JP2005127970A - Optical system for measuring light of wide dispersion light source, instrument for measuring light of wide dispersion light source, and light measuring method therefor - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an optical system for measuring light of a wide dispersion light source and an instrument for measuring the light of the wide dispersion light source capable of measuring the whole light beam at the same time, reduced in labors and times for a measuring operation, simple in system/instrument constitution, capable of dispensing with a detector of high sensitivity, and capable of measuring the overall light beam accurately even when uneven brightness and an irregular color exist in the wide dispersion light source, and a light measuring method therefor. <P>SOLUTION: In this optical system for the instrument 1 for measuring the light of the wide dispersion light source for measuring the light from the measured light source W by a measuring part of a light measuring means arranged in a side opposed to the measured light source, the optical system is an elliptical mirror 14 of a spheroid expressed by rotation around a major axis of an ellipse as the center, and is provided with openings 14e, 14f formed respectively in rear sides of the first focal point and the second focal point in the elliptical mirror, and is set to position the measured light source in the first focal point, and to position the measuring part 13a of the light measuring means in the second focal point. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to an optical system of a wide diffusion light source light measurement device, a wide diffusion light source light measurement device, and a light measurement method thereof for measuring values such as luminous intensity and chromaticity coordinates of a wide diffusion light source such as an LED.

  In general, as a wide diffused light source measuring device used for measuring values such as luminous intensity and chromaticity coordinates of a wide diffused light source such as an LED, one that performs total luminous flux measurement or partial luminous flux measurement is known (for example, Non-patent documents 1, 2). Wide diffused light source measuring devices that measure total luminous flux include gonio method and integrating sphere method, and wide diffused light source measuring device that measures partial luminous flux is CIE (Commission Internationale de I'Eclairage International Lighting Commission) Is used (for example, Non-Patent Document 3).

A wide diffused light source measuring device using the gonio method for measuring all luminous fluxes is configured to perform measurement by moving the wide diffused light source or the measurement portion for each predetermined angle of the wide diffused light source to be measured.
A wide diffused light source measuring device using an integrating sphere method for measuring all luminous fluxes is installed in an integrating sphere formed as a reflecting surface with a wide diffusing light source to be measured, and is also widely diffused in the measurement part arranged in the integrating sphere. A baffle is arranged so that direct light from the light source does not enter, and a part of the light reflected in the spherical surface is measured at the measurement part.

In the wide diffused light source measuring apparatus that performs partial light flux measurement, a light receiver is disposed at a predetermined distance from the wide diffuse light source to be measured, and the light receiver is widened through an aperture having an opening area of 100 mm ^2. The light emitted from the diffused light source is measured, and the average luminous intensity (I _LED ) obtained by the formula I _LED = E × d ² is measured. In the above equation, d is the distance from the light source to the light receiving surface, and E is the average illuminance (lx) measured by the light receiver.

"White LED Lighting System High Brightness, High Efficiency, Long Life Technology" Technical Information Association PP149-151, PP159-169 JISC7036: Light-emitting diode measurement method (for display) (Showa 60) CIE Publ. No. CIE 127: Measurement of LEDs. (1997)

However, the conventional wide diffused light source measuring apparatus has the following problems.
(1) In the diffusive light source measuring device using the gonio method for measuring the total luminous flux, the measurement data of the wide diffusing light source cannot be obtained at the same time because the wide diffusing light source is measured at every predetermined angle. It was. In addition, since the light measurement device needs to move the wide diffusion light source or the measurement part at every predetermined angle, it is necessary to maintain the stability of the wide diffusion light source and the stability of the light measurement device. It took a lot of time and effort. Furthermore, in the said optical measurement apparatus, high precision was requested | required in terms of facilities and technology from the necessity of calculating | requiring a light distribution curve correctly, and the measurement operation | work was difficult.

  (2) A wide diffused light source measuring device using an integrating sphere method for measuring total luminous flux requires a highly sensitive measuring device because it is necessary to measure a part of the light, and values such as luminosity and chromaticity coordinates to be measured are required. Comparison measurement with a known wide diffusion light source had to be performed, and absolute measurement could not be performed. In addition, in this optical measuring device, since a wide diffusion light source is inserted into the integrating sphere, if the opening formed in the integrating sphere is enlarged so that the insertion operation can be easily performed, a measurement error occurs, and the opening is kept small. Then, the insertion operation takes time and the tact time is reduced.

  A wide diffused light source measuring device that measures partial luminous flux has a simple configuration for measurement, so it is convenient, but if there is uneven brightness or color unevenness in the light distribution characteristics of the wide diffused light source to be measured, As a result, accurate measurement was impossible at all. In particular, in recent LEDs, it is not enough to classify on the XY chromaticity diagram such as white, blue, red, green, etc. In addition, it is possible to classify in the area on the chromaticity diagram with limited wavelength. A need has arisen and it has been desired to be able to measure accurate measurements of the overall light of the entire LED.

  The present invention was devised in view of the above-described problems, and can measure all luminous fluxes simultaneously, does not require a troublesome measurement operation, has a simple apparatus configuration, and has a highly sensitive detector. An optical system of a wide diffusion light source light measurement device, a wide diffusion light source light measurement device, and a light measurement method thereof capable of performing comprehensive light accurate measurement even when luminance unevenness and color unevenness exist in a wide diffusion light source. The purpose is to provide.

