JP3216482B2 - High frequency circuit device - Google Patents

High frequency circuit device

Info

Publication number
JP3216482B2
JP3216482B2 JP15618295A JP15618295A JP3216482B2 JP 3216482 B2 JP3216482 B2 JP 3216482B2 JP 15618295 A JP15618295 A JP 15618295A JP 15618295 A JP15618295 A JP 15618295A JP 3216482 B2 JP3216482 B2 JP 3216482B2
Authority
JP
Japan
Prior art keywords
dielectric substrate
electronic component
circuit device
metal
frequency circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15618295A
Other languages
Japanese (ja)
Other versions
JPH098432A (en
Inventor
享 土地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15618295A priority Critical patent/JP3216482B2/en
Publication of JPH098432A publication Critical patent/JPH098432A/en
Application granted granted Critical
Publication of JP3216482B2 publication Critical patent/JP3216482B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/4501Shape
    • H01L2224/45012Cross-sectional shape
    • H01L2224/45014Ribbon connectors, e.g. rectangular cross-section
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/4901Structure
    • H01L2224/4903Connectors having different sizes, e.g. different diameters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4911Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
    • H01L2224/49111Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49175Parallel arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19107Disposition of discrete passive components off-chip wires
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/05Insulated conductive substrates, e.g. insulated metal substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は高周波回路装置に関
し、特に発熱の大きい電子部品を用いるものに適用し得
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high-frequency circuit device, and more particularly, to a high-frequency circuit device using electronic components generating a large amount of heat.

【0002】[0002]

【従来の技術】図17は、従来の高周波回路装置を示す
構造であり、図中において1は表面に整合回路、バイア
ス回路等を有し、裏面に接地用導体を有する誘電体基
板、2は接地用導体を介して誘電体基板1を固定する金
属製キャリア、3はこの高周波回路装置と外部回路を接
続するリードである。
2. Description of the Related Art FIG. 17 shows a structure of a conventional high-frequency circuit device. In the drawing, reference numeral 1 denotes a dielectric substrate having a matching circuit and a bias circuit on the front surface and a grounding conductor on the back surface; A metal carrier 3 for fixing the dielectric substrate 1 via a grounding conductor is a lead for connecting the high-frequency circuit device to an external circuit.

【0003】また、図18はこの高周波回路装置表面上
の増幅器の詳細図であり、図において、4は誘電体基板
1上のマイクロストリップ線路、5は発熱の大きい表面
実装型電子部品、6はマイクロストリップ線路4と前記
表面実装型電子部品5を接続する導電性ワイヤである。
また図19は図18の断面図である。
FIG. 18 is a detailed view of an amplifier on the surface of the high-frequency circuit device. In FIG. 18, reference numeral 4 denotes a microstrip line on the dielectric substrate 1, reference numeral 5 denotes a surface-mounted electronic component which generates a large amount of heat, and reference numeral 6 denotes a component. It is a conductive wire that connects the microstrip line 4 and the surface-mounted electronic component 5.
FIG. 19 is a sectional view of FIG.

【0004】図17において、誘電体基板1の表面に
は、整合回路、バイアス回路等が設置されており、増幅
器部で高周波信号を増幅するように構成されている。金
属製キャリア2は誘電体基板1の裏面の接地用導体と、
半田若しくは導電性接着剤により接着されている。この
金属製キャリア2は、用途に応じて外部接地導体部に導
電性ネジ、半田若しくは導電性接着剤により固定されて
いる。これにより、誘電体基板1の裏面の接地用導体
に、接地面電位が供給される。
In FIG. 17, a matching circuit, a bias circuit, and the like are provided on the surface of a dielectric substrate 1 so that an amplifier unit amplifies a high-frequency signal. The metal carrier 2 includes a grounding conductor on the back surface of the dielectric substrate 1,
It is adhered by solder or a conductive adhesive. The metal carrier 2 is fixed to an external ground conductor portion by a conductive screw, solder, or a conductive adhesive depending on the application. As a result, a ground plane potential is supplied to the ground conductor on the back surface of the dielectric substrate 1.

【0005】また、増幅器部では図18に示すように、
誘電体基板1にあけられた穴を通して表面実装型電子部
品5が金属製キャリア2上に半田もしくは導電性接着剤
により接着されており、この表面実装型電子部品の電極
部と誘電体基板1上のマイクロストリップ線路4とは、
導電性ワイヤ6で接続されている。
In the amplifier section, as shown in FIG.
A surface-mounted electronic component 5 is bonded to the metal carrier 2 by soldering or a conductive adhesive through a hole formed in the dielectric substrate 1. Is the microstrip line 4 of
They are connected by conductive wires 6.

【0006】[0006]

【発明が解決しようとする課題】従来の高周波回路装置
は以上のように構成されており、誘電体基板1と金属製
キャリア2とは半田若しくは導電性接着剤により接着さ
れている。特に半田付けで接着する場合、誘電体基板1
と金属製キャリア2には 100〔℃〕以上の高温状態とな
るが、このとき誘電体基板1と金属製キャリア2との熱
膨張係数に差がありすぎると、誘電体基板1が破損して
しまうおそれがある。
The conventional high-frequency circuit device is configured as described above, and the dielectric substrate 1 and the metal carrier 2 are adhered by solder or a conductive adhesive. Especially when bonding by soldering, the dielectric substrate 1
And the metal carrier 2 is in a high temperature state of 100 ° C. or more. If the coefficient of thermal expansion between the dielectric substrate 1 and the metal carrier 2 is too large, the dielectric substrate 1 is damaged. There is a possibility that it will.

【0007】このため金属製キャリア2の材質は、誘電
体基板1の熱膨張係数に近いものから選ぶ必要がある
が、この際に熱伝導率の小さい材質を選ばざるを得ない
場合もある。ところがこのようにすると高周波回路装置
の動作時に表面実装型電子部品5で発生する熱の拡散と
して、横方向は図20のAR1に示すように、下方向は
図21のAR2に示すように、いずれも狭い範囲に止ま
る。
For this reason, the material of the metal carrier 2 must be selected from materials having a coefficient of thermal expansion close to that of the dielectric substrate 1. In this case, a material having a low thermal conductivity may be inevitably selected. However, in this case, as the diffusion of heat generated in the surface-mounted electronic component 5 during operation of the high-frequency circuit device, the lateral direction is as shown by AR1 in FIG. 20, and the downward direction is as shown by AR2 in FIG. Also stays in a narrow range.

【0008】なお、図20及び図21において、AR1
は電子部品で発生した熱が単位時間tに金属製キャリア
2上を横方向に拡散するエリアであり、AR2は電子部
品で発生した熱が単位時間tに金属製キャリア2上を下
方向に拡散するエリアである。この結果、表面実装型電
子部品5に熱がこもることになり、表面実装型電子部品
5の動作に悪影響を与えるおそれがあった。
[0008] In FIG. 20 and FIG.
AR2 is an area where the heat generated by the electronic component diffuses laterally on the metal carrier 2 per unit time t. AR2 denotes an area where the heat generated by the electronic component diffuses downward on the metal carrier 2 per unit time t. It is an area to do. As a result, heat is stored in the surface-mounted electronic component 5, which may adversely affect the operation of the surface-mounted electronic component 5.

【0009】この発明は上記のような問題点を解消する
ためになされたもので、動作時に電子部品に熱がこもる
ことを未然に防止し、電子部品を安定な状態で動作させ
ることができる高周波回路装置を提供することを目的と
する。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problems, and it is possible to prevent a heat from being stored in an electronic component during operation and to operate the electronic component in a stable state. It is an object to provide a circuit device.

【0010】[0010]

【課題を解決するための手段】この発明に係る高周波回
路装置は、表面にマイクロストリップ線路、裏面に接地
用導体が配された誘電体基板と、外部接地導体部に接着
固定されて、誘電体基板の接地導体に接地面電位を供給
し、接地用導体を介して誘電体基板を固定する金属製キ
ャリアと、誘電体基板の開口に配されて、マイクロスト
リップ線路と電気的に接続された電子部品と、誘電体基
板と金属製キャリアの間に装入して接着され、電子部品
が実装されるものであって、電子部品が発生する熱が拡
散するように熱伝導率が大きい材料を用いて、誘電体基
板及び金属製キャリアに比して十分に薄く形成された金
属板とを備えたものである。
A high-frequency circuit device according to the present invention is bonded to a dielectric substrate having a microstrip line on the front surface, a grounding conductor on the back surface, and an external grounding conductor.
Fixed and supplies ground plane potential to the ground conductor on the dielectric substrate
And, a metal carrier for fixing the dielectric substrate through the ground conductor, disposed in the opening of the dielectric substrate, microstrip
Lip line and electrically connected to the electronic component is adhered was charged between the dielectric substrate and the metal carrying an electronic component
Is mounted, and the heat generated by the electronic components spreads.
Using a material with a high thermal conductivity to disperse , gold formed sufficiently thin compared to the dielectric substrate and metal carrier
And a genus plate .

