JP3684462B2 - 光学特性測定装置 - Google Patents

光学特性測定装置 Download PDF

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Publication number
JP3684462B2
JP3684462B2 JP04294097A JP4294097A JP3684462B2 JP 3684462 B2 JP3684462 B2 JP 3684462B2 JP 04294097 A JP04294097 A JP 04294097A JP 4294097 A JP4294097 A JP 4294097A JP 3684462 B2 JP3684462 B2 JP 3684462B2
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JP
Japan
Prior art keywords
eye
light
light receiving
examined
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP04294097A
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English (en)
Japanese (ja)
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JPH10216092A5 (enExample
JPH10216092A (ja
Inventor
俊文 三橋
康文 福間
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Priority to JP04294097A priority Critical patent/JP3684462B2/ja
Priority to US09/023,058 priority patent/US6234978B1/en
Publication of JPH10216092A publication Critical patent/JPH10216092A/ja
Priority to US09/809,978 priority patent/US6540692B2/en
Publication of JPH10216092A5 publication Critical patent/JPH10216092A5/ja
Application granted granted Critical
Publication of JP3684462B2 publication Critical patent/JP3684462B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Eye Examination Apparatus (AREA)
JP04294097A 1997-02-12 1997-02-12 光学特性測定装置 Expired - Fee Related JP3684462B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP04294097A JP3684462B2 (ja) 1997-02-12 1997-02-12 光学特性測定装置
US09/023,058 US6234978B1 (en) 1997-02-12 1998-02-12 Optical characteristic measuring apparatus
US09/809,978 US6540692B2 (en) 1997-02-12 2001-03-16 Optical characteristic measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04294097A JP3684462B2 (ja) 1997-02-12 1997-02-12 光学特性測定装置

Publications (3)

Publication Number Publication Date
JPH10216092A JPH10216092A (ja) 1998-08-18
JPH10216092A5 JPH10216092A5 (enExample) 2005-02-24
JP3684462B2 true JP3684462B2 (ja) 2005-08-17

Family

ID=12650020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04294097A Expired - Fee Related JP3684462B2 (ja) 1997-02-12 1997-02-12 光学特性測定装置

Country Status (1)

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JP (1) JP3684462B2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE236568T1 (de) * 1998-11-13 2003-04-15 Benedikt Prof Dr Med Jean Verfahren und vorrichtung zur gleichzeitigen erfassung der oberflächentopographie und der biometrie eines auges
US6264328B1 (en) * 1999-10-21 2001-07-24 University Of Rochester Wavefront sensor with off-axis illumination
JP4692939B2 (ja) * 1999-11-15 2011-06-01 株式会社トプコン 眼特性測定装置
JP4618593B2 (ja) * 2000-10-20 2011-01-26 株式会社トプコン 眼特性測定装置
US6525883B2 (en) * 1999-12-27 2003-02-25 Kabushiki Kaisha Topcon Optical characteristic measuring instrument
JP4517211B2 (ja) * 2000-05-12 2010-08-04 株式会社トプコン 眼特性測定装置
JP2001340299A (ja) * 2000-06-02 2001-12-11 Topcon Corp 眼光学特性測定装置
JP4649035B2 (ja) 2000-10-18 2011-03-09 株式会社トプコン 眼特性測定装置
JP2002209854A (ja) * 2000-10-18 2002-07-30 Topcon Corp 光学特性測定装置
US6905209B2 (en) 2000-10-18 2005-06-14 Kabushiki Kaisha Topcon Optical characteristics measuring device
BR0209122A (pt) * 2001-04-18 2004-07-27 Bausch & Lomb Refração manifesta objetiva
JP4846938B2 (ja) * 2001-08-14 2011-12-28 株式会社トプコン 眼特性測定装置
JP4102058B2 (ja) 2001-11-09 2008-06-18 株式会社トプコン 眼の光学特性測定装置
JP4987408B2 (ja) 2006-09-29 2012-07-25 株式会社ニデック 眼科装置
JP5546112B2 (ja) * 2008-07-07 2014-07-09 キヤノン株式会社 眼科撮像装置および眼科撮像方法
JP5517571B2 (ja) 2009-11-18 2014-06-11 キヤノン株式会社 撮像装置および撮像方法
JP6007466B2 (ja) 2010-12-27 2016-10-12 株式会社ニデック 角膜形状測定装置
EP2835098B1 (en) 2012-04-06 2016-07-20 Nidek Co., Ltd. Ophthalmic measurement device, and ophthalmic measurement system equipped with ophthalmic measurement device
JP6515478B2 (ja) 2014-10-07 2019-05-22 株式会社ニデック 眼科装置、および、眼科測定プログラム

Also Published As

Publication number Publication date
JPH10216092A (ja) 1998-08-18

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