  In order to achieve the above-described object, the optical system of the wide diffusion light source measurement apparatus according to the present invention is configured as follows. That is, in the optical system of the wide diffusion light source light measurement device in which the measurement light source is arranged and the light from the measurement light source is measured by the measurement unit of the light measurement unit arranged on the side facing the measurement light source, The optical system is an ellipsoidal mirror that is a spheroid represented by rotating around the major axis of the ellipse, and the light irradiated as the widest angle of the light source to be measured placed at the first focal point and the ellipse An opening formed behind the intersection with the elliptical curved surface of the mirror and formed backward from the second focal point to the center of the ellipse in order to place the measuring unit at the second focal point It was supposed to be equipped with.

  With this configuration, in the optical system of the wide diffusion light source light measurement device, the light source to be measured is arranged at the position of the first focus from the opening of the elliptical mirror, and the light from the light source to be measured is Most of the light is condensed from the opening of the light to the measuring part of the light measuring means arranged at the second focal point.

  Further, the optical system of the wide diffusion light source light measurement apparatus has a wide light source in which a light source to be measured is arranged and light from the light source to be measured is measured by a measuring unit of a light measuring unit arranged on the side facing the light source to be measured. In the optical system of the diffused light source measurement apparatus, the optical system has one and the other elliptic curved mirrors having a curvature for condensing light from the first focal point to the second focal point, and the elliptic curved mirrors facing each other. An elliptical mirror comprising one and the other flat plate provided adjacent to the elliptical curved mirror, the light irradiated as the widest angle of the light source to be measured installed at the first focus and the elliptical An opening formed behind the intersection with the elliptical curved surface of the mirror and formed behind the second focus with respect to the center of the ellipse in order to place the measurement unit at the second focus Part.

As described above, in the optical system of the wide diffusion light source light measurement apparatus, when the directivity of the light source to be measured is, for example, a light source to be measured that irradiates light having a predetermined width such as a flat fan shape, If there is an elliptical curved mirror adapted to the characteristics, light can be collected from the first focus to the second focus, and most of the total luminous flux can be taken in from the measurement unit. In addition, the flat plate adjacent to the elliptical curved mirror has little influence on the collection of light from the light source to be measured to the measurement unit, and prevents the incidence of light from the outside.
The elliptic curved mirror uses a curved surface having a predetermined spatial width in the major axis direction of the spheroid represented by rotating around the major axis of the ellipse.

In the optical system of the wide diffused light source measurement apparatus, a condensing optical system that is disposed on a line connecting the first focus and the second focus and condenses the light from the first focus on the second focus. It was set as the structure provided.
With this configuration, in the optical system of the wide diffusion light source light measurement apparatus, light from the light source to be measured arranged at the first focal point of the elliptical mirror is condensed on the second focal point measurement unit by the elliptical curved mirror. In addition, since the condensing optical system is arranged on a line connecting both the focal points, the light that diverges toward the second focal point is condensed on the measurement unit of the second focal point through the condensing optical system. can do.

  Furthermore, in order to achieve the above-described object, the wide diffusion light source light measuring apparatus according to the present invention is configured such that the light source to be measured is installed by a light source installation unit that detachably holds and moves the light source to be measured and installs it at a measurement position In the wide diffused light source measuring device for measuring the light, the measuring part of the light measuring means detachably installed on the side facing the light source to be measured installed at the measurement position by the light source installing means, and the measuring part and An elliptical mirror disposed across the light source to be measured, and one of a condensing optical system or a diffusion optical system disposed on a line connecting the first focal point and the second focal point of the elliptical mirror, And an opening formed behind the intersection of the light irradiated as the widest angle of the light source to be measured installed at the first focus and the elliptical curved surface of the elliptical mirror, and the second focus at the second focus Place the measurement unit It was intended to comprise an opening formed in the rear with respect to the second focal point of the ellipse center in order.

  With this configuration, in the wide diffusion light source light measurement device, the light from the light source to be measured arranged at the first focal point of the elliptical mirror is condensed on the measurement unit at the second focal point. At this time, when the diffusion optical system is arranged on a line connecting both focal points, the light diverging toward the second focal point is diffused or transmitted by the diffusion optical system, and the elliptical curved surface or the second focal point directly. It is focused on. Further, when the condensing optical system is arranged on a line connecting both focal points, the light diverging toward the second focal point is condensed on the measuring unit of the second focal point through the condensing optical system. .

In the wide-diffuse light source measurement apparatus, the condensing optical system is a condensing lens that condenses light from the light source to be measured at the first focus on the measurement unit at the second focus.
In the wide diffused light source measuring apparatus configured as described above, when the light source to be measured installed at the first focal point has an irradiation angle with respect to the direction of 160 degrees such as an LED, the second focal point is used. Light that diverges toward the second focal point by the condensing lens arranged on the line connecting both focal points, even if the measuring unit installed on the ellipse is installed on a plane parallel to the minor axis direction of the ellipse Can be condensed.

