JP3370174B2 - Liquid material vaporizer - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid material vaporization and supply apparatus, which is equipped with a vaporizer capable of quantitatively vaporizing a liquid material such as tetraethoxysilane (TEOS) used in semiconductor manufacturing, and is generated by the vaporizer. The present invention relates to a liquid material vaporization and supply device that supplies the vaporized gas to various use points such as a chamber of a semiconductor manufacturing apparatus.

[0002]

2. Description of the Related Art Conventionally, as this type of vaporization supply device, there is one in which the vaporization part comprises a constant temperature bath, a liquid material tank and a plate heater. That is, as shown in FIG. 9 , a liquid material tank 72 containing the liquid material LM is provided in a constant temperature bath 71 set to an appropriate temperature.
2 is appropriately heated by the plate heater 73 to raise the temperature in the liquid material tank 72 to increase the vapor pressure of the liquid material LM and vaporize it, thereby obtaining a pressure difference from the outlet side. There is one in which the flow rate of the generated vaporized gas G (hereinafter referred to as gas flow rate) is directly controlled by a gas mass flow controller (hereinafter referred to as GMFC) 74.

Further, in another conventional vaporization supply device, as a method for controlling the gas flow rate, there is a direct vaporization method using a liquid mass flow controller and a vaporizer. That is,
As shown in FIG. 10, the vaporization supply device includes a liquid mass flow controller (hereinafter, referred to as a liquid mass flow controller) that controls the flow rate of the liquid material LM.
LMFC) 81, a vaporizer 82 that vaporizes the liquid material LM whose flow rate is adjusted by the LMFC 81 to generate vaporized gas G, and a carrier gas K that is introduced into the vaporizer 82 together with the liquid material LM is controlled to a constant flow rate. And a mass flow controller for gas (hereinafter, referred to as GMFC) 83, which is used to rapidly discharge the vaporized gas G to the downstream side by the carrier gas K.

[0004]

However, in the vaporization supply device shown in the former, it is necessary to heat the entire liquid material tank 72, and since the liquid material LM is always under the influence of heat, decomposition or However, there is a problem that the composition may be changed (altered) and that the impurities are eluted from the liquid material tank 72 and mixed into the liquid material LM. Further, since the gas flow rate is directly controlled, the time from the start of gas generation until the gas flow rate stabilizes is GMFC.
There is a problem that the GMFC74 having high performance depends on the performance of 74, and thus the cost increases. Further, the pressure loss of the gas flow control valve (not shown) becomes a problem, and therefore it is necessary to use a gas flow control valve having a high CV value in order to keep the pressure loss extremely low. In addition to increasing size and cost, the type of liquid material LM and GM
It was necessary to change the CV value of the control valve depending on the pressure conditions after FC74.

Further, in the latter vaporization supply device, the high temperature part is only the vaporizer 82, and since the supply system of the liquid material LM can be configured at room temperature, the liquid material LM stored in the liquid material tank is formed. Although it is possible to avoid problems such as thermal decomposition and composition change of the gas, the gas flow rate is easily affected by stability and reproducibility depending on the performance of the LMFC 81, the performance of the vaporizer 82, or the temperature conditions. In the case of monitoring, it is necessary to separately provide a gas flow meter 84 for high temperature in the vaporization supply device and pass the carrier gas K and the vaporized gas G.

The present invention has been made in consideration of the above-mentioned matters. The liquid material to be vaporized can be thermally influenced as little as possible, and the gas flow rate can be controlled constantly and stably. The purpose is to provide a supply device.

[0007]

In order to achieve the above object, the liquid material vaporization and supply device of the present invention has a pressure accompanying the inflow of the liquid material supplied from the liquid material tank into the vaporization chamber.
Of the vaporization function and vaporization gas that vaporizes by falling and heating
Has a flow rate adjustment valve with a flow rate adjustment function to adjust the flow rate
And a gas flow meter for measuring the flow rate of vaporized gas supplied through the vaporizer are connected in series, and the gas detection flow rate detected by the gas flow meter is compared with a set value,
A comparator control means for controlling the inflow of the vaporized gas to the gas flow meter based on the comparison result, further the vaporizer and gas flow meter is equipped with a heater, respectively, to vaporize the liquid material in the vaporizing chamber The vaporized gas is configured to be supplied to various points of use through the gas flow meter.

