JP3337100B2 - Classification method of electronic components - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for classifying electronic components, and more particularly to a method for classifying electronic components after inspection and measurement into a plurality of categories according to the inspection results.

[0002]

2. Description of the Related Art Conventionally, a method of classifying an electronic component after inspection and measurement into a plurality of categories according to the inspection result, such as a non-defective product, a defective product, and a re-inspection, is provided by providing one classification shuttle. In addition to locking the electronic components sequentially delivered from the payout lane of the inspection and measurement device in the sorting shuttle, and moving the classification shuttle in accordance with the inspection result output from the inspection and measurement device in synchronization with the removal of the electronic components. However, the locked electronic components are carried out to the unloader that collects the electronic components of each category, thereby performing the classification.

[0003]

Therefore, in such a conventional method of classifying electronic components, it is necessary to provide a classifying method and an unloader for each inspection and measurement device, which increases the size of the equipment and In addition, when the inspection and measurement equipment is used as a classification mechanism including one classification shuttle, the supply speed of the electronic components supplied from each of the inspection and measurement equipment is increased. However, even if the processing speed of the inspection and measurement device is high, the processing speed of the entire system using such a classification method cannot be improved. An object of the present invention is to solve such a problem, and it is an object of the present invention to provide an electronic component classification method capable of quickly classifying two electronic components after inspection and measurement into a common unloader. I have.

[0004]

In order to achieve the above object, an electronic component sorting method according to the present invention has a sorting stopper for dropping or sliding an electronic component and locking the electronic component. A classifying means comprising two classifying shuttles for classifying electronic components after inspection and measurement into categories according to the inspection results, and a centralized stopper for dropping or sliding the electronic components and locking the electronic components; And a collecting means for collecting the electronic components classified into a specific category by the classifying means into one storage lane, wherein the collecting means is located at a position where one of the collecting shuttles is always connected to the storage lane. At the same time, and put the centralizing stopper of the centralized shuttle stopped at a position that is continuous with the storage lane in the unlocked state. Aggregation stopper Le a locked state, the classification means is a predetermined electronic component receiving position, the two electronic components after inspection measurements in each category shuttle 1
One by one, they are temporarily locked by the classification stopper, and when each electronic component is of a specific category, each classification shuttle moves to a position that is continuous with the centralized shuttle, and the locking by each classification stopper is stopped. By canceling, one electronic component is directly carried out to the storage lane via one consolidation shuttle, and at the same time, the other electronic component is conveyed to the other consolidation shuttle. By moving to the continuous position and releasing the lock by the collective stopper of the other collective shuttle, the other electronic component is carried out to the storage lane, and at the same time, the classification means moves to the electronic component receiving position. hand,
Next, electronic components to be classified are received. Further, if any one of the received electronic components belongs to a category other than the specific category, the classification unit classifies the one electronic component into another category, and then classifies the other electronic component into another category. The classification shuttle that locks the electronic components moves to a position that is contiguous with the central shuttle that is stopped at a position that is continuous with the storage lane, releases the lock by the central stopper of the central shuttle, and stores the other electronic component in the storage lane. It is intended to be carried out.

[0005]

Therefore, when each electronic component locked to each classification shuttle is of a specific category to be classified into the storage lane, the classification means moves, and each electronic component moves to the respective aggregation means. Are conveyed to the storage lane via the consolidation shuttle, and the other is locked on the consolidation shuttle, and then the consolidation means moves and is conveyed to the storage lane. Also, if any one of the electronic components locked to each classification shuttle is not in a specific category,
After the classification means moves and one electronic component is classified into another category, the classification means moves further and the other electronic component is carried out to the storage lane.

[0006]

Next, the present invention will be described with reference to the drawings. 1 and 2 are operation explanatory diagrams schematically showing the operation of an electronic component classification method according to one embodiment of the present invention. In the drawings, reference numerals 1a and 1b denote ICs after inspection measurement from individual inspection measurement devices. Lanes, 2a and 2 respectively, which are carried out
b has classification stoppers 5a and 5b, respectively, for temporarily locking the IC carried out from each inspection and measurement device, and stops at a central position continuous with the payout lanes 1a and 1b, respectively, and is carried out from the payout lanes 1a and 1b. The IC is locked by the classification stoppers 5a and 5b, and is moved integrally from the center position to the left or right to release the lock in order.
This is a classification shuttle (classification means) for classifying.

