JP3224585U - Test socket device - Google Patents

Abstract

An object of the present invention is to provide a test socket device for performing an electrical test on a plurality of electronic components having a uniform operating force and good measurement accuracy. The positioning unit includes a positioning base and a positioning plate connected to the mounting base, the positioning plate having a first surface and a second surface opposite thereto, The test socket unit comprises two test socket groups on the second surface provided on the positioning plate at an interval, each of the test socket groups being an upper connection block 511, a first probe card 512 connected to the upper connection block. , A second probe card 513, and an insulating sheet provided between the first and second probe cards, wherein the first and second probe cards each project outward and are inclined at the same angle. It has a second detection end and detects electrical properties of the plurality of electronic components. [Selection diagram] FIG.

Description

  The present invention relates to a test socket device, and more particularly, to a test socket device used for performing an electrical test on a plurality of electronic components.

  As the development of electronic products becomes more and more popular, it is required to ensure the quality of electronic products at the time of shipment. In the manufacturing, assembly and pre-shipment processes of electronic components, defects are generated due to inevitable causes between each process. In order to maintain stable product quality, it is necessary to perform defect detection on the produced electronic components, analyze the causes of these defects based on the detection results, and further grasp the defects, and evaluate the process yield and reliability of the electronic components. Achieve the goal of improving.

  When a test is performed on the electronic component to be measured, the electronic component is connected to the instrument and transmits a feedback signal generated by the drive signal to the measuring instrument. Taking the four-terminal method as an example, two probes (four probes in total) need to be in contact with both ends of each object to be measured. Currently, four end points are detected by four probe cards with four independent rails. By moving the measurement object by connecting the object to be measured, the voltage drop due to the transmission of the drive signal of the drive terminal can be reduced and the accuracy in the measurement can be increased, but the adjustment and mounting difficulties in actual use are reduced. In addition to the increase in mounting flatness, the probe card has various problems such as wear, looseness, detachment, poor contact or breakage, indirectly affecting the results of electrical measurement, Raises concerns about accuracy.

  All of the above drawbacks represent various problems arising from the testing of conventional electronic components. Therefore, how to solve the problem of measurement accuracy and further improve the production efficiency and production quality of electronic components is an important issue facing people in various fields. Therefore, it is certainly necessary to propose a better solution for the prior art.

  In view of the above, an object of the present invention is to provide a test socket device that includes a positioning unit and a test socket unit and is used for performing an electrical test on a plurality of electronic components.

  The positioning unit includes a fixed base and a positioning plate connected to the fixed base, the positioning plate has a first surface and a second surface opposite thereto, and the test socket unit is mounted on a second surface of the positioning plate. Two test socket groups spaced apart from each other, the test socket groups each having an upper connection block, a first probe card connected to the upper connection block, a second probe card, and the first and second test cards. An insulating sheet provided between the two probe cards, the first and second probe cards each having first and second detection ends projecting outward and inclined at the same angle; The electrical properties of the electronic components.

  In another technical means of the present invention, the upper connection block has a first end and a second end opposite thereto, and the first and second probe cards and the insulating sheet are attached to the first end. And the two test socket groups further have a lower connection block respectively, the lower connection block being respectively connected to the fixed base and the second end of the upper connection block to position the test socket unit in the positioning. Secure to the unit.

  In another technical solution of the present invention, the first probe card has three first connection ports further arranged in a row, and the second probe card has two first connection ports further arranged in a row. It has two connection ports, the insulating sheet has two third connection ports installed in a line, and the first and second detection ends are close to the first end of the upper connection block. Will be installed.

  In still another technical solution of the present invention, the first and second detection ends of the two test socket groups are inclined at opposite and opposite angles.

  In another technical means of the present invention, the above-mentioned first and second probe cards further have first and second connection ends formed on one side, and the first and second connection ends are the first and second connection ends. First, it is installed far away from the second detection end.

  In another technical solution of the present invention, the positioning unit described above further comprises two separately provided slide rails on the second surface of the positioning plate, and the two upper connecting blocks are connected to each other. Limit the sliding direction.

  In still another technical means of the present invention, the upper connection block further has a limit groove located at the second end, the lower connection block has a protrusion located at the limit groove, and The width of the protrusion is smaller than the limit groove.

