JP3250516B2 - Washing device and washing method - Google Patents

Washing device and washing method

Info

Publication number
JP3250516B2
JP3250516B2 JP10048498A JP10048498A JP3250516B2 JP 3250516 B2 JP3250516 B2 JP 3250516B2 JP 10048498 A JP10048498 A JP 10048498A JP 10048498 A JP10048498 A JP 10048498A JP 3250516 B2 JP3250516 B2 JP 3250516B2
Authority
JP
Japan
Prior art keywords
water
washing
pure water
tank
circulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP10048498A
Other languages
Japanese (ja)
Other versions
JPH11283956A (en
Inventor
進也 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP10048498A priority Critical patent/JP3250516B2/en
Publication of JPH11283956A publication Critical patent/JPH11283956A/en
Application granted granted Critical
Publication of JP3250516B2 publication Critical patent/JP3250516B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、水洗方法及び装置
に関し、特に、ウェハ表面を高スループットで水洗する
ための方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for rinsing water, and more particularly to a method and apparatus for rinsing a wafer surface with high throughput.

【0002】[0002]

【従来の技術】従来、エッチングや洗浄等が終了したウ
ェハ(半導体基板)を水洗する装置として、図5に示す
ような、枚葉式スピン水洗方式(「公知例1」という)
は、ウェハ表面の水洗効果は高いものの、ウェハ1枚ず
つ処理を行うためスループットが低い。この方式は、ウ
ェハを回転させた状態でその上から純水を給水しウェハ
表面を洗浄するものである。
2. Description of the Related Art Conventionally, as a device for washing a wafer (semiconductor substrate) which has been subjected to etching, washing, etc., a single-wafer spin washing method (referred to as "known example 1") as shown in FIG.
However, although the water washing effect on the wafer surface is high, the throughput is low because the processing is performed one by one. In this method, pure water is supplied from above while the wafer is rotated to clean the wafer surface.

【0003】また、図6に示すように、従来の注水のみ
のバッチ式ディップ水洗方式(「公知例2」という)
は、水洗槽内の純水の流量が供給される純水の流量によ
って制限されるため、ウェハ表面の水洗効果が低い。こ
の種の従来の水洗装置として、例えば特開平4−990
25号公報には、底部に排水口が設けられた水洗と、
排水口の位置より上部に設けられ半導体基板を入れたキ
ャリアを載置する載置板と、内面部に純水を吐出するた
めのノズルが設けられ、循環ポンプ及びフィルターを通
過した排水口からの純水は水洗上層部の蓋のノズルか
ら半導体基板の間に垂直方向に吐出するように構成され
ている水洗装置が提案されている。
Further, as shown in FIG. 6, a conventional batch dip washing method using only water injection (hereinafter referred to as "known example 2").
In the method, since the flow rate of pure water in the washing tank is limited by the flow rate of the supplied pure water, the effect of washing the wafer surface with water is low. For example, Japanese Patent Application Laid-Open No. 4-990 discloses a conventional water washing apparatus of this kind.
Japanese Patent Publication No. 25 discloses a washing tank provided with a drain port at the bottom,
A mounting plate that is provided above the position of the drain port and on which the carrier containing the semiconductor substrate is mounted, and a nozzle for discharging pure water on the inner surface portion are provided. A flushing device has been proposed in which pure water is discharged vertically from a nozzle of a lid at a top portion of the flushing tank to between semiconductor substrates.

【0004】[0004]

【発明が解決しようとする課題】上記したように、従来
の水洗方式は、スループットが低く、またウェハ表面の
水洗効果が低い、という問題点を有している。
As described above, the conventional rinsing method has problems that the throughput is low and the effect of rinsing the wafer surface is low.

【0005】したがって、本発明は、上記問題点に鑑み
てなされたものであって、その目的は、ウエハ表面の洗
浄効率を高めるとともに、スループットを向上する水洗
方法及び装置を提供することにある。
SUMMARY OF THE INVENTION Accordingly, the present invention has been made in view of the above problems, and an object of the present invention is to provide a water washing method and apparatus for improving the efficiency of cleaning the wafer surface and improving the throughput.