[0007] Reference numeral 4 denotes a storage lane of an unloader for collecting ICs determined to be non-defective by the inspection and measurement apparatus, and one of the storage lanes 3a and 3b integrally moves so as to stop at a position continuous with the storage lane 4, and It has convergence stoppers 6a and 6b that operate according to the movement position, respectively.
IC supplied simultaneously from the sorting shuttle 2a or 2b
Of the ICs, the IC supplied to the side that is continuous with the storage lane 4 is directly dropped into the storage lane 4, the other IC is temporarily locked by the aggregation stopper 6a or 6b, and then moved integrally to the right or left to The integrated shuttle (aggregating means), 7a, 7b, 8a, 8b, which is integrated into the storage lane 4 by unlocking the IC, is the IC after the inspection and measurement.

The classifying shuttles 2a and 2b and the consolidating shuttles 3a and 3b are each formed of an annular member having a transport path inside which the IC is dropped or slid by its own weight, and each is integrally and movably supported in a predetermined positional relationship. ing. The classification stoppers 5a and 5b and the consolidation stoppers 6a and 6b protrude into the transport paths of the respective shuttles to lock the IC.

Next, the operation of the present invention will be described with reference to FIGS. The payout lanes 1a and 1b and the storage lane 4 are fixed, and only the ICs in the non-defective category are classified into the storage lane 4. First, FIG.
As shown in (a), since the sorting shuttles 2a and 2b receive ICs from the payout lanes 1a and 1b, both shuttles 2a and 2b respectively receive payout lanes 1a and 1b.
The ICs 7a and 7b, which have been moved to the center position (electronic component receiving position) that is continuous with the b and are inspected and measured by each measurement and inspection device (not shown), are simultaneously carried out from the payout lanes 1a and 1b, and are sorted by the sorting shuttle. It falls into 2a, 2b by its own weight.

In this case, as means for simultaneously supplying the ICs 7a and 7b to the sorting shuttles 2a and 2b, the ICs 7a and 7b after the measurement and inspection are temporarily locked from the payout lanes 1a and 1b to the measurement and inspection device side. Means may be provided, and the operation of each measurement and inspection device may be synchronized,
The ICs 7a and 7b after the inspection and measurement may be simultaneously carried out. The sorting stoppers 5a and 5b provided on the sorting shuttles 2a and 2b are in a state of locking the ICs 7a and 7b prior to receiving the ICs 7a and 7b, and the ICs 7a and 7b falling inside the sorting shuttles 2a and 2b are not used. They are locked by the classification stoppers 5a and 5b, respectively.

Here, the ICs 7a, 7
If the inspection results for b indicate that they are good products, the classification shuttles 2a and 2b are moved from the central position to positions continuous with the collection shuttles 3a and 3b, respectively, as shown in FIG. Then, the classification stoppers 5a, 5
The lock by b is released, and the ICs 7a and 7b fall into the central shuttles 3a and 3b. In this case, aggregate shuttle 3
a and 3b are classified shuttles 2 and 3 because the central shuttle 3b has moved to a position that is continuous with respect to the storage lane 4.
a and 2b move leftward from the center position.

The collective stoppers 6a and 6b operate in accordance with the movement positions of the collective shuttles 3a and 3b. In this case, the collective stopper 6b on the side continuous with the storage lane 4 is unlocked. , And the other integrated stopper 6a is in the locked state. As a result, of the ICs 7a and 7b dropped from the sorting shuttles 2a and 2b,
7a is locked by the collecting stopper 6a of the collecting shuttle 3a, and the IC 7b passes through the collecting shuttle 3b as it is and is collected on the storage lane 4.

Subsequently, as shown in FIG. 2A, the collecting shuttles 3a and 3b move rightward to carry out the IC 7a locked in the collecting shuttle 3a to the storage lane 4, It stops at the position where the collecting shuttle 3a and the storage lane 4 are continuous. Thereby, the consolidation stoppers 6a, 6
b is in a state opposite to that of FIG.
Is locked, the stopper 6a is unlocked, and the IC 7a locked by the stopper 6a is locked.
Are collected in the storage shuttle 4.

At the same time, the sorting shuttles 2a, 2b
Moves from the left side position to the center position that is continuous with the payout lanes 1a and 1b, and receives the ICs 8a and 8b to be classified next, and classifies according to the inspection result corresponding to each of the ICs 8a and 8b as described above. When the stoppers 5a and 5b operate and both ICs 8a and 8b are non-defective,
It is locked in the sorting shuttle by the sorting stoppers 5a and 5b.

