JP3322221B2 - Fully automatic material testing equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic material testing apparatus for continuously and automatically performing a material test on test pieces stored in a storage pallet or the like. The present invention relates to a fully automatic test apparatus that supplies a test piece to a test apparatus main body, performs a tensile test by the test apparatus main body, and collects the test sample in a collection box or the like by a test piece collection apparatus.

[0002]

2. Description of the Related Art In a fully automatic test apparatus for continuously testing materials such as rubber one after another, several test pieces are arranged on a storage pallet and transported to the vicinity of a test machine main body. Each test piece is taken out of the storage pallet using a hand having a chuck and a suction device built in the test piece supply device, and attached to the test piece holding chuck of the testing machine body. Next, the tensile test is performed by recording the relationship between the load and the displacement when the test piece is extended by the tester main body. After the tensile test, etc., the test piece will remain on the test piece gripping chuck of the testing machine, but the test specimen will be re-clamped by the collection chuck attached to the test piece collection device. The test piece is dropped into the collection box by transporting the sample to the top and opening the collection chuck. Fully automatic test equipment carries new test pieces in such a process,
The material test of the test piece is performed, and the tested test piece is collected fully automatically.

[0003]

The following procedure is used to supply the test piece carried by the transport device to the test piece holding chuck of the tester main body by the supply device. In the initial state, the upper and lower test piece gripping chucks (upper and lower chucks) of the tester main body are arranged at predetermined positions, and the gripping portions are kept open. The supply device conveys the test piece gripped by the hand to the position of the upper chuck of the tester main body. Hold the upper end of the test piece with the upper chuck, make the test piece hanging from the upper chuck, move the hand of the feeding device away from the tester main body, then lower the crosshead of the tester main body to test the lower end of the test piece. Lower the machine to the position where it is clamped by the lower chuck. When the lower chuck is closed in this state, the test piece will be gripped by the upper chuck and the lower chuck of the tester main body, so the test is performed by raising the crosshead of the tester main body to which the upper chuck is fixed. A strip elongation test is performed.

In the above process, when the test piece hanging from the upper chuck of the tester body is lowered and gripped by the lower chuck, if the test piece does not hang down straight and is slightly warped, the test piece may be warped. The lower end may not fit well in the lower chuck opening. In particular, when the test piece is made of rubber, the test piece often warps depending on the state of punching for forming the test piece.

The present invention has been made in view of such circumstances, and when a test piece is gripped by upper and lower test piece gripping chucks of a tester main body, a lower chuck test piece is reliably inserted. It is intended to provide an automatic test device.

[0006]

In order to solve the above-mentioned problems, the present invention comprises a material testing machine main body having a pair of upper and lower chucks for holding a test piece, and a supply device for supplying the test piece to the chuck. In the fully automatic material testing apparatus, an upper and lower open guide plate for guiding insertion of a test piece is provided above the lower chuck of the pair of chucks. When the other end of the test piece is clamped by the lower chuck, the insertion guide plate is positioned above the lower chuck so that the test piece inserted from above by the lowering of the upper check is moved to the lower side. It is characterized by being guided to the opening of the chuck.

[0007] The fully automatic material testing apparatus of the present invention includes an insertion guide plate for guiding the insertion of a test piece above the lower chuck of the tester main body. This insertion guide plate guides even the warped test piece into the opening of the lower chuck, so that the test piece hanging down by the upper chuck is securely held by the lower chuck. Become like Therefore, even if the test piece has a certain amount of warpage, the test piece is reliably held between the test piece holding chucks of the tester main body, and supply of the test piece does not fail.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a view showing a fully automatic material testing apparatus according to the present invention. A test piece such as a rubber material is put on a storage pallet or the like, and is conveyed to the vicinity of the test machine main body by a carrier. The transported test piece 4 is supplied by the test piece supply device 1 to the position of the test piece gripping chuck 5 of the tester main body 2. When the test piece 4 is set on the tester main body 2, the tester main body 2 pulls the test piece 4 according to a known method, and measures a load and an elongation at that time to perform a material test. Specimen 4 broken after material test
Remains on the upper chuck 6 and the lower chuck 5, but the test piece is caught by the collection chuck of the test piece collection device 3 and discarded in the collection box 7.
The arrows shown in FIG. 1 indicate a series of flows in which the test piece 4 is conveyed.