【0006】[0006]

【課題を解決するための手段】前記目的を達成するた
め、本発明は、ウェハを水洗するにあたり、水洗初期に
は水洗槽内の純水を循環ポンプを用いて強制的に排水
し、フィルターで濾過した循環水を供給することで水洗
を行い、一定時間後の水洗終期には循環を停止して純水
を水洗槽に供給することにより、新鮮な純水にて注水水
洗を行う。
According to the present invention, in order to achieve the above object, the present invention provides a method of washing a wafer with water, wherein pure water in a washing tank is forcibly drained using a circulating pump at an initial stage of the washing, and is then filtered. Washing is performed by supplying filtered circulating water, and at the end of washing after a certain period of time, circulation is stopped and pure water is supplied to the washing tank, so that water is washed with fresh pure water.

【0007】本発明の装置は、洗浄対象ウェハを収容す
る水洗槽と、前記水洗に純水の供給・遮断を制御する
ためのバルブであって、前記水洗の上流及び下流側に
配設された第1、第2のバルブと、前記水洗からの水
を濾過するフィルターと、前記水洗から強制的に排水
させ前記フィルターに供給し、前記フィルターで濾過さ
れた水を前記水洗に循環して供給するための循環ポン
プと、前記循環ポンプから供給された循環水の前記水洗
槽への供給・遮断を制御する第3のバルブと、を備え、
水洗初期には前記第1、第2のバルブを閉じ、前記水洗
槽内の純水を前記循環ポンプを用いて強制的に排水し、
循環水にて水洗を行い、一定時間経過後の水洗終期に
は、前記第3のバルブを閉じ、前記循環ポンプを停止し
て、前記第1、第2のバルブを開き、純水を前記水洗槽
に供給することにより、新鮮な純水にて注水水洗を行
う。
The apparatus according to the present invention comprises a washing tank for accommodating a wafer to be washed, and a valve for controlling the supply and shutoff of pure water to the washing tank , which are disposed upstream and downstream of the washing tank. the first is a second valve, a filter for filtering the water from the washing tank, forcibly drained from the washing tank is supplied to the filter, the filtered water in the filter to the water washing tank A circulation pump for circulating and supplying, and a third valve for controlling supply and cutoff of circulating water supplied from the circulation pump to the washing tank,
In the initial stage of washing, the first and second valves are closed, and pure water in the washing tank is forcibly drained using the circulation pump.
After rinsing with circulating water, at the end of rinsing after a certain period of time, the third valve is closed, the circulating pump is stopped, the first and second valves are opened, and pure water is rinsed with pure water. By supplying the water to the tank, water washing is performed with fresh pure water.

【0008】[0008]

【発明の実施の形態】本発明の実施の形態について以下
に説明する。本発明の実施の形態においては、図1を参
照すると、水洗初期には、循環ポンプ(5)を用いて、
水洗槽(1)内の純水を強制的に排水し、フィルター
(4)にて浄化した後、再び水洗槽(1)内へ供給する
ことにより循環水にて水洗を行う。そして、一定時間経
過後の水洗終期には、循環を停止し、純水を水洗槽に供
給することにより、新鮮な純水にて注水水洗を行う。
Embodiments of the present invention will be described below. In an embodiment of the present invention, referring to FIG. 1, in the initial stage of washing, a circulating pump (5) is used.
The pure water in the washing tank (1) is forcibly drained, purified by the filter (4), and then supplied again into the washing tank (1) to perform washing with circulating water. Then, at the end of the water washing after a certain period of time, the circulation is stopped, and pure water is supplied to the water washing tank, so that water washing is performed with fresh pure water.