Subsequently, as shown in FIG. 2 (b), the sorting shuttle 2a, 2b is moved to a position continuous with the collecting shuttles 3a, 3b, in this case, to a position on the right side.
a, 5b is released, the ICs 8a, 8b fall into the collecting shuttles 3a, 3b, and the collecting stopper 6a is in the unlocked state.
The IC 8b passes through the collecting shuttle 3a and is collected directly on the storage lane 4, while the collecting stopper 6b is in a locked state. Therefore, the IC 8b is locked in the collecting shuttle 3b by the collecting stopper 6b.

Thereafter, the consolidation shuttles 3a and 3b carry out the IC 8b in the consolidation shuttle 3b to the storage lane 4, so that the consolidation shuttle 3b and the storage lane 4 are connected to each other, that is, as shown in FIG. As shown in the drawing, the integrated stopper 6a is locked and the integrated stopper 6b is unlocked in response to this movement, and the ICs 8b are collected in the storage lane 4. At the same time, the classifying shuttles 2a, 2b move out of the payout lanes 1a, 1a from the left position.
The IC moves to the center position following 1b and receives the next IC to be classified. Thereafter, the classification and the aggregation are repeatedly performed in the order described above.

As described above, one of the aggregation shuttles 3a and 3b is always stopped at a position continuous with the accommodation lane 4, and the ICs 7a and 7b after the inspection and measurement are simultaneously received by the classification shuttles 2a and 2b. , IC7
If a and 7b are non-defective, the consolidation shuttles 3a and 3b
b, the ICs 7a, 7b are transferred, one of the ICs is directly carried out to the storage lane 4 via the consolidation shuttle, and the other IC is temporarily locked by the consolidation shuttle, and then the consolidation shuttles 3a, 3b And the locked IC is carried out to the storage lane 4, so that the ICs carried out from the two inspection and measurement devices can be integrated into a common unloader, thereby increasing the size of the equipment. And can be realized at relatively low cost.

In addition, the classification shuttles 2a, 2
b and the consolidation shuttles 3a, 3b are provided, and the ICs 7a, 3b from the classification shuttles 2a, 2b to the consolidation shuttles 3a, 3b are provided.
7b and carrying out to the storage lane 4 at the same time, carrying out the ICs 7a and 7b locked to the collecting shuttles 3a and 3b to the storage lane 4, and transferring the ICs 8a and 8b by the classification shuttles 2a and 2b. Receiving can be performed at the same time, and the classification speed of ICs is improved as compared with the case where a single classification shuttle is used to classify ICs carried out from two inspection and measurement devices. In addition, the processing speed of the entire classification system can be further increased.

FIG. 3 is an operation explanatory view schematically showing an operation in the case of classifying into storage lanes of another category.
In this figure, the same parts as those in FIGS. In FIG. 3A, reference numeral 9 denotes a storage lane for classifying ICs in a category different from the storage lane 4 for classifying non-defective ICs, for example, a defective product, a retest, and the like. In (a), the inspection and measurement results are locked to the classification shuttles 2a and 2b.
If one of the C7a and 7b, for example, indicates that the IC 7b is not a non-defective product and belongs to a category other than the category to be transported to the storage lane 4, first, the non-defective IC 7b is transported first. Then, the classification shuttle 2b that locks the IC 7b moves to a position that is continuous with the storage lane 9 of the category corresponding to the inspection measurement result, releases the lock by the classification stopper 5b, and moves the IC 7b to the storage lane 9 of that category. To be carried out.

Next, as shown in FIG. 3B, in order to carry out the remaining non-defective ICs 7a to the storage lane 4, the classification shuttle 2a holding the ICs 7a is moved to a position continuous with the storage lane 4. The IC 7a is released to the storage lane 4 by releasing the lock by the classification stopper 5a. If both ICs 7a and 7b are not good products, the classification shuttles 2a and 2b are sequentially moved to positions continuous with the storage lane 9 of the category corresponding to the inspection measurement result, and are locked by the classification stoppers 5a and 5b. Release the IC
7a and 7b are carried out to the storage lane 9 of the category.

