JP3113302U - Special optics - Google Patents

Special optics Download PDF

Info

Publication number
JP3113302U
JP3113302U JP2004006951U JP2004006951U JP3113302U JP 3113302 U JP3113302 U JP 3113302U JP 2004006951 U JP2004006951 U JP 2004006951U JP 2004006951 U JP2004006951 U JP 2004006951U JP 3113302 U JP3113302 U JP 3113302U
Authority
JP
Japan
Prior art keywords
knife edge
objective lens
light beam
collected light
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004006951U
Other languages
Japanese (ja)
Inventor
一 村上
Original Assignee
一 村上
村上 綾乃
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 一 村上, 村上 綾乃 filed Critical 一 村上
Priority to JP2004006951U priority Critical patent/JP3113302U/en
Application granted granted Critical
Publication of JP3113302U publication Critical patent/JP3113302U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Microscoopes, Condenser (AREA)

Abstract

【課題】 明視野観察用光学系を使用して観察試料の微細な欠陥や凹凸・歪を強調させて観察できるようにする。
【解決手段】 対物レンズによりとらえた観察画像を接眼鏡またはカメラに取り込める鏡筒を有する光学機器に対して前記対物レンズの集光束に対して微調整可能なナイフエッジを入れて前記集光束を切ることにより、観察試料の微細な欠陥や凹凸・歪を強調させて観察画像をとらえることができる特殊光学系の提供が可能となる。
【選択図】 図1、図2
PROBLEM TO BE SOLVED: To enable observation using a bright field observation optical system with emphasis on minute defects, unevenness and distortion of an observation sample.
An optical instrument having a lens barrel capable of taking an observation image captured by an objective lens into an eyepiece or a camera is inserted with a knife edge that can be finely adjusted with respect to the collected light beam of the objective lens to cut the collected light beam. Accordingly, it is possible to provide a special optical system that can capture an observation image by emphasizing minute defects, unevenness and distortion of the observation sample.
[Selection] FIG. 1 and FIG.

Description

本考案は、対物レンズ(有限遠系・無限遠系)によりとらえた観察画像を接眼鏡またはカメラに取り込める鏡筒を有する光学機器を利用して観察試料の微細な欠陥や凹凸・歪を強調させて観察画像としてとらえる特殊光学系、特に前記対物レンズ(有限遠系・無限遠系)の集光束に対して微調整可能なナイフエッジを入れて前記集光束を切る構成にした特殊光学系に関するものである。  The present invention emphasizes minute defects, irregularities and distortions in the observation sample using an optical instrument having a lens barrel that can capture an observation image captured by an objective lens (finite system / infinity system) into an eyepiece or a camera. Special optical systems that can be captured as observation images, in particular, special optical systems configured to cut the collected light flux by inserting a fine-adjustable knife edge with respect to the collected light flux of the objective lens (finite system / infinity system) It is.

従来の光学系では、対物レンズ(有限遠系・無限遠系)により試料に同軸落射光で照射して前記対物レンズにより正反射でとらえた明視野観察画像を接眼鏡またはカメラで観察する目的のための光学機器として一般的に広く活用されている。  In the conventional optical system, a bright field observation image obtained by irradiating a sample with a coaxial incident light by an objective lens (finite distance system / infinity system) and specular reflection by the objective lens is observed with an eyepiece or a camera. In general, it is widely used as an optical device.

以上に述べた従来の対物レンズ(有限遠系・無限遠系)により試料に同軸落射光で照射して前記対物レンズにより正反射でとらえた明視野観察画像を接眼鏡またはカメラで明視野観察する方法では、前記試料の微細な欠陥や凹凸・歪を観察出来ずに必ずしも効果的な観察結果や解析結果は得られなかった。  A bright field observation image obtained by irradiating a specimen with coaxial incident light using the conventional objective lens (finite distance system and infinity system) described above and captured by regular reflection by the objective lens is observed with a eyepiece or a camera. In the method, fine observations and irregularities / distortions of the sample cannot be observed, and effective observation results and analysis results cannot always be obtained.

本考案は、このような従来の構成が有していた問題を解決しようとするものであり、その目的とするところは、明視野観察光学機器を利用して前記明視野観察ではとらえることの出来なかった前記試料の微細な欠陥や凹凸・歪をとらえて前記試料に対する観察や正確な解析を可能とした特殊光学系を提供することである。  The present invention is intended to solve the problems of such a conventional configuration, and the object of the present invention can be grasped by the bright field observation using a bright field observation optical instrument. It is an object of the present invention to provide a special optical system capable of observing and accurately analyzing the sample by capturing minute defects, unevenness and distortion of the sample that have not been present.

前記目的を達成するために、本考案に係る特殊光学系は次のように構成したものである。  In order to achieve the above object, the special optical system according to the present invention is configured as follows.

即ち、本考案の請求項1に記載の考案は、円筒状内に数枚のレンズで構成され且つ画角のある対物レンズ(有限遠系・無限遠系)に対して同軸落射照明が可能なように照明を入光させるために前記対物レンズの像側にハーフミラー(もしくはビームスプリッター)を構成し、さらに前記対物レンズによりとらえた観察画像を接眼鏡またはカメラに取り込める鏡筒を有する光学機器に対して前記対物レンズと前記ハーフミラー(もしくはビームスプリッター)の間にある前記対物レンズの集光束に対してナイフエッジを入れて前記集光束を切ることを特徴とする特殊光学系である。  That is, according to the first aspect of the present invention, coaxial epi-illumination is possible with respect to an objective lens (finite distance system / infinite distance system) that is composed of several lenses in a cylindrical shape and has an angle of view. An optical apparatus having a lens barrel that captures an observation image captured by the objective lens into an eyepiece or a camera is configured such that a half mirror (or a beam splitter) is formed on the image side of the objective lens in order to allow illumination to enter. On the other hand, a special optical system characterized in that a knife edge is inserted into the collected light beam of the objective lens between the objective lens and the half mirror (or beam splitter) to cut the collected light beam.

本考案の請求項2に記載の考案は、前記請求項1記載の特殊光学系の考案において、前記集光束を切る前記ナイフエッジの入れる量を微調整可能なように前記ナイフエッジにリードネジを取り付けて前後微動移動可能なナイフエッジ微動調整機構を有し、さらに前記ナイフエッジ微動調整機構内に前記集光束を中心にあらゆる方向から前記ナイフエッジで切れるように回転可能な回転機構を有するナイフエッジ微動調整回転機構を内蔵することを特徴とする特殊光学系である。  A device according to claim 2 of the present invention is the device of the special optical system according to claim 1, wherein a lead screw is attached to the knife edge so that the amount of the knife edge that cuts the collected light beam can be finely adjusted. A knife edge fine movement adjustment mechanism that can be moved back and forth finely, and a knife edge fine movement that has a rotation mechanism that can be rotated so that the knife edge can be cut from any direction around the collected light beam in the knife edge fine movement adjustment mechanism It is a special optical system characterized by incorporating an adjusting rotation mechanism.

以上、上述のように本考案の請求項1記載の考案による作用は、前記光学機器内にある前記対物レンズの集光束に対してナイフエッジで切ることにより、従来の明視野観察機能を維持しながら今まで観察出来なかった試料の微細な欠陥や凹凸・歪をとらえることができ、正確で高度な観察・解析を可能とする。  As described above, the operation according to the first aspect of the present invention maintains the conventional bright field observation function by cutting the collected light beam of the objective lens in the optical apparatus with a knife edge. However, it can capture minute defects, irregularities and distortions of samples that could not be observed until now, and enables accurate and advanced observation and analysis.

また請求項2記載の考案による作用は、前記光学機器内にあるナイフエッジに前後移動及び回転移動可能な機構を有することにより、多種試料に対する微細な欠陥や凹凸・歪のエッジ強弱調整が可能となり、より正確で高度な観察・解析を可能とする。  In addition, the operation of the invention according to claim 2 has a mechanism capable of moving back and forth and rotating on the knife edge in the optical instrument, so that it is possible to adjust the edge strength of fine defects, unevenness and distortion on various samples. , Enabling more accurate and advanced observation and analysis.

以下、本考案の実施の形態を図1、図2に基づいて詳細に説明する。  Hereinafter, an embodiment of the present invention will be described in detail with reference to FIGS.

図1は本考案の一実施例を適用した特殊光学系の概要を模式的に示す構成説明図である。 図2は本考案の一実施例を適用したナイフエッジ微動調整回転機構を模式的に示す機構説明図である。  FIG. 1 is an explanatory diagram schematically showing the outline of a special optical system to which an embodiment of the present invention is applied. FIG. 2 is a mechanism explanatory view schematically showing a knife edge fine adjustment rotating mechanism to which one embodiment of the present invention is applied.

即ち、図1に示す実施例、特殊光学系の構成において、ランプ光源11より高輝度の光束A12aが対物レンズ10の対物内部レンズA10aに均一に入光するように前記ランプ光源11より前記光束A12aをうける照明用レンズ13を有し、前記対物レンズ10に前記光束A12aが垂直に入光するように前記対物レンズ10の像側にハーフミラー14を前記対物レンズ10の光軸26に対して45度の位置に設置し、且つ前記対物レンズ10と前記ハーフミラー14の間に集光束15がくるように構成し、前記光束A12aを前記対物レンズ10内にある前記対物内部レンズA10a、対物内部レンズB10b、対物内部レンズC10cより導いて同軸落射照明光の光束B12をつくる。  That is, in the configuration of the embodiment shown in FIG. 1 and the special optical system, the luminous flux A12a from the lamp light source 11 is uniformly incident on the objective internal lens A10a of the objective lens 10 so that the luminous flux A12a having higher brightness than the lamp light source 11 is incident. A half mirror 14 on the image side of the objective lens 10 with respect to the optical axis 26 of the objective lens 10 so that the luminous flux A12a enters the objective lens 10 vertically. And the converging light beam 15 is arranged between the objective lens 10 and the half mirror 14, and the light beam A12a is provided in the objective lens 10 with the objective internal lens A10a and the objective internal lens. B10b, guided from the objective internal lens C10c, produces a luminous flux B12 of coaxial incident illumination light.

前記特殊光学系で観察したい試料17を前記対物レンズ10の物体側に置き、前記対物レンズ10より光束B12を前記試料17に対して照射し、反射して戻ってきた光束C18を前記対物レンズ10内にある前記対物内部レンズC10c、前記対物内部レンズB10b、前記対物内部レンズA10aでとらえて観察画像18aをつくり、前記観察画像18aをCCDカメラ21内にあるCCD撮像素子20に結像するように、前記ハーフミラー14と前記CCD撮像素子20の間に結像レンズ19を設置する。  A sample 17 to be observed with the special optical system is placed on the object side of the objective lens 10, and the sample 17 is irradiated with a light beam B12 from the objective lens 10 and reflected and returned. An observation image 18a is created by the objective internal lens C10c, the objective internal lens B10b, and the objective internal lens A10a, and the observation image 18a is formed on the CCD image pickup device 20 in the CCD camera 21. An imaging lens 19 is installed between the half mirror 14 and the CCD image pickup device 20.

前記CCD撮像素子20より前記観察画像18aをとらえて、前記CCDカメラ21内部で前記観察画像18aを光電変換し、CCDカメラ映像信号23として前記CCDカメラ21よりCCDカメラケーブル22に伝送されて前記CCDカメラ映像信号23がTVモニター25へ出力されてTVモニター表示画面24上に前記観察画像18aが再現される。  The observation image 18a is captured from the CCD image pickup device 20, and the observation image 18a is photoelectrically converted inside the CCD camera 21, and transmitted as a CCD camera video signal 23 from the CCD camera 21 to the CCD camera cable 22 to be converted into the CCD. The camera image signal 23 is output to the TV monitor 25, and the observed image 18a is reproduced on the TV monitor display screen 24.

さらにエッジ強調された画像をとらえるために、前記対物レンズ10と前記ハーフミラー14の間にある前記光束A12a及び前記集光束15を垂直に切るナイフエッジ微動調整ユニット16を設置し、前記光束A12a及び前記集光束15に対して前記ナイフエッジ微動調整ユニット16により切る量と方向を微調整することにより今までとらえられなかった前記試料17にある微細な欠陥や凹凸・歪をとらえることを特徴とした特殊光学系を上記実施例により可能とした。  Further, in order to capture an edge-enhanced image, a knife edge fine adjustment unit 16 that vertically cuts the light flux A12a and the collected light flux 15 between the objective lens 10 and the half mirror 14 is installed, and the light flux A12a and By finely adjusting the amount and direction of the collected light beam 15 cut by the knife edge fine adjustment unit 16, it is possible to catch minute defects, irregularities and distortions in the sample 17 that have not been captured so far. A special optical system is made possible by the above embodiment.

前記図1の特殊光学系の構成は、前記対物レンズ10の仕様を無限遠系光学系とした模式的に示す構成説明図である。  The configuration of the special optical system in FIG. 1 is a configuration explanatory view schematically showing the specification of the objective lens 10 as an infinite system optical system.

前記図1の特殊光学系の構成に対して、前記対物レンズ10の仕様を有限遠系光学系とした場合、前記結像レンズ19を取り外せば、今までとらえられなかった前記試料17にある微細な欠陥や凹凸・歪をとらえることを特徴とした特殊光学系を可能とする。  In contrast to the configuration of the special optical system in FIG. 1, when the specification of the objective lens 10 is a finite distance optical system, if the imaging lens 19 is removed, the fineness in the sample 17 that has not been captured so far can be obtained. Special optical system characterized by capturing various defects, irregularities and distortions.

前記図1の特殊光学系の構成により、従来の明視野観察機能を生かしながら前記試料17の微細な欠陥や凹凸・歪をとらえる特殊光学系が可能となり、より正確な画像処理と同時に欠陥観察を可能とした今までにない特殊光学系の提供が可能となる。  The special optical system configuration shown in FIG. 1 enables a special optical system that captures fine defects, irregularities and distortions of the sample 17 while taking advantage of the conventional bright field observation function, and enables defect observation simultaneously with more accurate image processing. It becomes possible to provide a special optical system that has never been possible before.

即ち、図2に示す実施例、ナイフエッジ微動調整回転機構の構成において、ナイフエッジ微動調整ユニット16は前記試料17の目的にあわせてオスリードネジのあるナイフエッジ微動調整ツマミ29を回転させることによりメスリードネジのあるナイフエッジ微動調整機構部28及びナイフエッジ27が前記集光束15に対して垂直に前後微動し、前記光束A12a及び集光束15を切ることで前記特殊光学系を可能とする。  That is, in the embodiment shown in FIG. 2, the knife edge fine movement adjusting and rotating mechanism, the knife edge fine movement adjusting unit 16 rotates the knife edge fine movement adjusting knob 29 having a male lead screw in accordance with the purpose of the sample 17 to adjust the female lead screw. A certain knife edge fine adjustment mechanism 28 and knife edge 27 slightly move back and forth perpendicularly to the collected light beam 15 to cut off the light beam A12a and the collected light beam 15, thereby enabling the special optical system.

さらに前記特殊光学系の観察の目的にあわせて前記観察画像18aのエッジ強弱を変えられるように、ナイフエッジ微動調整ユニットスライダー30をナイフエッジ微動調整ユニット回転機構16bに固定し、前記光軸26を中心に前記ナイフエッジ微動調整ユニット回転機構16bが回転できるようオスミゾのあるナイフエッジ微動調整ユニット回転機構固定部16aにメスミゾのある前記ナイフエッジ微動調整ユニット回転機構16bをはめ合わせて回転させることにより前記ナイフエッジ微動調整ユニット16が前記光軸26を中心に回転可能となり、あらゆる方向から前記ナイフエッジ27により前記光束A12a及び前記集光束15の切る度合いと方向により前記試料17の目的にあわせた調整が可能となり、色々な観察を可能とする。  Further, the knife edge fine adjustment unit slider 30 is fixed to the knife edge fine adjustment unit rotating mechanism 16b so that the edge strength of the observation image 18a can be changed according to the purpose of observation of the special optical system, and the optical axis 26 is The knife edge fine movement adjustment unit rotation mechanism 16b with a female groove is fitted to the knife edge fine movement adjustment unit rotation mechanism fixing part 16a with a male groove so that the knife edge fine movement adjustment unit rotation mechanism 16b can be rotated at the center. The knife edge fine adjustment unit 16 can be rotated about the optical axis 26, and adjustment according to the purpose of the sample 17 can be performed according to the degree and direction in which the light beam A12a and the collected light beam 15 are cut by the knife edge 27 from any direction. It becomes possible, and various observations are possible That.

さらに前記ナイフエッジ微動調整ユニットスライダー30の設置により、前記試料17の観察内容や目的に応じて前記ナイフエッジ微動調整ユニット16を脱着可能とし、あるゆる形状のナイフエッジ27の設置を可能とする。  Further, the installation of the knife edge fine adjustment unit slider 30 enables the knife edge fine adjustment unit 16 to be attached / detached according to the observation contents and purpose of the sample 17 and enables the installation of a knife edge 27 of any shape.

前記試料17の観察するための条件が同類であるならば、前記ナイフエッジ27の形状、前記ナイフエッジ微動調整ユニット16の調整機構及び前記ナイフエッジ微動調整ユニット回転機構16b仕様は固定に設定してもかまわない。  If the conditions for observing the sample 17 are the same, the shape of the knife edge 27, the adjustment mechanism of the knife edge fine adjustment unit 16 and the specification of the knife edge fine adjustment unit rotation mechanism 16b are set to be fixed. It doesn't matter.

本考案の一実施例を適用した光学機器:特殊光学系の概要を模式的に示す構成説明図である。  BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is an explanatory diagram schematically showing an outline of an optical apparatus: special optical system to which an embodiment of the present invention is applied. 本考案の一実施例を適用した機構部:ナイフエッジ微動調整回転機構の概要を模式的に示す機構説明図である。  It is mechanism explanatory drawing which shows typically the outline | summary of the mechanism part to which one Example of this invention is applied: Knife edge fine movement adjustment rotation mechanism.

符号の説明Explanation of symbols

10 対物レンズ(無限遠系レンズ)
10a 対物内部レンズA
10b 対物内部レンズB
10c 対物内部レンズC
11 ランプ光源
12 光束B(同軸落射照明光)
12a 光束A
13 照明用レンズ
14 ハーフミラー(もしくはビームスプリッター)
15 集光束
16 ナイフエッジ微動調整ユニット
16a ナイフエッジ微動調整ユニット回転機構固定部
16b ナイフエッジ微動調整ユニット回転機構
17 試料
18 光束C
18a 観察画像
19 結像レンズ
20 CCD撮像素子
21 CCDカメラ
22 CCDカメラケーブル
23 CCDカメラ映像信号
24 TVモニター表示画面
25 TVモニター
26 光軸
27 ナイフエッジ
28 ナイフエッジ微動調整機構部
29 ナイフエッジ微動調整ツマミ
30 ナイフエッジ微動調整ユニットスライダー
10 Objective lens (infinity lens)
10a Objective internal lens A
10b Objective internal lens B
10c Objective internal lens C
11 Lamp light source 12 Light flux B (Coaxial epi-illumination light)
12a Luminous flux A
13 Illumination lens 14 Half mirror (or beam splitter)
15 Collected light beam 16 Knife edge fine movement adjustment unit 16a Knife edge fine movement adjustment unit rotation mechanism fixing part 16b Knife edge fine movement adjustment unit rotation mechanism 17 Sample 18 Light beam C
18a Observation image 19 Imaging lens 20 CCD image pickup device 21 CCD camera 22 CCD camera cable 23 CCD camera image signal 24 TV monitor display screen 25 TV monitor 26 Optical axis 27 Knife edge 28 Knife edge fine adjustment mechanism 29 Knife edge fine adjustment knob 30 Knife edge fine adjustment unit slider

Claims (2)

円筒状内に数枚のレンズで構成され且つ画角のある対物レンズ(有限遠系・無限遠系)に対して同軸落射照明が可能なように照明を入光させるために前記対物レンズの像側にハーフミラー(もしくはビームスプリッター)を構成し、さらに前記対物レンズによりとらえた観察画像を接眼鏡またはカメラに取り込める鏡筒を有する光学機器に対して前記対物レンズと前記ハーフミラー(もしくはビームスプリッター)の間にある前記対物レンズの集光束に対してナイフエッジを入れて前記集光束を切ることを特徴とする特殊光学系。  An image of the objective lens in order to make the illumination incident so that coaxial incident illumination is possible for an objective lens (finite distance system / infinity system) that is composed of several lenses in a cylindrical shape and has an angle of view. The objective lens and the half mirror (or beam splitter) with respect to an optical apparatus having a half mirror (or beam splitter) on the side and having a lens barrel capable of capturing an observation image captured by the objective lens into an eyepiece or a camera A special optical system characterized in that a knife edge is inserted into the collected light beam of the objective lens between them to cut the collected light beam. 前記対物レンズの前記集光束を切る前記ナイフエッジの入れる量を微調整可能なように前記ナイフエッジにリードネジを取り付けて前後微動移動可能なナイフエッジ微動調整機構を有し、さらに前記ナイフエッジ微動調整機構内に前記集光束を中心にあらゆる方向から前記ナイフエッジで切れるように回転可能な回転機構を有するナイフエッジ微動調整回転機構を内蔵することを特徴とする請求項1記載の特殊光学系。  A knife edge fine adjustment mechanism capable of finely moving back and forth by attaching a lead screw to the knife edge so that the amount of the knife edge that cuts the collected light beam of the objective lens can be finely adjusted; 2. The special optical system according to claim 1, further comprising a knife edge fine movement adjusting and rotating mechanism having a rotating mechanism that can be rotated so as to be cut by the knife edge from any direction around the collected light beam.
JP2004006951U 2004-10-28 2004-10-28 Special optics Expired - Fee Related JP3113302U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004006951U JP3113302U (en) 2004-10-28 2004-10-28 Special optics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004006951U JP3113302U (en) 2004-10-28 2004-10-28 Special optics

Publications (1)

Publication Number Publication Date
JP3113302U true JP3113302U (en) 2005-09-08

Family

ID=43275670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004006951U Expired - Fee Related JP3113302U (en) 2004-10-28 2004-10-28 Special optics

Country Status (1)

Country Link
JP (1) JP3113302U (en)

Similar Documents

Publication Publication Date Title
JP3404134B2 (en) Inspection device
JP5946751B2 (en) Defect detection method and apparatus, and defect observation method and apparatus
WO2006059647A1 (en) Surface inspection device and surface inspection method
JP5348765B2 (en) Method and apparatus for inspecting fine irregularities of flat transparent body
JP2008502929A (en) Inspection apparatus or inspection method for fine structure by reflected or transmitted infrared light
TWI700487B (en) System and method for inspecting object
CN113376824A (en) Method for adjusting image bounding box
JP2008076962A (en) Optical inspection apparatus
WO2016132451A1 (en) Microscope
US8508589B2 (en) Imaging systems and associated methods thereof
JP6387381B2 (en) Autofocus system, method and image inspection apparatus
JP2013142596A (en) Cylindrical inner surface detection optical system and cylindrical inner surface detector
JP3113302U (en) Special optics
JP2007198761A (en) Flaw detection method and detector
JP2003214978A (en) Inspection device for optical connector end surface
JP6633599B2 (en) Lens checker
JP2004535601A (en) Configuration of microscope objective lens
JP3753044B2 (en) Optical connector end face inspection device
JP2021001734A (en) Inner surface automatic inspection apparatus of pipe material and inner surface automatic inspection method of pipe material
TWI707131B (en) System and method for inspecting objects
JP2000097867A (en) Defect detecting device and method for translucent substrate
JP5922556B2 (en) Welding inspection apparatus and welding inspection method
JP3981376B2 (en) Magnification imaging adapter
JP6255305B2 (en) Optical microscope
JP5647716B2 (en) A simple telecentric lens device for micro unevenness inspection machine

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050527

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees