JP3160103B2 - Optical glass thickness measurement method - Google Patents

Optical glass thickness measurement method

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Publication number
JP3160103B2
JP3160103B2 JP34980992A JP34980992A JP3160103B2 JP 3160103 B2 JP3160103 B2 JP 3160103B2 JP 34980992 A JP34980992 A JP 34980992A JP 34980992 A JP34980992 A JP 34980992A JP 3160103 B2 JP3160103 B2 JP 3160103B2
Authority
JP
Japan
Prior art keywords
light
glass plate
measured
measuring
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP34980992A
Other languages
Japanese (ja)
Other versions
JPH06174432A (en
Inventor
英男 山内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP34980992A priority Critical patent/JP3160103B2/en
Publication of JPH06174432A publication Critical patent/JPH06174432A/en
Application granted granted Critical
Publication of JP3160103B2 publication Critical patent/JP3160103B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は光学式ガラス板厚測定方
法に関する。
The present invention relates about the optical glass plate thickness measuring method.

【0002】[0002]

【従来の技術】従来、ガラス板厚測定方法としてはマイ
クロメーター等による接触的測定法、超音波マイクロ
メーター等による半接触的測定法、あるいは放射線の
透過減衰量を測定することによる非接触的測定方法等が
あるが、近時、ガラス板に定速度で平行に移動するレー
ザー光を照射し、その表面反射光と裏面反射光の受光器
における検出光の時間差を計測することにより該ガラス
板厚を非接触的に測定する方法が開発され実用に供され
ている。
Conventionally, non-contact by measuring contact measuring how by micrometer or the like, semi-contact measuring how by ultrasound micrometer or the like, or the transmission attenuation of the radiation as a glass plate thickness measuring method Recently, a glass plate is irradiated with a laser beam that moves in parallel at a constant speed, and the time difference between the light reflected from the front surface and the light reflected from the back surface of the glass plate is measured. A method for non-contact measurement of plate thickness has been developed and put to practical use.

【0003】[0003]

【発明が解決しようとする課題】被測定ガラス板にビー
ムが実質的に一定速度で移動するレーザー光をガラス板
に照射し、受光光軸上に設置した受光器に検出されるそ
の表面反射光と裏面反射光の検出時間差を計測すること
によりガラス板厚を測定する方法において、被測定ガラ
ス板の内部に存在する僅かな屈折率の不均一性が該検出
時間差に誤差を生じさせ、測定精度の低下の原因となっ
ていた。図2に示す如く、被測定ガラス板の内部に存在
する僅かな屈折率の不均一性により受光器に検出される
その表面反射光と裏面反射光の方向のズレが生じ、上記
測定誤差を生じさせる
THE INVENTION Problems to be Solved] Bee on a glass plate to be measured
The glass plate is illuminated by irradiating the glass plate with a laser beam that moves at a substantially constant speed, and measuring the detection time difference between the reflected light on the front surface and the reflected light on the back surface, which is detected by a light receiver installed on the receiving optical axis. In the method of measuring the thickness, a slight non-uniformity of the refractive index existing inside the glass plate to be measured causes an error in the detection time difference, which causes a decrease in measurement accuracy. As shown in FIG. 2, occurs deviation in the direction of the surface reflected light and the back surface reflected light detected in the light receiver by the non-uniformity of a small refractive index existing in the glass plate to be measured, the
This causes a measurement error .

【0004】[0004]

【課題を解決するための手段】本発明は前述の課題を解
決すべくなされたものであり、発明者はかかる測定精度
の低下が被測定ガラス板の内部に存在する僅かな屈折率
の不均一性によりその表面反射光に対して裏面反射光が
平行でなくなることによることを見出だし、本発明に至
ったものである。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and the inventor of the present invention has found that such a decrease in measurement accuracy is caused by a slight unevenness of the refractive index existing inside the glass plate to be measured. It has been found that the light reflected on the back surface is no longer parallel to the light reflected on the front surface due to the nature of the light, thereby leading to the present invention.

