JP3476119B2 - High load test method for ATM exchange and recording medium thereof - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is capable of performing various high load tests such as multi-stage connection, multiple connection setting, and processing capacity load in an ATM switch regardless of the setting pattern of any band. The present invention also relates to a high-load test method capable of performing a maximum high-load test using a minimum of test equipment and a recording medium recording the program thereof.

[0002]

2. Description of the Related Art When performing a multi-stage connection test on a conventional ATM switch, it is necessary to connect a plurality of actual switches to carry out the test. Furthermore, in the ATM switch,
In order to perform a test such as setting of multiple connections and a high processing load test, it was necessary to connect a large number of pseudo call test devices and perform the test. As described above, in these tests, it is necessary to prepare a large number of exchanges and pseudo call test devices, which is inefficient in terms of cost and takes a lot of time to prepare. Also, a method of embedding a load generation processing module in the program to generate a pseudo load has been considered, but in order to perform a test as a system of an exchange by this method, it is necessary to use a high-performance system including hardware / software. It was necessary to realize the load condition.

[0003]

As described above, when performing tests such as a multi-connection continuation test, a plurality of connection settings and a high processing load test in the conventional ATM switch, many switches and pseudo call test equipment are prepared. Since it is necessary, there is a problem that it is inefficient in terms of cost and it takes a lot of time to prepare. Therefore, an object of the present invention is to solve such conventional problems and to provide a high load test method for an ATM exchange capable of performing a maximum high load test using a minimum of test equipment. is there.

[0004]

In order to achieve the above object, the high load test method for an ATM switch according to the present invention comprises:
By setting a loop connection in one ATM switch, a high load state proportional to the number of loops is realized. That is, in the test configuration of FIG. 1, when the pseudo call test device (2) housed in the line interface (14) makes a call to the pseudo call test device (3), A
In the TM switch (1), the signal processing unit (17) receives the call setting request signal from the pseudo call test apparatus (2), the routing processing unit (16) is called, and the routing processing unit (1) is called.
In 6), the route of the outgoing line is selected, and the line corresponding unit (11) which is the route of the outgoing line with the first priority is selected. When the route of the outgoing line is determined, the line management unit (18) checks the vacancy of resources such as the band required for connection setting, and if there is a vacancy, the connection processing unit (19) connects the connection. After that, the call setting request signal from the signal processing unit (17) is transferred from the line interface unit (11) to the first route. The physical line (4) output from the line interface (11) is physically connected back to the line interface (13). As a result, the above call setting request signal is received by the line interface (13). The call setup request signal received by the line interface (13) is processed again by the ATM exchange (1), and the route is selected again as long as the first selected route is available. Transferred. As a result, the call setup request signal loops between the line interface (11) and the line interface (13).
And, the call setup request signal and the connection accompanying it,
The loop is continued until the physical line (4) between the line corresponding unit (11) and the line corresponding unit (13) is exhausted, and when the physical line (4) becomes full, the loop is bypassed to the line corresponding unit (12) of the second selected route. , Multi-stage connection by loop is established.

[0005]

BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described in detail below with reference to the drawings. FIG. 1 is a block diagram of an ATM switch for a high load test method showing an embodiment of the present invention.
FIG. 2 is a flow chart up to setting a multi-stage connection by a loop. Conventionally, by connecting the ATM exchanges 1 in multiple stages (for example, two or more), the call setup request signal is sent from the pseudo call test device of the first exchange to the pseudo call test device of the second exchange. I was doing a high load test. On the other hand, in the high load test according to the present invention, a high load state proportional to the number of loops is realized by setting a loop connection in one ATM switch 1. That is, in the case of FIG.
Four line interface units are provided in one ATM exchange 1. The pseudo line test unit 2 is provided in the first line interface unit 14, and the pseudo call test device 3 is provided in the second line interface unit 12. By forming a loop with the physical line 4 between the third and fourth line corresponding units 11 and 13, the same number as the number of times the loop is repeatedly connected is equivalent to the case where the ATM switches are connected in multiple stages and tested. Get the effect of. By setting the number of times when the physical line 4 becomes empty to a predetermined number, it becomes possible to carry out a high load test of multistage connection of an arbitrary number of ATM exchanges.

In the present invention, by looping the connection, the series connection of the exchanges for the number of loops is simulated to perform a multi-stage connection test. Also, by looping the connections, the connection is set for the number of times of the loop, and the multiple connection setting test is realized. Further, by looping the connection setting signal, the connection is disconnected from the called-side pseudo test equipment, and by repeating the setting / releasing operation that loops the connection disconnection signal, a processing load is imposed on the exchange, and Implement a processing load test.

