JP2953910B2 - Stamping device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a stamping device, and
The present invention relates to a marking device for performing a marking work on a product before a sorting work by an SI tester.

[0002]

2. Description of the Related Art As shown in FIG.
The product is composed of a product sliding section 9, a product marking section 10, and a product storage section 11. Products that have not been stamped are slid on the product sliding section 9 one by one and are all sent to the product marking section 10. Product marking section 10
Then, the product's trademark, model name, lot No. And stamp it. All the products that have been stamped are stored in the product storage unit 11. After that, electrical characteristics and the like are tested by an LSI tester, and a good product and a defective product are selected.

[0003]

In the conventional stamping apparatus, a stamping operation is performed on all products sent to the product sliding section. That is, there is a problem that the stamping work is performed on all the sent products, whether they are defective or non-defective products generated in the previous process, resulting in unnecessary work.

[0004]

The marking device of the present invention includes a simple LSI tester capable of testing the function of a product terminal and a product measuring unit in addition to the conventional marking function. By using these before testing, the function of the terminal of the product can be tested to eliminate the useless work of stamping the defective product and solve the problem.

[0005]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. FIG. 1 is a schematic view of a stamping device according to one embodiment of the present invention. Products that have not been stamped are slid one by one on the product sliding section 1 and sent to the product measuring section 5. The product measuring section 5 has a structure as shown in FIG. The product 12 comes into contact with the contactor 14 connected to the simple LSI tester 17 via the wiring 16 at the terminal 13 of the product. On the other hand, simple LSI tester 1
Reference numeral 7 denotes a DC power supply 18 for supplying power to the product 12, a DC power supply 18 'for supplying DC current to the terminals of the product, and a selector 20 for selecting a terminal to be measured and a power supply terminal, and measures a flowing current. And a decision unit 19 for judging a match. The product measuring section 5 performs a terminal function test on the sent product. The test method will be described. A constant voltage is supplied to a power supply terminal of a product, a DC current is supplied to each terminal of the product, and a flowing current is measured. Referring to FIG. 4, the terminal 21 of the product is connected to the inside of the chip 25 via the inner lead 22, the wire 23, and the pad 24, so that the current I flows if assembled normally. If there is at least one terminal through which the current I does not flow, the measured product is determined to be defective. The product determined to be defective is sent to the defective product sliding unit 3 in FIG. 1 and stored in the defective product storage unit 8 without performing the stamping operation. If the current I flows through all the terminals, it is determined to be a non-defective product and is sent to the non-defective product sliding section 2 in FIG. Then, the product is stamped and stored in the non-defective product storage unit 7. By the operation as described above, a non-defective assembly and a defective assembly can be selected, and only the non-defective product can be stamped, thereby reducing man-hours by 2 to 3%.

Next, a second embodiment will be described. FIG.
FIG. 4 is a schematic view of a second embodiment. In the above-described embodiment, when the product measurement unit determines that the product is defective, the product is sent to the defective product sliding unit and stored in the defective product storage unit. However, in the second embodiment, as shown in FIG. The product measuring unit 30 performs only the determination of good or bad, and the product is sent to the product sliding unit 28, and the product marking unit 31 performs the marking work on the product determined to be non-defective, but does not apply to the product determined to be defective. Simple LSI tester 2
This part only passes through without receiving a bad signal from 9 and performing the sealing work. The good / defective product is once stored in the non-defective / defective product distributor 32 and receives the good / defective signal from the simple LSI tester 29. The good product is distributed to the non-defective product storage unit 3 and the defective product is distributed to the defective product storage unit 34. As described above, the second embodiment has an advantage that the size of the apparatus can be reduced because the sliding portions for good and defective products can be shared.

[0007]

As described above, according to the present invention, the incompletely stamped product is classified into a non-defective product and a defective product, and only the non-defective product is stamped. Has advantages.

[Brief description of the drawings]

FIG. 1 is a schematic diagram of one embodiment of the present invention.

FIG. 2 is a schematic diagram of a conventional marking device.

FIG. 3 is a detailed view of a product measuring section and a simple LSI tester of FIG. 1;

FIG. 4 is a schematic diagram when measuring a product.

FIG. 5 is a schematic view of a second embodiment of the present invention.

[Explanation of symbols]

 1, 9, 27, 28 Product sliding section 2 Good product sliding section 3 Defective product sliding section 4, 17, 29 Simple LSI tester 5, 30 Product measuring section 6, 10, 31 Product marking section 7, 33 Good product storing section 8, 34 Defective product storage unit 11 Product storage unit 12, 13, 26 Product 14, 15 Contactor 16 Wiring 18, 18 'DC power supply 19 Judge 20 Selector 21 Terminal 22 Inner lead 23 Wire 24 Pad 25 Chip 32 Good / defective product distributor

Claims (1)

(57) [Claims] 1. A Marking device of semiconductor products, the semi
Simple LSI tester for testing terminal functions of conductor products
And a good product of the semiconductor product connected to the simple tester.
・ The product measurement unit that determines defective products, the product
Product storage unit, comprising a defective product storage unit, the product measurement unit
Non-defective products were stamped at the product marking area based on the judgment result of
Stored in the post-defective product storage section
A marking device characterized by being stored in a storage section .