JP3436391B2 - Edge polisher - Google Patents

Edge polisher

Info

Publication number
JP3436391B2
JP3436391B2 JP20478493A JP20478493A JP3436391B2 JP 3436391 B2 JP3436391 B2 JP 3436391B2 JP 20478493 A JP20478493 A JP 20478493A JP 20478493 A JP20478493 A JP 20478493A JP 3436391 B2 JP3436391 B2 JP 3436391B2
Authority
JP
Japan
Prior art keywords
wafer
notch
polishing
polishing member
holding means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP20478493A
Other languages
Japanese (ja)
Other versions
JPH0740213A (en
Inventor
守 駿 二 箱
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SpeedFam Co Ltd
Original Assignee
SpeedFam Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SpeedFam Co Ltd filed Critical SpeedFam Co Ltd
Priority to JP20478493A priority Critical patent/JP3436391B2/en
Publication of JPH0740213A publication Critical patent/JPH0740213A/en
Application granted granted Critical
Publication of JP3436391B2 publication Critical patent/JP3436391B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Description

【発明の詳細な説明】 【0001】 【産業上の利用分野】本発明は、半導体ウエハの外周部
を鏡面研磨するためのエッジポリッシャに関するもので
あり、更に詳しくは、外周の一部にノッチを備えた円板
形ウエハの外周部を鏡面研磨するためのエッジポリッシ
ャに関するものである。 【0002】 【従来の技術】円板形をなす半導体ウエハの面取り加工
された外周部を鏡面研磨するエッジポリッシャは、例え
ば特開昭64−71656号公報に記載されているよう
に、従来より公知である。かかるエッジポリッシャは、
一般に、図4に示すように、ウエハ1を外周部がはみ出
た状態に保持する保持手段2と、ウエハ1の外周部に一
定の力で当接する研磨部材3とを有し、保持手段2でウ
エハ1を軸線の回りに回転させながら、回転する研磨部
材3でウエハ外周部1aを鏡面研磨するものである。 【0003】一方、半導体ウエハ1には、図5に示すよ
うに、外周の一部に平らな切欠き(オリエンテーション
フラット)4を有するものや、図6に示すように、X線
照射の認識マークとしてのV字形やU字形等の切欠き
(ノッチ)5を有するものがあり、従来では、これらの
ウエハ1を、切欠きの有無や切欠きの形状等に拘らず同
じエッジポリッシャを使用して研磨するようにしてい
た。 【0004】ところが、ノッチ5を有するウエハを研磨
する場合には、該ノッチ5の鋭利な角部5aが研磨部材
3に当ってポリッシングパッドを傷付け易いため、該パ
ッドが短時間にうちに破損してしまうという問題があっ
た。 【0005】 【発明が解決しようとする課題】本発明の課題は、ウエ
ハのノッチによって研磨部材が傷付けられにくいエッジ
ポリッシャを提供することにある。 【0006】 【課題を解決するための手段】上記課題を解決するた
め、本発明のエッジポリッシャは、外周の一部にノッチ
を備えた円板形のウエハを保持して軸線の回りに回転さ
せる保持手段と、ウエハの外周を研磨する研磨部材とを
有し、上記保持手段が、ウエハを外周部がはみ出た状態
に保持可能な該ウエハより小径のチャック面を有してい
て、該チャック面におけるウエハのノッチと対応する位
置に、該ノッチの角部が研磨部材に圧接するのを防止す
るための突部を備えていることを特徴とするものであ
る。 【0007】 【作用】ノッチ付きのウエハを、保持手段における突部
付きのチャック面に、ノッチと突部とが対応するような
位置関係に保持させたあと、該ウエハを軸線の回りに回
転させながら、回転する研磨部材でウエハ外周部を鏡面
研磨する。このとき、ウエハのノッチが形成されていな
い部分では該ウエハの外周が研磨部材に当接し、ノッチ
形成部分においては、チャック面の突部が研磨部材に当
接し、ノッチの鋭利な角部は研磨部材に当接しないか、
当接してもその当接力が弱いため、該角部によって研磨
部材のポリッシングパッドが傷付きにくい。 【0008】 【実施例】以下、本発明の一実施例を図面に基づいて詳
細に説明するに、本発明のエッジポリッシャは、図1乃
至図3に示すように、外周の一部にノッチ5を備えた円
板形のウエハ1を保持して軸線の回りに回転させる保持
手段10と、上記ウエハ1の面取り加工された外周部1
aを鏡面研磨する研磨部材11とを有している。 【0009】上記保持手段10は、ウエハ1より小径を
なす略円形のチャック面12上に、通孔14を通じて図
示しない真空ポンプに接続された複数の吸着孔13を設
けたもので、該チャック面12上に上記ウエハ1を、真
空吸着によりノッチ部分を除く外周部1aがチャック面
12からはみ出た状態に保持するように構成されてい
る。 【0010】上記チャック面12には、ウエハ1のノッ
チ5と対応する位置に、該ノッチ5の鋭利な角部5aが
研磨部材11に圧接するのを防止するための突部12a
が形成されている。該突部12aは、自らが研磨部材1
1に当接することにより該ノッチ5の角部5aが研磨部
材11に圧接するのを防止するもので、チャック面12
から滑らかな凸曲面を描くように突出し、先端部が少な
くともウエハ1の円周と重なる位置か又は円周よりもや
や外側に突出した位置を占めるようになっている。 【0011】一方、上記研磨部材11は、円筒形のドラ
ムの周囲にポリッシングパッドを巻き付けたもので、ウ
エハの面取りされた外周部1aにぴったりと当接するよ
う、保持手段10に対して所要の角度だけ相対的に傾斜
し、軸線の回りに駆動回転せしめられるようになってい
る。 【0012】また、上記保持手段10と該研磨部材11
とは、特に図示はしていないが、少なくとも一方が相互
に接離する方向に移動自在となっていて、適宜の負荷手
段により一定の力で相互に近接する方向に付勢されてお
り、これにより、ウエハ1が完全な円形でなくても、そ
の形状に応じて保持手段10と研磨部材11とが接離方
向に相対的に変移することにより研磨を行うことができ
ると共に、ウエハ1と研磨部材11とが常に一定の力で
当接するようになっている。 【0013】上記構成を有するエッジポリッシャでノッ
チ5付きウエハ1の外周部1aを研磨するときは、図2
に示すように、該ウエハ1を、保持手段10における突
部12a付きのチャック面12上に、ノッチ5と突部1
2aとが対応するような位置関係に保持させたあと、該
保持手段10でウエハ1を軸線の回りに回転させなが
ら、回転する研磨部材11でウエハ1の外周部1aを鏡
面研磨する。 【0014】このとき、ウエハ外周のノッチ5が形成さ
れていない部分においては、該ウエハ1の外周部1aが
研磨部材11に当接し、ノッチ形成部分においては、保
持手段のチャック面12に形成された突部12aが研磨
部材11に当接するため、ノッチ5の鋭利な角部5aは
研磨部材11に当接しないか又は当接しても弱い力で当
接することになり、このため、該角部5aによって研磨
部材11のポリッシングパッドが傷付きにくく、該ポリ
ッシングパッドを長期間にわたって使用することが可能
になる。 【0015】ウエハ1の反対側の面の面取された外周部
を研磨するときは、該ウエハ1を上下反転させて上記作
業を繰り返すようにする。なお、図示した実施例ではド
ラム形の研磨部材11を使用しているが、円板形の研磨
部材であっても良く、また、保持手段10が、2つの円
