JP3291887B2 - Method for forming gold-tin solder plating layer and method for bonding the same - Google Patents
Method for forming gold-tin solder plating layer and method for bonding the sameInfo
- Publication number
- JP3291887B2 JP3291887B2 JP1169294A JP1169294A JP3291887B2 JP 3291887 B2 JP3291887 B2 JP 3291887B2 JP 1169294 A JP1169294 A JP 1169294A JP 1169294 A JP1169294 A JP 1169294A JP 3291887 B2 JP3291887 B2 JP 3291887B2
- Authority
- JP
- Japan
- Prior art keywords
- gold
- plating
- tin
- plating layer
- solder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Particle Formation And Scattering Control In Inkjet Printers (AREA)
- Electroplating Methods And Accessories (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、金−錫半田を積層めっ
きによって形成し接合する金−錫半田めっき層の形成方
法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a gold-tin solder plating layer in which gold-tin solder is formed by lamination plating and joined.
【0002】[0002]
【従来の技術】従来、金−錫半田接合では、金−錫合金
の箔を形成し接合部に挿入するか、金と錫を相対する接
合面に別々に単一の層として、めっきまたは蒸着により
形成して接合していた。2. Description of the Related Art Conventionally, in gold-tin solder bonding, a gold-tin alloy foil is formed and inserted into a bonding portion, or gold and tin are separately plated on a bonding surface facing each other as a single layer by plating or vapor deposition. Formed and joined.
【0003】[0003]
【発明が解決しようとする課題】微細な2次元パターン
を有する被接合部材においては、金−錫合金の箔を接合
部に挿入する方法は、金−錫合金が極めて脆く微細な加
工が容易でないことから実用的ではない。また、金−錫
合金を単一の合金層として、接合面上に形成する技術は
確立しておらず、特に、その半田組成を精度良くコント
ロールすることは極めて困難で実用的ではない。In the case of a member to be joined having a fine two-dimensional pattern, the method of inserting a gold-tin alloy foil into the joint portion is that the gold-tin alloy is extremely brittle and fine processing is not easy. Therefore it is not practical. In addition, a technique for forming a gold-tin alloy as a single alloy layer on a bonding surface has not been established. In particular, it is extremely difficult and impractical to precisely control the solder composition.
【0004】一方、接合面の一方に金めっき、もう一方
に錫めっきを形成して接合する方法は、錫めっき膜が酸
化し易いため、接合強度がばらついたり、接合していな
い部分が生ずる等の接合不良の原因となっている。従っ
て、接合前にAr原子スパッタリング等により上記酸化
膜を除去する工程が必要である。また、錫めっき上に金
めっきを酸化防止層として形成することが考えられる
が、通常、金めっきはめっき浴温度50〜70℃で行わ
れる。その際、めっき膜中に金と錫が相互拡散して形成
されるために酸化防止層として十分な効果が得られない
という問題がある。On the other hand, in the method of forming a gold plating on one of the bonding surfaces and a tin plating on the other, and bonding, the tin plating film is easily oxidized, so that the bonding strength varies, and a non-bonded portion occurs. Causes poor bonding. Therefore, a step of removing the oxide film by Ar atom sputtering or the like before bonding is required. In addition, it is conceivable to form gold plating as an antioxidant layer on tin plating. Usually, gold plating is performed at a plating bath temperature of 50 to 70 ° C. In this case, there is a problem that a sufficient effect as an antioxidant layer cannot be obtained because gold and tin are formed by interdiffusion in the plating film.
【0005】本発明の目的は、耐酸化性に優れた金−錫
半田めっき層の形成方法並びにその接合方法を提供する
ことにある。An object of the present invention is to provide a method for forming a gold-tin solder plating layer having excellent oxidation resistance and a bonding method therefor.
【0006】[0006]
【課題を解決するための手段】前記課題を解決する本発
明の要旨は次のとおりである。The gist of the present invention for solving the above problems is as follows.
【0007】被接合物の金−錫半田接合部に、金と錫の
層を湿式めっきによりそれぞれ形成して積層し最外表面
には金めっき層を形成する金−錫半田めっき層の形成方
法において、前記最外表面の金めっきはめっき浴温度0
〜40℃で形成することを特徴とする金−錫半田めっき
層の形成方法にある。A method of forming a gold-tin solder plating layer in which gold and tin layers are formed and laminated on a gold-tin solder joint of a workpiece by wet plating, respectively, and a gold plating layer is formed on the outermost surface Wherein the gold plating on the outermost surface has a plating bath temperature of 0
A method for forming a gold-tin solder plating layer, characterized in that the layer is formed at a temperature of about 40 ° C.