【0005】すなわち、本発明は、照射光学系の光軸に
平行に、かつビームが実質的に一定速度で被測定ガラス
板の表面に沿って移動するレーザー光を被測定ガラス板
に照射し、その表面反射光と裏面反射光を受光器で検
出し、受光器における前記表面反射光の検出光と裏面反
射光の検出光との時間差計測し、該時間差より該ガラ
ス板厚を算出することにより該ガラス板厚を測定する方
法であって、受光光軸上の少なくとも2つの異なる位置
に設けた受光器ならびに測定光学系と被測定ガラス板の
距離を検出する手段を用いて、それぞれの受光器におけ
る前記時間差と前記距離を測定することにより被測定ガ
ラス板の厚さを算出することを特徴とする光学式ガラス
板厚測定方法を提供する。これにより、被測定ガラス板
の内部に存在する僅かな屈折率の不均一性による測定精
度の低下を除去したガラス板厚測定方法提供される。
That is, the present invention relates to a glass to be measured which is parallel to the optical axis of an irradiation optical system and whose beam is substantially constant.
The laser beam moves along the surface of the plate was irradiated on the glass plate to be measured, test and its surface reflection light and the light reflected by the lower surface by the photodetector
Out, and the detection light of the front surface reflected light in the light receiver and the back surface
Measures the time difference between the detection light Shako, the glass from the difference between said time
A method of measuring the glass plate thickness by calculating the thickness of the glass plate, wherein the photodetectors provided at at least two different positions on the light receiving optical axis and the measuring optical system and the glass plate to be measured are provided.
Using a means to detect the distance,
Measuring the time difference and the distance
Optical glass characterized by calculating the thickness of a lath plate
Provide a method for measuring a thickness. Thus, a glass plate thickness measuring method to remove the decrease in measurement precision due to non-uniformity of a small refractive index existing in the glass plate to be measured is Ru are provided.

【0006】本発明の詳細を図1によって説明する
ーザー光源LSを出たレーザー光は回転鏡RMと走査レ
ンズSLによって平行に移動する光ビームとなって被測
定ガラス板Gに照射される。その表面反射光と裏面反射
光は受光光軸上の少なくとも2つの異なる位置に設置さ
れた受光器SD1および受光器SD2(図1において受
光器SD1より距離 S だけ後方に設置)により検出さ
れる。ハーフミラーHMは受光器SD1および受光器S
D2が相互に検出の妨げにならない目的で用いられ、通
常は、SD2はハーフミラーHMの反射光を受ける位置
に設けられる
The details of the present invention will be described with reference to FIG . The laser light emitted from the laser light source LS is applied to the glass plate G as a light beam that moves in parallel by the rotating mirror RM and the scanning lens SL. The surface reflected light and the back reflected light is detected more in the light receiving optical axis of the at least two are located at different positions the optical receiver SD1 and the light receiver SD2 (located aft distance D S of the light receiving unit SD1 in FIG. 1) You. The half mirror HM includes the light receiver SD1 and the light receiver S
D2 is used for the purpose of not interfering with detection
Normally, SD2 is a position to receive the reflected light of the half mirror HM.
Is provided .

【0007】測定光学系の代表位置を受光器SD1の位
にとる。これと被測定ガラス板の測定点の距離
D、受光器SD1と受光器SD2の距離 S 、受光器
SD1および受光器SD2検出されるそれぞれの受光
器における表面反射光と裏面反射光との時間差t1、t2
から、被測定ガラス板の表面における時間差t0 は式
(1)で算出され、さらに式(2)で被測定ガラス板の
厚さTが得られる。 t0=t1+(t1−t2)・D/ S (1) T =k・t0 (2)
[0007] The representative position of the measuring optical system is set to the photo detector SD1.Rank
PlaceToYou.This and the glass plate to be measuredGMeasuring pointWhenDistance
D, light receiver SD1 and light receiver SD2WhenDistanceD S , Receiver
SD1 and photo detector SD2soDetectedEach light reception
In the vesselSurface reflected lightAnd the back reflection lightTime difference t1, TTwo
From the time difference t on the surface of the glass plate to be measured0 Is the expression
It is calculated by (1) and further calculated by equation (2).
A thickness T is obtained. t0= T1+ (T1-TTwo) ・ D /D S  (1) T = kt0 (2)

