JP2970816B2 - Ultrasonic measuring device - Google Patents

Description

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ultrasonic measuring device, and more particularly, to an ultrasonic flaw detector having a function of displaying an A-scope waveform in an image. The present invention relates to an ultrasonic measuring device capable of analyzing the ultrasonic wave.

[Related Art] In general, many small ultrasonic flaw detectors having a liquid crystal display device (hereinafter referred to as an LCD display device), a built-in microprocessor, and a graphic display function have a function of displaying an A-scope waveform as an image. . In this type of apparatus, a key for setting a position at which an ultrasonic measurement is started with respect to a subject and a key for determining a measurement range are provided on an operation panel. A target area is selected and measurement is performed, and an A-scope image as a result of the flaw detection can be sequentially selected and displayed according to a preset display range of the screen.

Also, in this type of ultrasonic flaw detector, an echo reception signal (RF signal) or a video signal obtained by detecting the signal is A / D-converted at a predetermined sampling cycle, temporarily stored in a waveform data memory, and the measured data is read out. , The data is expanded into display data. In this case, the measurement data obtained corresponding to each sampling is sequentially stored as a digital value corresponding to each address of the waveform data memory. At this time, these measurement data are stored as a function of time in units of the sampling period of the A / D conversion circuit. Therefore,
By taking out the measurement data as a function of this time and displaying the waveform in accordance with that time, it is possible to know the path of the echo reception signal (time value from the time of occurrence of a surface echo or a transmission pulse).

However, this type of device does not have a function of analyzing the ultrasonic wave itself. In conventional ultrasonic waveform analyzers, it is necessary to insert an FFT (Fast Fourier Transform) board or the like into an ultrasonic flaw detector and perform Fourier analysis on echo reception signals obtained from a probe or the like to grasp the characteristics of the waveform. Is being done. This is to analyze the characteristics of the waveform of the ultrasonic echo according to the launch waveform of the probe and the state of the defect by frequency analysis, and not to analyze the relationship between the ultrasonic wave and the material or shape of the subject. Absent.

[Problem to be solved] When the use of ultrasonic waves has penetrated many fields as one of the nondestructive inspections, inspection of defects, grasp of cross-sectional state, and thickness, which have been performed by conventional ultrasonic measurement, have been performed. There are objects and measurement conditions that cannot be covered only by the measurement technology, and a more advanced ultrasonic measurement technology is required.

In order to respond to such demands, the physical causal relationship between the frequency and launch waveform of ultrasonic waves and the material and shape of the subject, which had not been a problem in the past, must be clarified and individualized according to the measurement target. It is necessary to establish appropriate measurement conditions.

The present invention addresses such a need,
It is an object of the present invention to provide an ultrasonic measurement apparatus that analyzes measurement conditions according to the material and shape of a subject and easily performs ultrasonic measurement under conditions corresponding to the subject.

[Means for Solving the Problems] The ultrasonic measuring apparatus according to the present invention for achieving the above object is characterized by an attenuator that attenuates the launch waveform of a transmission pulse applied to an ultrasonic probe, An A / D conversion circuit that samples the output waveform and the echo reception signal reduced to about the level of the echo reception signal by the attenuator at a predetermined cycle and performs A / D conversion, and the A / D conversion circuit
A data memory for sequentially storing the / D-converted measurement data, and assigning each pixel in one direction corresponding to the time relationship of the measurement data in units of a cycle, and assigning each of the pixels in one direction based on the measurement data for the launch waveform and the echo reception signal. Display data generating means for generating display data with a waveform, and display means for displaying a launch waveform and a waveform of an echo reception signal on a display screen in accordance with display data of the launch waveform and the waveform of the echo reception signal And the display data generation means generates display data in which the launch waveform and the waveform of the echo reception signal have a phase relationship in which the display positions are aligned in the time axis direction on the display screen.

[Operation] As described above, the display data generating means generates display data in which the launch waveform and the waveform of the echo reception signal are in a phase relationship in which the display positions are aligned in the time axis direction on the display screen. The A-scope image display can be performed by simultaneously assigning the pixels in the time axis direction to the waveform of the emitted sound wave and the waveform of the echo reception signal obtained corresponding thereto. As a result, the launch waveform and the echo waveform of the echo reception signal can be observed simultaneously, and the relationship between these waveforms and the physical relationship with the subject can be observed.

Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

FIG. 1 is a block diagram of an ultrasonic flaw detector according to an embodiment to which the present invention is applied, FIG. 2 is an explanatory diagram of a waveform moving / overlapping process, and FIG. FIG. 4 is an explanatory view of a waveform display state of the oscilloscope, and FIG. 5 is an explanatory view of a measurement state of another subject.

In FIG. 1, reference numeral 10 denotes a portable ultrasonic flaw detector, and 1 denotes its flaw detector. This flaw detector unit 1
A pulse signal is sent from the transmission terminal 11 to the probe 16 in response to a control signal from the microprocessor (MPU) 5, an echo reception signal is received from the probe 16 at the reception terminal 12, and the pulse signal is received by the receiver. Amplify,
The signal is output to the A / D conversion circuit 2 as an analog signal. In addition,
The probe 16 is, as shown in FIG.
And the receiving probe 16b. In the figure, reference numeral 17 denotes a subject, 18 denotes a pulsar incorporated in the ultrasonic flaw detector 1, and 19 denotes a receiver.

1a is an attenuator whose attenuation rate is set by the MPU 5 and operates in accordance with the gate signal to attenuate the ejection pulse waveform and send it to the A / D conversion circuit 2. Also, 1b
Is an oscilloscope of two phenomena, the output of the receiver of the ultrasonic flaw detection unit 1 (here, RF signal and video signal are also acceptable)
The output of Atsuteneta 1a (RF signal here, also acceptable video signal) as shown in FIG. 4 receives a respective displays the transmitted pulse T, the launch pulse waveform Ta, the echo reception signal B _1.

The A / D conversion circuit 2 converts an echo reception signal (RF signal or video signal) for a surface reflected wave, a defective reflected wave, a bottom surface reflected wave, and the like obtained from the flaw detector 1 in response to a control signal from the MPU 5, for example. Sampling is performed at a high frequency of about 20 MHz, these analog outputs are converted into digital values, and are sequentially transmitted to the waveform data memory 3.

The waveform data memory 3 has a storage capacity for storing a predetermined number of measurement data which is n times (n is an integer of 2 or more) or more, for example, about 4000 points, of the number of measurement data displayed on the display screen. The data sampled by the A / D conversion circuit 2 is stored while sequentially updating (incrementing) its address. Then, when the number of data sampled by the A / D conversion circuit 2 is stored up to a predetermined final address, a sampling end signal is sent to the MPU 5.

As a result, the waveform data memory 3 stores at least twice the number of measurement data displayed as an image (for example,
If the number of points is 200, the measured data of a predetermined sampling number of 4,000 points (20 times) is sequentially stored as a digital value corresponding to each address. At this time, the measurement data of each address is
It is stored as a function of time in units of the sampling period of the A / D conversion circuit 2.

Upon receiving the sampling end signal from the waveform data memory 3, the MPU 5 stops the sampling process of the A / D conversion circuit 2, collects the measurement data from the waveform data memory 3 via the bus 13, and displays the display data of the A scope image. Generate. The generated display data is stored in an image memory area of the RAM 6 (an image memory unit 61 described later), and is stored in an LCD display device (LC
D) An A-scope image corresponding to the display data transferred to 8 and generated by the LCD display device 8 is displayed.

An operation panel 4 has a gain dial, a cursor dial, a display position designation knob, a sheet key, and the like, and is connected to the bus 13. The MPU 5 receives a set value set by a dial and various key input signals from this circuit via the bus 13. When the gain setting value (adjustment value) for the flaw detector 1 is input by the gain dial,
The MPU 5 controls the gain (amplification factor) of the receiver (its high-frequency amplifier) of the flaw detector 1, and sets the gain of the receiver so as to be a gain corresponding to the gain setting value input by the gain dial.

Reference numeral 6 denotes a RAM, which is connected to the bus 13 and displays digital display data of the A / D-converted echo reception signal, various application processing programs loaded from the outside, and a flaw detection mode designated by an input key. Various information such as a flag to be shown and various data are stored. The RAM 6 is provided with an image memory unit 61 for bit-expanding and storing image display data, a storage condition parameter storage region 62 for determining conditions for obtaining data from the waveform data memory 3, and a cut-out data storage region 63. ing.