【0008】前記最外表面に形成する金めっき層の厚さ
が0.3μm以上で、金と錫の積層めっき層全体の厚さ
が3μm以上である上記の金−錫半田めっき層の形成方
法にある。[0008] The above-mentioned method for forming a gold-tin solder plating layer, wherein the thickness of the gold plating layer formed on the outermost surface is 0.3 µm or more and the total thickness of the gold and tin laminated plating layer is 3 µm or more. It is in.
【0009】また、被接合物の接合部に、金と錫の層を
湿式めっきによりそれぞれ形成して積層し金−錫めっき
半田層を形成し、その最外表面には金めっき層をめっき
浴温度0〜40℃で形成し、前記被接合物の前記めっき
半田層を形成した接合部を位置合せした後、真空中また
は不活性ガス中で前記めっき層が溶融する温度で加熱す
ることを特徴とする接合方法にある。上記により容易に
接合することができる。[0009] Further, a gold and tin layers are formed on the joints of the objects to be joined by wet plating and laminated to form gold-tin plating solder layers, and a gold plating layer is plated on the outermost surface with a plating bath. After forming at a temperature of 0 to 40 ° C. and aligning the joints on which the plated solder layer is formed on the article to be joined, heating is performed at a temperature at which the plating layer is melted in a vacuum or an inert gas. In the joining method. The above can be easily joined.
【0010】[0010]
【作用】最外表面の金めっきのめっき浴温度を0〜40
℃とすることにより、めっき中の金と錫の拡散を防止で
きる。これによって、錫が最外表面に拡散してくること
がなく、半田層の最外表面の酸化を防止できる。従っ
て、接合前に酸化被膜を除去するスパッタリング等の操
作を必要としない。[Action] The plating bath temperature of the outermost gold plating is 0 to 40.
By setting the temperature to ° C., diffusion of gold and tin during plating can be prevented. This prevents tin from diffusing to the outermost surface and prevents oxidation of the outermost surface of the solder layer. Therefore, an operation such as sputtering for removing an oxide film before joining is not required.
【0011】最外表面の金めっきのめっき浴温度が40
℃を超えると錫の拡散が起こり、最外表面の酸化防止効
果が小さくなる。一方、0℃未満ではめっきが粒状に粗
くなって、剥離し易くなる。[0011] The plating bath temperature of the outermost gold plating is 40
When the temperature exceeds ℃, tin diffuses, and the effect of preventing oxidation of the outermost surface is reduced. On the other hand, if the temperature is lower than 0 ° C., the plating becomes coarse in a granular form, and it becomes easy to peel off.
【0012】上記の最外表面の金めっき層の厚さは0.
3μm以上はあることが望ましく、0.3μm未満では
錫めっき層が酸化を十分に防止することができない。[0012] The thickness of the gold plating layer on the outermost surface is 0.1 mm.
The thickness is desirably 3 μm or more, and if it is less than 0.3 μm, the tin plating layer cannot sufficiently prevent oxidation.
【0013】金−錫積層半田層は、接合加熱時に280
℃以上に加熱することにより、錫が溶解し金と相互拡散
して金−錫合金の融液層を形成する。このとき錫が母材
側にも拡散して化合物を形成し、半田層中の錫濃度が低
下して半田層の融点を変化させる。錫含有量が20重量
%以下あるいは全体の半田層厚さが3μm以下のもの
は、加熱接合中に前記化合物形成によって半田層中の錫
濃度が低下し、半田層融点が顕著に上昇する。その結
果、接合部に十分な融液が生じる前に半田層が凝固する
ため接合が不完全となる。The gold-tin laminated solder layer is heated to 280 at the time of joining and heating.
By heating to a temperature of not less than ° C., tin dissolves and interdiffuses with gold to form a gold-tin alloy melt layer. At this time, tin diffuses also to the base material side to form a compound, and the tin concentration in the solder layer is reduced to change the melting point of the solder layer. When the tin content is 20% by weight or less or the total solder layer thickness is 3 μm or less, the tin concentration in the solder layer is reduced due to the formation of the compound during the heat bonding, and the melting point of the solder layer is significantly increased. As a result, the bonding is incomplete because the solder layer solidifies before a sufficient melt is generated at the bonding portion.
