JP3074773B2 - Solid-state imaging device - Google Patents

Solid-state imaging device

Info

Publication number
JP3074773B2
JP3074773B2 JP03110076A JP11007691A JP3074773B2 JP 3074773 B2 JP3074773 B2 JP 3074773B2 JP 03110076 A JP03110076 A JP 03110076A JP 11007691 A JP11007691 A JP 11007691A JP 3074773 B2 JP3074773 B2 JP 3074773B2
Authority
JP
Japan
Prior art keywords
cap glass
solid
package
cap
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP03110076A
Other languages
Japanese (ja)
Other versions
JPH04337668A (en
Inventor
真一 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP03110076A priority Critical patent/JP3074773B2/en
Publication of JPH04337668A publication Critical patent/JPH04337668A/en
Application granted granted Critical
Publication of JP3074773B2 publication Critical patent/JP3074773B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は固体撮像素子に関し、特
にそのパッケージに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solid-state image pickup device, and more particularly to a package thereof.

【0002】[0002]

【従来の技術】固体撮像素子のパッケージは、固体撮像
素子チップに(以下チップと略記する)に光を入射させ
るため、セラミックパッケージと、光学的に平面なキャ
ップを用いるのが一般的となっている。図3はこの一例
の部分断面図であり、セラミックパッケージ5の中央に
チップ6を取り付け、チップ6と内部リードとを接続し
た後、キャップガラス2をセラミックパッケージ5の最
外周部のキャップガラス接着部4にのせ、あらかじめキ
ャップガラス2またはセラミックパッケージ5のキャッ
プガラス接着部4に付着させていた接着樹脂3を溶か
し、その後冷却してキャップガラス2とキャップガラス
接着部4を接着するようになっている。
2. Description of the Related Art In general, a solid-state image pickup device package uses a ceramic package and an optically flat cap in order to make light incident on a solid-state image pickup device chip (hereinafter simply referred to as a chip). I have. FIG. 3 is a partial cross-sectional view of this example. After attaching a chip 6 to the center of the ceramic package 5 and connecting the chip 6 and the internal lead, the cap glass 2 is attached to the outermost peripheral portion of the ceramic package 5. 4, the adhesive resin 3 previously attached to the cap glass 2 or the cap glass bonding portion 4 of the ceramic package 5 is melted, and then cooled to bond the cap glass 2 and the cap glass bonding portion 4. .

【0003】[0003]

【発明が解決しようとする課題】上述したようなパッケ
ージの構造では、キャップガラス2をセラミックパッケ
ージのキャップガラス接着部4に接着するとき、図3に
示すように、接着樹脂3がキャップガラス2の裏面をパ
ッケージの内側に向って広がり、チップ6の有効画素領
域を覆うことがある。これによって、映像信号出力画面
の端の部分に影が生じるという欠点がある。また、キャ
ップガラス2をセラミックパッケージ5にセットすると
き、強度の弱い樹脂セラミックパッケージ5と接触する
と、はがれてゴミとなり、それがチップ6上に付着した
場合は黒キズとなる等の問題点がある。
In the package structure as described above, when the cap glass 2 is bonded to the cap glass bonding portion 4 of the ceramic package, as shown in FIG. The back surface may extend toward the inside of the package and cover the effective pixel area of the chip 6. As a result, there is a drawback that a shadow is generated at an end portion of the video signal output screen. In addition, when the cap glass 2 is set in the ceramic package 5, if the cap glass 2 comes into contact with the resin ceramic package 5 having low strength, the cap glass 2 comes off and becomes dust, and if it adheres to the chip 6, there is a problem that it becomes black. .

【0004】[0004]

【課題を解決するための手段】本発明の固体撮像素子
は、パッケージのチップ取り付け部分とキャップガラス
接着部の間にキャップガラス接着部より高さが高い突起
部を設けることを特徴としている。また、キャップガラ
スの最外周部分を下方向へ突出させ、その突出部をパッ
ケージの突起部の外側のキャップガス接着部に接着する
ことを特徴としている。
The solid-state imaging device according to the present invention is characterized in that a projection having a height higher than that of the cap glass bonding portion is provided between the chip mounting portion of the package and the cap glass bonding portion. Further, the outermost peripheral portion of the cap glass is projected downward, and the projected portion is bonded to the cap gas bonding portion outside the projected portion of the package.

