JP3942685B2 - Semiconductor packaging equipment - Google Patents

Semiconductor packaging equipment Download PDF

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Publication number
JP3942685B2
JP3942685B2 JP07912397A JP7912397A JP3942685B2 JP 3942685 B2 JP3942685 B2 JP 3942685B2 JP 07912397 A JP07912397 A JP 07912397A JP 7912397 A JP7912397 A JP 7912397A JP 3942685 B2 JP3942685 B2 JP 3942685B2
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Prior art keywords
tape
iron
carrier tape
pocket
semiconductor
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JPH10258872A (en
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和夫 宗村
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ユー・エム・シー・ジャパン株式会社
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Description

【0001】
【発明の属する技術分野】本発明は、半導体製品を挿入したキャリアテープを熱圧着してリールに巻き取る半導体包装装置に関し、特に組立ラインにおいてトップテープを剥がしてキャリアテープのポケットから半導体製品を取り出す際の剥離強度が一定になるように引き剥がし作業時の剥離強度を考慮した熱圧着を行うように改良した半導体包装装置に関するものである。
【0002】
【従来の技術】
従来の半導体包装装置は、図1(a)に示すような、シールコテ1と図1(c)に示すコテ受け5とによって図1(a)の半導体製品4が挿入されているキャリアテープ3とトップテープ2を熱圧着するようにしていた。
【0003】
図2は従来のトップテープを熱圧着したキャリアテープを示す図であり、図2(a)は平面図、図2(b)は断面図である。図2に示すように、半導体製品4を挿入するポケットを有するキャリアテープ3のポケット部に、半導体製品を挿入した後、トップテープ2を載せ、その上から一定の温度にコントロールされたシールコテ1を圧接して、熱圧着しシール痕跡8の位置でシールした後に包装済みテープをリール等に巻き取る。
【0004】
このテープ及びリール加工された半導体製品4を自動化された組立ラインでプリント基板等に実装する際には、実装機を用いてトップテープ2をキャリアテープ3から引き剥がし、ポケット内の半導体製品4を実装機を用いてトップテープ2をキャリアテープ3から引き剥がし、ポケット内の半導体製品4を実装機の真空チャック等により吸着して次々とプリント基板上へ搬装する。
【0005】
【発明が解決しようとする課題】
しかしながら、上記従来技術においては、キャリアテープ3からトップテープ2を引き剥がす際に、シール痕跡8全体に亘って一定の剥離強度にはなっていない。図3の剥離強度の強さの比較図に示すように、半導体製品4のピッチに連動してトップテープを剥がす時の剥離強度の強さが、従来例の場合は実線Bカーブのようにキャリアテープ3のポケットとポケットの境界部で剥離強度が低くなり、ポケット部のところは高く発生して、剥離強度の強さを示すカーブのゆれが激しく剥離強度のバラツキが大きくなってしまうので、トップテープ2のテープ切れやキャリアテープ3の変形等が発生し、連続して正常な剥離動作を行うことが不可能になってしまうという問題がある。
【0006】
そこで、本発明の目的は、キャリアテープからトップテープを引き剥がす際の剥離強度のバラツキを無くすように熱圧着して、組立ラインへの半導体製品の円滑な連続実装を可能にする半導体包装装置を提供することにある。
【0007】
【課題を解決するための手段】
上記目的を達成するため、本発明は、半導体製品を収容す るためのポケットが複数並んだ状態に形成されたキャリアテープにトップテープを熱圧着することに基づき、複数の半導体製品を包装する半導体包装装置において、
前記キャリアテープの平面部であって、前記複数のポケットの両側にそれぞれ形成された平面部を受けるように配置されるシールコテ受けと、
該キャリアテープの平面部及び前記トップテープを前記シールコテ受けとによって熱圧着するシールコテと、
を備え、
前記シールコテ受けは、前記ポケットとポケットの境界部に近接する領域に接触する部分が、他の部分よりもクッション性の良い材質で形成された、ことを特徴とする。
【0008】
この構成によれば、コテ受けの一部の材質を変更することによってポケットとポケットの境界部に相当する領域のコテ受けのクッション性能を良くして、剥離強度を強化し全体の剥離強度のバラツキを無くすことができる。
【0009】
【発明の実施の形態】
以下、本発明の実施の形態について図を参照して説明する。
【0010】
図1(a)と(b)は本発明の一実施の形態に係わる半導体包装装置のシーリング・ユニット部の斜視図である。
【0011】
図1(a),(b)において、1は材質にアルミニウムかステンレスを用したシールコテであり、2は組立ラインにて剥がされるトップテープ、3は半導体製品が挿入されるキャリアテープ、4は半導体製品で、6は本発明のコテ受けである。また、7−1〜7−4は、材質がポリウレタン等のクッション性の良いものでできていて、一般のコテ受け6より衝撃吸収性能が良い。また、長手方向への長さはキャリアテープのポケットとポケットの境界部の幅より長い。なお、本発明に係る半導体包装装置はキャリアテープ3にトップテープ2を熱圧着することに基づき複数の半導体製品4を包装するためのもので、図1及び図2に明らかなように、キャリアテープ2には、半導体製品4を収容するためのポケットが複数並んだ状態に形成されている。また、図1 (a) に明らかなように、これら複数のポケットの両側には平面部がそれぞれ形成されており、図1 (b) に明らかなように、シールコテ受け6はそれらの平面部を受けるように配置されている。そして、シールコテ1とシールコテ受け6とは、キャリアテープ2の平面部及びトップテープ2を熱圧着するように構成されている。
【0012】
図1(c)は従来技術の斜視図である。図1(c)において、5は熱せられたシールコテ1とともにトップテープ2とキャリアテープ3を熱圧着する、材質にステンレスを使用した従来技術のコテ受けである。
【0013】
図2(a)は従来のトップテープを熱圧着したキャリアテープを示す平面図である。
【0014】
図2(b)は従来のトップテープを熱圧着したキャリアテープを示す断面図である。
【0015】
図3は図1に示すシーリング・ユニットによる剥離強度の比較図である。
【0016】
つぎに動作について説明する。
【0017】
先ず、図2(a)と(b)に示したように、半導体製品4を挿入するポケットを有するキャリアテープ3のポケット部に、半導体製品4を挿入した後トップテープ2を上に載せ、シールコテ1を所定の温度にコントロールして上下動が可能な半導体包装装置(コテ以外の動作部は図示していない)により、シールコテ1をトップテープ2の上面から圧接してトップテープ2とキャリアテープ3を熱圧着し、圧着済みのキャリアテープをリール等に巻き取って収納する。
【0018】
この場合、従来例の圧着では図3の実線Bカーブに示すように、剥離強度のバラツキが大きく、一方の自動配線ラインの実装機の方も高速化されてきてトップテープ引き剥がし時のトラブルが発生しやすい状況になっているので、本発明ではこれの改善策として、剥離強度のMAX側の値は変えずにMIN側だけの値を向上させて、剥離強度のバラツキを抑えるように対策を講じている。
【0019】
剥離強度は具体的に次式で表すことができる。
【0020】
剥離強度=(温度・圧力・時間・コテ幅・コテ受けのクッション性・エンボスポケットからの距離)/トッテープの厚さ)
このように分子の(温度〜ポケットからの距離)までの6つのファクターの積を、分母(トップテープの厚さ)で除した形となる。この式から剥離強度を調整するに当たって、「温度、圧力、時間、エンボスポケットからの距離」の4要素については、MIN側を上げようとすると、MAX側も上がってしまい所定の剥離強度の設定からズレてしまうので、目的とするMIN側の値だけの向上が可能なコテ受けのクッション性(衝撃吸収性)の調整に絞り、コテ受け6の剥離強度MINの発生位置(ポケットとポケットの境界部に近接する領域に接触する部分の材質をコテ受け本体のステンレスよりクッション性能があるポリウレタン等を採用して、コテ受け6の四隅が7−1〜7−4になるような構成としている。つまり、前記シールコテ受け6は、ポケットとポケットの境界部に近接する領域に接触する部分が、他の部分よりもクッション性の良い材質で形成されている。
【0021】
従って、本実施の形態によるトップテープ2の熱圧着には、シールコテ1によるエンボスポケット中央部はコテ受け本体6のステンレス部が衝撃吸収し、同時にポケットとポケットの境界部と、そこに近い部分(エンボステープの両端)は、ポリウレタン等のシールコテ受端部7−1〜7−4が衝撃吸収する。前式にある通り、剥離強度はコテ受けのクッション性に比例するので図3の実線BカーブのMIN側の低い底辺部に相当して押し上げるので、トータルの剥離強度は図3に一点鎖線のAカーブで示した本実施の形態の場合の改善カーブのように、MIN側が向上して剥離強度のバラツキが改善される。
