JP2835769B2 - Crucible for Si single crystal production - Google Patents

Crucible for Si single crystal production

Info

Publication number
JP2835769B2
JP2835769B2 JP9152190A JP9152190A JP2835769B2 JP 2835769 B2 JP2835769 B2 JP 2835769B2 JP 9152190 A JP9152190 A JP 9152190A JP 9152190 A JP9152190 A JP 9152190A JP 2835769 B2 JP2835769 B2 JP 2835769B2
Authority
JP
Japan
Prior art keywords
crucible
single crystal
quartz
producing
graphite
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP9152190A
Other languages
Japanese (ja)
Other versions
JPH03290393A (en
Inventor
充博 大和
仁 日下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP9152190A priority Critical patent/JP2835769B2/en
Publication of JPH03290393A publication Critical patent/JPH03290393A/en
Application granted granted Critical
Publication of JP2835769B2 publication Critical patent/JP2835769B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、低炭素濃度のSi単結晶を製造するためのル
ツボに関するものである。
Description: TECHNICAL FIELD The present invention relates to a crucible for producing a Si single crystal having a low carbon concentration.

[従来の技術] 従来のSiっ単結晶製造用ルツボは、第3図に示すよう
に石英ルツボ1を黒鉛ルツボ2に嵌合してなるものであ
る。このSi単結晶用ルツボ3は、底の中央が回転軸4に
支持され、ヒーター5,ヒートシールド6と共にチャンバ
ー7内に収容されている。
[Prior Art] A conventional crucible for producing a Si single crystal is formed by fitting a quartz crucible 1 to a graphite crucible 2 as shown in FIG. The center of the bottom of the crucible 3 for Si single crystal is supported by a rotating shaft 4, and is housed in a chamber 7 together with a heater 5 and a heat shield 6.

Si単結晶の製造は、前記ルツボ3に原料としてチャー
ジした多結晶Siをヒーター5によって加熱溶融し、雰囲
気ガスをチャンバー7に設けられた供給口8より導入
し、排出口9より排出する。ヒーター5により加熱して
多結晶Siを十分溶融した後、引上げ棒10の下端に挟持し
た種結晶11を融液12に浸漬し、引上げてSi単結晶13を育
成する。
In the production of a Si single crystal, polycrystalline Si charged as a raw material in the crucible 3 is heated and melted by a heater 5, an atmospheric gas is introduced from a supply port 8 provided in a chamber 7, and discharged from a discharge port 9. After heating by the heater 5 to sufficiently melt the polycrystalline Si, the seed crystal 11 held at the lower end of the pulling rod 10 is immersed in the melt 12 and pulled up to grow the Si single crystal 13.

[発明が解決しようとする課題] ところで、上記Si単結晶の製造において、多結晶Siの
加熱溶融時、融液表面から発生する反応生成物(SiO)
と黒鉛の反応でCOが生成され、その一部が融液12に混入
し、結晶中に炭素が混入する。この結晶中に混入した炭
素は、同じく結晶中に存在する酸素と相互に作用し、そ
の結果育成されたSi単結晶13を切り出して得たウェーハ
内の酸素の析出物が不均一となって、素子製造工程で悪
影響をおよぼす。
[Problems to be Solved by the Invention] By the way, in the production of the above-mentioned Si single crystal, a reaction product (SiO) generated from the surface of the melt when heating and melting polycrystalline Si.
CO is generated by the reaction between the graphite and graphite, a part of which is mixed into the melt 12, and carbon is mixed into the crystal. The carbon mixed into this crystal interacts with oxygen also present in the crystal, and as a result, the precipitate of oxygen in the wafer obtained by cutting out the grown Si single crystal 13 becomes non-uniform, This has an adverse effect on the device manufacturing process.

このため、石英ルツボ1の円筒側液側壁の上端に第4
図に示す如く外側フランジ14を一体に設けたSi単結晶製
造用ルツボ15が提案されている。(先行技術文献として
特開昭63−319288号公報がある) しかしこのSi単結晶製造用ルツボ15は、外側フランジ
14を一体に石英ルツボ1に設ける為、コスト高となり、
また外側フランジ14に角がある場合、気流に乱れが生
じ、単結晶育成に悪影響を及ぼす。
For this reason, a fourth crucible is placed on the upper end of the cylindrical liquid side wall of the quartz crucible 1.
As shown in the figure, a crucible 15 for producing a Si single crystal in which an outer flange 14 is integrally provided has been proposed. (Japanese Patent Laid-Open No. 63-319288 is a prior art document.) However, the crucible 15 for producing a Si single crystal has an outer flange.
Since 14 is integrally provided on the quartz crucible 1, the cost increases,
If the outer flange 14 has a corner, the air flow is disturbed, which adversely affects single crystal growth.

