JP2824569B2 - Electronic component manufacturing method - Google Patents
Electronic component manufacturing methodInfo
- Publication number
- JP2824569B2 JP2824569B2 JP8100875A JP10087596A JP2824569B2 JP 2824569 B2 JP2824569 B2 JP 2824569B2 JP 8100875 A JP8100875 A JP 8100875A JP 10087596 A JP10087596 A JP 10087596A JP 2824569 B2 JP2824569 B2 JP 2824569B2
- Authority
- JP
- Japan
- Prior art keywords
- resin
- electronic component
- printing
- sealing
- heated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Details Of Resistors (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、電子部品の製造方
法に関し、詳しくは、印刷により半導体等の電子部品を
樹脂で封止して、ICカード、メモリーカード、COB
モジュール、COGモジュール、PLCC、TAB、チ
ップキャリア、QFP、CSP、MCM、Flip c
hip、LCD、BGA、T−BGA、C−BGA、半
導体パッケージ等の電子部品を製造する方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing an electronic component, and more particularly, to a method of sealing an electronic component such as a semiconductor with a resin by printing, for example, an IC card, a memory card and a COB.
Module, COG module, PLCC, TAB, chip carrier, QFP, CSP, MCM, Flip c
The present invention relates to a method for manufacturing electronic components such as a chip, an LCD, a BGA, a T-BGA, a C-BGA, and a semiconductor package.
【0002】[0002]
【従来の技術】従来、半導体の樹脂封止方法としては、
一般に(1)リードフレーム上に搭載された半導体等を
金型中にセットしておき、当該金型中に固形の封止樹脂
を加熱、溶融させて射出し、硬化させた後に脱型するト
ランスファー成型方法及び射出封止方法、(2)半導体
素子上に液状の封止樹脂をディスペンサーで滴下し硬化
させる滴下封止方法、(3)半導体素子上に液状の封止
樹脂を孔版を用いて印刷し硬化させる印刷封止方法が行
なわれている。2. Description of the Related Art Conventionally, as a resin sealing method for a semiconductor,
In general, (1) Transfer in which a semiconductor or the like mounted on a lead frame is set in a mold, and a solid sealing resin is heated, melted, injected, cured, and then released from the mold in the mold. A molding method and an injection sealing method, (2) a drop sealing method in which a liquid sealing resin is dropped and hardened on a semiconductor element with a dispenser, and (3) a liquid sealing resin is printed on the semiconductor element using a stencil. A printing and sealing method for hardening is performed.
【0003】しかしながら、(1)の射出及びトランス
ファー封止方法は、金型が高価であるうえに取扱が困難
であり、また設計変更に伴う納期が長いなど問題が多
く、少品種大量生産向きであり、多品種生産には適さな
い。(2)の滴下封止方法は、厚みの制御が難しく、封
止エリアの広いものでは描画しなけらばならず作業効率
が非常に悪い。また、樹脂の粘度が低くないとエアー圧
では吐出できないため、信頼性の高い樹脂(一般に粘度
が高い)を使用できない。(3)の印刷封止方法は、非
常に経済的に多数個を同時に素早く封止でき、しかも形
状が安定したものを生産できる点で非常に優れている
が、半導体の接続ワイヤーが長い場合に、樹脂の粘度が
4000ポイズを超えると、樹脂圧により接続ワイヤー
が変形するおそれが生じる。However, the injection and transfer sealing method (1) has many problems such as expensive molds, difficult handling, and long delivery due to design change, and is suitable for small-scale mass production. Yes, not suitable for multi-product production. In the dropping sealing method of (2), it is difficult to control the thickness, and drawing must be performed on a large sealing area, resulting in very poor work efficiency. If the viscosity of the resin is not low, the resin cannot be ejected by air pressure, so that a highly reliable resin (generally having a high viscosity) cannot be used. The printing and sealing method (3) is very economical in that it can quickly and simultaneously seal a large number of pieces at the same time and can produce a product having a stable shape. If the viscosity of the resin exceeds 4000 poise, the connection wire may be deformed by the resin pressure.
【0004】[0004]
【発明が解決しようとする課題】本発明の目的は、前記
のような印刷封止方法の問題点を解決することにある。
本発明の目的は、高粘度の樹脂を使用する場合でも接続
ワイヤーの変形等の問題を生じない印刷封止方法を提供
し、低熱膨張率、低応力、耐湿性、耐熱性の観点より、
フィラーの高充填、粘度の高い樹脂組成を使用した印刷
による電子部品の封止を可能とすることにある。SUMMARY OF THE INVENTION An object of the present invention is to solve the problems of the above-described printing and sealing method.
An object of the present invention is to provide a printing sealing method that does not cause a problem such as deformation of a connection wire even when using a high-viscosity resin, and has a low coefficient of thermal expansion, low stress, moisture resistance, and heat resistance.
An object of the present invention is to make it possible to seal an electronic component by printing using a resin composition having a high filler content and a high viscosity.
【0005】[0005]
【課題を解決するための手段】半導体等の印刷封止方法
における前記のような問題点は、封止する電子部品、封
止材、印刷孔版、脱泡装置などを加熱し、樹脂の粘度を
低下させて作業性を改善することで解決できた。本発明
は、半導体等の電子部品を印刷により樹脂で封止する際
に、予め電子部品及び樹脂を加熱しておき、加熱された
状態で印刷を行ない、さらに必要に応じて加熱された状
態で脱泡を行なった後、所定の硬化条件で樹脂を硬化さ
せる電子部品の製造方法にある。The above-mentioned problems in the method of printing and sealing semiconductors and the like are caused by heating an electronic component to be sealed, a sealing material, a printing stencil, a defoaming device, and the like to reduce the viscosity of the resin. The problem was solved by lowering the workability. In the present invention, when an electronic component such as a semiconductor is sealed with a resin by printing, the electronic component and the resin are heated in advance, printing is performed in a heated state, and further, if necessary, in a heated state. The present invention relates to a method for manufacturing an electronic component in which a resin is cured under predetermined curing conditions after defoaming.
【0006】[0006]
【発明の実施の形態】印刷封止用の樹脂としては、常温
で液状の樹脂(組成物)を使用でき、一般に電子部品の
印刷封止に使用されているものを使用できる。電子部品
の封止用樹脂には、低熱膨脹率、低応力、耐湿性、耐熱
性の要望があり、一般に、フィラーの高充填、粘度の高
い樹脂組成により対応しており、結果として常温での粘
度の高い樹脂組成物が使用されている。DESCRIPTION OF THE PREFERRED EMBODIMENTS As a resin for printing and sealing, a resin (composition) which is liquid at room temperature can be used, and those generally used for printing and sealing electronic parts can be used. There is a demand for low thermal expansion coefficient, low stress, moisture resistance, and heat resistance for electronic component encapsulation resins. A resin composition having a high viscosity is used.
【0007】半導体等の電子部品の印刷封止において、
印刷時の樹脂の粘度が4000ポイズを超えると、例え
ば、半導体の接続ワイヤーが長いと、またはワイヤー径
が細いと、印刷時に樹脂の圧力でワイヤーが変形するお
それが生じる。また、通常、印刷後に樹脂の脱泡を行な
うが、樹脂の粘度が高いと脱泡時に気泡が抜けにくいと
いう問題が生じる。好ましい実施の形態では、予め樹脂
を加熱して粘度を4000ポイズ以下にして、このよう
な問題の発生を防止する。従って、本発明は、電子部品
の封止に、粘度が常温で4000ポイズを超える樹脂
(組成物)を用いる場合に好適である。In printing and sealing electronic parts such as semiconductors,
If the viscosity of the resin at the time of printing exceeds 4000 poise, for example, if the semiconductor connection wire is long or the wire diameter is small, the wire may be deformed by the pressure of the resin at the time of printing. In addition, the resin is usually defoamed after printing. However, if the viscosity of the resin is high, there is a problem that bubbles are difficult to be removed at the time of defoaming. In a preferred embodiment, the resin is heated in advance to reduce the viscosity to 4000 poise or less to prevent such a problem from occurring. Therefore, the present invention is suitable for a case where a resin (composition) having a viscosity exceeding 4000 poise at room temperature is used for sealing an electronic component.
【0008】封止材(樹脂)としては、エポキシ樹脂、
フェノール樹脂、ポリイミド樹脂、ポリアミド樹脂、ポ
リエステル樹脂、シリコーン樹脂、アクリル樹脂等の樹
脂組成物を使用できる。エポキシ樹脂の組成物として
は、配合物として、エポキシ樹脂に、硬化剤、促進剤、
カップリング剤、消泡剤、着色剤、その他の添加剤、フ
ィラーを配合した組成物を使用できる。As a sealing material (resin), epoxy resin,
A resin composition such as a phenol resin, a polyimide resin, a polyamide resin, a polyester resin, a silicone resin, and an acrylic resin can be used. As a composition of epoxy resin, as a compound, epoxy resin, curing agent, accelerator,
A composition containing a coupling agent, an antifoaming agent, a coloring agent, other additives, and a filler can be used.
【0009】エポキシ樹脂としては、特に限定されず公
知の樹脂をいずれも使用できる。例えば、ビスフェノー
ルA型、ビスフェノールF型、ビスフェノールAD型、
臭素化ビスフェノール型、ビフェニルエーテル型、フェ
ノールノボラック型、クレゾールノボラック型、ジシク
ロペンタジエン型、ナフタレン型、ブタジエン型、ウレ
タン型、シリコーン型、脂環式等のジ及びポリグリシジ
ルエーテル並びにジ及びポリグリシジルエステルのエポ
キシ樹脂を使用できる。好ましい実施の形態では、これ
らの樹脂を単独で若しくは2種以上を混合して用いる。
エポキシ樹脂自体の粘度や融点は特に問題ではない。好
ましい実施の形態では、樹脂に含まれる不純物イオンと
してナトリウムイオンが1ppm以下、塩素イオンが1
ppm以下であり、加水分解性塩素が600ppm以下
のエポキシ樹脂を用いる。The epoxy resin is not particularly limited, and any known resin can be used. For example, bisphenol A type, bisphenol F type, bisphenol AD type,
Brominated bisphenol type, biphenyl ether type, phenol novolak type, cresol novolak type, dicyclopentadiene type, naphthalene type, butadiene type, urethane type, silicone type, dicyclic and polyglycidyl ethers, and di and polyglycidyl esters Epoxy resin can be used. In a preferred embodiment, these resins are used alone or in combination of two or more.
The viscosity or melting point of the epoxy resin itself does not matter. In a preferred embodiment, sodium ions are 1 ppm or less and chlorine ions are 1 ppm or less as impurity ions contained in the resin.
ppm or less, and an epoxy resin having a hydrolyzable chlorine of 600 ppm or less is used.
【0010】硬化剤及び促進剤としては、脂肪族、芳香
族、脂環式のモノ、ジ又はポリアミン類及びその変性
物、イミダゾール類及びその変性物、ジシアンジアミ
ド、尿素類及びその変性物、アミジン化合物類、酸及び
酸アミド類、ヒドラジン、ヒドラジド類及びその変性
物、フェノール類及びフェノールの誘導体、3級アミン
類、フェノールノボラック樹脂、クレゾールノボラック
樹脂、有機ホスフィン及びその誘導体、脂肪族、芳香
族、脂環式の二又は多塩基酸無水物類等から選ばれるも
のを単独で若しくは2種以上を混合して使用できる。こ
れらの配合物自体の粘度、融点は特に問題ではないが、
好ましい実施の形態では、封止材として使用する樹脂組
成物の粘度の経時変化が、印刷封止時の温度で、1時間
以上、好ましくは2時間以上、少なく維持される配合物
を選択し、適宜組み合わせて使用する。Examples of the curing agent and accelerator include aliphatic, aromatic and alicyclic mono-, di- or polyamines and their modified products, imidazoles and their modified products, dicyandiamide, ureas and their modified products, and amidine compounds. , Acids and acid amides, hydrazine, hydrazides and modified products thereof, phenols and phenol derivatives, tertiary amines, phenol novolak resin, cresol novolak resin, organic phosphine and its derivatives, aliphatic, aromatic, and fatty acids Those selected from cyclic di- or polybasic acid anhydrides can be used alone or in combination of two or more. The viscosity and melting point of these compounds themselves are not particularly important,
In a preferred embodiment, a change over time in the viscosity of the resin composition used as the sealing material, at a temperature at the time of printing and sealing, is selected for a compound that is kept low for 1 hour or more, preferably 2 hours or more, Used in combination as appropriate.
【0011】好ましい実施の形態では、フィラーとし
て、結晶シリカ、溶融シリカ、合成シリカ、アルミナ、
水酸化アルミニウム、ジルコニウム、石英、窒化ケイ
素、窒化アルミニウム等の無機物粉末;シリコーンゴ
ム、アクリルゴム、ブタジエンゴム等のエラストマー粒
子;ポリスチレン、ポリカーボネート、ナイロン、アラ
ミド、炭素繊維等の粉末又は短繊維を用いる。その他、
必要に応じて、消泡剤、レベリング剤、揺変性付与剤、
カップリング剤等の各種添加剤を配合できる。作業性の
改善のため反応性希釈剤、溶剤等の希釈剤を配合できる
が、好ましい実施の形態では印刷作業時に著しい粘度の
変化を起こさない希釈剤を選択して用いる。In a preferred embodiment, as the filler, crystalline silica, fused silica, synthetic silica, alumina,
Inorganic powders such as aluminum hydroxide, zirconium, quartz, silicon nitride, and aluminum nitride; elastomer particles such as silicone rubber, acrylic rubber, and butadiene rubber; and powders or short fibers such as polystyrene, polycarbonate, nylon, aramid, and carbon fibers are used. Others
If necessary, an antifoaming agent, a leveling agent, a thixotropic agent,
Various additives such as a coupling agent can be blended. A diluent such as a reactive diluent or a solvent can be added to improve workability. In a preferred embodiment, a diluent that does not cause a significant change in viscosity during printing is selected and used.
【0012】本発明では、印刷により半導体等の電子部
品を樹脂で封止する。本発明は、(1)封止される電子
部品を予め加温しておくこと、(2)電子部品を加温し
たまま樹脂を印刷すること、(3)予め封止樹脂を加温
しておくこと、(4)予め印刷マスクを加温しておくこ
と、(5)加温された樹脂を印刷マスク上に加温された
まま吐出すること、(6)印刷後封止された部品を加温
したまま脱泡することを特徴とする。In the present invention, electronic components such as semiconductors are sealed with resin by printing. The present invention provides (1) preheating a sealed electronic component, (2) printing a resin while the electronic component is heated, and (3) preheating a sealing resin. (4) Preheating the print mask, (5) Discharging the heated resin on the print mask while heating, (6) Cleaning the sealed parts after printing. It is characterized by defoaming while heating.
【0013】本発明は、封止される電子部品及び封止に
用いる樹脂を予め加熱し、印刷を加熱された状態で行な
うことができるように、封止樹脂の印刷ラインに新たに
加温機構を付加することにより実施できる。According to the present invention, a heating mechanism is newly provided on a sealing resin printing line so that an electronic component to be sealed and a resin used for sealing can be heated in advance and printing can be performed in a heated state. Can be implemented.
【0014】図1に本発明を実施するための印刷ライン
の模式図を示す。ただし、加熱方法及び器具、材質はこ
れに限定されるものではなくあくまで一例にすぎない。
封止される電子部品1は金属製のヒートブロック2上で
予熱する。印刷テーブル3の加熱にもヒートブロック4
を用いる。樹脂の供給タンク5にバンドヒーター6を付
加し樹脂7を予熱する。印刷マスク8の印刷作業に支障
をきたさない部分にフィルムヒーター9を張り付ける。
さらに脱泡器10は壁面にヒーター11を埋め込み内壁
を金属性にして脱泡器内部を加温するようにする。各加
温の温度は、封止樹脂の温度が4000ポイズ以下にな
る温度に設定すればよく、好ましい実施の形態では、3
0〜200℃の範囲で選択する。FIG. 1 is a schematic view of a printing line for carrying out the present invention. However, the heating method, the tool, and the material are not limited to these, but are merely examples.
The electronic component 1 to be sealed is preheated on a metal heat block 2. Heat block 4 for heating printing table 3
Is used. A band heater 6 is added to the resin supply tank 5 to preheat the resin 7. A film heater 9 is attached to a portion of the print mask 8 that does not interfere with the printing operation.
Further, in the defoamer 10, a heater 11 is embedded in a wall surface to make the inner wall metallic and to heat the inside of the defoamer. The temperature of each heating may be set to a temperature at which the temperature of the sealing resin becomes 4000 poise or less.
Select in the range of 0-200 ° C.
【0015】[0015]
【作用】従来の印刷による電子部品の樹脂封止には常温
で液状の封止材を使用する必要がある。一般に、常温で
液状の封止材には、トランスファーモールドによる成形
材料に比べると耐湿信頼性が劣るとか、ヒートサイクル
性が劣る等の欠点があるといわれている。耐湿信頼性が
劣る理由は、常温で液体のエポキシ樹脂を用いる必要が
あり、さらに常温で液体の硬化剤を用いるか又は固体の
硬化剤を用いる場合には配合比をわずかとして封止材の
粘度が大きく上昇しないようにする必要があったことに
由来する。また、ヒートサイクル性が劣る理由は、封止
材と半導体チップの熱膨張率が異なるためであり、シリ
カ等の充填剤の比率を上げることによって改善されてい
るが、充填剤量の増加は封止材の粘度の上昇をともなう
のでおのずから限界がある。In the conventional resin sealing of electronic parts by printing, it is necessary to use a sealing material which is liquid at normal temperature. In general, it is said that a sealing material which is liquid at normal temperature has drawbacks such as poor moisture resistance reliability and poor heat cycleability as compared with a molding material formed by transfer molding. The reason why the moisture resistance reliability is poor is that it is necessary to use an epoxy resin that is liquid at room temperature, and if a liquid curing agent is used at room temperature or a solid curing agent is used, the compounding ratio is slightly reduced and the viscosity of the sealing material is reduced. From a large rise. In addition, the reason why the heat cycleability is inferior is that the thermal expansion coefficients of the sealing material and the semiconductor chip are different, and this is improved by increasing the ratio of a filler such as silica. There is naturally a limit as it increases the viscosity of the stop material.
【0016】本発明では、予め樹脂を加熱するので、常
温で固体を呈する封止材であっても使用できる。また、
樹脂(封止材)に配合する硬化剤、促進剤等を適宜選択
することにより、加熱時の粘度の経時変化を抑えること
ができ、例えば、一般に印刷作業に要する2時間以上に
わたって、粘度の変化が少ないような封止材を使用でき
る。そのため、本発明によれば、必要に応じて充填剤の
配合量を、樹脂がバインダーとして作用できる限界の9
9wt%近くまで増加でき、信頼性の非常に優れた封止
材を副資材のコストをかけずに短期間で量産することが
でき、生産性とコストメリットのある電子部品の生産が
可能となる。In the present invention, since the resin is heated in advance, a sealing material which is solid at room temperature can be used. Also,
By appropriately selecting a curing agent, an accelerator, and the like to be mixed with the resin (encapsulant), it is possible to suppress a change with time in viscosity during heating. Can be used. Therefore, according to the present invention, if necessary, the compounding amount of the filler is set to 9 which is the limit at which the resin can act as a binder.
The amount can be increased to nearly 9 wt%, and a highly reliable sealing material can be mass-produced in a short period of time without adding the cost of auxiliary materials, and it is possible to produce electronic parts with productivity and cost merit. .
【0017】[0017]
【実施例】下記の封止材原料を80℃に加熱して混合
し、プラネタリーミキサーで80℃で1時間、真空攪拌
した後、50℃まで冷却し、硬化促進剤(HX−374
2(旭化成工業(株))6部を加え、さらに15分間真
空攪拌して封止材Aを得た。EXAMPLE The following encapsulant materials were mixed by heating to 80 ° C., and the mixture was stirred under vacuum at 80 ° C. for 1 hour with a planetary mixer, and then cooled to 50 ° C. to obtain a curing accelerator (HX-374).
6 (Asahi Kasei Kogyo Co., Ltd.) was added, and the mixture was further stirred under vacuum for 15 minutes to obtain a sealing material A.
【0018】封止材原料 ビスフェノール型エポキシ樹脂:エピコート828(油
化シェルエポキシ(株)) 100部 酸無水物硬化剤:HN−2200(日立化成工業
(株)) 90部 着色顔料:カーボンブラック 1部 シランカップリング剤:A−187(日本ユニカー
(株)) 10部 充填剤:シリカ(平均粒径:20μm) 1760部。Bisphenol type epoxy resin as raw material of sealing material : Epicoat 828 (Yuka Shell Epoxy Co., Ltd.) 100 parts Acid anhydride curing agent: HN-2200 (Hitachi Chemical Industry Co., Ltd.) 90 parts Color pigment: carbon black 1 Part Silane coupling agent: A-187 (Nippon Unicar Co., Ltd.) 10 parts Filler: silica (average particle size: 20 μm) 1760 parts.
【0019】この封止材Aは、粘度が23℃(常温)で
12000ポイズであるが、40℃では3000ポイ
ズ、60℃では1200ポイズである。ポットライフは
23℃では20日間、40℃では3日間、60℃では6
時間であった。This sealing material A has a viscosity of 12,000 poise at 23 ° C. (normal temperature), 3000 poise at 40 ° C., and 1200 poise at 60 ° C. Pot life is 20 days at 23 ° C, 3 days at 40 ° C, 6 days at 60 ° C
It was time.
【0020】6mm×6mm厚み450μmのシリコン
チップをガラス−エポキシ回路基板上にダイボンディン
グし、シリコンチップと回路基板とを金線でワイヤーボ
ンディングして電気的に接線したものを供試体(電子部
品)として、図1の印刷ラインによって以下の様な樹脂
封止をそれぞれ行なった。得られた電子部品について、
ワイヤー流れ発生の有無、気泡残の有無、ヒートサイク
ル性(−40℃〜+150℃)及び耐湿寿命(85℃/
85%RH)を検査した。結果を表1に示す。A 6 mm × 6 mm silicon chip having a thickness of 450 μm is die-bonded on a glass-epoxy circuit board, and the silicon chip and the circuit board are wire-bonded with a gold wire and electrically connected to each other to obtain a test piece (electronic component). The following resin sealing was performed by the printing line of FIG. About the obtained electronic parts,
The presence or absence of wire flow, the presence or absence of air bubbles, the heat cycle property (-40 ° C to + 150 ° C), and the moisture resistance life (85 ° C /
85% RH). Table 1 shows the results.
【0021】実施例1 封止材A、印刷マスク、半導体チップを搭載した基板及
び脱泡器を60℃に加温し、印刷封止を行った。 Example 1 A sealing material A, a printing mask, a substrate on which a semiconductor chip was mounted, and a defoamer were heated to 60 ° C. to perform printing and sealing.
【0022】実施例2 封止材A、印刷マスク、半導体チップを搭載した基板及
び脱泡器を40℃に加温し、印刷封止を行った。 Example 2 A sealing material A, a printing mask, a substrate on which a semiconductor chip was mounted, and a defoamer were heated to 40 ° C. to perform printing and sealing.
【0023】比較例1 封止材A、印刷マスク、半導体チップを搭載した基板及
び脱泡器を加温せず常温で印刷封止を行った。COMPARATIVE EXAMPLE 1 A sealing material A, a printing mask, a substrate on which a semiconductor chip was mounted, and a defoamer were subjected to printing and sealing at room temperature without heating.
【0024】[0024]
【表1】 実施例1 実施例2 比較例1 ワイヤー流れ なし なし 発生 気泡残 なし なし 多い ヒートサイクル性(サイクル) 1000以上 1000以上 20未満 耐湿寿命試験 1000時間 780時間 230時間 [Table 1] Example 1 Example 2 Comparative Example 1 Wire flow None None Occurrence Bubble residue None None Many Heat cycle property (cycle) 1000 or more 1000 or more and less than 20 Moisture resistance life test 1000 hours 780 hours 230 hours
【0025】[0025]
【発明の効果】本発明よれば、樹脂等を予め加熱するの
で、電子部品の印刷封止に、信頼性が極めて高い封止材
でありながら粘度が高い為に、従来、常温での印刷封止
が困難であった樹脂を、作業性に支障をきたさずに使用
できるため、より信頼性の高い電子部品を安価に量産す
ることができる。According to the present invention, since resin and the like are pre-heated, printing and sealing of electronic parts can be carried out at a normal temperature because the viscosity is high although the sealing material is extremely reliable. The resin that has been difficult to stop can be used without hindering the workability, so that more reliable electronic components can be mass-produced at low cost.
【図1】 本発明の実施に用いる印刷ラインの模式図で
ある。FIG. 1 is a schematic view of a printing line used for carrying out the present invention.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 橋本 常一 滋賀県野洲郡野洲町大字小篠原2339−7 (56)参考文献 特開 平5−114620(JP,A) (58)調査した分野(Int.Cl.6,DB名) H01L 21/56 H01L 23/28 - 23/30 H01C 1/01──────────────────────────────────────────────────続 き Continuation of the front page (72) Inventor Tsuneichi Hashimoto 2339-7 Oshinohara, Yasu-cho, Yasu-gun, Shiga Prefecture (56) References JP-A-5-114620 (JP, A) (58) Fields investigated ( Int.Cl. 6 , DB name) H01L 21/56 H01L 23/28-23/30 H01C 1/01
Claims (5)
封止する際に、予め電子部品及び樹脂を加熱しておき、
加熱された状態で印刷を行ない、さらに必要に応じて加
熱された状態で脱泡を行なった後、所定の硬化条件で樹
脂を硬化させる電子部品の製造方法。1. When an electronic component such as a semiconductor is sealed with a resin by printing, the electronic component and the resin are heated in advance,
A method for producing an electronic component in which printing is performed in a heated state, and defoaming is performed in a heated state as necessary, and then the resin is cured under predetermined curing conditions.
封止する際に、予め電子部品及び樹脂を加熱しておき、
加熱された状態で印刷を行ない、さらに加熱された状態
で脱泡を行なった後、所定の硬化条件で樹脂を硬化させ
る電子部品の製造方法。 2. An electronic component such as a semiconductor is printed with a resin.
When sealing, heat the electronic components and resin in advance,
Printing is performed in a heated state, and further heated
After defoaming, cure the resin under the prescribed curing conditions
Manufacturing method of electronic components.
さない樹脂組成物であり、予め樹脂を印刷作業できる状
態まで粘度が低下するように加熱する請求項1又は2に
記載の電子部品の製造方法。3. a resin is a resin composition which does not cause changes in viscosity during the heating printing process, the electronic component according to claim 1 or 2 in viscosity to a state of pre-resin can print operations heated to decrease Production method.
000ポイズを超える樹脂を用いる請求項1〜3のいず
れかに記載の電子部品の製造方法。 4. A resin having a viscosity of 4 at room temperature (23 ° C.).
The resin according to any one of claims 1 to 3, which uses a resin exceeding 000 poise
A method for manufacturing an electronic component according to any of the claims.
イズ以下になる温度に設定する請求項1〜4のいずれか
に記載の電子部品の製造方法。 5. The method according to claim 5, wherein each heating temperature is set to a value of 4000
5. The method according to claim 1, wherein the temperature is set to be equal to or less than the size.
The method for producing an electronic component according to claim 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8100875A JP2824569B2 (en) | 1996-04-23 | 1996-04-23 | Electronic component manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8100875A JP2824569B2 (en) | 1996-04-23 | 1996-04-23 | Electronic component manufacturing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09289220A JPH09289220A (en) | 1997-11-04 |
JP2824569B2 true JP2824569B2 (en) | 1998-11-11 |
Family
ID=14285503
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8100875A Expired - Fee Related JP2824569B2 (en) | 1996-04-23 | 1996-04-23 | Electronic component manufacturing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2824569B2 (en) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0666350B2 (en) * | 1991-10-24 | 1994-08-24 | 日本レック株式会社 | Resin encapsulation method for electrical parts |
-
1996
- 1996-04-23 JP JP8100875A patent/JP2824569B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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JPH09289220A (en) | 1997-11-04 |
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