【0022】
このように、半導体製品4を挿入したキャリアテープ3とトップテープ2を熱圧着する包装工程において、引き剥がす時の剥離強度のバラツキを考慮した熱圧着を行っているので、このテープ及びリールを組立ライン等に投入した場合、図3のAカーブのような剥離強度の改善によって実装機によるテープの引き剥がし、半導体製品4の取り出し搬送がスムーズに行われる。
【0023】
【発明の効果】
以上、説明したように、本発明によれば、コテ受けのエンボスポケットとポケットの境界部に当たる部分及び、そこに近い部分に、ポリウレタン等のクッション性の良い(衝撃吸収性が高い)材質の部分を設けたので、キャリアテープからトップテープを引き剥がす際のバラツキを無くすように包装時の熱圧着を行って、組立ラインへの半導体製品の円滑な連続実装が可能になる。
【図面の簡単な説明】
【図1】本発明の一実施の形態に係わる半導体包装装置のシーリング・ユニット部の上部の斜視図(a)と、シールコテ受けの斜視図(b)、及び従来技術のシールコテ受けの斜視図(c)である。
【図2】トップテープを熱圧着したキャリアテープを示す平面図(a)と、トップテープを熱圧着したキャリアテープを示す断面図(b)である。
【図3】図1に示すシールコテ受けによる熱圧着の剥離強度の比較図である。
【符号の説明】
1 シールコテ
2 トップテープ
3 キャリアテープ
4 半導体製品
5 従来技術のシールコテ受け
6 本発明のシールコテ受け本体
7−1 本発明のシールコテ受け端部
7−2 本発明のシールコテ受け端部
7−3 本発明のシールコテ受け端部
7−4 本発明のシールコテ受け端部
[0001]
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor packaging apparatus in which a carrier tape into which a semiconductor product is inserted is thermocompression-bonded and wound on a reel, and in particular in an assembly line, the top tape is peeled off to take out the semiconductor product from the carrier tape pocket. The present invention relates to a semiconductor packaging device improved so as to perform thermocompression bonding in consideration of the peel strength at the time of peeling work so that the peel strength at the time is constant.
[0002]
[Prior art]
A conventional semiconductor packaging apparatus includes a carrier tape 3 in which the semiconductor product 4 of FIG. 1A is inserted by a seal iron 1 and a iron receiver 5 shown in FIG. 1C, as shown in FIG. The top tape 2 was thermocompression bonded.
[0003]
2A and 2B are views showing a carrier tape obtained by thermocompression bonding of a conventional top tape. FIG. 2A is a plan view and FIG. 2B is a cross-sectional view. As shown in FIG. 2, after inserting the semiconductor product into the pocket portion of the carrier tape 3 having a pocket for inserting the semiconductor product 4, the top tape 2 is placed, and the seal iron 1 controlled at a constant temperature is placed thereon. After pressure welding and thermocompression bonding and sealing at the position of the seal trace 8, the wrapped tape is wound around a reel or the like.
[0004]
When mounting the tape and reel processed semiconductor product 4 on a printed circuit board or the like on an automated assembly line, the top tape 2 is peeled off from the carrier tape 3 using a mounting machine, and the semiconductor product 4 in the pocket is removed. The top tape 2 is peeled off from the carrier tape 3 using a mounting machine, and the semiconductor product 4 in the pocket is adsorbed by a vacuum chuck or the like of the mounting machine and is successively carried on the printed circuit board.
[0005]
[Problems to be solved by the invention]
However, in the above prior art, when the top tape 2 is peeled off from the carrier tape 3, the peel strength is not constant over the entire seal trace 8. As shown in the comparison diagram of the strength of peel strength in FIG. 3, the strength of the peel strength when peeling the top tape in conjunction with the pitch of the semiconductor product 4 is the carrier in the conventional example as shown by the solid line B curve. The peel strength is low at the boundary between the pockets of the tape 3 and the pocket portion is high, and the fluctuation of the curve indicating the strength of the peel strength is severe and the variation of the peel strength becomes large. There is a problem that the tape 2 is cut or the carrier tape 3 is deformed, and it is impossible to continuously perform a normal peeling operation.
[0006]
Accordingly, an object of the present invention is to provide a semiconductor packaging device that enables smooth continuous mounting of semiconductor products on an assembly line by thermocompression bonding so as to eliminate variation in peel strength when the top tape is peeled off from the carrier tape. It is to provide.
[0007]
[Means for Solving the Problems]
To achieve the above object, the present invention is based on thermocompression bonding the top tape in the carrier tape pockets because is formed in a plurality aligned state to accommodate the semiconductor products, semiconductor packaging a plurality of semiconductor products In packaging equipment,