そこで本発明は、Si単結晶の製造において、炭素濃度
を低減でき、かつウェーハ内の酸素の析出物を均一にで
き、さらに低コストで製作できるSi単結晶製造用ルツボ
を提供しようとするものである。
Therefore, the present invention aims to provide a crucible for producing a Si single crystal, which can reduce the carbon concentration in the production of a Si single crystal, can evenly deposit oxygen in the wafer, and can be produced at a low cost. is there.

[課題を解決するための手段] 上記課題を解決するための本発明のSI単結晶製造用ル
ツボは、石英ルツボを黒鉛ルツボに嵌合してなるSi単結
晶製造用ルツボにおいて、前記石英ルツボの円筒状側壁
上端に、該円筒状側壁上端及び前記黒鉛ルツボの円筒状
側壁上端を被う石英リングを設けたことを特徴とするも
のである。
[Means for Solving the Problems] A crucible for producing an SI single crystal according to the present invention for solving the above-mentioned problems is a crucible for producing a Si single crystal, which is formed by fitting a quartz crucible to a graphite crucible. A quartz ring is provided at the upper end of the cylindrical side wall to cover the upper end of the cylindrical side wall and the upper end of the cylindrical side wall of the graphite crucible.

[作用] 上記の如く構成された本発明のSi単結晶製造用ルツボ
は、多結晶Siの加熱溶融時、石英リングによって石英ル
ツボと黒鉛ルツボの間にSiO蒸気が入ることが殆んどな
くなり、SiO+2C→SiC+COの反応が最少となる。従っ
て、製造されるSi単結晶の炭素濃度を低減でき、またSi
単結晶を切り出して得られるウェーハ内の酸素の析出量
を均一にできる。しかも黒鉛ルツボのSiC化が減少し、
寿命が増長する。石英リングは固化時の膨張で割れるの
を防止する為、すり割りのリングとするとよい。
[Function] In the crucible for producing a Si single crystal of the present invention having the above-described structure, almost no SiO vapor enters between the quartz crucible and the graphite crucible by the quartz ring when the polycrystalline Si is heated and melted. The reaction of SiO + 2C → SiC + CO is minimized. Therefore, the carbon concentration of the manufactured Si single crystal can be reduced, and
The amount of oxygen precipitated in a wafer obtained by cutting out a single crystal can be made uniform. Moreover, the use of SiC in graphite crucibles decreased,
The life is prolonged. The quartz ring may be a slotted ring in order to prevent the quartz ring from breaking due to expansion during solidification.

[実施例] 本発明のSi単結晶製造用ルツボの一実施例を第1図に
よって説明すると、外径406mm,高さ305mm,厚さ8mmの石
英ルツボ1を、内径407mm,高さ275mmの黒鉛ルツボ2に
嵌合してなるSi単結晶製造用ルツボにおいて、前記石英
ルツボ1の円筒状側壁上端に、該円筒状側壁上端及び前
記黒鉛ルツボ2の円筒状側壁上端を被う高さ15〜20mmの
幅25〜27mm,肉厚3〜4mmの断面逆レの字状のすり割りの
石英リング16を嵌着して、石英ルツボ1と黒鉛ルツボ2
との間を塞いである。この石英リング16のすり割りは、
引上げてSi単結晶を固化させた時、Siの膨張で石英ルツ
ボ1が割れても石英リング15が割れないように膨張力を
逃がすためのもので、第2図に示す如く通常1mm以下の
隙間17が形成されている。
[Embodiment] An embodiment of the crucible for producing a Si single crystal according to the present invention will be described with reference to Fig. 1. A quartz crucible 1 having an outer diameter of 406mm, a height of 305mm, and a thickness of 8mm is replaced with graphite having an inner diameter of 407mm and a height of 275mm. In the crucible for producing a Si single crystal, which is fitted to the crucible 2, a height of 15 to 20 mm covering the upper end of the cylindrical side wall of the quartz crucible 1 and the upper end of the cylindrical side wall of the graphite crucible 2 The quartz crucible 1 and the graphite crucible 2 are fitted by fitting a quartz ring 16 having a width of 25 to 27 mm and a wall thickness of 3 to 4 mm and having an inverted C-shaped cross section.
It is closing between. The slit of this quartz ring 16
When the Si single crystal is pulled up and solidified, the expansion force is released to prevent the quartz ring 15 from breaking even if the quartz crucible 1 breaks due to the expansion of Si. As shown in FIG. 2, the gap is usually 1 mm or less. 17 are formed.

尚、石英ルツボ1と黒鉛ルツボ2の相対的位置は、多
結晶Siの溶融前20〜25mm石英ルツボ1が高く、溶融後5
〜15mm石英ルツボ1が高い状態となるのが好ましく、あ
まり石英ルツボ1が高すぎると上部が低温になってSiO
が析出し、石英ルツボ1の方が黒鉛ルツボ2よりも低く
なっても同様にSiO又はSiCが析出するものである。
The relative positions of the quartz crucible 1 and the graphite crucible 2 are higher for the quartz crucible 1 20 to 25 mm before melting the polycrystalline Si, and 5 mm after the melting.
It is preferable that the quartz crucible 1 is in a high state of about 15 mm.
Is deposited, and even if the quartz crucible 1 is lower than the graphite crucible 2, SiO or SiC is similarly precipitated.

上記のように構成された実施例のSi単結晶製造用ルツ
ボ18と、石英リング16を有しない実施例と同一寸法の第
3図に示す従来例1のSi単結晶製造用ルツボ3と、石英
ルツボ1の上端に幅10mmの外側フランジ14を一体に設け
た実施例と同一寸法の第4図に示す従来例2のSi単結晶
製造用ルツボ15に、夫々多結晶Siを45kgチャージし、Ar
ガスを雰囲気ガスとして第3図に示されると同様にチャ
ンバー7に設けられた供給口8より60/min,圧力20Tor
rとなるように導入し、排出口9より排出し、ヒーター
5により加熱して多結晶Siを十分溶融した後、引上げ棒
10の下端に挟持した種結晶11を融液12に浸漬し、引上げ
てSi単結晶13を育成した。
The crucible 18 for producing a Si single crystal of the embodiment configured as described above, the crucible 3 for producing a Si single crystal of the prior art 1 shown in FIG. 45 kg of polycrystalline Si was charged to each of the crucibles 15 for producing a Si single crystal of the prior art 2 shown in FIG. 4 having the same dimensions as the embodiment in which the outer flange 14 having a width of 10 mm was integrally provided at the upper end of the crucible 1.
As shown in FIG. 3, the gas was used as an atmospheric gas through the supply port 8 provided in the chamber 7 at a pressure of 60 / min and pressure of 20 Torr.
r, discharged from the outlet 9 and heated by the heater 5 to sufficiently melt the polycrystalline Si.
Seed crystal 11 held at the lower end of 10 was immersed in melt 12 and pulled up to grow Si single crystal 13.

こうして実施例及び従来例1,2のSi単結晶製造用ルツ
ボを用いて製造した各Si単結晶13を切り出して得たウェ
ーハを、SIMSにて炭素濃度を測定し且つ赤外分光器(FT
IR)で酸素析出分布状況を検査した処、下記の表に示す
ような結果を得た。
The wafer obtained by cutting out each Si single crystal 13 produced using the crucible for producing a Si single crystal of Examples and Conventional Examples 1 and 2 was measured for carbon concentration by SIMS, and the infrared spectrometer (FT)
Inspection of the distribution of oxygen precipitation by IR) yielded the results shown in the table below.

上記の表で明らかなように従来例1のSi単結晶製造用
ルツボを用いて製造したSi単結晶は炭素濃度が高く、酸
素析出分布が不均一であり、また従来例2のSi単結晶製
造用ルツボを用いて製造したSi単結晶は炭素濃度が低い
が酸素析出分布がやや不均一であるのに対し、実施例の
Si単結晶製造用ルツボを用いて製造したSi単結晶は炭素
濃度が低く、酸素析出分布が均一で、品質の良いウェー
ハが得られることが判る。
As is clear from the above table, the Si single crystal produced by using the crucible for producing a Si single crystal of Conventional Example 1 has a high carbon concentration, non-uniform oxygen precipitation distribution, and the production of the Si single crystal of Conventional Example 2. While the silicon single crystal produced using the crucible for use had a low carbon concentration but a slightly non-uniform oxygen precipitation distribution,
It can be seen that a Si single crystal produced using a crucible for producing a Si single crystal has a low carbon concentration, a uniform oxygen precipitation distribution, and a high quality wafer.

[発明の効果] 以上の説明で判るように本発明のSi単結晶製造用ルツ
ボは、黒鉛ルツボに嵌合した石英ルツボの円筒状側壁上
端に、その上端及び黒鉛ルツボの円筒状側壁上端を被う
石英リングを設けているので、多結晶Siの加熱溶融時、
石英リングによって石英ルツボと黒鉛ルツボの間にSiO
蒸気が入ることが殆んどなくなり、従って製造されるSi
単結晶の炭素濃度を低減でき、また酸素の析出分布を均
一にでき、しかも黒鉛ルツボのSiC化が減少し、寿命が
増長する。さらに本発明のSi単結晶製造用ルツボは、通
常のルツボの円筒状側壁上端に石英リングをのせるだけ
で得られるので、低コストであり、またルツボそのもの
は1回限りで廃棄されるが、石英リングはルツボの口径
さえ合えば複数回使用できる。
[Effects of the Invention] As can be seen from the above description, the crucible for producing a Si single crystal of the present invention covers the upper end of the cylindrical side wall of the quartz crucible fitted to the graphite crucible and the upper end of the cylindrical side wall of the graphite crucible. Since a quartz ring is provided, when heating and melting polycrystalline Si,
SiO between quartz crucible and graphite crucible by quartz ring
Almost no steam enters and therefore the Si produced
The carbon concentration of the single crystal can be reduced, the distribution of oxygen precipitation can be made uniform, and the formation of SiC in the graphite crucible decreases, and the life increases. Furthermore, the crucible for producing a Si single crystal of the present invention can be obtained simply by putting a quartz ring on the upper end of the cylindrical side wall of a normal crucible, so that the cost is low, and the crucible itself is discarded only once. The quartz ring can be used multiple times as long as the crucible has the same diameter.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明のSi単結晶製造用ルツボを示す断面図、
第2図は平面図、第3図は従来のSi単結晶製造用ルツボ
を使用した引上装置を示す断面図、第4図はさらに従来
のSi単結晶製造用ルツボを示す断面図である。 1……石英ルツボ、2……黒鉛ルツボ、18……Si単結晶
製造用ルツボ、16……石英リング
FIG. 1 is a cross-sectional view showing a crucible for producing a Si single crystal of the present invention,
2 is a plan view, FIG. 3 is a cross-sectional view showing a pulling apparatus using a conventional crucible for producing a Si single crystal, and FIG. 4 is a cross-sectional view showing a conventional crucible for producing a Si single crystal. 1 ... Quartz crucible, 2 ... Graphite crucible, 18 ... Crucible for Si single crystal production, 16 ... Quartz ring

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭64−42387(JP,A) 特開 昭64−76992(JP,A) 実開 昭49−98446(JP,U) (58)調査した分野(Int.Cl.6,DB名) C30B 15/10 - 15/12 C30B 28/00 - 35/00──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-64-42387 (JP, A) JP-A-64-76992 (JP, A) Jikai Sho 49-98446 (JP, U) (58) Field (Int.Cl. 6 , DB name) C30B 15/10-15/12 C30B 28/00-35/00

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】石英ルツボを黒鉛ルツボに嵌合してなるSi
単結晶製造用ルツボにおいて、前記石英ルツボの円筒状
側壁上端に、該円筒状側壁上端及び前記黒鉛ルツボの円
筒状側壁上端を被う石英リングを設けたことを特徴とす
るSi単結晶製造用ルツボ。
A quartz crucible is fitted to a graphite crucible.
A crucible for producing a single crystal, wherein a quartz ring covering the upper end of the cylindrical side wall of the quartz crucible and the upper end of the cylindrical side wall of the graphite crucible is provided. .
JP9152190A 1990-04-06 1990-04-06 Crucible for Si single crystal production Expired - Fee Related JP2835769B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9152190A JP2835769B2 (en) 1990-04-06 1990-04-06 Crucible for Si single crystal production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9152190A JP2835769B2 (en) 1990-04-06 1990-04-06 Crucible for Si single crystal production

Publications (2)

Publication Number Publication Date
JPH03290393A JPH03290393A (en) 1991-12-20
JP2835769B2 true JP2835769B2 (en) 1998-12-14

Family

ID=14028721

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9152190A Expired - Fee Related JP2835769B2 (en) 1990-04-06 1990-04-06 Crucible for Si single crystal production

Country Status (1)

Country Link
JP (1) JP2835769B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5919306A (en) * 1997-11-03 1999-07-06 Sumitomo Sitix Corporation Silicon melting crucible
US20020124792A1 (en) * 2001-01-09 2002-09-12 Hariprasad Sreedharamurthy Crystal puller and method for growing single crystal semiconductor material
JP5027168B2 (en) * 2009-01-22 2012-09-19 ジャパンスーパークォーツ株式会社 Single crystal pulling crucible and single crystal pulling method
JP2011057469A (en) * 2009-09-07 2011-03-24 Mitsubishi Materials Techno Corp Crucible opening retaining member and method and apparatus for producing single crystal silicon
CN109811401A (en) * 2017-11-20 2019-05-28 上海新昇半导体科技有限公司 A kind of crucible device for long crystalline substance

Also Published As

Publication number Publication date
JPH03290393A (en) 1991-12-20

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