板形のチャック部材でウエハを両側から挟持してチャッ
クする方式のものであっても良いことは勿論である。 【0016】 【発明の効果】このように本発明によれば、ウエハ保持
手段におけるチャック面の一部に突部を設けるという簡
単な手段により、ウエハのノッチ部が研磨部材に圧接す
るのを防止したので、該ポリッシングパッドが傷付きに
くく、該ポリッシングパッドを長期間にわたって使用す
ることができる。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an edge polisher for mirror-polishing the outer peripheral portion of a semiconductor wafer, and more particularly, to a notch in a part of the outer peripheral portion. The present invention relates to an edge polisher for mirror-polishing the outer peripheral portion of a provided disk-shaped wafer. 2. Description of the Related Art An edge polisher for mirror-polishing a chamfered outer peripheral portion of a disk-shaped semiconductor wafer has been conventionally known, for example, as described in JP-A-64-71656. It is. Such an edge polisher is
In general, as shown in FIG. 4, the holding means 2 has a holding means 2 for holding the wafer 1 in a state in which the outer peripheral part is protruded, and a polishing member 3 which comes into contact with the outer circumferential part of the wafer 1 with a constant force. While rotating the wafer 1 around the axis, the rotating polishing member 3 mirror-polishes the wafer outer peripheral portion 1a. On the other hand, a semiconductor wafer 1 has a flat notch (orientation flat) 4 at a part of the outer periphery as shown in FIG. 5, or a recognition mark for X-ray irradiation as shown in FIG. Some have a notch 5 such as a V-shape or a U-shape. Conventionally, these wafers 1 are formed using the same edge polisher regardless of the presence or absence of the notch and the shape of the notch. I was going to polish. However, when a wafer having the notch 5 is polished, the sharp corners 5a of the notch 5 hit the polishing member 3 and easily damage the polishing pad. There was a problem that would. An object of the present invention is to provide an edge polisher in which a polishing member is hardly damaged by a notch of a wafer. [0006] In order to solve the above-mentioned problems, an edge polisher of the present invention holds a disk-shaped wafer having a notch on a part of its outer periphery and rotates it around an axis. Holding means, and a polishing member for polishing the outer periphery of the wafer, wherein the holding means has a chuck surface having a smaller diameter than the wafer capable of holding the wafer with the outer periphery protruding, and the chuck surface And a projection for preventing a corner of the notch from being pressed against the polishing member at a position corresponding to the notch of the wafer. After the notched wafer is held on the chuck surface with the projection in the holding means so that the notch and the projection correspond to each other, the wafer is rotated around the axis. While the polishing member is rotating, the outer peripheral portion of the wafer is mirror-polished. At this time, in the portion where the notch is not formed, the outer periphery of the wafer comes into contact with the polishing member, in the notch formed portion, the projection of the chuck surface contacts the polishing member, and the sharp corner of the notch is polished. Do not touch the member,
Since the contact force is weak even if the contact is made, the polishing pad of the polishing member is hardly damaged by the corner. An embodiment of the present invention will be described below in detail with reference to the drawings. As shown in FIGS. 1 to 3, an edge polisher according to the present invention Holding means 10 for holding and rotating the disc-shaped wafer 1 around an axis, and the chamfered outer peripheral portion 1 of the wafer 1
