JP2812281B2 - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JP2812281B2
JP2812281B2 JP8017434A JP1743496A JP2812281B2 JP 2812281 B2 JP2812281 B2 JP 2812281B2 JP 8017434 A JP8017434 A JP 8017434A JP 1743496 A JP1743496 A JP 1743496A JP 2812281 B2 JP2812281 B2 JP 2812281B2
Authority
JP
Japan
Prior art keywords
package
heat
input
semiconductor device
electrode section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP8017434A
Other languages
Japanese (ja)
Other versions
JPH09213853A (en
Inventor
一夫 本間
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP8017434A priority Critical patent/JP2812281B2/en
Publication of JPH09213853A publication Critical patent/JPH09213853A/en
Application granted granted Critical
Publication of JP2812281B2 publication Critical patent/JP2812281B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、高周波数帯で使用
される半導体装置、特に高出力や高利得が要求されるト
ランジスタ増幅装置等に用いられる半導体装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device used in a high frequency band, and more particularly to a semiconductor device used for a transistor amplifying device requiring high output and high gain.

【0002】[0002]

【従来の技術】一般に、この種の高周波数帯で使用され
る半導体素子、例えば高周波、高出力トランジスタは、
高出力化、高利得化にともない放熱効果を高める必要が
ある。このため、従来の半導体装置では、放熱効果を高
めるために、パッケージの外形を大きくしたり、パッケ
ージや半導体素子の電極部に放熱板を付加した構造を備
えている。また、この種の半導体装置では、高周波入出
力回路間の高周波的遮蔽を必要とするためにアイソレー
ションを大きくする必要がある。
2. Description of the Related Art Generally, a semiconductor device used in a high-frequency band of this kind, for example, a high-frequency, high-output transistor,
It is necessary to enhance the heat radiation effect with the increase in output and gain. For this reason, the conventional semiconductor device has a structure in which the outer shape of the package is enlarged or a heat radiating plate is added to the electrode portion of the package or the semiconductor element in order to enhance the heat radiation effect. Further, in this type of semiconductor device, it is necessary to increase isolation since high-frequency shielding between high-frequency input / output circuits is required.

【0003】図5は従来の半導体素子の外観を示す斜視
図で、同図に基づいてこれを説明する。同図において、
全体を符号20で示す半導体素子には、図示を省略した
半導体チップが封入されたパッケージ21と、パッケー
ジ21の上面に固着され断面E字状に形成された放熱板
22と、パッケージ21から露呈した半導体素子の入力
接続電極部21a、出力接続電極部21bおよび一対の
接地電極部21cとが備えられている。
FIG. 5 is a perspective view showing the appearance of a conventional semiconductor device, which will be described with reference to FIG. In the figure,
A semiconductor element, which is generally designated by the reference numeral 20, includes a package 21 in which a semiconductor chip (not shown) is sealed, a heat dissipation plate 22 fixed to the upper surface of the package 21 and formed in an E-shaped cross section, and exposed from the package 21. An input connection electrode portion 21a, an output connection electrode portion 21b, and a pair of ground electrode portions 21c of the semiconductor element are provided.

【0004】[0004]

【発明が解決しようとする課題】上述した従来の半導体
装置は、放熱効果を高めるためにパッケージ21や放熱
板22の外形を大きくしたり、放熱板22の表面積を大
きくするために半導体素子自体の構造が複雑で、かつ外
形が大きくなっていた。また、放熱板22の断面形状が
複雑でかつ大きいため、この放熱板22が取り付けられ
た半導体素子20を半導体装置に組み込んで使用する
際、高周波入出力回路の入出力電極部21a,21b間
の高周波アイソレーションを大きくとるための遮蔽板と
パッケージ21との間に隙間が生じ、かつ隙間が大きく
なって十分な遮蔽効果が得られなかった。また、半導体
装置20の接地電極部21cを接地するのに、誘電体基
板に形成された接地回路のスルーホールを介して電気的
に接地されるため、スルーホールの寄生インダクタンス
によって半導体装置20の電気的特性が不安定になり易
いといった問題があった。
In the above-described conventional semiconductor device, the external shape of the package 21 and the heat radiating plate 22 is increased in order to enhance the heat radiation effect, and the semiconductor element itself is increased in order to increase the surface area of the heat radiating plate 22. The structure was complicated and the outer shape was large. Further, since the cross-sectional shape of the heat radiating plate 22 is complicated and large, when the semiconductor element 20 to which this heat radiating plate 22 is attached is used in a semiconductor device, the space between the input / output electrode portions 21a and 21b of the high frequency input / output circuit is used. A gap is formed between the shielding plate for increasing high-frequency isolation and the package 21, and the gap is increased, so that a sufficient shielding effect cannot be obtained. In addition, since the ground electrode portion 21c of the semiconductor device 20 is electrically grounded through the through hole of the ground circuit formed on the dielectric substrate, the electric potential of the semiconductor device 20 is reduced by the parasitic inductance of the through hole. There is a problem that the characteristic tends to be unstable.

【0005】したがって、本発明は上記した従来の問題
に鑑みてなされたものであり、その目的とするところ
は、半導体素子自体に特別な放熱構造を設けることな
く、半導体素子自体を小型のままとするとともに、効率
の良い放熱を可能とし、かつ簡単な遮蔽構造によって高
周波入出力回路間の高周波アイソレーションを大きくと
れ、しかも半導体素子の接地電極部を電気的に接地する
際に生じる寄生インダクタンスを低減できる半導体装置
を提供することにある。
Accordingly, the present invention has been made in view of the above-mentioned conventional problems, and an object of the present invention is to provide a semiconductor device having a small size without providing a special heat radiation structure. In addition to enabling efficient heat dissipation, a simple shielding structure provides high-frequency isolation between high-frequency input / output circuits, and reduces parasitic inductance that occurs when the ground electrode of the semiconductor element is electrically grounded. It is an object of the present invention to provide a possible semiconductor device.

【0006】[0006]

【課題を解決するための手段】この目的を達成するため
に、請求項1記載の発明は、半導体チップが封入され、
入出力接続電極部および接地電極部を備えるパッケージ
と、このパッケージの入出力接続電極部と接地電極部と
が接続される高周波入出力回路と接地回路とを備えた基
板と、前記パッケージを覆う筐体と、前記パッケージと
筐体との間に介在して前記半導体装置の発熱を熱伝導に
よって放熱する放熱部材とを備え、放熱部材とパッケー
ジとの間に上下動自在な熱伝導介在部材を設け、この熱
伝導介在部材のパッケージに当接する部位にフランジ部
を形成したものである。 したがって、半導体チップから
発生した熱は、パッケージからフランジ部を介して効率
よく放熱部材および筐体に熱電導してここから放熱され
るとともに、パッケージの外形が変わっても熱伝導介在
部材を上下動に調整することにより、常にパッケージの
上端面に熱伝導介在部材を当接状態となる。 また、請求
項2記載の発明は、半導体チップが封入され、入出力接
続電極部および接地電極部を備えるパッケージと、この
パッケージの入出力接続電極部と接地電極部とが接続さ
れる高周波入出力回路と接地回路とを備えた基板と、前
記パッケージを覆う筐体と、前記パッケージと筐体との
間に介在して前記半導体装置の発熱を熱伝導によって放
熱する放熱部材とを備え、放熱部材をパッケージの入出
力接続電極部間に配置したものである。したがって、新
たに高周波の遮蔽板を設ける必要がなく、小型になると
ともに構造が複雑にならずに、遮蔽効果が大きい。
た、請求項3記載の発明は、半導体チップが封入され、
入出力接続電極部および接地電極部を備えるパッケージ
と、このパッケージの入出力接続電極部と接地電極部と
が接続される高周波入出力回路と接地回路とを備えた基
板と、前記パッケージを覆う筐体と、前記パッケージと
筐体との間に介在して前記半導体装置の発熱を熱伝導に
よって放熱する放熱部材とを備え、パッケージの接地電
極部と前記放熱部材との間に弾性変形可能な熱伝導介在
部材を設けたものである。したがって、パッケージの接
地電極部および放熱部材と熱伝導介在部材との接続が確
実になり熱伝導が向上する。 また、請求項4記載の発明
は、半導体チップが封入され、入出力接続電極部および
接地電極部を備えるパッケージと、このパッケージの入
出力接続電極部と接地電極部とが接続される高周波入出
力回路と接地回路とを備えた基板と、前記パッケージを
覆う筐体と、前記パッケージと筐体との間に介在して前
記半導体装置の発熱を熱伝導によって放熱する放熱部材
とを備え、放熱部材と筐体とを導電性部材で形成し、パ
ッケージの接地電極部と前記放熱部材との間に導電性の
放熱板を介装させたものである。したがって、パッケー
ジの接地を基板のスルーホールを介することなく、直接
放熱板によって行うので、インダクタンスの発生が低減
される。
In order to achieve this object, according to the first aspect of the present invention, a semiconductor chip is encapsulated,
A package including an input / output connection electrode portion and a ground electrode portion; a substrate including a high-frequency input / output circuit to which the input / output connection electrode portion and the ground electrode portion of the package are connected; and a ground circuit; comprising body and, a heat radiating member for radiating heat generated by heat conduction intervening to the semiconductor device between the package and the casing, the heat radiating member and the package
A heat conductive interposition member that can move up and down
Flange on the part of the conductive interposed member that contacts the package
Is formed. Therefore, from the semiconductor chip
The generated heat is efficient from the package through the flange
The heat is well conducted to the heat radiating member and the housing, and the heat is radiated from here.
And heat conduction even if the package shape changes.
By adjusting the members vertically, the package
The heat conduction interposed member comes into contact with the upper end surface. Also, billing
In the invention described in Item 2, the semiconductor chip is sealed and the input / output connection is made.
A package including a connection electrode section and a ground electrode section;
When the input / output connection electrode of the package and the ground electrode are
Board with a high-frequency input / output circuit and a ground circuit
A housing for covering the package;
The heat generated by the semiconductor device is released by heat conduction
And a heat dissipating member for heating, wherein the heat dissipating member is arranged between the input / output connection electrodes of the package. Therefore, it is not necessary to newly provide a high-frequency shielding plate, and the size is reduced, the structure is not complicated, and the shielding effect is large. Ma
In the invention according to claim 3, the semiconductor chip is encapsulated,
Package with input / output connection electrode section and ground electrode section
And the input / output connection electrode part and the ground electrode part of this package.
With a high-frequency input / output circuit to which the
A plate, a housing covering the package, and the package.
The heat generated by the semiconductor device is transferred to the heat
Therefore, a heat dissipating member that dissipates heat
An elastically deformable heat conductive interposition between the pole part and the heat dissipating member
A member is provided. Therefore, the package connection
The connection between the ground electrode and the heat dissipation member and the heat conduction
In fact, heat conduction is improved. The invention according to claim 4
Has a semiconductor chip encapsulated,
A package with a ground electrode and the package
High frequency input / output where output connection electrode and ground electrode are connected
A substrate having a power circuit and a ground circuit, and the package
A housing to be covered, and an intervening space between the package and the housing.
A heat dissipating member that dissipates heat generated by the semiconductor device by heat conduction.
With the door, and a heat radiating member and the housing is formed of a conductive member, is obtained by interposing a conductive radiating plate between said heat radiating member and the ground electrode portion of the package. Accordingly, the grounding of the package is performed directly by the heat radiating plate without passing through the through hole of the substrate, so that the occurrence of inductance is reduced.