In the wide diffused light source measurement apparatus, the condensing lens includes an aberration correction lens that is a combination of a plurality of lenses arranged on the same axis.
In the wide diffused light source measuring apparatus configured as described above, the light from the light source to be measured installed at the first focal point of the elliptical mirror is converted into parallel light by one condenser lens (for example, a combination lens of a convex lens and a concave lens), In addition, the other condenser lens (for example, a combination lens of a convex lens and a concave lens) condenses parallel light on a measurement unit installed at the second focal point. Of course, a configuration in which diffused light from the first focal point to the second focal point is condensed on the second focal point by a set of aberration correction lenses may be used.

  In the wide diffused light source measurement apparatus, the elliptical mirror is configured such that one elliptical curved mirror having a curvature for condensing light from the first focal point to the second focal point and the elliptical curved mirror are opposed to each other. One and the other flat plate provided adjacent to the elliptical curved mirror were provided.

  The wide diffused light source measuring apparatus configured as described above is configured so that when the light source to be measured irradiates light having directivity with a flat width, the light irradiated from the first focal point by the two elliptical curved mirrors is applied to the second focal point. Can be condensed. In addition, the flat plate adjacent to the elliptical curved mirror has almost no influence on the light necessary for the measurement of the light source to be measured, and prevents light from entering from the outside.

  In order to achieve the above object, the light measurement method of the wide diffusion light source light measurement apparatus according to the present invention is configured as follows. That is, an integrating sphere optical system, a measuring unit of light measuring means arranged at a predetermined position on the spherical surface of the integrating sphere optical system, and a baffle for preventing light from the light source to be measured from directly entering the measuring unit, A wide diffused light source measuring device having an opening for taking in light from a light source to be measured formed at a predetermined position on the spherical surface of the integrating sphere optical system, and an elliptical first focus and second focus A condensing lens arranged on a line, an opening formed behind an intersection of light irradiated as the widest angle of the light source to be measured installed at the first focal point of the ellipse and the elliptic curved surface of the elliptical mirror An opening formed rearward from the second focal point with respect to the center of the ellipse, one opening of the elliptical mirror abutting the opening of the integrating sphere optical system, and the elliptical mirror In the position that becomes the focal point of the elliptical mirror in the other opening, The place the measurement light source light from the sample light source was assumed to be incident into the integrating sphere optical system via the elliptical mirror.

  According to such a light measuring method, the light of the light source to be measured placed at the first focal point of the elliptical mirror from the opening of the integrating sphere optical system used in the past is converted into almost total luminous flux in the integrating sphere optical system. Incorporated and can be measured as light diffused more evenly in the integrating sphere optical system.

According to the optical system of the wide diffusion light source light measurement device, the wide diffusion light source light measurement device, and the light measurement method thereof according to the present invention, the following excellent effects can be obtained.
Since the optical system of the wide diffusion light source light measurement apparatus uses an elliptical mirror, when the light source to be measured at the first focal position emits light having directivity of 180 degrees or less, the measurement unit at the second focal position is used. Since light is collected in one measurement, it can be measured simultaneously as a state close to the total luminous flux. Therefore, in the optical system of the wide diffusion light source light measurement device, even if the measurement light source has luminance unevenness, color unevenness, etc. with respect to the direction of light emission, Measurement can be performed. Especially when the light source to be measured has uneven brightness and color unevenness on the periphery and center of the light emitting part, such as LED, the measurement is performed with much improved accuracy compared to the measurement using conventional partial light flux. It becomes possible to do.

  In the optical system of the wide diffusion light source light measuring device, an elliptical mirror provided with an elliptical curved mirror having a spatial width in accordance with the directivity of the light source to be measured may be used. Measurement can be performed by focusing from the first focal point to the second focal point in a state close to the total luminous flux of the light source to be measured, and the configuration is further simplified as compared with an elliptical curved surface.

  Further, in the optical system of the wide diffusion light source light measuring device, a condensing lens is provided on a line connecting the two focal points of the elliptical mirror, so that light originally diverging with respect to the second focal point is collected toward the second focal point. Since the light can be emitted, it is possible to measure almost the total luminous flux emitted from the light source to be measured by the light measuring means.

  Furthermore, in the wide diffusion light source light measuring device, light from the light source to be measured placed at the first focal point by the elliptical mirror can be simultaneously measured as almost total light flux by the measuring unit placed at the second focal point. Is an LED that emits light having directivity of 180 degrees or less, it is possible to measure light comprehensively even if the LED has luminance unevenness, color unevenness, and the like. If the directivity of the light source to be measured is reduced from 180 degrees, the opening on the first focal point where the light source to be measured is correspondingly installed is sufficient to install the light source to be measured. It is also wide, and the opening on the second focal side where the measurement unit is set is also sufficiently wide. For this reason, the wide diffused light source measurement device facilitates the installation work of the light source to be measured, facilitates the measurement operation, and simplifies the device configuration. Compared to the case where only an integrating sphere optical system is used, the total luminous flux can be obtained. Measurement is sufficient, and there is no need for a highly sensitive measuring instrument for measuring the total luminous flux.

  Furthermore, the wide diffused light source measurement apparatus can measure the light source to be measured in a state close to the sensation of light as seen by the human eye by performing simultaneously on all the luminous fluxes. In addition, since the wide diffused light source measurement device can measure light as a whole, the light is measured so that it can be divided into a more limited area than the division from the center radially on the XY chromaticity diagram. It becomes possible.

Moreover, in the wide diffused light source measuring device, the condensing optical system is arranged on the line connecting the two focal points of the elliptical mirror, so that light can be incident on the measuring unit in a state almost close to the total luminous flux, and the diffusion optics Compared with the case where the system is used, it is possible to perform the measurement with respect to the total luminous flux from the light source to be measured more accurately.
Further, in the wide diffusion light source light measurement apparatus, when one or two aberration correction lenses are used, when the light from the light source to be measured is condensed on the measurement unit, adjustment is performed by two or more lenses. Therefore, adjustment when setting the aberration correction lens is easier than setting and adjusting a single lens. Further, when measuring light sources to be measured having different colors, light can be condensed on the second focal point in a state corrected for chromatic aberration, coma aberration, etc., and more accurate measurement can be performed.

Furthermore, in the wide diffused light source measuring apparatus, even if the elliptical mirror is composed of an elliptical curved mirror and a flat plate, it is sufficient if it is within a range that matches the directivity of the light source to be measured. It becomes possible to manufacture as a simple structure compared with the mirror.
In the wide diffused light source measurement device, an opening is provided behind the first focal point and the second focal point, so that a wide opening can be obtained particularly for a light source to be measured that emits light having directivity of 180 degrees or less. It is only necessary to operate the light source to be measured and the measurement unit that are installed in the state of the unit.

  Further, in the light measurement method of the wide diffusion light source light measurement apparatus, it is possible to improve the tact time and the measurement accuracy using an existing integrating sphere optical system.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a cross-sectional view showing the entire wide diffusion optical light measurement device, FIG. 2 is a schematic view showing the whole light measurement system using the wide diffusion light source light measurement device, and (a) is a schematic view of the light measurement system. FIG. 3B is a plan view schematically showing the light measurement system, FIG. 3 is a view showing an optical system of the wide diffusion light source light measurement device, and FIG. FIG. 4B is an exploded perspective view of a state where a certain elliptical mirror is separated, FIG. 4B is a perspective view when the elliptical mirror which is an optical system is installed in the housing, and FIG. It is a schematic diagram which shows a light state.

  As shown in FIGS. 1 and 2, the light measurement system A includes a transport device B that transports a measured light source W such as an LED, and a power source for lighting the measured light source W that is transported by the transport device B. A device D, a wide diffused light source measuring device 1 that measures the light of the light source W to be measured turned on by the power supply device D, and a sorting that selects the measured light source W measured by the wide diffused light source light measuring device 1 Device C.

  The wide diffusion light source light measuring apparatus 1 is arranged to face the light source W to be measured which is conveyed by the handler 20 which is a light source installation means of the conveying apparatus B and is installed at the measurement position, and on the side facing the measurement position. The measurement unit 3a of the light measurement means 3 that is detachably installed, the measurement unit 3a as the second focal position of the ellipse, and the measurement position of the light source W to be measured installed by the handler 20 as the first focal position of the ellipse An elliptical mirror 4 to be installed and a casing 7 that supports the elliptical mirror 4 and the light measuring means 3 are provided. Note that the housing 7 may have any configuration that can detachably fix the elliptical mirror 4 and the measuring unit 3a by dividing or separating the predetermined positions.

  As shown in FIG. 3, the elliptical mirror 4 has elliptical curved mirrors 4 a and 4 b that have a curvature for condensing the light emitted from the first focal point to the second focal point and are arranged to face each other. Planar plates 4c and 4d arranged adjacent to the elliptic curved mirrors 4a and 4b and facing each other, and a condenser lens 5 as a condenser optical system arranged on a line connecting the first focal point and the second focal point, It has. The elliptical curved mirrors 4a and 4b are spheroids that are represented by rotating the ellipse with the major axis of the ellipse as a rotational axis, and the curved surface along the major axis is used with a predetermined width.

  The configuration of the elliptical mirror 4 is such that the range of the width of the elliptical curved mirrors 4a and 4b is set in accordance with the directivity of the light source W to be measured, and the wide diffusion light source described with reference to FIGS. The light measurement apparatus 1 will be described as being formed corresponding to a light source W to be measured having directivity having a width of 160 degrees on the front surface and a flat surface (for example, a flat surface having a width of 3 cm).

  As shown in FIGS. 3A and 3B, the elliptical mirror 4 has elliptical curved mirrors 4a and 4b and flat plates 4c and 4d parallel to the short axis of the ellipse at the positions of the first focal point and the second focal point. Openings 4e and 4f formed by cutting are provided. The openings 4e and 4f are formed if the measurement light source W and the measurement unit 3a can be set at the first focal point and the second focal point, and can be condensed from the first focal point to the second focal point. The position, notch shape, etc. are not particularly limited. Therefore, in this case, the elliptical mirror 4 forms semicircular cutouts 4g and 4g at the position of the opening 4e continuously from the positions of the planes 4c and 4d, so that the handler 20 is positioned at the position of the first focus. The light source W to be measured is configured to be easily installed.

  Further, as shown in FIG. 4, the opening 4e of the elliptical mirror 4 only needs to be formed behind the intersection point P between the light irradiated as the widest angle of the light source W to be measured and the elliptical curved surface. As shown by e1, it is formed so as to have a predetermined angle backward from the first focal point F1 by the intersection point P, and, as shown by e3, from the first focal point F1 toward the center of the ellipse. It may be formed linearly (parallel to the short axis) behind the intersection P, or may be formed behind the first focal point F1 (backward from the center of the ellipse) as indicated by e2. The opening 4f of the elliptical mirror 4 is formed rearward from the second focal point F2 with respect to the center of the elliptical mirror 4 (in the drawing, parallel to the short axis at the position of the second focal point F2), and the measurement unit 3a is installed. If it is easy, the formation position and opening shape are not limited.

  The elliptical mirror 4 may be a mirror surface at least on the inner surface of the elliptical curved mirrors 4a and 4b. In the case of the light source W to be measured, the planes 4c and 4d are used to prevent light from entering from the outside. Is. Of course, the planes 4c and 4d of the elliptical mirror 4 may be mirror surfaces.

  As shown in FIGS. 3 and 4, the elliptical mirror 4 is from the measured light source W that diffuses from the first focus F1 toward the second focus F2 immediately above the first focus F1 and the second focus F2. A condensing lens 5 that condenses the light at the second focal point F2 is provided. As the condenser lens 5, for example, an aberration correction lens (not shown) using a convex lens or a combination of a convex lens and a concave lens is used, and the focal distance of the lens is the second focal point of light from the first focal point of the elliptical mirror 4. It is set to concentrate.

The condensing lens 5 is installed in the elliptical mirror by a support means 6 such as a support rod at an intermediate position between the first focus F1 and the second focus F2. The position where the condenser lens 5 is installed is determined by the irradiation angle of the light source W to be measured, the diameter of the condenser lens 5, and the obstacle to the reflected light that is reflected from the elliptic curved mirrors 4 a and 4 b and collected at the second focal point. It is decided in consideration of things not becoming. Here, as shown in FIG. 4, when the condensing lens 5 is cut at 180 degrees parallel to the minor axis of the ellipse at the opening 4f where the measuring section 3a of the elliptical mirror 4 is installed, the condensing lens 5 is 180 degrees. Inwardly from the intersection P1 with the elliptical curved surface cut at, the light is projected at the position that can be condensed at the second focal point F2 with respect to the light of the expected spatial angle θ directly irradiated from the first focal point F1.
In the configuration of the elliptical mirror 4, the condensing lens 5 is fixed to the planes 4 c and 4 d via the support means 6. It is preferable that the support means 6 for fixing the condenser lens 5 has a linear shape that does not affect the vibration during the operation and does not block the optical path of the light condensed at the second focal point. The support means 6 is described as being supported by one support rod in the upper and lower directions in the drawing, but a total of four support rods in the upper and lower portions may be used as the support means 6.

  As shown in FIG. 1, the light measuring means 3 is installed through a holding tube 3e in contact with or in close proximity to the diffusion plate 3b arranged in the measurement unit 3a installed at the second focal point. Optical fiber 3c and fixing means 3d for detachably installing and fixing the optical fiber 3c to the housing 7, and to the optical measuring instrument (not shown) sent from the measuring unit 3a via the optical fiber 3c. The light from the measurement light source W is measured. Here, the light collected through the diffusion plate 3b is diffused into the measurement unit 3a installed at the second focal point of the elliptical mirror 4 and taken into the optical fiber 3c side. Depending on the configuration of W, the diffusion plate 3b may not be provided.

  A plurality of handlers 20 are provided on the rotating disk 21 of the transport device B at regular intervals so that the light emitting point of the light source W to be measured can be installed at the measurement position that is the first focal point of the ellipse at the opening 4e of the elliptical mirror 4. It is configured. Here, the handler 20 vacuum-sucks a predetermined position of the light source W to be measured aligned by an alignment device (not shown) to hold the electrode of the light source W to be measured in an exposed state, along the transport path of the transport device B. When the measured light source W is moved to a position where the measured light source W can be installed at the first focus of the elliptical mirror 4, the measured light source W is moved to the measurement position by moving and lowering the measured light source W. Is installed. The handler 20 is not limited in the moving direction and the moving method as long as the measured light source W can be installed at the position of the first focus.

  When the handler 20 sets W at the measurement position of the first focus, a power supply device D that turns on the light source W to be measured is disposed, for example, below the measurement position. The power supply device D comes into contact with the electrode of the light source W to be measured held by the handler 20 and turns on the light source W to be measured for a predetermined time (a time during which the light from the light source W can be measured). It is configured. The power supply device D may be fixed or mobile.

  Further, as shown in FIG. 2, a sorting device C is installed at a position adjacent to the wide diffusion light source light measurement device 1. This sorting device C is for classifying the light source W to be measured into a predetermined sorting case based on the result measured by the wide diffusion light source light measuring device 1. The sorting device C includes an opening slider 31 that is received when the light source to be measured W is dropped, a sorting nozzle 32 that is rotatably installed adjacent to the opening slider 31, and a lower part of the sorting nozzle 32. The sorting case 33 and the like are arranged.

  In the wide diffused light source measurement apparatus 1, the example has been described in which the condensing lens 5 as the condensing optical system is disposed on the elliptical mirror 4, but a diffusion plate (see FIG. (Not shown) may be installed. In the case where a diffuser plate is installed, there are some light beams from the first focal point that pass through the diffuser plate and gather at the second focal point, or after being diffused and reflected by the elliptic curved mirrors 4a and 4b. Some of them collect, and the light collection rate is lower than that of the condensing lens, but the light can be condensed on the second focal point through the diffusion plate.

Next, the operation of the wide diffusion light source light measurement apparatus 1 will be described.
First, the light source W to be measured held by the handler 20 of the transport device B is installed at the measurement position (first focus) of the elliptical mirror 4 of the wide diffused light source light measurement device 1 by the operation of the rotating disk 21. The electrode portion of the power supply device D is connected to the electrode of the light source W to be measured and turned on.

  When the measured light source W is turned on, as shown in FIGS. 4 and 1, most of the light from the measured light source W is collected by the elliptical curved mirrors 4a and 4b at the measurement unit 3a set at the second focal point F2. Lighted. Further, for the light diffused from the light source W to be measured toward the second focus F2 (probable space angle θ, here, the range from the center from the first focus F1 to 12.5 degrees to the left and right), the condenser lens 5 is used. Through the second focal point F2. Therefore, in the elliptical mirror 4, most of the light (light flux) emitted from the light source W to be measured can be collected by the optical fiber 3c through the diffusion plate 3b, and the wavelength characteristics, luminous intensity, and chromaticity are not measured by a photometer (not shown). Values such as coordinates (main wavelength, purity, peak wavelength, color temperature (correlated color temperature), color rendering evaluation value) and the like can be appropriately measured.

When the light from the light source to be measured W is measured by the wide diffused light source light measuring device 1, a signal indicating which class of the light source to be measured W is classified is sent to the sorting device C side from a light measuring device (not shown). In addition, the information table about the division | segmentation of the to-be-measured light source W is beforehand memorize | stored in the optical measuring device, and the signal is sent based on the information table.
When the measurement by the wide diffused light source measurement device 1 is completed, the handler 20 moves while holding the measured light source W that has been transported by the transport device B and has been measured, and stops above the sorting device C. At this time, the next handler 20 holds the next light source W to be measured and installs it at the measurement position of the wide diffused light measurement apparatus 1.

  The handler 20 stopped above the sorting device C releases the measured light source W into the opening slider 31 of the sorting device C that releases the hold of the measured light source W and waits downward. The sorting device C receives the light source W to be measured dropped by the aperture slider 31 and rotates the sorting nozzle 32 in advance according to a signal from the above-mentioned optical measuring device (not shown), and puts it into the sorting case 33 for each measurement result. The light source to be measured W is divided.

  The wide diffusion light source light measuring apparatus 1 described with reference to FIGS. 1 to 4 has been described as a configuration in which the condenser lens 5 is disposed. However, depending on the measurement conditions of the light source W to be measured, the condenser lens 5 Even if is not installed, it is possible to perform appropriate measurement. That is, when the required measurement conditions do not require exact numerical values, the light flux on the peripheral side is caused by the elliptical mirror 4 even if color unevenness occurs particularly on the peripheral side and the central portion of the light source to be measured (for example, LED). This is because there is a case where it can be recognized as the whole light that is close to human vision.

Further, in the wide diffused light source measurement apparatus 1, the example in which the condenser lens 5 is installed on the line connecting the first focus and the second focus has been described as an example. However, as shown in FIG. The structure which condenses the light from a 1st focus to a 2nd focus may be sufficient.
In other words, in FIG. 5, two convex lenses may be used as the condenser lens 5, and aberration correcting lenses (including chromatic aberration or coma aberration) 5 </ b> A and 5 </ b> B may be used as the condenser lens 5. When two convex lenses or aberration correction lenses 5A and 5B are used, the lens is finally arranged at a position where the light from the first focus is condensed on the second focus, and has an influence on chromatic aberration or coma aberration. A combination of few lenses is preferable.

  The aberration correction lenses 5A and 5B are a combination of a convex lens and a concave lens. Therefore, either one of the aberration correction lenses 5A and 5B may be a combination of a convex lens and a concave lens, or both may be a combination of a convex lens and a concave lens. By disposing the aberration correction lenses 5A and 5B on the same axis, the diffused light is further condensed on the second focal point as parallel light. When the aberration correction lenses 5A and 5B are installed, it is desirable that the positions be less obstructed with respect to the reflected light from the elliptic curved mirrors 4a and 4b.

  Furthermore, the elliptical mirror 4 of the wide diffusion light source light measuring apparatus 1 shown in FIG. 1 may have a configuration as shown in FIG. In FIG. 6, only the configuration of the elliptical mirror 14 is different from the configuration already described in FIGS. 1 to 5, and the other configuration is the same. Therefore, the elliptical mirror 14 will be mainly described.

  The wide diffused light source measurement device 11 includes an elliptical mirror 14 that is a three-dimensional elliptical shape represented by rotating an ellipse around its long axis, and a short axis direction of the ellipse behind the second focal point of the elliptical mirror 14. A measuring portion 13a of the light measuring means 13 set at the position of the second focal point in one opening portion 14f formed in a state of being cut in parallel along the optical axis, and a housing 17 for fixing the measuring portion 13a and the elliptical mirror 14. And a condensing lens 15 supported via support means 16 on a line connecting the first focal point and the second focal point of the elliptical mirror 14, and the short axis of the ellipse is located behind the first focal point of the elliptical mirror 14. The light source W to be measured (see FIG. 1) is measured by the handler 20 (see FIG. 1) at the position of the first focal point in the other opening 14e formed in a state cut in parallel along the direction. .

  Since all inner surfaces are formed on an elliptical curved surface that condenses light from the first focal point to the second focal point, the elliptical mirror 14 is the first focal point by the handler 20 (see FIG. 1) at the opening 14e. The light source W to be measured (see FIG. 1) arranged at the measurement position is condensed at the second focal point as shown in FIG. Then, the light within approximately 30 degrees (expected space angle θ) that diverges from the first focus F1 toward the second focus F2 is condensed by the condenser lens 15 onto the second focus F2. Therefore, in the elliptical mirror 14, if the directivity of the light source to be measured W is 170 degrees or less with respect to the first focus F1 in FIG. The light beam can be condensed. Further, the aberration correction lenses 15A and 15B described with reference to FIG.

  If there is a portion that protrudes forward when held by the handler 20 as in the state in which the LED rocket-type lens is already installed (see FIG. 7) as the light source W to be measured, Since the opening 14e is sufficiently wide with respect to the light source W to be measured, the configuration in which the operation of the handler 20 is moved up and down and back and forth can be easily set at the measurement position that is the first focus position. The measurement light source W can be arranged. Further, when the light source to be measured W is arranged at the measurement position, a shutter mechanism that closes the opening space with respect to the opening 14e from the left and right or the top and bottom (not shown) may be provided. Alternatively, the elliptical mirror 14 itself of the wide diffused light source measurement device 11 may be arranged in a dark room (not shown).

  Further, when the diffusing optical system is used in place of the condensing lens 15 which is a condensing optical system with the elliptical mirror 14 having a three-dimensional elliptical shape, it is used as a conical diffusing optical system (not shown). is there.

Next, a light measurement method using an integrating sphere optical system will be described with reference to FIG. FIG. 7 is a schematic view schematically showing a state in which an elliptical mirror is arranged in a wide diffusion light source light measuring device of an integrating sphere optical system.
The wide diffusion light source light measuring device 50 includes an integrating sphere optical system 51, a measuring unit 52 of light measuring means arranged at a predetermined position on the spherical surface of the integrating sphere optical system 51, and a light source W to be measured from the measuring unit 52. Baffle 53 for preventing direct incidence of light and an opening 51e for taking in light from light source W to be measured formed at a predetermined position on the spherical surface of integrating sphere optical system 51.
In addition, the elliptical mirror 34 is provided with support means on a line connecting the first focal point and the second focal point with openings 34e and 34f formed by cutting the rear of the first focal point and the second focal point in parallel with the minor axis of the elliptical part. And a condensing lens 35 disposed via 36.

  Therefore, when the light source to be measured (LED) W held by the handler 40 is installed at the measurement position that is the position of the first focal point in the opening 34e of the elliptical mirror 34, the power source device D lights up. The light irradiated by turning on the light source W to be measured is reflected by the elliptic curved surface of the elliptical mirror 34 and condensed on the second focal point, and the light diverging from the first focal point toward the second focal point is collected. The light is focused on the second focal point by the optical lens 35. Accordingly, almost all of the light emitted from the light source W to be measured enters the integrating sphere optical system 51.

  The light incident on the integrating sphere optical system 51 is diffused in the integrating sphere optical system 51, and a part of the light can be measured by the measuring unit 52. Therefore, it is possible to omit the trouble of inserting the light source to be measured W into the integrating sphere optical system as in the prior art and perform accurate measurement. Note that even with a wide-spreading optical light measurement device that uses an existing integrating sphere optical system, it is possible to use an elliptical mirror adjacently by making the most of the configuration, so manufacturing costs and replacement Costs are cheap.

It is sectional drawing which shows the whole wide-diffusion optical light measuring device based on this invention. BRIEF DESCRIPTION OF THE DRAWINGS It is the schematic which shows the whole light measurement system using the wide diffused light source light measuring apparatus based on this invention, (a) is the side view which described typically the light measurement system, (b) is a light measurement system typically It is the described top view. It is a figure which shows the optical system of the wide diffusion light source light measuring device which concerns on this invention, (a) is an exploded perspective view of the state which isolate | separated the elliptical mirror which is an optical system from the housing | casing, (b) is optical to a housing | casing. It is a perspective view when installing the elliptical mirror which is a system. It is a schematic diagram which shows the condensing state of the light in the elliptical mirror of the wide diffusion light source light measuring apparatus which concerns on this invention. It is a schematic diagram which shows the condensing state of the light of the elliptical mirror in the other form of the wide diffusion light source light measuring apparatus which concerns on this invention. (A) is a disassembled perspective view which shows the state which isolate | separated the elliptical mirror from the housing | casing of the wide diffusion light source light measuring device of the other form which concerns on this invention, (b) shows the state which installed the elliptical mirror in the housing | casing. It is a perspective view of a wide diffusion light source light measuring device. It is a schematic diagram which shows typically the state which uses an elliptical mirror for the wide diffusion optical light measuring device of an integrating sphere optical system.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Wide diffused light source measuring device 3 Light measuring means 3a Measuring part 4 Elliptical mirror 4a, 4b Elliptical curved mirror 4c, 4d Plane plate 4e, 4f Opening 5 Condensing lens 6 Support means 7 Case 20 Handler 51 Integrating sphere optical system A Light measurement system B Transport device C Sorting device D Power supply device W Light source to be measured

Claims (8)

In the optical system of the wide diffusion light source light measurement device that measures the light from the light source to be measured by the measuring unit of the light measuring means disposed on the side facing the light source to be measured by arranging the light source to be measured.
The optical system is an elliptical mirror that is a spheroid represented by rotating around the major axis of the ellipse,
An opening is formed behind the intersection of the light irradiated as the widest angle of the light source to be measured installed at the first focal point and the elliptical curved surface of the elliptical mirror, and the measuring unit is disposed at the second focal point. An optical system of a wide diffusion light source light measuring device, comprising an opening formed rearward from the second focal point to the center of the ellipse for placement. In the optical system of the wide diffusion light source light measurement device that measures the light from the light source to be measured by the measuring unit of the light measuring means disposed on the side facing the light source to be measured by arranging the light source to be measured.
The optical system is provided adjacent to the elliptical curved mirror, with one elliptical curved mirror having a curvature for condensing light from the first focal point to the second focal point, and the elliptical curved mirror facing each other. An elliptical mirror including one and the other flat plate, behind the intersection of the light irradiated as the widest angle of the light source to be measured installed at the first focal point and the elliptical curved surface of the elliptical mirror A wide diffusion comprising: an opening formed, and an opening formed rearward from the second focus with respect to the center of the ellipse in order to place the measurement unit at the second focus Optical system of light source light measurement device.   3. A condensing optical system that is disposed on a line connecting the first focus and the second focus and collects light from the first focus on the second focus. An optical system of the wide diffusion light source light measuring device described. In the wide diffused light source measuring device for measuring the measured light source installed by the light source installation means for detachably holding the measured light source and moving and installing it at the measurement position,
A measuring unit of a light measuring unit that is detachably installed on the side facing the measured light source installed at the measurement position by the light source installing unit, and an elliptical mirror that is arranged across the measuring unit and the measured light source And a condensing optical system or a diffusion optical system disposed on a line connecting the first focal point and the second focal point of the elliptical mirror,
The elliptical mirror includes an opening formed behind the intersection of the light irradiated as the widest angle of the light source to be measured installed at the first focal point and the elliptical curved surface of the elliptical mirror, and the first A wide diffused light source measuring apparatus, comprising an opening formed rearward from the second focal point to the center of the ellipse in order to arrange the measuring unit at two focal points.   5. The wide-spread light source light according to claim 4, wherein the condensing optical system is a condensing lens that condenses light from the light source to be measured having the first focus on the measurement unit having the second focus. measuring device.   6. The wide diffused light source measurement apparatus according to claim 5, wherein the condensing lens is a lens in which an aberration correction lens by a combination of a plurality of lenses is arranged on the same axis.   The elliptical mirror is provided adjacent to the elliptical curved mirror, with one elliptical curved mirror having a curvature for condensing light from the first focal point to the second focal point, and the elliptical curved mirror facing each other. The wide diffused light source measurement apparatus according to claim 4, comprising one and the other flat plate. An integrating sphere optical system, a measuring unit of a light measuring means arranged at a predetermined position on the spherical surface of the integrating sphere optical system, a baffle for preventing light from the light source to be measured from directly entering the measuring unit, and the integrating A wide diffusion light source light measurement device comprising: an opening for taking in light from a light source to be measured formed at a predetermined position on a spherical surface of a spherical optical system;
A condensing lens arranged on a line connecting the first focal point and the second focal point of the ellipse, light irradiated as the widest angle of the light source to be measured installed at the first focal point of the ellipse, and the ellipse of the elliptical mirror An opening formed behind the intersection with the curved surface, an opening formed behind the second focus with respect to the center of the ellipse, and light from the first focus of the ellipse is condensed on the second focus A light measuring method performed using an elliptical mirror having an elliptical curved surface,
The light source to be measured is arranged at a position where one opening of the elliptical mirror is brought into contact with the opening of the integrating sphere optical system and the elliptical mirror is focused on the other opening of the elliptical mirror. A light measurement method for a wide diffusion light source light measurement apparatus, wherein light from the light source to be measured is incident on the integrating sphere optical system through the elliptical mirror.

Images