【0011】また、この発明に係る高周波回路装置は、
電子部品の厚さが誘電体基板よりも薄い場合、熱伝導率
の大きい材料で形成されて、金属板上に設けられた金属
製台座上に実装される電子部品を設けたものである。
Further, the high-frequency circuit device according to the present invention comprises:
If the thickness of the electronic component is thinner than the dielectric substrate, the thermal conductivity
Formed of a material with a large size and provided on a metal plate
An electronic component mounted on a pedestal is provided.

【0012】また、この発明に係る高周波回路装置は、
その表面に電子部品、およびマイクロストリップ線路が
形成された小型誘電体基板を有し、上記電子部品と小型
誘電体基板のマイクロストリップ線路、および誘電体基
板のマイクロストリップ線路を電気的に接続することに
より小型増幅器部を形成した金属製台座を備えたもので
ある。
Further, a high-frequency circuit device according to the present invention
Electronic components and microstrip lines on the surface
Having a small-sized dielectric substrate formed, and a small
Microstrip line of dielectric substrate and dielectric substrate
To electrically connect microstrip lines on a plate
With a metal pedestal forming a smaller amplifier section
is there.

【0013】[0013]

【作用】誘電体基板と金属製キャリアとの間に、熱伝導
率が大きくかつ厚さが誘電体基板や金属製キャリアに比
べて十分に薄い金属板を挿入し、その上に発熱の大きい
電子部品を実装することにより、動作時電子部品で発生
する熱が、挿入された金属板に沿って、広範囲にしかも
急速に拡散する。かくして、電子部品に熱がこもること
を未然に防止し、安定な状態で動作させることができ
る。
A metal plate having a high thermal conductivity and a sufficiently small thickness compared to a dielectric substrate or a metal carrier is inserted between the dielectric substrate and the metal carrier. By mounting the components, the heat generated by the electronic components during operation spreads widely and rapidly along the inserted metal plate. Thus, it is possible to prevent the heat from being trapped in the electronic component and to operate the electronic component in a stable state.

【0014】[0014]

【実施例】以下図面を参照しながら、この発明の実施例
を詳述する。
Embodiments of the present invention will be described below in detail with reference to the drawings.

【0015】実施例1. 図17との対応部分に同一符号を付した図1においては
全体としてこの発明による高周波回路装置の実施例1を
示す。この実施例1の場合、誘電体基板1と金属製キャ
リア2との間に、熱伝導率が大きく、かつその厚さが誘
電体基板1や金属製キャリア2に比べて十分に薄い金属
板10を挿入し、その上に表面実装型電子部品5を実装
した点において、図17に上述した従来のものと相違す
る。また図18との対応部分に同一符号を付した図2
は、金属板10を挿入した場合の増幅器部周辺の詳細を
示し、また図19との対応部分に同一符号を付した図3
は図2の断面を示す。
Embodiment 1 FIG. FIG. 1 in which parts corresponding to those in FIG. 17 are denoted by the same reference numerals shows a high-frequency circuit device according to a first embodiment of the present invention as a whole. In the case of the first embodiment, a metal plate 10 having a high thermal conductivity and a thickness sufficiently smaller than that of the dielectric substrate 1 or the metal carrier 2 is provided between the dielectric substrate 1 and the metal carrier 2. 17 and the surface mount type electronic component 5 is mounted thereon, which is different from the conventional one shown in FIG. FIG. 2 in which the same reference numerals are given to the parts corresponding to FIG.
FIG. 3 shows details around the amplifier section when the metal plate 10 is inserted, and FIG.
Shows a cross section of FIG.

【0016】次に動作について説明する。高周波回路装
置の動作時に表面実装型電子部品5で発生する熱の拡散
は、下方向の場合は金属板10の厚さが誘電体基板1や
金属製キャリア2に比べて十分に薄いので、従来の場合
とあまり差はないが、横方向の場合は金属板10の熱伝
導率が大きいため、図4のAR10に示すように金属板
10に沿って広範囲にしかも急速に拡散する。なおAR
10は電子部品で発生した熱が単位時間tに金属板10
の横方向に拡散するエリアである。
Next, the operation will be described. The diffusion of heat generated in the surface-mounted electronic component 5 during the operation of the high-frequency circuit device is the same as in the conventional case because the thickness of the metal plate 10 in the downward direction is sufficiently smaller than that of the dielectric substrate 1 or the metal carrier 2. Although there is not much difference from the case of (1), in the case of the horizontal direction, since the thermal conductivity of the metal plate 10 is large, as shown by AR10 in FIG. AR
Reference numeral 10 denotes a state in which the heat generated in the electronic component is changed to the metal plate 10 per unit time t.
Is an area that spreads in the horizontal direction.