First, when the pseudo call test apparatus 2 of FIG. 1 makes a call to the pseudo call test apparatus 3, the response section 14 receives the call setting request signal, and the signal processing section 17 accepts / analyzes the signal. Perform (step 101). Next, the routing processing unit 16 selects the first one of the priorities (step 102). When the route is selected, the line management unit 18
The processing shifts to step (1), and the normality of the device status of the line corresponding unit 11 which is the first path, the free bandwidth capacity, etc. are checked (step 103). Here, if the band can be secured, the route is determined to be the first route, and the resources required for connection setting are secured (steps 104 and 10).
5, 106). Next, in the connection processing unit 19, the connection is connected (step 107), and the signal control unit 17
Then, a call setting request signal is transmitted to the outgoing line 4 via the line corresponding unit 11 which is the first route (step 108).

The call setup request signal sent to the outgoing line 4 is
Normally, it arrives at another ATM exchange opposite thereto, but in FIG. 1, since the outgoing line 4 is connected to the line corresponding part 13 of the same ATM exchange 1, the same ATM exchange 1 again sends the call setting request signal. To receive. The call setup request signal received by the line interface 13 is again returned to step 101.
The connection setting and signal transmission processing of 108 are repeated. In step 104, as long as the free bandwidth of the physical line 4 can be secured, the loop of steps 101 to 108 is repeated, and the loop connection is continuously set between the line interface 11 to the line interface 13.

As the loop is repeated, the free bandwidth of the physical line 4 decreases, and it becomes impossible to secure the free bandwidth. In step 104, if the resources for the first route cannot be secured, the process proceeds to the process for selecting another route number,
The second route is selected, and the resources necessary for setting the connection are secured (steps 104, 201, 20).
2). Next, the connection is connected in the connection processing section 19 (step 203), and the call setting request signal is sent from the signal control section 17 to the pseudo call test apparatus 3 via the line corresponding section 12 which is the second route (step). 204). Upon receiving the call setting request signal, the pseudo call test apparatus 3 transmits a response signal, and a multi-stage connection via a plurality of loops is established between the pseudo call test apparatus 2 and the pseudo call test apparatus 3 (step 205). Further, by repeating the call origination / disconnection, the call setup / call disconnection signals of the number of loops are processed, which enables a high processing load test. The present invention is not limited to the high load test of the ATM switch alone, but can be applied to the high load test of the network.

If the processing steps shown in FIG. 2 are converted into a program and the converted program is stored in a recording medium such as a CD ROM, fixed disk, flexible disk, etc. A load test becomes possible.

[0011]

As described above, according to the present invention,
It is economically effective because a high load test can be performed with any band setting pattern, and the maximum load test can be performed by minimizing the use of a pseudo call test device or the like. Further, the application from the ATM switch to the high load test of the network is also possible.

[Brief description of drawings]

FIG. 1 is a configuration diagram of an ATM exchange that executes a high load test method according to an embodiment of the present invention.

FIG. 2 is a flowchart of setting a multi-stage connection by the loop in FIG.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... ATM switch, 2, 3 ... Pseudo call test apparatus, 4 ... Physical line, 5 ... Loop connection, 11-14 ... Line corresponding part, 15 ... ATM switch (SW), 16 ... Routing processing part, 17 ... Signal processing Part, 18 ... Line management part, 19 ... Connection processing part.

─────────────────────────────────────────────────── ─── Continuation of front page (58) Fields surveyed (Int.Cl. ⁷ , DB name) H04L 12/56 400

Claims (4)

(57) [Claims] 1. A high load test method for an ATM switch equipped with one ATM switch and a plurality of pseudo call test devices for simulating input / output of call processing signals, wherein the outgoing line of the ATM switch to be tested is the same switch. By looping back to the incoming line inside, a loop of the line is formed, and the pseudo call test device on the calling side makes a call to the pseudo call test device on the called side, and the routing processing selection route is given priority. By setting the connection for the above loop, the connection is looped, the lack of resources on the outgoing line due to multiple loops is detected, and the routing function to bypass to another outgoing line is used to A high-load test method for an ATM exchange, characterized by performing a multi-stage connection test by simulating a series connection of ATM exchanges for the number of loops by receiving a call to a pseudo call test device. 2. The high load test method for an ATM exchange according to claim 1, wherein the routing function for diverting to another outgoing line is used:
By exiting the loop and making a call to the pseudo call test device on the called side, connection settings for the number of loops are set,
AT characterized by performing multiple connection setting test
High load test method for M switch. 3. The high load test method for an ATM exchange according to claim 1, wherein the routing function for diverting to another outgoing line is used,
By repeating the setting or releasing operation to loop the disconnection signal of the connection by disconnecting the relevant connection from the pseudo-call testing device on the called side while exiting the loop and receiving the call on the pseudo-call testing device on the called side, A high load test method for an ATM switch, characterized in that a processing load is applied to the switch. 4. A recording medium in which the processing steps according to claim 1 are converted into a program and the program is stored.