JP3127824B2 - Sputtering target for forming ferroelectric film and method for manufacturing the same - Google Patents

Sputtering target for forming ferroelectric film and method for manufacturing the same

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Publication number
JP3127824B2
JP3127824B2 JP08114764A JP11476496A JP3127824B2 JP 3127824 B2 JP3127824 B2 JP 3127824B2 JP 08114764 A JP08114764 A JP 08114764A JP 11476496 A JP11476496 A JP 11476496A JP 3127824 B2 JP3127824 B2 JP 3127824B2
Authority
JP
Japan
Prior art keywords
composite oxide
powder
ferroelectric film
oxide powder
sputtering target
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP08114764A
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Japanese (ja)
Other versions
JPH09302462A (en
Inventor
暁 森
淳一 小田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
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Mitsubishi Materials Corp
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Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP08114764A priority Critical patent/JP3127824B2/en
Priority to TW085116344A priority patent/TW343999B/en
Priority to KR1019970006270A priority patent/KR100494610B1/en
Publication of JPH09302462A publication Critical patent/JPH09302462A/en
Application granted granted Critical
Publication of JP3127824B2 publication Critical patent/JP3127824B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Compositions Of Oxide Ceramics (AREA)
  • Physical Vapour Deposition (AREA)
  • Semiconductor Memories (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、半導体メモリー
などのキャパシタ用薄膜など強誘電体膜形成用スパッタ
リングターゲットに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sputtering target for forming a ferroelectric film such as a thin film for a capacitor such as a semiconductor memory.

【0002】[0002]

【従来の技術】一般に、BaTiO3 などのBaおよび
Tiの複合酸化物(以下、BaTi複合酸化物とい
う)、SrTiO3 などのSrおよびTiの複合酸化物
(以下、SrTi複合酸化物という)並びに(Ba,S
r)TiO3 などのBa、SrおよびTiの複合酸化物
(以下、BaSrTi複合酸化物という)などの焼結体
からなるからなるスパッタリングターゲットを用いてペ
ロブスカイト構造を有する強誘電体膜を形成し、半導体
メモリー等におけるキャパシタ用薄膜として用いること
は知られている。
2. Description of the Related Art Generally, a composite oxide of Ba and Ti such as BaTiO 3 (hereinafter referred to as BaTi composite oxide), a composite oxide of Sr and Ti such as SrTiO 3 (hereinafter referred to as SrTi composite oxide) and ( Ba, S
r) forming a ferroelectric film having a perovskite structure using a sputtering target made of a sintered body such as a composite oxide of Ba, Sr and Ti such as TiO 3 (hereinafter referred to as a BaSrTi composite oxide); It is known to be used as a thin film for a capacitor in a semiconductor memory or the like.

【0003】前記BaTi複合酸化物、SrTi複合酸
化物またはBaSrTi複合酸化物焼結体からなる強誘
電体膜形成用スパッタリングターゲットは、市販のBa
Ti複合酸化物粉末、SrTi複合酸化物粉末またはB
aSrTi複合酸化物粉末を購入し、このBaTi複合
酸化物粉末、SrTi複合酸化物粉末またはBaSrT
i複合酸化物粉末をそれぞれ圧力:150kg/c
2 、温度:1200〜1350℃、0.5〜3時間保
持の条件でホットプレスすることにより製造する。前記
ホットプレスされたBaTi複合酸化物、SrTi複合
酸化物またはBaSrTi複合酸化物からなる焼結体
は、機械加工して所定のターゲット形状に仕上げられ
る。
[0003] The sputtering target for forming a ferroelectric film formed of a sintered body of BaTi composite oxide, SrTi composite oxide or BaSrTi composite oxide is a commercially available Ba target.
Ti composite oxide powder, SrTi composite oxide powder or B
aSrTi composite oxide powder is purchased and this BaTi composite oxide powder, SrTi composite oxide powder or BaSrT
Pressure of i composite oxide powder: 150 kg / c
It is manufactured by hot pressing under the conditions of m 2 , temperature: 1200 to 1350 ° C., and holding for 0.5 to 3 hours. The sintered body made of the hot-pressed BaTi composite oxide, SrTi composite oxide or BaSrTi composite oxide is machined and finished to a predetermined target shape.