Further, according to another aspect of the present invention, the liquid material supplied from the liquid material tank is introduced into the vaporizing chamber.
Vaporization function and vaporization gas vaporized by pressure drop and heating
Flow rate adjustment valve with a flow rate adjustment function to adjust the flow rate of the gas
A vaporizer having and a gas flow meter for measuring the flow rate of vaporized gas supplied through the vaporizer are connected in series, and a gas detection flow rate detected by the gas flow meter is compared with a set value. A comparison control means for controlling an inflow amount of vaporized gas to the gas flow meter based on a comparison result,
And wherein the vaporizer and gas flow meter is accommodated in a thermostatic bath, the liquid material is vaporized in the vaporizing chamber, and constituting the vaporized gas to be supplied to different use points through the gas flow meter Provided is a liquid material vaporization supply device.

Generally, the liquid material vaporization supply device is for supplying the vaporized gas generated in the vaporizer to various use points such as a chamber of a semiconductor manufacturing apparatus.
It is more practical to control the gas flow rate of the control target generated in the vaporizer based on the gas detection flow rate detected by the gas flow meter than the liquid flow rate of the liquid material as shown in the conventional example of FIG. This is convenient because the gas flow rate can be confirmed.
That is, since it is the purpose of the liquid material vaporization supply device to finally supply the vaporized gas to various use points, in the present invention, the gas flow meter is installed in the latter stage (secondary side) of the vaporizer, The vaporized material is supplied from the liquid material tank to the vaporizer in a liquid state, and the vaporized functional portion vaporizes the liquid material while the liquid material passes through the vaporizer, and the vaporized gas is supplied to the gas flow meter. The gas flow rate is directly supplied to the flow rate adjusting function part of the carburetor in order to control the gas flow rate from the detection signal of the gas detection flow rate detected by the gas flow meter. It becomes possible to monitor in the vaporized gas state. Moreover, although it is the same in that the gas flow rate is directly controlled, it has various problems in the configuration and has no comparison control means for controlling the inflow amount of the vaporized gas to the gas flow meter, as shown in FIG. It is obvious that the liquid material vaporization supply device is advantageous.

Further, in the liquid material vaporization and supply device of the present invention, heaters are arranged in the vaporizer and the gas flow meter respectively to supply heat individually (see FIG. 1), or alternatively, the vaporizer and gas flow meter. Since it is configured to supply heat at the same time by using one thermostatic chamber that accommodates, the amount of heat above a certain condition necessary for the stable vaporization of various liquid materials in the vaporization function part of the vaporizer. The vaporized gas can be easily obtained by supplying it to the liquid material, and the dew condensation in the gas flow meter can be prevented.

[0011]

In the vaporizer having the above structure, the vaporizing chamber has the vaporizing function and the flow rate adjusting function, and the liquid residual portion is not formed between the flow rate adjusting valve and the vaporizing chamber. Therefore, the vaporized gas generated in the vaporization chamber is promptly led out of the vaporization chamber, and high-speed response is possible. The high-speed response enables the vaporized gas to be repeatedly generated for a short time. Further, as described above, since the vaporizing chamber has the vaporizing function and the flow rate adjusting function, the device can be downsized and the cost can be reduced.

Further, since various liquid materials are sent to the vaporizer heated at room temperature, the liquid material is different from the conventional example using the liquid material tank heated by the plate heater in the constant temperature bath. Can be prevented from decomposing or changing the composition due to heat.

Further, since the vaporized gas generated by the vaporizer is supplied to various use points such as the chamber of the semiconductor manufacturing apparatus, the flow rate of the gas to be controlled generated by the vaporizer is set to the liquid flow rate of the liquid material. Rather than performing control based on the gas flow rate detected by the gas flow meter, it is more convenient to confirm the actual gas flow rate.
That is, since the purpose of the liquid material vaporization supply device is to finally supply the vaporized gas to various use points, in the present invention, the gas flow meter is installed in the latter stage (secondary side) of the vaporizer. And a configuration for feeding back the flow rate adjusting function portion of the vaporizer from the detection signal of the gas detection flow rate detected by the gas flow meter to control the gas flow rate, thereby directly monitoring the gas flow rate in the vaporized gas state. It becomes possible to do.