【0008】受光器SD1と被測定ガラス板の測定点
の距離Dの具体的な測定方法に限定はなく、本発明の要
件ではないが、非接触的な光学的方法が望ましく、例え
ば、反射型位置センサー用い得る。また、定数kは測
定光学系と被測定ガラス板の屈折率によって定まる装置
定数である。また、図1において、受光光軸上の受光器
と被測定ガラス板の間にいわゆるリレーレンズRLを置
き、測定光学系と被測定ガラス板の距離をあけることも
可能であり、また、これにより同図において受光器SD
1の位置を被測定ガラス板の左側(D<0)とすること
もできる。
[0008] There is no limitation to the specific method of measuring the distance D between the light receiving unit SD1 and the measurement point of the measurement the glass plate <br/>, although not a requirement of the present invention, non-contact optical methods is desirable For example, a reflective position sensor may be used. The constant k is a device constant determined by the refractive index of the measuring optical system and the glass plate to be measured. In FIG. 1, it is also possible to place a so-called relay lens RL between the light receiver on the light receiving optical axis and the glass plate to be measured, thereby increasing the distance between the measuring optical system and the glass plate to be measured. At the receiver SD
The position of 1 may be on the left side (D <0) of the glass plate to be measured.

【0009】[0009]

【実施例】図1において、レーザー光源LSに0.5m
Wヘリウムネオンガスレーザー、走査レンズSLに焦点
距離85mmのレンズ、受光光軸上に焦点距離25mm
のリレーレンズRLを用い、受光器SD1および受光器
SD2をリレーレンズRLよりそれぞれ40mm、55
mmの位置に設置し、被測定ガラス板とリレーレンズ
Lとの距離を55mmとした。このとき、リレーレンズ
RLから受光器SD1および受光器SD2の仮想的位置
はそれぞれ66.666mmおよび45.833mmと
なるので、受光器SD1の位置Dは−11.666m
m、受光器SD1と受光器SD2の距離 S は20.
833mmとなる。式(1)上の数値を用いて、t0
=0.44×t1+0.56×t2となる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In FIG.
W helium neon gas laser, a lens with a focal length of 85 mm on the scanning lens SL, and a focal length of 25 mm on the light receiving optical axis
Using the relay lens RL, respectively photoreceiver SD1 and the light receiver SD2 from the relay lens RL 40 mm, 55
mm, the glass plate to be measured and the relay lens R
The distance from L was 55 mm. At this time, the relay lens
From the RL, the virtual positions of the light receiver SD1 and the light receiver SD2 are 66.666 mm and 45.833 mm, respectively, so that the position D of the light receiver SD1 is -11.666 m.
m, the distance D S between the light receiver SD1 and receiver SD2 20.
833 mm. Using equation (1) and the above numerical values, t 0
= A 0.44 × t 1 + 0.56 × t 2.

【0010】表1は厚さ700μmの研磨されたガラス
板を1mm毎に測定位置をえて測定したt1、t2から
0を求めた値である。本発明により測定位置による測
定値の変動が減少し、高い精度のt0が得られた。した
がって、上記結果に示す如く、高い精度でガラス板の厚
さが求められた。
[0010] Table 1 is a value obtained with t 1, t 2 from t 0 was strange forte measured measurement position for each 1mm of polished glass plate having a thickness of 700 .mu.m. Variation of the measured values by more measurement positions on the onset bright is reduced, the t 0 with high accuracy is obtained. Therefore, as shown in the above results , the thickness of the glass plate was determined with high accuracy.