【0004】[0004]

【発明が解決しようとする課題】近年、半導体メモリー
の大量生産とコストダウンのために、高出力でスパッタ
リングし、高速成膜することにより短時間で強誘電体膜
を形成しょうとしている。しかし、従来の強誘電体膜形
成用スパッタリングターゲットを用いて成膜速度:10
0オングストローム/min.以上の高速スパッタリン
グ成膜を行うと、ターゲット表面が鱗片状に剥離した
り、ターゲット全体が割れてしまうことがあり、また1
00オングストローム/min.以上の高速スパッタリ
ング成膜を行うためには、ターゲットを高密度化してタ
ーゲットの強度および熱伝導度を上げる必要があるが、
従来の原料を用いてホットプレスによりターゲットを製
造すると、ホットプレス上がりで割れが発生しやすく、
製品の歩留まりが低かった。
In recent years, for mass production and cost reduction of semiconductor memories, it has been attempted to form a ferroelectric film in a short time by sputtering at a high output and forming a film at a high speed. However, using a conventional sputtering target for forming a ferroelectric film, a film forming rate of 10
0 angstroms / min. When the high-speed sputtering film formation is performed, the target surface may peel off in a scale-like manner, or the entire target may be broken.
00 angstroms / min. In order to perform the above high-speed sputtering film formation, it is necessary to increase the density of the target and increase the strength and thermal conductivity of the target,
When a target is manufactured by hot pressing using conventional raw materials, cracks tend to occur due to hot press up,
Product yield was low.

【0005】[0005]

【課題を解決するための手段】そこで、本発明者らは、
高電力をかけて高速スパッタリング成膜しても割れおよ
び剥離が生ずることがなく、さらにスパッタリングター
ゲット製造時の割れが発生せすることのない強誘電体膜
形成用スパッタリングターゲットを開発すべく研究を行
なった結果、(a)従来の強誘電体膜形成用スパッタリ
ングターゲットには、炭素が500〜1000ppm程
度含まれており、前記高速スパッタリング成膜時の割れ
および剥離は、炭素が大きく影響を及ぼすところから、
強誘電体膜形成用スパッタリングターゲットに含まれる
炭素は可及的に少ない方がよく、C:300ppm以下
に抑える必要がある、(b)従来の強誘電体膜形成用ス
パッタリングターゲットの原料粉末として用いる市販の
BaTi複合酸化物粉末、SrTi複合酸化物粉末また
はBaSrTi複合酸化物粉末には、いずれも炭素が5
00〜1000ppm程度含まれており、この炭素が5
00〜1000ppm程度含まれているBaTi複合酸
化物粉末、SrTi複合酸化物粉末またはBaSrTi
複合酸化物粉末を用いて強誘電体膜形成用スパッタリン
グターゲットを製造すると、スパッタリングターゲット
製造時のホットプレス上がりで割れが発生するところか
ら、原料粉末に含まれる炭素は、可及的に少ない方がよ
く、C:300ppm以下に抑える必要がある、という
知見を得たのである。
Means for Solving the Problems Accordingly, the present inventors have:
Conducted research to develop a sputtering target for ferroelectric film formation that does not cause cracking and peeling even when high-speed sputtering film formation is applied with high power, and that does not cause cracking during manufacturing of the sputtering target. As a result, (a) The conventional sputtering target for forming a ferroelectric film contains carbon in an amount of about 500 to 1000 ppm, and the cracks and peeling during the high-speed sputtering film formation are largely affected by carbon. ,
The carbon contained in the sputtering target for forming a ferroelectric film is preferably as small as possible, and it is necessary to suppress C: 300 ppm or less. (B) Used as a raw material powder of a conventional sputtering target for forming a ferroelectric film. Each of commercially available BaTi composite oxide powder, SrTi composite oxide powder and BaSrTi composite oxide powder contains 5 carbon atoms.
About 1000-1000 ppm, and this carbon
BaTi composite oxide powder, SrTi composite oxide powder or BaSrTi
When a sputtering target for forming a ferroelectric film is manufactured using a composite oxide powder, cracks occur due to hot pressing at the time of manufacturing the sputtering target. Well, it was found that it was necessary to suppress C: to 300 ppm or less.