A seal iron receiver arranged to receive a flat portion of the carrier tape, each of which is formed on both sides of the plurality of pockets;
A seal iron for thermocompression bonding the flat portion of the carrier tape and the top tape with the seal iron receiver;
With
The seal iron receptacle is characterized in that a portion that contacts a region close to the boundary between the pockets and the pocket is formed of a material having better cushioning properties than other portions.
[0008]
According to this configuration, by changing the material of a part of the iron receiver, the cushion performance of the iron receiver in the area corresponding to the boundary between the pockets and the pockets is improved, and the peel strength is enhanced and the overall peel strength varies. Can be eliminated.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0010]
1A and 1B are perspective views of a sealing unit portion of a semiconductor packaging device according to an embodiment of the present invention.
[0011]
1 (a) and 1 (b), 1 is a seal iron using aluminum or stainless steel as a material, 2 is a top tape to be peeled off in an assembly line, 3 is a carrier tape into which a semiconductor product is inserted, and 4 is a semiconductor. Product 6 is the iron receptacle of the present invention. Further, 7-1 to 7-4 are made of a material having good cushioning properties such as polyurethane, and have better shock absorption performance than a general iron receiver 6. The length in the longitudinal direction is longer than the width of the carrier tape pocket and the boundary between the pockets. The semiconductor packaging device according to the present invention is for packaging a plurality of semiconductor products 4 on the basis of thermocompression bonding of the top tape 2 to the carrier tape 3, and as is apparent from FIGS. 1 and 2, the carrier tape 2 is formed in a state in which a plurality of pockets for housing the semiconductor product 4 are arranged. Further, as is apparent in FIG. 1 (a), on both sides of the plurality of pockets are formed flat portions, respectively, as is apparent in FIG. 1 (b), Shirukote receives 6 their plane portion Arranged to receive. The seal iron 1 and the seal iron receptacle 6 are configured so as to thermocompress the flat portion of the carrier tape 2 and the top tape 2.
[0012]
FIG.1 (c) is a perspective view of a prior art. In FIG. 1 (c), reference numeral 5 denotes a conventional iron support using stainless steel as a material for heat-pressing a top tape 2 and a carrier tape 3 together with a heated seal iron 1.
[0013]
Fig.2 (a) is a top view which shows the carrier tape which heat-pressed the conventional top tape.
[0014]
FIG. 2B is a cross-sectional view showing a carrier tape obtained by thermocompression bonding of a conventional top tape.
[0015]
FIG. 3 is a comparative view of peel strength by the sealing unit shown in FIG.
[0016]
Next, the operation will be described.
[0017]
First, as shown in FIGS. 2A and 2B, after the semiconductor product 4 is inserted into the pocket portion of the carrier tape 3 having a pocket into which the semiconductor product 4 is inserted, the top tape 2 is placed on top of the seal tape. The top tape 2 and the carrier tape 3 are brought into pressure contact with the sealing iron 1 from the top surface of the top tape 2 by a semiconductor wrapping apparatus (the operation part other than the iron is not shown) capable of moving up and down by controlling 1 to a predetermined temperature. Is heat-pressed, and the crimped carrier tape is wound around a reel or the like and stored.
[0018]
In this case, as shown by the solid line B curve in FIG. 3, the conventional example of crimping has a large variation in peel strength, and the mounting machine of one automatic wiring line has also been speeded up, causing trouble when peeling the top tape. Since this situation is likely to occur, in the present invention, as a measure for improving this, a measure is taken to improve the value only on the MIN side without changing the value on the MAX side of the peel strength to suppress the variation in the peel strength. I'm taking it.
[0019]
The peel strength can be specifically expressed by the following formula.
[0020]
Peel strength = (Temperature, pressure, time, width of iron, cushioning of iron receiving, distance from embossed pocket) / thickness of tape
In this way, the product of six factors from the numerator (temperature to the distance from the pocket) is divided by the denominator (top tape thickness). In adjusting the peel strength from this formula, for the four elements of “temperature, pressure, time, distance from the embossed pocket”, when trying to raise the MIN side, the MAX side also rises and the predetermined peel strength is set. Because it will be misaligned, it will be focused on adjusting the cushioning (impact absorbability) of the trowel holder that can improve only the target MIN side value, and the position where the peel strength MIN of the trowel holder 6 occurs (the boundary between the pocket and the pocket) For example, polyurethane having a cushioning performance than the stainless steel of the iron receiving body is used as the material of the portion in contact with the area adjacent to the iron receiving body 6 so that the four corners of the iron receiving 6 become 7-1 to 7-4. That is, as for the said seal iron receptacle 6, the part which contacts the area | region close | similar to the boundary part of a pocket and a pocket is formed with the material with better cushioning properties than another part.
[0021]
Therefore, in the thermocompression bonding of the top tape 2 according to the present embodiment, the stainless steel portion of the iron receiving body 6 absorbs shocks at the center portion of the embossed pocket by the seal iron 1, and at the same time, the boundary portion between the pocket and the pocket and a portion close thereto ( At both ends of the embossed tape, the seal iron receiving end portions 7-1 to 7-4 such as polyurethane absorb the impact. As shown in the previous equation, the peel strength is proportional to the cushioning property of the iron receiving, so it is pushed up corresponding to the lower bottom portion on the MIN side of the solid line B curve in FIG. 3, so the total peel strength is shown by the one-dot chain line A in FIG. Like the improvement curve in the case of the present embodiment indicated by a curve, the MIN side is improved and the variation in peel strength is improved.
[0022]
In this way, in the packaging process in which the carrier tape 3 into which the semiconductor product 4 is inserted and the top tape 2 are thermocompression bonded, thermocompression bonding is performed in consideration of variation in peel strength when peeling off. When it is introduced into a line or the like, the tape is peeled off by the mounting machine due to the improvement in peel strength as shown by the curve A in FIG. 3, and the semiconductor product 4 is smoothly taken out and conveyed.
[0023]
【The invention's effect】
As described above, according to the present invention, a portion made of a material having a good cushioning property (high shock absorption) such as polyurethane, at a portion corresponding to the boundary portion between the embossed pocket and the pocket of the iron receiver and a portion close thereto. Therefore, it is possible to smoothly and continuously mount semiconductor products on the assembly line by performing thermocompression bonding during packaging so as to eliminate variations when the top tape is peeled off from the carrier tape.
[Brief description of the drawings]
FIG. 1 is a perspective view (a) of an upper portion of a sealing unit portion of a semiconductor packaging apparatus according to an embodiment of the present invention, a perspective view (b) of a seal iron receiver, and a perspective view of a conventional seal iron receiver ( c).
FIG. 2A is a plan view showing a carrier tape to which a top tape is thermocompression bonded, and FIG. 2B is a sectional view showing a carrier tape to which a top tape is thermocompression bonded.
FIG. 3 is a comparative view of peel strength of thermocompression bonding by the seal iron receiver shown in FIG.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Sealing iron 2 Top tape 3 Carrier tape 4 Semiconductor product 5 Sealing iron receiving body 6 of the prior art Sealing iron receiving body 7-1 of the present invention Sealing iron receiving end 7-2 of the present invention Sealing iron receiving end 7-3 of the present invention Sealing iron receiving end 7-4 Sealing iron receiving end of the present invention

Claims (1)

半導体製品を収容するためのポケットが複数並んだ状態に形成されたキャリアテープにトップテープを熱圧着することに基づき、複数の半導体製品を包装する半導体包装装置において、
前記キャリアテープの平面部であって、前記複数のポケットの両側にそれぞれ形成された平面部を受けるように配置されるシールコテ受けと、
該キャリアテープの平面部及び前記トップテープを前記シールコテ受けとによって熱圧着するシールコテと、
を備え、
前記シールコテ受けは、前記ポケットとポケットの境界部に近接する領域に接触する部分が、他の部分よりもクッション性の良い材質で形成された、ことを特徴とする半導体包装装置。
In a semiconductor packaging apparatus for packaging a plurality of semiconductor products based on thermocompression bonding of a top tape to a carrier tape formed in a state in which a plurality of pockets for housing semiconductor products are arranged,
A seal iron receiver arranged to receive a flat portion of the carrier tape, each of which is formed on both sides of the plurality of pockets;
A seal iron for thermocompression bonding the flat portion of the carrier tape and the top tape with the seal iron receiver;
With
The semiconductor wrapping apparatus according to claim 1, wherein the seal trowel receiver has a portion in contact with an area close to the boundary between the pocket and the pocket formed of a material having better cushioning properties than other portions .
JP07912397A 1997-03-14 1997-03-14 Semiconductor packaging equipment Expired - Fee Related JP3942685B2 (en)

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JP07912397A JP3942685B2 (en) 1997-03-14 1997-03-14 Semiconductor packaging equipment

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Application Number Priority Date Filing Date Title
JP07912397A JP3942685B2 (en) 1997-03-14 1997-03-14 Semiconductor packaging equipment

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JPH10258872A JPH10258872A (en) 1998-09-29
JP3942685B2 true JP3942685B2 (en) 2007-07-11

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Publication number Priority date Publication date Assignee Title
JP4947568B2 (en) * 2005-02-17 2012-06-06 塩野義製薬株式会社 PTP package
US8430264B2 (en) 2009-05-20 2013-04-30 The Bergquist Company Method for packaging thermal interface materials
US8205766B2 (en) 2009-05-20 2012-06-26 The Bergquist Company Method for packaging thermal interface materials

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