JP3783680B2 - Electronic component observation apparatus and electronic component observation method - Google Patents

Electronic component observation apparatus and electronic component observation method Download PDF

Info

Publication number
JP3783680B2
JP3783680B2 JP2002334818A JP2002334818A JP3783680B2 JP 3783680 B2 JP3783680 B2 JP 3783680B2 JP 2002334818 A JP2002334818 A JP 2002334818A JP 2002334818 A JP2002334818 A JP 2002334818A JP 3783680 B2 JP3783680 B2 JP 3783680B2
Authority
JP
Japan
Prior art keywords
electronic component
bump
recognition
emitting unit
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2002334818A
Other languages
Japanese (ja)
Other versions
JP2003218597A (en
Inventor
恵介 藤代
浩 村田
峰彦 後藤
浩二 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP2002334818A priority Critical patent/JP3783680B2/en
Publication of JP2003218597A publication Critical patent/JP2003218597A/en
Application granted granted Critical
Publication of JP3783680B2 publication Critical patent/JP3783680B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、バンプ付電子部品の観察に好適な電子部品観察装置及び電子部品観察方法に関するものである。
【0002】
【従来の技術】
本出願人は、先に、バンプ付電子部品の特性に応じて、既存の電子部品観察装置を改良した技術を提案した(例えば特許文献1参照)。
【0003】
以下、この電子部品観察装置の要点を、図6、図7を用いて説明する。
【0004】
図6において、1はバンプ付電子部品であり、このうち2はモールド体からなる本体部2、3は本体部2の下部に設けられる基板部、4は基板部3の下面にマトリックス状に複数個形成され、バンプ付電子部品1の端子としての役割を有するバンプ4である。バンプ4は、半球状をなし、その表面(曲面)は、鏡面状をなしている。
【0005】
バンプ付電子部品1は、移載ヘッド6の下部に設けられたノズル5によって吸着支持されており、移載ヘッド6にはバンプ付電子部品1の背後に位置するように背景板7が取り付けられている。
【0006】
8は、その上部に凹部9を備えた光源ユニットであり、凹部9の下部には、光源ユニット8の中心を貫通する鏡筒10が設けられ、鏡筒10に接続されるカメラ11は、鏡筒10、凹部9を介してバンプ付電子部品1の下面を下方から観察できるようになっている。
【0007】
12は、凹部9の傾斜面に多数配置され、バンプ付電子部品1の下面(端子としてのバ
ンプ4の配列面)に向けて下方から光を照射するLEDである。また、14はハロゲン光源13に接続され、矢印N1、N2で示すように、バンプ付電子部品1の背後にある背景板7を明るく照らす光ファイバ14である。
【0008】
ところで、図7(a)に示すように、バンプ4は、基板部3の下面に形成されたランド15に固着されるものである。しかし、場合によっては、バンプ4に欠けがあり、図7のA部で示すように、ランド15がそのまま下部に露呈していることがある。このような場合、バンプ付電子部品1は不良品であって、ラインから排除されなければならない。
【0009】
【特許文献1】
特開平8−153997号公報
【0010】
【発明が解決しようとする課題】
ところが、ランド15も銅などの金属箔から構成され、その表面は水平な金属面であるから、光を照射すると、明るく光るものである。
【0011】
このため、図6に示すような従来の電子部品観察装置で観察すると、図7(b)のような画像となっていた。なお、図7(b)において、斜線部は明るい部分を示し、非斜線部は暗い部分を示す。また、P1は基板部3の角部3aを示す点であり、S1、S2は図7(a)のA部に存在する像である。
【0012】
即ち、バンプ4が存在せず(バンプ欠け)ランド15のみの部分の像S2とバンプ4が存在する部分の像S2とを、画像上で区別することができない。
【0013】
したがって、この画像を画像処理部で認識させると、本来バンプ4がなく、「不良」と判定されるべきであるのに、「良」と誤判定されてしまう。このように、従来の電子部品観察装置では、バンプ付電子部品1の認識の信頼性が低いという問題点があった。またランド15の近くに配線パターンが存在する場合もこれを「バンプ」として誤認識してしまい、誤ったバンプの位置に基づいて電子部品を基板に搭載してしまうこともあった。
【0014】
そこで本発明は、バンプ付電子部品を正しく認識できる電子部品観察装置及び電子部品観察方法を提供することを目的とする。
【0015】
【課題を解決するための手段】
請求項1記載の電子部品観察装置は、電子部品を保持する移載ヘッドと、電子部品を下方から観察するカメラと、光源ユニットの凹部の傾斜面に設けられて電子部品の端子の配列面に向かって下方から光を照射する反射認識発光部と、この反射認識発光部よりも上段である前記光源ユニットの最上段に配置され、電子部品の端子の配列面に対してほぼ水平に近い鋭角に光を照射するバンプ認識発光部とを備え、前記端子がバンプの場合は前記バンプ認識発光部は点灯させ、前記反射認識発光部は消灯させる
【0016】
また、請求項2記載の電子部品観察方法は、電子部品を保持する移載ヘッドと、電子部品を下方から観察するカメラとを備えた電子部品観察装置による観察方法であって、光源ユニットの凹部の傾斜面に設けられて電子部品の端子の配列面に向かって下方から光を照射する反射認識発光部と、この反射認識発光部よりも上段である前記光源ユニットの最上段に配置され、電子部品の端子の配列面に対してほぼ水平に近い鋭角に光を照射するバンプ認識発光部とを用意し、バンプ認識方式、反射認識方式の認識方式によって、前記反射認識発光部と前記バンプ認識発光部のうち、点灯する発光部を切り替えて用いるものであり、前記端子がバンプの場合は前記バンプ認識発光部は点灯させ、前記反射認識発光部は消灯させる
【0018】
本発明によれば、上記構成によりバンプ付電子部品を観察する際には、バンプ認識発光部を点灯することによって、バンプが有る箇所についてリング状の画像を得ることができる。これによりバンプが無くランドがそのまま露呈している場合と、明確に区別することができ、誤認識を減らして、認識の信頼性を向上できる。
【0019】
【発明の実施の形態】
以下、本発明の実施の形態について、図面を参照して説明する。図1は発明の一実施の形態における電子部品観察装置の側面図、図2は発明の一実施の形態における電子部品観察装置の制御ブロック図、図3は発明の一実施の形態における電子部品観察装置のフローチャート、図4の(a)は発明の一実施の形態におけるバンプ付電子部品の側面図、図4の(b)は発明の一実施の形態における画像の例示図、図4の(c)は発明の一実施の形態におけるバンプ付近の拡大図、図5の(a)は発明の一実施の形態における透過認識方式向きの電子部品の側面図、図5の(b)は発明の一実施の形態における画像の例示図、図5の(c)は発明の一実施の形態における反射認識方式向きの電子部品の側面図、図5の(d)は発明の一実施の形態における画像の例示図である。なお、従来の技術を示す図6、図7と同様の構成要素については、同一符号を付すことにより説明を省略する。
【0020】
図1において、16は凹部17を有する光源ユニットである。凹部17の傾斜面には、バンプ付電子部品1の下面(端子としてのバンプ4の配列面)に向けて下方から光を照射する反射認識発光部18(多数のLEDから構成される)が設けられている。
【0021】
また、その上段には、ハロゲン光源13に接続され、背景板7に光を照射する透過認識発光部19(光ファイバで構成される)が設けられ、さらに、最上段には、上記配列面に対して鋭角(ほぼ水平に近い)に光を照射するバンプ認識発光部20(ハロゲンランプで構成される)が配置されている。
【0022】
これらの発光部18、19、20は、図2に示す制御ブロックによって、認識方式(バンプ認識方式、透過認識方式、反射認識方式)に応じて切り替えて用いられる。
【0023】
