JP3114410B2 - Image sensor test method - Google Patents

Image sensor test method

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Publication number
JP3114410B2
JP3114410B2 JP05027030A JP2703093A JP3114410B2 JP 3114410 B2 JP3114410 B2 JP 3114410B2 JP 05027030 A JP05027030 A JP 05027030A JP 2703093 A JP2703093 A JP 2703093A JP 3114410 B2 JP3114410 B2 JP 3114410B2
Authority
JP
Japan
Prior art keywords
light
image sensor
test
test light
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP05027030A
Other languages
Japanese (ja)
Other versions
JPH06244396A (en
Inventor
友彦 澤柳
一夫 宮澤
明弘 川村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP05027030A priority Critical patent/JP3114410B2/en
Publication of JPH06244396A publication Critical patent/JPH06244396A/en
Application granted granted Critical
Publication of JP3114410B2 publication Critical patent/JP3114410B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明はイメージセンサの映像検
出精度を確かめるためその複数の光センサの光検出感度
のばらつきを試験する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for testing variations in light detection sensitivities of a plurality of optical sensors in order to check the image detection accuracy of an image sensor.

【0002】[0002]

【従来の技術】CCD装置やフォトダイオードアレイと
してのイメージセンサでは、集積回路技術を利用して多
数の光センサを小形チップ内に集積化できるが、最近で
はその用途の拡大とともに映像検出の精度を高める要求
が益々強くなっている。例えば自動焦点カメラ用のイメ
ージセンサでは、各光センサが受ける光強度を4ビット
以上のディジタルデータに変換し得る高精度が要求され
る。かかる要求を満たすには、もちろんイメージセンサ
内の光センサの光検出特性が映像検出精度の要求水準に
応じて均一に揃っていなければならないので、その複数
の光センサの検出感度のばらつきを正確に試験する必要
があり、この試験のためには充分に均一な光束をイメー
ジセンサに入射させる必要がある。
2. Description of the Related Art In an image sensor as a CCD device or a photodiode array, a large number of optical sensors can be integrated in a small chip by using an integrated circuit technology. There is an increasing demand for heightening. For example, in an image sensor for an autofocus camera, high precision that can convert the light intensity received by each optical sensor into digital data of 4 bits or more is required. In order to satisfy such requirements, the light detection characteristics of the optical sensors in the image sensor must be uniform in accordance with the required level of image detection accuracy. A test needs to be performed, and a sufficiently uniform light flux needs to be incident on the image sensor for this test.

【0003】図2にこの均一な試験光の光束をイメージ
センサに与えるに適した従来方法の例を示す。図示のよ
うに試験光Ltを例えば1対の光源30により発生させ、そ
れを拡散板60により反射させて拡散性の光束に変換した
上でイメージセンサ10に入射させる。光源30には試験に
適する広い波長分布で発光するハロゲン電球等の白熱電
灯31を用い、拡散板60に与える光束をできるだけ広げる
ように反射板32と組み合わせる。拡散板60にはつや消し
の白色塗料を塗布したものを用いる。この従来方法では
光源30と拡散板60の距離, および拡散板60とイメージセ
ンサ10の距離をできるだけ大きくとり、かつ拡散板60の
光に対する拡散性ないし散乱性を高めることにより、試
験に適するほぼ均一な強度分布をもつ試験光Ltの拡散性
の光束をイメージセンサ10に与えることができる。
FIG. 2 shows an example of a conventional method suitable for applying the uniform test light beam to an image sensor. As shown in the drawing, the test light Lt is generated by, for example, a pair of light sources 30, reflected by a diffusion plate 60, converted into a diffusive light flux, and then incident on the image sensor 10. As the light source 30, an incandescent lamp 31 such as a halogen bulb emitting light with a wide wavelength distribution suitable for a test is used, and is combined with the reflector 32 so as to spread the luminous flux given to the diffuser 60 as much as possible. As the diffusion plate 60, a matte white paint is used. In this conventional method, the distance between the light source 30 and the diffusion plate 60, and the distance between the diffusion plate 60 and the image sensor 10 are made as large as possible, and the diffusion or scattering of the diffusion plate 60 with respect to light is increased, so that a substantially uniform light suitable for testing is obtained. A diffusive luminous flux of the test light Lt having an appropriate intensity distribution can be given to the image sensor 10.