【0009】本発明の水洗装置は、好ましい実施の形態
において洗浄対象ウェハを収容する水洗槽(1)と、水
に純の供給・遮断を制御するためのバルブであっ
て、前記水洗の給水側及び排出口側にそれぞれ配設さ
れる第1、第2のバルブ(22b)と、水洗の水
を濾過するフィルター(4)と、水洗から強制的に排
水させてフィルターに供給し、このフィルターで濾過さ
れた水を水洗内に循環して供給するための循環ポンプ
(5)と、循環ポンプから供給された循環水の水洗槽内
への供給・遮断を制御する第3のバルブ(3)と、備え
る。以下実施例に即して詳説する。
[0009] washing apparatus of the present invention, washing tank for accommodating the cleaned wafer in a preferred embodiment (1), a valve for controlling the supply and cutoff of the pure water washing tank, the washing tank the first is disposed on the water supply side and the outlet side respectively, the second valve (2 a, 2b), a filter (4) for filtering the water washing tank, forcibly drained from the washing tank is supplied to a filter, a circulation pump for feeding circulating the filtered water in the filter in the washing tank (5), controls the supply and interruption of the supplied circulating water of the washing tank from the circulation pump And a third valve (3). Hereinafter, the present invention will be described in detail with reference to examples.

【0010】[0010]

【実施例】本発明の実施例について図面を参照して以下
に説明する。図1は、本発明の一実施例の構成を示す図
である。図1を参照すると、本発明の一実施例において
は、ウェハを収容し水洗を行う水洗槽1、純水供給開閉
バルブ2a、2b、3、純水の循環を行うための循環ポ
ンプ5、純水の浄化を行うフィルター4、及び、純水を
供給する純水供給口6を備えて構成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing the configuration of one embodiment of the present invention. Referring to FIG. 1, in one embodiment of the present invention, a washing tank 1 for storing and washing a wafer, a pure water supply opening / closing valve 2a, 2b, 3; a circulation pump 5 for circulating pure water; The apparatus is provided with a filter 4 for purifying water and a pure water supply port 6 for supplying pure water.

【0011】図1を参照して、本発明の一実施例の動作
について説明する。純水で満たされた水洗槽1にウェハ
7を浸漬し、水洗初期には、水洗槽1の上流の純水供給
側に備えられた純水供給開閉バルブ2a、及び、水洗槽
1の上流の純水排水側に備えられた純水供給開閉バルブ
2bを閉じるとともに、循環ポンプ5の下流と、開閉バ
ルブ2bの上流の間に設けられた純水供給開閉バルブ3
を開け、循環ポンプ5を動作させる。
The operation of one embodiment of the present invention will be described with reference to FIG. The wafer 7 is immersed in the washing tank 1 filled with pure water, and in the initial stage of washing, the pure water supply opening / closing valve 2a provided on the pure water supply side upstream of the washing tank 1 and the upstream of the washing tank 1 are provided. The pure water supply opening / closing valve 2b provided on the pure water drain side is closed, and the pure water supply opening / closing valve 3 provided between the downstream of the circulation pump 5 and the upstream of the opening / closing valve 2b.
Is opened, and the circulation pump 5 is operated.

【0012】水洗槽1内の純水は、循環ポンプ4によっ
て、水洗槽1から強制的に排水され、フィルター5にて
浄化した後、再び水洗槽1へと供給することにより、循
環水にて水洗を行う。一定時間経過後の水洗終期には、
純水供給開閉バルブ2a、2bを開けるとともに、純水
開閉バルブ3を閉じ、循環ポンプ4を停止させる。そし
て水洗槽1には、純水供給口6から純水が供給され、新
鮮な純水にて注水水洗を行う。
The pure water in the washing tank 1 is forcibly drained from the washing tank 1 by the circulation pump 4, purified by the filter 5, and then supplied to the washing tank 1 again, so that the pure water is recirculated. Wash with water. At the end of washing after a certain period of time,
The pure water supply opening and closing valves 2a and 2b are opened, the pure water opening and closing valve 3 is closed, and the circulation pump 4 is stopped. Then, pure water is supplied to the washing tank 1 from a pure water supply port 6, and the pure water is washed with fresh pure water.

【0013】本実施例で、水洗を行った場合、全水洗時
間が3分であり、初期の循環水による水洗を1.5分
間、終期の注水による水洗を1.5分間行った。
In this embodiment, when the water washing was performed, the total washing time was 3 minutes, the initial washing with circulating water was performed for 1.5 minutes, and the washing with final water injection was performed for 1.5 minutes.