and a polishing member 11 for mirror-polishing a. The holding means 10 is provided with a plurality of suction holes 13 connected to a vacuum pump (not shown) through through holes 14 on a substantially circular chuck surface 12 having a smaller diameter than the wafer 1. The wafer 1 is held on the wafer 12 such that the outer peripheral portion 1 a excluding the notch portion is protruded from the chuck surface 12 by vacuum suction. The chuck surface 12 has a projection 12a at a position corresponding to the notch 5 of the wafer 1 for preventing the sharp corner 5a of the notch 5 from pressing against the polishing member 11.
Are formed. The protruding portion 12a is used by the polishing
1 prevents the corner 5 a of the notch 5 from pressing against the polishing member 11.
, So that the front end portion occupies at least a position overlapping the circumference of the wafer 1 or a position protruding slightly outside the circumference. On the other hand, the polishing member 11 is formed by wrapping a polishing pad around a cylindrical drum, and has a required angle with respect to the holding means 10 so that the polishing member 11 comes into close contact with the chamfered outer peripheral portion 1a of the wafer. , And can be driven to rotate about an axis. The holding means 10 and the polishing member 11
Although not particularly shown, at least one of them is movable in a direction of coming and going with each other, and is biased in a direction of approaching each other by a constant force by an appropriate load means. Accordingly, even if the wafer 1 is not perfectly circular, the polishing can be performed by relatively shifting the holding means 10 and the polishing member 11 in the contact / separation direction in accordance with the shape thereof. The member 11 is always in contact with a constant force. When the outer peripheral portion 1a of the wafer 1 with the notch 5 is polished by the edge polisher having the above-described structure, FIG.
As shown in FIG. 3, the notch 5 and the projection 1 are placed on the chuck surface 12 with the projection 12a of the holding means 10 as shown in FIG.
After the wafer 1 is held in a positional relationship corresponding to 2a, the outer peripheral portion 1a of the wafer 1 is mirror-polished by the rotating polishing member 11 while the wafer 1 is rotated around the axis by the holding means 10. At this time, the outer peripheral portion 1a of the wafer 1 abuts on the polishing member 11 in a portion where the notch 5 on the outer periphery of the wafer is not formed, and is formed on the chuck surface 12 of the holding means in the notch forming portion. Since the protruding portion 12a comes into contact with the polishing member 11, the sharp corner portion 5a of the notch 5 does not come into contact with the polishing member 11 or comes into contact with the polishing member 11 with a weak force. By 5a, the polishing pad of the polishing member 11 is hardly damaged, and the polishing pad can be used for a long time. When polishing the outer peripheral portion of the wafer 1 on the opposite side, the above operation is repeated by turning the wafer 1 upside down. In the illustrated embodiment, the drum-shaped polishing member 11 is used. However, a disc-shaped polishing member may be used, and the holding means 10 holds the wafer with two disc-shaped chuck members. Needless to say, it may be of a type in which a chuck is held while being held from both sides. As described above, according to the present invention, the notch of the wafer is prevented from pressing against the polishing member by a simple means of providing a projection on a part of the chuck surface of the wafer holding means. Therefore, the polishing pad is hardly damaged, and the polishing pad can be used for a long period of time.