【0014】本発明においては、錫含有量が20重量%
を超え40重量%未満で、金−錫積層半田層全体の厚さ
が3μm以上のものを用いることにより、加熱接合中の
半田層中の錫濃度低下による半田融点の低下を防止する
ことができる。In the present invention, the tin content is 20% by weight.
And less than 40% by weight and a total thickness of the gold-tin solder layer of 3 μm or more, it is possible to prevent a decrease in the solder melting point due to a decrease in the tin concentration in the solder layer during the heat bonding. .
【0015】[0015]
【実施例】以下本発明を実施例により具体的に説明す
る。The present invention will be specifically described below with reference to examples.
【0016】〔実施例1〕図1は、本発明を適用したイ
ンクジェットプリンタ用プリントヘッドの薄板の断面構
造を示す模式図である。図2はプリントヘッドを構成す
る薄板の構成を示す構成斜視図である。また、図3は、
接合後のプリントヘッド用薄板の接合部の断面模式図で
ある。Embodiment 1 FIG. 1 is a schematic view showing a cross-sectional structure of a thin plate of a print head for an ink jet printer to which the present invention is applied. FIG. 2 is a configuration perspective view showing the configuration of the thin plate constituting the print head. Also, FIG.
FIG. 4 is a schematic cross-sectional view of a joined portion of a printhead thin plate after joining.
【0017】図2で示すように、プリントヘッドの一部
を構成するダイアフラム6(SUS304、板厚20μ
m)、リストリクタ7(SUS304、板厚50μm)
及びフィルタ8(SUS304、板厚20μm)の3枚
を接合した。As shown in FIG. 2, a diaphragm 6 (SUS304, plate thickness 20 μm) constituting a part of the print head is provided.
m), restrictor 7 (SUS304, plate thickness 50 μm)
And three filters 8 (SUS304, plate thickness 20 μm).
【0018】リストリクタ7は、図1(a)のような構
造で、ステンレス1上に下地メッキとしてNiメッキ2
を1μm、次いで、金めっき3を65℃のシアン系金め
っき浴中で電流密度2A/dm2で2μm形成し、その
上に錫めっき4を3μm、最外表面に金めっき5を20
℃のシアン系金めっき浴中で、電流密度10A/dm2
で0.5μm施した。The restrictor 7 has a structure as shown in FIG.
Then, a gold plating 3 is formed at a current density of 2 A / dm 2 in a cyan gold plating bath at 65 ° C. at a current density of 2 A / dm 2 , a tin plating 4 is formed thereon, and a gold plating 5 is formed on the outermost surface.
Current density 10A / dm 2 in cyan gold plating bath
0.5 μm.
【0019】ダイアフラム6及びフィルタ8は、図1
(b)に示すような構造で、ステンレス板1上に下地メ
ッキとしてNiメッキ2を1μm、次に、金めっき3を
65℃のシアン系金めっき浴中で電流密度2A/dm2
で厚さ0.5μm施した。The diaphragm 6 and the filter 8 are arranged as shown in FIG.
In the structure shown in FIG. 2B, Ni plating 2 is 1 μm as a base plating on the stainless steel plate 1, and then gold plating 3 is applied with a current density of 2 A / dm 2 in a cyan gold plating bath at 65 ° C.
With a thickness of 0.5 μm.
【0020】次に上記3枚の薄板を上からダイアフラム
6、リストリクタ7、フィルタ8の順で位置合せし、真
空中、300℃で加熱して接合した。冷却後、接合室内
を大気に戻し被接合物を取り出した。図3に示すような
断面構造の接合体を得た。本実施例では、雰囲気として
真空中で接合したが、不活性ガス雰囲気中で行ってもよ
い。Next, the three thin plates were aligned from the top in the order of diaphragm 6, restrictor 7, and filter 8, and joined by heating at 300 ° C. in vacuum. After cooling, the inside of the joining chamber was returned to the atmosphere, and the object to be joined was taken out. A joined body having a sectional structure as shown in FIG. 3 was obtained. In this embodiment, the bonding is performed in a vacuum as an atmosphere, but the bonding may be performed in an inert gas atmosphere.
【0021】〔実施例2〕実施例1で示したリストリク
タ7において、ステンレス板1上に下地メッキとしてN
iメッキ2を1μm、次に、金めっき3を65℃のシア
ン系金めっき浴中で、電流密度2A/dm2で2μm、
その上に錫めっき4を3μm、最外表面に金めっき5を
20、30、40、50℃の各温度のシアン系金めっき
浴中で、電流密度10A/dm2で1.0μm施した。[Embodiment 2] In the restrictor 7 shown in Embodiment 1, N was applied as a base plating on the stainless steel plate 1.
i plating 2 was 1 μm, and then gold plating 3 was 2 μm at a current density of 2 A / dm 2 in a cyan gold plating bath at 65 ° C.
A tin plating 4 was applied thereon at 3 μm, and a gold plating 5 at the outermost surface was applied at a current density of 10 A / dm 2 in a cyan gold plating bath at 20, 30, 40, and 50 ° C. at 1.0 μm.
【0022】上記の表面の組織をXMAで分析した結果
を図4に示す。めっき浴温度が40℃以下であれば、表
面(接合面)への錫の拡散を防止できることが分かる。FIG. 4 shows the result of XMA analysis of the above surface structure. It can be seen that if the plating bath temperature is 40 ° C. or less, diffusion of tin to the surface (joining surface) can be prevented.
【0023】〔実施例3〕実施例1、2で示したリスト
リクタ7において、ステンレス板1上に下地メッキとし
てNiメッキ2を1μm、次に、金めっき3を65℃の
シアン系金めっき浴中で、電流密度2A/dm2で2μ
m、その上に錫めっき4を3μm、最外表面に金めっき
5を−5、0、10、20℃の各温度のシアン系金めっ
き浴中で、電流密度10A/dm2で1.0μm施した。[Embodiment 3] In the restrictor 7 shown in Embodiments 1 and 2, Ni plating 2 is 1 μm as a base plating on the stainless steel plate 1 and then gold plating 3 is a cyan gold plating bath of 65 ° C. in the middle, 2.mu. at a current density of 2A / dm 2
m, and tin plating 4 thereon, 3 μm, and gold plating 5 on the outermost surface in a cyan gold plating bath at −5, 0, 10, and 20 ° C. at a current density of 10 A / dm 2 and 1.0 μm. gave.
【0024】表1に、めっき層のテープ剥離試験を行っ
た結果を示す。錫めっき上の金めっき浴温度が0℃より
低いと、表面の金めっきが剥離してしまうことが分かっ
た。Table 1 shows the results of a tape peeling test of the plating layer. It was found that when the temperature of the gold plating bath on the tin plating was lower than 0 ° C., the gold plating on the surface was peeled off.
【0025】[0025]
【表1】 [Table 1]
【0026】[0026]
【発明の効果】本発明の金−錫半田積層めっきによれ
ば、金と錫の拡散が防止でき、該半田積層の最外表面が
上記の金めっき層で被覆されるので、錫めっき層の酸化
を防止でき、強固な接合ができる。According to the gold-tin solder laminate plating of the present invention, diffusion of gold and tin can be prevented, and the outermost surface of the solder laminate is covered with the gold plating layer. Oxidation can be prevented and strong bonding can be achieved.
【0027】また、従来の金−錫半田積層めっき層のよ
うに、接合直前にその酸化被膜を除去するスパッタリン
グ等の作業工程が不要である。Further, unlike the conventional gold-tin solder laminated plating layer, there is no need for an operation step such as sputtering for removing an oxide film immediately before joining, such as sputtering.
【図1】 本発明を適用したインクジェットプリンタ用
プリントヘッドの薄板の断面構造を示す模式図である。FIG. 1 is a schematic view showing a cross-sectional structure of a thin plate of a print head for an inkjet printer to which the present invention is applied.
【図2】 インクジェットプリンタ用プリントヘッドを
構成する薄板の構成を示す構成斜視図である。FIG. 2 is a configuration perspective view showing a configuration of a thin plate constituting a print head for an inkjet printer.
【図3】 本発明半田めっき方法による接合後のプリン
トヘッド用薄板の接合部の断面模式図である。FIG. 3 is a schematic cross-sectional view of a bonding portion of a printhead thin plate after bonding by the solder plating method of the present invention.
【図4】 本発明半田めっき方法を適用したプリントヘ
ッド用薄板の表面組織をXMAで分析した結果を示すグ
ラフである。FIG. 4 is a graph showing the results of XMA analysis of the surface texture of a printhead thin plate to which the solder plating method of the present invention has been applied.
1はステンレス板、2はNiメッキ、3は金めっき、4
は錫メッキ、5は最外表面金めっき、6はダイアフラ
ム、7はリストリクタ、8はフィルタ、9はインク流
路、10は接合部である。1 is a stainless steel plate, 2 is Ni plating, 3 is gold plating, 4
Is a tin plating, 5 is an outermost surface gold plating, 6 is a diaphragm, 7 is a restrictor, 8 is a filter, 9 is an ink flow path, and 10 is a joint.
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) C25D 5/10 C25D 3/48 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int. Cl. 7 , DB name) C25D 5/10 C25D 3/48
Claims (4)
の層を湿式めっきによりそれぞれ形成して積層し最外表
面には金めっき層を形成する金−錫半田めっき層の形成
方法において、前記最外表面の金めっきはめっき浴温度
0〜40℃で形成することを特徴とする金−錫半田めっ
き層の形成方法。1. A gold-tin solder plating layer in which gold and tin layers are formed and laminated on a gold-tin solder joint portion of an object by wet plating, respectively, and a gold plating layer is formed on the outermost surface. The method of forming a gold-tin solder plating layer, wherein the gold plating on the outermost surface is formed at a plating bath temperature of 0 to 40 ° C.
さが0.3μm以上で、金と錫の積層めっき層全体の厚
さが3μm以上である請求項1記載の金−錫半田めっき
層の形成方法。2. The gold-tin solder according to claim 1, wherein the thickness of the gold plating layer formed on the outermost surface is 0.3 μm or more, and the total thickness of the gold and tin laminated plating layer is 3 μm or more. A method for forming a plating layer.
が、20重量%を超え40重量%未満となるよう制御す
る請求項1または2記載の金−錫半田めっき層の形成方
法。3. The method for forming a gold-tin solder plating layer according to claim 1, wherein the tin content of the gold-tin laminated plating layer is controlled to be more than 20% by weight and less than 40% by weight. .
めっきによりそれぞれ形成して積層し金−錫めっき半田
層を形成し、その最外表面には金めっき層をめっき浴温
度0〜40℃で形成し、前記被接合物の前記めっき半田
層を形成した接合部を位置合せした後、真空中または不
活性ガス中で前記めっき層が溶融する温度で加熱するこ
とを特徴とする接合方法。4. A gold-tin plating solder layer is formed by laminating and laminating gold and tin layers on a joint portion of an object by wet plating, and a gold plating layer is formed on the outermost surface by a plating bath. After forming at a temperature of 0 to 40 ° C. and aligning the bonding portion of the article to which the plating solder layer is formed, heating is performed at a temperature at which the plating layer melts in a vacuum or an inert gas. And the joining method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1169294A JP3291887B2 (en) | 1994-02-03 | 1994-02-03 | Method for forming gold-tin solder plating layer and method for bonding the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1169294A JP3291887B2 (en) | 1994-02-03 | 1994-02-03 | Method for forming gold-tin solder plating layer and method for bonding the same |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07216579A JPH07216579A (en) | 1995-08-15 |
JP3291887B2 true JP3291887B2 (en) | 2002-06-17 |
Family
ID=11785091
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1169294A Expired - Lifetime JP3291887B2 (en) | 1994-02-03 | 1994-02-03 | Method for forming gold-tin solder plating layer and method for bonding the same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3291887B2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1488865A1 (en) * | 2003-06-18 | 2004-12-22 | Hille & Müller GmbH | Double walled metal tube, metal band and strip, and method of coating a metal strip |
CN100432297C (en) * | 2004-12-15 | 2008-11-12 | 中国科学院生态环境研究中心 | Electrode for removing nitrate from water and preparation method thereof |
JP4993916B2 (en) * | 2006-01-31 | 2012-08-08 | 昭和シェル石油株式会社 | In solder-coated copper foil ribbon conductor and connection method thereof |
JP5159725B2 (en) * | 2009-08-27 | 2013-03-13 | 三洋電機株式会社 | Solar cell string and solar cell module using the same |
-
1994
- 1994-02-03 JP JP1169294A patent/JP3291887B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH07216579A (en) | 1995-08-15 |
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