Further, in the liquid material vaporization and supply device of the present invention, heaters are arranged in the vaporizer and the gas flow meter respectively to supply heat individually, and one constant temperature tank for accommodating the vaporizer and the gas flow meter is provided. Since it is configured to supply heat at the same time by using it, it is easy to supply the liquid material with a heat quantity above a certain condition necessary for stable vaporization of various liquid materials in the vaporization function part of the vaporizer. It is possible to obtain vaporized gas, and therefore the pressure loss of the gas flow control valve does not become a problem, so it is necessary to use a large gas flow control valve having a high CV value in order to keep the pressure drop extremely low. In addition to the advantage of eliminating the above, dew condensation in the gas flow meter can be prevented.

[0015]

FIG. 1 shows a first embodiment of the present invention.
In the above, the liquid material vaporization supply device has a vaporization function and a flow rate adjusting function, and vaporizes the liquid material LM supplied from the liquid material tank T, and the vaporized gas supplied through the vaporizer 1. Is connected in series with the gas flow meter R for measuring the flow rate of the gas, the gas flow rate detected by the gas flow meter R is compared with a set value, and the inflow of the vaporized gas into the gas flow meter R is based on the comparison result. A comparison control circuit (comparison control means) C for controlling the amount is provided, and further, the carburetor 1 and the gas flow meter R are each provided with a cartridge heater 3a (FIG.
And a plate heater 3b, and the liquid material LM is vaporized in a vaporization chamber 21 (see FIG. 2) provided in the vaporizer 1, and the vaporized gas is passed through a gas flow meter R to a chamber of a semiconductor manufacturing apparatus. It is configured to supply to H. The symbol M indicates the cartridge heater 3 respectively.
a is a temperature controller connected to the plate heater 3b and for adjusting the temperature in the main body block 2 (see FIG. 2) of the vaporizer 1 and the gas flow meter R.

Further, FIGS. 2 to 4 show an example of the vaporizer 1, and in FIGS. 2 and 3, 2 is a rectangular parallelepiped made of a metal material having good thermal conductivity and corrosion resistance such as stainless steel. It is a body block of a shape. Although not shown in detail, the main body block 2 contains, for example, a cartridge heater 3a for heating the entire main body block 2.

The carburetor 1 will be described in detail below.
Numerals 4 and 5 are liquid material introduction passages and gas discharge passages formed in a hook shape in the main body block 2 without intersecting with each other. That is, in the liquid material introduction path 4, one opening (liquid material introduction port) 6 is formed on one side surface 7 of the main body block 2, and the other opening 8 is formed on the upper surface 9 orthogonal to the side surface 7. The liquid material LM is introduced into the vaporizing chamber 21 that operates. In the gas outlet path 5, one opening 10 is formed in the upper surface 9 and the other opening (gas outlet port) 11 is formed in the side surface 12 facing the side surface 7.
The gas G generated in the vaporization chamber 21 is led out of the main body block 2. Reference numerals 13 and 14 are joints respectively connected to the liquid material inlet 6 and the gas outlet 11.

The structure of the upper surface 9 of the main body block 2 will be described in detail with reference to FIG. 3 showing the plan structure of the main body block 2 and the enlarged vertical sectional view showing the upper structure of the main body block 2. The opening 8 in the upper surface 9 of the passage 4 opens into, for example, the central portion 15 of the upper surface 9. Around the central portion 15, a groove 16 is formed concentrically with the opening 8, and an opening 10 of the gas lead-out path 5 is opened so as to face the groove 16. The inner diameter of the liquid material introduction passage 4 is, for example, about 0.5 to 1.5 mm, the inner diameter of the gas discharge passage 5 is, for example, about 2 to 4 mm, and the groove 16 formed concentrically with the opening 8 is formed. Distance is 3 ~
It is about 6 mm. These dimensions are for liquid material inlet 6
It goes without saying that it is appropriately determined according to the amount of the liquid material LM introduced from the.

As shown in FIG. 4, an annular spacer 17 made of stainless steel having a thickness of, for example, about 20 to 80 μm is provided outside the groove 16.
The spacer 17 abuts and holds the lower peripheral portion of the diaphragm 23, which will be described later. Reference numeral 18 denotes a seal member fitted in a groove 19 provided around the outside of the spacer 17, and the lower surface of a valve block 20 described later abuts on the seal member 18.

