JP3330925B2 - Copper foil for laser drilling - Google Patents
Copper foil for laser drillingInfo
- Publication number
- JP3330925B2 JP3330925B2 JP2000103505A JP2000103505A JP3330925B2 JP 3330925 B2 JP3330925 B2 JP 3330925B2 JP 2000103505 A JP2000103505 A JP 2000103505A JP 2000103505 A JP2000103505 A JP 2000103505A JP 3330925 B2 JP3330925 B2 JP 3330925B2
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- plating
- laser
- copper
- treatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/384—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
- C25D7/0614—Strips or foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
- H05K3/0038—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material combined with laser drilling through a metal layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0307—Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
- H05K2203/0703—Plating
- H05K2203/0723—Electroplating, e.g. finish plating
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Physics & Mathematics (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electroplating Methods And Accessories (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Laser Beam Processing (AREA)
- Laminated Bodies (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、プリント回路基板
の層間接続孔を効率良く形成できるレーザー穴開け性に
優れた銅箔に関する。なお、本発明の銅箔は、銅箔それ
自体のみならず、銅張り積層板あるいは積層板に直接銅
を形成したもの(めっきしたものを含む)の全てを含む
ものとする。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a copper foil excellent in laser drilling property which can efficiently form interlayer connection holes in a printed circuit board. In addition, the copper foil of the present invention includes not only the copper foil itself but also a copper-clad laminate or a product in which copper is directly formed on a laminate (including a plated product).
【0002】[0002]
【従来の技術】近年、銅箔を導電体として用いた電子部
品及び配線基板の製造において、配線の高密度化に伴
い、従来の機械式ドリルに比較して、より微細な加工が
可能であるレーザーによる穴開けが用いられるようにな
ってきた。しかしながら、汎用性の高い炭酸ガスレーザ
ーを照射して銅箔表面に穴開け加工をしようとした場
合、炭酸ガスレーザーの波長である10μm近傍での銅
の反射率が100%近くなり、レーザー加工効率が極め
て悪いと言う問題点がある。この加工率の低下を補うた
めに、高出力の炭酸ガスレーザー加工装置が必要となる
が、このような高出力の炭酸ガスレーザーを用いて、高
エネルギーでレーザー加工した場合、銅箔と同時に穴開
けする樹脂基板が加工され過ぎてダメージを受け、意図
した形状に穴開けができないという問題を生じた。ま
た、加工に伴う飛散物が多くなり、装置および加工物の
非加工部への汚染等の問題が生じる。2. Description of the Related Art In recent years, in the production of electronic parts and wiring boards using copper foil as a conductor, finer processing is possible as compared with a conventional mechanical drill with the increase in wiring density. Laser drilling has been used. However, when a highly versatile carbon dioxide laser is irradiated to make a hole in the copper foil surface, the reflectance of copper near the wavelength of 10 μm of the carbon dioxide laser becomes close to 100%, and the laser processing efficiency is increased. Is extremely bad. In order to compensate for this reduction in processing rate, a high-output carbon dioxide laser processing device is required.When such high-output carbon dioxide laser is used for laser processing with high energy, There is a problem that the resin substrate to be opened is damaged due to excessive processing, and it is not possible to form a hole in an intended shape. In addition, the amount of scattered matter accompanying the processing increases, and problems such as contamination of the apparatus and the non-processed part of the processed object occur.
【0003】そこで、このような問題を避けるため、銅
箔部分に予め化学エッチングで穴開けし、その後樹脂部
をレーザーで穴開けすることが行われている。しかし、
この場合は銅箔及び樹脂部を一度に穴開けする場合に比
較して工程が増え、コスト高になってしまう欠点があ
る。一方、一般にレーザー光波長での反射率の高い金属
へレーザー加工の手段として、吸収率の高い物質を表面
に設けることにより、その物質にレーザー光を吸収さ
せ、熱を発生させて加工することが行われており、ま
た、表面に凹凸を付けることにより、同様に加工効率を
あげることが可能であることも知られている。さらに、
銅箔の穴開け加工に際し吸収率を高めるため銅の酸化表
面処理(黒化処理)を施すなどの提案もなされている。Therefore, in order to avoid such a problem, a hole is formed in the copper foil portion by chemical etching in advance, and then a resin portion is formed by laser. But,
In this case, there is a disadvantage that the number of steps is increased and the cost is increased as compared with the case where the copper foil and the resin portion are punched at once. On the other hand, in general, as a means of laser processing, metal with high reflectance at the wavelength of laser light is provided with a material with high absorptance on the surface, so that the material can absorb laser light and generate heat to process it. It is also known that processing efficiency can be similarly increased by making the surface uneven. further,
Proposals have also been made, such as to perform an oxidized surface treatment of copper (blackening treatment) in order to increase the absorptivity when drilling a copper foil.
【0004】しかし、上記の提案はいずれも操作や処理
が複雑になり、その割には十分なレーザー加工効率が得
られず、また上記表面処理層を設けたものは、処理層が
脆弱で剥離等により工程中の汚染源となるなどの問題が
あった。また、銅箔自体を薄くして低エネルギーでも穴
開け可能とする提案もなされている。しかし、実際に使
用される銅箔の厚さは9〜36μmの異なった膜厚のも
のが使用されているので、銅箔を薄くできるのは一部の
材料のみである。また、同じ低エネルギーの条件で穴開
けを行うためには、銅箔を3〜5μm程度に極端に薄く
する必要があり、この場合にはハンドリング等が問題と
なる。このように、従来の銅箔を改良したいくつかの提
案は、レーザー光による穴開けに充分でなく、レーザー
加工に適する銅箔材料が得られていないのが現状であ
る。[0004] However, all of the above proposals require complicated operations and treatments, so that sufficient laser processing efficiency cannot be obtained, and those provided with the above-mentioned surface treatment layer have a weak treatment layer and are thus peeled. For example, there is a problem that it becomes a contamination source during the process. Further, a proposal has been made in which the copper foil itself is thinned so that a hole can be formed even with low energy. However, since the thickness of the copper foil actually used is different from 9 to 36 μm, only a part of the material can make the copper foil thin. Further, in order to make a hole under the same low energy condition, it is necessary to make the copper foil extremely thin to about 3 to 5 μm, and in this case, handling becomes a problem. As described above, some proposals in which conventional copper foils are improved are not sufficient for drilling holes by laser light, and at present, a copper foil material suitable for laser processing has not been obtained.
【0005】[0005]
【発明が解決しょうとする課題】本発明は上記のような
問題点に鑑みてなされたものであり、その目的とすると
ころは、プリント回路基板の製造に際し、銅箔の表面を
改善することにより、レーザーによる穴開けが極めて容
易となり、小径層間接続孔の形成に適した銅箔を提供す
ることにある。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to improve the surface of a copper foil in manufacturing a printed circuit board. Another object of the present invention is to provide a copper foil suitable for forming a small-diameter interlayer connection hole, in which drilling with a laser becomes extremely easy.
【0006】[0006]
【課題を解決するための手段】以上から、本発明は 1 レーザーを用いて穴開け加工する銅箔であって、該
銅箔の少なくともレーザー入射面に、銅を含有するC
u、Ni、Co、Sn、Zn、In及びこれらの合金の
少なくとも1種以上の金属めっきを施し、該面に0.0
1〜3μmの粒子層を形成したことを特徴とするレーザ
ー穴開け用銅箔 2 上記金属めっきにより粒子層を形成した面に、さら
に表面形状を変化させずにかぶせ皮膜を形成したことを
特徴とする上記1記載のレーザー穴開け用銅箔、を提供
する。From the above SUMMARY OF THE INVENTION The present invention provides a copper foil for drilled hole machining using 1 laser, at least on the laser incident surface of the copper foil, containing copper C
u, Ni, Co, Sn, Zn, In and alloys thereof, and at least one or more metal platings.
Copper foil for laser drilling characterized by forming a particle layer of 1 to 3 μm 2 On the surface on which the particle layer is formed by the metal plating, a covering film is formed without further changing the surface shape. 2. The copper foil for laser drilling according to 1 above, wherein
【0007】[0007]
【発明の実施の形態】本発明は、表面めっき処理により
形成される表面形態に着目し、検討を進めた結果、表面
にめっきにより0.01〜3μmの粒子層を形成した場
合に、良好な穴開け特性が得られることを見出した。こ
の微細な0.01〜3μmの粒子層によって形成される
銅箔の粗化処理面はレーザー光を乱反射させ、光の吸収
と同様の効果を上げることができ、炭酸ガスレーザーに
よる低エネルギーでも充分な穴開け性を確保することが
可能となった。この時、銅を含有させて使用するめっき
金属としては、それ自体がレーザー光を吸収し、レーザ
ー穴開けに効果があると確認されているNi、Co、S
n、ZnIn及びこれらの合金を使用できる。しかし、
これらに限定する必要はなく、他の金属も使用できる。
本発明のように、銅箔のレーザー光入射面に銅を含有さ
せた金属めっきを施し、0.01〜3μmの粒子を形成
することにより、さらに高いレーザー加工性を得ること
が可能となった。BEST MODE FOR CARRYING OUT THE INVENTION The present invention focuses on the surface morphology formed by surface plating, and as a result of study, it has been found that when a particle layer of 0.01 to 3 μm is formed on the surface by plating, a favorable It has been found that perforation characteristics can be obtained. The roughened surface of the copper foil formed by this fine particle layer of 0.01 to 3 μm irregularly reflects laser light, and can achieve the same effect as light absorption. It has become possible to ensure a proper drilling property. At this time, as the plating metal containing copper, Ni, Co, S, which has been confirmed to absorb laser light by itself and to be effective for laser drilling, have been confirmed.
n, ZnIn and alloys thereof can be used. But,
It is not necessary to limit to these, and other metals can be used.
By applying metal plating containing copper to the laser light incident surface of the copper foil as in the present invention and forming particles of 0.01 to 3 μm, it has become possible to obtain even higher laser workability. .
【0008】なお、銅を含有しない上記Ni、Co、S
n、ZnIn及びこれらの合金を使用して0.01〜3
μmの粒子層を形成し、レーザー穴開け性を向上させる
ことも考えられる。確かにこのようなめっきによる粒子
層を形成することによりレーザー穴開け性は向上した。
しかしながら、このようなめっき処理層の剥離や脱落が
起こり、場合によっては、こすれ等により簡単に剥離す
る現象が見られた。例えば、銅箔上にCo単体の凹凸メ
ッキを施した場合、十分な穴開け性が確認されたが、そ
のめっき処理層は脆く、こすれにより粒子の脱離が起き
た。この脱落や剥離現象の問題を改善しようとして、め
っきの付着量を低減し、突起を低下させたところ、今度
は穴開け性が不十分となった。したがって、上記の金属
層を形成するだけでは、レーザー穴開け性等を向上させ
ることができても、実際には、適当な処理層とは言えず
問題があった。このようなことから、さらに銅箔にめっ
きする金属層を種々を検討した結果、上記粒子層を形成
する電気めっき組成物に銅を含有させることにより、め
っきの付着力が増し、処理層の剥離や脱落を効果的に防
止できることが分かった。The above-mentioned Ni, Co, S containing no copper
0.01 to 3 using n, ZnIn and their alloys.
It is also conceivable to form a particle layer of μm to improve the laser drilling property. Certainly, by forming the particle layer by such plating, the laser drilling property was improved.
However, such a peeling or dropping of the plating layer occurred, and in some cases, a phenomenon of easy peeling due to rubbing or the like was observed. For example, when unevenness plating of Co alone was performed on copper foil, sufficient hole-piercing properties were confirmed, but the plating treatment layer was brittle, and particles were detached by rubbing. In an attempt to improve the problem of the drop-out and peeling phenomena, the amount of plating was reduced and the protrusions were reduced. Therefore, even if the above-described metal layer is formed alone, the laser drilling property and the like can be improved, but it cannot be said that it is actually an appropriate treatment layer, and there is a problem. In view of the above, as a result of further studying various metal layers to be plated on copper foil, by adding copper to the electroplating composition forming the particle layer, the adhesion of plating is increased, and the treatment layer is peeled off. And that it can be effectively prevented from falling off.
【0009】更に、上記剥離や脱落を防止するために、
粗化処理面の上に1種以上の金属のかぶせめっきを施す
こともさらに有効である。このかぶせめっきは通常のめ
っき条件(正常めっき)でよく、前記粗化面処理で形成
した0.01〜3μmの粒子層を損なうことなくめっき
する。すなわち、レーザー光による穴開け性を低下させ
ないように、0.01〜3μmの粒子層がこの範囲で、
実質的に存在することが必要である。このかぶせ皮膜形
成のめっきには、上記粒子層を形成する粗化めっきと共
通のめっきでも良いし、異なるめっきでも良い。好まし
くは、上記粒子層を形成する粗化めっきと同様に、N
i、Co、Sn、Zn、In及びこれらの合金がよく、
更にレーザー穴開け性が改善できる。このように、粗化
処理の上にかぶせメッキを施すことにより、剥離や脱落
がなく且つ十分なレーザー穴開け性を確保できる。Further, in order to prevent the above-mentioned peeling or falling off,
It is more effective to cover the roughened surface with one or more metals. The overplating may be performed under normal plating conditions (normal plating), and plating is performed without damaging the particle layer of 0.01 to 3 μm formed by the roughened surface treatment. That is, a particle layer of 0.01 to 3 μm is in this range so as not to lower the perforation by laser light,
It needs to be substantially present. The plating for forming the cover film may be the same plating as the rough plating for forming the particle layer, or may be a different plating. Preferably, as in the rough plating for forming the particle layer, N
i, Co, Sn, Zn, In and alloys thereof are good;
Further, the laser drilling property can be improved. In this manner, by performing the overplating on the roughening treatment, it is possible to ensure sufficient laser drilling without peeling or falling off.