【0004】図3に示す従来例では図2の拡散板60のか
わりに拡散箱50を用いる。光源30は白熱電灯31および反
射板32をケース33に収納したもので、拡散箱50はケース
51の内面に拡散コーティング52を施して光源30から光束
を受ける入射窓53とイメージセンサ10に試験光Ltの光束
を出射する窓54を設け、さらに出射窓54に光拡散性の乳
白色ガラス等である窓材55を取り付けてなる。この従来
方法では光源30からの試験光Ltを拡散箱60の内面で繰り
返し反射させて拡散性光束とし、さらに窓材55によりそ
の拡散性を高めることによってイメージセンサ10に均一
な光強度分布の試験光Ltを与えることができる。以上の
図2や図3の従来方法による試験光Ltを受けるイメージ
センサ10に測定装置を接続し、その各光センサの光検出
信号値を測定することによって検出感度のばらつきを試
験する。
In the conventional example shown in FIG. 3, a diffusion box 50 is used instead of the diffusion plate 60 shown in FIG. The light source 30 includes an incandescent lamp 31 and a reflector 32 in a case 33, and the diffusion box 50 is a case.
A diffusion coating 52 is provided on the inner surface of 51, and an entrance window 53 for receiving a light beam from the light source 30 and a window 54 for emitting the light beam of the test light Lt are provided on the image sensor 10, and a light diffusing milky white glass or the like is further provided on the emission window 54. A certain window material 55 is attached. In this conventional method, the test light Lt from the light source 30 is repeatedly reflected on the inner surface of the diffusion box 60 to form a diffusive light flux, and the diffusivity is further enhanced by the window material 55 to test the uniform light intensity distribution on the image sensor 10. Light Lt can be given. A measuring device is connected to the image sensor 10 receiving the test light Lt according to the conventional method shown in FIGS. 2 and 3, and a variation in detection sensitivity is tested by measuring a light detection signal value of each light sensor.

【0005】[0005]

【発明が解決しようとする課題】ところが、イメージセ
ンサの映像検出精度の向上に対する要求が最近では益々
強まって来ており、これに応じてイメージセンサの各光
センサが受ける光強度を例えば8ビット精度のディジタ
ルデータに変換し得る程度に高めようとすると、光セン
サの検出感度のばらつきを 0.4%以下に抑える必要があ
り、かかる感度のばらつきを正確に試験するにはイメー
ジセンサに与える試験光を少なくともそれよりも小さい
例えば 0.1%以下の誤差範囲内で均一化する必要があ
る。しかし、図2や図3で説明した従来方法では試験光
を1%以下の誤差範囲内で均一化するのが非常に困難な
問題がある。
However, recently, the demand for improving the image detection accuracy of the image sensor has been increasing more and more, and accordingly, the light intensity received by each optical sensor of the image sensor is, for example, 8-bit accuracy. In order to improve the sensitivity of the optical sensor, it is necessary to suppress the variation in the detection sensitivity of the optical sensor to 0.4% or less. It is necessary to equalize the error within a smaller error range of, for example, 0.1% or less. However, the conventional method described with reference to FIGS. 2 and 3 has a problem that it is very difficult to make the test light uniform within an error range of 1% or less.

【0006】すなわち、図2の従来方法では拡散板60の
光拡散性の良好なものが得られ難くかつ光源30を置く位
置によってイメージセンサ10が受ける試験光Ltの強度分
布が変わりやすいので、図のように1対の光源30を用い
てそれらの位置を種々変えてみても強度分布を均一化す
るのが困難である。また、イメージセンサ10や光源30か
ら拡散板60を3〜数mも離せばかかる問題はかなり軽減
されるが、試験光Ltの利用効率が著しく低下して高光強
度下の試験が困難になるほか、投光系を含めた試験装置
が非常に大掛かりになってしまう。また、図3の従来方
法では投光系はずっと小形で済むが、拡散箱50の試験光
Ltを拡散性光束に変換する性能を高めるのが困難であ
り、かつ上述のように光源30に白熱電灯31を用いると図
2とは逆にイメージセンサ10を低光強度で試験をする際
に試験光Ltの均一性がとくに低下しやすい問題がある。
That is, in the conventional method shown in FIG. 2, it is difficult to obtain a good light diffusing property of the diffusion plate 60, and the intensity distribution of the test light Lt received by the image sensor 10 is easily changed depending on the position where the light source 30 is placed. Even if the positions of the light sources 30 are variously changed using the pair of light sources 30, it is difficult to make the intensity distribution uniform. Further, if the diffusion plate 60 is separated from the image sensor 10 and the light source 30 by 3 to several meters, the problem is considerably reduced, but the use efficiency of the test light Lt is remarkably reduced and the test under high light intensity becomes difficult. In addition, the test equipment including the light projecting system becomes very large. Also, the conventional method shown in FIG.
It is difficult to enhance the performance of converting Lt into a diffusive light flux, and when the incandescent lamp 31 is used as the light source 30 as described above, when the image sensor 10 is tested at a low light intensity contrary to FIG. There is a problem that the uniformity of the test light Lt is particularly likely to decrease.

【0007】かかる事情から、本発明の目的はイメージ
センサの映像検出精度を高めた場合にもそれに応じた高
い精度でその光センサの光検出感度のばらつきを試験で
きるように試験光の光強度分布を均一化することにあ
る。
Under these circumstances, an object of the present invention is to provide a light intensity distribution of a test light so that even when the image detection accuracy of an image sensor is enhanced, the variation in the light detection sensitivity of the optical sensor can be tested with a correspondingly high accuracy. Is to equalize.

【0008】[0008]

【課題を解決するための手段】本発明では上記の目的
は、イメージセンサの複数個の光センサの光検出感度の
ばらつきを試験するに当たって、光源により発生した試
験光を小レンズを面状に配列した集合レンズ体に与え、
この集合レンズ体から試験光の光束を光拡散箱に入射窓
から与え、その光拡散性の出射窓から出射する試験光を
イメージセンサに投光してその各光センサの光検出感度
を試験することにより達成する。
SUMMARY OF THE INVENTION In the present invention, an object of the present invention is to test a variation in light detection sensitivity of a plurality of optical sensors of an image sensor, and arrange test light generated by a light source into small lenses in a plane. To the collective lens body
The light beam of the test light is supplied from the collective lens body to the light diffusion box through the entrance window, and the test light emitted from the light diffusion exit window is projected on the image sensor to test the light detection sensitivity of each optical sensor. Achieved by

【0009】なお、光源により発生した試験光は光ファ
イバを介して集合レンズ体に与えるようにするのが投光
装置を小形化する上で有利であり、さらにはこの光ファ
イバからの試験光を光導体を介し集合レンズ体に与える
のがイメージセンサに与える試験光の光強度分布の均一
性を高める上で有利である。また、この均一性の向上に
はレンズ集合体の小レンズの焦点の位置を光拡散箱の入
射窓にほぼ一致させるのが有利である。拡散箱の光拡散
性の出射窓には従来と同様に乳白色ガラス等の光拡散性
の窓材を取り付けるのがよい。なお、イメージセンサに
与える試験光に所望範囲の波長分布をもたせる場合は波
長選択性のフィルタを拡散箱の入射窓に取り付けるのが
最も合理的である。
It is advantageous to give the test light generated by the light source to the collective lens body via the optical fiber in order to reduce the size of the light projecting device, and to further reduce the test light from the optical fiber. Applying the light to the collective lens via the light guide is advantageous in improving the uniformity of the light intensity distribution of the test light to be applied to the image sensor. In order to improve the uniformity, it is advantageous to make the position of the focal point of the small lens of the lens assembly substantially coincide with the entrance window of the light diffusion box. It is preferable to attach a light-diffusing window material such as milky white glass to the light-diffusing exit window of the diffusion box as in the related art. When the test light given to the image sensor has a wavelength distribution in a desired range, it is most reasonable to attach a wavelength-selective filter to the entrance window of the diffusion box.

【0010】[0010]

【作用】本発明方法でも拡散箱を利用するのは図3の従
来例と同様であるが、試験光をその入射窓に前項の構成
にいう小レンズを面状に配列した集合レンズ体を介して
与えることによって問題を解決する。この集合レンズ体
はそれが受けた試験光の光束を小レンズごとに分割して
その焦点ないし焦点面に集光するが、その集光点ないし
小さな集光面がもちろん小レンズの配列どおりに分布す
るので、試験光の光束を拡散箱の入射窓の面積内にほぼ
均一に分散させる役目を果たす。従って、本発明方法で
は試験光を拡散箱の入射窓の面積内に従来より均一な分
布で与え、拡散箱にその光を拡散させる性能を充分に発
揮させながら光拡散性の出射窓から試験光の光束を取り
出して、イメージセンサに対し従来方法によるよりも均
一な光強度分布で投光することができる。
The use of a diffusion box in the method of the present invention is similar to that of the prior art shown in FIG. 3, but the test light is transmitted through a collective lens body in which the small lenses described in the preceding paragraph are arranged in a plane at the entrance window. To solve the problem. This collective lens unit divides the test light beam received by it into small lenses and focuses them on the focal point or focal plane. Therefore, it plays a role of dispersing the luminous flux of the test light almost uniformly within the area of the entrance window of the diffusion box. Therefore, in the method of the present invention, the test light is given in the area of the entrance window of the diffusion box with a more uniform distribution than before, and the test light is diffused from the light diffusion exit window while sufficiently exhibiting the ability to diffuse the light to the diffusion box. Can be taken out and projected on the image sensor with a more uniform light intensity distribution than by the conventional method.

【0011】[0011]

【実施例】以下、図1を参照して本発明の実施例を説明
する。図の左下部に示された試験対象であるイメージセ
ンサ10は例えばフォトダイオードである光センサを複数
個集積化した半導体チップ11をリードフレーム12に搭載
して透明なパッケージ13に収納したもので、試験に際し
ては図示のようにそのリード14を配線基板15に差し込み
実装した上でコネクタ16および接続線47を介して測定装
置20と接続される。図の右下部に示す試験光Lt用の光源
30は図3の従来例と同様にハロゲン電球等の昼光色の白
熱電灯31と反射板32をケース33に収納したものである。
An embodiment of the present invention will be described below with reference to FIG. The image sensor 10 to be tested shown in the lower left part of the figure is a semiconductor chip 11 in which a plurality of photosensors, for example, photodiodes, are mounted on a lead frame 12 and housed in a transparent package 13, At the time of the test, the lead 14 is inserted into the wiring board 15 and mounted as shown in the figure, and then connected to the measuring device 20 via the connector 16 and the connection wire 47. Light source for test light Lt shown in lower right of figure
Reference numeral 30 denotes a case in which a daylight-colored incandescent lamp 31 such as a halogen bulb and a reflector 32 are accommodated in a case 33, similarly to the conventional example of FIG.

【0012】この光源30が発光する試験光Ltは図の中央
部に示す集合レンズ体40に原理上は直接与えることでよ
いが、図示の実施例では光ファイバ34と光導体42とを介
して試験光Ltを集光レンズ体40に伝達する。光ファイバ
34は多数のガラスファイバを束ねてシース35を被せた通
常のもので、接続具36により光源30のケース33に取り付
けられたその一端に試験光Ltを受ける。集合レンズ体40
は例えば円形のガラスブロックの図の下面内に分布して
多数の小さな半球状の凸部を形成してそれぞれ小レンズ
41とするもので、例えばロッド状の光学ガラスである光
導体42とともにケース43内に収納される。ケース43はそ
の下端部を光拡散箱50のケース51に取付位置を調整しな
がらねじ込んだ上でロックナット44で固定され、その上
端部には光ファイバ34の他端が接続具37を介して取り付
けられる。
In principle, the test light Lt emitted from the light source 30 may be directly applied to the collective lens body 40 shown in the center of the figure. However, in the illustrated embodiment, the test light Lt is transmitted through the optical fiber 34 and the optical conductor 42. The test light Lt is transmitted to the condenser lens body 40. Optical fiber
Numeral 34 denotes a normal type in which a number of glass fibers are bundled and covered with a sheath 35, and one end of the light source 30 attached to the case 33 by the connector 36 receives the test light Lt. Collective lens body 40
For example, a number of small hemispherical projections are distributed in the lower surface of the figure of a circular glass block to form small lenses.
A case 41 is housed in a case 43 together with a light guide 42 which is, for example, a rod-shaped optical glass. The case 43 is fixed with a lock nut 44 after screwing the lower end thereof into the case 51 of the light diffusion box 50 while adjusting the mounting position, and the other end of the optical fiber 34 is connected to the upper end thereof via a connector 37. It is attached.

【0013】拡散箱50は図3の従来方法で用いたものと
同じでよく、そのケース51の内面に白色の望ましくは凹
凸のある拡散性コーティング52を施して入射窓53から受
ける試験光Ltを内面で反射させながら閉じ込め、その出
射窓54に取り付けた拡散性の乳白色ガラス等の窓材55を
通して試験光Ltを取り出すことでよいが、この実施例で
は試験光Ltにイメージセンサ10の試験に適する波長分布
をもたせるために波長選択性を備える例えばいわゆるN
Dフィルタである光学フィルタ56を入射窓53に取り付
け、それを通して試験光Ltを取り込むようにする。この
光学フィルタ56は光透過率の異なるものを差し替え自在
にしておき、試験光Ltの強度レベルを切り換えてイメー
ジセンサ10を試験できるようにするのがよい。
The diffusion box 50 may be the same as that used in the conventional method shown in FIG. 3. The case 51 is provided with a white, preferably uneven, diffusible coating 52 on the inner surface thereof to receive the test light Lt received from the entrance window 53. It is good to take out the test light Lt through the window material 55 such as diffusible milky white glass attached to the exit window 54 while confining while reflecting on the inner surface, but in this embodiment, the test light Lt is suitable for testing the image sensor 10 with the test light Lt. Provided with wavelength selectivity to provide a wavelength distribution, for example, so-called N
An optical filter 56, which is a D filter, is attached to the entrance window 53, through which the test light Lt is taken. It is preferable that the optical filter 56 be different in light transmittance so that the image filter 10 can be tested by switching the intensity level of the test light Lt.

【0014】以上のように構成されたこの実施例の投光
装置では、光源30からの試験光Ltは光ファイバ34を通っ
た後にある広がり角をもつ光束の形でロッド状の光導体
40に入る。光導体40はこの試験光Ltの光束中の斜め進行
成分をその周面で全反射させながら伝達して光強度分布
が均一化された光束を集合レンズ体40に与える。集合レ
ンズ体40はこの光束を小レンズ41ごとにその配列どおり
に分布した焦点ないし焦点面に集光することにより試験
光Ltをその光束面積内に均一に分散させた上で拡散箱50
に与える。拡散箱50はこれを入射窓53の光学フィルタ56
を介して受け、それにより試験に適する波長分布に変換
された試験光Ltを内面コーティング52で反射しつつ内部
に閉じ込めてその出射窓54から拡散性光束Ldとして出射
するが、さらにその拡散性を半透明な窓材55により一層
強めた上で試験光Ltの光束としてイメージセンサ10に投
光する。
In the light projecting apparatus of this embodiment configured as described above, the test light Lt from the light source 30 passes through the optical fiber 34 and has a rod-shaped light guide in the form of a light beam having a certain divergence angle.
Enter 40. The light guide 40 transmits the obliquely traveling component in the light beam of the test light Lt while totally reflecting it on its peripheral surface, and gives the light beam having a uniform light intensity distribution to the collective lens body 40. The collective lens body 40 converges this light beam on the focal points or focal planes distributed according to the arrangement for each of the small lenses 41 so that the test light Lt is uniformly dispersed within the light beam area, and then the diffusion box 50
Give to. The diffusion box 50 is connected to the optical filter 56 of the entrance window 53.
The test light Lt converted into a wavelength distribution suitable for the test is confined inside while being reflected by the inner coating 52 and emitted from the emission window 54 as a diffusive light flux Ld. After being further strengthened by the translucent window material 55, the light is projected onto the image sensor 10 as a light beam of the test light Lt.

【0015】このように本発明では、光源30で発生させ
た試験光Ltの光束を蜻蛉の複眼状に小レンズ41を配列し
た集合レンズ体40により光強度分布が均一な光束に変換
した上で拡散箱50に与えるので、イメージセンサ10に与
える試験光Ltの拡散性光束の光強度分布を従来より均一
化できる。図1の実施例についての実験結果によればイ
メージセンサ10に与える試験光Ltの輝度に換算した明る
さがいわゆるルミネッセンス値LVで6, ないし 4.5Cd/
cm2 のとき、多数の光センサが受ける光強度のばらつき
を4x10-3Cd/cm2 以内, 率にすると 0.1%以下の変動
に抑えることができる。これを従来方法による場合の1
%程度の変動と比較すると、試験光Ltの均一性が本発明
によって約1桁向上することがわかる。
As described above, according to the present invention, the luminous flux of the test light Lt generated by the light source 30 is converted into a luminous flux having a uniform light intensity distribution by the collective lens body 40 in which the small lenses 41 are arranged in a compound eye of a dragonfly. Since the light is applied to the diffusion box 50, the light intensity distribution of the diffusible light flux of the test light Lt applied to the image sensor 10 can be made more uniform than before. According to the experimental results of the embodiment of FIG. 1, the brightness converted to the brightness of the test light Lt given to the image sensor 10 is a so-called luminescence value LV of 6, or 4.5 Cd /
In the case of cm 2 , the variation in the light intensity received by a large number of optical sensors is within 4 × 10 −3 Cd / cm 2 . This is the same as the conventional method.
%, It can be understood that the uniformity of the test light Lt is improved by about one digit according to the present invention.

【0016】また、この実験結果では集合レンズ体40を
その小レンズ41の焦点が拡散箱50の入射窓53の位置, 図
1の例では光学フィルタ56の上面と一致するように調整
したとき上述の試験光Ltの均一性が最良になる。このよ
うに調整された投光装置から試験光Ltを受けるイメージ
センサ10の試験に際しては、その各光センサの光検出信
号値の最大値と最小値と平均値を図1の測定装置20によ
り測定することにより複数個の光センサの光検出感度の
ばらつきを測定してイメージセンサ10の良否を判定する
ことができる。また、光学フィルタ56の差し換えにより
試験光Ltの強度レベルを切り換えてイメージセンサ10を
試験できる。
In this experimental result, when the collective lens body 40 is adjusted so that the focal point of the small lens 41 coincides with the position of the entrance window 53 of the diffusion box 50, in the example of FIG. The test light Lt has the best uniformity. When testing the image sensor 10 receiving the test light Lt from the light emitting device adjusted in this way, the maximum value, the minimum value, and the average value of the light detection signal values of the respective light sensors are measured by the measuring device 20 of FIG. This makes it possible to determine the quality of the image sensor 10 by measuring the variation in the photodetection sensitivity of the plurality of optical sensors. Further, the image sensor 10 can be tested by switching the intensity level of the test light Lt by replacing the optical filter 56.

【0017】[0017]

【発明の効果】以上に説明したとおり、本発明方法では
イメージセンサの複数個の光センサの光検出感度のばら
つきを試験するに際して、光源から発生させた試験光の
光束を小レンズを面状に配列した集合レンズ体に与えて
光強度分布が均一な光束に変換した上で光拡散箱にその
入射窓から与え、この光拡散箱の光拡散性の出射窓から
取り出した試験光をイメージセンサに投光して光センサ
の光検出感度を試験することにより、イメージセンサの
光センサが受ける試験光の強度分布のばらつきを従来の
1%程度から 0.1%以内に減少させて光センサの光検出
感度のばらつきを従来より正確に試験することができ
る。本発明方法は光センサが受ける光強度を4ビット以
上の精度のディジタルデータに変換できる高精度のイメ
ージセンサの試験に適し、とくに8ビット程度の映像検
出精度をもつイメージセンサの正確で実用的な試験を始
めて可能にするものである。
As described above, according to the method of the present invention, when testing the variation in the photodetection sensitivity of a plurality of photosensors of an image sensor, the luminous flux of the test light generated from the light source is applied to a small lens in a plane. After being given to the arrayed lens elements and converted to a light beam with a uniform light intensity distribution, it is given to the light diffusion box from its entrance window, and the test light taken out from the light diffusion exit window of this light diffusion box is sent to the image sensor. By projecting light and testing the photodetection sensitivity of the photosensor, the variation in the intensity distribution of the test light received by the photosensor of the image sensor is reduced from about 1% to 0.1% of the conventional level, and the photodetection sensitivity of the photosensor is reduced. Can be tested more accurately than before. The method of the present invention is suitable for testing a high-precision image sensor capable of converting the light intensity received by the optical sensor into digital data with an accuracy of 4 bits or more, and particularly for an accurate and practical image sensor having an image detection accuracy of about 8 bits. It is the first time that testing is possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明によるイメージセンサの試験方法の実施
例を示すイメージセンサおよび投光装置を含む断面図で
ある。
FIG. 1 is a cross-sectional view including an image sensor and a light projecting device showing an embodiment of a method for testing an image sensor according to the present invention.

【図2】従来のイメージセンサ試験方法の一例を示すイ
メージセンサと光源と拡散板の配置図である。
FIG. 2 is an arrangement diagram of an image sensor, a light source, and a diffusion plate, showing an example of a conventional image sensor test method.

【図3】従来の試験方法の他の例を示す光源および拡散
箱の断面図である。
FIG. 3 is a sectional view of a light source and a diffusion box showing another example of a conventional test method.

【符号の説明】[Explanation of symbols]

10 イメージセンサ 20 測定装置 30 光源 34 試験光を伝達する光ファイバ 40 集合レンズ体 41 小レンズ 42 光導体 50 光拡散箱 53 光拡散箱の入射窓 54 光拡散箱の出射窓 55 出射窓の窓材 56 光学フィルタ Ld 拡散性の光束 Lt 試験光ないしはその光束 10 Image sensor 20 Measuring device 30 Light source 34 Optical fiber for transmitting test light 40 Collective lens body 41 Small lens 42 Light guide 50 Light diffusion box 53 Light diffusion box entrance window 54 Light diffusion box exit window 55 Exit window window material 56 Optical filter Ld Diffusive light beam Lt Test light or its light beam

フロントページの続き (56)参考文献 特開 平2−90645(JP,A) 特開 平6−34487(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/66 H01L 27/14 G01M 11/00 Continuation of front page (56) References JP-A-2-90645 (JP, A) JP-A-6-34487 (JP, A) (58) Fields investigated (Int.Cl. 7 , DB name) H01L 21 / 66 H01L 27/14 G01M 11/00

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】イメージセンサの複数個の光センサの光検
出感度のばらつきを試験する方法であって、光源により
発生した試験光を小レンズを面状に配列した集合レンズ
体に与え、集合レンズ体からの試験光の光束を光拡散箱
に入射窓から与え、その光拡散性の出射窓から取り出し
た試験光をイメージセンサに投光して光センサの光検出
感度を試験するようにしたことを特徴とするイメージセ
ンサの試験方法。
1. A method for testing a variation in photodetection sensitivity of a plurality of optical sensors of an image sensor, wherein test light generated by a light source is provided to a collective lens body in which small lenses are arranged in a plane. The luminous flux of the test light from the body is given to the light diffusion box from the entrance window, and the test light extracted from the light diffusion exit window is projected on the image sensor to test the light detection sensitivity of the optical sensor. A method for testing an image sensor, comprising:
【請求項2】請求項1に記載の方法において、光源によ
り発生した試験光を光ファイバを介して集合レンズ体に
与えるようにしたことを特徴とするイメージセンサの試
験方法。
2. The method according to claim 1, wherein the test light generated by the light source is supplied to the collective lens body via an optical fiber.
【請求項3】請求項1に記載の方法において、レンズ集
合体の各小レンズの焦点を光拡散箱の入射窓にほぼ一致
させるようにしたことを特徴とするイメージセンサの試
験方法。
3. The method according to claim 1, wherein the focus of each small lens of the lens assembly is made to substantially coincide with the entrance window of the light diffusion box.
JP05027030A 1993-02-17 1993-02-17 Image sensor test method Expired - Fee Related JP3114410B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05027030A JP3114410B2 (en) 1993-02-17 1993-02-17 Image sensor test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05027030A JP3114410B2 (en) 1993-02-17 1993-02-17 Image sensor test method

Publications (2)

Publication Number Publication Date
JPH06244396A JPH06244396A (en) 1994-09-02
JP3114410B2 true JP3114410B2 (en) 2000-12-04

Family

ID=12209681

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3114410B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0593916U (en) * 1992-05-26 1993-12-21 カルソニック株式会社 Automotive air conditioner

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JP4631408B2 (en) * 2004-07-13 2011-02-16 横河電機株式会社 Light source device for inspection
JP4247993B2 (en) * 2004-11-05 2009-04-02 シャープ株式会社 Image inspection apparatus, image inspection method, control program, and readable storage medium
KR100752291B1 (en) * 2005-12-12 2007-08-24 옵토팩 주식회사 Image sensor package test apparatus
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KR100805834B1 (en) 2006-01-09 2008-02-21 삼성전자주식회사 Apparatus for testing a light receiving element and method of the same
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0593916U (en) * 1992-05-26 1993-12-21 カルソニック株式会社 Automotive air conditioner

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