As described above, when one of the ICs 7a and 7b received by the classification shuttles 2a and 2b is not a good product, the IC is first classified into a storage lane of a corresponding category, and then the good product IC is sorted. Since it is carried out to the storage lane 4, the ICs other than the non-defective ones can be sorted and sorted.
2b, the time for holding the lock is shortened.
a good IC even when malfunctions such as a and 5b occur.
Compared with the case of first classifying, it is possible to reduce the possibility that ICs of other categories are mixed into the storage lanes 4 of non-defective ICs, and to realize a more reliable classification method. Becomes

[0022]

As described above, according to the present invention, each of the electronic components locked to each of the classifying shuttles is provided with the classifying means including the two classifying shuttles and the grouping means including the two grouping shuttles. In the case where is a category to be classified as a storage lane, the classification means is moved and each electronic component is carried out to the respective collection shuttle of the collection means, and one of them is directly stored in the storage lane via the collection shuttle. And the other is locked to the shuttle, and then the collecting means is moved to the storage lane.
The electronic components carried out from one inspection and measurement device can be integrated into a common unloader, which can be realized at a relatively low cost without increasing the size of the equipment. As a result, the classification speed is improved as compared with the case where the electronic components carried out from the two inspection and measurement devices are classified, and the processing speed of the electronic component inspection and classification system as a whole can be further increased. Becomes

If any one of the electronic components locked to each of the sorting shuttles belongs to a category other than the category to be sorted into the storage lane, the sorting means is moved and one of the electronic components is shifted to the other. After the electronic components are classified into another category, the classification means is further moved to carry out the other electronic component to the storage lane. Even if the time during which the product is locked to the sorting shuttle becomes shorter and a malfunction such as a sorting stopper occurs, compared to the case where good products are sorted first, electronic components of other categories are stored in the storage lanes of good products. The possibility of mixing can be reduced, and a more reliable classification method can be realized.

[Brief description of the drawings]

FIG. 1 is an operation explanatory diagram schematically showing an operation of a potential component classification method according to an embodiment of the present invention.

FIG. 2 is an operation explanatory diagram schematically showing an operation of a potential component classification method according to an embodiment of the present invention.

FIG. 3 is an operation explanatory view schematically showing an operation of a potential component classification method according to an embodiment of the present invention.

[Explanation of symbols]

1a, 1b: payout lane, 2a, 2b: classification shuttle (classification means), 3a, 3b: aggregation shuttle (aggregation means), 4: storage lane, 5a, 5b: classification stopper, 6
a, 6b: Combination stopper, 7a, 7b, 8a, 8b ... I
C, 9 ... storage lane.

Claims (2)

(57) [Claims] An electronic component classification method for classifying electronic components after inspection and measurement into a plurality of categories in accordance with the inspection results, wherein the electronic component is dropped or slid, and a classification for locking the electronic component. Classification means for classifying electronic components after inspection and measurement into categories according to the inspection results, comprising: a classification shuttle having two stoppers; and an aggregation for dropping or sliding the electronic components and locking the electronic components. A consolidating means comprising two consolidating shuttles each having a stopper, and consolidating electronic components classified into a specific category by the classifying means into one storage lane; And stop the central stopper of the central shuttle stopped at the position continuous with the storage lane. And the sorting stopper of the other collecting shuttle is locked, and the sorting means receives two electronic components after the inspection and measurement one by one at each of the sorting shuttles at a predetermined electronic component receiving position, and the sorting shuttle receives the two electronic components. Once locked, when each of the electronic components is of the specific category, each classification shuttle is moved to a position continuous with the centralized shuttle, respectively, by releasing the lock by each classification stopper, One electronic component is directly carried out to the storage lane via one consolidation shuttle, and at the same time, the other electronic component is conveyed to the other consolidation shuttle. The consolidation means is provided at a position where the other consolidation shuttle is continuous with the storage lane. To release the other electronic component to the storage lane by releasing the locking by the collective stopper of the other collective shuttle. At the same time, the classification means, said electronic component receiving moved to the position, the classification method of the electronic component, characterized in that it has to receive an electronic component to be next classification. 2. The classifying method according to claim 1, wherein the classifying unit is configured to, if one of the received electronic components belongs to a category other than the specific category, select the one of the electronic components. After the electronic components are classified into the other category, the classification shuttle that locks the other electronic component moves to a position that is continuous with the central shuttle that is stopped at a position that is continuous with the storage lane, and A method for classifying electronic components, wherein the locking by the central stopper is released and the other electronic component is carried out to a storage lane.