【0006】この発明は、かかる知見に基づいて成され
たものであって、(1)C含有量が300ppm以下の
BaTi複合酸化物焼結体からなる強誘電体膜形成用ス
パッタリングターゲット。(2)C含有量が300pp
m以下のSrTi複合酸化物焼結体からなる強誘電体膜
形成用スパッタリングターゲット、(3)C含有量が3
00ppm以下のBaSrTi複合酸化物焼結体からな
る強誘電体膜形成用スパッタリングターゲット、(4)
C含有量が300ppm以下のBaおよびTiの複合酸
化物粉末、C含有量が300ppm以下のSrおよびT
iの複合酸化物粉末、またはC含有量が300ppm以
下のBa、SrおよびTiの複合酸化物粉末を焼結する
強誘電体膜形成用スパッタリングターゲットの製造方
法、に特徴を有するものである。
The present invention has been made based on such findings, and (1) a sputtering target for forming a ferroelectric film, comprising a BaTi composite oxide sintered body having a C content of 300 ppm or less. (2) C content is 300pp
m, a sputtering target for forming a ferroelectric film comprising a SrTi composite oxide sintered body having a C content of 3 m or less.
(4) a sputtering target for forming a ferroelectric film, comprising a BaSrTi composite oxide sintered body of not more than 00 ppm;
Ba and Ti composite oxide powder having a C content of 300 ppm or less, Sr and T having a C content of 300 ppm or less
The present invention is characterized by a method for producing a ferroelectric film-forming sputtering target for sintering a composite oxide powder of i or a composite oxide powder of Ba, Sr and Ti having a C content of 300 ppm or less.

【0007】ターゲットに含まれるC含有量は、高出力
スパッタリング中のターゲットの割れおよび剥離に大き
く影響を及ぼすところから、可及的に少ない方が好まし
いが、300ppmを越えて含有すると、高出力スパッ
タリング中の全てのターゲットに割れおよび剥離が発生
するので好ましくない。したがって、Cの含有量を30
0ppm以下に定めた。C含有量の一層好ましい範囲は
100ppm以下である。
[0007] The C content contained in the target is preferably as small as possible because it greatly affects the cracking and peeling of the target during high-power sputtering. Undesirably, cracks and peeling occur in all the targets inside. Therefore, if the content of C is 30
It was determined to be 0 ppm or less. A more preferred range of the C content is 100 ppm or less.

【0008】また、炭素が500〜1000ppm程度
含まれている市販のBaTi複合酸化物粉末、SrTi
複合酸化物粉末またはBaSrTi複合酸化物粉末を原
料粉末として用いるとホットプレス上がりで割れが発生
するのは、焼結は周囲から中心部に向かって進行すると
ころから、焼結体の中央部に発生したCOガスが逃げ場
を失い、焼結体を破壊しすることによるものと考えられ
る。
A commercially available BaTi composite oxide powder containing about 500 to 1000 ppm of carbon, SrTi
When the composite oxide powder or the BaSrTi composite oxide powder is used as a raw material powder, cracks are generated by hot pressing because the sintering proceeds from the periphery toward the center and occurs at the center of the sintered body. It is considered that the released CO gas loses an escape place and destroys the sintered body.

【0009】この発明で使用する原料粉末であるC含有
量が300ppm以下のBaTi複合酸化物粉末、Sr
Ti複合酸化物粉末またはBaSrTi複合酸化物粉末
は、市販のBaTi複合酸化物粉末、SrTi複合酸化
物粉末またはBaSrTi複合酸化物粉末を、大気中、
温度:1100℃、6時間保持の条件で加熱することに
より製造することができる。これらBaTi複合酸化物
粉末、SrTi複合酸化物粉末またはBaSrTi複合
酸化物粉末は、1100℃に加熱しても焼結することは
無い。
A raw material powder used in the present invention, a BaTi composite oxide powder having a C content of 300 ppm or less, Sr
Ti composite oxide powder or BaSrTi composite oxide powder, commercially available BaTi composite oxide powder, SrTi composite oxide powder or BaSrTi composite oxide powder, in the air,
It can be manufactured by heating at a temperature of 1100 ° C. for 6 hours. These BaTi composite oxide powder, SrTi composite oxide powder or BaSrTi composite oxide powder do not sinter even when heated to 1100 ° C.

【0010】[0010]

【発明の実施の形態】BEST MODE FOR CARRYING OUT THE INVENTION

市販の純度:99.9%のBaTiO3 粉末、SrTi
3 粉末、(Ba0.75,Sr0.25)TiO3 粉末、(B
0.5 ,Sr0.5 )TiO3 粉末および(Ba 0.25,S
0.75)TiO3 粉末を購入し、C含有量を測定したと
ころ、表1に示されるCが含まれていた。
 Commercial purity: 99.9% BaTiOThreePowder, SrTi
OThreePowder, (Ba0.75, Sr0.25) TiOThreePowder, (B
a0.5, Sr0.5) TiOThreePowder and (Ba 0.25, S
r0.75) TiOThreeAfter purchasing the powder and measuring the C content
At this time, C shown in Table 1 was included.

【0011】この市販のBaTiO3 粉末、SrTiO
3 粉末、(Ba0.75,Sr0.25)TiO3 粉末、(Ba
0.5 ,Sr0.5 )TiO3 粉末および(Ba0.25,Sr
0.75)TiO3 粉末を,大気中、1100℃で1時間保
持の条件で加熱処理することにより脱炭し、表1に示さ
れる成分組成の極低炭素複合酸化物粉末を作製した。
This commercially available BaTiO 3 powder, SrTiO
3 powder, (Ba 0.75 , Sr 0.25 ) TiO 3 powder, (Ba
0.5 , Sr 0.5 ) TiO 3 powder and (Ba 0.25 , Sr
0.75 ) The TiO 3 powder was decarburized by heat treatment at 1100 ° C. for 1 hour in the air to produce an ultra-low carbon composite oxide powder having the component composition shown in Table 1.

【0012】[0012]

【表1】 [Table 1]

【0013】実施例 加熱処理して得られた表1に示される炭素濃度の極低炭
素複合酸化物粉末をボールミルに入れて粉砕し、平均粒
径:1〜5μmを有する極低炭素複合酸化物粉末を製造
し、さらに得られた極低炭素複合酸化物粉末をグラファ
イトモールドに充填し、 昇温速度:5℃/min、 加熱温度:1300℃、 圧力:150ton/cm2 、 保持時間:1時間、 冷却:炉冷、 の条件でホットプレスした後、表面を研削することによ
り、直径:350mm、厚さ:6mmの寸法を有する本
発明スパッタリングターゲット(以下、本発明ターゲッ
トという)1〜5を作製した。得られた本発明ターゲッ
ト1〜5のC含有量を表2に示す。
EXAMPLE An ultra-low carbon composite oxide powder obtained by heat treatment and having a carbon concentration shown in Table 1 was put into a ball mill and pulverized to obtain an ultra-low carbon composite oxide having an average particle size of 1 to 5 μm. A powder is produced, and the obtained ultra-low carbon composite oxide powder is filled in a graphite mold. The temperature rising rate is 5 ° C./min, the heating temperature is 1300 ° C., the pressure is 150 ton / cm 2 , and the holding time is 1 hour. After hot pressing under the conditions of: cooling: furnace cooling, the surface is ground to produce sputtering targets of the present invention (hereinafter, referred to as target of the present invention) 1 to 5 having dimensions of 350 mm in diameter and 6 mm in thickness. did. Table 2 shows the obtained C contents of the present targets 1 to 5.

【0014】さらに、本発明ターゲット1〜5につい
て、同一原料で10回ずつホットプレスを行って割れが
発生せずにホットプレスできたターゲットの成功枚数を
測定し、その結果を表2に示した。次に、割れが発生せ
ずにホットプレスできたターゲットをIn−Snはんだ
により水冷銅板に接合し、高周波マグネトロンスパッタ
装置内にセットし、 雰囲気ガス:Arと酸素の混合ガス(Ar:O=1:
1)、 雰囲気圧力:1pa、 周波数:13.56Mhz、 出力:6000W、 時間:50時間、 の条件にてスパッタし、ターゲットに鱗片状に割れが発
生したか否かを黙視にて観察し、その結果も表2に示し
た。
Further, with respect to the targets 1 to 5 of the present invention, hot pressing was performed 10 times with the same raw material, and the number of successful hot pressing without cracks was measured. The results are shown in Table 2. . Next, the target that could be hot pressed without cracking was bonded to a water-cooled copper plate with In-Sn solder, set in a high-frequency magnetron sputtering apparatus, and an atmosphere gas: a mixed gas of Ar and oxygen (Ar: O = 1) :
1) Atmospheric pressure: 1 pa, frequency: 13.56 Mhz, output: 6000 W, time: 50 hours, sputtered, and observed whether or not a flake-like crack was generated on the target by silent observation. The results are also shown in Table 2.

【0015】従来例 表1に示される炭素濃度の市販のBaTiO3 粉末、S
rTiO3 粉末、(Ba0.75,Sr0.25)TiO3
末、(Ba0.5 ,Sr0.5 )TiO3 粉末および(Ba
0.25,Sr0.75)TiO3 粉末を実施例と同じ条件でホ
ットプレスすることにより従来スパッタリングターゲッ
ト(以下、従来ターゲットという)1〜5を作製した。
得られた従来ターゲット1〜5に含まれるC含有量を測
定し、同一原料で10回ずつ行いって割れが発生せずに
ホットプレスできたターゲットの成功枚数を測定し、さ
らに割れが発生せずにホットプレスできたターゲットを
用いて実施例と同じ条件でスパッタし、その際にターゲ
ットに鱗片状割れが発生したか否かを黙視にて観察し、
その結果を表2に示した。
Conventional Example A commercially available BaTiO 3 powder having a carbon concentration shown in Table 1
rTiO 3 powder, (Ba 0.75 , Sr 0.25 ) TiO 3 powder, (Ba 0.5 , Sr 0.5 ) TiO 3 powder and (Ba
0.25 , Sr 0.75 ) TiO 3 powder was hot-pressed under the same conditions as in the examples to produce conventional sputtering targets (hereinafter referred to as conventional targets) 1 to 5.
The C content contained in the obtained conventional targets 1 to 5 was measured, and the number of successful targets that could be hot-pressed without cracking by performing the same raw material 10 times was measured. Sputtering under the same conditions as in the example using the target that could be hot pressed without, observing with naked eye whether scaly cracks occurred in the target at that time,
The results are shown in Table 2.

【0016】[0016]

【表2】 [Table 2]

【0017】[0017]

【発明の効果】表1〜表2に示される結果から、極低炭
素複合酸化物粉末を使用して得られたC含有量:300
ppm以下の本発明ターゲット1〜5は、いずれも市販
のC含有量:500〜1000ppm含む複合酸化物粉
末を使用して得られたC含有量:400ppm以上含む
従来ターゲット1〜5に比べて、ホットプレスによる製
造時に割れが発生せず、またスパッタリング時に剥離ま
たは割れが生ずることなく高出力および高速成膜がで
き、産業上優れた効果を奏するものである。
From the results shown in Tables 1 and 2, the C content obtained by using the ultra-low carbon composite oxide powder: 300
Each of the targets 1 to 5 of the present invention having a C content of not more than 1 ppm is obtained by using a commercially available composite oxide powder containing a C content of 500 to 1000 ppm. Cracks do not occur during production by hot pressing, and high-power and high-speed film formation can be performed without peeling or cracking during sputtering, and an industrially superior effect is achieved.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI H01L 21/8242 H01L 27/10 651 27/108 (58)調査した分野(Int.Cl.7,DB名) C23C 14/00 - 14/58 C01G 23/00 C01G 25/00 - 57/00 C04B 35/42 C01F 11/16 C01B 13/16 JICSTファイル(JOIS)──────────────────────────────────────────────────の Continuation of front page (51) Int.Cl. 7 identification code FI H01L 21/8242 H01L 27/10 651 27/108 (58) Fields investigated (Int.Cl. 7 , DB name) C23C 14/00 -14/58 C01G 23/00 C01G 25/00-57/00 C04B 35/42 C01F 11/16 C01B 13/16 JICST file (JOIS)

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 C含有量が300ppm以下のBaおよ
びTiの複合酸化物焼結体からなることを特徴とする強
誘電体膜形成用スパッタリングターゲット。
1. A sputtering target for forming a ferroelectric film, comprising a sintered oxide of Ba and Ti having a C content of 300 ppm or less.
【請求項2】 C含有量が300ppm以下のSrおよ
びTiの複合酸化物焼結体からなることを特徴とする強
誘電体膜形成用スパッタリングターゲット。
2. A sputtering target for forming a ferroelectric film, comprising a sintered composite oxide of Sr and Ti having a C content of 300 ppm or less.
【請求項3】 C含有量が300ppm以下のBa、S
rおよびTiの複合酸化物焼結体からなることを特徴と
する強誘電体膜形成用スパッタリングターゲット。
3. Ba and S having a C content of 300 ppm or less.
A sputtering target for forming a ferroelectric film, comprising a composite oxide sintered body of r and Ti.
【請求項4】 C含有量が300ppm以下のBaおよ
びTiの複合酸化物粉末、C含有量が300ppm以下
のSrおよびTiの複合酸化物粉末、またはC含有量が
300ppm以下のBa、SrおよびTiの複合酸化物
粉末を焼結することを特徴とする強誘電体膜形成用スパ
ッタリングターゲットの製造方法。
4. A composite oxide powder of Ba and Ti having a C content of 300 ppm or less, a composite oxide powder of Sr and Ti having a C content of 300 ppm or less, or Ba, Sr and Ti having a C content of 300 ppm or less. A method for producing a sputtering target for forming a ferroelectric film, characterized by sintering a composite oxide powder of (1).
JP08114764A 1996-02-28 1996-05-09 Sputtering target for forming ferroelectric film and method for manufacturing the same Expired - Fee Related JP3127824B2 (en)

Priority Applications (3)

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JP08114764A JP3127824B2 (en) 1996-05-09 1996-05-09 Sputtering target for forming ferroelectric film and method for manufacturing the same
TW085116344A TW343999B (en) 1996-02-28 1996-12-31 High density sputtering target for forming ferroelectric film
KR1019970006270A KR100494610B1 (en) 1996-02-28 1997-02-27 High-Density Sputtering Target for Forming High-Dielectric Films

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP08114764A JP3127824B2 (en) 1996-05-09 1996-05-09 Sputtering target for forming ferroelectric film and method for manufacturing the same

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JP3127824B2 true JP3127824B2 (en) 2001-01-29

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TWI385139B (en) * 2005-02-01 2013-02-11 Tosoh Corp A sintered body, a sputtering target and a forming die, and a sintered body manufacturing method using the same
JP5778372B2 (en) * 2005-02-01 2015-09-16 東ソー株式会社 Sintered body, sputtering target, mold and method for producing sintered body
JP6756886B1 (en) * 2019-04-26 2020-09-16 Jx金属株式会社 Potassium niobate sodium sputtering target

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