【0010】本発明に使用する銅箔は、電解銅箔又は圧
延銅箔のいずれにも適用できる。また、銅箔の厚みは高
密度配線として使用するために、18μm以下であるこ
とが望ましい。しかし、本発明のレーザー穴開け性を向
上させた銅箔は、この厚さに制限されるわけではなく、
これ以上の厚さにも当然適用できるものである。これら
のめっき等により形成される粒子層(粗化処理)は、銅
箔のレーザー光照射面へ部分的に又は銅箔全面に施すこ
とができる。これらのめっき処理等は、回路基板に適用
される銅箔としての特性を損なわないことが要求される
のは当然であり、本発明の処理はこれらの条件を十分に
満たしている。[0010] The copper foil used in the present invention can be applied to either an electrolytic copper foil or a rolled copper foil. Further, the thickness of the copper foil is desirably 18 μm or less for use as a high-density wiring. However, the copper foil with improved laser drilling properties of the present invention is not limited to this thickness,
Naturally, it can be applied to a thickness larger than this. The particle layer (roughening treatment) formed by plating or the like can be partially applied to the laser beam irradiation surface of the copper foil or the entire copper foil. It is natural that these plating treatments and the like are required not to impair the properties of the copper foil applied to the circuit board, and the treatment of the present invention sufficiently satisfies these conditions.
【0011】上記のめっき処理後、クロム及び又は亜鉛
を含有する防錆処理を施すことができる。この防錆処理
の手法または処理液は特に制限されるものではない。こ
の防錆処理は、前記めっき処理の面上に、すなわち銅箔
のレーザー光照射面へ部分的に又は銅箔全面に施すこと
ができる。上記と同様に、この防錆処理は回路基板に適
用される銅箔としての特性を損なわないことが要求され
るのは当然であり、本発明の防錆処理はこれらの条件を
十分に満たしている。なお、この防錆処理はレーザー穴
開け性には殆ど影響しない。After the above plating treatment, a rust-preventive treatment containing chromium and / or zinc can be performed. The technique or treatment solution for this rust prevention treatment is not particularly limited. This rust prevention treatment can be performed on the surface of the plating treatment, that is, partially on the laser beam irradiation surface of the copper foil or on the entire copper foil. As described above, it is natural that this rust prevention treatment is not required to impair the properties as copper foil applied to the circuit board, and the rust prevention treatment of the present invention sufficiently satisfies these conditions. I have. In addition, this rust prevention treatment hardly affects the laser drillability.
【0012】本発明の金属めっきとして、例えばCu、
Ni、Co、Sn、Zn、In及びこれらの合金のめっ
き層を形成するには、次のようなめっき処理が適用でき
る。以下はその代表例である。この範囲内で適宜条件設
定を行うことにより、粗化処理及びかぶせめっきができ
る。なお、このめっき処理は好適な一例を示すのみであ
り、本発明はこれらの例に制限されない。As the metal plating of the present invention, for example, Cu,
In order to form a plating layer of Ni, Co, Sn, Zn, In, and an alloy thereof, the following plating treatment can be applied. The following is a typical example. By appropriately setting the conditions within this range, the roughening treatment and the cover plating can be performed. It should be noted that this plating process shows only a preferred example, and the present invention is not limited to these examples.
【0013】 (銅めっき処理) Cu濃度:1〜30g/L 電解液温度:20〜60°C、 pH:1.0〜4.0 電流密度:5〜60A/dm2、 めっき時間:0.5〜4秒 (ニッケルめっき処理) Ni濃度:1〜30g/L 電解液温度:25〜60°C、 pH:1.0〜4.0 電流密度:0.5〜5A/dm2、 めっき時間:0.5〜4秒 (コバルトめっき処理) Co濃度:1〜30g/L 電解液温度:25〜60°C、 pH:1.0〜4.0 電流密度:0.5〜5A/dm2、 めっき時間:0.5〜4秒 (錫めっき処理) Sn濃度:5〜100g/L 硫酸:40〜150g/L 電解液温度:25〜40°C、 pH:1.0〜4.0 電流密度:1.0〜5A/dm2、 めっき時間:0.5〜4秒 (インジウムめっき処理) In濃度:10〜50g/L 硫酸:10〜50g/L 電解液温度:20〜40°C、 pH:1.0〜4.0 電流密度:1.0〜20A/dm2、 めっき時間:0.5〜4秒 (亜鉛−コバルトめっき処理) Zn濃度:1〜20g/L、 Co濃度:1〜30g/L 電解液温度:25〜50°C、 pH:1.5〜4.0 電流密度:0.5〜5A/dm2、 めっき時間:1〜3秒 (銅−ニッケルめっき処理) Cu濃度:5〜20g/L、 Ni濃度:5〜20g/L 電解液温度:25〜50°C、 pH:1.0〜4.0 電流密度:10〜45A/dm2、 めっき時間:1〜3秒 (銅−コバルトめっき処理) Cu濃度:5〜20g/L、 Co濃度:5〜20g/L 電解液温度:25〜50°C、 pH:1.0〜4.0 電流密度:10〜45A/dm2、 めっき時間:1〜3秒 (亜鉛−ニッケルめっき処理) 亜鉛濃度:1〜10g/L、 Ni濃度:10〜30g/L 