図2において、21は全体を制御する主制御部、22は各電子部品毎の認識方式や形状のデータなどを記憶する記憶部、23は移載ヘッド6をXYZθ方向に駆動する移載ヘッド駆動部である。
【0024】
また、24は主制御部21から認識方式の情報を入力し、後述する要領で、各発光部18、19、20の点灯/消灯を切り替える照明制御部である。
【0025】
一方、カメラ11から得られたアナログの画像情報は、A/D変換器25でデジタル信号に変換され、画像メモリ26に一旦保存される。
【0026】
そして、画像処理部27が、画像メモリ26の画像に基づいて、位置ずれの有無やバンプ付電子部品1についてはバンプ4の有無などを認識し、バンプの位置情報や「良」または「不良」という認識結果が主制御部21に出力されるようになっている。そして主制御部21は、認識結果に基づいて移載ヘッド駆動部23を制御して移載ヘッド6に保持された電子部品を図外の基板へ移載したり、不良の電子部品を所定の位置に廃棄したりする。
【0027】
本形態の電子部品観察装置は、以上のような構成よりなり、次にその動作を電子部品実装装置を例にとって図3、図4などを用いて説明する。
【0028】
まず、ステップ1にて、図外の供給部から移載ヘッド6で電子部品をピックアップし、電子部品観察装置の上方へ移送する。ステップ2にて、現在ノズル5に吸着されている電子部品の認識方式を、記憶部22から取得する。
【0029】
この認識方式がバンプ認識方式であれば、照明制御部24にバンプ認識発光部20と透過認識発光部19を点灯させ、反射認識発光部18を消灯させる。
【0030】
なおこのとき、透過認識発光部19を消灯させても良いが、バンプ認識発光部20と透過認識発光部19とを点灯した方が、基板部3の角部を画像で見つけやすく、バンプ4の概略位置を求めることができるので、認識を高速化できて好都合である。
【0031】
さて、このバンプ認識方式による観察について、図4を用いて説明する。ここで、従来の技術に関する図7(a)と同様に、A部にバンプ4の欠けがあるとき、カメラ11の画像は、図4(b)のようになる。
【0032】
即ち、バンプ4がなくランド15がそのまま露呈している部分では、ランド15は水平な金属面であるから、バンプ認識発光部20によって鋭角に光が照射されても、反射光は、真下のカメラ11側に向くことがない。したがって、像S2のように、この部分は、暗く観察される。
【0033】
一方、ランド15にバンプ4が固着されていると、バンプ4にバンプ認識発光部20から照射される光は、図4(c)のように反射する。
【0034】
即ち、矢印N3のように、バンプ4の頂部付近に入射する光は、基板部3とほぼ並行に反射してカメラ11側には向かない。したがって、バンプ4の頂部付近は、暗い像になる。しかし、矢印N4のように、バンプ4の中腹付近に入射する光は、基板部3に対してほぼ垂直に反射して、カメラ11側を向く。
【0035】
この結果、バンプ4が存在すると、図4(b)の像S1のように、リング状の明るい像が得られる。そこで、画像処理部27において、リング状のパターン(二値または多値のいずれでもよい)を用意し、パターンマッチングを行い、バンプ4の位置を特定することができる。
【0036】
ここで、図4(b)に示すように、バンプ4の有無は、像S1、S2によって、明確に区別することができる。ここで、従来技術のように、バンプ4がなくランド15がそのまま露呈している場合に、「良」と誤判定することがない。このため、認識の信頼性を向上できる。
【0037】
次に、図3のステップ2にて、認識方式が透過認識方式であるとき、透過認識発光部19のみを点灯し、反射認識発光部18、バンプ認識発光部20を消灯する。
【0038】
この透過認識方式には、図5(a)に示すように、角チップ28やQFP,SOPなどのリード付電子部品が適する。
【0039】
この方式によると、図5(b)のように、背景板7が明るく照らされ、電子部品は背景板7の中に暗いシルエットとして観察される。なお本形態では、図1に示すように、透過認識発光部19によって下側から背景板7を照らしているが、上側から背景板7を照らすようにしても差し支えない。
【0040】
また図3のステップ2にて、認識方式が反射認識方式であるときは、反射認識発光部18を点灯する(ステップ5)。なお併せて、透過認識発光部19を点灯しても良い。
【0041】
透過認識方式を適用するのは、図5(c)のように、内側に折れ曲がるJリード29aを有するJリード部品29などである。このとき、図5(d)に示すように、Jリード29aのみが明るい像S4、S5として観察される。
【0042】
そして、図3のステップ6にて、カメラ11のアナログ画像をA/D変換器25でデジタル化し画像メモリ26に記憶させる。そして、画像処理部27により、電子部品の認識方式に応じて、位置ずれなどの認識を行い(ステップ7)、認識結果を得るものである。認識結果が「良」であれば検出したバンプ4の位置に基づいて電子部品を基板に搭載する(ステップ9)。不良であればこの電子部品を廃棄する(ステップ10)。そして全ての電子部品の搭載が完了したかを確認し(ステップ11)、完了していなければステップ1へ戻って次の電子部品をピックアップし完了であれば処理を終了させる。
【0043】
【発明の効果】
本発明では、以上のように構成したので、バンプ付電子部品についてもバンプの有無判定を含めて、信頼性の高い認識を行うことができる。
【図面の簡単な説明】
【図1】発明の一実施の形態における電子部品観察装置の側面図
【図2】発明の一実施の形態における電子部品観察装置の制御ブロック図
【図3】発明の一実施の形態における電子部品観察装置のフローチャート
【図4】(a)発明の一実施の形態におけるバンプ付電子部品の側面図
(b)発明の一実施の形態における画像の例示図
(c)発明の一実施の形態におけるバンプ付近の拡大図
【図5】(a)発明の一実施の形態における透過認識方式向きの電子部品の側面図
(b)発明の一実施の形態における画像の例示図
(c)発明の一実施の形態における反射認識方式向きの電子部品の側面図
(d)発明の一実施の形態における画像の例示図
【図6】従来の電子部品観察装置の側面図
【図7】(a)従来の電子部品観察装置によるバンプ付電子部品の側面図
(b)従来の電子部品観察装置による画像の例示図
【符号の説明】
1 バンプ付電子部品
4 バンプ
6 移載ヘッド
7 背景板
11 カメラ
18 反射認識発光部
19 透過認識発光部
20 バンプ認識発光部
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an electronic component observation apparatus and an electronic component observation method suitable for observing bumped electronic components.
[0002]
[Prior art]
The present applicant has previously proposed a technique in which an existing electronic component observation apparatus is improved in accordance with the characteristics of an electronic component with bumps (see, for example, Patent Document 1).
[0003]
The main points of this electronic component observation apparatus will be described below with reference to FIGS.
[0004]
In FIG. 6, reference numeral 1 denotes an electronic component with bumps, 2 of which is a main body part 2 made of a molded body, 3 is a substrate part provided at the lower part of the main body part 2, and 4 is a matrix on the lower surface of the substrate part 3 The bumps 4 are formed individually and serve as terminals of the bumped electronic component 1. The bump 4 has a hemispherical shape, and its surface (curved surface) has a mirror shape.
[0005]
The bumped electronic component 1 is adsorbed and supported by a nozzle 5 provided below the transfer head 6, and a background plate 7 is attached to the transfer head 6 so as to be positioned behind the bumped electronic component 1. ing.