【0017】これにより、表面実装型電子部品5に熱が
こもることはなくなり、安定な状態で表面実装型電子部
品5が動作し続けることができるようになる。また、こ
の金属板10は、その厚さが誘電体基板1や金属製キャ
リア2に比べて十分に薄いので、金属板10の熱膨張係
数が誘電体基板1や金属製キャリア2の熱膨張係数と差
があったとしてもその影響はほとんどなく、接着時に誘
電体基板1が破損することもない。
As a result, heat does not remain in the surface-mounted electronic component 5, and the surface-mounted electronic component 5 can continue to operate in a stable state. The metal plate 10 has a sufficiently small thickness compared to the dielectric substrate 1 and the metal carrier 2, so that the coefficient of thermal expansion of the metal plate 10 is smaller than that of the dielectric substrate 1 and the metal carrier 2. Even if there is a difference, there is almost no effect, and the dielectric substrate 1 is not damaged during bonding.

【0018】実施例2. 実施例1では、表面実装型電子部品を直接金属製キャリ
アに接着する場合について述べたが、表面実装型電子部
品の高さが低い場合には、高さ調整のために表面実装型
電子部品の下に熱伝導率の大きい金属製台座を設ける場
合がある。この場合もこの発明は有効である。これを実
施例2として図1との対応部分に同一符号を付した図5
に示す。この実施例2では、高さの低い表面実装型電子
部品12と熱伝導率の大きい金属製台座13を有する点
において、実施例1と相違する。またこの実施例2の断
面を図6に示す。
Embodiment 2 FIG. In the first embodiment, the case where the surface-mounted electronic component is directly bonded to the metal carrier has been described. However, when the height of the surface-mounted electronic component is low, the surface-mounted electronic component is adjusted for height adjustment. A metal pedestal having high thermal conductivity may be provided below. The present invention is also effective in this case. FIG. 5 in which the same reference numerals as in FIG.
Shown in The second embodiment differs from the first embodiment in that a surface mount electronic component 12 having a low height and a metal pedestal 13 having a high thermal conductivity are provided. FIG. 6 shows a cross section of the second embodiment.

【0019】この場合、高周波回路装置の動作時に表面
実装型電子部品12で発生した熱は、金属製台座13の
熱伝導率が大きいので、金属製台座13にこもることな
く急速に金属板10に伝わる。
In this case, the heat generated in the surface-mounted electronic component 12 during the operation of the high-frequency circuit device is quickly transferred to the metal plate 10 without being trapped in the metal pedestal 13 because the thermal conductivity of the metal pedestal 13 is large. Convey.

【0020】この場合の熱の拡散も実施例1で述べたよ
うに、下方向の場合は、金属板10の厚さが誘電体基板
1や金属製キャリア2に比べて十分に薄いので、従来の
場合とあまり差はないが、横方向の場合は金属板10の
熱伝導率が大きいために、図7のAR11に示すよう
に、金属板10に沿って広範囲にしかも急速に拡散す
る。なおAR11は電子部品で発生した熱が単位時間t
に金属板10の横方向に拡散するエリアである。
As described in the first embodiment, the heat diffusion in this case is, as described in the first embodiment, because the thickness of the metal plate 10 is sufficiently thinner than that of the dielectric substrate 1 or the metal carrier 2. Although there is not much difference from the case of (1), in the case of the horizontal direction, since the thermal conductivity of the metal plate 10 is large, as shown by AR11 in FIG. AR11 indicates that the heat generated by the electronic component is equal to the unit time t.
This is an area diffused in the horizontal direction of the metal plate 10.

【0021】これにより、表面実装型電子部品12に熱
がこもることはなくなり、安定な状態で表面実装型電子
部品12が動作し続けることができるようになる。
As a result, heat does not remain in the surface-mounted electronic component 12, and the surface-mounted electronic component 12 can continue to operate in a stable state.

【0022】実施例3. 実施例1及び実施例2では、表面実装型電子部品を用い
る場合について述べたが、リード付パッケージ型電子部
品を用いる場合にも、この発明は有効である。これを実
施例3として図1との対応部分に同一符号を付した図8
に示す。この実施例3では、リード付パッケージ型電子
部品16を有し、導電性ワイヤ6を有しない点において
実施例1と相違する。またこの実施例3の断面を図9に
示す。
Embodiment 3 FIG. In the first and second embodiments, the case where the surface-mounted electronic component is used has been described. However, the present invention is also effective when a packaged electronic component with leads is used. FIG. 8 in which the same reference numerals are given to portions corresponding to FIG.
Shown in The third embodiment is different from the first embodiment in that a package type electronic component 16 with leads is provided and the conductive wire 6 is not provided. FIG. 9 shows a cross section of the third embodiment.