FIG. 1 shows only the main structure of a fully automatic material testing apparatus. In addition to this, a test piece preparing apparatus for punching out an array type test piece from one plate, a plate-shaped test piece, and the like. In some cases, a thickness measuring device for measuring the thickness of the sample is attached, and a conveyor for transporting the test piece is also included.

FIG. 2 shows a test piece recovery apparatus 3 provided with a test piece insertion guide plate which is a main part of the present invention. The test piece collection device 3 is a device for collecting the test pieces that have been tested, and serves as a guide device for inserting the test pieces when the test pieces are supplied to the tester main body 2.
FIG. 2A is a view showing the test piece collection device 3 together with the collection box 7 when viewed from above, and also shows the movement of the collection chuck 11 of the test piece collection device 3. FIG. 2B is a diagram showing both the positional relationship between the lower chuck 5 of the tester main body and the insertion guide 17 provided on the collection chuck 11 when the test piece collection device 3 is viewed from the front.

A collection chuck 1 for collecting the test piece 4
1 is a shaft 15 of a rotary cylinder 16 via a collection arm 12.
, And can be rotated in the direction of arrow C about the shaft 15 by driving the rotary cylinder 16. Among the positions where the collection chuck 11 can be rotated, the position A is a position directly above the collection box 7 for collecting the tested test piece, and the position B is the lower chuck 5 of the tester main body.
This is the position where the remaining test piece can be grasped. A notch 14 into which the test piece 4 can enter is located below the collection chuck 11.
Is disposed. The collection chuck 11 opens and closes as indicated by arrow D. However, since the disposal guide plate 13 is a fixed plate, the collection chuck 1
It has nothing to do with the movement of the arrow D of 1.

When the material test is completed, the strip of the test piece 4 is left on the chuck 5 of the tester main body. When the test piece collecting apparatus 3 is rotated to the position B in a state where the collecting chuck 11 of the test piece collecting apparatus 3 is opened to collect the test piece 4, the collecting chuck 11 and the guide plate 13 are moved as shown in FIG. Test piece 4
Is sandwiched. In this state, when the collection chuck 11 is moved and closed as shown by the arrow D, the test piece 4 is gripped by the collection chuck 11. Next, when the lower chuck 5 of the tester main body is opened and the collection arm 12 is rotated to the position A, the test piece 4 is conveyed to a position directly above the collection box 7. The piece 4 falls into the collection box 7.

When the test piece 4 is dropped on the collection box 7, the disposal guide plate 13 functions as follows. When the test piece 4 is a highly adhesive sample such as a rubber material,
The test piece may adhere to the holding surface of the collection chuck 11. In such a case, the test piece 4 does not fall down only by opening the collection chuck 11. In the apparatus of the present invention, the width of the notch 14 of the waste guide plate 13 is sufficiently larger than the thickness of the test piece 4 but smaller than the opening width of the collection chuck 11.
The test piece 4 comes off the gripping surface of the collection chuck 11 by hitting one end of the notch 14 of the discard guide plate 13, so that the test piece 4 can be reliably dropped. Further, since the notch 14 of the disposal guide plate 13 also serves to guide the falling direction when the test piece 4 falls into the collection box 7 arranged below, the test piece 4
Scattering around the area other than immediately below 1 is reduced.

As shown in FIG. 2B, a pair of insertion guide plates 17 are attached to the upper part of the collection chuck 11. The left and right insertion guide plates 17 are paired to serve as a guide when the test piece is inserted into the lower chuck 5 from above, and as a whole, the upper portion is widened and the lower width is substantially equal to the opening of the lower chuck. The width is the same as the size. By using the insertion guide plate 17, the collection chuck 11 is a chuck for collecting the test pieces that have been tested as described above, and the test piece supply device 1 allows the test piece gripping chuck of the tester main body 2. When transferring a new test piece 4 to the (upper chuck 6 and lower chuck 5), it serves to guide the test piece.