【0007】[0007]

【発明の実施の形態】以下、本発明の実施の形態を図に
基づいて説明する。図1は本発明に係る半導体装置の全
体を示す斜視図、図2は図1におけるII-II 線断面図で
ある。これらの図において、全体を符号1で示す半導体
装置は、図示を省略した半導体チップが封入されたパッ
ケージ2と、高周波入力回路3aおよび高周波出力回路
3bが形成された誘電体基板3と、略直方体状に形成さ
れた放熱部材5と、断面コ字状に形成されたケース6
と、平板状の蓋7とを備えている。これら放熱部材5、
ケース6および蓋7はいずれも熱伝導率の良い導電材で
形成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a perspective view showing the entire semiconductor device according to the present invention, and FIG. 2 is a sectional view taken along line II-II in FIG. In these figures, a semiconductor device indicated by reference numeral 1 is a package 2 in which a semiconductor chip (not shown) is enclosed, a dielectric substrate 3 on which a high-frequency input circuit 3a and a high-frequency output circuit 3b are formed, and a substantially rectangular parallelepiped. Heat dissipating member 5 formed in a U-shape and case 6 formed in a U-shaped cross section
And a flat lid 7. These heat dissipating members 5,
Both the case 6 and the lid 7 are formed of a conductive material having good thermal conductivity.

【0008】パッケージ2には、ベースまたはゲート電
極等を形成する入力接続電極部2aと、コレクタまたは
ドレイン電極等を形成する出力接続電極部2bと、エミ
ッタまたはソース電極等を形成する一対の接地電極部2
cとが備えられている。4は誘電体基板2にスルーホー
ル4aが形成された一対の接地回路である。放熱部材5
の中央の下部には、断面が逆T字状に形成された切欠部
5aが設けられ、この切欠部5aの上端面の中央から放
熱部材5の上端面まで貫通するようにねじ部5bが螺設
されており、この放熱部材5は、切欠部5aが前記接地
回路4の上方に位置するように誘電体基板3に固着され
ている。
The package 2 includes an input connection electrode portion 2a forming a base or gate electrode and the like, an output connection electrode portion 2b forming a collector or drain electrode and the like, and a pair of ground electrodes forming an emitter or source electrode and the like. Part 2
c is provided. Reference numeral 4 denotes a pair of ground circuits each having a through hole 4a formed in the dielectric substrate 2. Heat dissipation member 5
A notch 5a having an inverted T-shaped cross section is provided in the lower part of the center of the screw member. A screw 5b is screwed so as to penetrate from the center of the upper end of the notch 5a to the upper end of the heat radiating member 5. The heat radiating member 5 is fixed to the dielectric substrate 3 such that the notch 5a is located above the ground circuit 4.

【0009】ケース6の両側には対向する一対の側壁6
a,6aが立設され、これら側壁6a,6aの内側面に
は、前記放熱部材5の両側端面が接触している。蓋7の
略中央には、孔7aが穿設されており、この孔7aが前
記放熱部材5のねじ部5bに対応するように、蓋7がケ
ース6の側壁6a,6aの上端面および放熱部材5の上
端面に接合されている。8は放熱部材5のねじ部5bに
螺合したねじであって、下端面は平坦状に形成されてい
る。
A pair of opposite side walls 6 are provided on both sides of the case 6.
The heat radiation member 5 is in contact with the inner side surfaces of the side walls 6a, 6a. A hole 7a is formed substantially at the center of the lid 7, and the upper end surface of the side walls 6a, 6a of the case 6 and the heat radiating portion are formed so that the hole 7a corresponds to the screw portion 5b of the heat radiating member 5. It is joined to the upper end surface of the member 5. Reference numeral 8 denotes a screw screwed to the screw portion 5b of the heat radiating member 5, and the lower end surface is formed flat.

【0010】このような構成において、パッケージ2の
入力接続電極部2aを高周波入力回路3aに、また出力
接続電極部2bを高周波出力回路3bに、また接地電極
部2cを接地回路4にそれぞれはんだ付け等で接続し
て、パッケージ2を誘電体基板3上に実装する。実装さ
れたパッケージ2の入力接続電極部2aと出力接続電極
部2bとが前記放熱部材5の両側に位置する。次に、蓋
7の孔7aからドライバー等でねじ8をねじ部5bに螺
合させてねじ8の下端面をパッケージ2の上端面に当接
させる。
In such a configuration, the input connection electrode 2a of the package 2 is soldered to the high-frequency input circuit 3a, the output connection electrode 2b is soldered to the high-frequency output circuit 3b, and the ground electrode 2c is soldered to the ground circuit 4. The package 2 is mounted on the dielectric substrate 3. The input connection electrode portion 2a and the output connection electrode portion 2b of the mounted package 2 are located on both sides of the heat radiation member 5. Next, the screw 8 is screwed into the screw portion 5b from the hole 7a of the lid 7 with a screwdriver or the like, and the lower end surface of the screw 8 is brought into contact with the upper end surface of the package 2.

【0011】このような状態とすることによって、パッ
ケージ2内で発生した熱は、パッケージ2の上端面から
ねじ8を伝わり、放熱部材5と、この放熱部材と接触し
ているケース6および蓋7とから放熱されるので、効率
良く放熱される。この場合、ねじ部5bとパッケージ2
の上端面とねじ8の下端面とに、熱導電性の良いグリス
を塗布しておくことにより、放熱効果をさらに高めるこ
とが可能である。
In this state, the heat generated in the package 2 is transmitted from the upper end surface of the package 2 to the screw 8, and the heat radiating member 5, the case 6 and the lid 7 which are in contact with the heat radiating member. , Heat is efficiently radiated. In this case, the screw portion 5b and the package 2
By applying grease having good thermal conductivity to the upper end surface of the screw 8 and the lower end surface of the screw 8, the heat radiation effect can be further enhanced.

【0012】また、ねじ8は高さを自在に変えることが
できるので、パッケージ2の上端面を平坦状に形成して
おけば、パッケージ2の高さが変わっても半導体装置1
そのものの構造を変更することなく使用することがで
き、半導体装置1を半導体素子のサイズや形状が変わる
たびに新たに設計し直す必要がない。さらに、半導体素
子そのものに特別な放熱板等が不要となるため、半導体
自体を小さくかつ軽量とすることができ、これを組み込
む半導体装置も小型化を図ることができる。
Further, since the height of the screw 8 can be freely changed, if the upper end surface of the package 2 is formed flat, the semiconductor device 1 can be formed even if the height of the package 2 changes.
The semiconductor device 1 can be used without changing its structure, and there is no need to redesign the semiconductor device 1 every time the size or shape of the semiconductor element changes. Further, since a special heat radiating plate or the like is not required for the semiconductor element itself, the semiconductor itself can be reduced in size and weight, and the size of the semiconductor device incorporating the semiconductor element can be reduced.

【0013】また、放熱部材5が、半導体装置1の高周
波入力回路3aと高周波出力回路3bとを高周波的に遮
蔽する仕切板として機能するため、高周波入出力回路間
のアイソレーションを大きくとることができる。このよ
うに、放熱部材5が遮蔽板としての機能も併せもつの
で、従来のように放熱板の他に遮蔽板を設ける必要がな
く、このため大型化するといったようなことがない。な
お、ねじ8の代わりに、放熱部材5の切欠部5aの上端
面にはんだ付け等によって固着した弾性変形可能な断面
U字状に形成した金属材からなる押え板を設け、この押
え板の弾性変形によって常に押え板がパッケージ2の上
端面と当接するようにして、この押え板を介して放熱を
行ってもよい。
Further, since the heat radiating member 5 functions as a partition plate for shielding the high-frequency input circuit 3a and the high-frequency output circuit 3b of the semiconductor device 1 at a high frequency, the isolation between the high-frequency input / output circuits can be increased. it can. As described above, since the heat dissipating member 5 also has a function as a shielding plate, there is no need to provide a shielding plate in addition to the heat dissipating plate as in the related art, and therefore, there is no increase in size. In place of the screw 8, a pressing plate made of a metal material having a U-shaped cross section elastically deformable and fixed to the upper end surface of the cutout portion 5a of the heat radiating member 5 by soldering or the like is provided. The heat may be dissipated through the pressing plate such that the pressing plate is always in contact with the upper end surface of the package 2 due to the deformation.

【0014】図3は本発明の第2の実施の形態を示す断
面図である。この第2の実施の形態では、パッケージ2
の接地電極部2cと放熱部材5の切欠部5aの段部5c
との間に断面U字状のばね性を有する放熱板10を介装
したものである。こうすることにより、接地電極部2c
および放熱板10を介してパッケージ2に発生する熱を
放熱部材5に放熱することができる。また、半導体素子
の接地電極部2cを接地回路4のスルーホール4aを介
して接地せずに、直接放熱板7を介して接地するため寄
生インダクタンスを低減することができ、電気的特性の
安定化が図れる。
FIG. 3 is a sectional view showing a second embodiment of the present invention. In the second embodiment, the package 2
Ground electrode 2c and step 5c of cutout 5a of heat radiation member 5
And a heat radiating plate 10 having a U-shaped cross section and having a spring property is interposed therebetween. By doing so, the ground electrode portion 2c
The heat generated in the package 2 can be radiated to the heat radiating member 5 via the heat radiating plate 10. Further, since the ground electrode portion 2c of the semiconductor element is directly grounded via the heat radiating plate 7 without being grounded via the through hole 4a of the ground circuit 4, the parasitic inductance can be reduced, and the electrical characteristics can be stabilized. Can be achieved.

【0015】図4は本発明の第3の実施の形態を示す断
面図である。この第3の実施の形態では、ねじ8の先端
にねじ8の形よりも大きい形を有する円板状のフランジ
部8aを一体的に形成したものである。こうすることに
より、パッケージ2からの熱伝導をより良好に行うこと
ができ、このためさらに効率よく放熱を行うことができ
る。
FIG. 4 is a sectional view showing a third embodiment of the present invention. In the third embodiment, a disk-shaped flange portion 8a having a shape larger than the shape of the screw 8 is integrally formed at the tip of the screw 8. By doing so, heat conduction from the package 2 can be performed more favorably, and therefore, heat can be more efficiently dissipated.

【0016】[0016]

【発明の効果】以上説明したように、請求項1記載の発
明によれば、半導体チップが封入され、入出力接続電極
部および接地電極部を備えるパッケージと、このパッケ
ージの入出力接続電極部と接地電極部とが接続される高
周波入出力回路と接地回路とを備えた基板と、前記パッ
ケージを覆う筐体と、前記パッケージと筐体との間に介
在して前記半導体装置の発熱を熱伝導によって放熱する
放熱部材とを備え、放熱部材とパッケージとの間に上下
動自在な熱伝導介在部材を設け、この熱伝導介在部材の
パッケージに当接する部位にフランジ部を形成したこと
により、半導体素子自体に放熱機能をもたせずに、それ
が組み込まれる半導体装置に放熱機能をもつ放熱部材お
よび筐体を設けたので、半導体素子のパッケージを大き
くしたり、半導体素子に特別な放熱構造を備える必要が
ないため、半導体素子自体の構造を複雑とすることがな
く、小型で軽量のままとすることができる。また、パッ
ケージの高さに合わせて熱伝導介在部材を調整できるの
で、半導体素子のパッケージの形状に関係なく放熱可能
となり、このため同一の半導体装置を設計変更すること
なく使用できて設計工数の削減が図れる。また、半導体
チップから発生した熱は、パッケージからフランジ部を
介して効率よく放熱部材および筐体に熱電導してここか
ら放熱されるので、放熱効率が向上する。
As described above, according to the first aspect of the present invention,
According to the description, a package in which a semiconductor chip is sealed and provided with an input / output connection electrode section and a ground electrode section, a high-frequency input / output circuit and a ground circuit in which the input / output connection electrode section and the ground electrode section of the package are connected. A substrate that covers the package, and a heat-dissipating member that is interposed between the package and the housing and that dissipates heat generated by the semiconductor device through heat conduction , between the heat-dissipating member and the package. Up and down
A movable heat conducting member is provided, and the heat conducting member is
By forming a flange portion at the part that comes into contact with the package , the semiconductor device itself is not provided with a heat dissipation function, and the semiconductor device in which it is incorporated is provided with a heat dissipation member and a housing having a heat dissipation function. the big or because it is not necessary to provide a special heat dissipation structure to the semiconductor device, without the complicated structure of the semiconductor device itself, can remain small and lightweight. In addition,
You can adjust the heat conduction interposition member according to the height of the cage
Heat can be dissipated regardless of the package shape of the semiconductor element
Therefore, it is necessary to change the design of the same semiconductor device.
Can be used without any problems and the design man-hour can be reduced. Also semiconductor
The heat generated from the chip transfers the flange from the package.
Heat conduction to the heat radiating member and housing efficiently through
Since the heat is dissipated, the heat radiation efficiency is improved.

【0017】また、請求項2記載の発明によれば、半導
体チップが封入され、入出力接続電極部および接地電極
部を備えるパッケージと、このパッケージの入出力接続
電極部と接地電極部とが接続される高周波入出力回路と
接地回路とを備えた基板と、前記パッケージを覆う筐体
と、前記パッケージと筐体との間に介在して前記半導体
装置の発熱を熱伝導によって放熱する放熱部材とを備
え、放熱部材をパッケージの入出力接続電極部間に配置
したことにより、放熱部材が高周波的に遮蔽する仕切板
として機能するため、高周波入出力回路間のアイソレー
ションを大きくとることができ、高利得の半導体素子の
電気的特性調整が容易に行え、安定した性能が得られる
とともに、放熱部材が遮蔽板としての機能を併せもつた
め、従来のように放熱板の他に遮蔽板を設けるために遮
蔽が十分行われないとか大型化するといったようなこと
がない。
According to the second aspect of the present invention, the semiconductor
Body chip is enclosed, input / output connection electrode section and ground electrode
And the input / output connection of this package
A high-frequency input / output circuit in which the electrode section and the ground electrode section are connected;
A substrate having a ground circuit, and a housing covering the package
And the semiconductor interposed between the package and the housing.
A heat dissipating member that dissipates heat generated by the device by heat conduction.
In addition, since the heat dissipating member is arranged between the input and output connection electrode portions of the package , the heat dissipating member functions as a partition plate for shielding in a high frequency, so that the isolation between the high frequency input and output circuits can be increased. Since the electrical characteristics of the gain semiconductor element can be easily adjusted, stable performance can be obtained, and the heat dissipating member also has a function as a shielding plate. There is no such thing as insufficient shielding or an increase in size.

【0018】また、請求項3記載の発明によれば、半導
体チップが封入され、入出力接続電極部および接地電極
部を備えるパッケージと、このパッケージの入出力接続
電極部と接地電極部とが接続される高周波入出力回路と
接地回路とを備えた基板と、前記パッケージを覆う筐体
と、前記パッケージと筐体との間に介在して前記半導体
装置の発熱を熱伝導によって放熱する放熱部材とを備
え、パッケージの接地電極部と前記放熱部材との間に弾
性変形可能な熱伝導介在部材を設けたことにより、パッ
ケージの接地電極部および放熱部材と熱伝導介在部材と
の接続が確実になり熱伝導が向上する。
According to the third aspect of the present invention, the semiconductor
Body chip is enclosed, input / output connection electrode section and ground electrode
And the input / output connection of this package
A high-frequency input / output circuit in which the electrode section and the ground electrode section are connected;
A substrate having a ground circuit, and a housing covering the package
And the semiconductor interposed between the package and the housing.
A heat dissipating member that dissipates heat generated by the device by heat conduction.
Between the ground electrode of the package and the heat dissipating member.
The heat conductive interposition member that can be deformed
Cage ground electrode and heat dissipating member
And the heat conduction is improved.

【0019】また、請求項4記載の発明によれば、半導
体チップが封入され、入出力接続電極部および接地電極
部を備えるパッケージと、このパッケージの入出力接続
電極部と接地電極部とが接続される高周波入出力回路と
接地回路とを備えた基板と、前記パッケージを覆う筐体
と、前記パッケージと筐体との間に介在して前記半導体
装置の発熱を熱伝導によって放熱する放熱部材とを備
え、放熱部材と筐体とを導電性部材で形成し、パッケー
ジの接地電極部と前記放熱部材との間に導電性の放熱板
を介装させたことにより、半導体素子の接地をスルーホ
ールを介して行うことなく、放熱板を介して接地するた
め寄生インダクタンスを低減することができ、電気的特
性の安定化が図れる。
According to the fourth aspect of the present invention, the semiconductor
Body chip is enclosed, input / output connection electrode section and ground electrode
And the input / output connection of this package
A high-frequency input / output circuit in which the electrode section and the ground electrode section are connected;
A substrate having a ground circuit, and a housing covering the package
And the semiconductor interposed between the package and the housing.
A heat dissipating member that dissipates heat generated by the device by heat conduction.
The heat radiating member and the housing are formed of a conductive member, and a conductive heat radiating plate is interposed between the ground electrode portion of the package and the heat radiating member. Therefore, the parasitic inductance can be reduced because the grounding is performed via the heat sink, and the electrical characteristics can be stabilized.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明に係る半導体装置の全体を示す斜視図
である。
FIG. 1 is a perspective view showing an entire semiconductor device according to the present invention.

【図2】 図1におけるII-II 線断面図である。FIG. 2 is a sectional view taken along line II-II in FIG.

【図3】 本発明に係る半導体装置の第2の実施の形態
を示す断面図である。
FIG. 3 is a sectional view showing a second embodiment of the semiconductor device according to the present invention.

【図4】 本発明に係る半導体装置の第3の実施の形態
を示す断面図である。
FIG. 4 is a sectional view showing a third embodiment of the semiconductor device according to the present invention.

【図5】 従来の半導体素子の全体を示す斜視図であ
る。
FIG. 5 is a perspective view showing an entire conventional semiconductor device.

【符号の説明】[Explanation of symbols]

1…半導体装置、2…パッケージ、2a…入力接続電極
部、2b…出力接続電極部、2c…接地電極部、3…誘
電体基板、3a…高周波入力回路、3b…高周波出力回
路、4…接地回路、4a…スルーホール、5…放熱部
材、5a…切欠部、5b…ねじ部、6…ケース、7…
蓋、8…ねじ、8a…フランジ部、10…放熱板。
DESCRIPTION OF SYMBOLS 1 ... Semiconductor device, 2 ... Package, 2a ... Input connection electrode part, 2b ... Output connection electrode part, 2c ... Ground electrode part, 3 ... Dielectric substrate, 3a ... High frequency input circuit, 3b ... High frequency output circuit, 4 ... Ground Circuit, 4a through hole, 5 radiating member, 5a notch, 5b screw, 6 case, 7
Lid, 8 screws, 8a flange, 10 radiator plate.

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 半導体チップが封入され、入出力接続電
極部および接地電極部を備えるパッケージと、このパッ
ケージの入出力接続電極部と接地電極部とが接続される
高周波入出力回路と接地回路とを備えた基板と、前記パ
ッケージを覆う筐体と、前記パッケージと筐体との間に
介在して前記半導体装置の発熱を熱伝導によって放熱す
る放熱部材とを備え、放熱部材とパッケージとの間に上
下動自存な熱伝導介在部材を設け、この熱伝導介在部材
のパッケージに当接する部位にフランジ部を形成したこ
とを特徴とする半導体装置。
1. A package in which a semiconductor chip is sealed and provided with an input / output connection electrode portion and a ground electrode portion, a high-frequency input / output circuit and a ground circuit connecting the input / output connection electrode portion and the ground electrode portion of the package. A substrate that covers the package, and a heat-dissipating member that is interposed between the package and the housing and that dissipates heat generated by the semiconductor device through heat conduction , between the heat-dissipating member and the package. On
The lower heat-existing heat conduction intervening member is provided.
That a flange is formed at the part that contacts the package
A semiconductor device characterized by the following.
【請求項2】 半導体チップが封入され、入出力接続電
極部および接地電極部を備えるパッケージと、このパッ
ケージの入出力接続電極部と接地電極部とが接続される
高周波入出力回路と接地回路とを備えた基板と、前記パ
ッケージを覆う筐体と、前記パッケージと筐体との間に
介在して前記半導体装置の発熱を熱伝導によって放熱す
る放熱部材とを備え、放熱部材をパッケージの入出力接
続電極部間に配置したことを特徴とする半導体装置。
2. A package enclosing a semiconductor chip and having an input / output connection electrode section and a ground electrode section, a high frequency input / output circuit and a ground circuit connecting the input / output connection electrode section and the ground electrode section of the package. A package that covers the package; and a heat radiating member interposed between the package and the case to radiate heat generated by the semiconductor device by heat conduction. A semiconductor device, which is disposed between connection electrode portions.
【請求項3】 半導体チップが封入され、入出力接続電
極部および接地電極部を備えるパッケージと、このパッ
ケージの入出力接続電極部と接地電極部とが接続される
高周波入出力回路と接地回路とを備えた基板と、前記パ
ッケージを覆う筐体と、前記パッケージと筐体との間に
介在して前記半導体装置の発熱を熱伝導によって放熱す
る放熱部材とを備え、パッケージの接地電極部と前記放
熱部材との間に弾性変形可能な熱伝導介在部材を設けた
ことを特徴とする半導体装置。
3. A package enclosing a semiconductor chip and having an input / output connection electrode section and a ground electrode section, a high-frequency input / output circuit and a ground circuit connecting the input / output connection electrode section and the ground electrode section of the package. wherein the substrate and a casing covering the package, said interposed between the package and the housing and a heat radiation member for radiating the heat generated heat conduction of the semiconductor device, and a ground electrode portion of the package Release
An elastically deformable heat conduction interposition member is provided between the heat member
A semiconductor device characterized by the above-mentioned.
【請求項4】 半導体チップが封入され、入出力接続電
極部および接地電極部を備えるパッケージと、このパッ
ケージの入出力接続電極部と接地電極部とが接続される
高周波入出力回路と接地回路とを備えた基板と、前記パ
ッケージを覆う筐体と、前記パッケージと筐体との間に
介在して前記半導体装置の発熱を熱伝導によって放熱す
る放熱部材とを備え、放熱部材と筐体とを導電性部材で
形成し、パッケージの接地電極部と前記放熱部材との間
に導電性の放熱板を介装させたことを特徴とする半導体
装置。
4. A package in which a semiconductor chip is sealed and provided with an input / output connection electrode section and a ground electrode section, a high-frequency input / output circuit and a ground circuit for connecting the input / output connection electrode section and the ground electrode section of the package. A substrate provided with: a housing covering the package; and a heat radiating member interposed between the package and the housing to radiate heat generated by the semiconductor device by heat conduction. A semiconductor device comprising: a conductive member; and a conductive heat radiating plate interposed between the ground electrode portion of the package and the heat radiating member.
JP8017434A 1996-02-02 1996-02-02 Semiconductor device Expired - Fee Related JP2812281B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8017434A JP2812281B2 (en) 1996-02-02 1996-02-02 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8017434A JP2812281B2 (en) 1996-02-02 1996-02-02 Semiconductor device

Publications (2)

Publication Number Publication Date
JPH09213853A JPH09213853A (en) 1997-08-15
JP2812281B2 true JP2812281B2 (en) 1998-10-22

Family

ID=11943924

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8017434A Expired - Fee Related JP2812281B2 (en) 1996-02-02 1996-02-02 Semiconductor device

Country Status (1)

Country Link
JP (1) JP2812281B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6252000B2 (en) * 2013-07-09 2017-12-27 三菱電機株式会社 substrate
JP6257474B2 (en) * 2014-08-20 2018-01-10 三菱電機株式会社 Power circuit device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59155794U (en) * 1983-03-31 1984-10-19 三菱電機株式会社 Heat dissipation device for electronic equipment

Also Published As

Publication number Publication date
JPH09213853A (en) 1997-08-15

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