Returning to FIG. 2 again, 20 is a valve block mounted on the upper surface 9 of the main body block 2, and is made of a material having good thermal conductivity and corrosion resistance such as stainless steel. A vaporization chamber 21 is formed between the valve block 20 and the upper surface 9. That is, the diaphragm 23 is provided in the internal space 22 of the valve block 20 such that the lower periphery of the diaphragm 23 abuts the spacer 17 and is constantly urged upward by the spring 24. 21 is constructed.

The diaphragm 23 is made of a material having good heat resistance and corrosion resistance, and as shown in FIG. 4, is contacted with or separated from the central portion 15 of the upper surface 9 of the main body block 2 below the shaft portion 25. A valve portion 26 for opening and closing the opening 8 of the liquid material introducing passage 4 is formed, a thin portion 27 is provided around the valve portion 26, and a thick portion 28 is provided around the thin portion 27. Therefore, the valve portion 26 is constantly urged upward by the spring 24, so that the valve portion 26 is
Although it is separated from 5, the valve portion 26 is configured to come into close contact with the central portion 15 and close the opening 8 when a downward pressing force acts on the shaft portion 25.

In this embodiment, the diaphragm 23 is provided with a valve for adjusting and shutting off the flow rate of the liquid material LM, and vaporization of the liquid material LM supplied into the main body block 2 through the liquid material inlet 6. It is used as a member that constitutes the chamber 21. Therefore, in order to perform the shutoff more reliably, the flat lower surface of the diaphragm 23 is coated with a fluororesin or is lined. Note that the diaphragm 23 itself may be formed of a fluororesin instead of this coating or the like.

In the diaphragm 23 having the above-mentioned structure, the shaft portion 25 is turned upside, the peripheral portion of the lower surface of the diaphragm 23 contacts the spacer 17, and the main body block 2 is placed in the vaporization chamber 21 formed on the lower surface side. Openings 8 and 1 formed in the upper surface 2b of the
It is provided so that 0 and the groove 16 are all included. That is, the openings 8, 1 of the liquid material introduction path 4 and the gas derivation path 5
0 communicates in the vaporization chamber 21. Then, this diaphragm 23 is pressed by an actuator 29 described later, and the opening degree of the opening 8 for introducing the liquid material LM into the vaporization chamber 21 is adjusted or closed,
The amount of the liquid material LM introduced into the vaporization chamber 21 is controlled.

Reference numeral 29 is an actuator for pressing the diaphragm 23 downward to distort it. In this embodiment, a plurality of piezoelectric elements are laminated in a housing 30 standing upright on the valve block 20. The piezo stack 31 is provided, and the pressing portion 32 of the piezo stack 31 is in contact with the shaft portion 25 of the diaphragm 23 to constitute a piezo actuator.

Next, the operation of the vaporizer 1 will be described with reference to FIG.
It will be explained with reference to also. As described above, the diaphragm 23 is constantly urged upward by the urging force of the spring 24, and the valve portion 26 of the diaphragm 23 is separated from the upper surface 9 of the main body block 2 with a slight gap as shown in FIG. It is in the state of having done. Therefore, the openings 8 and 9 on the upper side of the liquid material introduction path 4 and the gas derivation path 5 are open.

Then, while the cartridge heater 3a is energized to heat the main body block 2,
When a predetermined DC voltage is applied to the piezo stack 31, the diaphragm 23 is pushed downward, and its valve portion 26
4 is distorted so as to abut the central portion 15 of the upper surface 9, the opening 8 of the liquid material introducing passage 4 is closed, and the liquid is shut off. Therefore, even if the liquid material LM is supplied to the vaporizer 1 at a pressure of, for example, about 3 kg / cm ² , the liquid material LM does not flow into the vaporization chamber 21.

Next, the voltage applied to the piezo stack 31 is made slightly smaller than the applied voltage, and the diaphragm 23
When the pressing force on the liquid material is reduced, the closing of the opening 8 by the diaphragm 23 is released, and a slight gap is created between the valve portion 26 and the central portion 15, and the liquid material LM passes through this gap.
Will be introduced into the vaporization chamber 21. Then, the liquid material LM is quickly vaporized by the pressure drop accompanying the inflow into the vaporization chamber 21 and the heating by the heater 3 (for example, about 100 ° C.), and the gas G generated by the vaporization passes through the gas derivation path 5 and is introduced into the gas. It flows to the exit 11 side.