【図面の簡単な説明】 【図1】本発明に係るエッジポリッシャの要部正面図で
ある。 【図2】図1の部分平面図である。 【図3】図2のウエハを除いた状態の平面図である。 【図4】従来のエッジポリッシャの要部正面図である。 【図5】ウエハの一例を示す平面図である。 【図6】ウエハの他例を示す平面図である。 【符号の説明】 1 ウエハ 1a 外周部 5 ノッチ 5a 角部 10 保持手段 11 研磨部材 12 チャック面 12a 突部
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a front view of a main part of an edge polisher according to the present invention. FIG. 2 is a partial plan view of FIG. FIG. 3 is a plan view showing a state where a wafer of FIG. 2 is removed. FIG. 4 is a front view of a main part of a conventional edge polisher. FIG. 5 is a plan view showing an example of a wafer. FIG. 6 is a plan view showing another example of the wafer. [Description of Signs] 1 Wafer 1a Outer peripheral portion 5 Notch 5a Corner 10 Holding means 11 Polishing member 12 Chuck surface 12a Projection

Claims (1)

(57)【特許請求の範囲】 【請求項1】 外周の一部にノッチを有する円板形ウエ
ハを保持して軸線の回りに回転させる保持手段と、ウエ
ハの外周部を研磨する研磨部材とを有し、 上記保持手段が、ウエハを外周部がはみ出た状態に保持
可能な該ウエハより小径のチャック面を有していて、該
チャック面におけるウエハのノッチと対応する位置に、
該ノッチの角部が研磨部材に圧接するのを防止するため
の突部を備えていることを特徴とするエッジポリッシ
ャ。
(57) Claims: (1) holding means for holding a disk-shaped wafer having a notch in a part of the outer periphery and rotating the wafer around an axis, and a polishing member for polishing the outer periphery of the wafer; The holding means has a chuck surface having a smaller diameter than the wafer capable of holding the wafer in a state in which the outer peripheral portion protrudes, and at a position corresponding to a notch of the wafer on the chuck surface,
An edge polisher comprising a projection for preventing a corner of the notch from pressing against a polishing member.
JP20478493A 1993-07-27 1993-07-27 Edge polisher Expired - Fee Related JP3436391B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20478493A JP3436391B2 (en) 1993-07-27 1993-07-27 Edge polisher

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20478493A JP3436391B2 (en) 1993-07-27 1993-07-27 Edge polisher

Publications (2)

Publication Number Publication Date
JPH0740213A JPH0740213A (en) 1995-02-10
JP3436391B2 true JP3436391B2 (en) 2003-08-11

Family

ID=16496295

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20478493A Expired - Fee Related JP3436391B2 (en) 1993-07-27 1993-07-27 Edge polisher

Country Status (1)

Country Link
JP (1) JP3436391B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021085762A1 (en) * 2019-10-29 2021-05-06 주식회사 미래컴퍼니 Grinding system

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000190191A (en) * 1998-12-25 2000-07-11 Disco Abrasive Syst Ltd Processing method for semiconductor wafer
KR20000076987A (en) 1999-03-31 2000-12-26 다구마시로오 Method and apparatus for grinding a workpiece
JP4144834B2 (en) * 2000-07-12 2008-09-03 株式会社日平トヤマ Semiconductor wafer notch grinding equipment
JP3934957B2 (en) 2002-02-21 2007-06-20 日本発条株式会社 Vehicle stabilizer and method of assembling the same
US7559825B2 (en) 2006-12-21 2009-07-14 Memc Electronic Materials, Inc. Method of polishing a semiconductor wafer
KR100938115B1 (en) * 2008-01-10 2010-01-21 주식회사 실트론 Vacuum chuck for wafer having notch
JP5519256B2 (en) * 2009-12-03 2014-06-11 株式会社荏原製作所 Method and apparatus for polishing a substrate whose back surface is ground
CN110014347B (en) * 2019-05-14 2020-05-22 浙江自贸区敏瑞企业管理有限公司 Circular glass grinding device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021085762A1 (en) * 2019-10-29 2021-05-06 주식회사 미래컴퍼니 Grinding system

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Publication number Publication date
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