【0005】[0005]

【実施例】次に本発明について図面を参照して説明す
る。図1は、本発明の一実施例の固体撮像素子のキャッ
プガラス接着部付近の断面図である。パッケージの最外
周部のキャップガラス接着部4とセラミックパッケージ
5の中央のチップ6との間に突起部1が設けてあり、突
起部1とキャップガラス接着部4との間には溝7が構成
されている。キャップガラス2を接着するとき、まず、
キャップガラス2を突起部1の上にのせ、高温状態にし
て接着樹脂3を溶かす。接着樹脂3はキャップガラス2
の裏面をパッケージの内側方向に広がるが、突起部1が
障害となるため、突起部1とキャップガラス2との境界
部分を封止する形で止まり、チップ6上まで広がること
はできない。したがって、接着樹脂の影による画面の端
の欠を陥を防止することができる。またこの突起部1を
設けたことにより、接着樹脂のはがれによって発生した
ゴミが、チップ6上へ移動するのを防ぐことができる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional view of the vicinity of a cap glass bonding portion of a solid-state imaging device according to an embodiment of the present invention. The protrusion 1 is provided between the cap glass bonding portion 4 at the outermost periphery of the package and the chip 6 at the center of the ceramic package 5, and the groove 7 is formed between the protrusion 1 and the cap glass bonding portion 4. Have been. When bonding the cap glass 2, first,
The cap glass 2 is placed on the projection 1, and is brought to a high temperature state to melt the adhesive resin 3. Adhesive resin 3 is cap glass 2
Is spread inwardly of the package, but the protrusion 1 becomes an obstacle. Therefore, the protrusion stops at the sealing portion of the boundary between the protrusion 1 and the cap glass 2 and cannot spread over the chip 6. Therefore, it is possible to prevent the edge of the screen from being broken due to the shadow of the adhesive resin. In addition, the provision of the projections 1 prevents dust generated due to peeling of the adhesive resin from moving onto the chip 6.

【0006】図2は参考例の固体撮像素子の接着付近の
断面図である。キャップガラス2の突起部1との接触面
より外側に、突起部1との間を形成するように、下方向
への突起部8を設けている。このとき突起部1の高さは
キャップガラスの突起部8の高さより高くなっている。
キャップガラス2を接着するとき、接着樹脂3は、突起
部1の根元と、キャップガラスの突起部8とを封止する
形で止まりセラミックパッケージ5の内部に固着したチ
ップ6上まで広がることができない。したがって接着樹
脂3の影による画面の端の欠陥を防止することができ
る。またこの参考例ではキャップガラス2をセットした
後のキャップガラス2のずれが、突起部1とキャップガ
ラスの突起部7によって制限されるため、キャップガラ
ス2が大きくずれることがなくなりキャップガラス2の
セットが容易になる。
FIG. 2 is a sectional view of the vicinity of the solid-state image sensor of the reference example in the vicinity of adhesion. On the outer side of the contact surface of the cap glass 2 with the projection 1, a downward projection 8 is provided so as to form a space between the projection 1 and the cap 8. At this time, the height of the projection 1 is higher than the height of the projection 8 of the cap glass.
When bonding the cap glass 2, the adhesive resin 3 stops in a form that seals the base of the protrusion 1 and the protrusion 8 of the cap glass, and cannot spread onto the chip 6 fixed inside the ceramic package 5. . Therefore, it is possible to prevent the edge of the screen from being defective due to the shadow of the adhesive resin 3. The displacement of the cap glass 2 After setting the key Yappugarasu 2 in this reference example, since it is limited by the protrusions 1 and the cap glass protrusions 7, a set of cap glass 2 prevents the cap glass 2 large shift Becomes easier.

【0007】[0007]

【発明の効果】以上説明したように、本発明は固体撮像
素子のパッケージのチップの取り付け部分とキャップガ
ラス接着部との間にキャップガラス接着部に比べて高さ
が高い突起部を設け、キャップガラス接着時に接着樹脂
がパッケージ内部に広がってチップの有効画素を覆うの
を防ぐ構造としたので、画面出力の端の欠陥を防止する
という効果がある。また、キャップガラスの最外周部分
に、下方向への突起部を設けたので、パッケージの突起
部の高さを高く取れ、接着樹脂のパッケージ内部への侵
入がさらに困難となる。またキャップガラスのずれがキ
ャップガラスの突起部とパッケージの突起部によって制
限されるためキャップガラスが大きくずれることがなく
なり、キャップガラスのセットが容易になる。
As described above, according to the present invention, a projection having a height higher than that of the cap glass bonding portion is provided between the chip mounting portion of the package of the solid-state imaging device and the cap glass bonding portion. Since the structure is such that the adhesive resin does not spread inside the package during glass bonding and covers the effective pixels of the chip, there is an effect of preventing defects at the edges of the screen output. In addition, since a downwardly projecting portion is provided on the outermost peripheral portion of the cap glass, the height of the projecting portion of the package can be increased, making it more difficult for the adhesive resin to enter the inside of the package. In addition, since the displacement of the cap glass is limited by the protrusion of the cap glass and the protrusion of the package, the cap glass does not largely shift, and the setting of the cap glass is facilitated.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例の固体撮像素子のキャップガ
ラス接着部付近の断面図。
FIG. 1 is a sectional view showing the vicinity of a cap glass bonding portion of a solid-state imaging device according to an embodiment of the present invention.