As can be understood from the above description, in the vaporizer 1, the liquid material LM is quickly vaporized by the pressure drop accompanying the inflow into the vaporization chamber 21 and the heating by the heater 3, and at the same time, the vaporization chamber Since the volume of 21 is extremely small, the gas G generated by vaporization can be quickly and efficiently derived. Since the diaphragm 23 serves both as a valve for adjusting the flow rate of the liquid material LM and as a constituent member of the vaporization chamber 21 for vaporizing the liquid material LM, a liquid residual portion is formed between the flow rate adjustment valve and the vaporization chamber. Never do
Therefore, the bubbles do not accumulate or grow, the cavitation phenomenon which has been a problem in the conventional vaporizer does not occur, and the gas G having a desired flow rate can be stably supplied.

As described above, since the vaporizing chamber 21 has the vaporizing function and the flow rate adjusting function, high-speed response becomes possible,
It is possible to repeatedly generate vaporized gas for a short time. Also,
The carburetor 1 becomes compact and the cost can be reduced.
Needless to say, the condition for obtaining the vaporized gas G most stably is when the liquid material LM is controlled and the inflow amount of the liquid material LM into the vaporization chamber 21 is controlled. Further, since the liquid material LM is sent to the vaporizer 1 heated by the cartridge heater 3a at room temperature, the liquid material LM is more liquid than the conventional example using the liquid material tank heated by the plate heater in the constant temperature bath. It is possible to prevent the material from decomposing or changing the composition due to heat.

Further, in this embodiment, as shown in FIG. 1, the gas flow meter R is installed in the latter stage (secondary side) of the vaporizer 1, and the vaporized material LM is supplied from the liquid material tank T to the vaporizer 1. Is supplied in a liquid state, and while the liquid material LM passes through the vaporizer 1, the liquid material L is fed in the vaporization chamber 21 (vaporization functional portion).
M is vaporized and the vaporized gas is sent to the gas flow meter R, and a flow rate adjusting function portion consisting of the diaphragm 23 and the actuator 29 of the vaporizer 1 is controlled by the gas flow meter R to control the gas flow rate. By providing the configuration that feeds back from the detection signal S of the detected gas detection flow rate, the gas flow rate can be directly monitored in the vaporized gas state.

Moreover, since the heater 3a and the heater 3b are respectively arranged in the vaporizer 1 and the gas flow meter R to supply heat individually, the liquid material LM is vaporized in the vaporization chamber 21 (vaporization) of the vaporizer 1. It is possible to easily supply the vaporized gas to the liquid material by supplying a quantity of heat above a certain condition required for stable vaporization in each functional part), and therefore the pressure loss of the gas flow control valve does not become a problem. Without
Therefore, to keep the pressure loss extremely low, a high CV
Gas flow meter R with the advantage of not having to use a large gas flow control valve with value
Condensation inside can be prevented.

As a result, in the present liquid material vaporization and supply device, the vaporized gas G having a constant flow rate can be stably supplied to the chamber H of the semiconductor manufacturing device after the vaporizer 1.

In this embodiment, the vaporized gas G supplied through the vaporizer 1 is vaporized by the vaporizer 1, the gas flow meter R, the pipes connecting them and the chamber H. In each of the pipes for carrying the gas G, the temperature can be controlled independently.

In FIG. 6, heat is supplied at the same time by using one thermostat 39 containing the vaporizer 1 and the gas flowmeter R, and the temperature inside the main block 2 of the vaporizer 1 and the gas flowmeter R is adjusted. 2 shows a second embodiment of the invention with a temperature controller M for In FIG. 6, the liquid material vaporization supply device has a vaporizer 1 and a gas flow meter R for measuring the flow rate of vaporized gas supplied via the vaporizer 1 connected in series,
A comparison control circuit (comparison control means) C for comparing the gas detection flow rate detected by the gas flow meter R with a set value and controlling the inflow of vaporized gas into the gas flow meter R based on the comparison result; Further, the vaporizer 1 and the gas flow meter R are housed in a constant temperature bath 39 having a plate heater 40.

