JP3198619U - 象限を有する基板支持体 - Google Patents
象限を有する基板支持体 Download PDFInfo
- Publication number
- JP3198619U JP3198619U JP2014005510U JP2014005510U JP3198619U JP 3198619 U JP3198619 U JP 3198619U JP 2014005510 U JP2014005510 U JP 2014005510U JP 2014005510 U JP2014005510 U JP 2014005510U JP 3198619 U JP3198619 U JP 3198619U
- Authority
- JP
- Japan
- Prior art keywords
- substrate support
- quadrant
- line segment
- heating element
- coupled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 111
- 238000010438 heat treatment Methods 0.000 claims abstract description 96
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 6
- 239000000725 suspension Substances 0.000 description 4
- 239000002243 precursor Substances 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/002—Heaters using a particular layout for the resistive material or resistive elements
- H05B2203/003—Heaters using a particular layout for the resistive material or resistive elements using serpentine layout
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Plasma & Fusion (AREA)
- Chemical Vapour Deposition (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
本開示の実施形態は、概して、基板処理チャンバ内で使用するための基板支持体に関する。
プラズマ強化化学蒸着(PECVD)は、一般に、基板(例えば、有機発光ダイオード(OLED)基板及び半導体基板)上に薄膜を堆積するために用いられる。PECVDは、一般に、基板支持体上に配置された基板を有する真空チャンバ内に前駆体ガスを導入することによって達成される。前駆体ガスは、典型的には、真空チャンバの上部近くに位置するガス分配シャワーヘッドを通して導かれる。真空チャンバ内の前駆体ガスは、チャンバに結合された1以上のRF電源からチャンバ電極にRF電力を印加することによって、プラズマに励起される。プラズマは、基板支持体上に配置される基板の表面上に材料の層を形成する。ガス分配シャワーヘッドは、一般に、RF電源に接続され、基板支持体は、典型的には、RF電力のリターンパスを作成するためにチャンバ本体に接続されている。
Claims (15)
- 第1象限、第2象限、第3象限、及び第4象限を有する矩形基板支持体本体と、
第1象限内に配置され、基板支持体本体の中心領域から延びる第1加熱要素であって、
第1長さを有し、中心領域から延びる第1線分と、
第2長さを有する第2線分と、
第3長さを有し、第2線分と実質的に垂直に延びる第3線分と、
第4長さを有し、第3線分と実質的に垂直に、第2線分と実質的に平行に延びる第4線分であって、中心領域まで延びる第4線分を有する第1加熱要素と、
第1加熱要素によって実質的に囲まれ、実質的に「C」形状のパターンを有する第2加熱要素と、
第1加熱要素と第2加熱要素の間に配置された第1熱電対と、
「C」形状のパターンによって少なくとも部分的に囲まれた第2熱電対を含む基板支持体。 - 第2加熱要素は、
中心領域から延びる第1部分と、
第1部分に結合された第2部分と、
第2部分に結合された第3部分と、
第3部分に結合された第4部分と、
第4部分に結合された第5部分と、
第5部分に結合された第6部分と、
第6部分に結合され、中心領域まで延びる第7部分を有する請求項1記載の基板支持体。 - 第2部分は、第2線分に実質的に平行である請求項2記載の基板支持体。
- 第2部分は、湾曲部を介して第1部分に結合されている請求項3記載の基板支持体。
- 第3部分は、第3線分に実質的に平行である請求項4記載の基板支持体。
- 第4部分及び第7部分は、実質的に平行である請求項5記載の基板支持体。
- 第4部分及び第7部分は、共通の軸に沿って整列している請求項6記載の基板支持体。
- 第5部分及び第6部分は、実質的に平行である請求項7の基板支持体。
- 第5部分及び第6部分は、第4部分及び第7部分に実質的に垂直である請求項8記載の基板支持体。
- 第2熱電対は、第6部分、第5部分、及び第5部分を第6部分に結合する湾曲部の間に配置される請求項9記載の基板支持体。
- 第1熱電対は、第2線分を第3線分に結合する湾曲部と、第2部分を第3部分に結合する湾曲部との間に配置される請求項10記載の基板支持体。
- 第2象限は、第1象限の鏡像である請求項11記載の基板支持体。
- 第3象限は、第1象限の鏡像である請求項12記載の基板支持体。
- 第4象限は、第2象限と第3象限の両方の鏡像である請求項13記載の基板支持体。
- 第2象限は、第1象限の鏡像である請求項1記載の基板支持体。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361894954P | 2013-10-24 | 2013-10-24 | |
US61/894,954 | 2013-10-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP3198619U true JP3198619U (ja) | 2015-07-16 |
Family
ID=52994239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014005510U Expired - Lifetime JP3198619U (ja) | 2013-10-24 | 2014-10-16 | 象限を有する基板支持体 |
Country Status (5)
Country | Link |
---|---|
US (2) | US9677177B2 (ja) |
JP (1) | JP3198619U (ja) |
KR (1) | KR200490775Y1 (ja) |
CN (1) | CN204407286U (ja) |
TW (1) | TWM505059U (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109791902A (zh) * | 2016-10-12 | 2019-05-21 | 周星工程股份有限公司 | 设置在基板处理设备中的基板放置部 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9157730B2 (en) * | 2012-10-26 | 2015-10-13 | Applied Materials, Inc. | PECVD process |
US9677177B2 (en) * | 2013-10-24 | 2017-06-13 | Applied Materials, Inc. | Substrate support with quadrants |
KR102374079B1 (ko) * | 2015-03-13 | 2022-03-16 | 주성엔지니어링(주) | 기판 처리장치에 구비되는 기판안착부 |
KR102576532B1 (ko) * | 2016-08-29 | 2023-09-11 | 주성엔지니어링(주) | 기판 안착 유닛 및 그를 포함한 기판 처리 장치 |
JP6869882B2 (ja) * | 2017-12-21 | 2021-05-12 | 株式会社ニフコ | 面状発熱体、および、車両用ウインドシールド装置 |
DE102018212094A1 (de) * | 2018-07-19 | 2020-01-23 | E.G.O. Elektro-Gerätebau GmbH | Heizeinrichtung für ein Kochfeld und Kochfeld |
KR102696111B1 (ko) * | 2019-03-26 | 2024-08-20 | 삼성디스플레이 주식회사 | 기판 안착부 및 이를 포함하는 기판 처리 장치 |
WO2023091629A2 (en) * | 2021-11-22 | 2023-05-25 | Cvd Equipment Corporation | Improvements in chemical vapor deposition systems |
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US5294778A (en) * | 1991-09-11 | 1994-03-15 | Lam Research Corporation | CVD platen heater system utilizing concentric electric heating elements |
US5650082A (en) | 1993-10-29 | 1997-07-22 | Applied Materials, Inc. | Profiled substrate heating |
US6469283B1 (en) | 1999-03-04 | 2002-10-22 | Applied Materials, Inc. | Method and apparatus for reducing thermal gradients within a substrate support |
EP1272006A1 (en) * | 2000-04-07 | 2003-01-02 | Ibiden Co., Ltd. | Ceramic heater |
US8084719B2 (en) * | 2005-01-24 | 2011-12-27 | Whirlpool Corporation | Variable heat distribution for indoor cooking appliance |
US20060186110A1 (en) * | 2005-02-22 | 2006-08-24 | Mark Campello | Electric heater with resistive carbon heating elements |
US8226769B2 (en) | 2006-04-27 | 2012-07-24 | Applied Materials, Inc. | Substrate support with electrostatic chuck having dual temperature zones |
US20080035306A1 (en) * | 2006-08-08 | 2008-02-14 | White John M | Heating and cooling of substrate support |
US20100116788A1 (en) | 2008-11-12 | 2010-05-13 | Lam Research Corporation | Substrate temperature control by using liquid controlled multizone substrate support |
US8637794B2 (en) | 2009-10-21 | 2014-01-28 | Lam Research Corporation | Heating plate with planar heating zones for semiconductor processing |
US9677177B2 (en) * | 2013-10-24 | 2017-06-13 | Applied Materials, Inc. | Substrate support with quadrants |
-
2014
- 2014-10-02 US US14/505,355 patent/US9677177B2/en active Active
- 2014-10-07 TW TW103217803U patent/TWM505059U/zh unknown
- 2014-10-16 JP JP2014005510U patent/JP3198619U/ja not_active Expired - Lifetime
- 2014-10-23 KR KR2020140007709U patent/KR200490775Y1/ko active IP Right Grant
- 2014-10-24 CN CN201420623205.0U patent/CN204407286U/zh not_active Expired - Lifetime
-
2017
- 2017-04-25 US US15/496,405 patent/US10123379B2/en active Active
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109791902A (zh) * | 2016-10-12 | 2019-05-21 | 周星工程股份有限公司 | 设置在基板处理设备中的基板放置部 |
JP2019533311A (ja) * | 2016-10-12 | 2019-11-14 | ジュソン エンジニアリング カンパニー リミテッド | 基板処理装置に設けられる基板着座部 |
US11469135B2 (en) | 2016-10-12 | 2022-10-11 | Jusung Engineering Co., Ltd. | Substrate placing part that is arranged in substrate processing apparatus |
JP7181191B2 (ja) | 2016-10-12 | 2022-11-30 | ジュソン エンジニアリング カンパニー リミテッド | 基板処理装置に設けられる基板着座部 |
Also Published As
Publication number | Publication date |
---|---|
US20150114948A1 (en) | 2015-04-30 |
KR200490775Y1 (ko) | 2019-12-31 |
KR20150001688U (ko) | 2015-05-04 |
CN204407286U (zh) | 2015-06-17 |
US10123379B2 (en) | 2018-11-06 |
US9677177B2 (en) | 2017-06-13 |
TWM505059U (zh) | 2015-07-11 |
US20170231033A1 (en) | 2017-08-10 |
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