電解液温度:40〜50°C、 pH :3.0〜4.0 電流密度:0.5〜5A/dm2、 めっき時間:1〜3秒 (コバルト−ニッケルめっき処理) Co濃度:5〜20g/L、 Ni濃度:5〜20g/L 電解液温度:20〜50°C、 pH:1.0〜4.0 電流密度:0.5〜10A/dm2、 めっき時間:1〜180秒 (銅−コバルト−ニッケルめっき処理) Co濃度:1〜15g/L、 Ni濃度:1〜15g/L Cu濃度:5〜25g/L 電解液温度:20〜50°C、 pH:1.0〜4.0 電流密度:1.0〜30A/dm2、 めっき時間:1〜180秒(Copper plating treatment) Cu concentration: 1 to 30 g / L Electrolyte temperature: 20 to 60 ° C, pH: 1.0 to 4.0 Current density: 5 to 60 A / dm 2 , Plating time: 0.1 5 to 4 seconds (nickel plating treatment) Ni concentration: 1 to 30 g / L Electrolyte temperature: 25 to 60 ° C, pH: 1.0 to 4.0 Current density: 0.5 to 5 A / dm 2 , plating time : 0.5 to 4 seconds (cobalt plating treatment) Co concentration: 1 to 30 g / L Electrolyte temperature: 25 to 60 ° C, pH: 1.0 to 4.0 Current density: 0.5 to 5 A / dm 2 Plating time: 0.5 to 4 seconds (tin plating treatment) Sn concentration: 5 to 100 g / L Sulfuric acid: 40 to 150 g / L Electrolyte temperature: 25 to 40 ° C, pH: 1.0 to 4.0 Current density: 1.0~5A / dm 2, plating time: 0.5-4 seconds (indium plated In concentration: 10 to 50 g / L sulfuric acid: 10 to 50 g / L electrolyte solution temperature: 20~40 ° C, pH: 1.0~4.0 current density: 1.0~20A / dm 2, plating time: 0 0.5 to 4 seconds (zinc-cobalt plating treatment) Zn concentration: 1 to 20 g / L, Co concentration: 1 to 30 g / L Electrolyte temperature: 25 to 50 ° C, pH: 1.5 to 4.0 Current density : 0.5 to 5 A / dm 2 , Plating time: 1 to 3 seconds (copper-nickel plating treatment) Cu concentration: 5 to 20 g / L, Ni concentration: 5 to 20 g / L Electrolyte temperature: 25 to 50 ° C PH: 1.0 to 4.0 Current density: 10 to 45 A / dm 2 Plating time: 1 to 3 seconds (copper-cobalt plating treatment) Cu concentration: 5 to 20 g / L, Co concentration: 5 to 20 g / L Electrolyte temperature: 25 to 50 ° C, pH: 1.0 to 4.0 Current density: 10 45A / dm 2, plating time: 1-3 seconds (zinc - nickel-plated) zinc concentration: 1 to 10 g / L, Ni concentration: 10 to 30 g / L electrolyte solution temperature: 40~50 ° C, pH: 3 . 0 to 4.0 Current density: 0.5 to 5 A / dm 2 , Plating time: 1 to 3 seconds (cobalt-nickel plating treatment) Co concentration: 5 to 20 g / L, Ni concentration: 5 to 20 g / L Electrolyte Temperature: 20 to 50 ° C, pH: 1.0 to 4.0 Current density: 0.5 to 10 A / dm 2 , Plating time: 1 to 180 seconds (copper-cobalt-nickel plating treatment) Co concentration: 1 to 15 g / L, Ni concentration: 1 to 15 g / L Cu concentration: 5 to 25 g / L Electrolyte temperature: 20 to 50 ° C, pH: 1.0 to 4.0 Current density: 1.0 to 30 A / dm 2 , Plating time: 1 to 180 seconds
【0014】[0014]
【実施例】次に、実施例に基づいて説明する。なお、本
実施例は好適な一例を示すもので、本発明はこれらの実
施例に限定されるものではない。したがって、本発明の
技術思想に含まれる変形、他の実施例又は態様は、全て
本発明に含まれる。なお、本発明との対比のために、後
段に比較例を掲載した。Next, an embodiment will be described. Note that the present embodiment shows a preferred example, and the present invention is not limited to these embodiments. Therefore, all modifications, other examples or aspects included in the technical concept of the present invention are included in the present invention. For comparison with the present invention, a comparative example is described in a later stage.
【0015】(実施例1)厚さ12μmの電解銅箔の光
沢面(S面)に、上記条件で銅−コバルト−ニッケル合
金をめっきし、約0.1〜0.8μmの粒子層を形成し
たものである。図1は、この粒子層を形成した粗化面の
顕微鏡写真である。(Example 1) A copper-cobalt-nickel alloy was plated on a glossy surface (S surface) of an electrolytic copper foil having a thickness of 12 μm under the above conditions to form a particle layer of about 0.1 to 0.8 μm. It was done. FIG. 1 is a micrograph of the roughened surface on which the particle layer is formed.
