JP3243317B2 - Probe pin mounting device and replacement device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe pin mounting device and a replacement device for a circuit board inspection machine.

[0002]

2. Description of the Related Art Disconnection or short circuit of printed wiring on a circuit board,
2. Description of the Related Art In order to perform various inspections such as the type and performance of components mounted on a circuit board, there is an inspection machine that performs inspection by bringing a probe pin into contact with a measurement site. In this inspection machine, besides using a dedicated jig (pin board) in which probe pins are fixed in accordance with a circuit board, there is also an inspection apparatus in which probe pins are moved by an XY unit and a Z-axis unit.

[0003]

In the movable type, there is no need to make a dedicated pin board for each substrate to be measured, and the probe pins are mounted to be inclined with respect to the Z axis via the Z axis unit. This makes it possible to make an oblique contact with the measurement site, and has the advantage that measurement can be performed even on a high-density mounting substrate, which is difficult to measure with a normal pin board. On the other hand, the number of times one probe pin is used is much greater than that of a probe pin on a normal pin board, so that the tip of the probe pin is greatly consumed and the probe pin is frequently replaced. In addition, when a probe pin having a different tip shape, such as a probe pin for a chip component or a probe pin for a QFP (Quarter Flat Package), is used depending on the difference between the objects to be measured, it is necessary to replace the probe pin each time. In these cases, since the operator loosens the mounting screws and replaces the probe pins, work efficiency is reduced.

An object of the present invention is to solve the above-mentioned problems, and an object of the present invention is to provide a probe pin mounting device for a circuit board inspection machine which can easily replace a probe pin.

It is another object of the present invention to provide a probe pin exchanging apparatus for a circuit board inspection machine, which is capable of automatically exchanging a plurality of probe pins.

[0006]

According to the first aspect of the present invention, a chuck unit is provided between a Z-axis unit and a probe pin, and the probe pin is connected to the Z-axis unit by the chuck unit. Attached to
The probe pin has a lock groove formed in the insertion shaft portion in the circumferential direction, and the chuck unit fixes the cylindrical collet body into which the insertion shaft portion of the probe pin is inserted, and the collet body to the Z-axis unit. The mounting base, a tapered surface that becomes thicker toward the tip formed on the outer periphery of the tip portion of the collet body, a plurality of split grooves formed along the axial direction on the tapered surface, and divided by split grooves, A plurality of holding claws urged to open, a locking portion formed inside the distal end of the holding claw and locked in the lock groove, and a holding claw portion of the collet body movably provided in the axial direction. A lock sleeve, a tapered surface formed on the inner periphery of the lock sleeve and opened toward the distal end, and a bias of the lock sleeve toward the distal end on the holding claw of the collet body, thereby tapering the lock sleeve. Those constructed from an urging means for pressing the holding claw inward by.

[0007] The invention according to claim 2 is a chuck chuck.
Make electrical contact with the probe pins on the knit collet body
A connector body that, by providing a spring means for urging in a direction to discharge the probe pins in the connector body, in which to facilitate the discharge of the probe pins.

According to a third aspect of the present invention, a guide plate for guiding the movement of the lock sleeve is provided on the mounting base to improve the positioning accuracy of the probe pins.

According to a fourth aspect of the present invention, there is provided an apparatus for exchanging probe pins using the probe pin mounting device of the circuit board inspection device according to the first or second or third aspect, wherein the probe pins are inserted from the tip. A probe holder having a storage hole, a holder base on which a plurality of probe holders are mounted with the insertion direction of the probe pin aligned, a first moving unit for moving the holder base in the axial direction of the probe pin, and the lock sleeve. A chuck release member for bringing the lock member into the unlock position, a second moving portion for moving the chuck release member in the axial direction of the probe pin, and operating the first and second moving portions to move the probe pin. A replacement controller is provided to automate the replacement of the probe pins.