[0006]
Reference numeral 8 denotes a light source unit having a recess 9 in the upper portion thereof. A lens barrel 10 penetrating the center of the light source unit 8 is provided in the lower portion of the recess 9, and a camera 11 connected to the lens barrel 10 is a mirror. The lower surface of the bumped electronic component 1 can be observed from below through the cylinder 10 and the recess 9.
[0007]
A plurality of LEDs 12 are arranged on the inclined surface of the concave portion 9 and emit light from below toward the lower surface of the electronic component 1 with bumps (the arrangement surface of the bumps 4 as terminals). Reference numeral 14 denotes an optical fiber 14 that is connected to the halogen light source 13 and brightly illuminates the background plate 7 behind the electronic component 1 with bumps, as indicated by arrows N1 and N2.
[0008]
By the way, as shown in FIG. 7A, the bump 4 is fixed to the land 15 formed on the lower surface of the substrate portion 3. However, in some cases, the bump 4 is chipped, and the land 15 may be exposed as it is, as shown by part A in FIG. In such a case, the bumped electronic component 1 is defective and must be excluded from the line.
[0009]
[Patent Document 1]
JP-A-8-153997 gazette
[Problems to be solved by the invention]
However, since the land 15 is also made of a metal foil such as copper, and the surface thereof is a horizontal metal surface, it shines brightly when irradiated with light.
[0011]
Therefore, when the image is observed with a conventional electronic component observation apparatus as shown in FIG. 6, an image as shown in FIG. 7B is obtained. In FIG. 7B, the hatched portion indicates a bright portion, and the non-hatched portion indicates a dark portion. Moreover, P1 is a point which shows the corner | angular part 3a of the board | substrate part 3, and S1 and S2 are the images which exist in the A part of Fig.7 (a).
[0012]
That is, it is impossible to distinguish on the image the image S2 of the portion where only the land 15 where the bump 4 does not exist (the bump missing) and the bump 4 exist.
[0013]
Therefore, when this image is recognized by the image processing unit, the bump 4 is not originally present and should be determined as “defective”, but erroneously determined as “good”. Thus, the conventional electronic component observation apparatus has a problem that the reliability of recognition of the electronic component 1 with bumps is low. Further, when a wiring pattern is present near the land 15, it is erroneously recognized as a “bump”, and an electronic component may be mounted on the substrate based on the wrong bump position.
[0014]
Accordingly, an object of the present invention is to provide an electronic component observation apparatus and an electronic component observation method that can correctly recognize bumped electronic components.
[0015]
[Means for Solving the Problems]
The electronic component observation apparatus according to claim 1 is provided on the inclined surface of the concave portion of the light source unit and the transfer surface for holding the electronic component, the camera for observing the electronic component from below, and the arrangement surface of the terminals of the electronic component. A reflection recognition light emitting unit that irradiates light from below and an uppermost stage of the light source unit that is above the reflection recognition light emission unit, and has an acute angle that is almost horizontal with respect to the arrangement surface of the terminals of the electronic component. A bump recognition light emitting unit for irradiating light, and when the terminal is a bump, the bump recognition light emitting unit is turned on and the reflection recognition light emitting unit is turned off .
[0016]