【0016】(実施例2)厚さ12μmの電解銅箔の光
沢面(S面)に、上記条件で銅−コバルト−ニッケル合
金をめっきして約0.1〜0.8μmの粒子層を形成
し、さらにその上に上記めっき条件でコバルト−ニッケ
ル合金によるかぶせめっき(被覆層を形成)したもので
ある。(Example 2) A copper-cobalt-nickel alloy is plated on a glossy surface (S surface) of an electrolytic copper foil having a thickness of 12 μm under the above conditions to form a particle layer of about 0.1 to 0.8 μm. Further, a cover plating (forming a coating layer) with a cobalt-nickel alloy under the above plating conditions is further performed thereon.
【0017】(比較例1)厚さ12μmの電解銅箔をそ
のまま使用した。図2は、電解銅箔表面の顕微鏡写真で
ある。Comparative Example 1 An electrolytic copper foil having a thickness of 12 μm was used as it was. FIG. 2 is a micrograph of the surface of the electrolytic copper foil.
【0018】(比較例2)厚さ12μmの電解銅箔の光
沢面(S面)に、上記条件でコバルトをめっきして約
0.3〜1μmの粒子層を形成したものである。図3
は、この粒子層を形成した粗化面の顕微鏡写真である。Comparative Example 2 A glossy surface (S surface) of a 12 μm thick electrolytic copper foil was plated with cobalt under the above conditions to form a particle layer of about 0.3 to 1 μm. FIG.
Is a micrograph of the roughened surface on which the particle layer is formed.
【0019】以上の実施例1、2及び比較例1、2の試
料について、プリプレグ(FR−4)を用いて片面基板
とし、各100箇所に、次の条件で炭酸ガスレーザー光
を照射し、その穴開け率を比較した。その結果を表1に
示す。 (レーザー照射条件) 使用装置:炭酸ガスレーザー加工装置 スポットサイズ:144μmφ パルス幅:32μsec 周波数:400Hz、 ショット数:1ショット レーザー光照射エネルギー:(条件1:25mJ/パル
ス、条件2:32mJ/パルス)The samples of Examples 1 and 2 and Comparative Examples 1 and 2 were made into single-sided substrates using prepreg (FR-4), and 100 points were irradiated with carbon dioxide laser light under the following conditions. The piercing rates were compared. Table 1 shows the results. (Laser irradiation conditions) Apparatus used: Carbon dioxide laser processing equipment Spot size: 144 μm φ Pulse width: 32 μsec Frequency: 400 Hz, number of shots: 1 shot Laser irradiation energy: (Condition 1: 25 mJ / pulse, Condition 2: 32 mJ / pulse)
【0020】[0020]
【表1】 [Table 1]
【0021】実施例1では、条件1及び条件2のいずれ
も100%の穴開け率を示し、極めて優れた穴開け率を
示した。この場合、こすれによる粉落ち(めっき層の剥
離、脱落)が微量認められたが、特に問題となるレベル
ではなかった。これは、本発明の粒子層を形成するめっ
きにおいて、銅の含有はめっき層に剥離、脱落を防止す
る有効な手段であることが確認できた。In Example 1, both the condition 1 and the condition 2 showed a drilling rate of 100%, showing a very excellent drilling rate. In this case, a small amount of powder falling off (peeling off or falling off of the plating layer) due to rubbing was observed, but this was not a problematic level. This was confirmed that in the plating for forming the particle layer of the present invention, the content of copper is an effective means for preventing peeling and falling off of the plating layer.
【0022】実施例2では、上記実施例1と同様に、条
件1及び条件2のいずれも100%の穴開け率を示し、
極めて優れた穴開け率を示した。この場合、こすれによ
る粉落ち(めっき層の剥離、脱落)もなかった。これ
は、本発明の粒子層を形成した後に、さらにコバルト−
ニッケルのかぶせめっきしたケースであるが、このかぶ
せめっきはめっき層に剥離、脱落を防止する有効な手段
であることが確認できた。In the second embodiment, as in the first embodiment, both the condition 1 and the condition 2 show a hole punching rate of 100%.
It showed a very good drilling rate. In this case, there was no powder dropping (peeling off or falling off of the plating layer) due to rubbing. This is because after forming the particle layer of the present invention, the cobalt-
Although the case was covered with nickel, it was confirmed that this plating was an effective means for preventing peeling and falling off of the plating layer.
【0023】比較例1では、銅箔そのものを使用したケ
ースであるが、こすれによる粉落ちは認められないが、
条件1ではレーザー穴開け率が0、すなわち穴開けが事
実上できない。また、条件2でも穴開け率がわずか9%
で、極めて悪い結果となった。In Comparative Example 1, the case where the copper foil itself was used was used.
Under condition 1, the laser drilling rate is 0, that is, drilling is practically impossible. In addition, the drilling rate is only 9% even under condition 2.
The result was extremely bad.
【0024】比較例2では、条件1及び条件2のいずれ
も100%の穴開け率を示し、極めて優れた穴開け率を
示した。しかし、こすれによる粉落ち(めっき層の剥
離、脱落)が認められ、実際の使用に耐えるものではな
かった。In Comparative Example 2, both the condition 1 and the condition 2 showed a 100% drilling rate, showing an extremely excellent drilling rate. However, powder rubbing (peeling off and falling off of the plating layer) due to rubbing was observed, and the powder was not endurable for actual use.
【0025】以上から、銅箔そのものは炭酸ガスレーザ
ーによる穴開けは事実上不可能でありることがわかる。
本発明では、0.01〜3μmの粒子層を形成すること
により、上記実施例に示す通り、炭酸ガスレーザーによ
る穴開けが向上した。また、粉落ちの現象はこれらの粒
子を形成する際にめっき組成に銅を含有させることによ
り効果的に防止できる。またかぶせめっきをすることに
より、さらに強固に防止でき、必要に応じてこのような
手段を採用することができる。From the above, it can be seen that drilling of a copper foil itself with a carbon dioxide gas laser is practically impossible.
In the present invention, by forming a particle layer of 0.01 to 3 μm, drilling by a carbon dioxide gas laser was improved as shown in the above example. Further, the phenomenon of powder falling can be effectively prevented by adding copper to the plating composition when these particles are formed. In addition, the overcoating can be more firmly prevented, and such means can be employed if necessary.
【0026】[0026]
【発明の効果】プリント回路基板の製造に際して、炭酸
ガスレーザー等による低エネルギーレーザーで銅箔の直
接開孔及び簡便な層間接続孔の形成ができ、またこすれ
等によるめっき層の剥離や脱落を防止できるる著しい効
果を有する。According to the present invention, when manufacturing a printed circuit board, direct opening of copper foil and easy formation of interlayer connection holes can be performed with a low energy laser such as a carbon dioxide gas laser, and peeling or falling off of a plating layer due to rubbing or the like can be prevented. It has a remarkable effect.
【図1】実施例1の粒子層を形成した粗化面の顕微鏡写
真である。FIG. 1 is a micrograph of a roughened surface on which a particle layer of Example 1 is formed.
【図2】比較例1の電解銅箔表面の顕微鏡写真である。FIG. 2 is a micrograph of the surface of the electrolytic copper foil of Comparative Example 1.
【図3】比較例2の粒子層を形成した粗化面の顕微鏡写
真である。FIG. 3 is a micrograph of a roughened surface on which a particle layer of Comparative Example 2 is formed.
フロントページの続き (56)参考文献 特開 平7−231152(JP,A) 特開 平6−169169(JP,A) 特開 平6−169168(JP,A) 特開2000−190420(JP,A) 特開2000−43188(JP,A) 特開2000−228582(JP,A) 特開 平8−174263(JP,A) (58)調査した分野(Int.Cl.7,DB名) C25D 7/06 C25D 5/10 H05K 3/46 B23K 26/00 Continuation of the front page (56) References JP-A-7-231152 (JP, A) JP-A-6-169169 (JP, A) JP-A-6-169168 (JP, A) JP-A-2000-190420 (JP, A) A) JP-A-2000-43188 (JP, A) JP-A-2000-228582 (JP, A) JP-A-8-174263 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) C25D 7/06 C25D 5/10 H05K 3/46 B23K 26/00
Claims (2)
あって、該銅箔の少なくともレーザー入射面に、銅を含
有するCu、Ni、Co、Sn、Zn、In及びこれら
の合金の少なくとも1種以上の金属めっきを施し、該面
に0.01〜3μmの粒子層を形成したことを特徴とす
るレーザー穴開け用銅箔。1. A copper foil to be drilled by using a laser, wherein at least a laser incident surface of the copper foil contains Cu, Ni, Co, Sn, Zn, In, and copper containing copper.
A copper foil for laser drilling, characterized in that a metal layer of at least one kind of the alloy of ( 1) is applied and a particle layer of 0.01 to 3 μm is formed on said surface.
面に、さらに表面形状を変化させずにかぶせ皮膜を形成
したことを特徴とする請求項1記載のレーザー穴開け用
銅箔。2. The copper foil for laser drilling according to claim 1, wherein a covering film is formed on the surface on which the particle layer has been formed by the metal plating without changing the surface shape.
