JP3263612B2 - Optical measurement window device with stain prevention mechanism - Google Patents
Optical measurement window device with stain prevention mechanismInfo
- Publication number
- JP3263612B2 JP3263612B2 JP25019396A JP25019396A JP3263612B2 JP 3263612 B2 JP3263612 B2 JP 3263612B2 JP 25019396 A JP25019396 A JP 25019396A JP 25019396 A JP25019396 A JP 25019396A JP 3263612 B2 JP3263612 B2 JP 3263612B2
- Authority
- JP
- Japan
- Prior art keywords
- optical measurement
- measurement window
- fine particles
- dust
- window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Optical Measuring Cells (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、汚れ防止機構付光
学計測窓装置に関する。本発明は、ボイラー等の燃焼機
器の火炎観察や、機器の内部観察などに利用することが
できる。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical measurement window device with a stain prevention mechanism. INDUSTRIAL APPLICABILITY The present invention can be used for flame observation of combustion equipment such as a boiler, and internal observation of equipment.
【0002】[0002]
【従来の技術】従来の技術を図4に示す。従来の光学計
測窓機構は、図4に示すように、機器の壁103に光学
計測窓101を設置し、機器の内部を観察する上で、光
学窓の汚れを防止するために光学窓の周囲から空気など
のガスを流し、ゴミ、微粒子などの窓への付着を防止し
ていた。2. Description of the Related Art FIG. The conventional optical measurement window mechanism, as shown in FIG. 4, installs the optical measurement window 101 on the wall 103 of the device and observes the inside of the device. Gas, such as air, was blown from the window to prevent dust and fine particles from adhering to the window.
【0003】[0003]
【発明が解決しようとする課題】しかし、従来の技術に
は次のような問題がある。 (1)図4に示す従来法では、パージガス111の流れ
の慣性力のみにより、ゴミ、微粒子等を窓から遠ざけて
いたが、パージガス111の流れ中に存在する渦等の影
響により、ゴミ、微粒子等が窓に付着する場合が多い。 (2)また、機器内のガスが光学窓側に流れ込んだ場合
には、パージガス111の流れの慣性力のみでは、付着
を防止できないという欠点を有していた。本発明は、こ
れらの問題を解決することができる装置を提供すること
を目的とする。However, the prior art has the following problems. (1) In the conventional method shown in FIG. 4, dust and fine particles are moved away from the window only by the inertial force of the flow of the purge gas 111. However, dust and fine particles are affected by the vortex and the like existing in the flow of the purge gas 111. Etc. often adhere to windows. (2) Further, when the gas in the apparatus flows into the optical window, there is a disadvantage that the adhesion cannot be prevented only by the inertial force of the flow of the purge gas 111. An object of the present invention is to provide a device that can solve these problems.
【0004】[0004]
(第1の手段)本発明に係る汚れ防止機構付光学計測窓
装置は、光学計測窓を通して内部の観察を行う装置にお
いて、(A)光学計測窓の周囲からイオン発生させた空
気を光学計測窓に吹き付け、光学窓近傍に存在するゴミ
や微粒子にイオンを付着させて、ゴミおよび微粒子を帯
電させる機構と、(B)空気中に発生させたイオンと同
符号の電荷物質を光学計測窓近傍に配置し、イオンが付
着したゴミおよび微粒子に対し光学計測窓から遠ざかる
方向に電荷物質との反発力を与え、ゴミおよび微粒子が
光学計測窓に付着することを防止することを特徴とす
る。(First Means) An optical measurement window device with a stain prevention mechanism according to the present invention is a device for observing the inside through an optical measurement window. A mechanism for charging dust and fine particles by adhering ions to the dust and fine particles existing near the optical window, and (B) a charged substance having the same sign as the ions generated in the air near the optical measurement window. It is characterized by providing a repulsive force against the charged substance in a direction away from the optical measurement window to dust and fine particles to which ions are attached, thereby preventing dust and fine particles from adhering to the optical measurement window.
【0005】すなわち、本発明は、図2に示すように、
イオンを付加させパージガス12を光学計測窓1の周囲
から光学窓近傍に導入し、イオンを光学窓近傍に存在す
るゴミ、微粒子等13に吸着させる。That is, the present invention, as shown in FIG.