The electronic component observation method according to claim 2 includes a transfer head for holding an electronic component, a observation method according to the electronic component observation apparatus provided with a camera for observing the electronic part from below, the recess of the light source unit The reflection recognition light-emitting unit that is provided on the inclined surface of the electronic component and emits light from below toward the terminal arrangement surface of the electronic component, and is disposed on the uppermost stage of the light source unit that is above the reflection recognition light-emitting unit. A bump recognition light emitting unit that irradiates light at an acute angle that is almost horizontal with respect to the arrangement surface of the component terminals is prepared, and the reflection recognition light emitting unit and the bump recognition light emission are determined according to a bump recognition method and a reflection recognition method. Among the parts, the light emitting part to be turned on is used by switching . When the terminal is a bump, the bump recognition light emitting part is turned on and the reflection recognition light emitting part is turned off .
[0018]
According to the present invention, when observing an electronic component with bumps according to the above-described configuration, a ring-shaped image can be obtained for a portion having a bump by turning on the bump recognition light emitting unit. As a result, it is possible to clearly distinguish from the case where the land is exposed as it is without bumps, and it is possible to reduce erroneous recognition and improve the reliability of recognition.
[0019]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings. 1 is a side view of an electronic component observation apparatus according to an embodiment of the invention, FIG. 2 is a control block diagram of the electronic component observation apparatus according to an embodiment of the invention, and FIG. 3 is an electronic component observation according to an embodiment of the invention. FIG. 4A is a side view of a bumped electronic component according to an embodiment of the invention, FIG. 4B is an illustration of an image according to an embodiment of the invention, and FIG. ) Is an enlarged view of the vicinity of a bump in one embodiment of the invention, FIG. 5A is a side view of an electronic component suitable for a transmission recognition system in one embodiment of the invention, and FIG. FIG. 5C is a side view of an electronic component suitable for a reflection recognition system according to an embodiment of the invention, and FIG. 5D is an image of the image according to the embodiment of the invention. It is an illustration figure. In addition, about the component similar to FIG. 6, FIG. 7 which shows a prior art, the description is abbreviate | omitted by attaching | subjecting the same code | symbol.
[0020]
In FIG. 1, reference numeral 16 denotes a light source unit having a recess 17. The inclined surface of the concave portion 17 is provided with a reflection recognition light emitting unit 18 (comprising a large number of LEDs) that emits light from below toward the lower surface of the electronic component 1 with bumps (an arrangement surface of the bumps 4 as terminals). It has been.
[0021]
In addition, a transmission recognition light emitting unit 19 (comprising an optical fiber) connected to the halogen light source 13 and irradiating light to the background plate 7 is provided on the upper stage, and further, the arrangement surface is provided on the uppermost stage. On the other hand, a bump recognition light emitting unit 20 (comprising a halogen lamp) that irradiates light at an acute angle (nearly horizontal) is disposed.
[0022]
These light-emitting units 18, 19, and 20 are switched and used according to the recognition method (bump recognition method, transmission recognition method, reflection recognition method) by the control block shown in FIG.
[0023]