【0011】[0011]

【表1】 [Table 1]

【0012】[0012]

【発明の効果】ガラス板の板厚を測定するにあたり本発
明の方法を用いることにより、被測定ガラス板の内部に
存在する僅かな屈折率の不均一性による測定精度の低下
が軽減される。特にガラス製造工程におけるオンライン
測定においては被測定ガラス板の位置の変動が避けられ
ないが、本発明によりガラス板の板厚が高い測定精度で
得られる。また特に、本発明の方法を製造工程に適用す
ることにより、生産性の向上に大きな効果が得られる。
By using the method of the present invention in measuring the thickness of a glass plate, a decrease in measurement accuracy due to a slight non-uniformity of the refractive index existing inside the glass plate to be measured is reduced. In particular online measuring in the glass manufacturing process but unavoidable fluctuations in the position of the glass plate to be measured, the thickness of the more glass plates to the onset bright is obtained with high measurement accuracy. Particularly, by applying the method of the present invention to the manufacturing process, a great effect can be obtained in improving the productivity.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の光学系の構成図。FIG. 1 is a configuration diagram of an optical system according to the present invention.

【図2】本発明の課題を示すモデル図。FIG. 2 is a model diagram showing an object of the present invention.

【符号の説明】[Explanation of symbols]

LS:レーザー光源 RM:回転鏡 SL:走査レンズ SD1、SD2:受光器 HM:ハーフミラー G:被測定ガラス板 D:受光器SD1と被測定ガラス板の距離 Ds:受光器SD1と受光器SD2の距離 RL:リレーレンズ LS: Laser light source RM: Rotating mirror SL: Scanning lens SD1, SD2: Light receiver HM: Half mirror G: Glass plate to be measured D: Distance between light receiver SD1 and glass plate to be measured Ds: Distance between light receiver SD1 and light receiver SD2 Distance RL: Relay lens

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】照射光学系の光軸に平行に、かつビームが
実質的に一定速度で被測定ガラス板の表面に沿って移動
するレーザー光を被測定ガラス板に照射し、その表面反
射光と裏面反射光を受光器で検出し、受光器における
前記表面反射光の検出光と裏面反射光の検出光との時間
計測し、該時間差より該ガラス板厚を算出すること
により該ガラス板厚を測定する方法であって、受光光軸
上の少なくとも2つの異なる位置に設けた受光器ならび
に測定光学系と被測定ガラス板の距離を検出する手段を
用いて、それぞれの受光器における前記時間差と前記
離を測定することにより被測定ガラス板の厚さを算出す
ることを特徴とする光学式ガラス板厚測定方法。
1. A parallel to the optical axis of the illumination optical system, and irradiated with laser light beam travels along the <br/> substantially the surface of the measured glass plate at a constant speed on a glass plate to be measured, and the surface reflected light and the light reflected by the lower surface is detected by the light receiver, the light receiver
A method of measuring the time difference between the detection light of the front surface reflected light and the detection light of the back surface reflected light, and measuring the glass plate thickness by calculating the glass plate thickness from the time difference , using means for detecting a distance of at least two different light receiver provided at a position and the measuring optical system and the measured glass plate on the light receiving optical axis, the time difference in each of the light receiver and the distance <br/> away An optical glass sheet thickness measuring method, wherein the thickness of a glass sheet to be measured is calculated by measuring.
JP34980992A 1992-12-02 1992-12-02 Optical glass thickness measurement method Expired - Fee Related JP3160103B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34980992A JP3160103B2 (en) 1992-12-02 1992-12-02 Optical glass thickness measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34980992A JP3160103B2 (en) 1992-12-02 1992-12-02 Optical glass thickness measurement method

Publications (2)

Publication Number Publication Date
JPH06174432A JPH06174432A (en) 1994-06-24
JP3160103B2 true JP3160103B2 (en) 2001-04-23

Family

ID=18406268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34980992A Expired - Fee Related JP3160103B2 (en) 1992-12-02 1992-12-02 Optical glass thickness measurement method

Country Status (1)

Country Link
JP (1) JP3160103B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100372093C (en) * 2004-12-10 2008-02-27 上海宏力半导体制造有限公司 Method for real-time measuring of milling eliminating rate

Also Published As

Publication number Publication date
JPH06174432A (en) 1994-06-24

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