The ions are added and the purge gas 12 is introduced from the periphery of the optical measurement window 1 to the vicinity of the optical window, and the ions are adsorbed by dust, fine particles, and the like 13 existing near the optical window.
【0006】光学計測窓1にはイオンと同符号の電荷を
有した物質11を配置しておき、イオンが付着したゴミ
及び微粒子に対し、光学計測窓1から遠ざかる方向に電
荷物質との反発力14を作用させる。A substance 11 having a charge having the same sign as that of ions is arranged in the optical measurement window 1, and a repulsive force of dust and fine particles to which ions are attached to the charged substance in a direction away from the optical measurement window 1. 14 is operated.
【0007】したがって、次のように作用する。従来法
では、パージガスの慣性力のみで、ゴミ及び微粒子が光
学窓に付着することを防止していたが、本発明では、パ
ージガスの慣性力に加え、電荷物質との反発力14で、
ゴミ及び微粒子の付着を防止できるため、ゴミ及び微粒
子の付着防止に関する性能を大幅に向上することができ
る。Therefore, the operation is as follows. In the conventional method, dust and fine particles are prevented from adhering to the optical window only by the inertial force of the purge gas. However, in the present invention, in addition to the inertial force of the purge gas, the repulsive force 14 with the charged substance is used.
Since the adhesion of dust and fine particles can be prevented, the performance relating to the prevention of adhesion of dust and fine particles can be greatly improved.
【0008】[0008]
(第1の実施の形態)本発明の第1の実施の形態を図1
〜図3に示す。本発明装置は、図1に示すように、機器
の壁3に光学計測窓1を設置し、機器の内部を観察する
上で、光学計測窓1の汚れを防止するために、光学計測
窓1の周囲からイオンが付加された空気などのパージガ
スを流し、ゴミや微粒子等13を帯電させる。(First Embodiment) FIG. 1 shows a first embodiment of the present invention.
3 to FIG. The apparatus of the present invention, as shown in FIG. 1, installs an optical measurement window 1 on a wall 3 of an apparatus and, when observing the inside of the apparatus, prevents the optical measurement window 1 from being stained. A purge gas, such as air to which ions are added, is flowed from the surroundings to charge the dust and fine particles 13.
【0009】光学計測窓1にはイオンと同符号の電荷を
有した物質11を配置しておき、イオンが付着したゴミ
及び微粒子に対し、光学計測窓1から遠ざかる方向に電
荷物質との反発力14を作用させ、パージガスの流れの
慣性力とイオンが付着したゴミ及ぴ微粒子に働く電気力
を用いて、光学窓にゴミ及び微粒子等が付着することを
防止する。A substance 11 having a charge having the same sign as that of ions is arranged in the optical measurement window 1, and a repulsive force of dust and fine particles to which ions are attached to the charged substance in a direction away from the optical measurement window 1. By using the inertia force of the flow of the purge gas and the electric force acting on dust and fine particles to which ions are attached, dust and fine particles are prevented from adhering to the optical window.
【0010】本発明の有効な利用例を図4に示す。図4
は、ボイラー等の機器の火炎観察等における観察窓の汚
れ防止機構に、本発明装置を用いた例であり、レーザ光
等の光を照射し、ボイラー内部の流動や、温度、成分を
観察する場合における観察窓の汚れ防止機構にも利用で
きる。FIG. 4 shows an example of effective use of the present invention. FIG.
Is an example of using the apparatus of the present invention for a mechanism for preventing contamination of an observation window in flame observation of a device such as a boiler, and irradiates light such as a laser beam to observe the flow, temperature, and components inside the boiler. It can also be used as a mechanism for preventing contamination of the observation window in such cases.
【0011】[0011]
【発明の効果】本発明は前述のように構成されているの
で、以下に記載するような効果を奏する。 (1)本発明により、光学窓を介して機器の内部観察を
する計測器に関し、窓汚れの影響が大幅に改善すること
ができる。 (2)そのため、窓洗浄などのメインテナンスの向上、
および、計測精度の向上をはかることができる。Since the present invention is configured as described above, it has the following effects. (1) According to the present invention, a measuring instrument for observing the inside of a device through an optical window can greatly reduce the influence of window contamination. (2) Therefore, improvement of maintenance such as window cleaning,
In addition, measurement accuracy can be improved.
【図1】本発明の第1の実施の形態に係る汚れ防止機構
付光学計測窓装置を示す図。FIG. 1 is a diagram showing an optical measurement window device with a stain prevention mechanism according to a first embodiment of the present invention.
【図2】第1の実施の形態の係るイオン付加パージガス
を用いた汚れ防止効果を示す図。FIG. 2 is a diagram showing a contamination prevention effect using an ion-added purge gas according to the first embodiment.
【図3】ボイラー等の機器の火炎観察等への応用例を示
す図。FIG. 3 is a diagram showing an application example of a device such as a boiler to flame observation and the like.
【図4】従来法を用いた光学計測窓を示す図。FIG. 4 is a diagram showing an optical measurement window using a conventional method.
1…光学計測窓 2…内部観測機器 3…機器の壁 4…汚れ防止機構付光学計測窓 5…観測カメラ 6…レーザ 7…バーナ 8…ボイラー等の燃焼機器 11…イオン付加パージンガス 12…イオンと同符号の電荷物質 13…ゴミ、微粒子等 14…電荷物質との反発力 101…光学計測窓 102…内部観測機器 103…機器の壁 111…パージンガス DESCRIPTION OF SYMBOLS 1 ... Optical measurement window 2 ... Internal observation equipment 3 ... Equipment wall 4 ... Optical measurement window with a stain prevention mechanism 5 ... Observation camera 6 ... Laser 7 ... Burner 8 ... Combustion equipment such as a boiler 11 ... Ion-added parzine gas 12 ... Ion Charged substance 13 of the same sign 13: dust, fine particles, etc. 14 ... Repulsive force with the charged substance 101 ... Optical measurement window 102 ... Internal observation equipment 103 ... Equipment wall 111 ... Purgin gas
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01N 21/00 - 21/74 G02B 27/00 JICSTファイル(JOIS)────────────────────────────────────────────────── ─── Continued on the front page (58) Fields surveyed (Int. Cl. 7 , DB name) G01N 21/00-21/74 G02B 27/00 JICST file (JOIS)
Claims (1)
において、(A)光学計測窓(1)の周囲からイオン発
生させた空気を光学計測窓(1)に吹き付け、光学窓近
傍に存在するゴミおよび微粒子(13)にイオンを付着
させてゴミおよび、微粒子を帯電させる機構と、(B)
空気中に発生させたイオンと同符号の電荷物質を光学計
測窓近傍に配置し、イオンが付着したゴミおよび微粒子
に対し、光学計測窓から遠ざかる方向に電荷物質との反
発力(14)を与え、ゴミおよび微粒子が光学計測窓に
付着することを防止することを特徴とする汚れ防止機構
付光学計測窓装置。In an apparatus for observing the inside through an optical measurement window, (A) air generated from the periphery of the optical measurement window (1) is blown to the optical measurement window (1), and the air is present near the optical window. A mechanism for charging dust and fine particles by attaching ions to dust and fine particles (13); and (B)
A charged substance having the same sign as the ions generated in the air is arranged near the optical measurement window, and a repulsive force (14) with the charged substance is given to dust and fine particles to which the ions adhere in a direction away from the optical measurement window. An optical measurement window device with a stain prevention mechanism for preventing dust and fine particles from adhering to the optical measurement window.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25019396A JP3263612B2 (en) | 1996-09-20 | 1996-09-20 | Optical measurement window device with stain prevention mechanism |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25019396A JP3263612B2 (en) | 1996-09-20 | 1996-09-20 | Optical measurement window device with stain prevention mechanism |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH1090167A JPH1090167A (en) | 1998-04-10 |
JP3263612B2 true JP3263612B2 (en) | 2002-03-04 |
Family
ID=17204207
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25019396A Expired - Lifetime JP3263612B2 (en) | 1996-09-20 | 1996-09-20 | Optical measurement window device with stain prevention mechanism |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3263612B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001289780A (en) * | 2000-04-06 | 2001-10-19 | Japan Organo Co Ltd | Densitometer |
JP4873954B2 (en) * | 2006-01-20 | 2012-02-08 | 新日本製鐵株式会社 | Observation window device |
JP6871315B2 (en) * | 2019-07-24 | 2021-05-12 | 株式会社ソディック | Manufacturing method for laminated modeling equipment and three-dimensional modeling |
-
1996
- 1996-09-20 JP JP25019396A patent/JP3263612B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH1090167A (en) | 1998-04-10 |
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