In FIG. 2, 21 is a main control unit for controlling the whole, 22 is a storage unit for storing the recognition method and shape data for each electronic component, and 23 is a transfer head drive for driving the transfer head 6 in the XYZθ directions. Part.
[0024]
Reference numeral 24 denotes an illumination control unit which inputs information on the recognition method from the main control unit 21 and switches on / off the light emitting units 18, 19 and 20 in the manner described later.
[0025]
On the other hand, analog image information obtained from the camera 11 is converted into a digital signal by the A / D converter 25 and temporarily stored in the image memory 26.
[0026]
Then, the image processing unit 27 recognizes the presence / absence of positional deviation and the presence / absence of the bump 4 for the bumped electronic component 1 based on the image of the image memory 26, and the bump position information and “good” or “bad”. The recognition result is output to the main control unit 21. The main control unit 21 controls the transfer head driving unit 23 based on the recognition result to transfer the electronic component held by the transfer head 6 to a substrate not shown in the figure, or to transfer a defective electronic component to a predetermined unit. Or dispose of in position.
[0027]
The electronic component observation apparatus according to the present embodiment has the above-described configuration. Next, the operation of the electronic component observation apparatus will be described with reference to FIGS.
[0028]
First, in step 1, an electronic component is picked up by a transfer head 6 from a supply unit (not shown), and is transferred above the electronic component observation apparatus. In step 2, the recognition method of the electronic component currently sucked by the nozzle 5 is acquired from the storage unit 22.
[0029]
If this recognition method is a bump recognition method, the illumination control unit 24 turns on the bump recognition light emitting unit 20 and the transmission recognition light emitting unit 19 and turns off the reflection recognition light emitting unit 18.
[0030]
At this time, the transmission recognition light-emitting unit 19 may be turned off. However, when the bump recognition light-emitting unit 20 and the transmission recognition light-emitting unit 19 are turned on, the corners of the substrate unit 3 can be easily found in the image, and the bump 4 Since the approximate position can be obtained, the recognition can be speeded up, which is convenient.
[0031]
Now, the observation by this bump recognition method will be described with reference to FIG. Here, as in FIG. 7A relating to the prior art, when the bump 4 is missing in the portion A, the image of the camera 11 is as shown in FIG. 4B.
[0032]
That is, in the part where the bump 4 is not present and the land 15 is exposed as it is, the land 15 is a horizontal metal surface, so even if light is irradiated at an acute angle by the bump recognizing light emitting unit 20, the reflected light is directly below the camera. It does not face 11 side. Therefore, like the image S2, this portion is observed darkly.
[0033]
On the other hand, when the bump 4 is fixed to the land 15, the light emitted from the bump recognition light emitting unit 20 to the bump 4 is reflected as shown in FIG.
[0034]
That is, as indicated by the arrow N3, the light incident on the vicinity of the top of the bump 4 is reflected almost in parallel with the substrate 3 and is not directed to the camera 11 side. Therefore, a dark image is formed near the top of the bump 4. However, as indicated by the arrow N4, the light incident near the middle of the bump 4 is reflected substantially perpendicularly to the substrate unit 3 and faces the camera 11 side.
[0035]
As a result, when the bumps 4 are present, a bright ring-shaped image is obtained like the image S1 in FIG. Therefore, the image processing unit 27 can prepare a ring-shaped pattern (which may be either binary or multi-valued), perform pattern matching, and specify the position of the bump 4.
[0036]
Here, as shown in FIG. 4B, the presence or absence of the bump 4 can be clearly distinguished by the images S1 and S2. Here, unlike the prior art, when there is no bump 4 and the land 15 is exposed as it is, there is no erroneous determination as “good”. For this reason, the reliability of recognition can be improved.
[0037]
Next, in step 2 of FIG. 3, when the recognition method is the transmission recognition method, only the transmission recognition light emitting unit 19 is turned on, and the reflection recognition light emitting unit 18 and the bump recognition light emitting unit 20 are turned off.
[0038]
As shown in FIG. 5A, lead-type electronic components such as the square chip 28, QFP, and SOP are suitable for this transmission recognition method.
[0039]
According to this method, as shown in FIG. 5B, the background plate 7 is brightly illuminated, and the electronic component is observed as a dark silhouette in the background plate 7. In this embodiment, as shown in FIG. 1, the background plate 7 is illuminated from the lower side by the transmission recognition light emitting unit 19, but the background plate 7 may be illuminated from the upper side.
[0040]
If the recognition method is the reflection recognition method in step 2 of FIG. 3, the reflection recognition light emitting unit 18 is turned on (step 5). In addition, the transmission recognition light emitting unit 19 may be turned on.
[0041]
The transparent recognition method is applied to a J lead component 29 having a J lead 29a bent inward as shown in FIG. 5C. At this time, as shown in FIG. 5D, only the J lead 29a is observed as bright images S4 and S5.
[0042]
3, the analog image of the camera 11 is digitized by the A / D converter 25 and stored in the image memory 26. Then, the image processing unit 27 recognizes misalignment or the like according to the electronic component recognition method (step 7), and obtains a recognition result. If the recognition result is “good”, the electronic component is mounted on the substrate based on the detected position of the bump 4 (step 9). If it is defective, the electronic component is discarded (step 10). Then, it is confirmed whether or not all the electronic components have been mounted (step 11). If not completed, the process returns to step 1 to pick up the next electronic component, and if completed, the process is terminated.
[0043]
【The invention's effect】
Since the present invention is configured as described above, highly reliable recognition can be performed for bumped electronic components, including determination of the presence or absence of bumps.
[Brief description of the drawings]
FIG. 1 is a side view of an electronic component observation apparatus according to an embodiment of the invention. FIG. 2 is a control block diagram of the electronic component observation apparatus according to an embodiment of the invention. FIG. 4A is a side view of an electronic component with bumps according to an embodiment of the invention. FIG. 4B is an illustration of an image according to an embodiment of the invention. FIG. 4C is a bump according to an embodiment of the invention. FIG. 5A is a side view of an electronic component suitable for a transmission recognition system in an embodiment of the invention; FIG. 5B is an exemplary view of an image in the embodiment of the invention; and FIG. 5C is an embodiment of the invention. FIG. 6 is a side view of an image according to an embodiment of the invention. FIG. 6 is a side view of a conventional electronic component observation apparatus. FIG. 7 is a side view of a conventional electronic component. Bumped electricity by observation equipment Side view of the component (b) illustration of a conventional image by electronic component viewing device [Description of symbols]
DESCRIPTION OF SYMBOLS 1 Electronic component with bump 4 Bump 6 Transfer head 7 Background board 11 Camera 18 Reflection recognition light emission part 19 Transmission recognition light emission part 20 Bump recognition light emission part

Claims (2)

電子部品を保持する移載ヘッドと、電子部品を下方から観察するカメラと、光源ユニットの凹部の傾斜面に設けられて電子部品の端子の配列面に向かって下方から光を照射する反射認識発光部と、この反射認識発光部よりも上段である前記光源ユニットの最上段に配置され、電子部品の端子の配列面に対してほぼ水平に近い鋭角に光を照射するバンプ認識発光部とを備え、前記端子がバンプの場合は前記バンプ認識発光部は点灯させ、前記反射認識発光部は消灯させることを特徴とする電子部品観察装置。Reflection-recognition light emission that is provided on the inclined surface of the concave portion of the light source unit and emits light from below toward the arrangement surface of the terminals of the electronic component, and a transfer head that holds the electronic component, a camera that observes the electronic component from below And a bump recognition light-emitting unit that is disposed on the uppermost stage of the light source unit that is above the reflection-recognition light-emitting unit and that irradiates light at an acute angle that is almost horizontal with respect to the arrangement surface of the terminals of the electronic component. When the terminal is a bump, the bump recognition light emitting unit is turned on and the reflection recognition light emitting unit is turned off . 電子部品を保持する移載ヘッドと、電子部品を下方から観察するカメラとを備えた電子部品観察装置による観察方法であって、
光源ユニットの凹部の傾斜面に設けられて電子部品の端子の配列面に向かって下方から光を照射する反射認識発光部と、この反射認識発光部よりも上段である前記光源ユニットの最上段に配置され、電子部品の端子の配列面に対してほぼ水平に近い鋭角に光を照射するバンプ認識発光部とを用意し、バンプ認識方式、反射認識方式の認識方式によって、前記反射認識発光部と前記バンプ認識発光部のうち、点灯する発光部を切り替えて用いるものであり、前記端子がバンプの場合は前記バンプ認識発光部は点灯させ、前記反射認識発光部は消灯させることを特徴とする電子部品観察方法。
An observation method by an electronic component observation apparatus comprising a transfer head for holding an electronic component and a camera for observing the electronic component from below,
A reflection recognition light-emitting unit that is provided on the inclined surface of the concave portion of the light source unit and emits light from below toward the arrangement surface of the terminals of the electronic component, and the uppermost stage of the light source unit that is above the reflection recognition light-emitting unit And a bump recognition light emitting unit that irradiates light at an acute angle that is almost horizontal with respect to the arrangement surface of the terminals of the electronic component. Among the bump recognition light emitting units, a light emitting unit to be turned on is used by switching , and when the terminal is a bump, the bump recognition light emitting unit is turned on and the reflection recognition light emitting unit is turned off. Part observation method.
JP2002334818A 2002-11-19 2002-11-19 Electronic component observation apparatus and electronic component observation method Expired - Lifetime JP3783680B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002334818A JP3783680B2 (en) 2002-11-19 2002-11-19 Electronic component observation apparatus and electronic component observation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002334818A JP3783680B2 (en) 2002-11-19 2002-11-19 Electronic component observation apparatus and electronic component observation method