【0023】この場合、高周波回路装置の動作時にリー
ド付パッケージ型電子部品16で発生した熱の拡散は、
実施例1に上述したように、下方向の場合は、金属板1
0の厚さが誘電体基板1や金属製キャリア2に比べて十
分に薄いので、従来の場合とあまり差はないが、横方向
の場合は金属板10の熱伝導率が大きいために図10の
AR12に示すように、金属板10に沿って広範囲にし
かも急速に拡散する。なおAR12は電子部品で発生し
た熱が単位時間tに金属板10の横方向に拡散するエリ
アである。
In this case, the diffusion of heat generated in the packaged electronic component 16 with leads during the operation of the high-frequency circuit device is as follows.
As described in the first embodiment, in the case of the downward direction, the metal plate 1
10 is sufficiently smaller than the thickness of the dielectric substrate 1 and the metal carrier 2, so that there is not much difference from the conventional case. As shown by AR12 in FIG. AR12 is an area where the heat generated in the electronic component diffuses in the lateral direction of the metal plate 10 per unit time t.

【0024】これにより、リード付パッケージ型電子部
品16に熱がこもることはなくなり、安定な状態でリー
ド付パッケージ型電子部品16が動作し続けることがで
きるようになる。
As a result, heat does not stay in the packaged electronic component 16 with leads, and the packaged electronic component 16 with leads can continue to operate in a stable state.

【0025】実施例4. 実施例3では、リード付パッケージ型電子部品を用いる
場合について述べたが、ネジ止め式のリード付パッケー
ジ型電子部品を用いる場合にも、この発明は有効であ
る。これを実施例4として図8との対応部分に同一符号
を付した図11に示す。この実施例4では、ネジ止め式
のリード付パッケージ型電子部品19と取付けネジ20
を有する点において実施例3の場合と相違する。またこ
の実施例4の断面を図12に示す。
Embodiment 4 FIG. In the third embodiment, the case where a packaged electronic component with leads is used has been described. However, the present invention is also effective when a packaged electronic component with screws is used. This is shown in FIG. 11 in which the same reference numerals are given to portions corresponding to those in FIG. In the fourth embodiment, a packaged electronic component 19 with a screw-type lead and a mounting screw 20
This is different from the third embodiment in that FIG. 12 shows a cross section of the fourth embodiment.

【0026】この場合、高周波回路装置の動作時にネジ
止め式のリード付パッケージ型電子部品19で発生した
熱の拡散は、実施例1に上述したように、下方向の場合
は、金属板10の厚さが誘電体基板1や金属製キャリア
2に比べて十分に薄いので、従来の場合とあまり差はな
いが、横方向の場合は金属板10の熱伝導率が大きいた
めに図13のAR13に示すように、金属板10に沿っ
て広範囲にしかも急速に拡散する。なおAR13は電子
部品で発生した熱が単位時間tに金属板10の横方向に
拡散するエリアである。
In this case, when the high-frequency circuit device operates, the diffusion of the heat generated in the screw-type lead-type packaged electronic component 19 is, as described above in the first embodiment, when the metal plate 10 is in the downward direction. Since the thickness is sufficiently smaller than that of the dielectric substrate 1 or the metal carrier 2, there is not much difference from the conventional case. As shown in FIG. 6, the metal diffuses widely and rapidly along the metal plate 10. AR13 is an area where heat generated in the electronic component diffuses in the lateral direction of the metal plate 10 per unit time t.

【0027】これにより、ネジ止め式のリード付パッケ
ージ型電子部品19に熱がこもることはなくなり、安定
な状態でネジ止め式のリード付パッケージ型電子部品1
9が動作し続けることができるようになる。また、金属
板10はその厚さが薄いのでネジ止め用穴を開けること
は容易である。
As a result, heat does not stay in the screw-type lead-type package electronic component 19, and the screw-type lead-type package electronic component 1 in a stable state is prevented.
9 can continue to operate. Further, since the metal plate 10 is thin, it is easy to form a screw hole.

