portion that becomes the vibration region 2 is smaller than the outer peripheral portion that becomes the non-vibration region 3. (E) ". Finally, the metal film 6 is removed and "figure (f)", the excitation electrode 4 is deposited at the center of both main surfaces as the vibration region 2, and the extraction electrode 5 is deposited at the outer peripheral portions at both ends as the non-vibration region 3. Extend by etc. Usually, after being formed in the state of a crystal wafer (not shown), it is divided individually.
[0006]
[Problems to be solved by the invention]
(Problems of the prior art) However, in the crystal resonator having the above-described configuration, since the formation and removal of the metal film 6 and the resist solution 7 are repeated, many manufacturing steps are required and there is a problem of poor productivity. Further, since various chemical solutions are used for removing the metal film 6 and the resist solution 7, there is a problem of waste solution.
[0007]
(Object of the Invention) An object of the present invention is to provide a method for producing a crystal resonator which can reduce the number of production steps to increase productivity and produce less waste liquid.
[0008]
[Means for Solving the Problems]
(Points of interest) The present invention has focused on the point that the etching rate of the BT cut, which is twinned with respect to the AT cut, is about 2/7.
[0009]
(Solution) The present invention is based on the above point of interest, and basically etches a non-vibration region twinned (BT cut) with respect to a vibration region (AT cut) of a crystal piece. And
[0010]
[Action]
In the present invention, since the non-vibration region is etched by twinning (BT cut), the etching rate of the vibration region (AT cut) is relatively increased, and a metal film (mask) and a resist solution are not required. . Hereinafter, an embodiment of the present invention will be described based on the manufacturing process.
[0011]
【Example】
FIG. 1 is a diagram of a crystal resonator illustrating one embodiment of the present invention. In addition, the same number is attached | subjected to the same part as a prior art example, and the description is simplified or abbreviate | omitted.
The quartz crystal resonator is composed of a crystal piece 1 having an AT-cut central portion (vibration region) having an AT cut as described above and an outer peripheral portion (non-vibration region) having a larger thickness ("previous FIG. 3"). In this embodiment, the laser P is irradiated to the outer peripheral portion of the flat crystal piece 1 as shown in FIG. 1 (a). Note that the Y ′ axis of the crystal axis (XY′Z ′) in AT cut is the thickness, and here the X axis is the width and the Z ′ axis is the length.
[0012]
Thus, the outer peripheral portion of the crystal piece 1 is twinned with respect to the central portion (FIG. 2B). That is, the X-axis direction of the outer peripheral portion is reversed to change from AT cut to approximately BT cut. However, the AT cut is maintained at the center as it is. Then, a twin crystal piece 1 having an AT cut at the center and a BT cut at the outer peripheral portion is put into the HF solution and etched as a whole.
[0013]
In such a case, since the outer peripheral portion of the crystal piece 1 is a twinned BT cut, the etching rate is about 2/7 slower than the single crystal portion in the central portion. For example, if the HF solution is at room temperature of 25 ° C., the etching rate is 0.07 μm / min for the AT cut in the center and 0.02 μm / min for the outer periphery. Therefore, the central portion of the crystal piece 1 is etched first from both main surface sides, and eventually the thickness of the central portion is processed smaller than the outer peripheral portion (FIG. 1 (c)).
[0014]
For example, when the thickness of a flat crystal piece made of AT cut is 16.7 μm (100 MHz), the outer peripheral portion is twinned and etched, and the central portion is 1.7 μm (≈1 GHz), the outer peripheral portion becomes 12.4 μm. Therefore, a high-frequency crystal resonator is obtained with the outer peripheral portion having sufficient holding strength.
[0015]
From these facts, the laser P is irradiated to the outer periphery of the crystal piece 1 to form twin crystals, and then the crystal piece is only exposed and etched as a whole, greatly simplifying the manufacturing process and increasing productivity. It is done. Moreover, since a metal film and a resist are unnecessary, the chemical liquid for removing these is excluded and waste liquid is reduced.
[0016]
[Other matters]
In the above embodiment, the crystal piece 1 is made the non-vibration region 3 by increasing the thickness of the entire outer periphery of the central portion that becomes the vibration region 2. For example, as shown in FIG. The non-vibration region 3 may be formed, and these shapes are arbitrary.
[0017]
【The invention's effect】
The present invention, since the etching of the non-vibration region with respect to the vibration region of the crystal blank which was AT-cut and twinned, increase productivity by reducing the manufacturing steps, manufacturing of the crystal resonator to be less production of waste Can provide a method .
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of a crystal resonator (crystal piece) in each manufacturing process for explaining an embodiment of the present invention.
FIG. 2 is a diagram of a crystal resonator illustrating another embodiment of the present invention.
FIG. 3 is a diagram of a crystal resonator for explaining a conventional example.
FIG. 4 is a cross-sectional view of a crystal resonator in each manufacturing process for explaining a conventional example.
[Explanation of symbols]
1 crystal piece, 2 vibration region, 3 non-vibration region, 4 excitation electrode, 5 extraction electrode, 6 metal film, 7 resist solution.