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP31594796A Division JP3812020B2 (en) 1996-11-27 1996-11-27 Electronic component observation apparatus and electronic component observation method

Publications (2)

Publication Number Publication Date
JP2003218597A JP2003218597A (en) 2003-07-31
JP3783680B2 true JP3783680B2 (en) 2006-06-07

Family

ID=27655836

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002334818A Expired - Lifetime JP3783680B2 (en) 2002-11-19 2002-11-19 Electronic component observation apparatus and electronic component observation method

Country Status (1)

Country Link
JP (1) JP3783680B2 (en)

Also Published As

Publication number Publication date
JP2003218597A (en) 2003-07-31

Similar Documents

Publication Publication Date Title
JP3299193B2 (en) Bump inspection method / apparatus, information storage medium
JP3812020B2 (en) Electronic component observation apparatus and electronic component observation method
JP4804295B2 (en) Component recognition method, component recognition device, surface mounter and component inspection device
JP3783680B2 (en) Electronic component observation apparatus and electronic component observation method
JP2002071577A (en) Visual inspection apparatus and visual inspection method
JP2000028320A (en) Image recognizing equipment and image recognizing method
KR101079686B1 (en) Image recognition apparatus and image recognition method
US6738504B1 (en) Inspection apparatus for semiconductor device and parts mounter using same
JP2002048731A (en) Mounted base board visual inspection device and its visual inspection method
JP4818572B2 (en) Image recognition apparatus and image recognition method
JPH05288527A (en) Appearance inspecting method for mounted board and its device
JP3340114B2 (en) Inspection equipment for semiconductor devices and component mounting machines
JPH11205000A (en) Method and device for observing electronic component
JP4329152B2 (en) Component recognition device
JP2001094299A (en) Electronic parts recognizer in electronic parts mounter
CN100527933C (en) Electronic component identification process and apparatus
JP2000030991A (en) Method and equipment for reading wafer id
JP3006437B2 (en) Electronic component observation device and electronic component observation method
JP2001304829A (en) Electronic part recognizing apparatus
JP2885443B2 (en) Flat package integrated circuit lead inspection device
CN110113931B (en) Method for determining orientation of electronic component, sensor system and assembling machine
JP2010087304A (en) Electronic component mounting apparatus
JPH07174539A (en) Image-processing apparatus
JPH1027513A (en) Image picking-up device
JP4818571B2 (en) Image recognition apparatus and image recognition method

Legal Events

Date Code Title Description
RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20050707

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20050726

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050922

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20051101

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20051222

A911 Transfer of reconsideration by examiner before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20060117

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20060221

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20060306

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100324

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110324

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110324

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120324

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130324

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130324

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140324

Year of fee payment: 8

EXPY Cancellation because of completion of term