【0014】注水水洗時の水洗槽へ供給される純水流量
は公知例2と同様の1200L/Hである。
The flow rate of pure water supplied to the washing tank at the time of pouring water is 1200 L / H, which is the same as that of the known example 2.

【0015】なお、循環ポンプ5の送水能力は、300
0L/Hであり、循環水水洗時の水洗槽へ供給される純
水流量は、注水水洗時の2倍以上となる。
The water supply capacity of the circulation pump 5 is 300
It is 0 L / H, and the flow rate of pure water supplied to the rinsing tank at the time of circulating water rinsing is more than twice that at the time of water injection rinsing.

【0016】純水供給開閉バルブ2a、2b、循環ポン
プ5の動作は,マイクロコンピュータなどにより自動制
御され、純水供給開閉バルブ2a、2bが「閉」の時、
純水供給開閉バルブ3は「開」、循環ポンプ4は「作
動」、またはその逆となる。
The operations of the pure water supply opening / closing valves 2a and 2b and the circulation pump 5 are automatically controlled by a microcomputer or the like, and when the pure water supply opening / closing valves 2a and 2b are closed,
The pure water supply opening / closing valve 3 is “open” and the circulation pump 4 is “operating”, or vice versa.

【0017】本実施例によれば、水洗初期には、排水し
た純水を循環して再度、水洗槽に供給して循環水にて水
洗を行うため、大量の純水を必要とせず、純水使用量を
削減できる。図2は、本発明の一実施例における一日あ
たりの純使用量を、公知例1(図5参照)と、公知例
2(図6参照)と比較して示す図である。
According to the present embodiment, in the initial stage of washing, the drained pure water is circulated, supplied again to the washing tank, and washed with the circulating water, so that a large amount of pure water is not required. Water usage can be reduced. FIG. 2 is a diagram showing the amount of pure water used per day in one example of the present invention in comparison with Known Example 1 (see FIG. 5) and Known Example 2 (see FIG. 6).

【0018】また、本実施例によれば、循環を高速で行
うことによって、ウェハ表面の汚染物を効果的に水洗す
ることができる。図3は、本実施例におけるウェハ表面
残留イオン濃度を公知例1、2と比較して示す図であ
る。図3からも、本実施例は、公知例2よりも残留イオ
ンは少ない。
Further, according to this embodiment, by performing circulation at a high speed, contaminants on the wafer surface can be effectively washed with water. FIG. 3 is a diagram showing the concentration of residual ions on the wafer surface according to the present embodiment in comparison with known examples 1 and 2. FIG. 3 also shows that the present embodiment has less residual ions than the known example 2.

【0019】さらに、本実施例によれば、水洗効果が上
がり、スループットを向上する。図4は、比較例として
公知例1、2と、本実施例のスループットを比較して示
す図である。本実施例において一時間当たりのウエハ処
理枚数は500枚ほどとなり、上記公知例1、2よりも
単位時間当たりのウエハ処理枚数よりも遙か多い枚数を
処理できる。
Further, according to the present embodiment, the washing effect is improved and the throughput is improved. FIG. 4 is a diagram comparing the throughputs of the known examples 1 and 2 as a comparative example and the present embodiment. In this embodiment, the number of processed wafers per hour is about 500, and the number of processed wafers per unit time can be much larger than that of the known examples 1 and 2.

【0020】次に、本発明の第二の実施例について以下
に説明する。なお、本発明の第二の実施例において、そ
の構成は、図1に示したものと同様とされる。
Next, a second embodiment of the present invention will be described below. In the second embodiment of the present invention, the configuration is the same as that shown in FIG.