Reference numeral 7 denotes a ROM, which includes an A-scope image calculation processing program 71 executed by the MPU 5, a measurement data collection condition setting program 72, a display processing program 73, a waveform moving / overlapping processing program 74, and calculation of comparison values between waveforms. program
75, and various basic programs are stored. LC
The D display device 8 displays, in addition to an A-scope image, various measured values, a video memory interface and a video memory therein, a video memory controller that reads out information of the video memory and generates a video signal, a liquid crystal driving circuit, It has a liquid crystal display of a dot matrix of 128 × 256 dots or the like, for example, and is connected to the bus 13 via a video memory interface.

Here, the A-scope image calculation processing program 71 is started by the MPU 5 which has received the end of measurement data collection from the waveform data memory 3 at the start of measurement. Further, the program accesses the address of the waveform data memory 3 in accordance with the conditions stored in the data acquisition condition storage area 62 to generate display data, and stores the display data in the image memory unit 61. After that, the display processing program 72 is started.

The information stored in the storage area 62, such as the sampling condition parameters, includes the start address and the last address from which the measurement data in the waveform data memory 3 is read, and the measurement data in the waveform data memory 3 stored at addresses therebetween. The conditions for the order in which data are collected, such as whether data should be collected every few addresses, how many average values should be taken from the collected data and used as display data, and the highest value among multiple measurement data is displayed Parameter information such as whether to use data is stored.

The measurement data collection condition setting program 72 generates various information to be stored in the storage region 62 such as a collection condition parameter and the above-described parameters according to the conditions input from the operation panel 4 and stores them in the storage region 62 such as the collection condition parameter. Is performed. This program uses the operation panel 4
In response to an input of a predetermined function key such as a zoom function key that indicates the measurement range or waveform enlargement or reduction of the waveform, the MPU 5 is activated by an interrupt process.

The measurement data acquisition condition setting program 72 sets the measurement data stored in the waveform data memory 3 on the basis of the total number of display pixels on the side (time axis) for displaying the path of the A-scope image on the display screen of the LCD display device 8. Determine the number of measurement data to be collected. For example, LC that is a display corresponding to the route
The number of display data pixels in the horizontal direction of the D display device 8 is a maximum of 256 pixels in the above example, but if 200 pixels are assigned as the path display, 200 pixels from the waveform data memory 3 There are 200 measurement data collected as display data. Note that if two pixels are assigned to one measurement data, half of the number may be 100.

Therefore, the following description is made on the assumption that the number of data collected from the waveform data memory 3 is 200. The measurement data collection condition setting program 72 calculates and generates a parameter indicating what 200 pieces of measurement data are to be collected from the waveform data memory 3.

That is, the 200 data items specified by the measurement data collection condition setting program 72 are determined from the display start position and display end position data input from the operation panel 4 and the collection conditions. The measurement data collection condition setting program 72
First, the addresses of the waveform data memory 3 corresponding to the display start position and the display end position are determined, and when these addresses and the number of measurement data between them are 200 or more, m = M According to the numerical value m determined by / 200, for example, when m = 3, or 2.5
When ≦ m <3.5, a parameter for collecting data every third data is generated. Such parameters are stored in the sampling condition parameter etc. storage area 62 together with the addresses of the display start position and the display end position determined above. When an average value is specified as a sampling condition, a parameter is set such that every third measurement data is treated as a group and the average value is calculated. When the maximum value is collected, a parameter for selecting the maximum value in the group is set.

When the total number of measurement data between the display start position and the display end position, including the display start position and the display end position, is 200 or less, only a parameter for sequentially accessing the measurement data is generated.

In this manner, for example, if there are 800 points of data designated as the measurement image from the display start position to the display end position of the display image, 200 points are collected by collecting measurement data every four points. Measurement data can be selected. A
The scope image calculation processing program 71 generates parameters for such selection by this program. As a result, in accordance with this parameter, the A-scope image calculation processing program 71 determines that the number of pixels on the road side of the display screen is 20
Zero data is collected from the waveform data memory 3.

Here, the display start position and the display end position are usually set by time values. This time value is stored in the waveform data memory 3
Corresponds to the time until each measurement data is collected on the basis of the measurement start time (for example, the reception time of the surface echo, the reception time of the transmission pulse, or the gate setting time). This is determined using the sampling cycle of the A / D conversion circuit 2 as a unit, and when the sampling cycle is T, it is given by T × the number of measured data stored in the waveform data memory (the number of addresses). For example, 1
Assuming that one measurement data is stored in the address, the first sampling is performed after T time from the start time, and the measurement data is sequentially stored from the zero address,
The address value +1 storing the measured data is the number of stored measured data. By multiplying this number by the sampling period T, it is possible to obtain the time until the data collection time of each measurement data (this is the time position to be displayed simultaneously). Conversely, the address value of the waveform data memory can be calculated from the designated time. If the start time coincides with the first sampling time, the address value is equal to the measured data storage number.