  In another technical solution of the present invention, the two test socket groups described above further include a first fixing device, and the upper connection block is fixed to the positioning plate.

  In another technical solution of the present invention, the two test socket groups described above respectively have a first, a second fixing sheet and a second fixing tool, wherein the second fixing tool is respectively the first and second fixing sheets. To fix the first and second fixing sheets to the first and second connection ends.

  In still another technical solution of the present invention, each of the two test socket groups described above has a locking base and a third fixture, and the locking base has three fourth connection ports installed in a row. The third fixtures respectively pass through the plurality of fourth connection ports to fix the two locking bases to the two upper connection blocks.

  In another technical means of the present invention, the third fixture farthest from the first and second detection ends described above passes only through the first connection port farthest from the first detection end. .

  In another technical solution of the present invention, the first, second, and third fasteners described above are selected from screws, studs, and combinations thereof.

  According to an advantageous effect of the present invention, the two test socket groups each include the upper connection block, the first and second probe cards, and the insulating sheet, and the test socket device is operated to operate the plurality of electronic components. When detecting the electrical properties of the two, the operation of the first and second probe cards of the two test socket groups provided in the positioning unit are matched, so that the operating force is uniform and the unevenness of wear is caused. The measurement accuracy is hardly affected, and the production yield of electronic components is further improved.

FIG. 1 is a schematic exploded perspective view illustrating a preferred embodiment of a test socket device according to the present invention. FIG. 2 is a schematic perspective view illustrating an aspect in which the preferred embodiment is mounted on a connection unit. FIG. 3 is a schematic perspective view illustrating the preferred embodiment viewed from another viewing angle.

  The features and technical contents of the related application according to the present invention will be clearly shown by the following detailed description of preferred embodiments with reference to the drawings.

  Referring to FIGS. 1, 2 and 3, a preferred embodiment of a test socket device according to the present invention is applied to performing an electrical test on a plurality of electronic components, wherein the test socket device is connected. A positioning unit 3 and a test socket unit 5 are provided on a table for performing detection via the unit 1.

  The positioning unit 3 includes a fixed base 31, a positioning plate 32 connected to the fixed base 31, and slide rails 33 separately provided on the positioning plate 32 at intervals. It has a first surface 321 and an opposite second surface 322, and the two slide rails 33 are provided on the second surface 322.

  The test socket unit 5 includes two test socket groups 51 provided on the second surface 322 of the positioning plate 32 at an interval. The test socket groups are respectively provided on the upper connection block 511, the first probe card 512, the second probe card 513 connected to the upper connection block 511, and between the first and second probe cards 512, 513. And a lower connection block 515. The material of the insulating sheet 514 is selected from plastic to insulate the current from the first and second probe cards 512 and 513.

  The two slide rails 33 are provided between the second surface 322 of the positioning plate 32 and the upper connection block 511 to limit the sliding direction of the two upper connection blocks 511. At the time of actual operation, an actuator (not shown) is installed to operate the test socket device with respect to the connection unit 1 to perform a detection operation. With the two slide rails 33 and the two first probe cards 512 and the two second probe cards 513 on the two test socket groups 51, the installation cost for moving four probe cards with four rails can be reduced. .

  The upper connection block 511 has a first end 5111 and a second end 5112 opposite thereto, and the first and second probe cards 512, 513 and the insulating sheet 514 are connected to the first end 5111. , The lower connection block 515 is connected to the fixing base 31 and the second end 5112 of the upper connection block 511, respectively, to fix the test socket unit 5 to the positioning unit 3.

  The upper connection block 511 further has a limit groove 5113 located at the second end 5112, the lower connection block 515 has a protrusion 5151 located at the limit groove 5113, and the protrusion 5151 Is smaller than the limit groove 5113, and fixes the assembly position of the lower connection block 515 and the upper connection block 511. The limit groove 5113 is used to improve the alignment when replacing the first and second probe cards 512, 513.

  In addition, the first and second probe cards 512 and 513 have first and second detection ends 5121 and 5131 that project outward and are inclined at the same angle, respectively, so as to electrically connect the plurality of electronic components. Detect properties. In addition, the first and second detection ends 5121 and 5131 of the two test socket groups 51 installed at an interval are inclined and installed at an opposite angle to face each other, so that the first and second detection sockets 5121 and 5131 are installed in an intersecting manner. The ends of the second detection ends 5121 and 5131 face each other and are spaced apart.

  Each of the two test socket groups 51 has the upper connection block 511, the first and second probe cards 512 and 513, the insulating sheet 514, and the lower connection block 515, and the test socket device is operated. When the electrical properties of the plurality of electronic components are detected, the operations of the first and second probe cards 512 and 513 of the two test socket groups 51 provided on the positioning plate 32 are matched, so that the force is uniform. It is unlikely that unevenness of wear will affect measurement accuracy. When two pairs of the first and second probe cards 512 and 513 provided on the positioning plate 32 need to be replaced due to wear, the wear is the same. Replacing the first and second probe cards 512, 513 can simplify the maintenance work.

  Note that the first and second probe cards 512 and 513 of the two test socket groups 51 have a total of four points, and can be applied to the four-terminal method measurement. Replaces moving cards.

  Note that the first and second probe cards 512 and 513 and the insulating sheet 514 provided therebetween increase the collision strength and the buffering force of the detection, so that the first and second probe cards 512 and 513 can be used. The frequency of breakage can be reduced.

  Further, the first probe card 512 further has three first connection ports 5122 installed in one row, and the second probe card 513 further has two second connection ports 5132 installed in one row. The insulating sheet 514 has two third connection ports 5141 arranged in a line, and the first and second detection ends 5121 and 5131 are connected to the first end 5111 of the upper connection block 511. It will be installed closer.

  The first and second probe cards 512 have first and second connection ends 5123 and 5133 formed on one side thereof, and the first and second connection ends 5123 and 5133 are connected to the first and second connection ends 5123 and 5133. First, it is installed far away from the second detection ends 5121, 5131. The first and second connection ends 5123 and 5133 connect an external measuring device to detect the electrical properties of the plurality of electronic components. Here, the electronic component may be an inductance, a resistance, or the like.

  Each of the two test socket groups 51 further has a first fixture 516, and the upper connection block 511 is fixed to the positioning plate 31. Further, the two test socket groups 51 further include first and second fixing sheets 517, 518 and a second fixing tool 519, respectively, and the second fixing tool 519 respectively includes the first and second fixing sheets 517, 517. The first and second fixing sheets 517 and 518 are fixed to the first and second connection ends 5123 and 5133 through 518.

  By providing the first and second fixing sheets 517, 518, the convenience when the first and second connection ends 5123, 5133 are connected to an external measuring device is improved, and the work efficiency is further improved. it can.

  Further, each of the two test socket groups 51 has a locking base 520 and a third fixing tool 521, and the locking base 520 has three fourth connection ports 5201 installed in a line, and The tool 521 passes through the plurality of fourth connection ports 5201, and fixes the two locking bases 520 to the two upper connection blocks 511.

  In addition, by providing the first fixture 516, the locking base 520, and the third fixture 521, the upper connection block 511, the first and second probe cards 512, 513, and the insulating sheet 514 are provided at the time of replacement. In addition to improving the convenience of mounting on the positioning plate 32, looseness, detachment, poor contact or breakage can be reduced, and the production efficiency of electronic components can be further improved.

  The third fixture 521 furthest from the first and second detection ends 5121, 5131 does not pass through the second probe card 513, and the first fixture 521 farthest from the first detection end 5121 does not pass through. It passes only through the connection port 5122. The first, second, and third fixing members 516, 519, and 521 are selected from screws, studs, and combinations thereof, and the number is not limited to the number of connection ports.

  In summary, in the test socket device of the present invention, the positioning unit 3 and the test socket unit 5 are mutually installed, and the two test socket groups 51 are respectively connected to the upper connection block 511, the first, Two test cards provided in the positioning unit 3 when the second probe card 512, 513, the insulating sheet 514 and the lower connection block 515 are operated and detect the electrical properties of the plurality of electronic components. By matching the operations of the first and second probe cards 512 and 513 of the socket group 51, the force is uniform, and it is unlikely that unevenness of wear will affect measurement accuracy. The design of the first and second probe cards 512, 513 and the insulating sheet 514 provided between them increases the collision strength and the buffering force of the detection so that the first and second probe cards 512, In order to reduce the frequency of breakage of 513 and further improve the production yield of electronic components, the object of the present invention can be certainly achieved.