【0021】図1を参照すると、純水で満たされた水洗
槽1にウェハを浸漬し、水洗初期には純水供給開閉バル
ブ2a、2bから0〜100%純水の供給量を制御し、
純水供給開閉バルブ3を開け、循環ポンプ5を動作させ
る。水洗槽1内の純水は、循環ポンプ4によって水洗槽
から強制的に排水され、フィルター4にて浄化した後、
再び水洗槽1へと供給することにより、循環水にて水洗
を行う。同時に、純水供給口6から純水が供給され、新
鮮な純水にて注水水洗を行う。一定時間経過後の水洗終
期には、純水供給開閉バルブ2a、2bを開けるととも
に、純水開閉バルブ3を閉じ、循環ポンプ4を停止させ
る。水洗槽1には、純水供給口6から純水が供給され、
新鮮な純水にて注水水洗を行う。
Referring to FIG. 1, a wafer is immersed in a rinsing tank 1 filled with pure water, and in the initial stage of rinsing, a supply amount of 0 to 100% pure water is controlled from pure water supply opening / closing valves 2a and 2b.
The pure water supply opening / closing valve 3 is opened, and the circulation pump 5 is operated. Pure water in the washing tank 1 is forcibly drained from the washing tank by the circulation pump 4 and purified by the filter 4.
By supplying the water to the washing tank 1 again, washing with circulating water is performed. At the same time, pure water is supplied from the pure water supply port 6, and water washing is performed with fresh pure water. At the end of the washing after a lapse of a certain time, the pure water supply opening / closing valves 2a and 2b are opened, the pure water opening / closing valve 3 is closed, and the circulation pump 4 is stopped. Pure water is supplied to the washing tank 1 from a pure water supply port 6,
Rinse with fresh pure water.

【0022】これにより、水洗初期の循環水による水洗
時には、新鮮な純水も同時に供給されるため、水洗槽内
の純水流量が増大し、ウェハの浄化効果が高まる。
In this way, at the time of rinsing with circulating water at the initial stage of rinsing, fresh pure water is also supplied at the same time, so that the flow rate of pure water in the rinsing tank is increased and the effect of purifying the wafer is enhanced.

【0023】本実施例では、全水洗時間が3分であり、
初期の循環水による水洗を1.5分間、終期の注水によ
る水洗を1.5分間行った。注水水洗時の水洗槽へ供給
される純水流量は公知例2と同様の1200L/Hであ
る。なお、循環ポンプの送水能力は3000L/Hであ
り、循環水水洗時の水洗槽へ供給される純水流量は注水
水洗時の2倍以上となる。
In this embodiment, the total washing time is 3 minutes,
The initial washing with circulating water was performed for 1.5 minutes, and the final washing with water was performed for 1.5 minutes. The flow rate of pure water supplied to the rinsing tank at the time of rinsing with water is 1200 L / H, which is the same as that in the known example 2. In addition, the water supply capacity of the circulation pump is 3000 L / H, and the flow rate of pure water supplied to the rinsing tank at the time of circulating water washing is more than twice that at the time of water injection washing.

【0024】[0024]

【発明の効果】以上説明したように、本発明によれば、
下記記載の効果を奏する。
As described above, according to the present invention,
The following effects are obtained.

【0025】本発明の第1の効果は、大量の純水を必要
とせず、純水使用量を削減することができる、というこ
とである。
The first effect of the present invention is that the amount of pure water used can be reduced without requiring a large amount of pure water.

【0026】その理由は、本発明においては、水洗初期
には、排水した純水を循環して再度、水洗槽に供給して
循環水にて水洗を行うためである。
The reason for this is that, in the present invention, in the initial stage of washing, the drained pure water is circulated and supplied to the washing tank again to perform washing with the circulating water.

【0027】本発明の第2の効果は、循環を高速で行う
ことによって、ウェハ表面の汚染物を効果的に水洗(洗
浄)することができる、ということである。
A second effect of the present invention is that by performing circulation at a high speed, contaminants on the wafer surface can be effectively washed with water.

【0028】本発明の第3の効果は、水洗効果が上が
り、スループットを向上する、ということである。
The third effect of the present invention is that the water washing effect is improved and the throughput is improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例の構成を示す図である。FIG. 1 is a diagram showing a configuration of an embodiment of the present invention.