Since this embodiment has the above-described structure, the vaporizer 1, the gas flow meter R and the piping system are held in the constant temperature bath 39 and heated at a constant temperature to control the gas flow rate. It is possible to directly monitor the gas flow rate in the vaporized gas state by feeding back the flow rate adjusting function portion including the diaphragm 23 and the actuator 29 from the detection signal S of the gas detection flow rate detected by the gas flow meter R.

Further, the liquid material LM is vaporized in the vaporization chamber 2 of the vaporizer 1.
It is possible to easily supply vaporized gas by supplying to the liquid material LM a quantity of heat that exceeds a certain condition required for stable vaporization in 1 (vaporization functional portion), and therefore the pressure loss of the gas flow control valve is a problem. Therefore, there is an advantage that it is not necessary to use a large gas flow rate control valve having a high CV value in order to keep the pressure loss extremely low, and dew condensation in the gas flow meter can be prevented.

FIG. 7 shows a third embodiment of the present invention in which a gas purge line 41 is arranged between the vaporizer 1 and the gas flow meter R, and the purge gas P is introduced into the latter stage of the vaporizer 1.

In each of the above-described embodiments, the comparison control circuit (comparison control means) C is shown separately from the gas flow meter R, but the comparison control circuit is built in the gas flow meter and the comparison is made. The control circuit may be connected to the actuator 29 of the carburetor 1.

Further, in each of the above embodiments, in order to prevent dew condensation in the transport system after the vaporizer 1, a tape heater or the like is wound around the gas supply line including the gas flow meter R, and the temperature is collectively adjusted. You may comprise so that it may give.

Furthermore, the present invention is not limited to the above-described embodiments, but can be modified in various ways. That is, the vaporization chamber 2 may be formed in the main body block 2. The heater 3a may be a plate heater as long as it can heat the main body block 2, particularly in the vicinity of the vaporization chamber 21. Further, the liquid material introduction path 4 and the gas derivation path 5 do not have to be formed in a hook shape and may be straight. Further, as the actuator 29, an electromagnetic type or a thermal type may be used.

The liquid material LM is not limited to a liquid state at normal temperature and normal pressure, but may be a liquid at normal temperature by appropriately pressurizing even a gas at normal temperature and normal pressure. May be. Further, the liquid material vaporization supply device of the present invention is particularly effective when supplying vaporized gas such as tetraethoxysilane used in the low pressure CVD method.

Further, the liquid material supply line 3 to the vaporizer 1
A heater 38 (see FIG. 1 and FIG. 6) may be wound around 3 to preheat the liquid material LM to give the liquid material LM the thermal energy necessary for vaporization in advance. With this configuration, vaporization in the vaporizer 1 can be performed more efficiently, and a larger flow rate of gas can be easily obtained.

Further, as shown in FIG. 8, a plurality of gas discharge paths 5 (two in the illustrated example) between the vaporization chamber 21 and the gas discharge port 11 may be provided. In this case, the pressure loss on the gas outlet 11 side is reduced and the pressure in the vaporization chamber 21 is lowered, so the vaporization efficiency is improved, and the liquid material LM is correspondingly increased.
The inflow of can be increased.

[0044]

As described above, according to the vaporizer of the present invention, since the liquid material is in the liquid phase and at room temperature until it is introduced into the vaporization chamber, unlike the conventional vaporizers, the liquid due to the influence of heat is used. Problems such as material decomposition and composition change are eliminated. Further, in this vaporizer, since the internal volume of the vaporization chamber is extremely small, the response time from the start of vaporization of the liquid material until the gas flow rate becomes stable is shortened as much as possible, and therefore, the repetition of a short time is required. Can be generated. Further, in this vaporizer, since the vaporization chamber has the vaporization function and the flow rate adjusting function, the apparatus can be downsized and the cost can be reduced.

Since the vaporized gas generated in the vaporizer is supplied to various use points such as the chamber of the semiconductor manufacturing apparatus, the flow rate of the gas to be controlled generated in the vaporizer is set to the liquid flow rate of the liquid material. Rather than performing control based on the gas flow rate detected by the gas flow meter, it is more convenient to confirm the actual gas flow rate.
That is, since the purpose of the liquid material vaporization supply device is to finally supply the vaporized gas to various use points, in the present invention, the gas flow meter is installed in the latter stage (secondary side) of the vaporizer. And a configuration for feeding back the flow rate adjusting function portion of the vaporizer from the detection signal of the gas detection flow rate detected by the gas flow meter to control the gas flow rate, thereby directly monitoring the gas flow rate in the vaporized gas state. It becomes possible to do.

Further, in the liquid material vaporization and supply device of the present invention, heaters are arranged in the vaporizer and the gas flow meter respectively to supply heat individually, and one constant temperature tank for accommodating the vaporizer and the gas flow meter is provided. Since it is configured to supply heat at the same time by using it, it is easy to supply the liquid material with a heat quantity above a certain condition necessary for stable vaporization of various liquid materials in the vaporization function part of the vaporizer. It is possible to obtain vaporized gas, and therefore the pressure loss of the gas flow control valve does not become a problem, so it is necessary to use a large gas flow control valve having a high CV value in order to keep the pressure drop extremely low. In addition to the advantage of eliminating the above, dew condensation in the gas flow meter can be prevented.

[Brief description of drawings]

FIG. 1 is a structural explanatory view showing a first embodiment of the present invention.

FIG. 2 is a vertical sectional view showing a vaporizer in the above embodiment.

FIG. 3 is a diagram showing a planar configuration of a main body block of the vaporizer.

FIG. 4 is an enlarged vertical sectional view showing an upper configuration of the main body block.

FIG. 5 is an operation explanatory view of the vaporizer.

FIG. 6 is a structural explanatory view showing a second embodiment of the present invention.

FIG. 7 is a structural explanatory view showing a third embodiment of the present invention.

FIG. 8 is a diagram schematically showing another planar configuration of the main body block of the present invention.

FIG. 9 is a diagram for explaining a conventional vaporizer.

FIG. 10 is a view for explaining another conventional vaporizer.

[Explanation of symbols]

2 ... Main body block, 3a ... Cartridge heater, 3b,
40 ... Plate heater, 4 ... Liquid material introduction path, 5 ... Gas discharge path, 6 ... Liquid material introduction port, 8 ... Opening, 11 ... Gas discharge port, 21 ... Vaporization chamber, 23 ... Diaphragm, 29 ... Press drive section, 39 ... Constant temperature bath, LM ... Liquid material, G ... Vaporized gas, T ... Liquid material tank, R ... Gas flow meter, C ... Comparison control circuit (comparison control means), H ... Chamber.

─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-2-261529 (JP, A) JP-A 64-67243 (JP, A) JP-A 63-151625 (JP, A) JP-A 2- 163600 (JP, A) JP-A-6-214658 (JP, A) Actual development 1-83432 (JP, U) (58) Fields investigated (Int.Cl. ⁷ , DB name) G05D 7/06 B01J 7 / 00

Claims (2)

(57) [Claims] 1. A vaporization function for vaporizing liquid material supplied from a liquid material tank by pressure drop and heating accompanying inflow into a vaporization chamber and a flow rate controller for adjusting the flow rate of vaporized gas.
A vaporizer having a flow rate control valve having a function and a gas flow meter for measuring the flow rate of vaporized gas supplied through the vaporizer are connected in series, and a gas detection flow rate detected by the gas flow meter is connected. And a comparison control means for controlling the inflow amount of the vaporized gas to the gas flowmeter based on the comparison result, and further, the vaporizer and the gas flowmeter each have a heater, and the liquid material said vaporized in the vaporization chamber, the vaporization gas through the gas flow meter liquid material vaporizing supply apparatus characterized by being configured to supply to the various use points. 2. A vaporization function for vaporizing a liquid material supplied from a liquid material tank by pressure drop and heating accompanying inflow into a vaporization chamber and a flow rate controller for adjusting the flow rate of vaporized gas.
A vaporizer having a flow rate control valve having a function and a gas flow meter for measuring the flow rate of vaporized gas supplied through the vaporizer are connected in series, and a gas detection flow rate detected by the gas flow meter is connected. And a comparison control means for controlling the inflow amount of the vaporized gas to the gas flow meter based on the comparison result, and further, the vaporizer and the gas flow meter are housed in a constant temperature bath, and the liquid the material was vaporized in the vaporizing chamber, the liquid material vaporizer supply apparatus characterized by being configured the vaporized gas to be supplied to different use points through the gas flow meter.