  However, what has been described above is merely a preferred embodiment of the present invention, and therefore cannot limit the scope of implementation of the present invention, i.e., simple equivalents made according to the claims and the description of the present invention. All changes and modifications are within the scope of the invention.

  According to an advantageous effect of the present invention, the two test socket groups each include the upper connection block, the first and second probe cards, and the insulating sheet, and the test socket device is operated to operate the plurality of electronic components. When detecting the electrical properties of the two, the operation of the first and second probe cards of the two test socket groups provided in the positioning unit are matched, so that the operating force is uniform and the unevenness of wear is caused. The measurement accuracy is hardly affected, and the production yield of electronic components is further improved.

1 Connection unit
3 Positioning unit
31 Fixed base
32 Positioning plate
321 First Surface
322 Second surface
33 Slide rail
5 Test socket unit
51 Test Socket Group
511 Upper connection block
5111 First end
5112 Second end
5113 Limit groove
512 First probe card
5121 First detection end
5122 First connection port
5123 First connection end
513 Second probe card
5131 Second detection end
5132 Second connection port
5133 Second connection end
514 Insulation sheet
5141 Third connection port
515 Lower connection block
5151 Projection
516 First Fixture
517 First fixed sheet
518 Second fixed sheet
519 Second fixture
520 locking base
5201 4th connection port
521 Third Fixture

Claims (12)

A test socket device used for performing an electrical test on a plurality of electronic components,
A fixing unit, and a positioning unit connected to the fixing unit, the positioning unit including a positioning plate having a first surface and a second surface opposite thereto.
A test socket unit comprising two test socket groups spaced apart on the second surface of the positioning plate,
The test socket group has an upper connection block, a first probe card connected to the upper connection block, a second probe card, and an insulating sheet provided between the first and second probe cards,
The first and second probe cards respectively have first and second detection ends that project outward and are inclined at the same angle,
Detecting electrical properties of the plurality of electronic components;
Test socket device. The upper connection block has a first end and a second end opposite thereto, the first and second probe cards and the insulating sheet are located at the first end, and the two test socket groups are 2. The device according to claim 1, further comprising a lower connection block, wherein the lower connection block is connected to a second end of the fixing base and the second end of the upper connection block, respectively, to fix the test socket unit to the positioning unit. Test socket equipment. The first probe card further has three first connection ports installed in one row, the second probe card further has two second connection ports installed in one row, and the insulating sheet 3. The test according to claim 2, comprising two third connection ports arranged in a line, and wherein the first and second detection ends are installed close to a first end of the upper connection block. Socket device. The test socket device according to claim 3, wherein the first and second detection ends of the two test socket groups are inclined at opposite angles. The first and second probe cards further have first and second connection ends formed on one side, and the first and second connection ends are far away from the first and second detection ends. The test socket device according to claim 4, wherein the test socket device is installed in a position. The positioning unit further comprises two separately provided slide rails spaced apart on a second surface of the positioning plate to limit a sliding direction of the two upper connection blocks. 6. The test socket device according to 5. The upper connection block further has a limit groove located at the second end, the lower connection block has a protrusion located at the limit groove, and a width of the protrusion is smaller than the limit groove. The test socket device according to claim 6. The test socket device according to claim 7, wherein the two test socket groups further include a first fixture, and the upper connection block is fixed to the positioning plate. The two test socket groups each have a first and a second fixing sheet and a second fixing tool, and the second fixing tool passes through the first and the second fixing sheets respectively, and the first and the second fixing sheets. 9. The test socket device according to claim 8, wherein a sheet is fixed to the first and second connection ends. The two test socket groups each have a locking base and a third fixture, the locking base has three fourth connection ports installed in a row, and the third fixture is each of the plurality of the third fixtures. The test socket device according to claim 9, wherein the two locking bases are fixed to the two upper connection blocks through four connection ports. The test socket apparatus according to claim 10, wherein the third fixture farthest from the first and second detection ends passes only through the first connection port farthest from the first detection end. The test socket device of claim 11, wherein the first, second, and third fasteners are selected from screws, studs, and combinations thereof.

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