JP2860006B2 - Method of creating an experiment plan for a system for creating a quality inspection plan for parts - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for creating an experiment plan for a system for creating a quality inspection plan for a part, and
The present invention relates to an experiment plan creating method of a component quality inspection plan creating system for creating an experiment plan for creating a quality inspection plan for determining whether a component is good or defective.

[0002]

2. Description of the Related Art Conventionally, in the industry, a quality inspection plan for a component is created by a system for creating a quality inspection plan for a component, and further, the quality of the component is evaluated by using the quality inspection plan creation system in which the quality inspection plan is stored. An automatic quality inspection system for automatically inspecting a product is used.

In the method for creating a quality inspection plan, outputs of sensors provided at a plurality of points of a component to be measured are read by a quality inspection plan creation system (experiment mode), and a large number of measurement data obtained are obtained. Is analyzed (analysis mode), and from this analysis result, an optimum inspection point and a judgment value for judging good or bad of the part are set (judgment value creation mode). Next, based on the set judgment value, the quality inspection plan is automatically created by an arithmetic circuit arranged in the quality inspection plan creation system (inspection program automatic creation mode).

In this case, in the experiment mode, an interface circuit for reading the output of the sensor, for example, a conversion rate of an analog / digital (hereinafter, referred to as A / D) conversion circuit, and data from the A / D conversion circuit. The sampling time to be read is set from the keyboard by the operator, and then the experiment mode is executed based on the measurement method selected on the display means.

[0005]

In the above-described experiment mode according to the prior art, since the conversion rate of the A / D conversion circuit is input as a voltage value from a keyboard by an operator, the operation of the apparatus is difficult for an operator who is unfamiliar with the operation of the apparatus. In this case, it takes time to set the conversion rate. Further, in the case of the quality inspection creating apparatus in which the conversion rate is stored in the ROM in advance, the data stored in the ROM must be rewritten every time the conversion rate is changed. There is an inconvenience.

Further, in the above-mentioned experiment mode, since the reading condition that can be set is only the sampling time, there is a problem that the measurement method is limited and it is difficult to obtain desired experiment data.

SUMMARY OF THE INVENTION The present invention has been made to solve such a conventional problem. In a method for creating an experiment plan of a quality inspection plan by a part quality inspection plan creation system, sampling of experimental data is started. Timing and sampling end timing, etc.
It is an object of the present invention to provide an experiment plan creation method for a quality inspection plan creation system for a part that can be easily and accurately set by an operator unfamiliar with the operation of the device and has a large degree of freedom in a setting range of a measurement method. And

[0008]

In order to achieve the above object, the present invention provides a method for sampling a plurality of types of data from an object to be measured, and performing an experiment on a quality inspection plan of the object based on the sampled data. In the test plan creation method of the quality inspection plan creation system for parts that create the plan,
A first step of selecting a plurality of data input means corresponding to a plurality of detectors provided on the measuring object on a display means, and displaying input conditions including an input range, a unit, and the like of each of the data input means; a second step of selecting on means, a third step of selecting on the display unit measurement pattern for each data input means each for reading data from the data input means of the respective measurements that are selected and a fourth step of setting the measurement conditions such as the sampling time for the pattern, the third step
Then, the specified general measurement pattern is blank on the display means
A plurality of sentences are displayed, and in the fourth step,
Numerical values and terms pertaining to the blank for the measured pattern
Text display prompting input and / or selection of eyes, units, etc.
Screen and wherein Rukoto displayed on the display means.

[0009]

In the method for creating an experiment plan of the component quality inspection plan creation system according to the present invention, a plurality of data input means corresponding to a plurality of detectors provided on the object to be measured are selected on the display means, An input condition including an input range and a unit of each data input means is selected on the display means. Next, a measurement pattern for reading data from each of the data input means is selected on the display means for each data input means, and measurement conditions such as a sampling time are set for the measurement pattern. And display the measurement pattern
A predetermined general measurement pattern on the display means.
When displaying multiple texts with columns and setting measurement conditions,
Numerical values, items, units, etc. for the selected measurement pattern
Displays a text display screen prompting you to enter and / or select
It is displayed on the indicating means.

Therefore, the selection of the input conditions and the setting of the measurement conditions can be easily performed on the display means.

[0011]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, a preferred embodiment will be described with reference to the accompanying drawings, with reference to the attached drawings, in which a method for preparing an experimental plan of a system for preparing a quality inspection plan for parts according to the present invention will be described. Will be described.

FIG. 1 is a block diagram showing the configuration of an experiment plan creating apparatus 10. The experiment plan creation device 10 includes a CPU 11 as control means and a touch panel 1 as input means.
2 and keyboard 14 and CRT 1 as display means
6 and an interface (hereinafter referred to as I / F) circuit 17
And The I / F circuit 17 converts an output of a sensor (not shown) into a digital value, an A / D converter circuit 18, a counter circuit 20 for counting pulses output from the sensor (not shown), and outputs data to an externally connected device. Digital / analog (hereinafter D / A) as an output means for outputting
A) and a conversion circuit 22.

The experimental plan creating apparatus 10 includes an I / F circuit 17
An I / F setting screen storage circuit 24 for storing setting screen data relating to the measurement method, and a measurement method setting screen storage circuit 26 for storing setting screen data relating to the measuring method.

Further, the experimental plan creating apparatus 10 includes a reading condition storing circuit 28 for storing the set data reading conditions of the I / F circuit 17, a measuring method storing circuit 30 for storing the set measuring method. A measurement data storage circuit 32 for storing the set data reading conditions of the I / F circuit 17 and measurement data read based on the set measurement method, and a data measurement set by the measurement method. Trigger value calculation circuit 34 for calculating a trigger value
And

The experiment plan creating apparatus 10 configured as described above is incorporated in a general-purpose measuring instrument. Next, a method for automatically creating an inspection program for a part to be inspected by the general-purpose measuring instrument will be described. This will be described with reference to the flowchart of FIG.

The method for automatically creating an inspection program includes an experiment mode (step S1) for collecting data of each part of a part based on set reading conditions and a measurement method, and an analysis mode (step S1) for analyzing the obtained data. Step S2), a determination value creation mode in which a determination value is set based on the analysis result (Step S3), and an inspection program automatic creation mode in which an inspection program is automatically created from the set determination value (Step S4). Consists of

Next, the details of the operation in the experiment mode in step S1 will be described with reference to the block diagram of FIG. 1, the flowchart of FIG. 3, and the display screens displayed on the CRT 16 shown in FIGS. explain.

The selection and setting in the following description is C
This is performed by touching the touch panel 12 provided on the RT 16.

When the experiment mode is selected on a mode selection screen (not shown), the CPU 11 reads the data of the reading condition setting screen from the I / F setting screen storage circuit 24, and
It is displayed on the RT 16 (see FIG. 4) (step S11).
On this screen, for example, when "A / D setting" is selected (step S12), the CPU 11 reads out the first setting screen data of the A / D card from the I / F setting screen storage circuit 24 and displays it on the CRT 16 (See FIG. 5).

On this screen, for example, the A / D conversion circuit 18
After “A” is set in the 0ch and 1ch unit fields of “No.”, if “End” is selected, the CRT 16 displays a second setting screen of the A / D card (see FIG. 6).
On this screen, the input range of each channel and the converted value for displaying the voltage value read from each channel on the CRT 16 are set (step S13).

FIG. 6 shows that the input range of one channel is -4.00 V-
It is set to 6.00V and the converted value of 2ch is -50
It shows that it was set to 00 to 5000. Therefore, the input range of one channel of the A / D conversion circuit 18 is -4.0.
0V to 6.00V, and the data read from the 1ch to the CPU 11 is -4.00V converted to -12,
6.00V is converted to +12 and displayed on the CRT 16 as a graph.

When "end" is selected on the second setting screen of the A / D card, a third setting screen of the A / D card is displayed (see FIG. 7). On this screen, the name of the measurement item, for example, 0ch When "motor current L", "motor current R" for 1ch, and "clutch oil pressure" for 2ch are further set, and "end" is selected, the CPU 11 determines that the setting of the reading condition is completed, A / D conversion circuit 18
Is stored in the reading condition storage circuit 28.

Next, the CPU 11 reads the data of the first selection screen of the measurement pattern from the measurement method setting screen storage circuit 26 and displays it on the CRT 16 (see FIG. 8).
(Step S14).

When, for example, “measurement pattern 2” is selected on the first selection screen, the CPU 11 reads from the measurement method setting screen storage circuit 26 the second of the measurement patterns indicating the more detailed contents of “measurement pattern 2”. The data of the selection screen is read and displayed on the CRT 16 (see FIG. 9) (step S15). On the screen, for example, “Pattern 2-
When “2” is selected, the CPU 11 generates a measurement method setting screen from the selected “measurement pattern 2” and “pattern 2-2” and displays it on the CRT 16 (step S1).
6).

The generated measurement method setting screen measures “items” at maximum “numbers” and “units” until “items” become “numerical values” and “units” by sampling “numerical values” ms, for example. Becomes

A touch panel 12 is provided on the screen of the CRT 16 on which the text is displayed. Then, when the operator selects the above by touching the touch panel 12 above the above sentence, an input instruction screen for the selected number is displayed in a window. The numerical value or the name of the item displayed on the input instruction screen is selected or changed by further touching the touch panel 12.

That is, when the operator touches the touch panel 12 on the “numerical value” of the measurement method setting screen, the CPU 11 measures the measurement methods P-0 to P-23 stored in the measurement method setting screen storage circuit 26 in advance. Is read out and displayed in a window on the CRT 16 (see FIG. 10).

When, for example, “P-10” is selected from the measurement methods P-0 to P-23, the CPU 11 reads the first setting screen of P-10 from the measurement method setting screen storage circuit 26 and reads out the first setting screen. A window is displayed on the CRT 16 (see FIG. 11). In this screen, for example, when the touch panel 12 on “2” is touched, “
“2” is set to “numerical value”, and the sentence “with 2 ms sampling” is completed.

Subsequently, when the "item" is touched, the CR
At T16, an item table as a second setting screen is displayed in a window (see FIG. 12). For example, when "steering angle" is selected from the item table, "steering angle" is set in "item" on the measurement method setting screen, and the sentence "steering angle is completed" is completed (see FIG. 13). Here, as shown in FIG. 5, "degree" is set in the column of the unit of the steering angle, so "degree" is set as the "unit".

Similarly, "254.7" is used for "numerical value".
Is set (see FIG. 14), and "I"
When "I" clutch hydraulic pressure and "III" output torque are set (see FIG. 15), "1818" is set in "numerical value", and the unit of this numerical value "times" is set.
Is completed as shown below (Fig. 1
6) (Step S17). Until the “steering angle” becomes “254.7” or “degrees” or more with sampling of “2” ms, measure “items II and III” at most “1818” and “times”.

In this case, the trigger value calculation circuit 34
The conversion value set on the second setting screen of the A / D card shown in (1) is converted into the voltage indication value v by the equation (1) and stored in the measurement method storage circuit 30. v = {(re−rs) × (tn−urs) / (ure−urs)} + rs (1) In equation (1), re is the maximum value of the input range, rs is the minimum value of the input range, and tn is The trigger value, urs indicates the conversion minimum value, and ure indicates the conversion maximum value.

On the other hand, the maximum value of the steering angle set to “numerical value” is converted into a hexadecimal number by the trigger value calculation circuit 34 according to the equation (2), and is stored in the measurement method storage circuit 30 as the first trigger value t _n1. Is stored (step S1
8). Hex value = {v × G + (S _P / 2)} × D _P } / S _P (2) In equation (2), G is the amplification of the amplifier provided at the input of the A / D conversion circuit 18. Rate, _SP is the input range span,
D _P represents respectively the resolution of the A / D converter circuit 18.

When "end" is selected on the screen shown in FIG. 16, a measurement execution screen is displayed (see FIG. 17). When "start" is selected on this screen, measurement is executed, that is, data sampling is started. (Step S19),
The CPU 11 reads each data from the 2ch and 3ch of the A / D conversion circuit 18 every 2 ms sampling.

At this time, the CPU 11 controls the A / D conversion circuit 1
8, the steering angle t read through the 5ch,
The trigger value t _n1 (25
Hex value of 4.7 degrees) (step S2).
0), when t> t _n1 , the A / D conversion circuit 18
The sampling of the clutch oil pressure and the output torque read from the channel is stopped (step S21), and the experiment mode ends.

When t> t _n1 is not satisfied, the CPU 11
Stores the read output torque in the measurement data storage circuit 32 together with the sampling time and steering angle data (step S22).

As described above, according to this embodiment,
The reading condition and the measuring method are displayed on the CRT 16 on which the touch panel 12 is provided, and the operator selects a desired item from a plurality of selection items displayed by touching the touch panel 12 on each screen.

Accordingly, the operator can easily make settings on each of the screens. Further, the setting can be easily changed by re-inputting on each screen.

[0038]

In the method for creating an experiment plan of the system for creating a quality inspection plan for parts according to the present invention, the input conditions and the measurement conditions of the input means can be easily and easily selected by selecting the displayed numerical values on the display means. Can be set up quickly,
The measurement preparation time can be reduced.

Further, a technical knowledge of a system for creating a quality inspection plan for parts is not required, and an operator who is unfamiliar with the handling of the apparatus can easily create and change the plan in the experiment mode. This makes it possible to reduce the burden on the user.

[Brief description of the drawings]

FIG. 1 is a block diagram showing an overall configuration of an experiment plan creating apparatus for implementing the present invention.

FIG. 2 is a main flowchart showing an operation of automatically creating an inspection program by a general-purpose measuring instrument.

FIG. 3 is a flowchart showing an operation in an experimental mode of the flowchart shown in FIG. 2;

FIG. 4 is a view for explaining a menu selection screen for measurement conditions in the experiment mode shown in FIG. 3;

FIG. 5 is a diagram illustrating a setting screen for setting the unit of the A / D card selected in FIG.

FIG. 6 is a diagram illustrating a setting screen for setting an input range of the A / D card selected in FIG. 4;

FIG. 7 is a diagram illustrating a screen on which the input condition setting of the A / D card selected in FIG. 4 has been completed.

8 is a diagram illustrating a menu selection screen of a measurement method in the experiment mode shown in FIG.

9 is a diagram illustrating a submenu selection screen of the measurement method shown in FIG.

FIG. 10 is a view for explaining a program number selection screen of a measurement method in the experiment mode shown in FIG. 3;

11 is a diagram illustrating a sampling rate selection screen of a measurement method in the experimental mode shown in FIG.

FIG. 12 is a view for explaining a measurement item selection screen of a measurement method in the experiment mode shown in FIG. 3;

13 is a diagram illustrating a trigger level selection screen of a measurement method in the experiment mode shown in FIG.

14 is a diagram illustrating a measurement item selection screen of a measurement method in the experiment mode shown in FIG.

15 is a diagram illustrating a sampling length selection screen of a measurement method in the experiment mode shown in FIG.

16 is a diagram illustrating a sampling length unit selection screen of the measurement method in the experiment mode shown in FIG.

17 is a diagram illustrating a measurement execution screen in the experiment mode shown in FIG.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 10 ... Experiment plan preparation apparatus 11 ... CPU 12 ... Touch panel 16 ... CRT 17 ... I / F circuit 18 ... A / D conversion circuit 20 ... Counter circuit 24 ... I / F setting screen storage circuit 26 ... Measurement method setting screen storage circuit 28 ... Reading condition storage circuit 30 ... Measurement method storage circuit 32 ... Measurement data storage circuit 34 ... Trigger value calculation circuit

────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-62-63313 (JP, A) JP-A-3-199921 (JP, A) JP-A-3-252901 (JP, A) (58) Field (Int.Cl. ⁶ , DB name) G01D 21/00 G06F 17/40

Claims (1)

(57) [Claims] 1. A method for producing an inspection plan of a component quality inspection plan creating system for sampling a plurality of types of data from a measurement object and creating an experiment plan of the quality inspection plan of the measurement object based on the sampled data. A first step of selecting a plurality of data input means corresponding to a plurality of detectors provided on the measurement object on a display means, and input conditions including an input range and a unit of each of the data input means. A second step of selecting on the display means, a third step of selecting a measurement pattern for reading data from each of the data input means on the display means for each of the data input means , comprising a fourth step of setting the measurement conditions such as the sampling time relative to the measurement pattern, and wherein in the third step, on the display means Constant of common measurement
A plurality of fixed patterns are displayed in blank text.
In the step, for the selected measurement pattern,
Enter numerical values, items, units, etc. related to the blanks and / or
Experimental scheme create a component inspection scheme creation system of sentence display screen prompting the selection is characterized Rukoto displayed on the display unit.