Claims (1)

ATカットとした水晶片における振動領域の厚みをエッチングによって非振動領域よりも小さくしてなる水晶振動子の製造方法において、前記水晶片の非振動領域を振動領域に対して双晶化し、前記水晶片の両主面を露出して全体的にエッチングして前記振動領域より厚みの大きな前記非振動領域を形成したことを特徴とする水晶振動子の製造方法In a manufacturing method of a crystal resonator in which a thickness of a vibration region in an AT-cut crystal piece is made smaller than that in a non-vibration region by etching, the non-vibration region of the crystal piece is twinned with respect to the vibration region, and the crystal method for manufacturing a quartz resonator, characterized in that it wholly etched to expose the both main surfaces of the pieces to form large the non-vibrating region of thickness from the vibrating region.
JP2001251760A 2001-08-22 2001-08-22 Manufacturing method of crystal unit Expired - Fee Related JP3980850B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001251760A JP3980850B2 (en) 2001-08-22 2001-08-22 Manufacturing method of crystal unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001251760A JP3980850B2 (en) 2001-08-22 2001-08-22 Manufacturing method of crystal unit

Publications (2)

Publication Number Publication Date
JP2003069374A JP2003069374A (en) 2003-03-07
JP3980850B2 true JP3980850B2 (en) 2007-09-26

Family

ID=19080349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001251760A Expired - Fee Related JP3980850B2 (en) 2001-08-22 2001-08-22 Manufacturing method of crystal unit

Country Status (1)

Country Link
JP (1) JP3980850B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013051673A (en) 2011-07-29 2013-03-14 Nippon Dempa Kogyo Co Ltd Crystal resonator and crystal oscillator

Also Published As

Publication number Publication date
JP2003069374A (en) 2003-03-07

Similar Documents

Publication Publication Date Title
JP4435758B2 (en) Method for manufacturing crystal piece
JP3995987B2 (en) Manufacturing method of crystal unit
JP3888107B2 (en) Etching method of piezoelectric diaphragm for piezoelectric vibrating device
JP2973560B2 (en) Processing method of crystal unit
JP2004260593A (en) Crystal oscillation reed, its manufacturing method, crystal device using crystal oscillation reed, portable telephone system using crystal device, and electronic equipment using crystal device
JPH07120919B2 (en) Crystal resonator manufacturing method and crystal resonator manufactured by the manufacturing method
JP2010136202A (en) Method of manufacturing piezoelectric oscillating piece, piezoelectric oscillating piece, and piezoelectric resonator
JP3980850B2 (en) Manufacturing method of crystal unit
US7560040B2 (en) Etching method and article etched molded by that method
JPH11340775A (en) Piezoelectric oscillator
JP2004088706A (en) Etching method and etching shaped article thereby
US20070228895A1 (en) Method for manufacturing piezoelectric resonator element
JP2004040399A (en) Etching method, and etched product formed by the same
JP2002084156A (en) Saw element and manufacturing method therefor
JP2007096369A (en) Metal mask and method of cutting piezoelectric resonator element
JPH05315881A (en) Manufacture of crystal vibrator
JP3564564B2 (en) Etching method and workpiece processed by the method
JP2006339749A (en) Quartz vibrator and method of manufacturing the same
JPH04294622A (en) Production of piezoelectric element
JP2016174328A (en) Wafer manufacturing method and wafer
JPH04130810A (en) Manufacture of at cut crystal oscillating piece
JP2005244735A (en) Manufacturing method of quartz oscillator, and quartz oscillator
JPH0294911A (en) Manufacture of surface acoustic wave element
JP2001226142A (en) Method for forming through-hole
JP3442517B2 (en) Manufacturing method of crystal unit

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040628

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20060522

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060530

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070116

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070316

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070626

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070628

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100706

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100706

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100706

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110706

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110706

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110706

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120706

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120706

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120706

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120706

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130706

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130706

Year of fee payment: 6

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees