JP2970814B2 - Ultrasonic measurement device sensitivity setting signal generator - Google Patents

Description

Description: FIELD OF THE INVENTION The present invention relates to a sensitivity setting signal generator for an ultrasonic measuring device, and more specifically, to enable simultaneous setting of sensitivity and calibration of an ultrasonic flaw detector. Also, the present invention relates to a sensitivity setting signal generator with a calibration function that can be used as a reference device.

[Prior art] Conventionally, such as calibration of the path of the ultrasonic wave, calibration of the depth and thickness, etc.
The horizontal axis calibration of a so-called ultrasonic flaw detector is performed by flaw detection of an appropriate standard test piece having an accurate thickness or length. The calibration of the measurement range and the time axis is also performed by the standard test piece.

This is because, in an ultrasonic flaw detector, a time generation circuit that gives horizontal axis information to a measured value is generally configured by an analog circuit such as a transistor or an IC, and a temperature drift or the like.
This is because drift phenomena such as drift due to voltage fluctuations occur.In order to measure accurate plate thickness etc., calibrate with a standard test specimen in advance, and fine-tune with a variable resistor if necessary Is required.

Calibration of the abscissa is to generate an accurate time, generally by measuring the time when an ultrasonic wave propagates through a certain thickness of a standard test piece (steel). On the other hand, as the adjustment on the vertical axis side, the sensitivity is set according to the ultrasonic probe (probe) to be used. This adjustment is performed by using a sensitivity standard test piece, and is set so that the defect echo, the bottom surface echo, and the like have a predetermined height on the display.

[Problem to be Solved] In such a sensitivity setting work and a calibration work of the horizontal axis, a probe is applied to a standard test piece, the standard test piece is vertically inspected, and a bottom echo indicating its thickness displayed on a CRT is displayed. This is done by measuring the peak values (its height) of the multiple reflections and the artificial defect echoes and adjusting these values to a predetermined value.

For this reason, portable ultrasonic flaw detectors must go out with heavy standard test specimens for remote measurement.
Inconvenient. In particular, in the case of sensitivity setting, a new measurement must be performed using a standard test piece for each probe used, and adjustment must be performed.
The time required for the peak adjustment is long, and the efficiency of the measurement operation is reduced.

SUMMARY OF THE INVENTION The present invention has been made to solve the problems of the prior art, and has as its object to provide a sensitivity setting signal generator of an ultrasonic measurement apparatus capable of setting sensitivity in a short time without carrying a standard test piece. And

[Means for Solving the Problems] To achieve the above object, a configuration of a sensitivity setting signal generating device of the ultrasonic measuring device according to the first invention is a terminal to which a probe of the ultrasonic measuring device is connected. A connection terminal connected to the, a pulse signal generation circuit that generates a pulse signal that can be regarded as a reception echo signal to the ultrasonic measurement device according to the transmission pulse signal sent from the ultrasonic measurement device to the connection terminal, An amplitude adjustment circuit that receives a signal, converts the signal into a pulse signal having a predetermined amplitude in accordance with the control signal, and outputs the signal to a connection terminal. A setting value is selected from the outside, and a control signal corresponding to the selected setting value is generated. Setting means for setting the amplitude of the pulse signal to a predetermined value corresponding to the selected setting value, storage means for storing the setting value, and means for reading and displaying the setting value stored in the storage means. Have A pulse signal having an amplitude corresponding to the peak value of the received echo signal in the ultrasonic measurement device when the standard test piece is measured is stored in the storage means at the setting value selected when the amplitude adjustment circuit generates the pulse signal. It is something to memorize.

Further, the second invention provides an ultrasonic measuring device according to a connection terminal connected to a terminal to which a probe of the ultrasonic measuring device is connected, and a transmission pulse signal transmitted from the ultrasonic measuring device to the connecting terminal. A pulse signal generation circuit that generates a pulse signal that can be regarded as a reception echo signal, and a pulse signal,
An amplitude adjustment circuit for converting this into a pulse signal of a predetermined amplitude in accordance with the control signal and outputting the pulse signal to a connection terminal, a set value selected from the outside, generating a control signal corresponding to the selected set value, and generating a pulse signal Setting means for setting the amplitude to a predetermined value corresponding to the selected setting value; storage means for storing the amplitude value of the pulse signal or the control value of the control signal; and reading the amplitude value stored in the storage means. The amplitude value is compared with the amplitude value of the pulse signal output from the amplitude adjustment circuit, and the amplitude adjustment circuit is controlled until these comparison results match, or the control value stored in the storage means is read out and the control value is adjusted. A control means for controlling in addition to the circuit, the pulse output from the amplitude adjustment circuit being a peak value corresponding to the peak value of the received echo signal in the ultrasonic measurement device when the standard test piece is measured. It is for storing the amplitude value or the control value at that time of the signal in the storage means.

[Operation] A pulse signal generation circuit that generates a pulse signal corresponding to a received echo signal in the ultrasonic measurement device according to a transmission pulse signal generated from the ultrasonic measurement device as the sensitivity setting signal generation device, And an amplitude adjustment circuit that adjusts the amplitude of the pulse signal that has been adjusted, the amplitude of the pulse signal adjusted by the amplitude adjustment circuit is made to correspond to the echo obtained from the standard test piece, and the adjustment value is stored.
By reading the value, a pulse signal having the same amplitude can be generated anywhere.

As a result, it is possible to set the sensitivity corresponding to the probe anywhere without using the standard test piece, and it becomes unnecessary to carry the standard test piece for ultrasonic flaw detection or the like.

In addition, since the information corresponding to the standard test pieces is stored in the memory, data on a number of standard test pieces can be stored in correspondence with a number of probes. Just by walking, it can be used equally with many standard specimens.

Furthermore, if a calibration function is added to this device that sets the timing of generating pulse signals to the ultrasonic flaw detector to be the same as that of the standard test piece, it will be possible to detect and correct the time axis drift peculiar to analog circuits, It is easy to calibrate the range, and even when measuring a long object or a huge subject, it is not necessary to use a large calibration test piece.

Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

FIG. 1 is a block diagram of an embodiment in which a sensitivity setting signal generating device of an ultrasonic measuring device according to the present invention is applied to a calibration device of an ultrasonic measuring device, and FIG. Explanatory diagram of a specific example of a pseudo echo signal generation circuit,
FIG. 3 is an explanatory diagram of an image displayed on the ultrasonic flaw detector side.

Reference numeral 10 denotes an ultrasonic calibration device which is connected to the probe connection terminal 21a of the ultrasonic inspection device 21, and has a connection terminal 11 for this connection. Then, upon receiving the transmission pulse signal from the ultrasonic flaw detector 21, an ultrasonic reception echo signal similar to that of the standard test piece is generated in a pseudo manner.

Here, 21b is a display of the ultrasonic flaw detector 21, 22 is a probe, and 23 is a standard test piece.

The ultrasonic calibration apparatus 10 includes an attenuator 12 that attenuates a transmission pulse signal to a voltage level suitable for a trigger signal of an electronic circuit, and a time pulse generator that generates a time pulse signal (hereinafter referred to as a clock pulse) every predetermined unit time. The circuit 13 receives the clock pulse and the transmission pulse signal that has dropped to the trigger signal level, opens its gate only for a time set according to the timing of the transmission pulse signal, and sends the clock pulse to the time counting circuit 15. Gate circuit 14
And a time counting circuit 15 for counting clock pulses from the gate circuit 14, an arithmetic processing unit 17 for setting a target count value in the time counting circuit 15, an input device 16 for designating standard test pieces to be used and setting various measurement conditions. A display device 18 for displaying the content of the designated standard test piece and the input measurement conditions, a pseudo echo signal generation circuit 19 for transmitting a pulse signal to the connection terminal 11, and an output pulse voltage measurement circuit 20. Have.

Here, as shown in FIG. 2, the pseudo echo signal generation circuit 19 includes a pulse generation circuit 19a and this pulse generation circuit 19a.
A variable gain amplifier circuit 19b that receives the output pulse and amplifies the pulse signal with a gain set according to the control voltage value of the gain setting device 19c and adjusts the amplitude of the pulse signal (a specific example of the amplitude adjustment circuit of the present invention) And a gain setting device 19c that can externally set the output voltage with a dial or the like. A received echo signal obtained when a standard test piece is measured with a certain probe according to the output from the time counting circuit 15. A pulse signal having the same amplitude and the same generation timing is generated in the variable gain amplifying circuit 19b and transmitted to the ultrasonic measurement device 21 via the connection terminal 11 as if it were a received echo signal (pseudo echo signal) from a standard test piece. Output. Note that the gain of the variable gain amplifier 19b is also controlled by a control signal sent from the arithmetic processing unit 17 described later.

The output pulse voltage measurement circuit 20, as shown in FIG.
Peak detection circuit 20a, A / D conversion circuit 20b, and storage switch 20c
It is started by the pulse output of the time count circuit 15 and peak-holds the voltage value of the output pulse signal of the variable gain amplifier circuit 19b by the peak detection circuit 20a, which is A / D-converted by the A / D conversion circuit 20b. Convert. A / D conversion by A / D conversion circuit 20b
The D-converted peak value is sent to the arithmetic processing unit 17 next.

The arithmetic processing unit 17 receives the "ON / OFF" signal of the externally operated storage switch 20c from the output pulse voltage measuring circuit 20, the A / D conversion data together with the interrupt signal, and sends the gain control signal to the variable gain amplifier circuit 19b. And the amplitude of the output pulse signal is controlled so as to become a target value. Further, a target value of the time to be counted is sent to the time counting circuit 15.

The time counting circuit 15 includes a target value counter 15a, a pulse counter 15b, and a comparator 15c.A target value is set in the target value counter 15a from the arithmetic processing unit 17, and the pulse counter 15b Receives the clock pulse received from the counter, counts it, compares the values of these two counters, detects the coincidence in the comparison circuit section 15c, and outputs a coincidence signal to the pseudo echo signal generation circuit 19 and the output pulse voltage measurement circuit. Send it to 20 as a start signal.

Therefore, when the target value set in the target value counter 15a indicates the time from the generation of the transmission pulse signal to the generation of the reception echo signal, the coincidence detection signal is generated after the time set by the target value from the generation of the transmission pulse signal. Then, the pulse generation circuit 19a is activated, and a pulse signal corresponding to the reception echo signal having the amplitude set by the gain setting device 19 is transmitted from the pseudo echo signal generation circuit 19 to the ultrasonic measurement device 21.

When the coincidence detection signal is generated, the output pulse voltage measurement circuit 20 is also activated, and when the arithmetic processing device 17 receives an interrupt signal from the output pulse voltage measurement circuit 20, the arithmetic processing device 17 The peak value (digital data) of the pulse signal sent to 21 is taken in from the A / D conversion circuit 20b. And at this time, the external operation memory switch
If 20c is "ON", the peak value obtained by the A / D conversion is stored as the reference peak value in the memory corresponding to the used probe (its code).

By the way, the pulse counter 15 of the time counting circuit 15
The value of b is cleared by the coincidence detection output from the comparison circuit section 15c, and starts counting from zero again. Therefore, the next coincidence output is generated at the time of coincidence with the target value set in the target value counter 15a, and a pulse signal corresponding to the next reception echo signal is generated again from the pseudo echo signal generation circuit 19 by this coincidence output. Then, this is transmitted to the ultrasonic measurement device 21 again.

FIG. 3 shows an A-scope image when the probe 22 is connected to the ultrasonic flaw detector 21 and the standard test piece 23 is measured, and an A-scope image when the ultrasonic calibrator 10 is connected. In the figure, T is a transmission wave obtained on the receiving side,
B ₁ , B ₂ , B ₃ ,... Are echo signals received when the standard test piece 23 is measured using the probe 22, D is a display range of the display 21 b, and R is a horizontal axis thereof. Range A
Corresponds to the time when the ultrasonic wave passes through the probe 21, and M corresponds to the time when the ultrasonic wave propagates from the surface of the standard test piece 23 to the bottom or a defect provided on the bottom. .

E ₁ and E ₂ shown by dotted lines are echo waveforms when receiving the pulse signal of the pseudo echo signal generation circuit 19 when the ultrasonic calibration device 10 is connected, respectively.

In the ultrasonic calibration apparatus 10, the pulse signal of the pseudo echo signal generation circuit 19 which is first generated after the gate circuit 14 is opened is the reception echo signal E ₁ (however, the reception echo signal B ₁ corresponding to the first reception echo signal B ₁ in FIG. 3). , the position of the transmission pulse is the position of T indicated by a dotted line), the pulse signal generated second is the received echo signal E ₂ corresponding to the received echo signals B _2. Then, the time value corresponding to M is set as a target value in the target value counting unit 15a from the arithmetic processing unit 17. The predetermined period during which the gate is opened corresponds to the number of reception echo signals generated, and the number of reception echo signals to be generated can be set in this predetermined period. The gate circuit 14 is opened for a certain period of time and then closed and waits for the generation of the next transmission pulse signal. The open period of the gate circuit 14 is set by a signal from the arithmetic processing unit 17.

In this way, if the target value is generated corresponding to the standard test piece 23 specified by the input device 16 and the time is set, the calibration pulse signal is generated at an arbitrary time after the transmission pulse signal is generated. It is generated as a reception echo signal, and the measurement screen of the ultrasonic measurement device 21 is calibrated in response to the reception echo signal.

Here, after adjusting the initial height h of the received echo B ₁ standard specimen 23 in predetermined, legible height ultrasonic flaw detector 21, it is recorded or storing the height.

Then, so as to match the ultrasound calibration device 10 the height of the received echo E ₁ by adjusting the dial of the gain setting unit 19c connected to the terminal 21a in h. Then, the memory switch 20c is set to the “ON” state, the peak of the amplitude of the pulse signal at that time is detected, A / D converted and sent to the arithmetic processing unit 17, and the reference peak value is stored in the memory corresponding to the probe used. To be stored.

Here, the arithmetic unit 17 includes a microprocessor, a memory, an interface, and the like, and inputs information from the input device 16 that specifies a period during which the gate circuit 14 is open, and data that selects between oblique flaw detection and vertical flaw detection. , The data specifying the standard test piece, the identification code (probe number, etc.) of the probe 22 currently used, and the current temperature are received via the interface, and are stored in the memory.

Further, in the state where the ultrasonic calibration device 10 is connected to the ultrasonic inspection device 21, when an instruction for sensitivity setting is given by an input signal from the input device 16, the arithmetic processing device 17 first sets the storage switch 20c to “ The reference peak value stored as "ON" is searched and read from the memory from the identification code of the designated probe. This is, for example, a reference peak value when the standard test piece 23 is measured by the probe 22 described above. Then, the current peak value of the pulse signal output from the ultrasonic calibration device 10 to the ultrasonic inspection device 21 (the pulse signal output from the pseudo echo signal generation circuit 19) is obtained from the A / D conversion circuit 20b, This is compared with the previously read reference peak value, and the gain of the variable gain amplifier circuit 19b is controlled until the current peak value is stored and becomes the reference peak value. Note that the generation timing of the pseudo echo signal at this time does not have to coincide with the timing at the time of calibration of the standard test piece as a fixed constant value. That is, the target value set by the arithmetic processing unit 17 in the time counting circuit 15 does not have to coincide with the time M in FIG.

As a result of this control, the pulse signal output from the pseudo echo signal generation circuit 19 becomes a pseudo echo signal having the same peak value as the echo signal when the standard test piece 23 is measured by the probe 22.

Further, in a state where the ultrasonic calibration device 10 is connected to the ultrasonic inspection device 21, when a calibration instruction is given by an input signal from the input device 16, the arithmetic processing device 17 performs the variable gain of the sensitivity setting instruction. In addition to the control of the amplifier circuit 19b, the setting information for the period during which the gate is open is read from the memory, and a control signal corresponding to the gate time determined by the setting information is sent to the gate circuit. As a result, the gate circuit
14 is set to that value. In addition, the arithmetic processing unit 17 receiving the selection data of the oblique flaw detection or the vertical flaw detection, the data designating the standard test piece, and the current temperature, obtains the oblique flaw detection of the standard test piece at the standard temperature from the table stored in the memory. Alternatively, time information on the flaw detection selected from the vertical flaw detection is searched, the temperature is corrected according to the input temperature, and the pulse count is calculated from the pulse generation cycle of the time pulse generation circuit 13. The value thus calculated is set as a target value (corresponding to the time M in FIG. 3) in the target value counter 15a of the time counting circuit 15.

The input data and time information, and the reference peak value of the pulse signal stored by the storage switch 20c and the corresponding probe identification code of the probe 22 are displayed on the display 18 by the processing of the arithmetic processing unit 17. Is displayed.

In this way, a reception echo signal is generated from the ultrasonic measurement device 21 in response to the transmission pulse signal, and is transmitted to the ultrasonic measurement device 21 where the measurement screen calibration and sensitivity are performed. Settings.

If the time pulse generation circuit 13 is an accurate one such as a crystal oscillator, accurate time measurement can be performed without being affected by the external environment.

Conventionally, calibration and sensitivity setting are performed in comparison with JIS standard test specimens.Since a pseudo signal of the received echo signal can be generated at any time and with any amplitude, the setting time is changed and By comparing the state of the reception echo of the sample, absolute measurement of the sound velocity of the material and the like is also possible.

By the way, in this embodiment, a pseudo echo signal generation circuit
The amplitude of the pulse signal output from 19 is controlled by the control of the arithmetic processing unit 17 so as to match the standard test piece measured by the probe, but the ultrasonic calibration device 10 is connected to the gain setting unit 19c. Adjust the dial to receive echo E ₁
When the height of the variable gain amplifier is made to match the echo height h when the standard test piece is measured, the variable gain amplifier circuit at that time is used.
Even if the control voltage value of 19b is obtained from the gain setting device 19c and stored in the memory, and the control voltage value is applied from the arithmetic processing unit 17 to the variable gain amplifier circuit 19b, the amplitude of the pseudo echo signal is set. Good. Further, the dial setting value of the gain setting device 19c is input from the input device 16 and the arithmetic processing device 17
The dial setting value of the standard test piece 23 for the probe 22 is displayed on the display device 18 by the arithmetic processing unit 17 at the time of setting the sensitivity or at the time of calibration, and the gain setting unit 19c The sensitivity can be set in the same manner by manually setting the set values of.

As described above, in the embodiment, a pulse signal corresponding to the target peak value is generated using the arithmetic processing device,
In addition, the pseudo echo signal is generated by setting the target timing value. However, the present invention only needs to generate the peak value corresponding to the standard test piece, and time calibration is not required. Further, each set value and control value is not limited to the case of being set or controlled by the arithmetic processing unit.

In the embodiment, the time data of the oblique flaw detection or the vertical flaw detection of various standard test pieces at the standard temperature of the memory is stored. However, the data is not limited to the data of the oblique flaw detection or the vertical flaw detection. Can be stored according to the flaw detection conditions.

Further, the time data stored in the memory corresponding to the standard test piece can be easily obtained by actually measuring and storing the time when the actual standard test piece is measured in the standard temperature state. In addition,
In this case, if various temperature states are stored in advance instead of the standard temperature state, the calculation by the temperature correction becomes unnecessary.

It should be noted that the sensitivity setting signal generating device of the present invention may be used in an ultrasonic flaw detector or the like together with or separately from the calibration device.

[Effects of the Invention] As can be understood from the above description, according to the present invention, the ultrasonic measurement apparatus responds to the reception echo signal according to the transmission pulse signal generated from the ultrasonic measurement apparatus as the sensitivity setting signal generation apparatus. A pulse signal generation circuit that generates a pulse signal and an amplitude adjustment circuit that adjusts the amplitude of the generated pulse signal. The amplitude of the pulse signal adjusted by the amplitude adjustment circuit corresponds to the echo obtained from the standard test piece. Since the adjustment value is stored, a pulse signal having the same amplitude can be generated anywhere by reading the adjustment value.

As a result, it is possible to set the sensitivity corresponding to the probe anywhere without using the standard test piece, and it becomes unnecessary to carry the standard test piece for ultrasonic flaw detection or the like.

In addition, since the information corresponding to the standard test pieces is stored in the memory, data on a number of standard test pieces can be stored in correspondence with a number of probes. Just by walking, it can be used equally with many standard specimens.

[Brief description of the drawings]

FIG. 1 is a block diagram of an embodiment in which a sensitivity setting signal generator of an ultrasonic measuring device according to the present invention is applied to a calibration device of an ultrasonic measuring device, and FIG. 2 is an output pulse voltage measuring circuit and a pseudo echo. FIG. 3 is an explanatory diagram of a specific example of the signal generation circuit, and FIG. 3 is an explanatory diagram of an image displayed on the ultrasonic flaw detector. 10 ... Calibration device, 11 ... Connection terminal, 12 ... Attenuator, 13 ...
... Time pulse generation circuit, 14 ... Gate circuit, 15 ... Time count circuit, 16 ... Input device, 17 ... Calculation processing device,
18 ... display device, 19 ... simulated reception echo signal generation circuit,
19a …… Pulse generation circuit, 19b …… Variable gain amplifier circuit, 19
c: Gain setting device, 20: Output pulse voltage measurement circuit, 2
0a …… Peak detection circuit, 20b …… A / D conversion circuit, 20c ……
Memory switch, 21: Ultrasonic measurement device, 21a: Probe connection terminal, 22: Probe, 23: Standard test piece.

──────────────────────────────────────────────────の Continued on the front page (72) Inventor Yoshiaki Suzuki 650, Kandamachi, Tsuchiura-shi, Ibaraki Hitachi Construction Machinery Co., Ltd. Inside the Tsuchiura Plant (72) Inventor Yoshikazu Hamasaki 1592 Uefu, Shingu-cho, Kasuya-gun, Fukuoka Prefecture Inside the Kyushu Branch of Hitachi Construction Machinery Co., Ltd. (56) References JP-A-63-314464 (JP, A) (JP, A) JP-A-62-223611 (JP, A) (58) Fields investigated (Int. Cl. ⁶ , DB name) G01N 29/00-29/28

Claims (4)

(57) [Claims] 1. An ultrasonic measuring device according to a connection terminal connected to a terminal to which a probe of an ultrasonic measuring device is connected, and a transmission pulse signal transmitted from the ultrasonic measuring device to the connecting terminal. A pulse signal generation circuit that generates a pulse signal that can be regarded as a reception echo signal, an amplitude adjustment circuit that receives the pulse signal, converts the pulse signal into a pulse signal having a predetermined amplitude according to a control signal, and outputs the pulse signal to the connection terminal. Setting means for externally selecting a set value, generating a control signal corresponding to the selected set value, setting the amplitude of the pulse signal to a predetermined value corresponding to the selected set value, and storing the set value And a means for reading and displaying the set values stored in the storage means, corresponding to the peak value of the received echo signal in the ultrasonic measurement apparatus when the standard test piece is measured. Sensitivity setting signal generator of the ultrasonic measurement apparatus according to claim the selected set value to be stored in said storage means when the amplitude the pulse signal of a peak value the amplitude adjustment circuit has occurred that. 2. An ultrasonic measuring apparatus according to claim 1, wherein said connecting terminal is connected to a terminal to which a probe of said ultrasonic measuring apparatus is connected, and said transmitting apparatus transmits said ultrasonic measuring apparatus to said connecting terminal. A pulse signal generation circuit that generates a pulse signal that can be regarded as a reception echo signal, an amplitude adjustment circuit that receives the pulse signal, converts the pulse signal into a pulse signal having a predetermined amplitude according to a control signal, and outputs the pulse signal to the connection terminal. Setting means for selecting a setting value from the outside, generating a control signal corresponding to the selected setting value to set the amplitude of the pulse signal to a predetermined value corresponding to the selected setting value, and an amplitude of the pulse signal A storage unit for storing a value or a control value of the control signal; reading the amplitude value stored in the storage unit; comparing the read value with the amplitude value of the pulse signal output from the amplitude adjustment circuit; Control means for controlling the amplitude adjustment circuit until the results match, or for reading out a control value stored in the storage means and adding this control value to the amplitude adjustment circuit to control the standard test piece. The amplitude value of the pulse signal output from the amplitude adjustment circuit, which becomes the peak value corresponding to the peak value of the reception echo signal in the ultrasonic measurement device when measured, or the control value at that time is stored in the storage means. A sensitivity setting signal generator for an ultrasonic measurement device. 3. A connection terminal connected to a terminal to which a probe of an ultrasonic measurement device is connected, a time pulse generation circuit for generating a time pulse signal for each predetermined unit time, and a time pulse generation circuit. A gate circuit for transmitting the time pulse signal in response to a transmission pulse signal transmitted from the ultrasonic measurement device to the connection terminal in response to the time pulse signal, and setting the time pulse signal obtained from the gate circuit. A time counting circuit that counts up to the set target value to generate an output signal, a pulse signal generation circuit that generates a pulse signal that can be regarded as a reception echo signal to the ultrasonic measurement device in accordance with the output signal, An amplitude adjustment circuit for receiving a signal, converting the signal into a pulse signal having a predetermined amplitude in accordance with a control signal, and outputting the pulse signal to the connection terminal; Setting means for generating a control signal corresponding to the selected set value to set the amplitude of the pulse signal to a predetermined value corresponding to the selected set value, and setting the amplitude value of the pulse signal or the control value of the control signal to A storage unit for storing, and reading the amplitude value stored in the storage unit, comparing the readout amplitude value with the amplitude value of the pulse signal output from the amplitude adjustment circuit, and operating the amplitude adjustment circuit until these comparison results match. Control means for controlling or reading the control value stored in the storage means and controlling the control value by adding the control value to the amplitude adjustment circuit. A supersonic sound, wherein an amplitude value of the pulse signal output from the amplitude adjustment circuit, which becomes a peak value corresponding to a peak value of the received echo signal, or a control value at that time is stored in the storage means. Sensitivity setting signal generator of the measuring device. 4. The control means is an arithmetic processing device, and the storage means is a memory built in the arithmetic processing device. The target value of the time counting circuit is a value corresponding to a designated standard test piece. 4. The sensitivity setting signal generator for an ultrasonic measurement device according to claim 3, wherein the signal is supplied from a controller.