【図2】本発明の実施例の作用効果として、純水使用量
を公知例1、2と比較して示す図である。
FIG. 2 is a diagram showing the amount of pure water used as an effect of the embodiment of the present invention in comparison with known examples 1 and 2.

【図3】本発明の実施例の作用効果として、ウエハ表面
残留イオン濃度を公知例1、2と比較して示す図である
FIG. 3 is a diagram showing, as an operational effect of the embodiment of the present invention, a residual ion concentration on a wafer surface in comparison with known examples 1 and 2.

【図4】本発明の実施例の作用効果として、単位時間の
ウエハ処理枚数を公知例1、2と比較して示す図であ
る。
FIG. 4 is a diagram showing the number of processed wafers per unit time in comparison with the known examples 1 and 2, as an operational effect of the embodiment of the present invention.

【図5】第1の公知例を説明するための図である。FIG. 5 is a diagram for explaining a first known example.

【図6】第2の公知例を説明するための図である。FIG. 6 is a diagram for explaining a second known example.

【符号の説明】[Explanation of symbols]

1 水洗槽 2、3 純水供給開閉バルブ 4 フィルター 5 循環ポンプ 6 純水供給口 7 ウェハ DESCRIPTION OF SYMBOLS 1 Rinse tank 2, 3 Pure water supply opening / closing valve 4 Filter 5 Circulation pump 6 Pure water supply port 7 Wafer

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】ウェハを水洗するにあたり、水洗初期には
該ウェハが浸漬される水洗槽内の純水を循環ポンプを用
いて強制的に排水し、フィルターで濾過した循環水を前
記水洗槽に供給することで水洗を行い、一定時間後の水
洗終期には循環を停止して純水を水洗槽に供給すること
により、新鮮な純水にて注水水洗を行う、ことを特徴と
する水洗方法。
When washing a wafer with water, at the initial stage of washing, pure water in a washing tank in which the wafer is immersed is forcibly drained using a circulation pump, and circulating water filtered by a filter is supplied to the washing tank. Water washing by supplying water, and at the end of the water washing after a certain time, circulating is stopped and pure water is supplied to the water washing tank, so that water is washed with fresh pure water. .
【請求項2】洗浄対象ウェハを収容する水洗槽と、 前記水洗に純水の供給・遮断を制御するためのバルブ
であって、前記水洗の上流側及び下流側にそれぞれ配
設された第1、第2のバルブと、 前記水洗からの水を濾過するフィルターと、 前記水洗から強制的に排水させて前記フィルターに供
給し、前記フィルターで濾過された水を前記水洗に循
環して供給するための循環ポンプと、 前記循環ポンプから供給された循環水の前記水洗槽への
供給・遮断を制御する第3のバルブと、 備えたことを特徴とする水洗装置。
2. A rinsing tank for accommodating a wafer to be cleaned, and a valve for controlling the supply / cutoff of pure water to the rinsing tank , the valve being disposed upstream and downstream of the rinsing tank , respectively. first circulation and the second valve, a filter for filtering the water from the washing tank, is forcibly drained from the washing tank is supplied to the filter, the filtered water in the filter to the water washing tank A circulating pump for supplying the circulating water; and a third valve for controlling supply and shutoff of circulating water supplied from the circulating pump to the rinsing tank.
【請求項3】水洗初期には前記第1、第2のバルブを閉
じ、前記水洗槽内の純水を前記循環ポンプを用いて強制
的に排水し、前記フィルターで濾過した循環水にて水洗
を行い、一定時間経過後の水洗終期には、前記第3のバ
ルブを閉じ、前記循環ポンプを停止し、前記第1、第2
のバルブを開き、純水を前記水洗槽に供給することによ
り、新鮮な純水にて注水水洗を行う、ことを特徴とする
請求項2記載の水洗装置。
3. Initially, the first and second valves are closed, pure water in the washing tank is forcibly drained using the circulating pump, and washed with circulating water filtered by the filter. The third valve is closed and the circulating pump is stopped at the end of the water washing after the elapse of a predetermined time, and the first and second pumps are stopped.
The flushing device according to claim 2, wherein the valve is opened to supply pure water to the flushing tank, thereby performing flushing with fresh pure water.
【請求項4】水洗初期にも前記第1、第2のバルブを適
宜開いた状態で純水を前記水洗に供給するとともに、
前記水洗槽内の純水を前記循環ポンプを用いて強制的に
排水し、前記フィルターで濾過した循環水にて水洗を行
い、一定時間経過後の水洗終期には、前記第3のバルブ
を閉じ、前記循環ポンプを停止し、前記第1、第2のバ
ルブを開き、純水を前記水洗槽に供給することにより、
新鮮な純水にて注水水洗を行う、ことを特徴とする請求
項2記載の水洗装置。
4. At the initial stage of washing, pure water is supplied to the washing tank while the first and second valves are appropriately opened.
The pure water in the washing tank is forcibly drained using the circulating pump, washed with circulating water filtered by the filter, and at the end of washing after a certain period of time, the third valve is closed. Stopping the circulation pump, opening the first and second valves, and supplying pure water to the washing tank,
3. The water washing device according to claim 2, wherein the water washing is performed with fresh pure water.
JP10048498A 1998-03-27 1998-03-27 Washing device and washing method Expired - Fee Related JP3250516B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10048498A JP3250516B2 (en) 1998-03-27 1998-03-27 Washing device and washing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10048498A JP3250516B2 (en) 1998-03-27 1998-03-27 Washing device and washing method