A procedure for mounting the test piece 4 on the upper chuck 6 and the lower chuck 5 will be described with reference to FIG. The lower chuck 5 is fixed at a predetermined position, and when the previous tensile test is completed, the upper chuck 6 is returned to the predetermined position by the movement of the crosshead of the tester main body. At this time, the gripping surfaces of both chucks are open. In this state, the test piece 4 held by the supply chuck 18 of the test piece supply device 1 is transported to the position of the upper chuck 6 (FIG. 3A). Next, after the gripping surface 20 of the upper chuck 6 is closed and the upper end of the test piece 4 is gripped, the supply chuck 18 is retracted, the crosshead of the tester body is lowered, and the upper chuck 6 is lowered as shown by the arrow E. . Even when the test piece 4 is warped as shown in FIG. 3, the lower part of the test piece 4 is guided by the insertion guide 17 and inserted into the opening of the lower chuck 5 from above (FIG. 3 (b)). ) And FIG. 3 (c)). When the lower end of the test piece 4 reaches the gripping surface 19 of the lower chuck 5, the lowering of the upper chuck 6 is stopped, the gripping surface 19 of the lower chuck 5 is closed, and the lower end of the test piece 4 is gripped. Then, the collection arm 12 of the test piece collection device 3 is rotated to retract the insertion guide plate 17 (FIG. 3D).

After the test piece is gripped by the test piece gripping chucks 5 and 6 of the tester body, the load value and the elongation value are measured and recorded while moving the crosshead upward, whereby a tensile test is performed. The test piece remaining on the test piece holding chuck after the test is discarded in the collection box by the test piece collection device as described above.

[0017]

According to the fully automatic test apparatus of the present invention, the insertion guide plate which is open upward is provided on the lower chuck of the tester main body so as to be able to be taken in and out freely. The test piece was securely mounted even when the other end was lowered so as to be inserted into the lower chuck to test a warped test piece that was not straight. In addition, a disposal guide plate with a notch to allow the test piece to be placed in the collection chuck of the collection device that collects the test piece makes it easy to separate the test piece from the collection chuck, and the test piece is placed in the collection box below. It also served as a guide when dropping, ensuring the operation of collecting the tested test pieces. Overall, it has become possible to improve the reliability and reliability of the fully automatic test equipment.

[Brief description of the drawings]

FIG. 1 is a diagram showing a main configuration of a fully automatic test apparatus of the present invention.

FIG. 2 is a view showing a test piece recovery device which also serves as a test piece insertion guide device which is a main part of the present invention.

FIG. 3 is a diagram illustrating a procedure for mounting a test piece on an upper chuck and a lower chuck of a tester main body.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 ... Test piece supply apparatus 2 ... Test machine main body 3 ... Test piece collection apparatus 4 ... Test piece 5 ... Lower chuck 6 ... Upper chuck 7 ... Collection box 11 ... Collection chuck 12 ... Collection arm 13 ... Disposal guide plate 14 ... Cut 15: shaft 16: rotary cylinder 17: insertion guide plate 18: supply chuck

────────────────────────────────────────────────── ─── Continued on the front page (58) Field surveyed (Int.Cl. ⁷ , DB name) G01N 3/00-3/62 JICST file (JOIS)

Claims (1)

(57) [Claims] 1. A fully automatic material testing apparatus comprising a material testing machine main body having a pair of upper and lower chucks for holding a test piece, and a supply device for supplying a test piece to the chuck, wherein a lower side of the pair of chucks is provided. Above the chuck, there is provided an insertion guide plate which is open and retractable to guide the insertion of the test piece, and a test piece whose one end is held by the upper chuck is held at the other end of the test piece by the lower chuck. A fully automatic material test wherein the test piece inserted from above by lowering the upper check is guided to the opening of the lower chuck by positioning the insertion guide plate above the lower chuck. apparatus.