By the way, the measurement data collection condition setting program 72 performs a process of starting the measurement when the measurement start key is input after setting the above parameters. When a zoom function key, which will be described later, is being input, the A-scope image calculation processing program 71 is started.
When the measurement start key is input and the measurement start process is performed,
The flaw detector 1 is activated to perform ultrasonic flaw detection. When the flaw detector 1 is activated, an echo reception signal (flaw detection waveform) of the subject (test material) obtained in response to the transmission pulse signal sent from the flaw detector 1 is stored in the waveform data memory 3 as a digital value. Are sequentially stored in the form. Then, after the waveform data memory 3 sends a measurement data collection end signal to the MPU 5, the MPU 5 activates the A-scope image calculation processing program 71.

The MPU 5 accesses the waveform data memory 3 by referring to the storage area 62 such as the sampling condition parameters according to the A-scope image calculation processing program 71 and stores from the address corresponding to the designated display start position to the address of the display end position. The obtained measurement data is read out, 200 pieces of display data are generated and stored in the image memory unit 61. After that, the display processing program 73 is started. As a result, an image according to the display data is displayed on the screen of the LCD display device 8.

The waveform moving and overlapping processing program 74 is started in response to the block setting function key, and the MPU 5 sets a rectangular frame (block) for the waveform displayed on the screen. And
In response to the input of the movement function key, the waveform data in the range of the specified block of the video displayed on the LCD display device 8 is written to a predetermined area of the RAM 6, and the display data is designated together with the block with the display position designation knob. A process of overwriting the address of the image memory unit 61 corresponding to the position of the display coordinate to be performed is performed.

The comparison value calculation program 75 between waveforms measures a level difference between waveforms at a position designated by a cursor when a key for performing waveform comparison in a waveform superimposed state, for example, a level comparison key is pressed and a level comparison is performed. To display. In addition, various functions, such as a waveform inclination state and a time difference, can be added thereto to compare the waveform differences.

FIGS. 2 (a), (b) and (c) are explanatory diagrams of the waveform shift superposition processing program 74, the comparison value calculation program 75 between waveforms, and the processing method.

When collecting the launch pulse waveform Ta and echo reception signal B ₁ by a gate 21, 22 relative to the transmission time of the transmitted pulse T to the display waveform of Oshirokopu 1b shown in FIG. 4, the waveform data memory 3, A waveform as shown in FIG. 2A is stored and displayed on the screen. However, the waveform of the ejection pulse Ta obtained from the attenuator 1a is collected by setting the gate 21 slightly before (Δt) before the generation of the transmission pulse T, and is stored in the waveform data memory 3. Further, the received echo signal waveform B ₁ represents, is taken in a range of the pulse width T ₂ after being subjected to a delay time T ₁ constant from the transmitted pulse T by the gate 22. And the time difference Tg between these gates 21 and 22
Are stored in the RAM 6.

Waveform movement superimposed processing program 74 sets a block 20 for a range of the waveform data to be switching-clad, stores the coordinate value of the time axis of the waveform data entered into this block 20 (in block 20 T ₃ and T ₄₎ in RAM6 . Then, the image memory unit 61
Then, the display data in the block is extracted and stored in the cut-out data storage area 63 of the RAM 6. Further, the display data in the cut-out data storage area 63 is overwritten on the image memory unit 61 such that the original waveform display data is cleared and the left vertical line of the block 20 is located at the coordinates specified by the display position specifying knob.

As a result, on the screen of the LCD display device 8, the waveform in the block 20 moves and is displayed according to the display position designation knob. As a result, one waveform can be displayed over the other waveform. When a zoom function key described later is pressed, the stored coordinate values (in block 20,
From T ₃ and T ₄ ), display data on the moving block side is newly generated at the magnification specified by the zoom function, and it is stored in the cut-out data storage area 63 at the same magnification as the displayed waveform. The waveform of the moving block is displayed superimposed on the moving position.

When the waveform movement superposition processing program 74 is executed, the MPU5
Is first on the screen can be set block to one of the launch pulse waveform Ta or echo received waveform B _1. Therefore, here is set the block 20 to the echo received waveform B _1. Next, the MPU 5 moves the display position of the block according to the operation amount of the display position designation knob. Thus in eventually drawing by moving (b), moved an echo received waveform B ₁ launch and pulse Ta is the respective waveforms are combined heavy. When a key for calculating various waveform differences is pressed at the time when the overlapping is performed, the comparison value calculation program 75 between the waveforms is started, and the MPU 5 calculates the waveform difference data to be calculated by executing the program. Display on the screen.

Next, the overall operation will be described with reference to FIG. 3. First, in a step, a function key of the flaw detection mode is input from the operation panel 4 to set the apparatus to the flaw detection mode.

In the next step, receiving this input information
Is started and the MPU 5 executes it, the gain of the receiver of the flaw detector 1 is set by the gain dial on the operation panel 4, and the attenuation condition of the attenuator 1a is input. Further, the measurement conditions, the maximum measurement range stored in the waveform data memory 3 and the like are input from the operator (measurer) by the keys on the operation panel 4.
As a result, the MPU 5 operates according to the input information and the processing program stored in the ROM 7, and under the control of the MPU 5, the gain of the flaw detector 1 is set according to the gain dial, and the flaw detection function of the apparatus itself is generated.

In the next step, a function key for setting a display range is input, whereby a display start position and a display end position of a waveform displayed by the LCD display device 8 and conditions for collecting measurement data are input. By inputting the execution key after this input, in the next step, the measurement data collection condition setting program 72 is started, and the above-described various parameters are generated and stored in the storage area 62 such as the collection condition parameter. At first, key input is waited for here, a measurement start key is input, and the process proceeds to a step.

It should be noted that various parameters are generated according to the input conditions also when a zoom function key is input in a step described later. This is also stored separately in the storage area 62 such as the sampling condition parameters.

Check that the measurement start key has been entered in the next step
It is determined whether the zoom function key has been input or a key other than these has been input. Here, when the measurement start key has already been input, the process proceeds to step. When the zoom function key is input, the process proceeds to a step. If any other key is input, the process proceeds to a process corresponding to the function key.

When the measurement key is input, the measurement is started in step, the flaw detector 1 is activated, a transmission pulse is generated from the flaw detector 1, and the measurement data is collected in the waveform data memory 3. Therefore, in the next step, the process enters a wait loop for waiting for the end of measurement data collection.

When a predetermined amount of measurement data is stored are taken in accordance with the gate 21 (see FIG. 4) in the waveform data memory 3 for launch pulse waveform Ta and echo receive signals B _1, MPU 5 is collected data ends Signal is stored in waveform data memory 3
Receive from Here, moving to the step, MPU5
The scope image calculation processing program 71 is activated to generate display image data from the display start position to the display end position input in the step, and to store 200 display data in the image memory unit 61.

In the next step, the MPU 5 activates the display processing program 73, transfers the display data of the image memory unit 61 to the LCD display device 8, and displays, for example, an image as shown in FIG. Do the processing.

Next, in a step, the MPU 5 determines whether or not to end the measurement, and returns to the step through the step when the function key for zooming is input without inputting the key for terminating the measurement. When a key other than the above is input, the process proceeds to a step. If a measurement key is input as a key other than the above at this time, the process returns to the step through the step, and another measurement data is displayed again through the steps 1 to 6.

In the step, it is determined whether or not the input function key is a block setting key, and if it is any other key, in the step, it is determined whether or not the above-mentioned measurement key or the like is used.

When block setting key is pressed, two points on a diagonal line is designated by the cursor in step, blocked for echo reception waveform B ₁ shown in FIG. 2 (a) 20
Is drawn. Then, in a step, the MPU 5 stores the time values T ₃ and T ₄ shown in FIG.
To memorize. In the next step, when the movement function key wait loop is entered and the movement function key is input,
The step 74 starts the waveform movement superposition processing program 74, and the MPU 5 transfers the display data of the block 20 to the cut-out data storage area 63 and stores it, and moves the screen in accordance with the operation of the display position designation knob on the operation panel 4. A process of moving a designated block to the upper position and performing display is performed. Then, the process returns to the step. At this time, the block can be moved on the displayed screen.
Then, the movement of the waveform and the superposition operation are performed. At this time, if the size of the displayed waveform is not sufficient,
A zoom function key is input from the operation panel 4. The processing shifts to the step by this key input interruption, and the same judgment is performed again.

When the zoom function key is input, the process moves from step to step. In the step, a process of interactively inputting the time value (path value) between the display start position and the display end position on the display screen is performed. After this input, return to the step.

Since the zoom function key has already been pressed, the processing from the step shifts to the step via the steps,. Here, the waveform display is performed on the measurement data in the waveform data memory 3 which has already been collected, under the conditions of the display start position and the display end position newly set in the step. FIG. 2 (b) shows the waveform of the partial enlargement thus displayed. At this time, the tension display data that has been moved by the previous block is also enlarged and displayed in the same magnification time relationship.

When the zoom function key is pressed, the A-scope image calculation processing program 71 does not delete the display start position and display end position of the first waveform input in the step and the conditions for collecting the measurement data. Then, display data is generated by selecting the measurement data according to the condition newly input on the screen. When the zoom display key reaches the step and the zoom function key is released at the step, the next step is passed to the next step, and the display start position and the display end position of the first waveform are displayed. An image is displayed through steps according to the conditions of data collection, and the original waveform is displayed.

At this point, the figure block is moved in the measured state first, then moved to a position where it can be displayed in the zoom state, and then shifted to the zoom display. Eventually, the launch pulse waveform Ta as shown in FIG. 5 (b) and echo reception waveform B ₁ is overlaid. When a predetermined comparison key is depressed in this state, it is determined whether or not the key is a comparison key in step a through step and step. When it is the comparison key, the MPU 5 activates the comparison value calculation program 75. As a result, various waveform comparison values are calculated in step a,
It is displayed on the screen, returns to the step, and waits for a function key input.

The above is the case where the waveform overlap processing is performed by enlarging and displaying a part of the waveform using the zoom function key. However, the waveform does not necessarily need to be enlarged.

By the way, in the above example, the two waveforms are overlapped on the same time axis, but according to the image of the oscilloscope 1b,
As shown in FIG. 11C, two time axes are set vertically in parallel on the display screen, and two waveforms are displayed on the respective time axes, and the positions of the upper and lower waveforms are aligned. 2
Needless to say, the time may be measured by adjusting the phases of the two waveforms. This simply requires changing the manner of display on the display screen, and the processing may be substantially the same as in the case of overlapping.

Here, if a large interval is provided between the values of the start position and the end position in the step by pressing the zoom function key, a reduced screen can be further displayed as shown in FIG.
It is possible to observe echo reception signals at distant positions on the same screen. Then, a block can be set from this display state to start moving the waveform.

When it is desired to continue the measurement process, the user presses the measurement start key in the step, and new measurement data is collected in the waveform data memory 3 through the steps from the step under the first input condition. Based on that, new display data is generated in steps and a new image is obtained.

As described above, the method of specifying the display start position and the display end position in the embodiment is an example, and the present invention is not limited to the case where these are specified on the screen. In addition, as the selection condition of the measurement data, one of the display start position and the display end position and the display start position and the display end position can be designated as a range therefrom.

In the embodiment, the waveform data memory includes an A / D conversion circuit and an MPU.
However, if the processing speed of the MPU is high, the data of the A / D conversion circuit should be received once by the MPU and transferred to the waveform data memory to collect the measurement data. Can also.

Further, in the embodiment, one pixel on the side corresponding to the path is displayed corresponding to the time corresponding to one measurement data, but it is needless to say that n pixels may be displayed corresponding to one measurement data. is there.

In the embodiment, the number of measurement data is one digit or more larger than the number of display data. However, the present invention can be applied even when the number of measurement data is equal to or smaller than the number of display data. In such a case, the time between the waveforms can be measured simply by moving the waveform displayed on the screen and performing the overlapping process without using the Smooth function.

By the way, when the measurement data is collected in the waveform data memory with a short cycle and high-resolution sampling, for example, when sampling is performed at about 1 ns to several ns, it is ten times or more, for example, about several tens to 50 ns. Clock from 1 ns to several n for each measurement
1 ns by an equivalent sampling method that delays about s and repeats measurement several tens to about 50 times
Needless to say, sampling of about several ns may be performed.

