JP3107103B2 - 2D total reflection measuring device - Google Patents

2D total reflection measuring device

Info

Publication number
JP3107103B2
JP3107103B2 JP32657791A JP32657791A JP3107103B2 JP 3107103 B2 JP3107103 B2 JP 3107103B2 JP 32657791 A JP32657791 A JP 32657791A JP 32657791 A JP32657791 A JP 32657791A JP 3107103 B2 JP3107103 B2 JP 3107103B2
Authority
JP
Japan
Prior art keywords
prism
sample
total reflection
measuring device
reflection measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP32657791A
Other languages
Japanese (ja)
Other versions
JPH05133882A (en
Inventor
康志 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP32657791A priority Critical patent/JP3107103B2/en
Publication of JPH05133882A publication Critical patent/JPH05133882A/en
Application granted granted Critical
Publication of JP3107103B2 publication Critical patent/JP3107103B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、試料面からの全反射吸
収スペクトルを測定する装置、より詳細には試料と入
射、出射関係を形成する光学系に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for measuring a total reflection absorption spectrum from a sample surface, and more particularly to an optical system for forming an incident / emission relationship with a sample.

【0002】[0002]

【従来の技術】試料表面の全反射吸収スペクトルを測定
する場合には、試料表面に平面状プリズムを接しさせて
試料に全反射角となるように光を入射させ、試料により
吸収された反射光を検出するようになっている。このよ
うな装置を用いて試料面全体を2次元的に測定しようと
すると、1つの測定点での測定が終了する度にプリズム
を試料面から退避させたのち、次の測定点に移動させる
という作業が必要となって、分析に手間が掛かるばかり
でなく、連続点としての測定が困難であるという問題が
ある。もとより、試料にプリズムを接しさせた状態で測
定点を移動させることも考えられるが、上述したように
プリズムが平面状に構成されているため、試料面との間
に大きな摩擦があり、試料の表面やプリズムが損傷を受
けるといった問題がある。
2. Description of the Related Art When measuring the total reflection absorption spectrum of a sample surface, a planar prism is brought into contact with the sample surface, light is incident on the sample so as to have a total reflection angle, and the reflected light absorbed by the sample is reflected. Is to be detected. When trying to measure the entire sample surface two-dimensionally using such a device, the prism is retracted from the sample surface each time measurement at one measurement point is completed, and then moved to the next measurement point. This requires work, which not only requires time and labor for analysis, but also makes it difficult to perform measurement as a continuous point. Of course, it is conceivable to move the measurement point while the prism is in contact with the sample, but since the prism is configured in a flat shape as described above, there is great friction between the sample and the sample surface, and There is a problem that the surface and the prism are damaged.

【0003】[0003]

【発明が解決しようとする課題】本発明は、このような
問題に鑑みてなされたものであって、その目的とすると
ころは、試料の表面を2次元的に測定することができる
新規な全反射測定装置を提供することにある。
SUMMARY OF THE INVENTION The present invention has been made in view of such a problem, and an object of the present invention is to provide a novel total measurement apparatus capable of two-dimensionally measuring the surface of a sample. An object of the present invention is to provide a reflection measuring device.

【0004】[0004]

【課題を解決するための手段】このような問題を解消す
るために本発明においては、球状に形成されたプリズム
を保持部材の一端に回転可能に支持するとともに、前記
プリズムと光路を形成するようにカセグレン光学系を配
置するようにした。
According to the present invention, a spherical prism is rotatably supported at one end of a holding member and an optical path is formed with the prism. The Cassegrain optical system is arranged at the center.

【0005】[0005]

【作用】プリズムを試料に接しさせたまま試料とプリズ
ムを相対的に移動させると、球形のプリズムは、その回
転位置に関わりなく試料面との光学光路を一定の関係に
維持したまま、円滑に移動する。
[Function] When the sample and the prism are relatively moved while the prism is in contact with the sample, the spherical prism smoothly moves while maintaining a constant optical path with the sample surface regardless of the rotational position. Moving.

【0006】[0006]

【実施例】そこで以下に本発明の詳細を図示した実施例
に基づいて説明する。$ 図1は本発明の一実施例を示すものであって、図中符号
1は、試料Sと接するプリズムで、必要な光学特性を備
えた光学材料を球形に成型して構成され、一半を保持部
材2の一端部2aに回転可能に支持されている。3は、
半球鏡4とでカセグレン光学系を構成するカセグレン鏡
で、窓3aからの入射光L1をプリズム1に、またプリ
ズム1からの光を集光して図示しない検出器の検出光L
2として出射するように配置されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The details of the present invention will be described below with reference to the illustrated embodiments. $ FIG. 1 shows an embodiment of the present invention. In the figure, reference numeral 1 denotes a prism which is in contact with a sample S and is formed by molding an optical material having necessary optical characteristics into a spherical shape. The holding member 2 is rotatably supported by one end 2a. 3 is
A Cassegrain mirror, which forms a Cassegrain optical system with the hemispherical mirror 4, receives the incident light L1 from the window 3a on the prism 1, and collects the light from the prism 1 to detect the detection light L of a detector (not shown).
It is arranged to emit as 2.

【0007】この実施例において、プリズム1を試料S
の表面に当接させて発光手段を作動させると、カセグレ
ン鏡3から出射した光は、プリズム1を透過して試料S
の一点を試料平面に対して臨界角以上、例えば40度以
上で照射する。この光は、試料の特性に応じた波長成分
を吸収されて全反射され、再びプリズム1に入射する。
試料で全反射された光はプリズム1を通過してカセグレ
ン鏡3により集光されて図示しない光検出器に入射す
る。
In this embodiment, the prism 1 is connected to the sample S
The light emitted from the Cassegrain mirror 3 is transmitted through the prism 1 and the sample S
Is irradiated at a critical angle or more, for example, 40 degrees or more with respect to the sample plane. This light absorbs a wavelength component corresponding to the characteristics of the sample, is totally reflected, and enters the prism 1 again.
The light totally reflected by the sample passes through the prism 1, is collected by the Cassegrain mirror 3, and is incident on a photodetector (not shown).

【0008】この状態でプリズム1と試料Sを相対的に
移動させると、プリズム1は試料Sの表面からの摩擦力
を受けて保持部材2の一端部2a内で回動して試料の移
動に滑らかに追従する。もとより、プリズム1は球形に
構成されているから、カセグレン鏡3、及び試料との光
学経路の関係を一定の状態に維持するから、移動に伴っ
て誤差が発生するようなことにはならない。
When the prism 1 and the sample S are relatively moved in this state, the prism 1 receives the frictional force from the surface of the sample S and rotates within the one end 2a of the holding member 2 to move the sample. Follow smoothly. Naturally, since the prism 1 is formed in a spherical shape, the relationship between the optical path with the Cassegrain mirror 3 and the sample is maintained in a constant state, so that an error does not occur with the movement.

【0009】[0009]

【発明の効果】以上説明したように本発明においては、
球状に形成されたプリズムを保持部材の一端に回転可能
に支持するとともに、このプリズムと光路を形成するよ
うにカセグレン光学系を配置したので、プリズムが試料
面、及びカセグレン光学系との光学路関係を一定に維持
した状態で回動可能となり、したがってプリズムを試料
に接しさせたまま測定点を変更することができて、試料
表面を連続走査して測定することができる。
As described above, in the present invention,
The spherically formed prism is rotatably supported on one end of the holding member, and the Cassegrain optical system is arranged so as to form an optical path with the prism. Can be rotated while maintaining the constant, so that the measurement point can be changed while the prism is in contact with the sample, and measurement can be performed by continuously scanning the sample surface.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例を示す装置の構成図である。FIG. 1 is a configuration diagram of an apparatus showing one embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 球形プリズム 2保持部材 3 カセグレン鏡 4 半球鏡 S 試料 Reference Signs List 1 spherical prism 2 holding member 3 Cassegrain mirror 4 hemispheric mirror S sample

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】球状に形成されたプリズムを保持部材の一
端に回転可能に支持するとともに、前記プリズムと光路
を形成するようにカセグレン光学系を配置してなる2次
元全反射測定装置。
1. A two-dimensional total reflection measuring apparatus comprising: a spherically formed prism rotatably supported at one end of a holding member; and a Cassegrain optical system arranged to form an optical path with the prism.
JP32657791A 1991-11-14 1991-11-14 2D total reflection measuring device Expired - Fee Related JP3107103B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32657791A JP3107103B2 (en) 1991-11-14 1991-11-14 2D total reflection measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32657791A JP3107103B2 (en) 1991-11-14 1991-11-14 2D total reflection measuring device

Publications (2)

Publication Number Publication Date
JPH05133882A JPH05133882A (en) 1993-05-28
JP3107103B2 true JP3107103B2 (en) 2000-11-06

Family

ID=18189368

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32657791A Expired - Fee Related JP3107103B2 (en) 1991-11-14 1991-11-14 2D total reflection measuring device

Country Status (1)

Country Link
JP (1) JP3107103B2 (en)

Also Published As

Publication number Publication date
JPH05133882A (en) 1993-05-28

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