Publications (2)

Publication Number Publication Date
JPH11283956A JPH11283956A (en) 1999-10-15
JP3250516B2 true JP3250516B2 (en) 2002-01-28

Family

ID=14275213

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10048498A Expired - Fee Related JP3250516B2 (en) 1998-03-27 1998-03-27 Washing device and washing method

Country Status (1)

Country Link
JP (1) JP3250516B2 (en)

Also Published As

Publication number Publication date
JPH11283956A (en) 1999-10-15

Similar Documents

Publication Publication Date Title
JP3338134B2 (en) Semiconductor wafer processing method
KR101464387B1 (en) Cleaning apparatus, cleaning method and storage medium
CN112740361A (en) Substrate processing apparatus and substrate processing method
CN110335807A (en) A kind of silicon wafer cleaning method
JP4692997B2 (en) Processing apparatus and processing method
JP3138901B2 (en) Substrate immersion processing equipment
JP3250516B2 (en) Washing device and washing method
JP3817093B2 (en) Processing apparatus and processing method
JP3556583B2 (en) Semiconductor substrate cleaning and drying equipment
US20050271985A1 (en) Method, apparatus and system for rinsing substrate with pH-adjusted rinse solution
KR100598918B1 (en) A solution supply method and chemical solution supply apparatus in use the semiconductor device fabrication installation
JPH10303171A (en) Method and device for wet-treating semiconductor wafer
JP4553781B2 (en) Substrate processing method, substrate processing apparatus, and substrate processing system
JP2002353186A (en) Liquid chemical recycling system for sheet substrate- cleaning device and sheet substrate-cleaning device
JP3582680B2 (en) Cleaning equipment
JP2541443B2 (en) Wet etching apparatus and filter regeneration method
JP2000058492A (en) Immersion processing system for substrate
KR20110082730A (en) Apparatus and method for cleaning wafer
JPH10163158A (en) Cleaning apparatus for sheetlike body
CN219163344U (en) Semiconductor cleaning equipment
KR20190139565A (en) Wafer cleaning apparatus
JPH088223A (en) Method and apparatus for cleaning semiconductor substrate
JPH05331652A (en) Wet film-forming device
KR19990081141A (en) Parts cleaning device of semiconductor cleaning equipment
JPH10189523A (en) Cleaning apparatus for semiconductor wafer

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20011016

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071116

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081116

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081116

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091116

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091116

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101116

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101116

Year of fee payment: 9

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101116

Year of fee payment: 9

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111116

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111116

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121116

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121116

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131116

Year of fee payment: 12

LAPS Cancellation because of no payment of annual fees