[Effects of the Invention] As can be understood from the above description, in the present invention, the display data in which the launch waveform and the waveform of the echo reception signal have a phase relationship in which the display positions are aligned in the time axis direction on the display screen. Is generated by the display data generating means, so that the A-scope image is displayed by simultaneously assigning pixels in the time axis direction to the waveform of the pulse of the ultrasonic wave emitted from the probe and the waveform of the echo reception signal obtained corresponding thereto. be able to. As a result, the launch pulse waveform and the echo waveform of the echo reception signal can be simultaneously observed, and the relationship between these waveforms and the physical relationship with the subject can be observed.

[Brief description of the drawings]

FIG. 1 is a block diagram of an ultrasonic flaw detector according to an embodiment to which the present invention is applied, FIG. 2 is an explanatory diagram of a waveform moving and overlapping process, FIG. Fig. 4 shows the waveform display state of the oscilloscope.
FIG. 5 is an explanatory diagram of a measurement state of another subject. 1. Ultrasonic flaw detector, 2. A / D conversion circuit, 3. Waveform data memory, 4. Operation panel, 5. Microprocessor (MPU), 6. RAM, 10. Portable type Ultrasonic flaw detector, 61 ... Display graph data storage area, 62 ... Image memory unit, 8 ... Liquid crystal display (LCD display), 71 ... A scope image calculation processing program, 72 ... Measurement data collection Condition setting program 73 Display processing program 74 Waveform moving and overlapping processing program 75 Comparison value calculation program between waveforms

──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Nobuo Takeda 2-2-2 Daimoncho, Higashikurume-shi, Tokyo (72) Inventor Manabu Engaku 22-10, Kamiyamacho, Shibuya-ku, Tokyo (72) Inventor Junichi Kajiwara Ibaraki 650, Tsuchiura-cho, Tsuchiura-shi, Hitachi Inside the Tsuchiura Plant, Hitachi Construction Machinery Co., Ltd. (72) Inventor Yukio Ogura 650, Kandate-cho, Tsuchiura-shi, Ibaraki Prefecture Inside the Tsuchiura Plant, Hitachi Construction Machinery Co., Ltd. No. 650, Hitachi Construction Machinery Co., Ltd. Tsuchiura Works (56) References JP-A-63-150664 (JP, A) JP-A-1-13665 (JP, A) JP-A-63-95353 (JP, A) 1979-570764 (JP, A) (58) Fields investigated (Int. Cl. ⁶ , DB name) G01N 29/00-29/28

Claims (4)

(57) [Claims] 1. An ultrasonic measuring apparatus which displays an A-scope image of an echo reception signal obtained by ultrasonic flaw detection as a function of time by allocating each pixel in one direction on a display screen of a display device in a time axis direction, An attenuator for attenuating the launch waveform of the transmission pulse applied to the ultrasonic probe, and the launch waveform and the echo reception signal reduced to about the level of the echo reception signal by the attenuator at a predetermined period. A / D conversion circuit for sampling and A / D conversion
A data memory for sequentially storing the measurement data A / D-converted by the A / D conversion circuit, and assigning each pixel in the one direction to each of the pixels in accordance with the time relationship of the measurement data in units of the period, and performing the measurement. Display data generating means for generating display data of the launch waveform and the waveform of the echo reception signal based on data, and the display data on the display screen according to the display data of the launch waveform and the waveform of the echo reception signal. Display means for displaying a launch waveform and a waveform of the echo reception signal; display data generation means, wherein the launch waveform and the waveform of the echo reception signal are displayed on the time axis on the display screen. An ultrasonic measurement apparatus for generating display data having a phase relationship in which display positions are aligned in directions. 2. The display data generating means according to claim 1, wherein said display data, wherein said display position is aligned with said display data, is such that said launch waveform and said echo reception signal waveform are superimposed on said display screen. The ultrasonic measurement apparatus according to claim 1, wherein: 3. The display data generating means according to claim 1, wherein said display data has a phase relationship in which said display positions are aligned, and displays said launch waveform and said echo reception signal waveform on two parallel time axes on said display screen. Display data of the launch waveform assigned to one of the two time axes and display data of the waveform of the echo reception signal assigned to the other of the two time axes. 2. The ultrasonic measurement apparatus according to claim 1, wherein display data is generated at a corresponding display position in the time axis direction. 4. The display data generating means generates display data in which one of the launch waveform and the echo received signal waveform moves on a screen in response to an external operation signal. The ultrasonic measuring device according to claim 1 or 2, wherein: