JP3797822B2 - ポリッシング装置 - Google Patents
ポリッシング装置 Download PDFInfo
- Publication number
- JP3797822B2 JP3797822B2 JP18535799A JP18535799A JP3797822B2 JP 3797822 B2 JP3797822 B2 JP 3797822B2 JP 18535799 A JP18535799 A JP 18535799A JP 18535799 A JP18535799 A JP 18535799A JP 3797822 B2 JP3797822 B2 JP 3797822B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- wafer
- top ring
- pusher
- transfer robot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005498 polishing Methods 0.000 title claims description 367
- 238000012546 transfer Methods 0.000 claims description 121
- 238000000034 method Methods 0.000 claims description 31
- 239000007788 liquid Substances 0.000 claims description 15
- 238000012545 processing Methods 0.000 claims description 14
- 235000012431 wafers Nutrition 0.000 description 382
- 238000004140 cleaning Methods 0.000 description 70
- 239000004065 semiconductor Substances 0.000 description 43
- 238000013459 approach Methods 0.000 description 20
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000007517 polishing process Methods 0.000 description 6
- 238000001035 drying Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000009434 installation Methods 0.000 description 5
- 230000032258 transport Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000002411 adverse Effects 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000005201 scrubbing Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000003749 cleanliness Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000008237 rinsing water Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
- B24B37/345—Feeding, loading or unloading work specially adapted to lapping
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18535799A JP3797822B2 (ja) | 1999-06-30 | 1999-06-30 | ポリッシング装置 |
| US09/605,989 US6447385B1 (en) | 1999-06-30 | 2000-06-29 | Polishing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18535799A JP3797822B2 (ja) | 1999-06-30 | 1999-06-30 | ポリッシング装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006076902A Division JP4413882B2 (ja) | 2006-03-20 | 2006-03-20 | ポリッシング装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001009713A JP2001009713A (ja) | 2001-01-16 |
| JP2001009713A5 JP2001009713A5 (enExample) | 2004-12-24 |
| JP3797822B2 true JP3797822B2 (ja) | 2006-07-19 |
Family
ID=16169384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18535799A Expired - Fee Related JP3797822B2 (ja) | 1999-06-30 | 1999-06-30 | ポリッシング装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6447385B1 (enExample) |
| JP (1) | JP3797822B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200002928A (ko) * | 2017-04-26 | 2020-01-08 | 액서스 테크놀로지, 엘엘씨 | 향상된 처리량과 공정 유연성을 가진 cmp 기계 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6780083B2 (en) * | 2002-04-19 | 2004-08-24 | Peter Wolters Cmp-Systeme Gmbh & Co. Kg | Apparatus and method for the chemical mechanical polishing of the surface of circular flat workpieces, in particular semi-conductor wafers |
| US20100041316A1 (en) * | 2008-08-14 | 2010-02-18 | Yulin Wang | Method for an improved chemical mechanical polishing system |
| JP5941763B2 (ja) * | 2012-06-15 | 2016-06-29 | 株式会社荏原製作所 | 研磨方法 |
| JP6370084B2 (ja) * | 2014-04-10 | 2018-08-08 | 株式会社荏原製作所 | 基板処理装置 |
| JP6971676B2 (ja) * | 2016-08-29 | 2021-11-24 | 株式会社荏原製作所 | 基板処理装置および基板処理方法 |
| CN107799436B (zh) * | 2016-08-29 | 2023-07-07 | 株式会社荏原制作所 | 基板处理装置及基板处理方法 |
| US20210323117A1 (en) * | 2020-04-16 | 2021-10-21 | Applied Materials, Inc. | High throughput polishing modules and modular polishing systems |