According to a fifth aspect of the present invention, there is provided the probe pin changing device according to the fourth aspect , wherein
Upon replacement, the controller controls the movable part.
After the chuck unit is aligned with the position of the probe holder to be controlled and stored, the first moving unit is advanced and the holder base is raised to insert the probe pin into the storage hole of the probe holder , and then the second moving unit Is advanced to raise the chuck release member to remove the probe pin from the chuck unit, and then the first and second moving parts are sequentially retracted to lower the probe table and the chuck release member, and thereafter, the probe to be used. Align the chuck unit with the position of the probe holder in which the pin is stored, advance the second moving unit, raise the chuck release member, and allow the chuck unit to insert the probe pin, and then advance the first moving unit. Then, insert the probe pin into the storage hole of the chuck unit, and then, after lowering the chuck release member by retracting the second moving unit, Retracting the first moving unit is configured to lower the holder base.

[0011]

When removing the probe pin from the chuck unit, the lock sleeve is lifted upward. As a result, the holding claw is opened, the locking between the locking portion of the holding claw and the lock groove of the probe pin is released, and the probe pin falls off. When mounting the probe pin, the insertion shaft portion of the probe pin is inserted into the collet body with the lock sleeve raised. After that, when you release the lock sleeve,
The lock sleeve is urged downward, and the holding claws of the collet body are pressed inward by the tapered surface of the lock sleeve. Is fixed.

The automatic replacement of the probe pins using the chuck unit is performed as follows. First, the holder base is raised to insert the probe pins into the storage holes of the probe holder. The chuck releasing member rises to lift the lock sleeve upward, and removes the probe pin from the chuck unit. The holder base and the chuck release member are lowered to separate the removed probe pin from the chuck unit. Next, the chuck unit is adjusted to the position of the probe holder in which the probe pins to be used are stored. The chuck releasing member is lifted to lift the lock sleeve upward to release the lock, and wait for insertion of the probe pin. The holder base rises to insert the probe pin into the collet body of the chuck unit. When the chuck release member is lowered, the lock sleeve is urged downward, and the holding claw is pushed inward by the tapered surface of the lock sleeve, so that the chuck unit is in the locked state of the probe pin. Thereafter, the holder base descends and separates from the chuck unit. As described above, the probe pins are automatically exchanged by the interlocking of the holder base and the chuck releasing member.

[0013]

1 to 3 show a probe pin 10 and a chuck unit 11 for detachably holding the same. As shown in FIG. 1, a lock groove 12 is formed in the probe pin 10 in the circumferential direction, and a locking portion 14 (see FIG. 3) of the holding claw 13 of the chuck unit 11 is locked in this. Then, the probe pins 10 are fixed in the chuck unit 11. A rotation restricting groove 16 is formed in a part of a peripheral surface of the insertion shaft portion 15 above the probe pin 10 along an axial direction, and a rotation restricting pin 17 of the chuck unit 11 is formed therein. Entry, probe pin 10
Regulate the rotation of

The chuck unit 11 is roughly divided into
It comprises a mounting base 21, a rotation restricting bracket 22, a collet body 23, a lock sleeve 24, a coil spring 25, and a terminal connector 26.

The mounting base 21 is formed in a T-shape by a rectangular vertical plate 21a arranged in the vertical direction and a horizontal plate 21b mounted at a right angle to the center of the rectangular vertical plate 21a. The holding hole 30 of the collet main body 23 is formed in the center of the horizontal plate 21b. A notch 31 is formed in the holding hole 30, whereby the horizontal plate 21 b is separated so as to be a holding bracket 32. Holding bracket 32
A fixing screw 34 is attached to the collet body 23, and the upper part of the collet body 23 is fastened and fixed by the holding bracket 32.

The collet main body 23 is formed in a cylindrical shape, and a tapered surface 35 is formed on the outer periphery of the distal end portion, the taper surface 35 increasing in thickness toward the distal end. This tapered surface 35
Are formed with four split grooves 36 along the axial direction of the collet main body 51, and the tapered surface portion is divided into four holding claws 13 by the split grooves 36. Holding claw 1
A thin portion 38 is provided on the upper side of 3, and the holding claw 13 is configured to open outward due to its spring property.

At the inside of the tip of the holding claw 13, a locking portion 14 is formed to protrude inward. This locking part 14
Penetrates into the lock groove 12 of the probe pin 10 to restrict the movement of the probe pin 10 in the axial direction. Further, a flange 39 for preventing the lock sleeve 24 from dropping is formed on the outside of the tip of the holding claw 13.

The lock sleeve 24 is provided on the collet main body 23.
Are provided movably in the axial direction on the holding claw 13 portion, and are urged downward by the coil spring 25, that is, downward. The inner peripheral surface of the lock sleeve 24 is a tapered surface 45 that opens toward the tip,
The inclination angle of the tapered surface 45 is substantially the same as that of the tapered surface 35 of the holding claw portion of the collet main body 23. As a result, when the lock sleeve 24 moves to the distal end side on the holding claws 13 of the collet body 23 by the coil spring 25, the holding claws 13 are tapered by the tapered surfaces 45 and 35, and the locking portions 14 And the probe pin 10 can be firmly held.

A terminal connector 26 is fitted into the collet main body 23 from above. Terminal connector 26
At the upper end of the collet main body 23, a part of its peripheral surface is cut out, and a pair of chamfers 26a and 23a are formed. The chamfered portions 26a and 23a are planes parallel to each other, and when they come into contact with the rotation restricting surface 22a of the rotation restricting bracket 22, the collet main body 23 and the terminal connector 26 are non-rotatably fixed to the mounting base 21. You. The rotation restricting bracket 22 is fixed to the horizontal plate 21b of the mounting base 21 by two mounting screws 47, and has a through hole 22b for projecting the connector main body 52 upward.

The terminal connector 26 is composed of a metal holder 50 and a connector main body 52 movably mounted in an axial direction via an insulating sleeve 51. The connector body 52 is urged downward by a coil spring (not shown) incorporated in the sleeve 51.
The contact portion 53 of the probe pin 10 is always in contact. Moreover, this urging, when removing the probe pins 10 to lift the locking sleeve 24 upwards, the probe pin 10 is simply whether the collet body 23 et discharge <br/> issued. Accordingly, the probe pin 10 is dropped by the chuck unit 1 in combination with the drop of the probe pin 10 due to its own weight.
It will surely come off from 1.

As shown in FIG. 4, four connector bodies 52 are attached to the holder 50 at a 90 ° pitch in the circumferential direction, and two connector portions 54a, 54b, 55a, 55
It is configured to be able to contact both the X-direction or Y-direction component chip probe pins 56 and 57 having b. Then, as shown in FIG.
A connection cord 58 is connected to the upper end of the probe pin, whereby an electric signal from the probe pin 10 is sent to the measuring instrument side.

Next, an automatic probe pin changing apparatus using the chuck unit 11 will be described. In FIG. 5, a base 60 is provided with a pair of linear bearings 61 and 62.
The probe holder base 63 and the chuck release plate 64 are attached so as to be movable in parallel. The base 60 is formed of a rectangular plate, and the linear bearings 61 and 62 are attached to both ends of the base 60 via brackets 65 in the vertical direction.

The linear bearings 61 and 62 are composed of a rail 70 and sliders 71 and 72 guided by the rail 70. The probe holder 63 and the chuck release plate 64 are moved in parallel with respect to the base 60. .

The probe holder base 63 is fixed to the slider 71 via a bracket 73. On the probe holder base 63, a number of holder mounting holes are formed in a row at a predetermined pitch. In these mounting holes, a probe holder 7 is provided.
5, 76 are detachably attached by screws.
The probe holders 75, 76 have probe pin storage holes 75a, 76a formed in the axial direction. In the present embodiment, two types of probe holders 75 and 76 are attached according to the shape of the probe pins used, but these probe holders are appropriately changed according to the probe pins used.

The chuck release plate 64 is fixed to the slider 72 via a bracket 80 above the probe holder base 63. A chuck release hole 81 is formed in the chuck release plate 64 at a position corresponding to each of the holders 75 and 76 of the probe holder base 63. Chuck release hole 81
Is constituted by a round hole having a diameter larger than the maximum diameter of the probe pin 10 and smaller than the diameter of the lock sleeve 24 of the chuck unit 11. The probe pin 10 is inserted into and removed from the probe holders 75 and 76 through the release hole 81. Is done.

Two air cylinders 85 and 86 are mounted on the base 60 via a mounting bracket 84. One air cylinder (hereinafter referred to as A cylinder) 85
The rod 85a passes through the hole 87 of the probe holder base 63, and the tip thereof is fixed to the chuck release plate 64. The tip of a rod 86 a of the other air cylinder (hereinafter, referred to as a B cylinder) is fixed to the holder base 63. Each of the air cylinders 85, 86 protrudes downward from an opening 88 formed in the base 60, and
5,86 are stored compactly.

Further, a sensor mounting bracket 90 is mounted on the base 60, and a probe sensor 91 is mounted on the sensor mounting bracket 90. Probe sensor 91
Detects whether the probe pins 10 are in the probe holders 75 and 76. For this reason, the probe sensor 91 is attached at a position for detecting the probe pin 10 housed in each of the probe holders 75 and 76, and a reflection type optical sensor including a light emitter and a light receiver is used. Note that, instead of the reflection-type optical sensor, a transmission-type optical sensor that detects light by blocking light rays, another mechanical sensor, a magnetic sensor, or the like may be used.

Next, the operation of this embodiment will be described. When replacing the probe pin 10, as shown in FIG. 5, the XY unit 96 positions the chuck unit 11 coaxially with the probe holder 76 to be stored, and the Z-axis unit 95 moves the chuck unit 11 as shown in FIG. Then, the chuck unit 11 moves down to the replacement position in the Z-axis direction.

Next, as shown in FIG.
As a result, the holder base 63 is raised, and the probe pins 10 are stored in the storage holes 76 a of the holder 76.

Next, as shown in FIG.
As a result, the chuck release plate 64 is raised, and the lock sleeve 24 is lifted upward to release the lock of the chuck unit 11. When the chuck release plate 64 is raised to shift the lock sleeve 24 upward, as shown in FIG.
Is retracted, the lock of the probe pin 10 is released, and the probe pin 10 is ejected from the chuck unit 11.

Then, as shown in FIG.
6, the holder base 63 is lowered. As a result, the probe pin 10 is removed from the chuck unit 11,
It is stored in the holder 76.

Thereafter, as shown in FIG. 10, the chuck release plate 64 is lowered by the A cylinder 85, and the chuck unit 11 is moved horizontally to be set coaxially with the probe pin 79 to be newly attached.

Next, as shown in FIG.
The chuck release plate 64 is lifted by 5 to raise the lock sleeve 24, and the chuck unit 11 is released from the lock state to wait for insertion of the probe pin 79.

Then, as shown in FIG. 12, the probe base 63 is raised by the B cylinder 86, and the upper portion of the probe pin 79 in the holder 76 is inserted into the chuck unit 11. At this time, as shown in FIG. 1, the rotation restricting pin 17 of the collet body 23 enters the rotation restricting groove 16 of the probe pin 10, so that the rotation of the probe pin 10 becomes impossible.

Next, as shown in FIG.
5, the chuck release plate 64 is lowered. In this state, as shown in FIGS. 2 and 3, since the lock sleeve 24 is shifted downward by the bias of the coil spring 25, the tapered surface 45 of the holding claw 13 is pressed by the tapered surface 45 of the lock sleeve 24, The holding claws 13 become narrow. As a result, the locking portion 14 of the holding claw 13 is
And the probe pin 79 is firmly fixed by the holding claw 13 of the collet main body 23 so as not to move in the axial direction.

Next, as shown in FIG.
6, the chuck release plate 64 is lowered to remove the probe pin 79 from the holder 76. Thereafter, as shown in FIG. 5, the chuck unit 11 is raised by the Z-axis unit 95, is positioned above a predetermined measurement site by the XY unit 96, and the probe pin is lowered by the Z-axis unit 95, and the measurement is performed. The tip of the probe pin contacts the site, and an electrical signal is sent to the measuring instrument. When the next probe pin is replaced, the same operation as described above is repeated.