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000103505A JP3330925B2 (en) | 2000-04-05 | 2000-04-05 | Copper foil for laser drilling |
TW090107469A TWI238027B (en) | 2000-04-05 | 2001-03-29 | Copper foil for laser drilling |
US10/089,581 US20020182432A1 (en) | 2000-04-05 | 2001-03-30 | Laser hole drilling copper foil |
PCT/JP2001/002706 WO2001077420A1 (en) | 2000-04-05 | 2001-03-30 | Laser hole drilling copper foil |
CN01802679A CN1388841A (en) | 2000-04-05 | 2001-03-30 | Laser hole drilling copper foil |
EP01917661A EP1273682A4 (en) | 2000-04-05 | 2001-03-30 | Laser hole drilling copper foil |
KR10-2002-7012574A KR100495481B1 (en) | 2000-04-05 | 2001-03-30 | Laser hole drilling copper foil |
MYPI20011627A MY122999A (en) | 2000-04-05 | 2001-04-05 | Copper foil for use in laser beam drilling |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000103505A JP3330925B2 (en) | 2000-04-05 | 2000-04-05 | Copper foil for laser drilling |
PCT/JP2001/002706 WO2001077420A1 (en) | 2000-04-05 | 2001-03-30 | Laser hole drilling copper foil |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2001288595A JP2001288595A (en) | 2001-10-19 |
JP3330925B2 true JP3330925B2 (en) | 2002-10-07 |
Family
ID=18617204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000103505A Expired - Lifetime JP3330925B2 (en) | 2000-04-05 | 2000-04-05 | Copper foil for laser drilling |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP3330925B2 (en) |
KR (1) | KR100495481B1 (en) |
MY (1) | MY122999A (en) |
TW (1) | TWI238027B (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3869352B2 (en) * | 2002-11-12 | 2007-01-17 | 日鉱金属株式会社 | Calorie measurement method of metal foil, adjustment method of surface characteristics, laser drilling method or calorimeter |
US7476449B2 (en) | 2003-02-27 | 2009-01-13 | Furukawa Circuit Foil Co., Ltd. | Electromagnetic shielding copper foil, method of production thereof and electromagnetic shield |
JP4458519B2 (en) * | 2003-07-28 | 2010-04-28 | 三井金属鉱業株式会社 | Surface-treated copper foil having a blackened surface, a method for producing the surface-treated copper foil, and an electromagnetic shielding conductive mesh for a front panel of a plasma display using the surface-treated copper foil |
JP4458521B2 (en) * | 2004-03-02 | 2010-04-28 | 三井金属鉱業株式会社 | Surface-treated copper foil having a grayed surface, a method for producing the surface-treated copper foil, and an electromagnetic shielding conductive mesh for a front panel of a plasma display using the surface-treated copper foil |
KR100654737B1 (en) * | 2004-07-16 | 2006-12-08 | 일진소재산업주식회사 | Method of manufacturing Surface-treated Copper Foil for PCB having fine-circuit pattern and Surface-treated Copper Foil thereof |
JP2006210689A (en) * | 2005-01-28 | 2006-08-10 | Fukuda Metal Foil & Powder Co Ltd | Copper foil for high frequency printed wiring board and its production method |
US7886437B2 (en) | 2007-05-25 | 2011-02-15 | Electro Scientific Industries, Inc. | Process for forming an isolated electrically conductive contact through a metal package |
KR101289803B1 (en) | 2008-05-16 | 2013-07-26 | 삼성테크윈 주식회사 | Circuit board and method of manufacturing the same |
JP2009235580A (en) * | 2009-07-22 | 2009-10-15 | Furukawa Electric Co Ltd:The | Copper foil sheet for opening laser-drilled hole |
CN104160068B (en) | 2012-03-01 | 2017-05-24 | 三井金属矿业株式会社 | Copper foil having carrier foil, manufacturing method for producing the copper foil having carrier foil, and copper clad laminate for laser opening processing using the copper foil having carrier foil |
US9338898B2 (en) | 2012-03-09 | 2016-05-10 | Mitsui Mining & Smelting Co., Ltd. | Method of producing a printed wiring board |
KR101400778B1 (en) * | 2012-10-05 | 2014-06-02 | 일진머티리얼즈 주식회사 | Copper foil for laser hole drilling, copper-clad laminate and preparation method of the foil |
CN103972513B (en) * | 2013-02-06 | 2016-08-17 | 永箔科技股份有限公司 | Porous collector metal material continuous process method |
KR102356407B1 (en) * | 2013-03-05 | 2022-01-28 | 미쓰이금속광업주식회사 | Copper foil for laser processing, carrier-foil-supported copper foil for laser processing, copper-clad laminate, and process for producing printed wiring board |
CN109788658B (en) * | 2017-11-15 | 2021-10-19 | 鹏鼎控股(深圳)股份有限公司 | Circuit board and manufacturing method thereof |
-
2000
- 2000-04-05 JP JP2000103505A patent/JP3330925B2/en not_active Expired - Lifetime
-
2001
- 2001-03-29 TW TW090107469A patent/TWI238027B/en not_active IP Right Cessation
- 2001-03-30 KR KR10-2002-7012574A patent/KR100495481B1/en active IP Right Grant
- 2001-04-05 MY MYPI20011627A patent/MY122999A/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR20020084243A (en) | 2002-11-04 |
KR100495481B1 (en) | 2005-06-14 |
TWI238027B (en) | 2005-08-11 |
MY122999A (en) | 2006-05-31 |
JP2001288595A (en) | 2001-10-19 |
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