| US11705354B2 (en) | 2020-07-10 | 2023-07-18 | Applied Materials, Inc. | Substrate handling systems |
| CN114203574A (zh) * | 2020-09-17 | 2022-03-18 | 长鑫存储技术有限公司 | 清洗机台以及清洗方法 |
| US12198944B2 (en) | 2020-11-11 | 2025-01-14 | Applied Materials, Inc. | Substrate handling in a modular polishing system with single substrate cleaning chambers |
| US12224186B2 (en) | 2023-04-03 | 2025-02-11 | Applied Materials, Inc. | Apparatus and method of brush cleaning using periodic chemical treatments |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5649854A (en) | 1994-05-04 | 1997-07-22 | Gill, Jr.; Gerald L. | Polishing apparatus with indexing wafer processing stations |
| US5562524A (en) | 1994-05-04 | 1996-10-08 | Gill, Jr.; Gerald L. | Polishing apparatus |
| US5738574A (en) | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
| US5951373A (en) * | 1995-10-27 | 1999-09-14 | Applied Materials, Inc. | Circumferentially oscillating carousel apparatus for sequentially processing substrates for polishing and cleaning |
| EP1281476A3 (en) * | 1996-05-16 | 2003-08-13 | Ebara Corporation | Method for polishing workpieces and apparatus therefor |
| JP3679871B2 (ja) * | 1996-09-04 | 2005-08-03 | 株式会社荏原製作所 | ポリッシング装置及び搬送ロボット |
| US6241585B1 (en) * | 1999-06-25 | 2001-06-05 | Applied Materials, Inc. | Apparatus and method for chemical mechanical polishing |
-
1999
- 1999-06-30 JP JP18535799A patent/JP3797822B2/ja not_active Expired - Fee Related
-
2000
- 2000-06-29 US US09/605,989 patent/US6447385B1/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200002928A (ko) * | 2017-04-26 | 2020-01-08 | 액서스 테크놀로지, 엘엘씨 | 향상된 처리량과 공정 유연성을 가진 cmp 기계 |
| KR102680584B1 (ko) * | 2017-04-26 | 2024-07-03 | 액서스 테크놀로지, 엘엘씨 | 향상된 처리량과 공정 유연성을 가진 cmp 기계 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001009713A (ja) | 2001-01-16 |
| US6447385B1 (en) | 2002-09-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5885138A (en) | Method and apparatus for dry-in, dry-out polishing and washing of a semiconductor device | |
| US5616063A (en) | Polishing apparatus | |
| KR100487590B1 (ko) | 폴리싱장치 | |
| JPH09285958A (ja) | ウェーハの研磨装置システム | |
| JP3797822B2 (ja) | ポリッシング装置 | |
| US20180315622A1 (en) | Apparatus and method for cleaning a back surface of a substrate | |
| JP2001038615A (ja) | ポリッシング装置 | |
| JP4413882B2 (ja) | ポリッシング装置 | |
| JP3420849B2 (ja) | ポリッシング装置及び方法 | |
| JP4579879B2 (ja) | ポリッシング装置 | |
| KR102838644B1 (ko) | 통합된 기판 정렬 스테이지를 갖는 건조 시스템 | |
| JP3897507B2 (ja) | ポリッシング装置 | |
| JP3623220B2 (ja) | ポリッシング装置及び方法 | |
| JP3496007B2 (ja) | ポリッシング装置及び方法 | |
| JP2003273058A (ja) | スクラブ洗浄装置におけるブラシクリーニング方法及び処理システム | |
| JP3652359B2 (ja) | ポリッシング装置 | |
| JP3628307B2 (ja) | ポリッシング装置及び方法 | |
| JP2002141318A (ja) | ポリッシング装置及び方法 | |
| JP2000024910A (ja) | ウェーハの研磨方法及び研磨装置並びにこの研磨装置を用いたウェーハの製造方法 | |
| JP2004312036A (ja) | ポリッシング装置及び方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20040119 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20040119 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20060113 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20060117 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060320 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20060418 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20060418 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090428 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100428 Year of fee payment: 4 |
|
| LAPS | Cancellation because of no payment of annual fees |