JP2830629B2 - Vapor phase growth equipment - Google Patents

Vapor phase growth equipment

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Publication number
JP2830629B2
JP2830629B2 JP19139992A JP19139992A JP2830629B2 JP 2830629 B2 JP2830629 B2 JP 2830629B2 JP 19139992 A JP19139992 A JP 19139992A JP 19139992 A JP19139992 A JP 19139992A JP 2830629 B2 JP2830629 B2 JP 2830629B2
Authority
JP
Japan
Prior art keywords
substrate
reaction tube
electric furnace
vapor phase
growth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP19139992A
Other languages
Japanese (ja)
Other versions
JPH0613330A (en
Inventor
芳健 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP19139992A priority Critical patent/JP2830629B2/en
Publication of JPH0613330A publication Critical patent/JPH0613330A/en
Application granted granted Critical
Publication of JP2830629B2 publication Critical patent/JP2830629B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、半導体や化合物などの
成長層を基板上に結晶成長するための気相成長装置に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vapor phase growth apparatus for growing a crystal of a growth layer of a semiconductor or a compound on a substrate.

【0002】[0002]

【従来の技術】気相成長装置は、半導体や酸化物超伝導
薄膜を基板上に成長させるために広く用いられている。
その中でも、化合物半導体を成長するのに適した有機金
属気相成長装置は広く利用され、多くの化合物が成長さ
れている。従来の気相成長装置としては、例えばジャー
ナル・オブ・クリスタル・グロース(Journal of Cryst
al Growth)第69巻,1984年,10頁〜14頁に詳述されて
いるものがある。図2は局所加熱器の一つである高周波
コイルを用いた従来の気相成長装置の一例の概略構成図
である。ガス流量制御装置21から供給される複数種の
成長ガスが、複数の配管22によって独立に輸送され、
反応管23に送られている。反応管23内のサセプタ2
4上には基板25が配置されており、基板加熱用として
高周波コイル26が反応管23の周りに配置されてい
る。
2. Description of the Related Art A vapor phase growth apparatus is widely used for growing a semiconductor or a superconducting oxide thin film on a substrate.
Among them, metal organic chemical vapor deposition apparatuses suitable for growing compound semiconductors are widely used, and many compounds are grown. Conventional vapor phase growth devices include, for example, the Journal of Cryst
al Growth) 69, 1984, pp. 10-14. FIG. 2 is a schematic configuration diagram of an example of a conventional vapor phase growth apparatus using a high-frequency coil as one of the local heaters. A plurality of types of growth gas supplied from the gas flow control device 21 are independently transported by a plurality of pipes 22,
It is sent to the reaction tube 23. Susceptor 2 in reaction tube 23
A substrate 25 is disposed on 4, and a high-frequency coil 26 is disposed around the reaction tube 23 for heating the substrate.

【0003】[0003]

【発明が解決しようとする課題】III−V族化合物半導
体のGaAsとII−VI族化合物半導体のZnSeは格子
定数がほぼ等しく、バンドギャップが大きく異なること
から注目され、GaAs/ZnSeヘテロ構造素子の研
究が近年行われるようになった。他方、ZnSeは、青
色発光素子材料として注目されているが、良質のZnS
e基板がないこと、更に基板が非常に高価であることか
ら、ZnSeの成長には、結晶性に優れ比較的安価なG
aAs基板が多く用いられている。しかしながら、図2
に示すような高周波コイルを用いた気相成長装置を用い
て、例えばGaAs/ZnSeヘテロ構造膜を成長しよ
うとした場合には、良質なヘテロ界面を形成できず、更
に成長層の膜質も良くないという問題があった。これ
は、以下の理由による。
It is noted that GaAs, a III-V compound semiconductor, and ZnSe, a II-VI compound semiconductor, have substantially the same lattice constant and a significantly different band gap. Research has recently been undertaken. On the other hand, ZnSe has been attracting attention as a blue light emitting element material.
Since there is no e-substrate and the substrate is very expensive, the growth of ZnSe requires a relatively inexpensive G
aAs substrates are often used. However, FIG.
When, for example, a GaAs / ZnSe heterostructure film is to be grown by using a vapor phase growth apparatus using a high-frequency coil as shown in (1), a high quality heterointerface cannot be formed, and the film quality of the grown layer is not good. There was a problem. This is for the following reason.

【0004】従来の高周波コイルを用いた気相成長装置
によって、例えばGaAsの成長を行うには、まず基板
に成長原料を供給させる。供給された成長原料は、基板
あるいはサセプタの熱によって分解され、その分解物が
基板に付着することによって成長が進行するわけであ
る。しかし、この時成長に寄与しなかった分解物はサセ
プタまわりや反応管の内壁に付着する。続けて、ZnS
eの成長を行うと、GaAs成長時に付着した分解物が
ZnSe層に取込まれて、ヘテロ界面やZnSe層が汚
染される問題が生じていた。これは、III−V族化合物
半導体にとっては、II族およびVI族元素は伝導型を支配
する不純物であり、同様に、II−VI族化合物半導体に対
してIII族、V族は同様な振舞いをする不純物だからで
ある。また、この気相成長装置では、成長する毎に反応
管内に付着物が堆積するために、次の成長時に反応管管
壁から堆積物が剥がれ、基板上に降り注ぐことがしばし
ば起こった。この時得られた成長層は結晶欠陥が多く問
題となっていた。
In order to grow GaAs, for example, by a conventional vapor phase growth apparatus using a high-frequency coil, first, a growth material is supplied to a substrate. The supplied growth raw material is decomposed by the heat of the substrate or the susceptor, and the decomposition product adheres to the substrate, whereby the growth proceeds. However, decomposition products that did not contribute to the growth at this time adhere to the periphery of the susceptor and the inner wall of the reaction tube. Then, ZnS
When e is grown, a decomposition product attached during GaAs growth is taken into the ZnSe layer, causing a problem that the hetero interface and the ZnSe layer are contaminated. This means that for a III-V compound semiconductor, the II and VI elements are impurities that govern the conductivity type, and similarly, the III and V groups behave similarly to the II-VI compound semiconductor. This is because they are impurities. Further, in this vapor phase growth apparatus, since deposits accumulate in the reaction tube every time they grow, the deposit often peels off from the tube wall of the reaction tube during the next growth and falls down onto the substrate. The grown layer obtained at this time had many crystal defects and was a problem.

【0005】一方、従来の気相成長装置においては、高
周波コイルによる局所加熱ではなく、電気炉を有する気
相成長装置も知られている。しかし、この装置を用い
て、GaAs/ZnSeヘテロ構造膜を成長しようとす
ると、成長原料が混合された付近で反応管内壁への付着
が起こり、成長が阻害されるという問題があり、特にZ
nSeに代表されるII−VI族化合物半導体の成長には不
向きであった。さらに、ヘテロ構造膜の成長装置として
は、反応管を2室にし、2室間を連結して成長毎に基板
移動させることによりヘテロ構造膜を気相成長させた
り、あるいは同様に成長室を2室にしてMBE法により
成長を行うことが考えられる。しかし、この場合は基板
の移動が必要で操作が繁雑になるとともに、装置も高価
になるという欠点がある。本発明の目的は、このような
従来の問題点を解決して、良質なヘテロ構造膜の成長が
可能な気相成長装置を提供することにある。
On the other hand, in the conventional vapor phase growth apparatus, a vapor phase growth apparatus having an electric furnace instead of local heating using a high-frequency coil is also known. However, when an attempt is made to grow a GaAs / ZnSe heterostructure film using this apparatus, there is a problem that the growth material is adhered to the inner wall of the reaction tube near the area where the growth materials are mixed, and the growth is hindered.
It is not suitable for growing II-VI group compound semiconductors represented by nSe. Further, as an apparatus for growing a heterostructure film, two reaction tubes are provided, the two chambers are connected to each other, and the substrate is moved for each growth, so that the heterostructure film is vapor-phase grown. It is conceivable that the chamber is grown by the MBE method. However, in this case, there is a drawback that the operation is complicated because the substrate needs to be moved, and the apparatus becomes expensive. An object of the present invention is to solve such a conventional problem and to provide a vapor phase growth apparatus capable of growing a high-quality heterostructure film.

【0006】[0006]

【課題を解決するための手段】本発明は、以上の目的を
達成するために、基板またはサセプタ上に支持された基
板を挿脱自在に収納し、前記基板を加熱しながら成長原
料ガスに接触させて該基板上に結晶成長を行う反応管を
備えた気相成長装置において、反応管外部に該反応管を
覆って配設される電気炉と、前記反応管外部に配置され
る局所加熱器と、前記電気炉および局所加熱器をそれぞ
れ移動自在に支持する移動機構部を有し、前記局所加熱
器および前記電気炉の移動機構部は、一方の移動時にお
いて他方の移動を妨げないように移動可能に形成してな
る気相成長装置を構成するものである。
According to the present invention, in order to achieve the above object, a substrate or a substrate supported on a susceptor is removably housed, and the substrate is contacted with a growth source gas while heating the substrate. In a vapor phase growth apparatus provided with a reaction tube for growing crystals on the substrate, an electric furnace disposed outside the reaction tube and covering the reaction tube, and a local heater disposed outside the reaction tube And a moving mechanism for movably supporting the electric furnace and the local heater, respectively, such that the moving mechanism of the local heater and the electric furnace does not impede the movement of one while moving the other. This constitutes a vapor-phase growth apparatus formed so as to be movable.

【0007】[0007]

【作用】本発明の気相成長装置を用いて、例えば、Ga
AsとZnSeの連続成長を行う場合には、以下のよう
に行う。GaAsの成長原料としてジエチルガリウムク
ロライド((C252GaCl)とAsH3を用い、電
気炉による基板加熱を行う。この方法は、良く知られて
いるように、電気炉で反応管自身も暖められるため、反
応管管壁への付着はまったく生じず良質なGaAs成長
が可能である。続けて、電気炉を基板部より遠ざけ、基
板の加熱に局所加熱器を用いてZnSeの成長を行う。
この時は通常の有機金属気相成長法を用いればよい。G
aAs成長時に反応管およびサセプタがまったく汚れな
いために、良好なヘテロ界面を有し、不純物汚染がない
ヘテロ構造膜が得られる。本発明の気相成長装置を用い
れば、成長終了後反応管内壁やサセプタに堆積した付着
物は、電気炉を用いて反応管を加熱させ、HCl等のハ
ロゲンガスによる気相エッチングによって容易に除去で
きる。この結果、成長毎に反応管を正常な状態に保つこ
とができる。
Using the vapor phase growth apparatus of the present invention, for example, Ga
When performing continuous growth of As and ZnSe, the following is performed. Using diethyl gallium chloride ((C 2 H 5 ) 2 GaCl) and AsH 3 as GaAs growth raw materials, the substrate is heated by an electric furnace. In this method, as is well known, since the reaction tube itself is also heated in an electric furnace, adhesion to the reaction tube wall does not occur at all, and high-quality GaAs can be grown. Subsequently, the electric furnace is moved away from the substrate portion, and ZnSe is grown using a local heater for heating the substrate.
At this time, a normal metal organic chemical vapor deposition method may be used. G
Since the reaction tube and the susceptor are not contaminated at all during the growth of aAs, a heterostructure film having a favorable heterointerface and free from impurity contamination can be obtained. When the vapor phase growth apparatus of the present invention is used, the deposits deposited on the inner wall of the reaction tube and the susceptor after the growth is completed are easily removed by heating the reaction tube using an electric furnace and vapor phase etching with a halogen gas such as HCl. it can. As a result, the reaction tube can be kept in a normal state for each growth.

【0008】[0008]

【実施例】以下、本発明の一実施例を図面に基づき説明
する。図1は本発明の一実施例の概略構成図である。気
相成長装置の反応管13内にはサセプタ18上に支持さ
れる基板17が収納される。反応管13内には配管12
が挿設され、配管12の基端側は成長原料ガスを反応管
13内に供給するためのガス流量制御装置11に連結さ
れる。電気炉14は反応管13の外周を覆って配設され
る。電気炉14は反応管13の軸線方向に沿って配置さ
れるレール15aに支持され、レール15aに係合する
図略の電気炉移動機構部により反応管13の軸線方向に
移動可能に支持される。なお、前記電気炉移動機構部と
しては、送りねじと、それに螺合し電気炉14側に固持
されるナット部材および送りねじの駆動モータ等が一例
として適用される。赤外線放射ランプ等からなる局所加
熱器16は反応管13の基板17が収納されている近傍
の外部側に配置される。局所加熱器16はレール15b
に支持されるとともに、図略の局所加熱器移動機構部に
より移動可能に支持される。前記局所加熱器移動機構部
は前記電気炉移動機構部とほぼ近似する構造のものが一
例として適用される。なお、前記局所加熱器移動機構部
は電気炉14が前記電気炉移動機構部により反応管13
の軸線方向に沿って局所加熱器16側に移動した際に、
両者が干渉しないように形成される。例えば、図1に示
すようにレール15aとレール15bとを互いに直交さ
せて配置することにより干渉防止を図ることができる。
以上の構造により、基板17およびサセプタ18は電気
炉14および局所加熱器16により加熱されながらガス
流量制御装置からの成長原料ガスに接触し、結晶成長す
る。
An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic configuration diagram of one embodiment of the present invention. A substrate 17 supported on a susceptor 18 is accommodated in a reaction tube 13 of the vapor phase growth apparatus. A pipe 12 is provided in the reaction tube 13.
Is inserted, and the base end side of the pipe 12 is connected to a gas flow control device 11 for supplying a growth source gas into the reaction tube 13. The electric furnace 14 is provided so as to cover the outer periphery of the reaction tube 13. The electric furnace 14 is supported by rails 15a arranged along the axial direction of the reaction tube 13 and supported by an electric furnace moving mechanism (not shown) that engages with the rail 15a so as to be movable in the axial direction of the reaction tube 13. . As the electric furnace moving mechanism section, a feed screw, a nut member screwed to the electric furnace 14 and fixed to the electric furnace 14 side, a drive motor for the feed screw, and the like are applied as an example. The local heater 16 composed of an infrared radiation lamp or the like is arranged on the outside of the reaction tube 13 in the vicinity of the housing of the substrate 17. Local heater 16 is rail 15b
And is movably supported by a local heater moving mechanism (not shown). As the local heater moving mechanism, one having a structure substantially similar to the electric furnace moving mechanism is applied as an example. In addition, the electric heater 14 is connected to the reaction tube 13 by the electric furnace moving mechanism.
When moved to the local heater 16 side along the axial direction of
They are formed so that they do not interfere with each other. For example, interference can be prevented by arranging the rails 15a and 15b orthogonal to each other as shown in FIG.
With the above structure, the substrate 17 and the susceptor 18 are heated by the electric furnace 14 and the local heater 16 and come into contact with the growth source gas from the gas flow controller to grow crystals.

【0009】次に、上記の如く構成された気相成長装置
を用いた気相成長方法を説明する。ガス流量制御装置1
1から供給された複数の成長原料ガスはそれぞれ配管1
2により反応管13に輸送される。反応管13を覆うよ
うに電気炉14が設置されており、電気炉14はレール
15aによって、反応管13の軸線方向に移動できるよ
うになっている。まず、電気炉14を基板に近づけて加
熱し、第1の化合物半導体を気相成長させる。続いて、
電気炉14を基板から遠ざけ、代わりに局所加熱器16
を基板に近づけて加熱し、第2の化合物半導体を気相成
長させる。この局所加熱器16は、赤外線ランプで構成
されている。局所加熱器16は、電気炉14の移動を妨
げないようにレール15bにより移動できるようになっ
ている。図1は、局所加熱器16を用いてサセプタ18
を通して基板17を加熱し、成長を行う際の配置になっ
ている。電気炉14を用いて成長する際には、局所加熱
器16を反応管13より遠ざけ、電気炉14を基板17
が加熱される位置まで移動させて行う。
Next, a vapor phase growth method using the vapor phase growth apparatus configured as described above will be described. Gas flow control device 1
The plurality of growth source gases supplied from
2 to the reaction tube 13. An electric furnace 14 is installed so as to cover the reaction tube 13, and the electric furnace 14 can be moved in the axial direction of the reaction tube 13 by a rail 15 a. First, the electric furnace 14 is heated close to the substrate to vapor-grow the first compound semiconductor. continue,
The electric furnace 14 is moved away from the substrate, and
Is heated close to the substrate to vapor-grow the second compound semiconductor. This local heater 16 is constituted by an infrared lamp. The local heater 16 can be moved by the rail 15b so as not to hinder the movement of the electric furnace 14. FIG. 1 shows a susceptor 18 using a local heater 16.
Through which the substrate 17 is heated for growth. When growing using the electric furnace 14, the local heater 16 is kept away from the reaction tube 13, and the electric furnace 14 is
Is moved to the position where is heated.

【0010】本実施例では、局所加熱器として赤外線放
射ランプを用いたが、本発明はこれに限定されず、平行
電極による高周波誘導加熱手段や割型電気炉など他の加
熱器でもよい。本実施例では、電気炉および局所加熱器
の移動にレールを用いたが、本発明はこれに限定されな
いのは明らかである。
In this embodiment, an infrared radiation lamp is used as the local heater. However, the present invention is not limited to this, and another heater such as a high-frequency induction heating means using parallel electrodes or a split electric furnace may be used. In this embodiment, rails were used for moving the electric furnace and the local heater, but it is obvious that the present invention is not limited to this.

【0011】[0011]

【発明の効果】以上説明したように、本発明によれば、
III−V族化合物半導体とII−VI族化合物半導体を連続
成長しても、良質なヘテロ界面を有するヘテロ構造膜が
成長可能である。また、反応管を成長毎に気相エッチン
グできることから、反応管は常に正常な状態に保たれ、
欠陥の少ない良質な成長膜が得られる。
As described above, according to the present invention,
Even if a III-V group compound semiconductor and a II-VI group compound semiconductor are continuously grown, a heterostructure film having a high quality heterointerface can be grown. In addition, since the reaction tube can be vapor-phase etched each time it is grown, the reaction tube is always kept in a normal state,
A high quality grown film with few defects can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例の気相成長装置の概略構成図
である。
FIG. 1 is a schematic configuration diagram of a vapor phase growth apparatus according to one embodiment of the present invention.

【図2】従来の気相成長装置の一例の概略構成図であ
る。
FIG. 2 is a schematic configuration diagram of an example of a conventional vapor phase growth apparatus.

【符号の説明】[Explanation of symbols]

11 ガス流量制御装置 12 配管 13 反応管 14 電気炉 15a,15b レール 16 局所加熱器 17 基板 18 サセプタ 21 ガス流量制御装置 22 配管 23 反応管 24 サセプタ 25 基板 26 高周波コイル DESCRIPTION OF SYMBOLS 11 Gas flow controller 12 Pipe 13 Reaction tube 14 Electric furnace 15a, 15b Rail 16 Local heater 17 Substrate 18 Susceptor 21 Gas flow controller 22 Pipe 23 Reaction tube 24 Susceptor 25 Substrate 26 High frequency coil

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 基板またはサセプタ上に支持された基板
を挿脱自在に収納し、前記基板を加熱しながら成長原料
ガスに接触させて該基板上に結晶成長を行う反応管を備
えた気相成長装置において、反応管外部に該反応管を覆
って配設される電気炉と、前記反応管外部に配置される
局所加熱器と、前記電気炉および局所加熱器をそれぞれ
移動自在に支持する移動機構部を有し、前記局所加熱器
および前記電気炉の移動機構部は、一方の移動時におい
て他方の移動を妨げないように移動可能に形成されるこ
とを特徴とする気相成長装置。
1. A gas phase having a reaction tube for accommodating a substrate or a substrate supported on a susceptor and allowing the substrate to come into contact with a growth source gas while heating the substrate to grow crystals on the substrate. In the growth apparatus, an electric furnace disposed outside the reaction tube so as to cover the reaction tube, a local heater disposed outside the reaction tube, and a movement for movably supporting the electric furnace and the local heater, respectively. A vapor phase growth apparatus, comprising a mechanism, wherein the local heater and the moving mechanism of the electric furnace are formed so as to be movable so as not to hinder the movement of one of the electric heater and the electric furnace.
JP19139992A 1992-06-26 1992-06-26 Vapor phase growth equipment Expired - Fee Related JP2830629B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19139992A JP2830629B2 (en) 1992-06-26 1992-06-26 Vapor phase growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19139992A JP2830629B2 (en) 1992-06-26 1992-06-26 Vapor phase growth equipment

Publications (2)

Publication Number Publication Date
JPH0613330A JPH0613330A (en) 1994-01-21
JP2830629B2 true JP2830629B2 (en) 1998-12-02

Family

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Application Number Title Priority Date Filing Date
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Country Link
JP (1) JP2830629B2 (en)

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