【図2】本発明の参考例の固体撮像素子のキャップガラ
ス接着部付近の断面図。
FIG. 2 is a cross-sectional view of the vicinity of a cap glass bonding portion of the solid-state imaging device according to the reference example of the present invention.

【図3】従来の固体撮像素子のキャップガラス接着部付
近の断面図。
FIG. 3 is a cross-sectional view showing the vicinity of a cap glass bonding portion of a conventional solid-state imaging device.

【符号の説明】[Explanation of symbols]

1 パッケージの突起部 2 キャップガラス 3 接着樹脂 4 キャップガラス接着部 5 パッケージ 6 チップ 7 溝 8 キャップガラスの突起部 DESCRIPTION OF SYMBOLS 1 Package protrusion 2 Cap glass 3 Adhesive resin 4 Cap glass adhesion part 5 Package 6 Chip 7 Groove 8 Cap glass protrusion

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H01L 27/14 H01L 23/02 ──────────────────────────────────────────────────続 き Continued on front page (58) Field surveyed (Int.Cl. 7 , DB name) H01L 27/14 H01L 23/02

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 セラミックパッケージ中央部に固体撮
像素子チップを固着し、前記セラミックパッケージ上部
にキャップガラスを接着して成る固体撮像素子におい
て、前記セラミックパッケージのキャップガラス接着部
と、前記セラミックパッケージのチップの取り付け部分
との間に、前記キャップガラス接着部より高さが高い突
起部を設け、前記突起部と前記キャップガラス接着部と
の間に溝を設けたことを特徴とする固体撮像素子。
1. A solid-state image pickup device comprising a solid-state image pickup device chip fixed to a center portion of a ceramic package and a cap glass bonded to an upper portion of the ceramic package, wherein a cap glass adhesion portion of the ceramic package and a chip of the ceramic package are provided. Between the mounting portion of the cap glass adhesive portion is provided with a projection higher than the cap glass adhesive portion , the projection portion and the cap glass adhesive portion
A solid-state imaging device , wherein a groove is provided between them .
JP03110076A 1991-05-15 1991-05-15 Solid-state imaging device Expired - Fee Related JP3074773B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03110076A JP3074773B2 (en) 1991-05-15 1991-05-15 Solid-state imaging device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03110076A JP3074773B2 (en) 1991-05-15 1991-05-15 Solid-state imaging device

Publications (2)

Publication Number Publication Date
JPH04337668A JPH04337668A (en) 1992-11-25
JP3074773B2 true JP3074773B2 (en) 2000-08-07

Family

ID=14526429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03110076A Expired - Fee Related JP3074773B2 (en) 1991-05-15 1991-05-15 Solid-state imaging device

Country Status (1)

Country Link
JP (1) JP3074773B2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4519424B2 (en) 2003-06-26 2010-08-04 ルネサスエレクトロニクス株式会社 Resin mold type semiconductor device
JP3838572B2 (en) 2003-09-03 2006-10-25 松下電器産業株式会社 Solid-state imaging device and manufacturing method thereof
JP5155352B2 (en) 2010-03-25 2013-03-06 日本電波工業株式会社 Piezoelectric device
JP5134045B2 (en) * 2010-06-23 2013-01-30 日本電波工業株式会社 Piezoelectric device and manufacturing method thereof
JP5982972B2 (en) * 2012-04-10 2016-08-31 日本電気株式会社 Vacuum package, sensor, and manufacturing method of vacuum package
JP5185459B2 (en) * 2012-07-12 2013-04-17 シャープ株式会社 Electronic element and electronic information device
WO2017061296A1 (en) * 2015-10-09 2017-04-13 ソニー株式会社 Solid-state imaging element package, manufacturing method therefor, and electronic device
FR3065318B1 (en) * 2017-04-18 2021-09-10 E2V Semiconductors HERMETIC ELECTRONIC COMPONENT BOX, ESPECIALLY FOR IMAGE SENSOR

Also Published As

Publication number Publication date
JPH04337668A (en) 1992-11-25

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