【0028】実施例5. 実施例2では、高さの低い表面実装型電子部品を金属製
台座の上に乗せる場合について述べたが、この高さの低
い表面実装型電子部品と金属製台座、それに小型誘電体
基板等を用いて小型増幅部を構成し、それを金属製キャ
リアに接着する場合にもこの発明は有効である。
Embodiment 5 FIG. In the second embodiment, the case where the low-height surface-mounted electronic component is placed on the metal pedestal has been described. However, the low-height surface-mount electronic component and the metal pedestal, and the small dielectric substrate and the like are used. The present invention is also effective when a small amplifying section is formed by using the small amplifying section and bonded to a metal carrier.

【0029】これを実施例5として図14に示す。高さ
の低い表面実装型電子部品12と金属製台座13よりも
大きめの金属製台座23、そして小型誘電体基板24で
小型増幅器部を構成していて、それを金属板10上に接
着している。この表面実装型電子部品12と小型誘電体
基板24上のマイクロストリップ線路26と誘電体基板
1上のマイクロストリップ線路4とは導電性リボン25
で接続されている。
This is shown in FIG. 14 as a fifth embodiment. A small amplifier section is composed of the surface mount electronic component 12 having a low height, a metal pedestal 23 which is larger than the metal pedestal 13, and a small dielectric substrate 24, which is adhered to the metal plate 10. I have. The surface mounted electronic component 12, the microstrip line 26 on the small dielectric substrate 24, and the microstrip line 4 on the dielectric substrate 1 are connected to a conductive ribbon 25.
Connected by

【0030】この場合も実施例2で述べたように、高周
波回路装置の動作時に表面実装型電子部品12で発生し
た熱は、金属製台座23の熱伝導率が大きいので、金属
製台座23にこもることはなく金属板10に伝わり、熱
の拡散も下方向の場合は金属板10の厚さが誘電体基板
1や金属製キャリア2に比べて十分に薄いので従来の場
合とあまり差はないが、横方向の場合は金属板10の熱
伝導率が大きいため、図16のAR14に示すように、
金属板10に沿って広範囲にしかも急速に拡散する。な
おAR14は電子部品で発生した熱が単位時間tに金属
板10の横方向に拡散するエリアである。
Also in this case, as described in the second embodiment, the heat generated in the surface-mounted electronic component 12 during the operation of the high-frequency circuit device is transferred to the metal pedestal 23 because the thermal conductivity of the metal pedestal 23 is large. It does not stay inside and is transmitted to the metal plate 10, and when the diffusion of heat is downward, the thickness of the metal plate 10 is sufficiently thinner than the dielectric substrate 1 and the metal carrier 2, so that there is not much difference from the conventional case. However, in the case of the horizontal direction, since the thermal conductivity of the metal plate 10 is large, as indicated by AR14 in FIG.
It diffuses widely and rapidly along the metal plate 10. AR14 is an area where heat generated in the electronic component diffuses in the horizontal direction of the metal plate 10 per unit time t.

【0031】これにより、表面実装型電子部品12に熱
がこもることはなくなり、安定な状態で表面実装型電子
部品12が動作し続けることができるようになる。なお
上述した実施例1〜5では、電子部品として増幅器を用
いた場合について述べたが、この発明はこれに限らず、
要は動作時に高熱を発生する電子部品であれば、上述の
実施例と同様の効果を実現できる。
As a result, heat does not remain in the surface-mounted electronic component 12, and the surface-mounted electronic component 12 can continue to operate in a stable state. In the first to fifth embodiments described above, the case where an amplifier is used as an electronic component has been described. However, the present invention is not limited to this.
In short, any electronic component that generates high heat during operation can achieve the same effect as the above-described embodiment.

【0032】[0032]

【発明の効果】以上のようにこの発明によれば、誘電体
基板と金属製キャリアとの間に、熱伝導率が大きくかつ
厚さが誘電体基板や金属製キャリアに比べて十分に薄い
金属板を挿入し、その上に発熱の大きい電子部品を実装
することにより、動作時電子部品で発生する熱が、挿入
された金属板に沿って、広範囲にしかも急速に拡散す
る。かくして、電子部品に熱がこもることを未然に防止
し、安定な状態で動作させ得る高周波回路装置を実現で
きる。
As described above, according to the present invention, a metal having a high thermal conductivity and a thickness sufficiently smaller than that of a dielectric substrate or a metal carrier is provided between the dielectric substrate and the metal carrier. By inserting the plate and mounting the electronic component that generates a large amount of heat thereon, the heat generated by the electronic component during operation spreads widely and rapidly along the inserted metal plate. Thus, it is possible to realize a high-frequency circuit device capable of preventing the accumulation of heat in the electronic components and operating in a stable state.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 この発明の実施例1による高周波回路装置の
構造を示す略線図である。
FIG. 1 is a schematic diagram illustrating a structure of a high-frequency circuit device according to a first embodiment of the present invention.

【図2】 この発明の実施例1による高周波回路装置表
面上の増幅器周辺の詳細構成を示す平面図である。
FIG. 2 is a plan view showing a detailed configuration around an amplifier on the surface of the high-frequency circuit device according to Embodiment 1 of the present invention.

【図3】 図2の断面図である。FIG. 3 is a sectional view of FIG. 2;

【図4】 実施例1による電子部品で発生した熱が横方
向に拡散する様子を示す略線図である。
FIG. 4 is a schematic diagram illustrating a state in which heat generated in the electronic component according to the first embodiment is diffused in a lateral direction.

【図5】 この発明の実施例2による高周波回路装置表
面上の増幅器周辺の詳細構成を示す平面図である。
FIG. 5 is a plan view showing a detailed configuration around an amplifier on the surface of a high-frequency circuit device according to Embodiment 2 of the present invention.

【図6】 図5の断面図である。FIG. 6 is a sectional view of FIG.

【図7】 実施例2による電子部品で発生した熱が横方
向に拡散する様子を示す略線図である。
FIG. 7 is a schematic diagram illustrating a state in which heat generated in an electronic component according to the second embodiment is diffused in a lateral direction.

【図8】 この発明の実施例3による高周波回路装置表
面上の増幅器周辺の詳細構成を示す平面図である。
FIG. 8 is a plan view showing a detailed configuration around an amplifier on the surface of a high-frequency circuit device according to Embodiment 3 of the present invention.

【図9】 図8の断面図である。FIG. 9 is a sectional view of FIG.

【図10】 実施例3による電子部品で発生した熱が横
方向に拡散する様子を示す略線図である。
FIG. 10 is a schematic diagram illustrating how heat generated in an electronic component according to a third embodiment is diffused in a lateral direction.

【図11】 この発明の実施例4による高周波回路装置
表面上の増幅器周辺の詳細構成を示す平面図である。
FIG. 11 is a plan view showing a detailed configuration around an amplifier on the surface of a high-frequency circuit device according to Embodiment 4 of the present invention.

【図12】 図11の断面図である。FIG. 12 is a sectional view of FIG.

【図13】 実施例4による電子部品で発生した熱が横
方向に拡散する様子を示す略線図である。
FIG. 13 is a schematic diagram illustrating how heat generated in an electronic component according to a fourth embodiment is diffused in a lateral direction.

【図14】 この発明の実施例5による高周波回路装置
表面上の増幅器周辺の詳細構成を示す平面図である。
FIG. 14 is a plan view showing a detailed configuration around an amplifier on the surface of a high-frequency circuit device according to Embodiment 5 of the present invention.

【図15】 図14の断面図である。FIG. 15 is a sectional view of FIG.

【図16】 実施例5による電子部品で発生した熱が横
方向に拡散する様子を示す略線図である。
FIG. 16 is a schematic diagram illustrating how heat generated in an electronic component according to a fifth embodiment is diffused in a lateral direction.

【図17】 従来の高周波回路装置の構造を示す略線図
である。
FIG. 17 is a schematic diagram illustrating the structure of a conventional high-frequency circuit device.

【図18】 従来の高周波回路装置表面上の増幅器部周
辺の詳細構成を示す平面図である。
FIG. 18 is a plan view showing a detailed configuration around an amplifier section on the surface of a conventional high-frequency circuit device.

【図19】 図18の断面図である。FIG. 19 is a sectional view of FIG. 18;

【図20】 従来の高周波回路装置における電子部品で
発生した熱が横方向に拡散する様子を示す略線図であ
る。
FIG. 20 is a schematic diagram showing how heat generated by electronic components in a conventional high-frequency circuit device diffuses in a horizontal direction.

【図21】 従来の高周波回路装置における電子部品で
発生した熱の下方向の拡散を表した図である。
FIG. 21 is a diagram illustrating downward diffusion of heat generated in an electronic component in a conventional high-frequency circuit device.

【符号の説明】[Explanation of symbols]

1 誘電体基板 2 金属製キャリア 3 リード 4 マイクロストリップ線路 5 表面実装型電子部品 6 導電性ワイヤ 10 金属板 12 表面実装型電子部品 13 金属製台座 16 リード付パッケージ型電子部品 19 ネジ止め式のリード付パッケージ型電子部品 20 ネジ 23 金属製台座 24 小型誘電体基板 25 導電性リボン 26 マイクロストリップ線路 DESCRIPTION OF SYMBOLS 1 Dielectric board 2 Metal carrier 3 Lead 4 Microstrip line 5 Surface mount type electronic component 6 Conductive wire 10 Metal plate 12 Surface mount type electronic component 13 Metal pedestal 16 Package type electronic component with lead 19 Screw type lead Packaged electronic component 20 Screw 23 Metal pedestal 24 Small dielectric substrate 25 Conductive ribbon 26 Microstrip line

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H05K 1/18 H01L 23/36 H05K 1/02 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H05K 1/18 H01L 23/36 H05K 1/02

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 表面にマイクロストリップ線路および開
口、裏面に接地用導体が配された誘電体基板と、外部接地導体部に接着固定されて、上記誘電体基板の接
地導体に接地面電位を供給し、上 記接地用導体を介して
上記誘電体基板を固定する金属製キャリアと、上記誘電体基板の開口に配されて、上記マイクロストリ
ップ線路と電気的に接続された電子部品と、 上記誘電体基板と上記金属製キャリアの間に装入して接
着され、上記電子部品が実装されるものであって、上記
電子部品が発生する熱が拡散するように熱伝導率が大き
い材料を用いて、上記誘電体基板及び上記金属製キャリ
アに比して十分に薄く形成された金属板とを備えたこと
を特徴とする高周波回路装置。
1. A microstrip line and an open circuit on a surface.
A dielectric substrate having a grounding conductor disposed on its mouth and back surface is bonded and fixed to an external grounding conductor to form a connection between the dielectric substrate and the dielectric substrate.
Supplying a ground plane potential to the ground conductor, a metal carrier for fixing the dielectric substrate through the upper Symbol grounding conductor, arranged in the opening of the dielectric substrate, the microstrip
An electronic component electrically connected to the tap line, and inserted and bonded between the dielectric substrate and the metal carrier, wherein the electronic component is mounted,
High thermal conductivity so that the heat generated by electronic components is diffused
A high-frequency circuit device comprising: a dielectric material ; and a metal plate formed sufficiently thinner than the metal carrier by using a suitable material.
【請求項2】 電子部品は、その厚さが誘電体基板より
も薄い場合、熱伝導率の大きい材料で形成されて、金属
板上に設けられた金属製台座上に実装されることを特徴
とする請求項1に記載の高周波回路装置。
2. The electronic component has a thickness greater than that of the dielectric substrate.
If it is too thin, it is formed of a material with high thermal conductivity,
It is mounted on a metal pedestal provided on a plate
The high-frequency circuit device according to claim 1, wherein
【請求項3】 金属製台座は、その表面に電子部品、お
よびマイクロストリップ線路が形成された小型誘電体基
板を有し、上記電子部品と小型誘電体基板のマイクロス
トリップ線路、および誘電体基板のマイクロストリップ
線路を電気的に接続することにより形成された小型増幅
器部を有することを特徴とする請求項2に記載の高周波
回路装置。
3. The metal pedestal has electronic components and a surface on its surface.
Dielectric substrate with microstrip line and microstrip line
Board, and a micros
Trip lines and microstrips on dielectric substrates
Small amplification formed by electrically connecting lines
The high-frequency device according to claim 2, wherein the high-frequency device has a cavity.
Circuit device.
JP15618295A 1995-06-22 1995-06-22 High frequency circuit device Expired - Fee Related JP3216482B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15618295A JP3216482B2 (en) 1995-06-22 1995-06-22 High frequency circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15618295A JP3216482B2 (en) 1995-06-22 1995-06-22 High frequency circuit device

Publications (2)

Publication Number Publication Date
JPH098432A JPH098432A (en) 1997-01-10
JP3216482B2 true JP3216482B2 (en) 2001-10-09

Family

ID=15622158

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15618295A Expired - Fee Related JP3216482B2 (en) 1995-06-22 1995-06-22 High frequency circuit device

Country Status (1)

Country Link
JP (1) JP3216482B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3906510B2 (en) * 1997-03-19 2007-04-18 松下電器産業株式会社 Heat dissipation board for mounting electronic components
JP4575147B2 (en) * 2004-12-28 2010-11-04 株式会社東芝 Semiconductor device
JP2008288379A (en) * 2007-05-17 2008-11-27 Toshiba Corp Semiconductor package
JP5987222B2 (en) * 2011-09-30 2016-09-07 住友電工デバイス・イノベーション株式会社 Semiconductor device

Also Published As

Publication number Publication date
JPH098432A (en) 1997-01-10

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