In the above embodiment, the air cylinder 8
Although the holder base 63 and the chuck release plate 64 are moved up and down by 5, 86, they may be moved up and down by using a link, a crank mechanism, and a rack and pinion.

In the above embodiment, the holders 76 are arranged in one row on the holder base 63, but they may be arranged in a plurality of rows.

In the above embodiment, the probe pin 10 is initially discharged by the coil spring (not shown) of the connector main body 53 of the terminal connector 26. In addition, the discharge of the probe pin 10 into the collet main body 23 is performed. May be arranged.

Further, as shown in FIG.
The chuck unit 102 may be formed by extending the lower part of the sheet No. 00 and horizontally providing the guide plate 101 on the extended part. The same components as those in the above embodiment are denoted by the same reference numerals, and duplicate description is omitted. In this case, a guide hole 103 for guiding the lock sleeve 24 is formed in the center of the guide plate 101. Thereby, the lock sleeve 24 is smoothly guided in the up-down direction, and the shift of the lock sleeve 24 can be reliably performed. Moreover, since the lock sleeve 24 is firmly held by the guide hole 103, the probe pin 1
0 does not move in the axial direction, and the positioning accuracy of the probe pin can be improved.

[0041]

As described above, according to the present invention,
A cylindrical collet body, a plurality of holding claws formed on the outer periphery of the tip of the collet body, a lock sleeve movably mounted on the holding claws, and a biasing means for biasing the lock sleeve downward. Since the chuck unit is configured, the probe pin can be attached and detached in a one-touch manner with a simple configuration. In addition, since the locking part formed inside the tip of the holding claw is inserted into the lock groove of the probe pin and holds the probe pin, it is securely fixed so that the probe pin does not move in the chuck unit in the axial direction can do.

The holder base on which a plurality of probe holders are mounted so that the probe pins are inserted in the same direction, and the chuck release member which engages with the lock release member of the chuck unit and moves the lock sleeve to the retracted position are moved in parallel with each other. Since the probe pins are freely provided and moved forward and backward, the probe pins can be removed from the chuck unit and a new probe pin can be automatically attached to the chuck unit. Further, by attaching a large number of holders to the holder base, a large number of probe pins can be exchanged. In addition, the moving means can be shared when each probe pin is replaced, and the configuration can be simplified.

[Brief description of the drawings]

FIG. 1 is an exploded perspective view showing a probe pin mounting device of a circuit board inspection machine embodying the present invention.

FIG. 2 is a perspective view showing a holding state of a probe pin by a chuck unit.

FIG. 3A is a side view showing a state in which a probe pin is held by a chuck unit, and FIG. 3B is a side view showing a state in which the probe pin is released from the chuck unit.

FIG. 4 is a perspective view showing a connector connection state of probe pins having different mounting directions in an X direction and a Y direction.

FIG. 5 is a perspective view showing a probe pin changing device using the chuck unit.

FIG. 6 is a front view illustrating a procedure for exchanging probe pins and showing a state in which the probe pins are positioned in a probe holder to accommodate the probe pins.

FIG. 7 is a front view showing a state where the holder base is lifted and the probe pins are stored in the probe holder.

FIG. 8 is a front view showing a state in which a lock release plate is lifted and a chuck unit is opened.

FIG. 9 is a front view showing a state in which a probe is removed from a chuck unit by lowering a holder base.

FIG. 10 is a front view showing a state where the chuck unit is moved in parallel to a position above a new probe pin.

FIG. 11 is a front view illustrating a state in which a lock release plate is lifted to open a chuck unit and a probe pin is waiting to be inserted;

FIG. 12 is a front view showing a state where the holder base is lifted and a probe pin is inserted into the chuck unit.

FIG. 13 is a front view showing a state where the lock release plate is lowered to lock the chuck unit.

FIG. 14 is a front view showing a state in which the probe holder attached to the chuck unit is lowered from the probe holder by lowering the holder base.

FIG. 15 is a perspective view showing another chuck unit.

[Explanation of symbols]

 10, 79 Probe pin 11 Chuck unit 12 Lock groove 16 Rotation restricting groove 17 Rotation restricting pin 21 Mounting base 23 Collet body 24 Lock sleeve 25 Coil spring 26 Terminal connector 35, 45 Tapered surface 60 Base 61, 62 Linear bearing 63 Probe Holder base 64 Chuck release plate 75, 76 Probe holder 81 Chuck release hole 85 A cylinder 86 B cylinder 90 Sensor mounting bracket 91 Probe sensor 95 Z axis unit 96 XY unit

Claims (5)

(57) [Claims] An X along a plane parallel to a circuit board to be inspected.
A movable portion that moves in the -Y-axis direction, is attached to the movable portion, and move forward and backward can be Z-axis unit in the Z axis direction, the Z
Mounted on the shaft unit, in the probe pin mounting apparatus for circuit board inspection machine equipped with a probe pin in electrical contact with the measurement site of the circuit board to be inspected, the chuck unit between the Z-axis unit and the probe pins provided, attaching the flop <br/> Robupin by the chuck unit to the Z-axis unit, the probe pin in the insertion shaft portion, a locking groove formed in the circumferential direction, the chuck unit, said probe a tubular collet body insertion shaft portion of the pin is inserted, a mounting base for fixing the collet body to the Z-axis unit, a tip formed on the outer periphery of the distal end portion of the Kore <br/> Tsu DOO body A tapered surface that becomes thicker as it goes, and a plurality of split grooves formed along the axial direction on this tapered surface, are divided by this split groove,
A biased plurality of holding claws to open outwardly, is formed at the distal end inside the holding <br/> nails, and the locking portion for locking said lock grooves, holding claws portion of the collet body with a locking sleeve which is provided movably in the axial direction, and the tapered surface formed to open in accordance formed on the inner peripheral toward the tip of the locking sleeve, the distal end side of the locking sleeve on the retaining claws of the collet body and energized, the <br/> tapered surface by the holding claws probe pin mounting apparatus for circuit board inspection machine, characterized by being configured and a biasing means for pressing the inside of the locking sleeve. 2. The collet book of the chuck unit.
The body is a connector body that makes electrical contact with the probe pins
The provided, the probe pin mounting apparatus for circuit board inspection apparatus according to claim 1, characterized in that spring means for urging in a direction to discharge the probe pins in the connector main body. 3. A pre-Symbol probe pin mounting apparatus for circuit board inspection apparatus according to the guide plate for guiding the movement of the locking sleeve to claim 1 or 2, characterized in that provided in the mounting base. 4. A probe pin exchanging device using a probe pin attaching device of a circuit board inspection machine according to claim 1, 2 or 3 , wherein a probe holder having a storage hole into which the probe pin is inserted from a tip is provided. a holder base mounted a plurality of the probe holder combined insertion direction of the probe pin, and a first moving unit for moving the holder base in the axial direction of the probe pin, engaged with the locking sleeve a chuck releasing member to do this unlocked position Te, a second moving unit for moving the chuck releasing member in the axial direction of the probe pin, wherein by actuating the first and second moving portions A probe pin exchanging device for a circuit board inspection machine, comprising: a controller for exchanging probe pins. 5. The method according to claim 5 , wherein when replacing the probe pin,
Controller, move the chuck unit to the position of the flop <br/> Robuhoruda be accommodated by controlling the movable unit,
Advancing the first moving portion is raised the holder base
The probe pin after insertion into housing bore of the probe holder, the second mobile unit to advance the chucking <br/> Unlocking member raises the <br/> probe pins from the chuck unit the removed, then the first and second moving portion is retracted in order lowers the probe base and the chuck releasing member, and thereafter, the probe the probe pins to be used is accommodated the position of the holder fit the chucking <br/> click unit, the chuck unit is raised the <br/> chuck releasing member to advance the second mobile unit
After making the probe pin insertable, the first
The moving portion is moved forward in the hole of the chuck unit
Inserting the probe pin, then, after retracting it is lowered the chuck releasing member said second mobile unit, before
Ru is lowered the holder stand is retracted the serial first moving portion
Probe pin exchanging device of the circuit board inspection apparatus according to claim 4, wherein the arc.